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LEICA INS-3000 DUV Wafer Defect Inspection ( NT OS) for Sale


SDI fabsurplus.com is pleased to announce the availability of the following listed used LEICA INS-3000 DUV Wafer Defect Inspection ( NT OS).
Please click on the "Send More Details" button at the end of the INS-3000 DUV description, if you'd like to get more details, photos and specifications of this Wafer Defect Inspection ( NT OS), and your request for this equipment will be forwarded to our SDI sales representatives automatically.
This LEICA INS-3000 DUV Wafer Defect Inspection ( NT OS) is available for immediate sale.
Crating, refurbishment and delivery for this equipment can be quoted on request.


LEICA INS-3000 DUV Equipment Details

SDI ID: 91489
Manufacturer: LEICA
Model: INS-3000 DUV
Description: Wafer Defect Inspection ( NT OS)
Version: 200 mm
Vintage: 01.06.2003
Quantity: 1
Sales Condition: as is where is
Lead Time: Inquire
Sales Price: Inquire
Comments:
De-installed, warehoused. Can be inspected by appointment.
Categories:
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The data provided herein is not an offer capable of acceptance.
The information contained on this page is, to our knowledge and information, accurate, but it may contain errors and therefore we do not warrant the completeness or accuracy of the information contained on this page.
Any offer by you to purchase the equipment described on this page shall be subject to our standard terms and conditions of sale.

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