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Pre-owned Fab Metrology , Inspection & QC Equipment for sale by fabsurplus.com

Please find below a list of Used Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com .Click on any listed item of Fab Metrology , Inspection and QC Equipment to see further data. Semiconductor metrology and wafer defect detection are vital in the semiconductor fabrication process. They provide the means to monitor and control the quality of each step in a sub-microscopic manufacturing sequence which can have hundreds of steps and a processing time of several weeks.


SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
103225 ADE NanoMapper FA Nano-Defects Inspection System 300 mm 1 inquire immediately
108791 ADE 5810 Non-Contact Capacitance Gauging Module with 2ea ADE 2248 Probes 1 inquire
108792 ADE 6033 Wafer Thickness Tester 1 inquire
108793 ADE 6033T Wafer Thickness Tester 1 inquire
109554 ADE NANOMAPPER Phase Shift nano defect inspection system 300 mm 01.11.2001 1 as is where is immediately
83514 Applied Materials Opal 7830i Enhanced CD MEASUREMENT SEM FOR 200 mm / 150 mm wafers 100 mm to 200 mm 01.05.1997 1 as is where is immediately
108556 Applied Materials Uvision 600SP Brightfield Inspection System 300 mm 01.05.2008 1 as is where is immediately
108931 Applied Materials SEMVISION G5 MAX Defect Review SEM 300 mm 01.06.2011 1 as is where is immediately
109088 Applied Materials SEMVISION G3 Lite Defect Review SEM 300 mm 01.08.2007 1 as is where is 6 months
109112 Applied Materials Verity 2 CD MEASUREMENT SEM 200 mm 01.06.2004 1 immediately
109149 Applied Materials ComPLUS MP Darkfield Inspection 200mm 1 as is where is
109150 Applied Materials ComPLUS MP Darkfield Inspection 200mm 1 as is where is
110661 APPLIED MATERIALS UVISION 5 Bright Field Inspection 300 mm 01.06.2011 1 as is where is immediately
110684 Applied Materials Sting Dark Field Defect Inspection 300 mm 01.06.2009 1 as is where is immediately
110687 Applied Materials Aera 2 Photomask Inspection System 300 mm 01.06.2009 1 as is where is immediately
109055 ASML Yieldstar S200B Wafer metrology system 300 mm 01.06.2011 1 as is where is immediately
109158 ASML YieldStar S-200B Overlay Measurement System 300mm 1 as is where is
109159 ASML YieldStar S-250 Overlay Measurement System 300mm 1 as is where is
108153 ATI OAK-1 Auto Scope Inspection 01.06.2013 1 as is where is
98447 August 3DI-8000 wafer bump inspection 300mm 1 as is where is immediately
98448 August NSX-95 2D Auto inspection system / Macro defect inspection system 200 mm 4 as is where is immediately
101818 August NSX105 Wafer Bumping Inspection System / Macro defect inspection 200mm 1 inquire
108734 Bio-Rad Q8 Overlay Metrology 1 as is all rebuilt 1 month
108735 Bio-Rad QS-1200 FT-IR Spectrometer 100-200 mm 01.05.2004 1 as is where is immediately
108736 Bio-Rad QS-300 FT-IR Spectrometer 1 as is where is immediately
108800 BIO-RAD ECN4900PC Profilers, 2ea Available - Parts Only 1 inquire
108801 BIO-RAD Q7 Overlay Metrology Tool 1 inquire
108802 BIO-RAD Q8 Overlay Metrology / CD Measurement Tool for up to 200mm Wafers 1 inquire
108737 BIORAD Q5 Overlay Metrology Tool 200 mm 2 as is where is immediately
106642 BROOKS METARA 7200 Overlay 200 mm 01.06.1996 1 as is where is
108025 BRUKER VERTEX 80V FT-IR Spectrometer 1 as is where is
110694 BRUKKER D8 Fabline MH Atomic Force Microscope 150 mm 01.06.2009 1 as is where is immediately
106645 CAMECA EX300 Secondary Ion Mass Spectrometer 300 mm 1 as is where is
108394 CAMECA EX-300 Implant Dosing Measurement 300 mm 1 as is where is
109533 Creative Design Engineering (CDE) ResMap 178 Resistivity Mapping System Up to 200 mm 01.06.2012 1 as is where is immediately
106647 CYBER OPTICS CYBERSCAN C212/110 Laser Measure 200 mm 1 as is where is
110675 Dektak 3ST Stylus Profileometer 150 mm 1 as is all rebuilt immediately
108201 DNS INSPECTION SCOPE Inspection Scope 1 as is where is
106200 EDAX Eagle 2 Micro-probe EDX analyser Laboratory 01.06.2000 1 as is where is immediately
108026 FEI CLM 3D Fully Automated Dual Beam FIB-SEM 300 mm 01.04.2012 1 as is where is immediately
108932 FEI ExSolve CLM Next Gen High Accuracy FIB SEM 300 mm 01.06.2016 2 as is where is immediately
110678 FEI Helios 1200+ Dual beam FIB SEM 300 mm 01.06.2011 1 as is where is immediately
111383 FEI Quanta 200 3D Dual-Beam FIB SEM with Omniprobe, LMIS, BSD Laboratory 01.06.2005 1 as is where is immediately
108710 Fogale DeepProbe 300M Low Coherence IR wafer interferometry 200 mm and 300 mm 01.06.2014 1 inquire
108817 FOUR DIMENSIONS CV92A Semi Auomatic Mercury Probe CV Plotter up to 200 mm 01.06.1998 1 inquire immediately
110723 Four Dimensions CVMAP 3092-A Wafer CV mapper 100-200 MM 01.06.2005 1 as is where is immediately
93084 FSM SYMPHONYMC Life Time 300 MM 1 as is where is
96543 Gaertner L115C-8 Ellipsometer, cassette to cassette 100-200 mm 28.02.1995 1 as is where is immediately
108751 GCA TROPEL 9000 Wafer Flatness Analyzer 1 as is where is
71907 Hamamatsu C7103 PC Controlled IC Back-side Lapping and Wafer Grinding System 200 mm and packages 30.09.2001 1 as is where is immediately
52166 Hitachi 545-5515 DC power supply module for CD SEM spares 1 as is where is immediately
52167 Hitachi 6280H Power Supply Module 4channels spares 1 as is where is immediately
52168 Hitachi 545-5540 Power Supply unit for CD SEM Spares 1 as is where is immediately
52312 Hitachi 545-5522 VG board for CD SEM spares 31.05.1994 1 as is where is immediately
52339 Hitachi 545-5521 EVAC PCB FOR HITACHI CD-SEM spares 31.05.1994 1 as is where is immediately
52340 Hitachi 545-5537 IP-PC2 for cd-sem spares 31.05.1994 1 as is where is immediately
52343 Hitachi 377-7592 Power Supply Module for CD SEM spares 31.05.1994 1 as is where is immediately
53054 HITACHI 6280H (SPARES) SORD Computer for cd sem system spares 1 as is where is immediately
60939 HITACHI S4160 Scanning electron microscope 31.05.1996 1 as is where is
74794 Hitachi S5200 FE SEM with EDX Inspection 31.05.2005 1 as is where is immediately
83849 Hitachi S4500 Type I FE SEM Laboratory 01.05.1995 1 inquire immediately
91397 HITACHI IS2700SE Dark Field inspection 1 as is where is
91403 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91404 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91405 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91407 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91408 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91417 HITACHI LS-6800 wafer surface inspection 300 mm 31.08.2007 1 as is where is immediately
91418 HITACHI UA-7200 Stripper/Asher 31.05.2001 1 as is where is
98269 HITACHI RS 4000 Defect Review SEM 300 mm 01.05.2003 1 as is where is immediately
98270 HITACHI RS 4000 Defect Review SEM 300 mm 01.05.2003 1 as is where is immediately
103525 HITACHI S4700-l Scanning Electron Microscope Laboratory 31.05.2004 1 as is where is immediately
103526 HITACHI S4700-ll FE Sem with Horriba EMAX EDX Laboratory 31.05.2001 1 as is where is immediately
103527 HITACHI S4700-ll FE Sem with Horriba EMAX EDX (Destocking Status) Laboratory 31.05.2003 1 as is where is immediately
106160 HITACHI RS6000 (Enhanced) Defect Review SEM 300 mm 01.06.2013 1 as is where is immediately
106662 HITACHI FB2100 FIB 200 mm 01.06.2003 1 as is where is
106663 HITACHI IS3000SE WAFER PARTICLE INSPECTION 300 mm 01.06.2006 1 as is where is
106664 HITACHI IS3200SE WAFER PARTICLE INSPECTION 300 mm 01.06.2010 1 as is where is
106665 HITACHI LS9000 Wafer Surface Inspection 300 mm 01.06.2010 1 as is where is
106666 HITACHI LS-6800 Wafer Surface Inspection 300 mm 01.06.2007 1 as is where is
108027 HITACHI N-6000 NANO PROBER Laboratory 01.09.2007 1 as is where is
108072 Hitachi S-6280H CD SEM 1 as is where is
108159 HITACHI S4700II FE SEM with EDAX (Detecting Unit) 1 as is where is
108160 HITACHI CV4000 High Voltage SEM 300 mm 01.06.2014 1 as is where is
108413 Hitachi CG4000 SEM 300 mm 3 as is where is
108568 HITACHI LS9000 Wafer Surface Inspection System 300mm 01.06.2010 1 as is where is immediately
108752 HITACHI S7000 CD SEM 150 mm 01.05.1989 1 as is where is immediately
108896 Hitachi RS4000 Defect Review SEM 300 mm 01.06.2006 1 as is where is immediately
108902 Hitachi RS4000 Defect Review SEM 300 mm 01.05.2007 1 as is where is immediately
109183 Hitachi CG4000 SEM - Critical Dimension (CD) Measurement 300mm 1 as is where is
109287 Hitachi SU 8010 Ultra High Resolution Field Emission Scanning Electron Microscope 100 mm 01.06.2007 1 as is where is immediately
109555 Hitachi IS3000 DARK FIELD INSPECTION 300 mm 01.05.2007 1 as is where is
109556 Hitachi HD2300 STEM (Scanning Transmission Electron Microscope) Laboratory 01.06.2006 1 as is where is immediately
109561 Hitachi S5500 HIGH RESOLUTION INSPECTION SEM Laboratory 01.06.2014 1 as is where is immediately
109568 Hitachi CG-4100 Critical Dimension (CD) Measurement SEM 300 mm 01.06.2012 1 as is where is immediately
109569 Hitachi CG-4000 Critical Dimension (CD) Measurement SEM 300 mm 01.06.2010 1 as is where is immediately
110781 Hitachi S-7840 High Resolution Imaging and CD-SEM 150 mm to 200 mm 01.09.2000 1 inquire immediately
109114 HMI EScan 400XP E-Beam wafer inspection system 300 mm 01.06.2010 2 as is where is immediately
109115 HMI EScan EP3 E-Beam wafer inspection system 300 mm 01.06.2010 2 as is where is immediately
109179 HMI eP3 XP E-beam Inspection 300mm 1 as is where is
109180 HMI eScan 300 E-beam Inspection 300mm 1 as is where is
109181 HMI eScan 320 E-beam Inspection 300mm 1 as is where is
109182 HMI eScan 320 E-beam Inspection 300mm 1 as is where is
108161 HP 4145B CV Measurement 1 as is where is
106667 HSEB AXIOSPECT 300 MICROSCOPE INSPECTION STATION 300 mm 1 as is where is
102559 HSEB Zeiss Axiotron 300 AOI microscope with 2 units of Brooks load port 300 mm 1 as is where is immediately
108819 HYPERVISION Visionary 2 Emmission Microscope with Karl Suss PM-8 Analytical Prober 1 inquire
106504 Irvine Optical Auto Wafer Loader Microscope Inspection WAFER INSPECTION MICROSCOPE WITH AUTOLOADER 200 mm 01.06.1990 1 as is where is immediately
91419 J.A Woollam VUV-VASE (Gen II) Ellipsometer 300 mm 1 as is where is
91420 J.A Woollam VUV-VASE VU302 (Gen I) Ellipsometer 200 mm 31.05.2001 1 as is where is
91422 JEOL JSM-5600 FE SEM 31.05.1999 1 as is where is
91424 JEOL JSM-6700F FE SEM 1 as is where is
106668 JEOL JWS-7500E SCANNING ELECTRON MICROSCOPE 200 mm 1 as is where is
108164 JEOL JSM-6340F FE Sem 1 as is where is
108323 JEOL JFS-9855S Focused Ion Beam System 200mm 01.05.2000 1 as is where is immediately
108324 JEOL JWS-7555 SEM - Defect Review (DR) 200mm 1 as is where is immediately
108822 JEOL JSM-6600F Scanning Electron Microscope 1 inquire
108907 JEOL JEM3200FS High Resolution TEM Laboratory 01.05.2006 1 as is where is immediately
109185 JEOL JEM-2010F TEM Laboratory 1 as is where is
109186 JEOL JFS-9815 Focused Ion Beam System 200mm 1 as is where is
109187 JEOL JSM-6400F FE SEM Laboratory 1 as is where is
109558 JEOL JSM-7500F SEM Laboratory 01.05.2009 1 as is where is immediately
110627 JEOL JSM-6460LV Scanning Electron Microscope Laboratory 1 as is where is
91427 Jordan Valley JVX 6200 X-ray metrology (X-Ray Reflectivity) 300 mm 1 as is where is
99830 JORDAN VALLEY JVX6200I X-ray Metrology System 300 mm 28.02.2011 1 as is where is immediately
100917 Jordan Valley JVX6200 X-Ray Inspection System 300 mm 31.05.2010 1 as is where is
108415 Jordan Valley Semiconductors LTD JVX 7200 X-ray Fluorescence Spectrometer 300 mm 1 as is where is
106865 KLA 2830 (PARTS) EFEM ONLY with Yaskawa XURCM9206 robot 300 mm 01.02.2010 1 as is where is immediately
106968 KLA SP2 (spare parts) Complete set of calibration standard wafers for a KLA SP2 200 mm 01.11.2022 1 inquire immediately
108009 KLA UV1250SE Wafer Film measurement / Ellipsometer 200 mm 01.10.1996 1 as is where is immediately
108421 KLA eDR-5210 SEM - Defect Review (DR) 300 mm 4 as is where is
108424 KLA eS805 E-beam Inspection 300 mm 1 as is where is
108426 KLA SM-300/SpectraMap Film Thickness Measurement System 1 as is where is
108428 KLA Surfscan 7700 Particle Measurement 200 MM 1 as is where is
108430 KLA TP300 Implant Dosing Measurement 200 MM 1 as is where is
108431 KLA VisEdge CV300R Edge Defect 300 mm 1 as is where is
108569 KLA 2131 Inspection System 200 mm 01.05.1995 1 as is where is immediately
108775 KLA AlphaStep 300 Profilometer 1 inquire
109106 KLA Surfscan AIT 3 Wafer particle Inspection 200 mm 01.06.2005 1 as is where is immediately
109537 KLA 2351 Brightfield Wafer Defect Inspection System 200 mm 01.06.2002 1 as is where is immediately
109562 KLA 2367 Brightfield wafer defect inspection system 200 mm 01.09.2006 1 as is where is immediately
110659 KLA UV1250SE Thin film meansurement system 125 mm - 200 mm 01.08.1998 1 as is where is immediately
110660 KLA 7700 Surfscan wafer particle detection system 100 - 200 mm 1 as is where is immediately
110668 KLA UV1280SE Thin Film Thickness Measurement System / Ellipsometer Up to 200 mm 01.01.2000 1 as is where is immediately
110679 KLA Surfscan 6400 Unpatterned wafer surface particle inspection system 100-200 MM 01.06.1994 1 inquire immediately
110686 KLA eDR-5200 Defect Review Sem 300 mm 01.06.2009 2 as is where is immediately
110751 KLA OP 2600 THIN FILM MEASUREMENT 200 mm 1 as is where is immediately
110786 KLA SP1-TBI Wafer Particle Detection System (Surfscan) 200 mm 1 inquire immediately
110787 KLA SP1-TBI Wafer Particle Detection System (Surfscan) 200 mm / 300 mm 1 inquire immediately
110788 KLA SP1-TBI Wafer Particle Detection System (Surfscan) 200 mm 1 inquire immediately
111346 KLA Quantox XP Electrical Measurement 300 mm 01.10.2006 1 as is where is immediately
111348 KLA P16 Plus Profileometer 200 mm 01.06.2005 1 as is where is immediately
32230 KLA TENCOR SFS6400 MECHANICAL CALIBRATION Document Number 238 WAFERSURFACE ANALYSIS SYSTEM CUSTOMER MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
32231 KLA TENCOR Surfscan 64X0 Calibration Procedure Surfscan 64X0 Calibration Procedure MANUAL 1 as is where is immediately
32232 KLA TENCOR surfscan 64XX optical alignments Document Number 236 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
32233 KLA TENCOR SFS6x00 MECHANICAL CALIBRATION Document number 200 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
106481 KLA Tencor AIT I Patterned Surface Inspection System 150 mm/200 mm 01.06.1995 1 as is where is immediately
106574 KLA TENCOR SEM-3800C Scanning Electron Microscope N/A 1 as is where is
106674 KLA TENCOR Viper 2430 Macro Defect Inspection 300 mm 01.06.2004 1 as is where is immediately
106675 KLA TENCOR Viper 2435 Macro Defect Inspection 300 mm 01.06.2004 1 as is where is
106676 KLA TENCOR Viper 2435XP Macro Defect Inspection 300 mm 01.06.2004 1 as is where is
106679 KLA TENCOR 2132 (mainbody only) Wafer Inspection System 150 mm,200 mm 01.06.1995 1 as is where is
106681 KLA TENCOR P-2 Profileometer 150 mm,200 mm 01.06.1996 1 as is where is
108075 KLA Tencor 2131 Wafer Defect Inspection 150 mm 1 as is where is
108165 KLA TENCOR Surfscan 7200 Surfscan wafer particle detection 150 mm,200 mm 01.06.1991 1 as is where is
108166 KLA TENCOR Surfscan 7200 Surfscan wafer particle detection 150 mm,200 mm 01.06.1990 1 as is where is
1691 KLA-TENCOR 259 (spare parts) Reticle Inspection - SPARE PARTS up to 7 inch 01.12.1991 1 inquire immediately
52151 KLA-Tencor Hamamatsu R1924A Photomultiplier spares 01.03.2007 1 as is where is immediately
53035 KLA-Tencor 2132 (8 inch Wafer Chuck Assembly) Ceramic Wafer chuck, 8" spares 1 as is where is immediately
53036 KLA-Tencor Compumotor M575L11 Stepping motor drive spares 1 as is where is immediately
71632 KLA-TENCOR 2122 Brightfield Wafer Defect Inspection System 200 mm 01.04.1996 1 as is where is immediately
91435 KLA-Tencor AIT Particle Review 200 mm 31.05.1997 1 as is where is
91464 KLA-Tencor PROMETRIX FT750 Film Thickness Measurement 200 mm 1 as is where is immediately
91466 KLA-Tencor PROMETRIX FT750 Film Thickness Measurement 1 as is where is
96998 KLA-Tencor Surfscan AIT Patterned Wafer Inspection 200 mm 01.05.1997 1 as is where is immediately
108716 KLA-Tencor Surfscan 4500 Unpatterned Wafer Surface Inspection 2 inch to 6 inch 01.11.1989 1 as is where is immediately
108760 KLA-Tencor Surfscan 4500 Wafer Particle Inspection System 2 to 6 inch 01.05.1986 1 as is where is immediately
109107 KLA-Tencor PROMETRIX FT-650 WAFER FILM THICKNESS MEASUREMENT SYSTEM 01.06.1991 1 as is where is immediately
109191 KLA-Tencor 2820 Wafer Inspection Equipment 300mm 1 as is where is
109192 KLA-Tencor 2820 Wafer Inspection Equipment 300mm 1 as is where is
109193 KLA-Tencor 2830 Brightfield Inspection 300mm 1 as is where is
109194 KLA-Tencor AIT UV Darkfield Inspection 300mm 1 as is where is
109195 KLA-Tencor ASET-F5x Film Thickness Measurement System 300mm 1 as is where is
109196 KLA-Tencor Puma 9130 Darkfield Inspection 300mm 1 as is where is
109197 KLA-Tencor Puma 9130 Darkfield Inspection 300mm 1 as is where is
109198 KLA-Tencor Surfscan SP2 Wafer Particle Measurement System 300 mm 01.12.2010 1 as is where is immediately
109598 KLA-Tencor Surfscan 5500 Wafer Particle Detection 200 mm 1 inquire
109613 KLA-Tencor AIT Surfscan wafer particle detection system 150 mm 1 inquire
110725 KLA-Tencor ARCHER 5 Optical Overlay measurement system 150-200 mm 01.06.2001 1 as is where is immediately
110726 KLA-Tencor OmniMap AutoRS75TC Wafer Resistivity Measurement 150-200 mm 01.06.1996 1 as is where is immediately
110727 KLA-Tencor UV1080 Thin film measurement system 150-200 mm 01.06.2000 1 as is where is immediately
108837 KOKUSAI VR70 Resistivity Test Tool 1 inquire
94475 LASERTEC BGM300 Wafer Surface Analyzing and VIsualization System 200 mm 31.05.2008 1 as is where is
106702 LASERTEC BGM300 Wafer Inspection System 300 mm 1 as is where is
106485 Leica LEICA INM20 Microscope inspection station 200 mm 01.06.1995 1 as is where is immediately
108171 LEICA INM100 Microscope 1 as is where is
108172 LEICA INM100 Microscope 1 as is where is
108173 LEICA INM100 Microscope 1 as is where is
108174 LEICA KENSINGTON 300901 Wafer Inspection Microscope 1 as is where is
108175 LEICA KENSINGTON 300901 Wafer Inspection Microscope 1 as is where is
108176 LEICA KENSINGTON 300901 Wafer Inspection Microscope 1 as is where is
108177 LEICA KENSINGTON 300901 Wafer Inspection Microscope 1 as is where is
108178 LEICA Polyvar SC POLYVAR SCOPE 1 as is where is
108179 LEICA Reichert POLYVAR SC Wafer Inspection Microscope 200 mm/300 mm 01.06.2002 1 as is where is
108180 LEICA Reichert-Jung, Kensington 300901 Wafer Inspection Microscope 1 as is where is
108181 LEICA Reichert-Jung, Kensington 300901 Wafer Inspection Microscope 1 as is where is
108182 LEICA Reichert-Jung, Kensington 300901 Wafer Inspection Microscope 1 as is where is
108183 LEICA Reichert-Jung, Kensington 300901 Wafer Inspection Microscope 1 as is where is
109211 Leica INS3300 Macro-Defect 300mm 1 as is where is
109212 Leica INS3300 Macro-Defect 300mm 1 as is where is
109213 Leica INS3300 Macro-Defect 300mm 1 as is where is
108464 Metryx Mentor DF3 Mass Measurement 300 mm 1 as is where is
108465 Metryx Mentor OC23 Mass Measurement 200-300 mm 1 as is where is immediately
109214 Metryx Mentor OC23 Mass Measurement 200mm 1 as is where is
108848 MINATO MM-6600 Wafer Mobility Tester with MECS UX-1000 Wafer Robot, 2ea Available 1 inquire
108029 MSP CORP. 2300XP1 Particle Depositioning 300 mm 1 as is where is
106703 N&K ANALYZER 5700-CDRT Wafer Inspection System 1 as is where is
106704 n&k Technology 6700-CDRT Wafer Inspection System 1 as is where is
106705 NANO OPTICS HAZE 2 Nano Optics Haze 2 200 mm 1 as is where is
91526 NANOMETRICS Caliper Mosaic Overlay 300 mm 31.05.2003 1 as is where is immediately
91529 NANOMETRICS Caliper Mosaic Overlay 300 mm 28.02.2010 1 as is where is immediately
91530 NANOMETRICS NANOMETRICS 9-7200-0195E Mask & Wafer Inspection 200 mm 1 as is where is
98289 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 31.05.2005 1 as is where is
98290 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 31.05.2005 1 as is where is
98291 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 30.06.2006 1 as is where is immediately
98480 Nanometrics 8000X film thickness measurement 150mm 2 as is where is immediately
98481 Nanometrics 8000Xse film thickness measurement 200mm 2 as is where is
101585 NANOMETRICS CALIPER-ULTRA Overlay Measurement 300 mm 30.06.2006 1 as is where is
103544 NANOMETRICS CALIPER ELAN Overlay 300 mm 31.05.2004 1 as is where is
106179 Nanometrics 9000 Nanospec Wafer Metrology film thickness measurement tool 200 mm 01.06.2005 1 as is all rebuilt immediately
106706 NANOMETRICS CALIPER_ULTRA Mask & Wafer Inspection 300 mm 01.06.2006 1 as is where is
106823 Nanometrics Nanospec 9100 Ox film thickness measurement (PC missing) 200mm 1 as is where is immediately
107027 NANOMETRICS Caliper Mosaic Overlay measurement System 300 mm 01.08.2010 1 inquire immediately
108186 NANOMETRICS CALIPER_MOSAIC Overlay 300 mm 01.06.2001 1 as is where is
108467 Nanometrics Tevet Trajectory T3 Film Thickness Measurement System 300 mm 1 as is where is
109113 Nanometrics LynX 9010T Optical CD Measurement (Scatterometry) system 300 mm 01.09.2008 1 as is where is immediately
93103 NGR NGR2150 E-beam wafer inspection 300 MM 1 as is where is
108853 NICOLET Avatar 370 DTGS FT-IR Spectrometer 1 inquire
108189 NIDEC Im15 Wafer inspection 1 as is where is
108190 NIDEC Im800 Wafer inspection 1 as is where is
99396 Nikon EpiPhot 200 Inspection Microscope 200 mm 1 as is where is immediately
106503 Nikon Auto Wafer Loader for Microscope Inspection WAFER INSPECTION MICROSCOPE 150 mm/200 mm 1 as is where is immediately
106707 NIKON AMI-3300 Wafer Inspection System 300 mm 1 as is where is
106708 NIKON AMI-3300 Wafer Inspection System 300 mm 1 as is where is
106709 NIKON AMI-3500 Wafer Inspection System 300 mm 1 as is where is
108092 Nikon OPTIPHOT-200 Wafer inspection microscope 200 mm 3 as is where is
108093 Nikon OPTIPHOT-300 Wafer inspection microscope 300 mm 1 as is where is
108094 Nikon OPTIPHOT-88-AC IN Wafer inspection microscope 200 mm 1 as is where is
108643 Nikon Eclipse L200 Wafer Inspection Microscope 150 mm/200 mm 01.06.2006 1 as is where is immediately
108772 Nikon Optistation 3 Wafer Inspection System 150 mm 01.05.1994 1 as is where is immediately
108784 Nikon Optistation 3A Automatic Wafer Inspection Station 200 mm 01.05.1997 1 as is where is immediately
108785 NIKON Optiphot 200 (For spares use) Wafer Inspection Microscope (Parts Tool Only) 200 mm 1 as is where is immediately
108789 Nikon Optiphot 200 Wafer Inspection Microscope 200 mm 1 as is all rebuilt immediately
108790 NIKON Optiphot 88 Wafer Inspection Microscope 200 mm 1 as is where is immediately
108854 NIKON NWL-860 Automatic Microscope Wafer Loader for up to 200mm Wafers 1 inquire
108855 NIKON Optiphot 200 Wafer Inspection Microscope, B/Dfield & DIC Microscopy, Motorized Turret with 5ea Objectives, Prior ProScan Programmable Stage, 200mm X 200mm XY Travel, Color CCD Camera & More 1 inquire
110610 NIKON OptiStation 3 Wafer Inspection Microscope 200 mm 1 as is where is immediately
110618 NIKON Optistation 3 Wafer Inspection Microscope 01.07.1994 1 as is where is immediately
110695 Nikon NWL 860 TMB Wafer Inspection Microscope with wafer autoloader 150 mm, 200 mm 1 as is where is immediately
110791 Nikon OptiStation 3200 Fully Automated Wafer Inspection Microscope 300 mm 1 as is where is immediately
108033 NOVA NOVASCAN 3090 P/N 390-10000-11 CMP metrology system 300 mm 1 as is where is immediately
108967 NOVA T600 MMSR Ellipsometer for CD and thin film measurements 300 mm 01.01.2018 1 as is where is immediately
109216 Nova NovaScan 3090 Next SA Optical CD Measurement 300mm 1 as is where is
109217 Nova NovaScan 3090 Next SA Optical CD Measurement 300mm 1 as is where is
109218 Nova NovaScan 3090 Next SA Optical CD Measurement 300mm 1 as is where is
109219 Nova NovaScan 3090 Next SA Optical CD Measurement 300mm 1 as is where is
109220 Nova V2600 Integrated CMP Endpoint / Film Measurement 300mm 1 as is where is
109283 NOVA MEASURING Novascan Novascan CMP Endpoint measurement unit 200 mm 01.06.2000 1 as is where is immediately
109284 NOVA MEASURING Novascan Novascan CMP Endpoint measurement unit 200 mm 01.06.2000 1 as is where is immediately
106825 Olympus AL110-LMB6 with MX51 wafer loader with Microscope 150mm 1 as is where is immediately
108786 OLYMPUS BH-BHM Wafer Inspection Microscope 150 mm 1 as is where is immediately
108857 OLYMPUS AL100-L8 Wafer Loader, 200mm, Parts Tool 200 MM 1 inquire
109035 Olympus AL110N-LMB6 Wafer Inspection Microscope with autoloader 100 MM AND 150 mm 1 as is where is immediately
109058 Olympus AL110N-LMB6 Microscope autoloader only (Not including the microscope) 100 MM AND 150 mm 1 as is where is immediately
110696 Olympus AL100-L6 Wafer autoloader 100MM TO 150 MM 1 as is where is immediately
110697 Olympus AL100-LB6 Wafer autoloader 100MM TO 150 MM 2 as is where is immediately
103547 ONTO WV320 MACRO INSPECTING 300 mm 31.05.2004 1 as is where is
109229 ONTO AutoEL III Ellipsometer 200mm 1 as is where is
109230 ONTO Axi 935 Macro-Defect 300mm 1 as is where is
109231 ONTO MetaPULSE 300 Film Thickness Measurement System 300mm 1 as is where is
109232 ONTO MetaPULSE 300 Film Thickness Measurement System 300mm 1 as is where is
109233 ONTO NSX 105 Macro-Defect 200mm 1 as is where is
109559 Philips PHI 680 Auger Nanoprobe Laboratory 01.05.1998 1 as is where is immediately
110683 Plasmos SD2000 Thin Film Thickness Measurement System / Ellipsometer 200 mm 01.06.1998 1 as is where is immediately
31246 PMS Liquitrack 776200 Non volatile residual Monitor for water-quality checking facilities 01.10.1999 1 as is where is immediately
91552 RAYTEX RXW-800 EDGE SCAN 200 mm 31.05.2008 1 as is where is
98489 Raytex RXW-0826SFIX-SMIF edge scanner 200mm 1 as is where is
108479 Raytex RXW-1227 EdgeScan Edge Defect 1 as is where is
108329 ReVera RVX1000 Film Thickness Measurement System 300 mm 1 as is where is immediately
108480 ReVera RVX1000 Film Thickness Measurement System 1 as is where is
91557 RIGAKU XRF3640 (Handle include) Wafer/ Disk Analyzer 200 mm 01.05.1995 1 as is where is
108194 RIGAKU 3640 WAFER/DISK Analyzer 200 mm 01.06.2000 1 as is where is immediately
108865 RIGAKU V300 Total Reflection Xray Fluoroescence Spectrometer 1 inquire
91559 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2005 1 as is where is
91560 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2005 1 as is where is
91561 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2006 1 as is where is
91563 RUDOLPH Meta Pulse Film Metrology 200 mm 31.05.2005 1 as is where is
91566 Rudolph WS3840 3D Bump Metrology 300 mm 31.05.2010 1 as is where is immediately
91567 RUDOLPH META PULSE 200 Surface Film Metrology 200 mm 31.05.2002 1 as is where is immediately
94478 RUDOLPH FE-3 Focus Ellipsometer 200 mm 1 as is where is
94479 RUDOLPH FE-4D Focus Ellipsometer 200 mm 1 as is where is
98296 RUDOLPH Meta Pulse 300 Film thickness measurement 300 mm 1 as is where is
98297 RUDOLPH Meta Pulse 300 Film thickness measurement 300 mm 1 as is where is
98298 RUDOLPH MP1-300 Film thickness measurement 300 mm 31.05.2007 1 as is where is
98835 RUDOLPH AXI-S Macro Wafer Inspection 300 mm 01.06.2004 1 as is where is immediately
98837 RUDOLPH MP1-300XCU Film Thickness Measurement System 300 mm 30.04.2008 1 as is where is immediately
100928 RUDOLPH AXI-S Macro Inspection System 300 mm 31.05.2003 1 as is where is
100929 RUDOLPH FE-7 Ellipsometer 200 mm 31.05.1996 1 as is where is
100930 RUDOLPH MP300 Film thickness measurement 200 mm 31.05.2007 1 as is where is
100931 RUDOLPH MP300 Film thickness measurement 200 mm 31.05.2009 1 as is where is
100932 RUDOLPH S3000A Focused Beam Ellipsometer 200 mm 31.05.2012 1 as is where is
103553 RUDOLPH AXI-S Macro Inspection 300 mm 31.05.2004 1 as is where is
103554 RUDOLPH AXI935D AVI 300 mm 1 as is where is
103555 RUDOLPH MP3 300XCU FLIM THICKNESS MEASUREMENT SYSTEM 300 mm 1 as is where is immediately
106420 Rudolph NSX 115 Automated Defect Inspection 200 mm 1 as is where is immediately
106421 Rudolph NSX 95 Automated Macro Defect Inspection 150 mm/200 mm 1 as is where is immediately
106422 Rudolph NSX-105 Automated Defect Inspection 150 mm/200 mm 1 as is where is immediately
106424 Rudolph NSX-95 Automated Macro Defect Inspection 150 mm/200 mm 1 as is where is immediately
106425 Rudolph NSX-95 Manual Macro Wafer Defect Inspection 150 mm/200 mm 1 as is where is immediately
106715 RUDOLPH MP3_300A METAL THICKNESS MEASUREMENT 300 mm 01.06.2012 1 as is where is
106716 RUDOLPH MP-300 Film thickness measurement 300 mm 01.06.2005 1 as is where is
106717 RUDOLPH MP1-300 Film Thickness Measurement 300 mm 01.06.2003 1 as is where is
106718 RUDOLPH MP1-300 Film Thickness Measurement 300 mm 1 as is where is
106719 RUDOLPH MP1-300XCU Film thickness measurement system 300 mm 01.06.2008 1 as is where is
106720 RUDOLPH NSX 105 MACRO DEFECT INSPECTION SYSTEM 300 mm 01.06.2008 1 as is where is immediately
106721 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2010 1 as is where is
106722 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2011 1 as is where is
106723 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 1 as is where is
106724 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2011 1 as is where is
106725 RUDOLPH S3000S FBE(focused beam laser ellipsometry) 300 mm 01.06.2010 1 as is where is
106726 RUDOLPH S3000S FBE(focused beam laser ellipsometry) 300 mm 1 as is where is
106727 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2003 1 as is where is
106728 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2003 1 as is where is
106729 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2006 1 as is where is
106730 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2002 1 as is where is
106731 RUDOLPH WV320 Macro Inspection 300 mm 01.06.2006 1 as is where is
106732 RUDOLPH MP200 Film thickness measurement 200 mm 01.06.2003 1 as is where is
106733 RUDOLPH MP200 Film thickness measurement 200 mm 01.06.1999 1 as is where is
106734 RUDOLPH WV320 Macro Defect Inspection System 300 mm 1 as is where is
106735 RUDOLPH WV320 Macro Defect Inspection System 300 mm 1 as is where is
106831 Rudolph MP200XCU Cu Film thickness measurement 200mm 1 inquire
106832 Rudolph MP300 Metal Film thickness measurement 300mm 1 inquire
106833 Rudolph MP300 XCu Cu Film thickness measurement 300mm 2 inquire
106871 RUDOLPH NSX 105 Automated Wafer, Die and Bump Inspection System 300 mm 01.06.2008 1 as is where is immediately
108034 RUDOLPH AXI-S930B Macro Defect Inspection 300 mm 01.01.2007 1 as is where is
108195 RUDOLPH META PULSE 200 Film thickness measurement 200 mm 01.06.1999 1 as is where is
108196 RUDOLPH META PULSE 200 Film thickness measurement 200 mm 01.06.2005 1 as is where is
108197 RUDOLPH META PULSE 200X CU Film thickness measurement (Including HDD) 200 mm 01.06.2003 1 as is where is
108198 RUDOLPH META PULSE 200X CU Film thickness measurement (Including HDD) 200 mm 01.06.2001 1 as is where is
108199 RUDOLPH META PULSE II 200X CU Film thickness measurement 200 mm 01.06.2008 1 as is where is
108200 RUDOLPH MP200 Film thickness measurement 200 mm 01.06.2002 1 as is where is
108482 Rudolph Axi 935 Macro-Defect 1 as is where is
108483 Rudolph Matrix S-300 Ellipsometer 300 mm 1 as is where is
108484 Rudolph MetaPULSE 300 Film Thickness Measurement System 300 mm 3 as is where is
108485 Rudolph NSX 105 Macro-Defect 300 mm 8 as is where is
108587 RUDOLPH WV320 Wafer Inspection System 300mm 1 as is where is immediately
108711 Rudolph Sonus 7800 Acoustic Metrology and Defect Detection System 300 MM 01.06.2015 1 inquire
109550 Rudolph AXI-S Macro Defect Inspection System 300 mm 01.06.2006 1 as is where is immediately
109570 Rudolph WaferView 320 Macro Wafer Defect Inspection System 300 mm 1 as is where is immediately
110735 Rudolph MetaPulse 200 Metal film measurement system 150-200 mm 01.06.2006 1 as is where is immediately
110736 Rudolph MetaPulse 200XCu Metal film measurement system 150-200 mm 01.06.2006 1 as is where is immediately
110759 Rudolph S300 Ultra II METROLOGY 300 mm 1 as is where is immediately
110795 Rudolph S300D Ultra II Thin Film Measurement Tool / Ellipsometer 300 mm 01.05.2005 1 as is where is immediately
106661 SDI FAAST 230-DP+SPV+SLIC CARRIER LIFETIME MEASUREMENT 200 mm 1 as is where is
108035 SEMILAB PMR_3000 Dose Monitoring 300 mm 1 as is where is
109074 Sensofar PLu Neox Optical 3D Surface Profiler with motorized XY stage, 4 Lens (10X, 20X, 50X, 100X), anti vibration table Optical 3D Surface Profiler 01.06.2012 1 as is where is
108696 SENTECH Senduro 300 Thin Film measurement Up to 300 MM 01.06.2008 1 inquire
106742 SSM Fastgate 5200 Resistivity / CV Measurement 200 mm 01.06.2008 1 as is where is immediately
108773 SSM 470i CV Plotter 1 inquire
110780 SSM 5130 Hg-CV Hg-CV measurement system up to 12 inch 01.01.2004 1 as is where is immediately
91569 Thermo Fisher ECO 1000 FTIR System 200 mm 01.05.2000 1 as is where is immediately
107011 Veeco Dektak 200 Si Contact Profilometer - for spares use (Not operational condition) 150 mm 01.06.2000 1 as is where is immediately
108331 Veeco Dimension 7000 Atomic Force Microscope (AFM) 200mm 1 as is where is immediately
108893 VEECO AP-150 Automtic Four Point Probe, for up to 6" Wafers 150 MM 1 as is where is 2 weeks
108894 VEECO Dektak 3030ST Profilometer 1 inquire
108916 Veeco Dimension X3D Model 340 Atomic Force Microscope 300 MM 01.05.2006 1 as is where is immediately
109116 Veeco Vx340 Dimension Atomic Force Proflier 300 mm 01.06.2010 1 as is where is immediately
109600 Veeco Dimension 3100 Atomic Force Microscope 1 inquire
93087 Woollam VUV-VASE (Gen II) Ellipsometer 300 MM 1 as is where is immediately
108216 ZEISS AXIOTRON Inspection Micro Scope 1 as is where is
108217 ZEISS AXIOTRON Inspection Micro Scope 1 as is where is
108218 ZEISS AXIOTRON High Perfomance Micro Scope 01.06.2008 1 as is where is
108545 Zeiss Axiospect 300 Optical Review System 300 mm 4 as is where is
108972 Zeiss Axiospect Wafer Inspection Microscope 300 mm 01.06.2011 1 as is where is immediately


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