SDI fabsurplus.com is pleased to announce the availability of the following listed used Cyberscan CT350T Dual non-contact double-sided optical profilometer.
Please click on the "Send More Details" button at the end of the CT350T description, if you'd like to get more details, photos and specifications of this Dual non-contact double-sided optical profilometer, and your request for this equipment will be forwarded to our SDI sales representatives automatically.
This Cyberscan CT350T Dual non-contact double-sided optical profilometer is available for immediate sale.
Crating, refurbishment and delivery for this equipment can be quoted on request.
|Description:||Dual non-contact double-sided optical profilometer|
|Sales Condition:||as is where is|
|Sales Price:||90,000 USD|
Has CE Mark.- DUAL NON-CONTACT MEASUREMENT SYSTEM - 3D MAPPING OF THICKNESS,BOW, WARPAGE AND ROUHGNESS - USER FRIENDLY CONCEPT - SOPHISTICATED ANALYSIS AND AUTOMATION SOFTWARE Tools are still running in production. Available from May/June 2019 Inspection already possible! The tools are pretty new and rarely used. Vintage 2018 and 2015 The CT 350T was originally designed for measuring thickness of substrates and wafers. It provides accurate measurements independent of material and surface properties. There is no limitation on the minimum thickness, even measurements of samples with a thickness of only a few microns can easily be taken. The CT 350T is a non-contact double-sided optical profilometer with a 300 mm x-/y- scanning stage. The upper sensor is mounted on a highly accurate z-axis with 100 mm range, while the lower sensor is stationary inside the granite platform. Both sensors collect height data synchronized with x-, y- encoder signals and are aligned axially in order to ensure accurate differential thickness measurements. The software generates 2D profiles and 3D maps simultaneously from the top and the bottom surface and calculates the corresponding total thickness profile or map. The motion system uses fast and accurate magnetic linear motors. By triggering the chromatic white light sensors at a data rate of 4 kHz the inspection time is minimized. The sensors are available with a z-resolution down to 3 nm and a measurement range up to 25 mm. With an adapter plate on the stage aperture the system can be used as a standard optical surface profilometer which makes the CT 350T the most versatile surface and thickness measurement system. The system is also available in a smaller version as CT 250T with 200 mm travel ideally for 8” wafers or substrates and solar wafers. Technology Fast and accurate dual scanning system Measurement speed: 4 kHz 300 mm (200 mm) travel in x- and y-direction, lateral resolution 50 nm, motorized z-axis resolution 5 nm 2D profiles and 3D topographical maps and 3D thickness maps Large scanning area Maximum x-, y-, z-resolution up to the full maximum travel of 300 mm (200 mm) Chromatic white light sensors Z-resolution down to 3 nm, measurement range up to 25 mm High resolution off-axis camera
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