FEI Company Tecnai G2 F30 TEM for Sale

SDI fabsurplus.com is pleased to announce the availability of the following listed used FEI Company Tecnai G2 F30 TEM.
Please click on the "Get Quote" button at the end of the Tecnai G2 F30 description, if you'd like to get a quotation, photos and specifications of this TEM, and your request for this equipment will be forwarded to our SDI sales representatives automatically.
This FEI Company Tecnai G2 F30 TEM is available for immediate sale.
Crating, refurbishment and delivery for this equipment can be quoted on request.

FEI Company Tecnai G2 F30 Equipment Details

SDI ID: 101441
Manufacturer: FEI Company
Model: Tecnai G2 F30
Description: TEM
Version: Laboratory
Vintage: Inquire
Quantity: 1
Sales Condition: as is where is
Lead Time: immediately
Sales Price: Inquire

FEI Tecnai G2-F30

Configuration Details:

Tecnai 30ST
S/N :
High Tension : 300kV
Resolution TEM point : 0.205nm
Resolution HRSTEM : 0.16nm

Camera : Gatan 794 CCD
EELS : Gatan Tridiem
Lorentz lens
Tomography STEM/TEM

OS : Windows XP sp3
Tecnai 3.1.2
TIA 3.2 SP6
Digital Micrograph 3.9.5 for GMA 1.4.5

Objective Lens Type : PLEASE SPECIFY

Essential specifications
Electron source
• Flexible high tension (50, 100, 150, 200, 250, 300 kV and values in between)
• Schottky Field emitter with high maximum beam current ( 100 nA)
• High probe current (0.6 nA in a 1 nm spot, 15 nA in a 10 nm spot)
• Small energy spread (0.8 eV or less)
• Spot drift 1 nm/minute


• Patented TWIN, S-TWIN and U-TWIN objective lenses
• Coma-free alignment for high resolution objective-lens centering
• Ranged, rotation-free magnification and diffraction series
• Magnification reproducible within ± 1.5%
• Embedded CCD/energy filter
• Lorentz lens for field free imaging for magnetic field visualization (optional)


• Fully digital scan system
• Bright Field and Annular Dark Field mode
• High resolution STEM with HAADF detector


• Excellent EDX in-hole performance ( 1% hole count)
• Low system background in EDX ( 1% spurious peaks)
• High P/B ratio (Fiori number) 4000
• Embedding of EDX, PEELS and energy filter
• Spectrum imaging with multiple detectors

Specimen stage

• Fully computer-controlled, eucentric side-entry, high stability CompuStage
• Maximized tilts for any X,Y,Z, α and β combination
• Choice of a variety of specimen holders
• X, Y movement ± 1 mm, Z movement ± 0.375 mm; specimen size 3 mm
• Specimen recall reproducibility: ≤ 0.3 μm (after movement of 300 μm in x and y) and ≤ 0.1 (α tilt)
• Drift ≤ 0.5 nm/minute with a standard holder attainable


• Fully interlocked differentially pumped column
• Clean vacuum system with turbo molecular pump, prepumping column, gun and specimen airlock
• 150 l/s Ion Getter Pump on specimen area • Liner tubes pumped by additional Ion Getter Pump
• Ultra-high vacuum for contamination-free observation
• Vacuum levels: specimen chamber 2.7 × 10-5 Pa ; gun 5 × 10-7 Pa
• Fast airlock pumping times: user selectable down to 1 min
• Plate camera exchange without switching off high tension or emitter

Software and control

• Operations system: Windows® XP • Remote operation (optional)
• Motorized apertures (optional) • Scripting software (optional)
• Xplore3D™: FEIs intelligent tomography solution for TEM and STEM (optional)
• TrueImage: FEIs patented focal series acquisition and reconstruction software package (optional)

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The data provided herein is not an offer capable of acceptance.
The information contained on this page is, to our knowledge and information, accurate, but it may contain errors and therefore we do not warrant the completeness or accuracy of the information contained on this page.
Any offer by you to purchase the equipment described on this page shall be subject to our standard terms and conditions of sale.

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