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Seiko Instruments Xvision 300DB Fib-SEM for Sale


SDI fabsurplus.com is pleased to announce the availability of the following listed used Seiko Instruments Xvision 300DB Fib-SEM.
Please click on the "Send More Details" button at the end of the Xvision 300DB description, if you'd like to get more details, photos and specifications of this Fib-SEM, and your request for this equipment will be forwarded to our SDI sales representatives automatically.
This Seiko Instruments Xvision 300DB Fib-SEM is available for immediate sale.
Crating, refurbishment and delivery for this equipment can be quoted on request.


Seiko Instruments Xvision 300DB Equipment Details

SDI ID: 102379
Manufacturer: Seiko Instruments
Model: Xvision 300DB
Description: Fib-SEM
Version: 300 mm
Vintage: Inquire
Quantity: 1
Sales Condition: as is where is
Lead Time: immediately
Sales Price: Inquire
Comments:

XVision 300D / TB series

Resolution (secondary electron Image)

4nm/30Kv

Acceleration Voltage

1-30 V

Maximum Probe current density

50A/cm

Maximum current

90NA

Electron Beam (FE-SEM)

Resolution (third-order electron image)

3nm @ 5kV

Beam coin incident point

1-30kV

Ar Beam (TB only)

Accelerated Voltage

0.5-2kV

Stage

Sample Stage

5-axis electric tilt stage (with scale feedback)

Sample Size

Up to 300 mm JEIDA standard Wafer

Option

Linkage with missing test dosage

Micro probing system

4ch multi-gas supply system

Continued  TEM sample automatic addition Software

Categories:
Attachments: 6 Files
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The data provided herein is not an offer capable of acceptance.
The information contained on this page is, to our knowledge and information, accurate, but it may contain errors and therefore we do not warrant the completeness or accuracy of the information contained on this page.
Any offer by you to purchase the equipment described on this page shall be subject to our standard terms and conditions of sale.

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