Buy and Sell Semiconductor, Assembly, Test and SMT Equipment at fabsurplus.com
On behalf of our European Clients, we are pleased to offer the attached SMT and test Equipment. All Equipment is still installed and in excellent condition. Click on each table item for further details. Photographs and equipment specifications are available on request.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q.ty | Sales Cond. | Lead Time | Att. |
|---|---|---|---|---|---|---|---|---|---|
| 22146 | AGILENT | 5DX Series 3 | X-RAY SYSTEM | ASSEMBLY | 01.06.2005 | 1 | inquire | immediately | 100 |
| 27998 | Agilent | 5DX (spares) | x-ray inspection spare parts | assembly | 1 | as is where is | immediately | 2 | |
| 9878 | ALESSI | REL 4500 | Manual Wafer Prober | 150 mm | 1 | inquire | immediately | 2 | |
| 11569 | Applied Materials | 0290-09018 Rev F | Heat Exchanger | FACILITIES | 01.04.1996 | 1 | inquire | immediately | 3 |
| 32266 | ASA | SBP9300 & Reflow oven | SOLDER BALL INSPECTION SYSTEM AND REFLOW OVEN | assembly | 01.06.1999 | 1 | as is where is | immediately | 10 |
| 33619 | CHATILLON | DFM-10 | Pull Tester | 1 | as is where is | 0 | |||
| 23163 | Cognex | 1600 | character recognition system | ASSEMBLY | 01.06.1995 | 1 | as is where is | immediately | 1 |
| 9916 | DAGE | BT 24 | Ball/Die Shear Tester | ASSEMBLY | 01.06.1994 | 1 | inquire | immediately | 1 |
| 22257 | DAGE | 4000 HS | BOND MICROTESTER HIGH SPEED | ASSEMBLY | 01.05.2007 | 1 | as is where is | immediately | 1 |
| 22258 | DAGE | BT 23 | BALL SHEAR TESTER | ASSEMBLY | 01.06.1992 | 1 | as is where is | immediately | 6 |
| 23142 | DAGE | 5000 | BOND TESTER | ASSEMBLY | 01.03.2007 | 1 | as is where is | immediately | 12 |
| 27753 | Dage | 2400PC | Wire Pull and Ball Shear Tester | 01.05.1999 | 1 | 1 | |||
| 32134 | Dage | 2400-TX | Wire Pull Ball Shear Tester | 1 | 10 | ||||
| 33620 | DAGE | 2400PC-BS500G | 500g Ball Shear Load Cell for Dage 2400 | 1 | as is where is | 0 | |||
| 33621 | DAGE | 2400PC-DS100KG | 100 Kg Die Shear Load Cell for Dage 2400 | 1 | as is where is | 0 | |||
| 33622 | DAGE | 2400PC-WP10KG | 10 Kg Wire Pull Load Cell for Dage 2400 | 1 | as is where is | 0 | |||
| 33623 | DAGE | BT-22 | Microtester with 20gm & 200gm Wire Pull Load Cells | 1 | as is where is | 0 | |||
| 33624 | DAGE | BT-23 | Microtester with LC200 Die Shear Load Cell | 1 | as is where is | 0 | |||
| 33625 | DAGE | PC2400 | Assembly Test Tool | 1 | as is where is | 0 | |||
| 33626 | DAGE | PC2400 | Assembly Test Tool | 1 | as is where is | 0 | |||
| 12073 | Dage Precision | BT 23 | WIRE PULL Tester | ASSEMBLY | 01.02.1989 | 1 | as is where is | immediately | 1 |
| 28005 | Datacon | 2200 APM GlopTop | MULTI CHIP DIE BONDER | assembly | 01.06.2006 | 1 | as is where is | immediately | 1 |
| 28006 | Datacon | APM GlopTop | Dispensing/Coating Equipment | 01.06.2006 | 1 | as is where is | immediately | 1 | |
| 32183 | Datacon | PPS 2310 | MULTI CHIP DIE BONDER | assembly | 01.06.2000 | 1 | inquire | immediately | 11 |
| 22931 | EDO / Barnes Engineering | Emmi | Emission Microscope | ANALYSIS | 01.06.1996 | 1 | as is where is | immediately | 8 |
| 23164 | Eichhorn and Hausmann | MX203 - 8 | Wafer Geometry Gauge | 200 mm | 01.06.1996 | 1 | as is where is | immediately | 3 |
| 16418 | EVEX | EDX probe for SEM | 1 | inquire | immediately | 0 | |||
| 21461 | FEI | XL30 FEG | SEM | 1 | inquire | immediately | 1 | ||
| 23744 | FEIN FOCUS | Tiger (160.40) | X-Ray System | 01.05.2001 | 1 | 1 | |||
| 34065 | Fein Focus | FXS-225/32 | x-ray inspection | 1 | as is where is | immediately | 0 | ||
| 33434 | FISCHER | Fischer Scope | Film Thickness Measureme | - | 01.06.2001 | 1 | inquire | 0 | |
| 16473 | Hitachi | SEM S-6000 | Critical Dimension Scanning Electron Microscopes | 1 | 1 | ||||
| 21457 | Hitachi | S2300 | SEM | 1 | inquire | immediately | 1 | ||
| 22702 | Hitachi | S-4500 | FEM SEM WITH TYPE 2 CHAMBER | 200mm | 01.06.1995 | 1 | as is where is | immediately | 0 |
| 22703 | Hitachi | S-4700 | SEM | 100mm | 1 | inquire | immediately | 12 | |
| 23183 | Hitachi | S5000 | FE SEM for inspection | 200 MM | 01.06.1999 | 1 | inquire | immediately | 0 |
| 26518 | Hitachi | S3000N | Scanning Electron Microscope with EDX | 6 Inch | 01.06.2004 | 1 | inquire | immediately | 21 |
| 27178 | HITACHI | S5200 | SEM | Laboratory Equipment | 01.12.2004 | 1 | inquire | immediately | 2 |
| 34088 | HITACHI | S5200 | inspection sem | Laboratory Equipment | 01.12.2004 | 1 | inquire | immediately | 10 |
| 33435 | HITACHI | S-3000N | SEM | - | 01.06.2002 | 1 | inquire | 0 | |
| 33436 | HITACHI | S-3500H | SEM | - | 01.06.2003 | 1 | inquire | 0 | |
| 33437 | HITACHI | S5500 | INSPECTION SEM | N.A. | 01.06.2006 | 1 | as is where is | immediately | 0 |
| 33438 | HITACHI | WA-200C | AFM | 200 | 01.06.2001 | 1 | inquire | 0 | |
| 33537 | Hitachi | S5000 | INSPECTION SEM | 01.10.1997 | 1 | as is where is | immediately | 3 | |
| 33540 | Hitachi | S5000 | INSPECTION SEM | 01.10.1997 | 1 | as is where is | immediately | 3 | |
| 27185 | Hitachi High-Technologies | S5200 | REM S5200 | Laboratory Equipment | 01.12.2001 | 1 | inquire | immediately | 2 |
| 28000 | HP / Agilent | 5DX-S2L | X-Ray Inspection system | 01.08.1999 | 1 | as is where is | immediately | 6 | |
| 28027 | Ismeca | TMBU-GR.HS | LEAD SCANNER AND TAPING MACHINE | 1 | as is where is | 0 | |||
| 28028 | Ismeca | TMBU-GR.HS | LEAD SCANNER AND TAPING MACHINE | 1 | as is where is | 0 | |||
| 28029 | Ismeca | TMBU-GR.HS | LEAD SCANNER AND TAPING MACHINE | 1 | as is where is | 0 | |||
| 28030 | Ismeca | TMBU-GR.HS | LEAD SCANNER AND TAPING MACHINE | 1 | as is where is | 0 | |||
| 28031 | Ismeca | TMBU-GR.HS | LEAD SCANNER AND TAPING MACHINE | 1 | as is where is | 0 | |||
| 28032 | Ismeca | TMBU-GR.HS | LEAD SCANNER AND TAPING MACHINE | 1 | as is where is | 0 | |||
| 15055 | Jeol | JWS-7505ZH | Microscope | 1 | 0 | ||||
| 16420 | KEVEX | QUADRA | With EDX System | 1 | as is where is | immediately | 0 | ||
| 15057 | KLA-Tencor | FT-750 | Film Thickness Inspection System | 1 | 6 | ||||
| 9994 | KTC | Bond Tester 30 | Wire Bond Pull Tester | 1 | as is where is | 1 | |||
| 21456 | LEO | 435VP | Inspection SEM | 01.06.1999 | 1 | inquire | immediately | 16 | |
| 33538 | LEO | 1560 Gemini | INSPECTION SEM | 1 | as is where is | immediately | 0 | ||
| 33539 | MICRION | 9500 | FIB SEM | 01.11.1996 | 1 | as is where is | immediately | 0 | |
| 15529 | Micro Vu | Smartscope 250 | Video Microscope Measuring System | 01.05.1999 | 1 | as is where is | immediately | 9 | |
| 15530 | Micro Vu | Smarscope 250 | Video Microscope Measuring System | 01.05.1995 | 1 | 6 | |||
| 28034 | Micro-Tec Instrumentation | Z-CHECK 700 S | MICROSCOPE | 1 | as is where is | 0 | |||
| 20243 | microvu | M516 qubix vision | microscope inspection system | ASSEMBLY | 01.09.2000 | 1 | as is where is | immediately | 1 |
| 33627 | MITUTOYO | B504B | Coordinate Measuring Machine | 1 | as is where is | 0 | |||
| 13178 | motic | smz scope and moticam 200 digital camera | 1 | 0 | |||||
| 32257 | Nicolet | NXR1410HR | X-ray machine | 1 | inquire | immediately | 0 | ||
| 10038 | NIKON | Metaphot | Binocular Microscope with 5X, 20X, 40X & 100X BF/DF Obj. Lenses, Polaroid Camera | 125 mm | 1 | as is where is | immediately | 1 | |
| 11111 | Nikon | NWL- 851M | Wafer auto loader | 200 MM | 01.04.1996 | 1 | 5 | ||
| 14573 | Nikon | Optistation 2A | Automatic Wafer Inspection System | 3 | 1 | ||||
| 23157 | Nikon | SMZ-U | INSPECTION MICROSCOPE ZOOM 1:10 | TEST | 01.06.2001 | 1 | as is where is | immediately | 2 |
| 22451 | NIKON | SMZ 645 | MICROSCOPE | ASSEMBLY | 01.10.2007 | 1 | as is where is | immediately | 1 |
| 22453 | NIKON | SMZ800 | STEREO MICROSCOPE | ASSEMBLY | 01.01.2007 | 1 | inquire | immediately | 4 |
| 23155 | Nikon | Optiphot 2 | Trinocular Microscope with 6 inch manual stage | 150 mm | 1 | as is where is | immediately | 1 | |
| 33937 | NIKON | Optistation Mark 7 | Microscope inspection station | 1 | as is where is | immediately | 0 | ||
| 34114 | Nikon | Optiphot 66 | Inspection Microscope with wafer Loader | 2 | 5 | ||||
| 26601 | Niton | XLt797QWZ | XRF Analyser | 01.12.2005 | 2 | as is where is | immediately | 8 | |
| 28033 | OGP | SmartScope Flash 200 | MEASUREMENT MICROSCOPE | 1 | as is where is | 0 | |||
| 33441 | OGP | SMARTSCOPE Z250E | MICROSCOPE | - | 01.06.2000 | 1 | inquire | 0 | |
| 15207 | Olympus | AL100-B8 | Programmable Wafer Loader | 200 mm | 9 | as is where is | immediately | 3 | |
| 31610 | Olympus | SZ40ESD | Microscope Head | 50 | 0 | ||||
| 23169 | Olympus | SZ40 | stereo microscope on stand | ASSEMBLY | 1 | as is where is | immediately | 6 | |
| 25477 | OLYMPUS | ST6045CHI | Binocular Microscope | 1 | 2 | ||||
| 25475 | OLYMPUS | SZH | Trinocular Microscope | 1 | 5 | ||||
| 33439 | OLYMPUS | OSP-SP200 | SPECTROSCOPE | 200 | 01.06.2000 | 1 | inquire | 0 | |
| 33440 | ORC MANUFACTURING | MEM-5296 | BUMP INSPECTION | 200 | 01.06.1999 | 1 | inquire | 0 | |
| 15061 | Philips | SPW-2800 | Xray Inspection System | 150 mm and 200 mm | 01.06.2000 | 1 | inquire | immediately | 7 |
| 22633 | Philips | CM 12 | TEM Transmission Electron Microscope | 1 | as is where is | immediately | 1 | ||
| 22634 | Philips | CM 20 | TEM Transmission Electron Microscope | 1 | as is where is | immediately | 1 | ||
| 22635 | Philips | Various | Parts for TEM Transmission Electron Microscopes | 1 | as is where is | immediately | 15 | ||
| 23159 | Polaron THERMO VG SCIENTIFIC | SC 7620 | Sputter Coater for sample preparation | laboratory | 01.06.2000 | 1 | as is where is | immediately | 1 |
| 20424 | SAMSUNG | FARA VSS-3ES | Mechatronics Center (Vision Inspection machine and Inker for DRAM) | assembly | 01.11.2003 | 2 | as is where is | immediately | 8 |
| 23689 | SOFRON | BST 1505 | X-RAY EXPOSURE SYSTEM | TEST | 01.06.1991 | 1 | as is where is | immediately | 2 |
| 32237 | Sonix | UHR 2001 | Scanning Acoustic Microscope (CSAM) | assembly | 01.04.2005 | 1 | as is where is | immediately | 4 |
| 28026 | Texas Instruments | 4000ER | LEAD SCANNER | 1 | as is where is | 0 | |||
| 32480 | Texas Instruments | 4000ER | LEAD SCANNER | N/A | 1 | inquire | 0 | ||
| 17000 | Veeco | SXM AFM-9960 | Atomic Force Microscope | 75 mm to 200 mm | 01.05.1996 | 1 | as is where is | immediately | 4 |
| 23161 | Vision Engineering | VS 7 | SMT inspection Dynascope system | SMT | 01.06.2000 | 1 | as is where is | immediately | 2 |
| 33628 | WENTWORTH LABS | HOP "Hands Off Probe" | Micropositioner, 2ea Available | 1 | as is where is | 0 | |||
| 10138 | WILD | M410 | Makrozoom Microscope w/Coaxial Illumination, Focus Mechanism, w/o stand | 1 | as is where is | 1 | |||
| 10139 | WILD | M420 | Makrozoom Microscope | 1 | as is where is | immediately | 5 | ||
| 12076 | Zeiss | Standard 20 | Microscope | 1 | 1 |
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