Please find below a list of Used Probers for sale by fabsurplus.com .Click on any listed Prober to see further data.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 98974 | ACCRETECH | SA2400 | Wafer Prober | 300 mm | 01.12.2006 | 1 | as is where is | |
| 98975 | ACCRETECH | SA2500 | Wafer Prober | 300 mm | 01.03.2008 | 1 | as is where is | |
| 98976 | ACCRETECH | UF200 | Wafer Prober | 200 mm | 01.10.1994 | 1 | as is where is | |
| 98977 | ACCRETECH | UF200 | Wafer Prober | 200 mm | 01.10.1998 | 1 | as is where is | |
| 98978 | ACCRETECH | UF200A | Wafer Prober | 200 mm | 01.06.2003 | 1 | as is where is | |
| 98979 | ACCRETECH | UF200A | Wafer Prober | 200 mm | 01.09.2003 | 1 | as is where is | |
| 98980 | ACCRETECH | UF200A | Wafer Prober | 200 mm | 01.09.2003 | 1 | as is where is | |
| 98981 | ACCRETECH | UF200A | Wafer Prober | 200 mm | 01.09.2003 | 1 | as is where is | |
| 98982 | ACCRETECH | UF200S | Wafer Prober | 200 mm | 01.02.2002 | 1 | as is where is | |
| 98983 | ACCRETECH | UF200S | Wafer Prober | 200 mm | 01.02.2002 | 1 | as is where is | |
| 98984 | ACCRETECH | UF200SA | Wafer Prober | 200 mm | 01.05.2004 | 1 | as is where is | |
| 98985 | ACCRETECH | UF200SA | Wafer Prober | 200 mm | 01.05.2004 | 1 | as is where is | |
| 98986 | ACCRETECH | UF200SA | Wafer Prober | 200 mm | 01.10.2003 | 1 | as is where is | |
| 98987 | ACCRETECH | UF200SA | Wafer Prober | 200 mm | 01.10.2003 | 1 | as is where is | |
| 98988 | ACCRETECH | UF200SA | Wafer Prober | 200 mm | 01.05.2004 | 1 | as is where is | |
| 98989 | ACCRETECH | UF200SA | Wafer Prober | 200 mm | 01.10.2004 | 1 | as is where is | |
| 86068 | Accretech / TSK | UF190A | Prober | 1 | inquire | immediately | ||
| 89027 | Accretech / TSK | UF200A | Automatic Prober | 200 mm | 1 | inquire | immediately | |
| 92435 | Accretech / TSK | EM-11A | Prober | 6 | inquire | |||
| 92436 | Accretech / TSK | UF190B | Prober | 3 | inquire | |||
| 93855 | Accretech / TSK | UF200 SA | prober with cold option (-40C) | 200 mm | 01.02.2005 | 1 | as is where is | immediately |
| 96180 | Accretech / TSK | UF200 AL | Prober, AMBIENT AND HOT | 200 mm | 3 | as is where is | immediately | |
| 96781 | Accretech / TSK | UF200H Cold | Wafer PROBER | 200 mm | 01.06.2001 | 1 | inquire | |
| 98228 | Accretech / TSK | MHF6000 | Manipulator | 1 | inquire | |||
| 98229 | Accretech / TSK | MHF300L | Manipulator | 11 | inquire | immediately | ||
| 98230 | Accretech / TSK | MHF 400 | 4000 Series Manipulator | 9 | inquire | immediately | ||
| 98246 | Accretech / TSK | UF200A | Prober | 200 mm | 1 | inquire | immediately | |
| 98247 | Accretech / TSK | UF200SA | Prober | 200 mm | 1 | inquire | immediately | |
| 98249 | Accretech / TSK | UF200 | Prober | 200 mm | 4 | inquire | immediately | |
| 54226 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 01.06.1999 | 1 | as is where is | immediately |
| 95398 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 01.06.1999 | 1 | as is where is | immediately |
| 95399 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 01.06.1999 | 1 | as is where is | immediately |
| 95400 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 01.06.1999 | 1 | as is where is | immediately |
| 95401 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 01.06.1999 | 1 | as is where is | immediately |
| 95402 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 01.06.1999 | 1 | as is where is | immediately |
| 95403 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 01.06.1999 | 1 | as is where is | immediately |
| 99907 | Accretech/TSK | UF3000EX | Automatic Wafer Prober | 01.05.2007 | 1 | as is where is | immediately | |
| 100058 | Accretech/TSK | UF3000 | Prober | 300 mm | 1 | as is where is | immediately | |
| 100059 | Accretech/TSK | UF3000 | Prober | 300mm | 1 | as is where is | ||
| 100060 | Accretech/TSK | UF3000 | Prober | 300mm | 1 | as is where is | ||
| 101379 | Accretech/TSK | UF3000 | Wafer Prober | 300mm | 01.11.2006 | 1 | as is where is | |
| 101380 | Accretech/TSK | UF3000 | Wafer Prober | 300mm | 01.11.2013 | 1 | as is where is | |
| 101381 | Accretech/TSK | UF3000 | Wafer Prober | 300mm | 01.06.2004 | 1 | as is where is | |
| 101382 | Accretech/TSK | UF3000EX | Wafer Prober | 300mm | 1 | as is where is | immediately | |
| 91879 | ALESSI | REL-4500 | Analytical Wafer Prober with 6" (dia.) Gold Plated Chuck | 150 mm | 1 | inquire | immediately | |
| 92046 | Alessi | REL 6100 | Manual Prober (For spares use) | 1 | as is where is | immediately | ||
| 92345 | Applied Precision | Probeworx 300 | Wafer Probe Card Test and Analysis System | 01.01.2008 | 1 | as is where is | immediately | |
| 95279 | Cascade | Alessi REL-5500 | Prober | 200mm | 1 | as is where is | ||
| 98231 | Cascade | REL-4800 | Prober | 200 mm | 1 | inquire | immediately | |
| 98232 | Cascade | REL-5500 | Prober | 200 mm | 1 | inquire | immediately | |
| 98267 | CASCADE | PM8 | Prober | 1 | as is where is | |||
| 99002 | CASCADE | S200 | Wafer Prober | 200 mm | 1 | as is where is | ||
| 101678 | CSE | X-300 | Semi-Auto Prober | 300 mm | 1 | inquire | ||
| 92026 | Electroglas | 4080X | Wafer Prober | 1 | as is where is | immediately | ||
| 77057 | Electroglas | EG2001X | Prober | 1 | ||||
| 78132 | Electroglas | Horizon 4085X | Fully Automatic Prober with an inker | 200 mm | 01.02.1998 | 1 | as is where is | immediately |
| 86457 | Electroglas | EG2001 | prober | 150 mm | 1 | as is where is | immediately | |
| 86458 | Electroglas | EG2001 | prober | 150 mm | 1 | as is where is | immediately | |
| 86459 | Electroglas | EG2001 | prober | 150 mm | 1 | as is where is | immediately | |
| 88820 | Electroglas | 2001 | Automatic Prober | 150 mm | 2 | as is where is | immediately | |
| 91591 | ELECTROGLAS | EG5300 | Prober | 300 mm | 1 | as is where is | ||
| 91592 | ELECTROGLAS | EG5/300 A | Prober | 300 mm | 01.01.2005 | 1 | as is where is | immediately |
| 91593 | ELECTROGLAS | EG5300 | Prober | 300 mm | 1 | as is where is | ||
| 96707 | Electroglas | EG4080X | Wafer PROBER | 200 MM | 1 | as is where is | ||
| 96708 | Electroglas | EG4080X | Wafer PROBER | 200 MM | 1 | inquire | ||
| 96709 | Electroglas | EG4080X | Wafer PROBER | 200 MM | 1 | inquire | ||
| 96710 | Electroglas | EG4090U | Wafer PROBER | 200 MM | 3 | inquire | ||
| 96711 | Electroglas | EG4090U | Wafer PROBER | 200 MM | 1 | inquire | ||
| 96712 | Electroglas | EG4090U | Wafer PROBER | 200 MM | 1 | inquire | ||
| 96713 | Electroglas | EG4090U | Wafer PROBER | 200 MM | 1 | inquire | ||
| 96714 | Electroglas | EG4090U | Wafer PROBER | 200 MM | 1 | inquire | ||
| 96715 | Electroglas | EG4090U | Wafer PROBER | 200 MM | 1 | inquire | ||
| 98029 | ELECTROGLAS | EG5/300E | Prober | 300 mm | 01.06.2004 | 1 | as is where is | |
| 98235 | Electroglas | 2001X | Prober | 200 mm | 15 | inquire | immediately | |
| 98237 | Electroglas | 3001X | Prober | 200 mm | 1 | inquire | immediately | |
| 98238 | Electroglas | 4060 | Prober | 200 mm | 3 | inquire | immediately | |
| 98239 | Electroglas | 4080 | Prober | 200 mm | 20 | inquire | immediately | |
| 98240 | Electroglas | 4085 | Prober | 200 mm | 5 | inquire | immediately | |
| 98241 | Electroglas | 4090u | Prober | 200 mm | 15 | inquire | immediately | |
| 98242 | Electroglas | 4090u | Prober | 200 mm | 1 | inquire | immediately | |
| 98244 | Electroglas | 4090u+ | Prober | 200 mm | 2 | inquire | immediately | |
| 98391 | Electroglas | E2001CX | Prober | 150 mm | 1 | as is where is | ||
| 99851 | Electroglas | 2010CX | Prober | 150 mm | 3 | inquire | ||
| 101337 | Electroglas | EG 2001 | Wafer Prober | 150mm | 1 | as is where is | ||
| 101679 | Electroglas | 1034 | Prober | 2 | inquire | |||
| 101680 | Electroglas | 4090u | Tri-temp Prober | 200 MM | 1 | inquire | ||
| 83524 | ERS | AC3 | 200 MM THERMAL CHUCK SYSTEM FOR A MANUAL PROBER | 200 MM | 1 | inquire | 3 months | |
| 97105 | Karl Suss | PSM6 | Wafer Prober | 150 mm | 1 | as is where is | immediately | |
| 98972 | Karl Suss | PSM6 | Wafer Prober | 150 mm | 1 | inquire | immediately | |
| 99397 | KARL SUSS | PM 8 | Prober | 1 | as is where is | immediately | ||
| 99838 | Karl Suss | AP6 | Manual prober with shield box and 6 probes | 1 | as is where is | immediately | ||
| 99839 | Karl Suss | PSM4 | Manual prober with 8 probes | 1 | as is where is | immediately | ||
| 86304 | KLA | 1007 | Chuck, prober, 6" gold chuck assembly | 200 mm | 1 | inquire | immediately | |
| 87086 | KLA | 655-6616141-00 | Wafer stage, kla 21xx | 200 mm | 1 | inquire | immediately | |
| 96664 | MarTek/Electroglas | EG 4090U | Prober | 1 | as is where is | immediately | ||
| 71902 | Microcontrol | MWE Plus | UV Wafer Eraser with cassette loading | 200 mm , 150 mm, 125 mm | 01.06.2000 | 1 | as is where is | immediately |
| 101683 | Micromanipulator | 9900 | Prober | 2 | inquire | |||
| 100219 | MPI Corporation | LEDA P6801 | LED Die Prober | 200mm | 01.06.2010 | 1 | as is where is | |
| 94398 | NexGen Technologies | Nexgen Prober 2013 Model | semi-automatic prober with hot chuck | Min 75 mm Max 200 mm Set 200 mm | 01.06.2013 | 1 | as is where is | immediately |
| 101684 | Probilt | PB6800 | Prober | 1 | inquire | |||
| 96611 | QMC | DPS-600 | LED Die Probing System | Up to 6 inch | 01.12.2011 | 1 | as is where is | immediately |
| 96635 | QMC | DPS-600 | LED Die Probing System | Up to 6 inch | 01.12.2011 | 1 | as is where is | immediately |
| 96636 | QMC | DPS-600 | LED Die Probing System | Up to 6 inch | 01.12.2011 | 1 | as is where is | immediately |
| 96637 | QMC | DPS-600 | LED Die Probing System | Up to 6 inch | 01.12.2011 | 1 | as is where is | immediately |
| 96638 | QMC | DPS-600 | LED Die Probing System | Up to 6 inch | 01.12.2011 | 1 | as is where is | immediately |
| 91040 | RUCKER & KOLLS | 683A | PROBER | 200 mm | 1 | as is where is | immediately | |
| 99341 | Rucker & Kolls | 680A | SEMI-AUTOMATIC PROBER | 01.06.1995 | 1 | as is where is | ||
| 84169 | SEMICS | OPUS2 | Prober | 300 mm | 1 | as is where is | immediately | |
| 86465 | SEMICS | Opus 2 | Prober | 300 mm | 01.06.2007 | 1 | as is where is | immediately |
| 97873 | SEMICS | OPUS II | Wafer Prober | 1 | as is where is | |||
| 97874 | SEMICS | OPUS II | Wafer Prober | 1 | as is where is | |||
| 97875 | SEMICS | OPUS II | Wafer Prober | 300 mm | 01.06.2006 | 1 | as is where is | |
| 97876 | SEMICS | OPUS II | Wafer Prober | 1 | as is where is | |||
| 97967 | SEMICS | OPUS3 | PROBER | 1 | inquire | |||
| 90336 | Signatone | S-580 | prober | 200mm | 1 | as is where is | immediately | |
| 90372 | Signatone | S-1160 | Probe Station | 1 | as is where is | |||
| 71904 | ST Automation | test head | test head for Eprom U 1835 | 1 | as is where is | |||
| 96554 | TEL | P12 XL | Prober | 01.01.2003 | 1 | as is where is | immediately | |
| 34069 | TEL TOKYO ELECTRON | P8 | PROBER | 200 MM | 01.06.2002 | 1 | as is where is | immediately |
| 74530 | TEL Tokyo Electron | P8 | PROBER | 200 MM | 6 | as is where is | ||
| 78323 | TEL Tokyo Electron | P12XL | PROBER | 1 | as is where is | |||
| 86067 | TEL Tokyo Electron | P8XL | Prober | 1 | inquire | immediately | ||
| 87848 | TEL TOKYO ELECTRON | P12XLM | Prober | 300 mm | 01.06.2006 | 1 | inquire | immediately |
| 87849 | TEL TOKYO ELECTRON | P-12XLM | Prober | 300 mm | 01.06.2006 | 1 | inquire | immediately |
| 91594 | TEL TOKYO ELECTRON | P-8 | AUTOMATIC WAFER PROBER | 200 mm | 01.06.2002 | 1 | as is where is | |
| 92348 | TEL Tokyo Electron | WDF DP | Prober | 200 mm | 01.12.2004 | 1 | inquire | immediately |
| 92368 | TEL Tokyo Electron | P12XLn+ | Fully Automatic Prober | 300 mm | 01.08.2006 | 1 | inquire | 1 month |
| 92437 | TEL Tokyo Electron | 19S | Prober | 9 | inquire | |||
| 92438 | TEL Tokyo Electron | P8 ( VIP4 ) | Prober | 16 | inquire | |||
| 92440 | TEL Tokyo Electron | P8XL | Prober | 01.10.2002 | 1 | inquire | ||
| 92441 | TEL Tokyo Electron | P12XL ( WAT ) | Fully Automatic Prober with Gold Hot Chuck and WAT | 300 MM | 01.06.2009 | 1 | inquire | immediately |
| 93837 | TEL Tokyo Electron | P12XL | Prober | 300 mm | 01.06.2004 | 1 | inquire | immediately |
| 94023 | TEL Tokyo Electron | P8XL | Fully Automatic Prober with Hot Chuck | 200 mm | 01.06.2001 | 1 | as is where is | immediately |
| 95987 | TEL Tokyo Electron | P12XL ( WAT ) | Fully Automatic Prober with Gold Hot Chuck and WAT | 300 MM | 01.10.2008 | 1 | inquire | immediately |
| 96381 | TEL Tokyo Electron | P-12XL | Prober | 300 mm | 01.02.2006 | 1 | as is where is | immediately |
| 96724 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96725 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96726 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96727 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96728 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96729 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96730 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96731 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96732 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96733 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96734 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96735 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96736 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96737 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96738 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96739 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96740 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96741 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96742 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96743 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96744 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2003 | 1 | inquire | |
| 96745 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96746 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96747 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96748 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96749 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96750 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96751 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96752 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2003 | 1 | inquire | |
| 96753 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96754 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96755 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 1 | inquire | ||
| 98042 | TEL Tokyo Electron | P-12XL | Prober | 300 mm | 01.06.2002 | 1 | as is where is | |
| 98045 | TEL Tokyo Electron | Precio Nano | Prober | 300 mm | 01.06.2012 | 1 | as is where is | immediately |
| 98250 | TEL Tokyo Electron | P8 | Prober | 200 mm | 3 | inquire | immediately | |
| 98251 | TEL Tokyo Electron | P8XL | Prober | 200 mm | 2 | inquire | immediately | |
| 98252 | TEL Tokyo Electron | P8XLm | Prober | 200 mm | 2 | inquire | immediately | |
| 98253 | TEL Tokyo Electron | P12XLn | Prober | 300 MM | 2 | inquire | immediately | |
| 98254 | TEL Tokyo Electron | P12XLn | Prober | 300 MM | 2 | inquire | immediately | |
| 98255 | TEL Tokyo Electron | P-12XLn+ | Prober | 300 MM | 2 | inquire | immediately | |
| 98256 | TEL Tokyo Electron | P-12XLm | Prober | 300 MM | 1 | inquire | immediately | |
| 98257 | TEL Tokyo Electron | WDF | Prober, 6 Inch Frame | 150 MM | 2 | inquire | immediately | |
| 99915 | TEL Tokyo Electron | P12XLM | Prober | 300 mm | 01.06.2006 | 1 | as is where is | |
| 100265 | TEL Tokyo Electron | P-12XLn | Prober | 300mm | 1 | as is where is | ||
| 96665 | Tokyo Seimitsu | A-PM-90A | Prober | 01.09.1997 | 1 | as is where is | immediately | |
| 96553 | TSK | UF3000 | Prober | 300mm | 01.04.2007 | 3 | as is where is | immediately |
| 97982 | TSK | UF300A | PROBER | 300 MM | 10 | inquire | ||
| 101688 | TSK | UF200 | Tri-temp Prober | 200 MM | 1 | inquire | ||
| 101689 | TSK | UF200S | Prober | 200 MM | 3 | inquire | ||
| 101690 | TSK | UF200SA | Tri-temp Prober | 200 MM | 4 | inquire | ||
| 101811 | TSK | UF200 | prober | 200 mm | 01.06.2000 | 1 | inquire | |
| 98370 | ULTRACISION | 880E | Manual Wafer Prober, for up to 200mm Wafers | 200 mm | 1 | inquire | ||
| 98371 | ULTRACISION | 880E | Manual Wafer Prober, for up to 200mm Wafers | 200 mm | 1 | inquire | ||
| 98372 | ULTRACISION | 880E | Manual Wafer Prober, for up to 200mm Wafers | 200 mm | 1 | inquire | ||
| 91881 | WENTWORTH LABS | MP-2300 | Analytical Wafer Prober, for up to 200mm Wafers | 1 | inquire | |||
| 99374 | Wentworth Labs | 0-023-0021 | 6" PROBE STATION/ WAFER PROBER MITUTOYO MICROSCOPE | 01.06.1995 | 1 | as is where is | ||
| 99375 | Wentworth Labs | MP900 | Die Probe Station | 01.06.1995 | 1 | as is where is |