Buy and Sell Semiconductor, Assembly, Test and SMT Equipment at fabsurplus.com
Please find below a list of Used Probers for sale by fabsurplus.com .Click on any listed Prober to see further data.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q.ty | Sales Cond. | Lead Time | Att. |
|---|---|---|---|---|---|---|---|---|---|
| 23660 | ACCRETECH | UF3000 | FULL AUTO PROBER | 200 MM | 01.06.2003 | 10 | as is where is | immediately | 0 |
| 26630 | ACCRETECH | UF 3000 | Prober | 300 mm | 01.03.2008 | 1 | as is where is | immediately | 3 |
| 27991 | Accretech | UF 3000 | Prober UF3000 for Parametertest at Agilent 4071A | 01.09.2003 | 1 | 2 | |||
| 27992 | ACCRETECH | UF300A | Prober UF300A for Parametertest at Agilent 4072B | 01.11.2001 | 1 | 1 | |||
| 34083 | ACCRETECH | UF 3000 | Prober | 1 | 0 | ||||
| 31336 | ACCRETECH | UF200SA | FULL AUTO PROBER | 200 MM | 01.06.2005 | 1 | as is where is | 0 | |
| 33501 | ACCRETECH | UF3000 | PROBER | 300 | 01.06.2005 | 1 | as is where is | 0 | |
| 33502 | ACCRETECH | UF3000 | PROBER | 300 | 01.06.2005 | 1 | as is where is | 0 | |
| 33503 | ACCRETECH | UF3000 | PROBER | 300 | 01.06.2006 | 1 | as is where is | 0 | |
| 33504 | ACCRETECH | UF3000 | PROBER | 300 | 01.06.2005 | 1 | as is where is | 0 | |
| 22628 | Accretech TSK | UF200 | Automatic wafer prober | 200 mm | 01.10.1999 | 1 | inquire | immediately | 14 |
| 21866 | ACCRETECH TSK | UF 200 | PROBER | 200 mm | 01.06.2001 | 4 | as is where is | immediately | 0 |
| 22625 | Accretech TSK | UF 200 A | Automatic Prober | 200 mm | 01.03.2003 | 1 | inquire | immediately | 4 |
| 26668 | ACCRETECH TSK | UF3000 EX | Automatic Wafer Prober | 300 mm | 01.05.2008 | 1 | as is where is | immediately | 2 |
| 30889 | ACCRETECH/TSK | UF200S | PROBER - WAFER | 1 | as is where is | 0 | |||
| 32856 | Accretech/TSK | UF-200 | PROBER | 200 mm | 01.03.1998 | 1 | as is where is | 0 | |
| 32857 | Accretech/TSK | UF-200 | PROBER | 200 mm | 01.05.1998 | 1 | as is where is | 0 | |
| 32858 | Accretech/TSK | UF-3000 | PROBER | 300 mm | 1 | as is where is | 0 | ||
| 32859 | Accretech/TSK | UF-3000 | PROBER | 300 mm | 1 | as is where is | 0 | ||
| 32860 | Accretech/TSK | UF-3000 | PROBER | 300 mm | 1 | as is where is | 0 | ||
| 32861 | Accretech/TSK | UF-3000 | PROBER | N/A | 1 | as is where is | 0 | ||
| 32862 | Accretech/TSK | UF-3000 | PROBER | 300 mm | 1 | as is where is | 0 | ||
| 33354 | Accretech/TSK | UF200A | Prober - Wafer | 01.06.2007 | 1 | as is where is | 1 | ||
| 33355 | Accretech/TSK | UF200A | Prober - Wafer | 01.06.2007 | 1 | as is where is | 1 | ||
| 32437 | ACCTETECH TSK | UF200 | Prober | 200 mm | 01.01.1999 | 1 | inquire | 0 | |
| 9878 | ALESSI | REL 4500 | Manual Wafer Prober | 150 mm | 1 | inquire | immediately | 2 | |
| 16270 | Alessi | 550 | Wafer Prober | 200 mm | 1 | inquire | immediately | 2 | |
| 33790 | ALESSI | REL-5500 | Analytical Wafer Prober with 8" (dia.) Nickel Plated Chuck | 1 | as is where is | 0 | |||
| 30925 | CASCADE | PS21 | PARAMETRIC AUTOPROBER | 1 | as is where is | 0 | |||
| 21001 | Cascade Microtech | Parametric Series PS300 | Wafer Prober (Automatic) | 150 mm | 1 | 1 | |||
| 32876 | Cascade Microtech | MTS 2200 | PROBER | N/A | 1 | as is where is | 0 | ||
| 33516 | CASCADE MICROTECH | S300-861 | PROBER | 300 | 01.06.2003 | 1 | as is where is | 0 | |
| 15793 | ELECTROGLAS | 3001 | PROBER | 1 | as is where is | immediately | 0 | ||
| 18496 | ELECTROGLAS | 4080 RTM | Wafer Prober | 8" | 1 | 0 | |||
| 21055 | Electroglas | 4085X | Prober | 200 mm | 1 | inquire | immediately | 2 | |
| 21341 | Electroglas | 4085X | Prober | 2 | 0 | ||||
| 23196 | ELECTROGLAS | 4085X | PROBER | 1 | inquire | immediately | 0 | ||
| 23197 | ELECTROGLAS | 4085X | PROBER | 1 | inquire | immediately | 0 | ||
| 28101 | Electroglas | EG4060X | PROBER | 1 | as is where is | 0 | |||
| 28102 | Electroglas | EG4060X | PROBER | 1 | as is where is | 0 | |||
| 28103 | Electroglas | EG4060X | PROBER | 1 | as is where is | 0 | |||
| 32863 | Electroglas | EG4060X | PROBER | 150 mm | 1 | as is where is | 0 | ||
| 32864 | Electroglas | EG4060X | PROBER | 150 mm | 1 | as is where is | 0 | ||
| 32865 | Electroglas | EG4060X | PROBER | 150 mm | 1 | as is where is | 0 | ||
| 32866 | Electroglas | EG4080X | PROBER | 150 mm | 1 | as is where is | 0 | ||
| 33987 | ELECTROGLAS | 4085X | PROBER | 1 | as is where is | immediately | 0 | ||
| 28104 | KLA | 1201 | PROBER | 1 | as is where is | 0 | |||
| 28105 | KLA | 1201 | PROBER | 1 | as is where is | 0 | |||
| 28106 | KLA | 1201 | PROBER | 1 | as is where is | 0 | |||
| 33791 | MC SYSTEMS | 8806 | Analytical Probing System w/B/L MicroZoom Microscope, 2.25X, 8X, 25X Objectives | 1 | as is where is | 0 | |||
| 21484 | NCR | 1034X | Automatic Wafer Prober | 14 | 1 | ||||
| 18495 | TEL | 4080 STD | Autoprober | 01.05.1996 | 1 | 0 | |||
| 23178 | TEL | P8 | PROBER | 200 mm | 10 | as is where is | 0 | ||
| 23179 | TEL | P8XL | PROBER | 200 mm | 2 | as is where is | 0 | ||
| 15795 | TEL TOKYO ELECTRON | 1201 | PROBER | 1 | as is where is | immediately | 0 | ||
| 31522 | TEL TOKYO ELECTRON | P-8 | Prober | 200 mm | 01.05.1997 | 1 | as is where is | 0 | |
| 31518 | TEL TOKYO ELECTRON | P-8 | Prober | 200 mm | 01.05.2004 | 1 | as is where is | 0 | |
| 31519 | TEL TOKYO ELECTRON | P-8 | Prober | 200 mm | 01.05.2004 | 1 | as is where is | 0 | |
| 31521 | TEL TOKYO ELECTRON | P-8 | Prober | 200 mm | 01.05.1997 | 1 | as is where is | 0 | |
| 34063 | TEL TOKYO ELECTRON | P8XL | Automatic Wafer Prober | 200 MM | 01.03.1998 | 1 | as is where is | immediately | 1 |
| 28107 | TEL TOKYO ELECTRON | 80W | PROBER | 1 | as is where is | 0 | |||
| 28108 | TEL TOKYO ELECTRON | 80W | PROBER | 1 | as is where is | 0 | |||
| 28109 | TEL TOKYO ELECTRON | 80W | PROBER | 1 | as is where is | 0 | |||
| 28110 | TEL TOKYO ELECTRON | 80W | PROBER | 1 | as is where is | 0 | |||
| 28111 | TEL TOKYO ELECTRON | 80W | PROBER | 1 | as is where is | 0 | |||
| 28112 | TEL TOKYO ELECTRON | 80W | PROBER | 1 | as is where is | 0 | |||
| 28113 | TEL TOKYO ELECTRON | 80W | PROBER | 1 | as is where is | 0 | |||
| 28114 | TEL TOKYO ELECTRON | 80W | PROBER | 1 | as is where is | 0 | |||
| 34069 | TEL TOKYO ELECTRON | P8 | PROBER | 200 MM | 01.06.2002 | 2 | as is where is | immediately | 14 |
| 32867 | TEL TOKYO ELECTRON | P-12XL | PROBER | 300 mm | 1 | as is where is | 0 | ||
| 32868 | TEL TOKYO ELECTRON | P-12XL | PROBER | 300 mm | 1 | as is where is | 0 | ||
| 32869 | TEL TOKYO ELECTRON | P-12XL | PROBER | 300 mm | 1 | as is where is | 0 | ||
| 32870 | TEL TOKYO ELECTRON | P-12XL | PROBER | N/A | 1 | as is where is | 0 | ||
| 32871 | TEL TOKYO ELECTRON | P-12XL | PROBER | 300 mm | 1 | as is where is | 0 | ||
| 32872 | TEL TOKYO ELECTRON | P-8 | PROBER | 150 mm | 1 | as is where is | 0 | ||
| 32873 | TEL TOKYO ELECTRON | P-8 | PROBER | 150 mm | 1 | as is where is | 0 | ||
| 32874 | TEL TOKYO ELECTRON | Precio | PROBER | 300 mm | 01.10.2008 | 1 | as is where is | immediately | 0 |
| 33505 | TEL TOKYO ELECTRON | P-12XL | FULL AUTO PROBER | 300 | 01.06.2003 | 1 | as is where is | 0 | |
| 33506 | TEL TOKYO ELECTRON | P-8 | FULL AUTO PROBER | 200 | 01.06.1999 | 1 | as is where is | 0 | |
| 33507 | TEL TOKYO ELECTRON | P-8 | FULL AUTO PROBER | 200 | 01.06.1999 | 1 | as is where is | 0 | |
| 33508 | TEL TOKYO ELECTRON | P-8 | FULL AUTO PROBER | 200 | 01.06.1999 | 1 | as is where is | 0 | |
| 33509 | TEL TOKYO ELECTRON | P-8XLm | FULL AUTO PROBER | 200 | 01.06.2005 | 1 | as is where is | 0 | |
| 33510 | TEL TOKYO ELECTRON | P-8XLm(15°C~150°C) | FULL AUTO PROBER | 200 | 01.06.2006 | 1 | as is where is | 0 | |
| 33511 | TEL TOKYO ELECTRON | P-8XLm(15°C~150°C) | FULL AUTO PROBER | 200 | 01.06.2006 | 1 | as is where is | 0 | |
| 33512 | TEL TOKYO ELECTRON | P-8XLm(15°C~150°C) | FULL AUTO PROBER | 200 | 01.06.2006 | 1 | as is where is | 0 | |
| 33513 | TEL TOKYO ELECTRON | P-8XLm(15°C~150°C) | FULL AUTO PROBER | 200 | 01.06.2006 | 1 | as is where is | 0 | |
| 33514 | TEL TOKYO ELECTRON | P-8XLm(15°C~150°C) | FULL AUTO PROBER | 200 | 01.06.2006 | 1 | as is where is | 0 | |
| 33515 | TEL TOKYO ELECTRON | P-8XLm(15°C~150°C) | FULL AUTO PROBER | 200 | 01.06.2005 | 1 | as is where is | 0 | |
| 33578 | TEL Tokyo Electron | P-12XLn | Prober | 12(300mm) | 01.12.2004 | 1 | as is where is | 0 | |
| 33579 | TEL Tokyo Electron | P-12XLn | Prober | 12(300mm) | 01.11.2002 | 1 | as is where is | 0 | |
| 33580 | TEL Tokyo Electron | P-12XLn | Prober | 12(300mm) | 01.11.2002 | 1 | as is where is | 0 | |
| 33581 | TEL Tokyo Electron | P-12XLn | Prober | 12(300mm) | 01.11.2002 | 1 | as is where is | 0 | |
| 33582 | TEL Tokyo Electron | P-12XLn | Prober | 12(300mm) | 01.11.2002 | 1 | as is where is | 0 | |
| 33583 | TEL Tokyo Electron | P-12XLn | Prober | 12(300mm) | 01.11.2002 | 1 | as is where is | 0 | |
| 33584 | TEL Tokyo Electron | P-12XLn | Prober | 12(300mm) | 01.11.2002 | 1 | as is where is | 0 | |
| 33585 | TEL Tokyo Electron | P-12XLn | Prober | 12(300mm) | 01.11.2002 | 1 | as is where is | 0 | |
| 33586 | TEL Tokyo Electron | P-12XLn | Prober | 12(300mm) | 01.11.2002 | 1 | as is where is | 0 | |
| 33587 | TEL Tokyo Electron | P-12XLn | Prober | 12(300mm) | 01.12.2002 | 1 | as is where is | 0 | |
| 33588 | TEL Tokyo Electron | P-12XLn | Prober | 12(300mm) | 01.12.2002 | 1 | as is where is | 0 | |
| 33589 | TEL Tokyo Electron | P-12XLn+ | Prober | 12(300mm) | 01.05.2008 | 1 | as is where is | 0 | |
| 33590 | TEL Tokyo Electron | P-12XLn+ | Prober | 12(300mm) | 01.05.2008 | 1 | as is where is | 0 | |
| 33591 | TEL Tokyo Electron | P-12XLn+ | Prober | 12(300mm) | 01.05.2008 | 1 | as is where is | 0 | |
| 33592 | TEL Tokyo Electron | P-12XLn+ | Prober | 12(300mm) | 01.05.2008 | 1 | as is where is | 0 | |
| 33593 | TEL Tokyo Electron | P-8 | Prober | 8 inch | 01.05.1996 | 1 | as is where is | 0 | |
| 33594 | TEL Tokyo Electron | P-8 | Prober | 8 inch | 01.05.1996 | 1 | as is where is | 0 | |
| 33889 | TEL TOKYO ELECTRON | P8 | PROBER | 200 MM | 1 | as is where is | immediately | 0 | |
| 30899 | TOKYO ELECTRON LTD. | P-8LC | PROBER - WAFER | 1 | as is where is | 0 | |||
| 30900 | TOKYO ELECTRON LTD. | P-8LC | PROBER - WAFER | 1 | as is where is | 0 | |||
| 30901 | TOKYO ELECTRON LTD. | P-8LC | PROBER - WAFER | 1 | as is where is | 0 | |||
| 30902 | TOKYO ELECTRON LTD. | P-8LC | PROBER - WAFER | 1 | as is where is | 0 | |||
| 30903 | TOKYO ELECTRON LTD. | P-8LC | PROBER - WAFER | 1 | as is where is | 0 | |||
| 30904 | TOKYO ELECTRON LTD. | P-8LC | PROBER - WAFER | 1 | as is where is | 0 | |||
| 30905 | TOKYO ELECTRON LTD. | P-8XL | PROBER - WAFER | 01.06.1998 | 1 | as is where is | 1 | ||
| 30906 | TOKYO ELECTRON LTD. | P-8XL | PROBER - WAFER | 1 | as is where is | 0 | |||
| 30907 | TOKYO ELECTRON LTD. | P-8XL | PROBER - WAFER | 1 | as is where is | 0 | |||
| 30908 | TOKYO ELECTRON LTD. | P-8XL | PROBER - WAFER | 1 | as is where is | 0 | |||
| 30909 | TOKYO ELECTRON LTD. | P-8XL | PROBER - WAFER | 1 | as is where is | 0 | |||
| 30910 | TOKYO ELECTRON LTD. | P-8XL | PROBER - WAFER | 1 | as is where is | 0 | |||
| 30911 | TOKYO ELECTRON LTD. | P-8XL | PROBER - WAFER | 1 | as is where is | 0 | |||
| 30912 | TOKYO ELECTRON LTD. | P-8XL | PROBER - WAFER | 1 | as is where is | 0 | |||
| 30913 | TOKYO ELECTRON LTD. | P-8XL | PROBER - WAFER | 200mm | 01.04.1998 | 1 | as is where is | 1 | |
| 30915 | TOKYO ELECTRON LTD. | P-8XL | PROBER - WAFER | 1 | as is where is | 0 | |||
| 30916 | TOKYO ELECTRON LTD. | P-8XL | PROBER - WAFER | 1 | as is where is | 0 | |||
| 30917 | TOKYO ELECTRON LTD. | P-8XL | PROBER - WAFER | 1 | as is where is | 0 | |||
| 30918 | TOKYO ELECTRON LTD. | P-8XL | PROBER - WAFER | 1 | as is where is | 0 | |||
| 30919 | TOKYO ELECTRON LTD. | P-8XL | PROBER - WAFER | 1 | as is where is | 0 | |||
| 30922 | TOKYO ELECTRON LTD. | P-8XL | PROBER - WAFER | 1 | as is where is | 0 | |||
| 30923 | TOKYO ELECTRON LTD. | P-8XL | PROBER - WAFER | 1 | as is where is | 0 | |||
| 30924 | TOKYO ELECTRON LTD. | P-8XL | PROBER - WAFER | 1 | as is where is | 0 | |||
| 33357 | Tokyo Electron Ltd. | P-8XL | Prober - Wafer | 01.03.1998 | 1 | as is where is | 0 | ||
| 9102 | TSK | UF200AL | Prober | 1 | inquire | immediately | 0 | ||
| 14815 | TSK | APM-90A | Prober | 150 MM | 01.06.1996 | 2 | 2 | ||
| 20011 | TSK | UF-200 | Prober | 01.06.2001 | 10 | 3 | |||
| 31544 | TSK | P-12XLm | Prober | 300 MM | 01.10.2006 | 1 | as is where is | 0 | |
| 23174 | TSK | UF200 | PROBER | 200 mm | 1 | as is where is | immediately | 0 | |
| 23175 | TSK | UF200S | PROBER | 200 mm | 5 | as is where is | immediately | 6 | |
| 23176 | TSK | UF200SA | PROBER | 200 mm | 10 | as is where is | immediately | 8 | |
| 23177 | TSK | APM90A | PROBER | 200 mm | 15 | as is where is | immediately | 8 | |
| 27993 | TSK | UF200AL | Prober | 01.07.2000 | 1 | 7 | |||
| 32122 | TSK | UF 300 | Prober unused | 300mm | 01.03.2001 | 1 | 1 | ||
| 33595 | TSK | UF3000 | Prober | 12(300mm) | 01.08.2005 | 1 | as is where is | 0 | |
| 33596 | TSK | UF3000 | Prober | 12(300mm) | 01.08.2005 | 1 | as is where is | 0 | |
| 33786 | TSK | APM-90A | Automatic Wafer Prober, for up to 200mm Wafers | 1 | as is where is | 0 | |||
| 33787 | TSK | APM-90A | Automatic Wafer Prober, for up to 200mm Wafers | 1 | as is where is | 0 | |||
| 14598 | Ultracision | 880 | Wafer Prober | 1 | 1 | ||||
| 26522 | Wentworth | APS80 | Prober | 01.06.2003 | 1 | as is where is | immediately | 1 | |
| 16405 | Wentworth Labs | CMP-100 | Wafer Prober | 1 | 0 | ||||
| 32875 | Wentworth Labs | MP 2000 | PROBER | 200 mm | 1 | as is where is | 0 |
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