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Hitachi SU 8010 Ultra High Resolution Field Emission Scanning Electron Microscope for Sale


SDI fabsurplus.com is pleased to announce the availability of the following listed used Hitachi SU 8010 Ultra High Resolution Field Emission Scanning Electron Microscope.
Please click on the "Send More Details" button at the end of the SU 8010 description, if you'd like to get more details, photos and specifications of this Ultra High Resolution Field Emission Scanning Electron Microscope, and your request for this equipment will be forwarded to our SDI sales representatives automatically.
This Hitachi SU 8010 Ultra High Resolution Field Emission Scanning Electron Microscope is available for immediate sale.
Crating, refurbishment and delivery for this equipment can be quoted on request.


Hitachi SU 8010 Equipment Details

SDI ID: 97043
Manufacturer: Hitachi
Model: SU 8010
Description: Ultra High Resolution Field Emission Scanning Electron Microscope
Version: 100 mm
Vintage: 01.06.2014
Quantity: 1
Sales Condition: as is where is
Lead Time: immediately
Sales Price: Inquire
Comments:

Ultra High Resolution Field Emission Scanning Electron Microscope,resolution 1nm /15kV

Designed for ultra high resolution microscopy for use in fields such as semiconductors, electronics, catalysis and other functional materials, biotechnology and pharmaceuticals.
Ultra High Resolution FE-SEM has grown to be an indispensable tool to observe the fine surface structure of materials in a wide range of nanotechnology fields.The new SU8000 Series has excellent imaging performance throughout the range, and offers a variety of stages, chambers and signal detection systems to meet the wide variety of customer-specific needs for ultra high resolution microscopy.

The Su 8010 features a semi-in-lens type objective lens and a cold FE gun with a small energy spread. Signal mixing simultaneously using dual SE and BSE detectors is available by changing the voltage of the signal conversion electrode in the objective lens. A beam decelerator is also available to improve image quality and reduce damage to the sample.

100mm ( 4") diameter capacity 3 axis stage

upper and lower secondary electron detectors

Keithley single channel System source meter,D32 2635B

Options: Kleindeike probe, Electron Beam Induced Current option ( EBIC) for characterisation of electrical properties of semiconductor materials,sub surface electronic structure and defect analysis.

The unit has been lightly used in an R and D environment for 3-4 years, and then it has been professionally de-installed, and is currently in storage in the E. U.

The Unit can be inspected by appointment.

SE Detector

SE resolution

1.0nm(Vacc 15kV, WD = 4mm)

1.3nm (landing voltage 1kV, WD = 1.5mm)

Top detector

NO

Upper detector

YES

Lower detector

YES

Specimen Stage

Stage control

3-axis motor drive stage *5-axis motor drive stage (option)

Stage

Traverse

Range

 

X

0 ~ 50mm

Y

0 ~ 50mm

R

360°

T

-5 ~ 70°

Z

1.5 ~ 30mm

Max. sample size

100mm dia. *150mm dia. (Option)

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The data provided herein is not an offer capable of acceptance.
The information contained on this page is, to our knowledge and information, accurate, but it may contain errors and therefore we do not warrant the completeness or accuracy of the information contained on this page.
Any offer by you to purchase the equipment described on this page shall be subject to our standard terms and conditions of sale.

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