Please find below a list of Used Probers for sale by fabsurplus.com .Click on any listed Prober to see further data.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 87173 | ACCRETECH | UF3000 | prober | 300 mm | 01.06.2004 | 1 | as is where is | |
| 87174 | ACCRETECH | UF3000 | prober | 300 mm | 01.06.2004 | 1 | as is where is | |
| 87175 | ACCRETECH | UF3000 | prober | 300 mm | 01.06.2004 | 1 | as is where is | |
| 86068 | Accretech / TSK | UF190A | Prober | 1 | inquire | immediately | ||
| 86462 | Accretech / TSK | UF3000EX | Prober -40 C to + 150 C | 200 mm / 300 mm | 01.01.2007 | 2 | as is where is | immediately |
| 86618 | Accretech / TSK | UF200S | Prober | 200 mm | 1 | inquire | immediately | |
| 88774 | ACCRETECH / TSK | UF3000EXE | Fully Automated Wafer Prober | 300 mm | 01.06.2017 | 1 | inquire | immediately |
| 88775 | ACCRETECH / TSK | UF3000EXE | Fully Automated Wafer Prober | 300 mm | 01.06.2017 | 1 | inquire | immediately |
| 88776 | ACCRETECH / TSK | UF3000EXE | Fully Automated Wafer Prober | 300 mm | 01.06.2017 | 1 | inquire | immediately |
| 88777 | ACCRETECH / TSK | UF3000EXE | Fully Automated Wafer Prober | 300 mm | 01.06.2017 | 1 | inquire | immediately |
| 88778 | ACCRETECH / TSK | UF3000EXE | Fully Automated Wafer Prober | 300 mm | 01.06.2017 | 1 | inquire | immediately |
| 88779 | ACCRETECH / TSK | UF3000EXE | Fully Automated Wafer Prober | 300 mm | 01.06.2017 | 1 | inquire | immediately |
| 88780 | ACCRETECH / TSK | UF3000EXE | Fully Automated Wafer Prober | 300 mm | 01.06.2017 | 1 | inquire | immediately |
| 88781 | ACCRETECH / TSK | UF3000EXE | Fully Automated Wafer Prober | 300 mm | 01.06.2017 | 1 | inquire | immediately |
| 88784 | ACCRETECH / TSK | UF3000 | Fully Automated Wafer Prober | 300 mm | 1 | inquire | immediately | |
| 88785 | ACCRETECH / TSK | UF3000 | Fully Automated Wafer Prober | 300 mm | 1 | inquire | immediately | |
| 88786 | ACCRETECH / TSK | UF300 | Fully Automated Wafer Prober | 01.06.2001 | 1 | inquire | ||
| 88787 | ACCRETECH / TSK | UF300 | Fully Automated Wafer Prober | 1 | inquire | |||
| 88788 | ACCRETECH / TSK | UF300A | Fully Automated Wafer Prober | 01.06.2003 | 1 | inquire | ||
| 88789 | ACCRETECH / TSK | UF300A | Fully Automated Wafer Prober | 01.06.2003 | 1 | inquire | ||
| 89027 | Accretech / TSK | UF200A | Automatic Prober | 200 mm | 1 | inquire | immediately | |
| 54226 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 01.06.1999 | 7 | as is where is | immediately |
| 90268 | Agilent / HP | 75000 Series | TESTER | 150 mm | 02.10.1995 | 1 | as is where is | |
| 9878 | ALESSI | REL 4500 | Manual Wafer Prober | 150 mm | 1 | inquire | immediately | |
| 87653 | Alessi | REL 5000 | Semi-Automatic Prober | Prober | 1 | as is where is | immediately | |
| 82217 | Amicra | AIS | Wafer Inker | Up to 5 inch | 01.06.2007 | 2 | as is where is | immediately |
| 84782 | APPLIED PRECISION ProbeWoRx | Probeworx 300 | Wafer Probe Card Test and Analysis System | 01.01.2008 | 1 | as is where is | immediately | |
| 90366 | ASM | AD9012A | Flipchip Bonder | 300mm | 10 | as is where is | ||
| 76782 | ASTRODESIGN | SE6101 | Manual prober | 200 mm | 01.06.2000 | 1 | as is where is | immediately |
| 61013 | AUTOMATIC | WAFER PROBER EQUIPMENT | 1 | as is where is | ||||
| 88928 | Cascade | Suss PA300 | Wafer Prober | 300mm | 1 | as is where is | ||
| 88929 | Cascade | PA300PS | Wafer Prober | 300mm | 1 | as is where is | ||
| 90059 | CASCADE | REL6100 | PROBE STATION | 300 mm | 01.06.2005 | 1 | as is where is | immediately |
| 71737 | Electroglas | 2080X | Prober | 1 | as is where is | immediately | ||
| 77057 | Electroglas | EG2001X | Prober | 1 | ||||
| 78132 | Electroglas | Horizon 4085X | Prober with an inker | 200 mm | 01.02.1998 | 1 | as is where is | immediately |
| 79071 | ELECTROGLAS | EG5/300E | Prober WITH A HINGE | 300 mm | 01.06.2003 | 1 | as is where is | immediately |
| 79446 | Electroglas | 2080X | Prober | 1 | as is where is | immediately | ||
| 79447 | Electroglas | 2080X | Prober | 1 | as is where is | immediately | ||
| 79448 | Electroglas | 2080X | Prober | 1 | as is where is | immediately | ||
| 79449 | Electroglas | 2080X | Prober | 1 | as is where is | immediately | ||
| 79470 | Electroglas | 2080X | Prober | 1 | as is where is | immediately | ||
| 79471 | Electroglas | 2080X | Prober | 1 | as is where is | immediately | ||
| 79472 | Electroglas | 2080X | Prober | 1 | as is where is | immediately | ||
| 85076 | Electroglas | 2001X | Prober | 200 mm | 1 | as is where is | ||
| 85082 | Electroglas | 2001X | Prober | 200 mm | 1 | as is where is | ||
| 85085 | Electroglas | 2001X | Prober | 200 mm | 1 | as is where is | ||
| 85088 | Electroglas | 2001X | Prober | 200 mm | 1 | as is where is | ||
| 85090 | Electroglas | 2001X | Prober | 200 mm | 1 | as is where is | ||
| 85091 | Electroglas | 2001X | Prober | 200 mm | 1 | as is where is | ||
| 85092 | Electroglas | 2001X | Prober | 200 mm | 1 | as is where is | ||
| 85096 | Electroglas | SVTR | Prober | 200 mm | 1 | as is where is | ||
| 86457 | Electroglas | EG2001 | prober | 150 mm | 1 | as is where is | immediately | |
| 86458 | Electroglas | EG2001 | prober | 150 mm | 1 | as is where is | immediately | |
| 86459 | Electroglas | EG2001 | prober | 150 mm | 1 | as is where is | immediately | |
| 88801 | ELECTROGLAS | 4090u | Wafer Prober | 1 | inquire | |||
| 88802 | ELECTROGLAS | 4090u | Wafer Prober | 1 | inquire | |||
| 88803 | ELECTROGLAS | 4090u | Wafer Prober | 1 | inquire | |||
| 88804 | ELECTROGLAS | 4090u | Wafer Prober | 1 | inquire | |||
| 88805 | ELECTROGLAS | 4090u | Wafer Prober | 1 | inquire | |||
| 88806 | ELECTROGLAS | 4090u | Wafer Prober | 1 | inquire | |||
| 88807 | ELECTROGLAS | 4090u | Wafer Prober | 1 | inquire | |||
| 88808 | ELECTROGLAS | 4090u | Wafer Prober | 1 | inquire | |||
| 88809 | ELECTROGLAS | 4090u | Wafer Prober | 1 | inquire | |||
| 88810 | ELECTROGLAS | 4090u | Wafer Prober | 1 | inquire | |||
| 88811 | ELECTROGLAS | 4090u | Wafer Prober | 1 | inquire | |||
| 88812 | ELECTROGLAS | 4085x | Wafer Prober | 1 | inquire | |||
| 88813 | ELECTROGLAS | 4085x | Wafer Prober | 1 | inquire | |||
| 88814 | ELECTROGLAS | 4085x | Wafer Prober | 1 | inquire | |||
| 88820 | Electroglas | 2001 | Automatic Prober | 150 mm | 2 | as is where is | immediately | |
| 88821 | Electroglas | 4090u | Automatic Prober | 200 mm | 3 | as is where is | immediately | |
| 88930 | Electroglas | 4090u | Automated Prober | 01.06.2000 | 1 | as is where is | ||
| 88931 | Electroglas | 4090u | Automated Prober | 01.06.2000 | 1 | as is where is | ||
| 88932 | Electroglas | 4090u | Automated Prober | 01.06.2000 | 1 | as is where is | ||
| 90269 | Electroglas | 2001CX | Wafer prober | 150 mm | 02.06.1995 | 1 | as is where is | |
| 90270 | Electroglas | 2001CX | Wafer prober | 150 mm | 02.09.1995 | 1 | as is where is | |
| 90271 | Electroglas | 2001CXE | Wafer prober | 150 mm | 02.08.1998 | 1 | as is where is | |
| 90272 | Electroglas | 2001CXE | Wafer prober | 150 mm | 02.08.1998 | 1 | as is where is | |
| 90273 | Electroglas | 2001CXE | Wafer prober | 150 mm | 02.08.1998 | 1 | as is where is | |
| 90274 | Electroglas | 2001CXE | Wafer prober | 150 mm | 02.11.1999 | 1 | as is where is | |
| 90275 | Electroglas | 2001CXE | Wafer prober | 150 mm | 02.06.1998 | 1 | as is where is | |
| 83524 | ERS | AC3 | 200 MM THERMAL CHUCK SYSTEM FOR A MANUAL PROBER | 200 MM | 1 | inquire | 3 months | |
| 87462 | KARL SUSS | PM-8 | Analytical Wafer Prober | 1 | as is where is | immediately | ||
| 88150 | Karl Suss | PM5 / 6 | Wafer Prober | up to 150 mm | 1 | inquire | immediately | |
| 86304 | KLA | 1007 | Chuck, prober, 6" gold chuck assembly | 200 mm | 1 | inquire | immediately | |
| 87086 | KLA | 655-6616141-00 | Wafer stage, kla 21xx | 200 mm | 1 | inquire | immediately | |
| 71902 | Microcontrol | MWE Plus | UV Wafer Eraser with cassette loading | 200 mm , 150 mm, 125 mm | 01.06.2000 | 1 | as is where is | immediately |
| 87465 | Micronics | MP-10 | Manual Probe Station with B&L StereoZoom 7 Microscope & 2ea Micropositioners | 1 | as is where is | immediately | ||
| 85105 | PREMTEK Internationa | 9920 | Semi-Automatic Prober | 300 MM | 1 | as is where is | ||
| 84169 | SEMICS | OPUS2 | Prober | 300 mm | 1 | as is where is | immediately | |
| 86465 | SEMICS | Opus 2 | Prober | 300 mm | 01.06.2007 | 1 | as is where is | immediately |
| 90336 | Signatone | S-580 | prober | 200mm | 1 | as is where is | immediately | |
| 90372 | Signatone | S-1160 | Probe Station | 1 | as is where is | |||
| 71904 | ST Automation | test head | test head for Eprom U 1835 | 1 | as is where is | |||
| 87604 | Suss | PA 300PS | Wafer Prober with chiller, temp -40C to 200C | Prober | 1 | as is where is | immediately | |
| 87605 | Suss | PA 300PS | Wafer Prober with chiller, temp -40C to 200C | Prober | 1 | as is where is | immediately | |
| 86328 | Tel | P8 | PROBER PARTS (SEE LIST) | 1 | as is where is | immediately | ||
| 34069 | TEL TOKYO ELECTRON | P8 | PROBER | 200 MM | 01.06.2002 | 1 | as is where is | immediately |
| 68895 | TEL TOKYO ELECTRON | P12XLn+ | PROBER, WITH COOL CHUCK | 300 mm | 01.11.2004 | 2 | as is where is | immediately |
| 74527 | TEL Tokyo Electron | P12XLn | Prober | 300 mm | 01.10.2004 | 2 | as is where is | immediately |
| 74530 | TEL Tokyo Electron | P8 | PROBER | 200 MM | 6 | as is where is | ||
| 78124 | TEL TOKYO ELECTRON | P8 | Wafer Prober | 200 MM | 01.09.1996 | 1 | as is where is | immediately |
| 78131 | TEL TOKYO ELECTRON | P8XL | Fully Automatic Wafer Prober (Gold Chuck) | 200 MM | 01.09.2000 | 1 | as is where is | immediately |
| 78323 | TEL Tokyo Electron | P12XL | PROBER | 1 | as is where is | |||
| 78821 | TEL Tokyo Electron | P12XLm | PROBER | 300 mm | 01.04.2009 | 1 | inquire | immediately |
| 83984 | TEL Tokyo Electron | P8 XL | Fully Automatic prober | 200 mm | 1 | as is where is | immediately | |
| 86067 | TEL Tokyo Electron | P8XL | Prober | 1 | inquire | immediately | ||
| 87176 | TEL Tokyo Electron | P-12XL | prober | 300 mm | 01.06.2002 | 1 | as is where is | |
| 87177 | TEL Tokyo Electron | P-12XL | prober | 300 mm | 01.06.2002 | 1 | as is where is | |
| 87178 | TEL Tokyo Electron | P-12XL | prober | 300 mm | 01.06.2002 | 1 | as is where is | |
| 87179 | TEL Tokyo Electron | P-12XL | prober | 300 mm | 01.06.2002 | 1 | as is where is | |
| 87180 | TEL Tokyo Electron | P-12XL | prober | 300 mm | 01.06.2003 | 1 | as is where is | |
| 87181 | TEL Tokyo Electron | P-12XL | prober | 300 mm | 01.06.2003 | 1 | as is where is | |
| 87182 | TEL Tokyo Electron | P-12XL | prober | 300 mm | 01.06.2003 | 1 | as is where is | |
| 87183 | TEL Tokyo Electron | P-12XL | prober | 300 mm | 01.06.2001 | 1 | as is where is | |
| 87184 | TEL Tokyo Electron | P-12XL | prober | 300 mm | 01.06.2001 | 1 | as is where is | |
| 87185 | TEL Tokyo Electron | P-12XL | prober | 300 mm | 01.06.2001 | 1 | as is where is | |
| 87186 | TEL Tokyo Electron | P-8XL | prober | 150 mm | 01.06.2002 | 1 | as is where is | |
| 87187 | TEL Tokyo Electron | P-8XL | prober | 200 mm | 01.06.2000 | 1 | as is where is | |
| 87188 | TEL Tokyo Electron | P-8XL | prober | 200 mm | 01.06.1999 | 1 | as is where is | |
| 87189 | TEL Tokyo Electron | P-8XL | prober | 200 mm | 01.06.2000 | 1 | as is where is | |
| 87190 | TEL Tokyo Electron | P-8XL | prober | 200 mm | 01.06.2000 | 1 | as is where is | |
| 87191 | TEL Tokyo Electron | P-8XL | prober | 200 mm | 01.06.1999 | 1 | as is where is | |
| 87848 | TEL TOKYO ELECTRON | P-12XLM | Prober | 300 mm | 01.06.2006 | 1 | as is where is | |
| 87849 | TEL TOKYO ELECTRON | P-12XLM | Prober | 300 mm | 01.06.2006 | 1 | as is where is | |
| 88399 | TEL Tokyo Electron | P12XLn cool chuck ( -30~150 degree ) | Prober | 300 mm | 1 | inquire | immediately | |
| 88790 | TEL TOKYO ELECTRON | P8XL | Fully Automated Wafer Prober | 01.06.2000 | 1 | inquire | ||
| 88791 | TEL TOKYO ELECTRON | P8XL | Fully Automated Wafer Prober | 01.06.1999 | 1 | inquire | ||
| 88792 | TEL TOKYO ELECTRON | P8XL | Fully Automated Wafer Prober | 01.06.2000 | 1 | inquire | ||
| 88793 | TEL TOKYO ELECTRON | P8XL | Fully Automated Wafer Prober | 01.06.2002 | 1 | inquire | ||
| 88794 | TEL TOKYO ELECTRON | P8XL | Fully Automated Wafer Prober | 01.06.2000 | 1 | inquire | ||
| 88795 | TEL TOKYO ELECTRON | P8XL | Fully Automated Wafer Prober | 01.06.1999 | 1 | inquire | ||
| 88796 | TEL TOKYO ELECTRON | P8XL | Fully Automated Wafer Prober | 01.06.1999 | 1 | inquire | ||
| 88797 | TEL TOKYO ELECTRON | P8XL | Fully Automated Wafer Prober | 01.06.1999 | 1 | inquire | ||
| 88798 | TEL TOKYO ELECTRON | P8XL | Fully Automated Wafer Prober | 01.06.1999 | 1 | inquire | ||
| 88799 | TEL TOKYO ELECTRON | P8XL | Fully Automated Wafer Prober | 01.06.1999 | 1 | inquire | ||
| 88800 | TEL TOKYO ELECTRON | P8XL | Fully Automated Wafer Prober | 01.06.2000 | 1 | inquire | ||
| 88933 | TEL Tokyo Electron | P-12XLn+ | Automated Prober | 300mm | 1 | as is where is | ||
| 88934 | TEL Tokyo Electron | P-12XLn+ | Automated Prober | 300mm | 1 | as is where is | ||
| 88935 | TEL Tokyo Electron | P-12XLn+ | Automated Prober | 300mm | 1 | as is where is | ||
| 79886 | Temptronic | TPO 3215A-2300-2 | TEMPERATURE FORCER | Facilities | 01.06.2002 | 1 | as is where is | immediately |
| 61012 | THERMA-WAVE | OP 2600B | OPTI-PROBE | 200mm | 01.01.1997 | 1 | as is where is | immediately |
| 87473 | ULTRACISION | 860 | Manual Wafer Prober, for up to 200mm Wafers | 200 mm | 1 | as is where is | immediately | |
| 90367 | Verigy | E9732-69501 | MCE 4M4S Card | 2 | as is where is | |||
| 90368 | Verigy | E8013-68511 | DPS32 card | 3 | as is where is | |||
| 90369 | Verigy | E9711-69502 | MSDPS card | 4 | as is where is | |||
| 90370 | Verigy | E9722-69501 | MCB8M card | 2 | as is where is | |||
| 90371 | Verigy | EN2491-69500 | Port Scale RF 24-port card | 2 | as is where is | |||
| 55913 | WENTWORTH LABS | MP-2000 | Analytical Wafer Prober, for up to 200mm Wafers | 1 | as is where is |