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Rudolph NSX 105 Macro-Defect Inspection System for Sale


SDI fabsurplus.com is pleased to announce the availability of the following listed used Rudolph NSX 105 Macro-Defect Inspection System.
Please click on the "Send More Details" button at the end of the NSX 105 description, if you'd like to get more details, photos and specifications of this Macro-Defect Inspection System, and your request for this equipment will be forwarded to our SDI sales representatives automatically.
This Rudolph NSX 105 Macro-Defect Inspection System is available for immediate sale.
Crating, refurbishment and delivery for this equipment can be quoted on request.


Rudolph NSX 105 Equipment Details

SDI ID: 101490
Manufacturer: Rudolph
Model: NSX 105
Description: Macro-Defect Inspection System
Version: 200mm
Vintage: 01.07.2008
Quantity: 1
Sales Condition: as is where is
Lead Time: immediately
Sales Price: 185,000 USD
Comments:

Rudolpht NSX-105 Specifications

 

Currently Configured for: 200mm

Asset HDD not included

Loading Configuration : Open Cassette & FOUP

Type: Macro Inspection

Wafer Size: 100mm to 300mm

 

System Feature:

Throughput: Up to 120 Wafers per hour

Performance: Up to 60MB processing / Sec

Review Camera: Adimec 33 FPS 3CCD Color

Illumination: High Speed Strobe

Staging: Using Continuous Scan Technology

Inspection Axis: Linear motor drive

Support Wafer: 100mm to 300mm (<300 on film frames)

Defect Sensitivity: To 0.5micron (User Adjustable)

Dark Field Option: Yes

OS: Windows XP

Computer: 2.4Ghz

Image Processing System: Genesis (2 nodes)

Data Collection: Automatic

Platform: Aluminum hard anodized with Ni Plating

Turret Assembly: 1X , 2X, 5X, 10X and 20X

2D Defect and Metrology Verification Standard: NIST Certified

Mini Environment for Wafer Handling: Class 100 with 600CFM

Filter Blower Ionizer for Clear Air: Included

Light Tower: Included

Docking Module: Included

Multipass Software: Included

Single OCR: Whole Wafer Only

Wafer Map Integration and Test Service: Included

DCS I: Defect Capture Station Stand alone Capturing Images from Inspection system

Review Pilot Software: Included

High Speed Focus Map Sensor (Point Sensor): Resolution 0.02um measuring range +-1/0 working distance 10mm spot dimeter 20um, response time 200ms Linearity +-0.03% of F.S. Visible Red 650nm Laser Light Source

 

Facility Configuration:

Single Phase + GRD

Power: 200-240 VAC @ 50/60 Hz

Full Load: 40 Amps

Largest load: 8Amp

House Vacuum CDA

Weight: 2000 lbs

Categories:
Attachments: 10 Files
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The data provided herein is not an offer capable of acceptance.
The information contained on this page is, to our knowledge and information, accurate, but it may contain errors and therefore we do not warrant the completeness or accuracy of the information contained on this page.
Any offer by you to purchase the equipment described on this page shall be subject to our standard terms and conditions of sale.

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