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KLA-Tencor Candela 7100 Wafer Inspection system for Hard Disk Substrates for Sale


SDI fabsurplus.com is pleased to announce the availability of the following listed used KLA-Tencor Candela 7100 Wafer Inspection system for Hard Disk Substrates.
Please click on the "Get Quote" button at the end of the Candela 7100 description, if you'd like to get a quotation, photos and specifications of this Wafer Inspection system for Hard Disk Substrates, and your request for this equipment will be forwarded to our SDI sales representatives automatically.
This KLA-Tencor Candela 7100 Wafer Inspection system for Hard Disk Substrates is available for immediate sale.
Crating, refurbishment and delivery for this equipment can be quoted on request.


KLA-Tencor Candela 7100 Equipment Details

SDI ID: 106194
Manufacturer: KLA-Tencor
Model: Candela 7100
Description: Wafer Inspection system for Hard Disk Substrates
Version: Inquire
Vintage: 01.12.2010
Quantity: 1
Sales Condition: as is where is
Lead Time: immediately
Sales Price: Inquire
Comments:

De-installed from working condition in June 2022.
See attached photos of the tool taken before it was removed from the wafer fab.
power rating 230 V 1 phase 5A.
Software version installed: Candela 71xx Version 1.1 Build 8 Aug 2010.
Memory allocated: 1079 MB.
Computer Type: DELL.
Windows version: Vista.
No known missing parts.

Product Description

Designed for hard disk drive substrates and media inspection.
Fitted with a dual-wavelength laser .
Multi-channel scatter detectors provide enhanced sensitivity for classification of sub-micron pits, bumps, particles, and buried defects on a full range of substrates.
The capability and stability of the 7100 series ensures that one platform can be used for multiple process control application points.

Features
    Detects and classifies sub-micron pits, bumps, particles, buried defects on metal and glass, substrates and media with full disk defect maps.
    Provides faster time to results through full disk maps, with classified defects and actionable data output.
    Reduces dependence on off-line inspection technologies (AFM, SEM, TEM, etc.).
    Available in either a manual or fully-automated configuration

Can be used for
    Defect inspection
    Scratch and ridge inspection
    Particle and stain inspection
    Laser texture analysis
    Carbon uniformity analysis and carbon void inspection
    Recording layer and soft underlayer mapping
    Lube uniformity analysis
    Magnetic imaging

Options
    Precision diamond scribe
    High Sensitivity (HS) option
    Magnetic imaging
    Offline software large form factor software license


Get Quote



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The data provided herein is not an offer capable of acceptance.
The information contained on this page is, to our knowledge and information, accurate, but it may contain errors and therefore we do not warrant the completeness or accuracy of the information contained on this page.
Any offer by you to purchase the equipment described on this page shall be subject to our standard terms and conditions of sale.

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