Pre-owned Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com

Please find below a list of Used Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com .Click on any listed item of Fab Metrology , Inspection and QC Equipment to see further data.

SDI ID Manufacturer Model Description Version Vintage Q.ty Sales Cond. Lead Time Att.
16534 ACCENT Q8 REGISTRATION Tool 200mm 1 0
23184 ACCENT (Nanometrix, BioRad) Quaestor Q8 REGISTRATION 200 mm 1 inquire immediately 0
23185 ACCENT (Nanometrix, BioRad) Quaestor Q8 REGISTRATION 1 inquire 0
33532 ACCENT OPTO CDS 200 WAFER INSPECTION 200 MM 1 as is where is immediately 0
30762 ACCRETECH/TSK CRYSTAL EDGE WAFER INSPECTION SYSTEM 1 as is where is 0
30763 ACCRETECH/TSK WIN-WIN 50-1400 WAFER INSPECTION SYSTEM 1 as is where is 0
30764 ACCRETECH/TSK WIN-WIN 50-1400 WAFER INSPECTION SYSTEM 1 as is where is 0
30765 ACCRETECH/TSK WIN-WIN 50-1600 WAFER INSPECTION SYSTEM 1 as is where is 0
14521 ADE 3046A PROFILOMETER 1 inquire immediately 1
20612 ADE AVS AWIS 3110 WAFER INSPECTION SYSTEM 300MM / 200 MM 01.08.2001 1 as is where is immediately 5
23186 ADE 9500 FLATNESS TESTER DIFF 200 mm 1 inquire immediately 2
26133 ADE 9500 ULTRAGAGE WAFER Characterization System 200 mm 1 as is where is immediately 2
33668 ADE Episcan 1000 Epi Metrology Spectromter, ONLINE 2110 Spectrometer Head, IRVINE OPTICAL NanoLoader II 1 inquire 0
33336 Advanced Metrology Systems LLC (AMS) IR3100 Metrology - MBIR 1 inquire 0
27846 AMAT Compass 200 Wafer Inspection System 01.09.2000 0 as is where is 1 month 1
11003 Applied Materials EXCITE IPM 832 BARE SILICON WAFER INSPECTION SYSTEM 200 MM 01.06.2000 1 inquire immediately 10
11561 Applied Materials 7830 si SPARE PARTS FOR CD SEM spares 01.05.1998 1 as is where is immediately 7
17843 Applied Materials SEM VISION Defect Metrology 1 0
18487 Applied Materials ORBOT 736 WAFER INSPECTION SYSTEM 200 mm 01.02.1998 1 as is where is immediately 11
21961 Applied Materials Complus Defect Inspection 300 MM 1 inquire immediately 0
23664 Applied Materials SEM Vision G2 Defect review 200mm/300mm 01.05.2004 1 as is where is 8
32404 Applied Materials SEMVISION_CX Review SEM 200 mm 01.12.2006 1 inquire 0
29700 Applied Materials Opal 7830 SI CD SEM 200 mm 3 as is where is 0
30519 APPLIED MATERIALS SEMVISION G2 - DEFECT REVIEW STATION (MODULE ONLY) INSPECTION - AUTOMATED MACRO-DEFECT 1 as is where is 0
30527 APPLIED MATERIALS SEMVISION CX INSPECTION - DEFECT ANALYSIS 1 as is where is 0
30529 APPLIED MATERIALS SEMVISION G2 INSPECTION - DEFECT ANALYSIS 1 as is where is 0
30530 APPLIED MATERIALS SEMVISION G2 FIB INSPECTION - DEFECT ANALYSIS 1 as is where is 0
30532 APPLIED MATERIALS SEMVISION CX INSPECTION - DEFECT ANALYSIS 1 as is where is 0
30572 APPLIED MATERIALS COMPASS PATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30573 APPLIED MATERIALS COMPASS PRO PATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30574 APPLIED MATERIALS COMPASS PRO PATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30575 APPLIED MATERIALS COMPLUS PATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30576 APPLIED MATERIALS COMPLUS PATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30578 APPLIED MATERIALS COMPLUS PATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30579 APPLIED MATERIALS COMPLUS 2T PATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30580 APPLIED MATERIALS COMPLUS MP PATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30626 APPLIED MATERIALS NANOSEM 3D SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30627 APPLIED MATERIALS NANOSEM 3D SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30663 APPLIED MATERIALS SEMVISION G3 SEM - DEFECT REVIEW 1 as is where is 0
30664 APPLIED MATERIALS SEMVISION G3 FIB SEM - DEFECT REVIEW 1 as is where is 0
31240 Applied Materials Complus SUN Ultra10 Offline station/ADC MGR 200 mm 1 as is where is 0
31241 Applied Materials Complus 3T DARKFIELD WF INSPECTION 200 mm 1 as is where is 0
32798 Applied Materials Compass Pro 200 mm 1 inquire 0
32799 Applied Materials ComPlus 200 mm 1 inquire 0
32800 Applied Materials ComPlus 200 mm 1 inquire 0
32801 Applied Materials ComPlus 200 mm 1 inquire 0
32802 Applied Materials ComPlus 200 mm 1 inquire 0
32803 Applied Materials SEMVision G2 300 mm 01.06.2003 1 inquire 0
32804 Applied Materials SEMVision G3 FIB 300 mm 01.10.2005 1 inquire 0
32805 Applied Materials SEMVision G3 FIB 300 mm 1 inquire 0
32806 Applied Materials UVision 300 mm 01.10.2005 1 inquire 0
32807 Applied Materials UVision 200 mm 01.02.2006 1 inquire 0
32808 Applied Materials VeraSEM 3D 200 mm 1 inquire 0
32809 Applied Materials VeritySEM 300 mm 01.04.2004 1 inquire 0
33524 Applied Materials Centura 5200 ULTIMA CVD system, GIGAFILL HT USG HDP 200 MM 01.04.2000 1 as is where is immediately 0
33525 Applied Materials Producer dual twin SACVD PPS PROCESS 300 MM 01.04.2000 1 as is where is immediately 0
33891 Applied Materials COMPASS SEM 200 MM 01.10.2002 1 as is where is immediately 0
33925 APPLIED MATERIALS COMPASS PRO WAFER INSPECTION 200 MM 01.06.2000 1 as is where is immediately 0
33954 APPLIED MATERIALS SEM VISION SEM 1 inquire 0
33955 APPLIED MATERIALS SEM VISION Defect Metrology 1 inquire 0
16572 Applied Research Lab. 3410 ICP Inductive coupled Plasma Mass Spec. 01.06.1993 1 1
33669 AT&T Automatic Robotic CV Plotter with Mercury Probe 1 inquire 0
33670 AT&T Manual CV Plotter with Mercury Probe, 3ea Available 1 inquire 0
33918 AUGUST AXIS WAFER INSPECTION 1 as is where is immediately 0
32810 Bede Scientific Metrix-F XRD 300 mm 01.10.2004 1 inquire 0
33675 BIO-RAD QS-300 FT-IR Spectrometer 1 inquire 2
33676 BIO-RAD QS-300 FT-IR Spectrometer with MAP300 Wafer Chuck and PIKE AutoPro Motion Controller, WIN-Epi/IR 1 inquire 0
33677 BIO-RAD QS-312 FT-IR Spectrometer for up to 300mm Wafers 01.05.1996 1 inquire 2
33956 BIO-RAD Q7 Metrology 1 inquire 0
14529 BioRad Q7 Q8 Overlay Metrology Tool 75mm-200mm 01.11.1998 1 inquire immediately 1
17458 BioRad QS408M/FTI FTIR Spectrometer 01.06.1994 1 as is where is immediately 1
17851 BioRad QS 500 Automated FT-IR Spectrometer 100-200 mm 01.05.1996 1 as is where is 2 months 6
19267 BIORAD QUAESTOR Q3 OPTICAL METROLOGY 100 mm 1 as is where is immediately 4
29701 BioRad Q5 Overlay 200 mm 7 as is where is 0
29702 BioRad Q7 Overlay 200 mm 3 as is where is 0
33671 BIORAD Q5 Overlay Metrology Tool 1 inquire 0
33672 BIORAD Q6 Overlay Metrology Tool 1 inquire 0
33673 BIORAD Q7 Overlay Metrology Tool 1 inquire 0
33674 BIORAD QS-408M Manual FTIR Spectrometer for Epi, SiN, BPSG Measurement, up to 200mm Wafers 1 inquire 0
33678 BOONTON 72B Capacitance Meter 1 inquire 0
21838 CAMECA SHALLOW PROBE (LEXES) EPI DOPANT CONCENTRATION MEASUREMENT up to 300 MM 01.10.2003 1 inquire immediately 8
33957 CAMECA SHALLOW PROBE Metrology 1 inquire 0
25471 Canon M-830 Ultra Sonic Image Inspection (SAT) 1 6
32473 Carl Zeiss LSM 210 Laser Scanning Microscope and Optical Beam Induced Current(OBIC) system with inst* 200 mm 1 inquire 0
32405 CDE RESMAP468 Resistivity mapping system 200 mm 01.12.2006 1 inquire 2
33679 CDE 463-OC Resistivity Mapping Tool, 150mm-300mm Wafers, 2ea Available. 1 inquire 0
23163 Cognex 1600 character recognition system ASSEMBLY 01.06.1995 1 as is where is immediately 1
30614 CREATIVE DESIGN ENGINEERING, INC RESMAP 463-FOUP RESISTIVITY MEASUREMENT SYSTEM 1 as is where is 0
30615 CREATIVE DESIGN ENGINEERING, INC RESMAP 463-FOUP RESISTIVITY MEASUREMENT SYSTEM 1 as is where is 0
34017 Dage 4000 Wire Pull test system 01.05.2009 1 3
32855 Dionex GT 40 N/A 1 inquire 0
21002 Disco DFD640 DICING SAW 01.06.1995 1 as is where is immediately 0
21003 Disco DFD640 DICING SAW 01.05.1993 1 as is where is immediately 0
27057 E AND H MX2012 Wafer geometry measuring system 300 mm 01.09.1998 1 as is where is immediately 1
27058 E AND H MX2012 Wafer Geometry 300 mm 01.12.2001 1 as is where is immediately 1
16505 Eichhorn and Hausmann MX208 Wafer Geometry Gauge 1 as is where is immediately 5
23164 Eichhorn and Hausmann MX203 - 8 Wafer Geometry Gauge 200 mm 01.06.1996 1 as is where is immediately 3
21968 Emitech K550 Sputter Coater for SEM sample preparation 1 as is all rebuilt immediately 2
16321 ESI 4300 Laser Trim System 01.01.2000 5 as is where is immediately 10
16418 EVEX EDX probe for SEM 1 inquire immediately 0
21461 FEI XL30 FEG SEM 1 inquire immediately 1
14505 FEI XL830 Dual beam FIB workstation 01.06.1998 1 inquire 2 weeks 1
31278 FEI DUAL BEAM EXPIDA1265 FIB SEM 200 AND 300 MM 01.06.2002 1 as is where is 0
32117 FEI 200 XP FIB SEM SINGLE BEAM UP TO 50 MM FRAGMENTS 01.06.2001 1 inquire immediately 13
33680 FEI Expida 1265 Dual Beam IonMill/SEM for up to 300mm Wafers 1 inquire 0
33877 FEI FIB800 FIB 1 as is where is 0
33958 FEI 800 FIB SEM 1 inquire 0
23688 FEINFOCUS FXS 160.40 X-Ray Inspection system 01.05.2001 1 2
33681 FIRST TEN ANGSTROMS FTA-135 Contact Angle Analyzer 1 inquire 0
15948 Four Dimensions 280 Automatic Sheet Resistivity Prober 1 as is all rebuilt 2 weeks 1
26582 Four Dimensions 280 SI Automatic Sheet Resistivity Prober 100-200 mm 01.06.2004 1 as is where is immediately 4
31279 FRONTIER FSM128L-NT FILM STRESS AND WAFER BOW MEASUREMENT 01.06.2006 1 as is where is 0
33459 FRONTIER FSM128L FILM STRESS/WAFER BOW 300 01.06.2003 1 inquire 0
9961 GCA TROPEL 9000 Surface Flatness Analyzer 1 as is where is immediately 3
9967 HITACHI S7000 CD SEM 150 mm 01.06.1989 1 inquire immediately 4
14856 Hitachi S8820 CD SEM 200 mm 01.03.1997 1 inquire immediately 7
15381 Hitachi S5000 FE Inspection SEM 01.06.1998 1 as is where is immediately 1
16407 Hitachi S4500 FE Inspection SEM Type 1 chamber & Type 2 on 2nd S-4500 01.06.1996 2 as is where is immediately 0
16408 Hitachi S4500 FE Inspection SEM Type 2 chamber 01.06.1996 2 as is where is immediately 0
16409 Hitachi S4700 FE Inspection SEM Type 2 chamber 01.06.2001 1 inquire immediately 3
16419 Hitachi S570 Inspection sem with EDX 1 as is where is immediately 0
20439 Hitachi S7800 CD-SEM 200 MM 01.08.1997 1 inquire immediately 0
21346 Hitachi S9380 CD SEM 200mm 1 0
21457 Hitachi S2300 SEM 1 inquire immediately 1
32430 Hitachi IS2600 Wafer Inspecsion 200 mm 01.12.2006 1 inquire 0
32431 Hitachi S-4500 FESEM 200 mm 01.07.1995 1 inquire 0
32408 Hitachi S-8840 CD-SEM 200 mm 01.12.1997 1 inquire 0
32409 Hitachi S-9200 CD-SEM 200 mm 01.04.2000 1 inquire 0
32406 Hitachi S-8820S CD-SEM 200 mm 01.02.1996 1 inquire 0
32407 Hitachi S-8840 CD-SEM 200 mm 01.08.1997 1 inquire 0
31294 HITACHI S-9380 TYPE II CD-SEM 300 MM 01.06.2005 1 as is where is 0
31292 HITACHI S-9380 TYPE II CD-SEM 300 MM 01.06.2004 1 as is where is 0
31291 HITACHI S-9360 CD-SEM 300 MM 01.06.2005 1 as is where is 0
31290 HITACHI S-9360 CD-SEM 200 AND 300 MM 01.06.2003 1 as is where is 0
31289 HITACHI S-9220 CD-SEM 01.06.2000 1 as is where is 0
31282 HITACHI LS-6800 WAFER PARTICLE INSPECTION SYSTEM 200 AND 300 MM 01.06.2005 1 as is where is 0
31281 HITACHI IS2700 DARK-FIELD INSPECTION SYSTEM 200 AND 300 MM 01.06.2003 1 as is where is 0
21839 HITACHI S9380 CD SEM 200 MM 1 inquire immediately 0
22636 Hitachi S-4160 Hitachi SEM with EDX 1 4
22702 Hitachi S-4500 FEM SEM WITH TYPE 2 CHAMBER 200mm 01.06.1995 1 as is where is immediately 0
22703 Hitachi S-4700 SEM 100mm 1 inquire immediately 12
23183 Hitachi S5000 FE SEM for inspection 200 MM 01.06.1999 1 inquire immediately 0
23198 HITACHI S8840 CD SEM 1 inquire immediately 0
23199 HITACHI S9220 CD SEM W/ SMIF 1 inquire immediately 0
23200 HITACHI S9220 CD SEM 1 inquire immediately 0
23201 HITACHI S9220 CD SEM 1 inquire immediately 0
23202 HITACHI S9380 CD SEM 200 mm 1 inquire immediately 0
26518 Hitachi S3000N Scanning Electron Microscope with EDX 6 Inch 01.06.2004 1 inquire immediately 21
26026 HITACHI PD-3000 RETICLE PARTICLE DETECTION 200 mm 01.05.1998 1 inquire 1
25472 Hitachi Mi-Scope 10 Scanning Acoustic Microscope (SAM) 01.06.1995 1 as is where is immediately 3
25468 Hitachi S-2700 SEM with EDX 01.03.1991 1 17
27178 HITACHI S5200 SEM Laboratory Equipment 01.12.2004 1 inquire immediately 2
28094 Hitachi S-5000 INSPECTION SEM 1 as is where is 0
34088 HITACHI S5200 inspection sem Laboratory Equipment 01.12.2004 1 inquire immediately 10
34078 Hitachi S9220 CD SEM 200 mm 01.05.2000 3 inquire immediately 0
32834 Hitachi IS-2600 300 mm 01.11.2001 1 inquire 0
32835 Hitachi S-4500 N/A 1 inquire 0
32836 Hitachi S-5000 N/A 1 inquire 0
32837 Hitachi S-9380-II 300 mm 01.11.2005 1 inquire 0
33460 HITACHI S-6200H CD-SEM 150 01.06.1996 1 inquire 0
33461 HITACHI S-7800 CD-SEM 125 01.06.1997 1 inquire 0
33462 HITACHI S-8840 CD-SEM 200 01.06.1998 1 inquire 0
33463 HITACHI S-9220 CD-SEM 200 01.06.2000 1 inquire 0
33464 HITACHI S-9380II CD-SEM 300 01.06.2003 1 inquire 0
33465 HITACHI S-9380II CD-SEM 300 01.06.2006 1 inquire 0
33466 HITACHI S-9380II CD-SEM 300 01.06.2007 1 inquire 0
33467 HITACHI WA-200C AFM 200 01.06.2001 1 inquire 0
33535 Hitachi S8820 CD SEM 200 MM 1 as is where is immediately 0
33536 Hitachi S8820 CD SEM 200 MM 1 as is where is immediately 0
33537 Hitachi S5000 INSPECTION SEM 01.10.1997 1 as is where is immediately 3
33540 Hitachi S5000 INSPECTION SEM 01.10.1997 1 as is where is immediately 3
33570 Hitachi S-8840 Scanning Electron Microscope 8 inch 01.12.1997 1 inquire 0
33571 Hitachi S-8840 Scanning Electron Microscope 8 inch 01.01.1998 1 inquire 0
33893 Hitachi S9300 CD SEM 200 MM 01.10.1999 1 as is where is immediately 0
33928 Hitachi S8840 CD SEM 200 mm 01.05.2000 1 inquire immediately 0
33934 Hitachi S9300 CD SEM 200 mm 1 inquire immediately 0
33959 HITACHI S5000 INSPECTION SEM 1 inquire 0
23284 Hitachi (SEM) S-4160 FE SEM 1 inquire 0
30630 HITACHI (SEMICONDUCTOR) S-6100 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30631 HITACHI (SEMICONDUCTOR) S-8820 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30632 HITACHI (SEMICONDUCTOR) S-8820 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30633 HITACHI (SEMICONDUCTOR) S-8820 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30634 HITACHI (SEMICONDUCTOR) S-8820 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30635 HITACHI (SEMICONDUCTOR) S-8820 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30636 HITACHI (SEMICONDUCTOR) S-8820 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30638 HITACHI (SEMICONDUCTOR) S-8840 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30639 HITACHI (SEMICONDUCTOR) S-9200 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30640 HITACHI (SEMICONDUCTOR) S-9200 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30641 HITACHI (SEMICONDUCTOR) S-9220 SEM - CD (CRITICAL DIMENSION) 01.04.2001 1 as is where is immediately 0
30642 HITACHI (SEMICONDUCTOR) S-9220 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30643 HITACHI (SEMICONDUCTOR) S-9220 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30644 HITACHI (SEMICONDUCTOR) S-9220 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30645 HITACHI (SEMICONDUCTOR) S-9220 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30648 HITACHI (SEMICONDUCTOR) S-9380 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30649 HITACHI (SEMICONDUCTOR) S-9200 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30650 HITACHI (SEMICONDUCTOR) S-9200 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30791 HITACHI (SEMICONDUCTOR) Z-8270 SPECTROMETER - POLARIZED ZEEMAN ATOMIC ABSORPTION 1 as is where is 0
27185 Hitachi High-Technologies S5200 REM S5200 Laboratory Equipment 01.12.2001 1 inquire immediately 2
31635 Horiba PD3000 RETICLE INSPECTION 01.02.1994 1 as is where is 4
32838 Horiba PD3000 N/A 1 inquire 0
33468 HORIBA UT-300 20 FILM THICKNESS 0 ???/??? 01.06.2006 1 inquire 0
30767 HSEB DRESDEN GMBH AXIOSPECT WAFER INSPECTION SYSTEM 1 as is where is 0
27192 ION-TOF TOF 300 TOF-SIMS Mass Spectrometer for full wafers up to 300 mm 01.02.2008 1 inquire immediately 2
33683 IONIC SYSTEMS Stressgauge Wafer Stress Measurement Tool,150mm Wafers, 2ea Available 1 inquire 0
33684 IONIC SYSTEMS Stressgauge II Wafer Stress Measurement Tool,150mm Wafers 1 inquire 0
11069 IRVINE OPTICAL UltraSpec III Wafer Inspection microscope 3 to 6 inch 1 inquire immediately 1
33685 IRVINE OPTICAL Ultrasort 208 Wafer Sorting Tool, 200mm 1 inquire 0
33686 IRVINE OPTICAL Ultrasort 208 Wafer Sorting Tool, 200mm 1 inquire 0
30555 IVS, INC. ACV4 OVERLAY MEASUREMENT SYSTEM 1 as is where is 0
30503 J. A. WOOLLAM VUV-VASE ELLIPSOMETER 1 as is where is 0
15289 JEOL JSM 7550 INSPECTION SEM 200 mm 01.06.1996 1 as is where is immediately 12
15299 JEOL JSM 7700 INSPECTION SEM 200 mm 01.06.1995 1 as is where is immediately 0
17461 Jeol JWS-7855S SEM Scope Mask Observation 01.05.2001 1 1
34064 JEOL JSM 5300LV SEM 1 as is where is immediately 0
29638 JEOL JWS-7500E SEM 200 mm 1 as is where is 0
29703 Jeol 7505 SEM 200 mm 1 as is where is 0
30670 JEOL JFS-9855S SEM - FIB (FOCUSED ION BEAM) 1 as is where is 1
30671 JEOL JWS-8755S SEM (SCANNING ELECTRON MICROSCOPE) 1 as is where is 0
32159 Jeol JWS 7700 FE Inspection SEM 1 1
32811 JEOL JSM6320 Field Emission SEM N/A 1 inquire immediately 0
33337 JEOL JWS3000 FE Sem for wafer defect review up to 300 mm 01.06.2004 1 inquire immediately 0
22994 Jeol / Holon EMU-220 CD SEM / Mask Measurement 01.07.2002 1 inquire immediately 4
30789 JORDAN VALLEY SEMICONDUCTORS LTD JVX 6200 1 as is where is 0
16420 KEVEX QUADRA With EDX System 1 as is where is immediately 0
26577 KLA 2135 WAFER INSPECTION 200 mm 1 5
1680 KLA TENCOR 2132 bright-field WAFER INSPECTION 200 mm 01.08.1995 1 inquire immediately 40
9991 KLA TENCOR RS 55 Resistivity Mapping Tool 100mm - 200 mm 01.06.1991 1 as is all rebuilt immediately 3
15493 KLA Tencor Surfscan 7700 Patterned Wafer Surface Inspection Tool 200 mm 01.06.1997 1 inquire immediately 4
17831 KLA TENCOR 2135 Defect Metrology 200mm 1 1
19018 KLA Tencor 2138 wafer inspection system 200 mm 01.01.1998 1 inquire immediately 10
20938 KLA TENCOR AIT XP Wafer Inspection Equipment 200 mm 1 1
21834 KLA TENCOR 6200 bare wafer surface inspection 200 MM 2 inquire immediately 0
21334 KLA Tencor ES31 Voltage Contrast SEM 1 0
21335 KLA Tencor 6200 Surfscan Particle detection 2 0
21343 KLA Tencor AIT 2 + Fusion Patterned and unpatterened wafer inspection 200 mm 01.06.2005 1 inquire immediately 2
21345 KLA Tencor AIT 2 + FUSION Wafer inspection System 200 MM 01.06.2005 1 inquire immediately 2
21853 KLA TENCOR 6200 wafer surface inspection 150 MM AND 200 MM 01.03.1993 1 inquire immediately 3
21962 KLA Tencor Stealth Defect Inspection 200 MM 1 inquire immediately 0
34062 KLA TENCOR 2135 Bight field wafer inspection 200mm 1 as is where is immediately 10
32230 KLA TENCOR SFS6400 MECHANICAL CALIBRATION Document Number 238 WAFERSURFACE ANALYSIS SYSTEM CUSTOMER MAINTENANCE REFERENCE MANUAL 1 as is where is immediately 1
32231 KLA TENCOR Surfscan 64X0 Calibration Procedure Surfscan 64X0 Calibration Procedure MANUAL 1 as is where is immediately 1
32232 KLA TENCOR surfscan 64XX optical alignments Document Number 236 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately 1
32233 KLA TENCOR SFS6x00 MECHANICAL CALIBRATION Document number 200 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately 1
33935 KLA TENCOR QUANTOX 64100 Metrology 200mm 1 as is where is 0
1691 KLA-TENCOR 259 (spare parts) Reticle Inspection - SPARE PARTS up to 7 inch 01.12.1991 1 inquire immediately 0
15058 KLA-Tencor Surfscan 7700 Patterned Wafer Surface Inspection Tool 01.05.1996 2 1
15562 KLA-TENCOR eS20XP CD-SEM e-beam inspection system SMIF 200 MM 01.09.2001 1 as is where is immediately 0
15563 KLA-TENCOR 8100XP CD SEM WITH SMIF 100-200 MM 01.07.2001 1 as is where is immediately 0
15564 KLA-TENCOR 8100XP CD SEM SMIF FITTED 100-200 MM 01.11.1998 1 as is where is immediately 0
15565 KLA-TENCOR FABVARS VARS IMAGE STORAGE DATABASE FACILITIES 01.07.2000 1 as is where is immediately 0
15797 KLA-TENCOR eS20XP CD-SEM 1 as is where is 0
16441 KLA-TENCOR 2132 Patterned wafer brightfield defect inspection 200 mm 1 as is where is immediately 0
17464 KLA-TENCOR 2550 WAFER INSPECTION COMPUTER facilities 01.02.1992 1 as is where is immediately 0
19345 KLA-Tencor TeraStar Reticle Inspection System reticle 01.06.2002 1 inquire immediately 0
20140 KLA-Tencor Viper 2401 MACRO DEFECT INSPECTION SYSTEM 1 inquire immediately 0
20141 KLA-Tencor Viper 2401 MACRO DEFECT INSPECTION SYSTEM 1 inquire immediately 0
20142 KLA-Tencor Viper 2401 MACRO DEFECT INSPECTION SYSTEM 150 MM 01.12.1998 1 inquire immediately 5
20480 KLA-TENCOR 6220 WAFER INSPECTION 2 to 8 inch 1 inquire immediately 0
20673 KLA-TENCOR VIPER 2410 MACRO WAFER DEFECT INSPECTION 200 MM 01.06.2001 1 as is where is 0
31505 KLA-Tencor  SFS6200  Inspection  200 mm 01.11.1993 1 as is where is 0
31506 KLA-Tencor  SFS6200  Inspection  200 mm 01.05.1993 1 as is where is 0
31507 KLA-Tencor  SFS6200  Inspection  200 mm 01.11.1993 1 as is where is 0
32429 KLA-Tencor RS75TC Resistivity mapping system 200 mm 01.09.1997 1 inquire 0
32432 KLA-Tencor SURFSCAN 6420 Surface Analyzer 200 mm 01.09.1995 1 inquire 0
32433 KLA-Tencor SURFSCAN 7600 Surface Analyzer 200 mm 01.05.1995 1 inquire 0
32426 KLA-Tencor UV-1280SE Thin Film Measurement 200 mm 01.10.2000 1 inquire 0
32427 KLA-Tencor KLA-5200XP Overlay measurement 200 mm 01.08.2000 1 inquire 0
32428 KLA-Tencor KLA-5200XP Overlay measurement 200 mm 01.02.2006 1 inquire 0
32414 KLA-Tencor RS35C Resistivity mapping system 200 mm 01.09.1996 1 inquire 0
32415 KLA-Tencor SFS6420 Non pattern wafer inspection 200 mm 01.02.1996 1 inquire 0
32416 KLA-Tencor SFS6420 Non pattern wafer inspection 200 mm 01.09.1996 1 inquire 0
32410 KLA-Tencor HRP-240 High Resolution Surface Profiler 200 mm 01.05.2006 1 inquire 0
32411 KLA-Tencor M-GAGE300 Thin Film Measurement 200 mm 01.01.1996 1 inquire 0
32412 KLA-Tencor P-2 Surface Profiler 200 mm 01.01.1996 1 inquire 0
32413 KLA-Tencor RS35C Resistivity mapping system 200 mm 01.01.1996 1 inquire 0
31301 KLA-TENCOR 5200XP OVERLAY MEASUREMENT 200 MM 01.06.2000 1 as is where is 0
21857 KLA-TENCOR AIT WAFER SURFACE PARTICLE INSPECTION SYSTEM 125-200 MM 1 as is where is immediately 0
22719 KLA-Tencor Surfscan SP-1 Classic Wafer Surface Inspection System Multiple 01.06.2002 1 inquire 2 weeks 8
23203 KLA-TENCOR 6220 SURFSCAN BARE 200 mm 01.02.1999 1 inquire immediately 0
26160 KLA-TENCOR 2139 WAFER INSPECTION SYSTEM 200 mm 01.05.1996 1 inquire immediately 1
26158 KLA-TENCOR 2139 WAFER INSPECTION SYSTEM 200 mm 01.05.1996 1 inquire immediately 1
26138 KLA-TENCOR 2139 WAFER INSPECTION 150 mm 01.01.2001 1 inquire immediately 1
26119 KLA-TENCOR SURFSCAN 6220 UNPATTERNED WAFER SURFACE INSPECTION 200 mm 01.03.1998 1 inquire 1
26084 KLA-TENCOR P-22 Automated SURFACE PROFILER 200 mm 01.02.1997 1 inquire 1
26574 KLA-Tencor 2135 XP BRIGHTFIELD WAFER DEFECT INSPECTION 200 mm 01.09.1996 1 as is where is immediately 9
27225 KLA-TENCOR AIT 2 FUSION Darkfield Defect inspection system 300 mm 01.11.1998 1 inquire immediately 1
27230 KLA-TENCOR ASET F5X Film Thickness Measurement F5+ 300 mm 01.06.2001 1 as is where is immediately 4
27789 KLA-Tencor SP1 TBI unpatterned wafer surface inspecion system 200 and 300 mm 01.06.2000 1 inquire immediately 1
27796 KLA-Tencor Surfscan SP-1 Classic Wafer Surface Inspection System Multiple 01.03.1997 1 inquire 2 weeks 2
27865 KLA-Tencor SP1-TBI WAFER INSPECTION SYSTEM 200 MM 01.01.2001 1 inquire immediately 2
28024 KLA-TENCOR ES32 VOLTAGE CONTRAST SEM 01.07.2004 1 inquire immediately 5
28097 KLA-Tencor 6100 WAFER PARTICLE DETECTION 1 as is where is 0
28098 KLA-Tencor 6100 WAFER PARTICLE DETECTION 1 as is where is 0
28099 KLA-Tencor 6420 WAFER PARTICLE DETECTION 1 as is where is 0
28100 KLA-Tencor 7700 WAFER PARTICLE DETECTION 1 as is where is 0
34053 KLA-Tencor 6420 surface particle detection system 1 as is where is immediately 1
29705 KLA-TENCOR FT 600 Film thickness 200 mm 1 as is where is 0
29706 KLA-TENCOR FT 750 Film thickness 200 mm 4 as is where is 0
29707 KLA-TENCOR QUANTOX 200 mm 1 as is where is 0
29708 KLA-TENCOR QUANTOX spare parts tool 200 mm 1 as is where is 0
30594 KLA-TENCOR PUMA 9130 PATTERNED WAFER INSPECTION SYSTEM 200/300 mm 1 as is where is immediately 1
31238 KLA-Tencor AIT UV Inspection System 200 mm 1 as is where is 0
31239 KLA-Tencor AIT UV Inspection System 200 mm 1 as is where is 0
31242 KLA-Tencor 5100 XP registration tool / overlay measurement 200 mm 01.04.1999 1 inquire immediately 13
31243 KLA-Tencor AIT UV Inspection System 200 mm 1 as is where is 0
31244 KLA-Tencor 8250 cd sem 200 mm 1 as is where is 0
32208 KLA-TENCOR 9000 PUMA darkfield defect inspection system 300 mm 01.06.2004 1 inquire immediately 1
32203 KLA-TENCOR 9000 PUMA darkfield defect inspection system 300 mm 01.06.2004 1 inquire immediately 1
32234 KLA-TENCOR 9000 PUMA darkfield defect inspection system 300 mm 01.06.2004 1 inquire immediately 1
32812 KLA-Tencor 6100 200 mm 01.12.1993 1 inquire 0
32813 KLA-Tencor 6200 200 mm 1 inquire 0
32814 KLA-Tencor 6420 150 mm 01.07.1998 1 inquire 0
32815 KLA-Tencor 7700 200 mm 01.11.1995 1 inquire 0
32816 KLA-Tencor 7700 200 mm 01.11.1995 1 inquire 0
32817 KLA-Tencor 8250 N/A 1 inquire 0
32818 KLA-Tencor AIT Fusion UV 200 mm 1 inquire 0
32819 KLA-Tencor AIT Fusion UV 200 mm 1 inquire 0
32820 KLA-Tencor AIT Fusion UV 200 mm 1 inquire 0
32821 KLA-Tencor AIT Fusion XUV 200 mm 1 inquire 0
32822 KLA-Tencor Archer 10 200 mm 1 inquire 0
32823 KLA-Tencor Archer 10 200 mm 01.03.2003 1 inquire 0
32824 KLA-Tencor Archer 10 200 mm 1 inquire 0
32825 KLA-Tencor Archer AIM 200 mm 01.05.2000 1 inquire 0
32826 KLA-Tencor eS32 300 mm 01.06.2005 1 inquire 0
32827 KLA-Tencor SP1 200 mm 1 inquire 0
32828 KLA-Tencor SP1-DLS 200 mm 1 inquire 0
32829 KLA-Tencor SP1-DLS 200 mm 01.08.2004 1 inquire 0
32830 KLA-Tencor SP1-DLS 300 mm 01.01.2005 1 inquire 0
32831 KLA-Tencor SP1-TBI 200 mm 01.09.2002 1 inquire 0
32832 KLA-Tencor SP2 300 mm 01.09.2007 1 inquire 0
32833 KLA-Tencor SP2 200 mm 1 inquire 0
33078 KLA-Tencor SL301 Reticle inspection system 01.06.1996 1 as is where is immediately 34
33079 KLA-Tencor SL3UV HR Reticle inspection system 01.06.2002 1 as is where is immediately 6
33522 KLA-TENCOR AIT XP WAFER INSPECTION 200 MM 01.06.2000 1 as is where is immediately 0
33523 KLA-TENCOR AIT XP WAFER INSPECTION 200 MM 01.09.2000 1 as is where is immediately 0
33527 KLA-Tencor Surfscan 7600 Wafer inspection system 200 MM 01.03.1997 1 as is where is immediately 0
33529 KLA-TENCOR UV 1280 SE Thin film measurement 200 MM 1 as is where is immediately 0
33572 KLA-Tencor SFS6200 Bare Wafer Inspection 8 inch 01.01.1995 1 inquire 0
33573 KLA-Tencor SFS6200 Bare Wafer Inspection 8 inch 01.02.1995 1 inquire 0
33574 KLA-Tencor SFS6420 Bare Wafer Inspection, Wafer Size:6,8 8 inch 01.01.1996 1 inquire 0
33575 KLA-Tencor UV-1280SE Film Thickness Measurement 8 inch 01.11.1998 1 inquire 0
33576 KLA-Tencor UV-1280SE Film Thickness Measurement 8 inch 01.05.1998 1 inquire 0
33577 KLA-Tencor UV-1280SE Film Thickness Measurement 8 inch 01.11.1998 1 inquire 0
33687 KLA-TENCOR 5100 Overlay Metrology Tool for 200mm Wafers 1 inquire 0
33688 KLA-TENCOR AlphaStep 200 Profilometer 1 inquire 2 weeks 1
33689 KLA-TENCOR CRS-3000 Confocal Review Station for up to 300mm Wafers 1 inquire 0
33690 KLA-TENCOR P-2 Long Scan Profiler 1 inquire 0
33691 KLA-TENCOR P-22 Long Scan Profiler, Cassette to Cassette 1 inquire 0
33692 KLA-TENCOR SpectraFx 200 Optical Thin-Film Metrology System 1 inquire 0
33693 KLA-TENCOR Surfscan 7700 Patterned Wafer Surface Inspection Tool 1 inquire 0
33694 KLA-TENCOR Surfscan 7700 Patterned Wafer Surface Inspection Tool 1 inquire 0
33695 KLA-TENCOR Surfscan AIT Patterned Wafer Surface Inspection Tool 1 inquire 0
33696 KLA-TENCOR Surfscan AIT 8020 Patterned Wafer Surface Inspection Tool with Autofocus Review 1 inquire 0
33892 KLA-Tencor Aset F5 Metrology system 200 MM 01.10.1999 1 as is where is immediately 0
33894 KLA-Tencor RS 55 TC Metrology system 200 MM 01.06.1996 1 as is where is immediately 0
33895 KLA-Tencor 6220 WAFER SURFACE INSPECTION 200 MM 01.04.1996 1 as is where is immediately 0
33896 KLA-Tencor 6220 WAFER SURFACE INSPECTION 200 MM 01.04.1996 1 as is where is immediately 0
33897 KLA-Tencor AIT WAFER SURFACE INSPECTION 200 MM 01.03.1998 1 as is where is immediately 0
33898 KLA-Tencor SURFSCAN 7600 WAFER SURFACE INSPECTION 200 MM 01.04.1995 1 as is where is immediately 0
33900 KLA-Tencor SURFSCAN 6200 WAFER SURFACE INSPECTION 200 MM 01.06.1994 1 as is where is immediately 0
33901 KLA-Tencor SURFSCAN 6220 WAFER SURFACE INSPECTION 200 MM 01.05.1999 1 as is where is immediately 0
33902 KLA-Tencor RS 55 TC RESMAP 200 MM 01.06.1996 1 as is where is immediately 0
33906 KLA-Tencor Surfscan AIT WAFER INSPECTION 200 MM 01.04.1999 1 as is where is immediately 0
33907 KLA-Tencor AIT UV WAFER SURFACE INSPECTION DUAL SMIF 200 MM 01.10.2002 1 as is where is immediately 0
33911 KLA-Tencor AIT UV WAFER SURFACE INSPECTION DUAL SMIF 200 MM 01.08.2002 1 as is where is immediately 0
33912 KLA-Tencor QUANTOX WAFER INSPECTION 200 MM 01.08.2002 1 as is where is immediately 0
33914 KLA-Tencor 2370 STEALTH WAFER INSPECTION 300 MM 01.02.2003 1 as is where is immediately 0
33915 KLA-Tencor 2608 WAFER INSPECTION 200 MM 1 as is where is immediately 0
33916 KLA-Tencor 2350 WAFER INSPECTION 200 MM 01.09.2000 1 as is where is immediately 0
33919 KLA-Tencor FUSION XUV PLUS WAFER INSPECTION 200 MM 01.06.2004 1 as is where is immediately 0
33923 KLA-Tencor RS100 WAFER INSPECTION 200 MM 01.06.2000 1 as is where is immediately 0
33960 KLA-TENCOR 2132 BRIGHT FIELD WAFER INSPECTION 1 inquire 0
33961 KLA-TENCOR SP1 Defect Metrology 1 inquire 0
33962 KLA-TENCOR 5340PS OVERLAY MEASUREMENT 1 inquire 0
33963 KLA-TENCOR AIT UV Defect Metrology 1 inquire 0
33964 KLA-TENCOR AIT UV+ Defect Metrology 1 inquire 0
33965 KLA-TENCOR AIT-XP PLUS Defect Metrology 1 inquire 0
33966 KLA-TENCOR AIT2 Defect Metrology 1 inquire 0
33967 KLA-TENCOR ARCHER 10 OVERLAY MEASUREMENT 1 inquire 0
33968 KLA-TENCOR SP1 DEFECT INSPECTION 1 inquire 0
33969 KLA-TENCOR SP1 TBI READY Defect Metrology 1 inquire 0
34090 KLA-Tencor Corp. 2800 (Parts) Front end of Patterned wafer inspection system 300 MM 01.11.2006 1 as is where is immediately 1
30520 KLA-TENCOR CORP. VIPER 2401 INSPECTION - AUTOMATED MACRO-DEFECT 1 as is where is 0
30521 KLA-TENCOR CORP. VIPER 2401 INSPECTION - AUTOMATED MACRO-DEFECT 1 as is where is 0
30522 KLA-TENCOR CORP. VIPER 2401 INSPECTION - AUTOMATED MACRO-DEFECT 1 as is where is 0
30523 KLA-TENCOR CORP. VIPER 2401 INSPECTION - AUTOMATED MACRO-DEFECT 1 as is where is 0
30524 KLA-TENCOR CORP. VIPER 2410 INSPECTION - AUTOMATED MACRO-DEFECT 200 mm 01.01.2001 1 as is where is 1
30525 KLA-TENCOR CORP. VIPER 2410 INSPECTION - AUTOMATED MACRO-DEFECT 1 as is where is 0
30533 KLA-TENCOR CORP. CRS-1200-S INSPECTION - DEFECT ANALYSIS 1 as is where is 0
30556 KLA-TENCOR CORP. 5200XP OVERLAY MEASUREMENT SYSTEM 1 as is where is 0
30557 KLA-TENCOR CORP. 5200XP OVERLAY MEASUREMENT SYSTEM 1 as is where is 0
30558 KLA-TENCOR CORP. 5200XP OVERLAY MEASUREMENT SYSTEM 1 as is where is 0
30559 KLA-TENCOR CORP. 5200XP OVERLAY MEASUREMENT SYSTEM 1 as is where is 0
30560 KLA-TENCOR CORP. 5200XP OVERLAY MEASUREMENT SYSTEM 1 as is where is 0
30561 KLA-TENCOR CORP. 5200XP OVERLAY MEASUREMENT SYSTEM 1 as is where is 0
30562 KLA-TENCOR CORP. 5200XP OVERLAY MEASUREMENT SYSTEM 1 as is where is 0
30563 KLA-TENCOR CORP. 5200XP OVERLAY MEASUREMENT SYSTEM 1 as is where is 0
30565 KLA-TENCOR CORP. ARCHER 10 OVERLAY MEASUREMENT SYSTEM 01.03.2000 1 as is where is 1
30583 KLA-TENCOR CORP. AIT XP PATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30584 KLA-TENCOR CORP. AIT XP PATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30585 KLA-TENCOR CORP. AIT XP PATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30586 KLA-TENCOR CORP. AIT XP PATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30587 KLA-TENCOR CORP. AIT XP+ PATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30588 KLA-TENCOR CORP. AIT XP+ PATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30589 KLA-TENCOR CORP. AIT XP+ PATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30590 KLA-TENCOR CORP. AIT XP+ PATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30591 KLA-TENCOR CORP. AIT XP+ PATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30592 KLA-TENCOR CORP. AIT XP+ PATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30593 KLA-TENCOR CORP. AIT XP+ PATTERNED WAFER INSPECTION SYSTEM 200 mm 01.05.2000 1 as is where is 1
30595 KLA-TENCOR CORP. SURFSCAN AIT PATTERNED WAFER INSPECTION SYSTEM WITH SMIF PORTS 01.12.2000 1 as is where is immediately 0
30596 KLA-TENCOR CORP. SURFSCAN AIT PATTERNED WAFER INSPECTION SYSTEM 200 MM 01.12.1997 1 as is where is immediately 0
30597 KLA-TENCOR CORP. SURFSCAN AIT PATTERNED WAFER INSPECTION SYSTEM WITH SMIF PODS 200 MM 01.02.2001 1 as is where is immediately 0
30598 KLA-TENCOR CORP. SURFSCAN AIT PATTERNED WAFER INSPECTION SYSTEM 200 mm 01.12.1997 1 as is where is immediately 0
30610 KLA-TENCOR CORP. HRP-240 PROFILOMETER - LONG SCAN 1 as is where is 0
30611 KLA-TENCOR CORP. HRP-240 PROFILOMETER - LONG SCAN 1 as is where is 0
30616 KLA-TENCOR CORP. OMNIMAP RS75 RESISTIVITY MEASUREMENT SYSTEM 1 as is where is 0
30617 KLA-TENCOR CORP. OMNIMAP RS75 RESISTIVITY MEASUREMENT SYSTEM 1 as is where is 0
30618 KLA-TENCOR CORP. RS-100 RESISTIVITY MEASUREMENT SYSTEM 1 as is where is 0
30619 KLA-TENCOR CORP. RS-100 RESISTIVITY MEASUREMENT SYSTEM 1 as is where is 0
30620 KLA-TENCOR CORP. RS-100 RESISTIVITY MEASUREMENT SYSTEM 1 as is where is 0
30621 KLA-TENCOR CORP. RS-100 RESISTIVITY MEASUREMENT SYSTEM 1 as is where is 0
30622 KLA-TENCOR CORP. RS-75 OMNIMAP RESISTIVITY MEASUREMENT SYSTEM 1 as is where is 0
30623 KLA-TENCOR CORP. RS-75 OMNIMAP RESISTIVITY MEASUREMENT SYSTEM 1 as is where is 0
30624 KLA-TENCOR CORP. RS-75 OMNIMAP RESISTIVITY MEASUREMENT SYSTEM 1 as is where is 0
30625 KLA-TENCOR CORP. RS-75 OMNIMAP RESISTIVITY MEASUREMENT SYSTEM 1 as is where is 0
30651 KLA-TENCOR CORP. 8100XP SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30652 KLA-TENCOR CORP. 8100XP SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30653 KLA-TENCOR CORP. 8100XP SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30654 KLA-TENCOR CORP. 8100XP-S SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30656 KLA-TENCOR CORP. ECD-1 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30657 KLA-TENCOR CORP. ECD-1 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30658 KLA-TENCOR CORP. ECD-1 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30659 KLA-TENCOR CORP. ECD-1 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30660 KLA-TENCOR CORP. ECD-1 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30661 KLA-TENCOR CORP. ECD-2 SEM - CD (CRITICAL DIMENSION) 1 as is where is 0
30666 KLA-TENCOR CORP. EV300 SEM - DEFECT REVIEW 1 as is where is 0
30667 KLA-TENCOR CORP. EV300 SEM - DEFECT REVIEW 1 as is where is 0
30668 KLA-TENCOR CORP. EV300 SEM - DEFECT REVIEW 1 as is where is 0
30669 KLA-TENCOR CORP. EV300 SEM - DEFECT REVIEW 1 as is where is 0
30673 KLA-TENCOR CORP. FLX-5500 STRESS MEASUREMENT SYSTEM 1 as is where is 0
30674 KLA-TENCOR CORP. FLX-5500 STRESS MEASUREMENT SYSTEM 1 as is where is 0
30675 KLA-TENCOR CORP. FLX-5500 STRESS MEASUREMENT SYSTEM 1 as is where is 0
30677 KLA-TENCOR CORP. P-30H SURFACE PROFILER 200 mm 01.02.1997 1 as is where is 1
30679 KLA-TENCOR CORP. P-22H SURFACE PROFILER 1 as is where is 0
30682 KLA-TENCOR CORP. ASET-F5X THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30683 KLA-TENCOR CORP. ASET-F5X THIN FILM MEASUREMENT SYSTEM 01.10.2000 1 as is where is 1
30684 KLA-TENCOR CORP. ASET-F5X THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30686 KLA-TENCOR CORP. PROMETRIX UV-1070 THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30687 KLA-TENCOR CORP. PROMETRIX UV-1280SE THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30688 KLA-TENCOR CORP. PROMETRIX UV-1280SE THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30689 KLA-TENCOR CORP. PROMETRIX UV-1080 THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30690 KLA-TENCOR CORP. PROMETRIX UV-1080 THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30691 KLA-TENCOR CORP. PROMETRIX UV-1080 THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30693 KLA-TENCOR CORP. PROMETRIX UV-1080 THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30694 KLA-TENCOR CORP. PROMETRIX UV-1080 THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30696 KLA-TENCOR CORP. PROMETRIX UV-1080 THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30697 KLA-TENCOR CORP. PROMETRIX UV-1080 THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30698 KLA-TENCOR CORP. PROMETRIX UV-1080 THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30699 KLA-TENCOR CORP. PROMETRIX UV-1080 THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30700 KLA-TENCOR CORP. PROMETRIX UV-1080 THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30701 KLA-TENCOR CORP. PROMETRIX UV-1280SE THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30702 KLA-TENCOR CORP. PROMETRIX UV-1280SE THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30703 KLA-TENCOR CORP. PROMETRIX UV-1280SE THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30704 KLA-TENCOR CORP. PROMETRIX UV-1280SE THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30732 KLA-TENCOR CORP. SURFSCAN 6200 UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30733 KLA-TENCOR CORP. SURFSCAN 6200 UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30735 KLA-TENCOR CORP. SURFSCAN 6420 UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30736 KLA-TENCOR CORP. SURFSCAN 6420 UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30737 KLA-TENCOR CORP. SURFSCAN 6420 UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30738 KLA-TENCOR CORP. SURFSCAN 6420 UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30740 KLA-TENCOR CORP. SURFSCAN SP1 UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30741 KLA-TENCOR CORP. SURFSCAN SP1 UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30742 KLA-TENCOR CORP. SURFSCAN SP1 UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30743 KLA-TENCOR CORP. SURFSCAN SP1 TBI UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30744 KLA-TENCOR CORP. SURFSCAN SP1 TBI UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30745 KLA-TENCOR CORP. SURFSCAN SP1 TBI UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30747 KLA-TENCOR CORP. SURFSCAN SP2 UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30748 KLA-TENCOR CORP. SURFSCAN 6220 UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30749 KLA-TENCOR CORP. SURFSCAN 6220 UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30750 KLA-TENCOR CORP. SURFSCAN 6220 UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30751 KLA-TENCOR CORP. SURFSCAN 6220 UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30752 KLA-TENCOR CORP. SURFSCAN 6220 UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30753 KLA-TENCOR CORP. SURFSCAN 6220 UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30754 KLA-TENCOR CORP. SURFSCAN 6220 UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30755 KLA-TENCOR CORP. SURFSCAN 6420 UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30756 KLA-TENCOR CORP. SURFSCAN 6420 UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30757 KLA-TENCOR CORP. SURFSCAN 6420 UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30758 KLA-TENCOR CORP. SURFSCAN SP1 UNPATTERNED WAFER INSPECTION SYSTEM 1 as is where is 0
30768 KLA-TENCOR CORP. 2135 WAFER INSPECTION SYSTEM 1 as is where is 0
30769 KLA-TENCOR CORP. 2138 WAFER INSPECTION SYSTEM 1 as is where is 0
30770 KLA-TENCOR CORP. 2138XP WAFER INSPECTION SYSTEM 1 as is where is 0
33338 KLA-Tencor Corp. 2800 Patterned wafer inspection system 200 MM 01.07.2007 1 as is where is immediately 0
33339 KLA-Tencor Corp. AIT XP Patterned wafer inspection system 01.03.2000 1 inquire 0
33340 KLA-Tencor Corp. ASET-F5X / Spectra CD 100 Thin film measurement system 01.12.2003 1 inquire 0
33341 KLA-Tencor Corp. eV300 SEM - Defect Review 01.10.2000 1 inquire 0
33342 KLA-Tencor Corp. FLX-5400 Stress measurement system 01.06.1997 1 inquire 0
33343 KLA-Tencor Corp. Quantox 64100 Oxide charge monitoring system 01.03.2001 1 inquire 0
16209 KLA/TENCOR CRS 1010 DEFECT REVIEW STATION 01.06.1996 1 4
33469 KLA/TENCOR KLA2138 DEFECT ANALYZER 200 01.06.1999 1 inquire 0
33470 KLA/TENCOR SP1 20 WAFER PARTICLE COUNTER 0 ???/??? 01.06.2000 1 inquire 0
15112 Leica INS3000 Microscope inspection station 100 to 200 mm 01.03.1999 1 inquire immediately 5
33697 LEICA INS 2000 Defect Review System 1 inquire 0
33698 LEICA Polylite 88 Microscope - Incomplete, 3ea Available 1 inquire 0
33699 LEICA SZ6 StereoZoom Microscope on Boom Stand with 10X WF EPs 1 inquire 0
33917 LEICA INS 3000 WAFER INSPECTION MICROSCOPE 200 MM 01.03.2000 1 as is where is immediately 0
30534 LEICA INC. LDS3000M INSPECTION - DEFECT ANALYSIS 1 as is where is 0
30535 LEICA INC. LDS3000M INSPECTION - DEFECT ANALYSIS 1 as is where is 0
30536 LEICA INC. LDS3000M INSPECTION - DEFECT ANALYSIS 1 as is where is 0
30537 LEICA INC. LDS3000M INSPECTION - DEFECT ANALYSIS 1 as is where is 0
30543 LEICA INC. INM20 MICROSCOPE- WAFER INSPECTION 1 as is where is 0
30544 LEICA INC. INM20 MICROSCOPE- WAFER INSPECTION 1 as is where is 0
30545 LEICA INC. INM20 MICROSCOPE- WAFER INSPECTION 1 as is where is 0
30546 LEICA INC. INM 200 MICROSCOPE- WAFER INSPECTION 1 as is where is 0
30547 LEICA INC. INM 200 MICROSCOPE- WAFER INSPECTION 1 as is where is 0
30548 LEICA INC. INM 200 MICROSCOPE- WAFER INSPECTION 1 as is where is 1
30549 LEICA INC. INM 200 MICROSCOPE- WAFER INSPECTION 1 as is where is 0
30550 LEICA INC. INM 200 MICROSCOPE- WAFER INSPECTION 1 as is where is 0
30551 LEICA INC. INM 200 MICROSCOPE- WAFER INSPECTION 1 as is where is 0
30553 LEICA INC. INM 200 MICROSCOPE- WAFER INSPECTION 1 as is where is 0
20442 LEITZ MPV-SP REFLECTOMETER 150mm 01.06.1995 1 as is where is immediately 7
21456 LEO 435VP Inspection SEM 01.06.1999 1 inquire immediately 16
32839 Leo LTA-550 200 mm 01.10.1996 1 inquire 0
33538 LEO 1560 Gemini INSPECTION SEM 1 as is where is immediately 0
14861 Leo Giken LTA 330A Carrier Lifetime measurement 150 mm 01.06.1993 1 inquire immediately 3
33082 Logitech PM5 Polishing System 1 1
19268 MDC CSM / 2 CV MEASUREMENT 100 mm 1 as is where is immediately 1
33539 MICRION 9500 FIB SEM 01.11.1996 1 as is where is immediately 0
32840 Micro Instruments PE9015 N/A 01.06.1997 1 inquire 0
15529 Micro Vu Smartscope 250 Video Microscope Measuring System 01.05.1999 1 as is where is immediately 9
15530 Micro Vu Smarscope 250 Video Microscope Measuring System 01.05.1995 1 6
32841 Micro-Tec Instrumentation Z-CHECK 700 S N/A 1 inquire 0
32842 Micro-Vu H-14 N/A 1 inquire 0
33345 MKS Instruments Inc. HPQ 2 - High Pressure Quadrapole RGA Equipment - Spectra 1 inquire 0
33970 MSP 2300 PSL SPHERE 1 inquire 0
28096 NANO-Master NSC-2000 SEM SAMPLE PREPARATION 1 as is where is 0
14563 Nanometrics NanoSpec AFT #010-0181 Film Thickness Analyzers 150 mm/125 mm 2 as is where is immediately 2
32435 Nanometrics NANOSPEC 8000XSE Thin Film Measurement 200 mm 01.11.2000 1 inquire 0
32436 Nanometrics NANOSPEC 8000XSE-NT Thin Film Measurement 200 mm 01.10.2001 1 inquire 0
32434 Nanometrics NANOSPEC 8000XSE Thin Film Measurement 200 mm 01.04.2000 1 inquire 0
32843 Nanometrics 9010T 200 mm 01.08.2004 1 inquire 0
33471 NANOMETRICS NMI-1627-1 FILM STRESS(NANO SPEC) 125 01.06.1982 1 inquire 0
33700 NANOMETRICS Nanoline CD-50 CD Measurement Tool 1 inquire 0
33701 NANOMETRICS Nanospec 181 Film Thickness Measurement System 1 inquire 0
33702 NANOMETRICS Nanospec 181 Film Thickness Measurement System 1 inquire 0
33703 NANOMETRICS Nanospec 2100 Film Thickness Measurement System with Irvine Optical Optistation 200 Automatic Wafer Loader 1 inquire 0
33704 NANOMETRICS Nanospec 212 Film Thickness Measurement System with 125mm/150mm Dual Wafer Sliding Stage 1 inquire 0
33705 NANOMETRICS Nanospec 8300XSE Automatic Film Thickness Tool, Cassette to Cassette for 200mm & 300mm Wafers 1 inquire 0
33706 NANOMETRICS Nanospec 9000i Automatic In Situ Film CMP Thickness Tools, 3ea Available 1 inquire 0
26515 Nicolet Magna 550 FTIR Spectrometer Laboratory 01.06.1995 1 inquire immediately 1
33472 NICOLET ECO-RS FT-IR 300 01.06.1998 1 inquire 0
17867 NIDEK IM140DJ AUTO LOADER 200 MM 01.04.1996 3 as is where is immediately 4
30760 NIDEK CO., LTD. IM-80 WAFER AUTO LOADER 1 as is where is 0
30761 NIDEK CO., LTD. IM-80 WAFER AUTO LOADER 1 as is where is 0
11111 Nikon NWL- 851M Wafer auto loader 200 MM 01.04.1996 1 5
14570 Nikon Optiphot 88 Microscope 200 mm 1 0
14573 Nikon Optistation 2A Automatic Wafer Inspection System 3 1
14574 NIKON Optistation 2A Automatic Wafer Inspection System w/Auto Focus - Parts Tool Only 3 0
17868 Nikon Optiphot 200 MICROSCOPE WITH AUTO LOADER 200 MM 01.04.1996 1 as is where is immediately 1
20215 NIKON OPTISTATION V INSPECTION MICROSCOPE WITH SMIF LOADER 200 MM 1 as is where is immediately 0
32417 Nikon OPTISTATION V WAFER INSPECTION 200 mm 01.12.2006 1 inquire 0
32418 Nikon OPTISTATION V WAFER INSPECTION 200 mm 01.12.2006 1 inquire 0
23155 Nikon Optiphot 2 Trinocular Microscope with 6 inch manual stage 150 mm 1 as is where is immediately 1
26154 NIKON OPTISTATION V WAFER INSPECTION SYSTEM 200 mm 01.07.1007 1 inquire 1
33937 NIKON Optistation Mark 7 Microscope inspection station 1 as is where is immediately 0
26598 Nikon Optiphot-150 Microscope 1 14
34066 Nikon Optistation 3 Microscope 1 as is where is immediately 0
34021 Nikon Optistation 3 Inspection Microscope 6 Inch 01.05.1997 1 8
30569 NIKON NRM-1000A OVERLAY MEASUREMENT SYSTEM 1 as is where is 0
30570 NIKON NRM-1000A OVERLAY MEASUREMENT SYSTEM 1 as is where is 0
30779 NIKON OPTISTATION V WAFER INSPECTION SYSTEM 1 as is where is 0
30780 NIKON OPTISTATION V WAFER INSPECTION SYSTEM 1 as is where is 0
30782 NIKON OPTISTATION V WAFER INSPECTION SYSTEM 1 as is where is 0
30783 NIKON OPTISTATION V WAFER INSPECTION SYSTEM 1 as is where is 0
30784 NIKON OPTISTATION V WAFER INSPECTION SYSTEM 1 as is where is 0
30785 NIKON OPTISTATION V WAFER INSPECTION SYSTEM 1 as is where is 0
30787 NIKON OPTISTATION V WAFER INSPECTION SYSTEM 1 as is where is 0
30788 NIKON OPTISTATION V WAFER INSPECTION SYSTEM 1 as is where is 0
32845 Nikon Optistation 3200 300 mm 01.06.2005 1 inquire 0
32846 Nikon Optistation 3200 300 mm 01.06.2005 1 inquire 0
33473 NIKON X6F-UM MICRO SCOPE - 01.06.1987 1 inquire 0
33707 NIKON NWL-851 Cassette Wafer Loaders for up to 200mm Wafers, 3ea Available 1 inquire 0
33708 NIKON Optiphot Wafer Inspection Microscope 1 inquire 0
33709 NIKON Optiphot 200 Wafer Inspection Microscope, 10X, 20X, 50X, 100X & 150X Objectives, DIC Optics, 200mm XY Stage 1 inquire 0
33710 NIKON Optiphot 66 Binocular Microscope with 5X, l0X, 20X & 40X Obj. Lenses 1 inquire 0
33711 NIKON Optistation 2A Automatic Wafer Inspection Systems for 75mm- 150mm Wafers, Auto Focus, 4ea Available 1 inquire 0
33931 Nikon NRM 3100 WAFER SURFACE INSPECTION DUAL SMIF 200 MM 01.03.2004 1 as is where is immediately 0
26601 Niton XLt797QWZ XRF Analyser 01.12.2005 2 as is where is immediately 8
23286 Noran Instruments Voyager EDX 1 inquire 0
23321 Noran Instruments Voyager EDX 1 inquire 0
32844 Nova Measuring NovaScan 3060 200 mm 1 inquire 0
30507 NOVA MEASURING INSTRUMENTS, INC. NOVASCAN 420 FILM THICKNESS MEASUREMENT SYSTEM - CMP 1 as is where is 0
31245 NOVA SYSTEMS NOVASCAN 3060CD epi measurement 200 mm 01.06.2004 1 as is where is immediately 14
21819 OGP SMARTSCOPE Z250E OPTICAL-PRECISION MEASUREMENT 01.06.2000 1 as is where is immediately 1
15207 Olympus AL100-B8 Programmable Wafer Loader 200 mm 9 as is where is immediately 3
23662 Olympus BH3 MJL A4 INSPECTION MICROSCOPE 150 mm 01.01.1991 1 inquire immediately 11
31509 Olympus  AL110-MB8  Inspection  200 MM 1 as is where is 0
31511 Olympus LEXT OLS3000IR Inspection 300 MM 01.01.2006 1 as is where is 1
31512 Olympus  MX61L-IR  Inspection  300 MM 01.01.2006 1 as is where is 0
32419 OLYMPUS AL-2100 WAFER INSPECTION 200 mm 01.12.2006 1 inquire 0
23169 Olympus SZ40 stereo microscope on stand ASSEMBLY 1 as is where is immediately 6
32847 Olympus AL3110 300 mm 01.04.2004 1 inquire 0
33712 OLYMPUS AL100-LMB8 Wafer Loader, 200mm, 8ea Available 1 inquire 0
33713 OLYMPUS BHM Wafer Inspection Microscope with NeoSPlan 5X, 10X, 20X & 50X Objectives 1 inquire 0
33714 OLYMPUS SZ4045 StereoZoom Microsope with WF10X/22 EPs & Fluoroescent Ring Illuminator on Boom Stand, 2ea Available 1 inquire 0
33932 Olympus MX80F WAFER INSPECTION MICROSCOPE 300 MM 01.08.2002 1 as is where is immediately 0
28093 Omron VT-Win II INSPECTION 01.01.2005 1 as is where is immediately 0
30509 OPTIK ELEKTRONIK GERĂ?TETECHNIK (OEG) SURFTENS GONIOMETER 1 as is where is 0
32848 OptoMetrix Schlieren Thermal Mapper (STM) 200 mm 1 inquire 0
22633 Philips CM 12 TEM Transmission Electron Microscope 1 as is where is immediately 1
22634 Philips CM 20 TEM Transmission Electron Microscope 1 as is where is immediately 1
22635 Philips Various Parts for TEM Transmission Electron Microscopes 1 as is where is immediately 15
30792 PHILIPS TREX 610T SPECTROMETER - XRF 1 as is where is 0
30793 PHILIPS TREX 610T SPECTROMETER - XRF 1 as is where is 0
32849 Philips SPW2800 200 mm 1 inquire 0
32850 Philips SPW2800 200 mm 1 inquire 0
5225 PLASMOS SD 4000 Ellipsometer DUAL WAVELENGHT 200 mm 01.07.1993 1 inquire immediately 17
31246 PMS Liquitrack 776200 Non volatile residual Monitor facilities 01.11.1999 1 as is where is immediately 6
23159 Polaron THERMO VG SCIENTIFIC SC 7620 Sputter Coater for sample preparation laboratory 01.06.2000 1 as is where is immediately 1
10061 PROMETRIX VP-10e Four Point Probe 200 mm 1 as is where is immediately 8
17463 Prometrix FT - 650 Wafer Inspection Tool 01.07.1992 1 1
23663 Prometrix FT750 Patterned Wafer Mapping System 200mm 1 as is where is immediately 10
33715 PROMETRIX FT-600 Film Thickness Measuring Tool 1 inquire 0
33716 PROMETRIX FT-750 Film Thickness Measuring Tool 1 inquire 0
26136 RAYTEX EDGESCAN WAFER EDGE DEFECT INSPECTION 200 mm 01.10.2004 1 inquire 2
20227 Realtime X-Ray Corp Scan-Ray X-Ray System 1 as is where is immediately 1
29704 Reichardt Polyvar Visual inspect microscope 200 mm 12 as is where is 0
33717 REICHERT POLYVAR Wafer Inspection Station with KENSINGTON LABS Wafer Loader, 12ea Available 1 inquire 0
10066 RIGAKU 3630 XRF Wafer Analyzer 01.02.1996 1 as is where is 6
31513 Rigaku  Wafer X 300  Inspection  200 MM 01.07.2005 1 as is where is 0
32420 Rigaku 3630 X-Ray Fluorescence Analysis System 200 mm 01.03.1996 1 inquire 0
32421 Rigaku 3630 X-Ray Fluorescence Analysis System 200 mm 01.12.1997 1 inquire 0
32422 Rigaku 3640 X-Ray Fluorescence Analysis System 200 mm 01.12.2006 1 inquire 0
30513 RIGAKU MFM65 IN-LINE X-RAY METAL FILM MONITOR 1 as is where is 0
29709 Rigaku 3620 X Ray 150 mm 1 as is where is 0
30794 RIGAKU TXRF-V300 SPECTROMETER - XRF 1 as is where is 0
30795 RIGAKU WAFERX 300 SPECTROMETER - XRF 1 as is where is 1
21509 RUDOLPH AUTO EL II Ellipsometer 01.05.1981 1 2
31318 RUDOLPH AUTO EL 4 ELLIPSOMETER 150 MM 01.06.1987 1 as is where is 0
21836 RUDOLPH METAPULSE CU CU BARRIER SEED THICKNESS MEASUREMENT 200 MM 01.10.2000 1 inquire immediately 6
25995 RUDOLPH FOCUS FE VII ELLIPSOMETER 200 mm 01.12.1996 1 inquire 2
15568 RUDOLPH RESEARCH METAPULSE COPPER FILM MEASUREMENT - HAS SMIF PODS 200 MM 01.09.2002 1 as is where is immediately 1
32423 Rudolph Research FE-7 Ellipsometer 200 mm 01.10.1997 1 inquire 0
32424 Rudolph Research FE-7 Ellipsometer 200 mm 01.12.1997 1 inquire 0
30506 RUDOLPH TECHNOLOGIES, INC. VANGUARD SPECTRALASER 200XL FILM THICKNESS MEASUREMENT SYSTEM 1 as is where is 0
30504 RUDOLPH TECHNOLOGIES, INC. METAPULSE 200X CU FILM THICKNESS MEASUREMENT SYSTEM 1 as is where is 0
30538 RUDOLPH TECHNOLOGIES, INC. AXI 930 INSPECTION - DEFECT ANALYSIS 1 as is where is 0
32123 Rudolph Technologies, Inc. NSX-105c Automatic Defect Inspection System 01.05.2007 1 2
23141 SCIENCSCOPE SZ-BD-B2 Microscope with light source & stand 1 5
21859 SDI SPV STATION 1010 CARRIER LIFETIME MEASUREMENT 125-200 MM 01.06.1996 1 as is where is immediately 1
33718 SDI FAaST-330 SPV, Ultimate SPV, PDM, SILC and other Test Capabilities, 300mm - Call for Details 1 inquire 0
33924 SDI FAAAST 200 SL WAFER INSPECTION 200 MM 01.06.2000 1 as is where is immediately 0
25469 Seiko Instruments SMI-8300 FIB Focused Ion Beam 01.08.1990 1 14
32425 SEIKO SEIKI SMI8800 FIB 200 mm 01.03.1995 1 inquire 0
21274 Sela MC-500 Microcleaver System 01.05.2003 1 1
32851 Sela MC100 SEM/TEM Sample Prep Tool 200 mm 1 inquire 0
30518 SEMICONDUCTOR DIAGNOSTICS, INC. FAAST-350 INSPECTION 1 as is where is 0
32196 semilab 4085 1 as is where is immediately 0
31321 SII SFT9300 FLUORESCENT X RAY COATING 01.06.2002 1 as is where is 0
28354 Solid State Measurements CV470i CV MEASUREMENT 1 as is where is immediately 0
30571 SOLURIS INC. IVS-130 OVERLAY MEASUREMENT SYSTEM 01.06.2001 1 as is where is immediately 1
33719 SSM 530 CV Profiler 1 inquire 0
23133 Struers Tegrapol-15 Sample grinder Polisher 1 9
28365 TA Instruments AR1000 Rheometer RHEOMETER 1 as is where is immediately 0
33720 TECHNICAL INSTRUMENT K2 IND/NIKON Confocal Microscope 1 inquire 0
28353 Tektronix 371A CURVE TRACER 1 as is where is immediately 0
33721 TENCOR AlphaStep 200 Profilometer 1 inquire 0
33722 TENCOR AlphaStep 300 Profilometer 1 inquire 0
33723 TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool, for 75mm-150mm Wafers 1 inquire 0
23223 TEVET IN3 PARC THICKNESS AND K MEASUREMENT 1 inquire immediately 0
26100 THERMA-WAVE OPTI-PROBE 5240I THIN FILM 200 mm 01.01.1999 1 inquire 1
33530 Therma-wave Optiprobe 2600 WAFER INSPECTION 200 MM 01.06.1995 1 as is where is immediately 0
33531 Therma-wave Optiprobe 2600 WAFER INSPECTION 200 MM 01.06.1995 1 as is where is immediately 0
33899 Therma-wave 2600 WAFER SURFACE INSPECTION 200 MM 01.03.1998 1 as is where is immediately 0
33903 Therma-wave TP420 XP WAFER SURFACE INSPECTION 200 MM 01.10.1997 1 as is where is immediately 0
33921 Therma-wave OP 5230 WAFER INSPECTION 200 MM 01.06.2000 1 as is where is immediately 0
33922 Therma-wave OP 5230 WAFER INSPECTION 200 MM 01.06.2000 1 as is where is immediately 0
30510 THERMA-WAVE INC. THERMA-PROBE 320S IMPLANT MONITOR 1 as is where is 0
30511 THERMA-WAVE INC. THERMA-PROBE 500 IMPLANT MONITOR 01.12.1996 1 as is where is 0
30705 THERMA-WAVE INC. OPTI-PROBE 3260 THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30707 THERMA-WAVE INC. OPTI-PROBE 3260 THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30708 THERMA-WAVE INC. OPTI-PROBE 3260 DUV THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30709 THERMA-WAVE INC. OPTI-PROBE 3260 DUVI THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30710 THERMA-WAVE INC. OPTI-PROBE 3290 THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30711 THERMA-WAVE INC. OPTI-PROBE 5205 THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30712 THERMA-WAVE INC. OPTI-PROBE 5205I THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30713 THERMA-WAVE INC. OPTI-PROBE 5220 THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30714 THERMA-WAVE INC. OPTI-PROBE 5230 THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30715 THERMA-WAVE INC. OPTI-PROBE 5230I THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30716 THERMA-WAVE INC. OPTI-PROBE 5230I THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30717 THERMA-WAVE INC. OPTI-PROBE 5230I THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30718 THERMA-WAVE INC. OPTI-PROBE 5230I THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30719 THERMA-WAVE INC. OPTI-PROBE 5240 THIN FILM MEASUREMENT SYSTEM 200 mm 01.08.1998 1 as is where is 1
30721 THERMA-WAVE INC. OPTI-PROBE 5240I THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30723 THERMA-WAVE INC. OPTI-PROBE 7341 THIN FILM MEASUREMENT SYSTEM 200mm 01.08.2003 1 as is where is 1
30724 THERMA-WAVE INC. OPTI-PROBE 7341 THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30725 THERMA-WAVE INC. OPTI-PROBE 7341 THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30726 THERMA-WAVE INC. OPTI-PROBE 7341 THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
30727 THERMA-WAVE INC. OPTI-PROBE 7341 THIN FILM MEASUREMENT SYSTEM 1 as is where is 0
33347 Therma-Wave Inc. Opti-Probe 5240i Thin film measurement system 01.10.2001 1 inquire 0
20971 Thermawave TP420 Implant dose monitoring tool 150 mm and 200 mm 01.06.1996 1 inquire immediately 12
30512 THERMAWAVE THERMA-PROBE 630XP IMPLANT MONITOR 200 mm and 300 mm 01.06.2005 1 as is where is immediately 0
32852 Thermawave TP420 200 mm 1 inquire 0
33971 THERMAWAVE 2600B Metrology 1 inquire 0
30672 TOPCON EM-002B SEM (SCANNING ELECTRON MICROSCOPE) 1 as is where is 1
14513 Varian CP 3800 Gas Chromatograph 01.06.1999 1 as is where is immediately 7
10130 VEECO Dektak IIA Profilometer 150 MM 01.06.1984 1 as is all rebuilt immediately 1
21355 VEECO Dektak IIA Profilometer 150 MM 01.06.1997 1 as is all rebuilt immediately 1
17000 Veeco SXM AFM-9960 Atomic Force Microscope 75 mm to 200 mm 01.05.1996 1 as is where is immediately 4
17635 VEECO UVX210 ATOMIC FORCE PROFILER 200 mm 01.06.2001 1 as is where is immediately 2
20716 VEECO DEKTAK 200 SL PROFILOMETER 150MM AND 200MM 01.07.2001 1 as is where is immediately 9
32195 Veeco Dimension 3000 AFM 1 as is where is immediately 3
32854 Veeco SXM 200 mm 01.11.1995 1 inquire 0
33724 VEECO Dektak 3-30 Profilometer 1 inquire 0
33725 VEECO Dektak IIA Profilometer 1 inquire 0
34019 Veeco / Digital Instruments Nanoscope E AFM 01.06.1998 1 as is where is immediately 4
30541 VEECO INSTRUMENTS INC. DIMENSION X1D MICROSCOPE - ATOMIC FORCE (AFM) 1 as is where is 0
30542 VEECO INSTRUMENTS INC. SXM-320 MICROSCOPE - ATOMIC FORCE (AFM) 200 mm 01.05.1998 1 as is where is 1
30604 VEECO INSTRUMENTS INC. DIMENSION VX 210 PROFILER - ATOMIC FORCE 200 mm 01.02.2001 1 as is where is 0
30606 VEECO INSTRUMENTS INC. DIMENSION VX 310 PROFILER - ATOMIC FORCE 300 mm 01.05.2004 1 as is where is 1
30607 VEECO INSTRUMENTS INC. DIMENSION VX 310 PROFILER - ATOMIC FORCE 1 as is where is 0
33348 Veeco Instruments Inc. Dimension 9000M Microscope - Atomic Force (AFM) 01.06.1999 1 inquire 0
32187 Votsch VT7010 Temperature Chamber 01.05.2001 1 3
33904 VOTSCH VT 7012 S3 THERMAL SHOCK CHAMBER 1 3
21353 WED MACROSPEC BRIGHT LIGHT INSPECTION 200 MM 01.06.1995 2 as is where is immediately 1
33726 WILD M410 Makrozoom Microscope w/Coaxial Illumination, Focus Mechanism, w/o Stand 1 inquire 0
34091 Wyko NT 2000 Optical Profiling system 1 0
15561 ZEISS AXIOTRON II INSPECTION MICROSCOPE WITH SMIF LOADER 200 MM 01.02.1998 2 as is where is immediately 0
32853 Zygo ARHS N/A 1 inquire 0


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