Please find below a list of Used Probers for sale by fabsurplus.com .Click on any listed Prober to see further data.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 86068 | Accretech / TSK | UF190A | Prober | 1 | inquire | immediately | ||
| 88780 | ACCRETECH / TSK | UF3000EXE | Fully Automated Wafer Prober | 300 mm | 01.06.2017 | 1 | inquire | immediately |
| 89027 | Accretech / TSK | UF200A | Automatic Prober | 200 mm | 1 | inquire | immediately | |
| 92435 | Accretech / TSK | EM-11A | Prober | 6 | inquire | |||
| 92436 | Accretech / TSK | UF190B | Prober | 3 | inquire | |||
| 92719 | Accretech / TSK | UF300A | Fully Automated Wafer Prober / Ambient / Hot | 200 mm or 300 mm | 01.06.2003 | 8 | inquire | immediately |
| 92724 | Accretech / TSK | UF190B | Fully Automated Wafer Prober / Ambient / Hot | 5, 6 AND 8 INCH | 1 | inquire | immediately | |
| 92725 | Accretech / TSK | UF200 | Fully Automated Wafer Prober / Ambient / Hot | 5, 6 AND 8 INCH | 1 | inquire | immediately | |
| 92726 | Accretech / TSK | UF200A / AL | Fully Automated Wafer Prober / Ambient / Hot | 5, 6 AND 8 INCH | 01.07.2004 | 1 | inquire | immediately |
| 92728 | Accretech / TSK | UF200H | Fully Automated Wafer Prober / Ambient / Hot / Cold | 5, 6 AND 8 INCH | 1 | inquire | immediately | |
| 92729 | Accretech / TSK | UF200SA | Fully Automated Wafer Prober / Ambient / Hot | 5, 6 AND 8 INCH | 1 | inquire | immediately | |
| 93855 | Accretech / TSK | UF200 SA | prober with cold option (-40C) | 200 mm | 01.02.2005 | 1 | as is where is | immediately |
| 54226 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 01.06.1999 | 7 | as is where is | immediately |
| 95246 | Accretech/TSK | UF3000 | Fully Automatic Prober | 300mm | 1 | as is where is | ||
| 95247 | Accretech/TSK | UF3000 | Fully Automatic Prober | 300mm | 1 | as is where is | ||
| 95248 | Accretech/TSK | UF3000 | Fully Automatic Prober | 300mm | 1 | as is where is | ||
| 95249 | Accretech/TSK | UF3000 | Fully Automatic Prober | 300mm | 1 | as is where is | ||
| 95250 | Accretech/TSK | UF3000 | Fully Automatic Prober | 300mm | 1 | as is where is | ||
| 95251 | Accretech/TSK | UF3000 | Fully Automatic Prober | 300mm | 1 | as is where is | ||
| 95252 | Accretech/TSK | UF3000 | Fully Automatic Prober | 300mm | 1 | as is where is | ||
| 95253 | Accretech/TSK | UF3000 | Fully Automatic Prober | 300mm | 1 | as is where is | ||
| 95254 | Accretech/TSK | UF3000 | Fully Automatic Prober | 300mm | 1 | as is where is | ||
| 95255 | Accretech/TSK | UF3000 | Fully Automatic Prober | 300mm | 1 | as is where is | ||
| 90268 | Agilent / HP | 75000 Series | TESTER | 150 mm | 02.10.1995 | 1 | as is where is | |
| 87653 | Alessi | REL 5000 | Semi-Automatic Prober | Prober | 1 | as is where is | immediately | |
| 91879 | ALESSI | REL-4500 | Analytical Wafer Prober with 6" (dia.) Gold Plated Chuck, ECC-1 Controller & B&L MicroZoom Optics | 1 | inquire | |||
| 92046 | Alessi | REL 6100 | Manual Prober (For spares use) | 1 | as is where is | immediately | ||
| 82217 | Amicra | AIS | Wafer Inker | Up to 5 inch | 01.06.2007 | 2 | as is where is | immediately |
| 92345 | Applied Precision | Probeworx 300 | Wafer Probe Card Test and Analysis System | 01.01.2008 | 1 | as is where is | immediately | |
| 90366 | ASM | AD9012A | Flipchip Bonder | 300mm | 10 | as is where is | ||
| 95279 | Cascade | Alessi REL-5500 | Prober | 200mm | 1 | as is where is | ||
| 92346 | Cascade Microtech | 11000 | Prober | 200 mm | 1 | inquire | immediately | |
| 92415 | Cascade Microtech | 11000 | Prober | 200 mm | 1 | inquire | immediately | |
| 92700 | CASCADE MICROTECH | REL6100 | PROBE STATION | 01.06.2005 | 1 | as is where is | immediately | |
| 93730 | Cascade Microtech | 12000 | Prober | 200 MM | 1 | as is where is | ||
| 93731 | Cascade Microtech | 12000 | Prober | 200 MM | 1 | as is where is | ||
| 93732 | Cascade Microtech | REL-4800 | Prober | 200 MM | 1 | as is where is | ||
| 93733 | Cascade Microtech | REL-4800 | Prober | 200 MM | 1 | as is where is | ||
| 93734 | Cascade Microtech | REL-6100 | Prober | 200 MM | 1 | as is where is | ||
| 93735 | Cascade Microtech | REL-6100 | Prober | 200 MM | 1 | as is where is | ||
| 93736 | Cascade Microtech | RF-1 | Prober | 200 MM | 1 | as is where is | ||
| 93737 | Cascade Microtech | RF-1 | Prober | 150 MM | 1 | as is where is | ||
| 93738 | Cascade Microtech | Summit 10600 | Prober | 200 MM | 1 | as is where is | ||
| 93739 | Cascade Microtech | Summit 12561B | Prober | 200 MM | 1 | as is where is | ||
| 93740 | Cascade Microtech | Summit 9000 | Prober | 200 MM | 1 | as is where is | ||
| 92026 | Electroglas | 4080X | Wafer Prober | 1 | as is where is | immediately | ||
| 77057 | Electroglas | EG2001X | Prober | 1 | ||||
| 78132 | Electroglas | Horizon 4085X | Prober with an inker | 200 mm | 01.02.1998 | 1 | as is where is | immediately |
| 79071 | ELECTROGLAS | EG5/300E | Prober WITH A HINGE | 300 mm | 01.06.2003 | 1 | as is where is | immediately |
| 86457 | Electroglas | EG2001 | prober | 150 mm | 1 | as is where is | immediately | |
| 86458 | Electroglas | EG2001 | prober | 150 mm | 1 | as is where is | immediately | |
| 86459 | Electroglas | EG2001 | prober | 150 mm | 1 | as is where is | immediately | |
| 88801 | ELECTROGLAS | 4090u | Wafer Prober | 1 | inquire | |||
| 88820 | Electroglas | 2001 | Automatic Prober | 150 mm | 2 | as is where is | immediately | |
| 88821 | Electroglas | 4090u | Automatic Prober | 200 mm | 3 | as is where is | immediately | |
| 90269 | Electroglas | 2001CX | Wafer prober | 150 mm | 02.06.1995 | 1 | as is where is | |
| 90270 | Electroglas | 2001CX | Wafer prober | 150 mm | 02.09.1995 | 1 | as is where is | |
| 90271 | Electroglas | 2001CXE | Wafer prober | 150 mm | 02.08.1998 | 1 | as is where is | |
| 90272 | Electroglas | 2001CXE | Wafer prober | 150 mm | 02.08.1998 | 1 | as is where is | |
| 90273 | Electroglas | 2001CXE | Wafer prober | 150 mm | 02.08.1998 | 1 | as is where is | |
| 90274 | Electroglas | 2001CXE | Wafer prober | 150 mm | 02.11.1999 | 1 | as is where is | |
| 90275 | Electroglas | 2001CXE | Wafer prober | 150 mm | 02.06.1998 | 1 | as is where is | |
| 91591 | ELECTROGLAS | EG5300 | Prober | 300 mm | 1 | as is where is | ||
| 91592 | ELECTROGLAS | EG5300 | Prober | 300 mm | 1 | as is where is | ||
| 91593 | ELECTROGLAS | EG5300 | Prober | 300 mm | 1 | as is where is | ||
| 93741 | Electroglas | Horizon 4085X | Prober | 200 MM | 1 | as is where is | ||
| 95024 | ELECTROGLAS | 4080X | Prober | PROBER | 3 | as is where is | ||
| 83524 | ERS | AC3 | 200 MM THERMAL CHUCK SYSTEM FOR A MANUAL PROBER | 200 MM | 1 | inquire | 3 months | |
| 87462 | KARL SUSS | PM-8 | Analytical Wafer Prober | 150 mm | 1 | as is where is | immediately | |
| 88150 | Karl Suss | PM5 / 6 | Wafer Prober | up to 150 mm | 1 | inquire | immediately | |
| 93742 | Karl Suss | PA200 | Prober | 200 MM | 1 | as is where is | immediately | |
| 93743 | Karl Suss | PM8 | Prober | 150 MM | 1 | as is where is | ||
| 93744 | Karl Suss | PM8 | Prober | 200 MM | 1 | as is where is | ||
| 93745 | Karl Suss | PSM6 | Prober | 150 MM | 1 | as is where is | ||
| 86304 | KLA | 1007 | Chuck, prober, 6" gold chuck assembly | 200 mm | 1 | inquire | immediately | |
| 87086 | KLA | 655-6616141-00 | Wafer stage, kla 21xx | 200 mm | 1 | inquire | immediately | |
| 71902 | Microcontrol | MWE Plus | UV Wafer Eraser with cassette loading | 200 mm , 150 mm, 125 mm | 01.06.2000 | 1 | as is where is | immediately |
| 91880 | MICRONICS JAPAN CO. | MP-10 | Manual Probe Station with B&L StereoZoom 7 Microscope & 2ea Micropositioners | 1 | inquire | |||
| 93754 | MPI | LEDA-8F 3G Plus-V 110 | Prober | 1 | as is where is | |||
| 92251 | MPI Corporation | LEDA P6801 | LED Die Prober | 200mm | 01.06.2010 | 1 | as is where is | |
| 94874 | Multiprobe | MP1 | Atomic Force Prober | 300 mm | 1 | as is where is | ||
| 94398 | NexGen Technologies | Nexgen Prober 2013 Model | semi-automatic prober | Min 75 mm Max 200 mm Set 200 mm | 01.06.2013 | 1 | as is where is | |
| 91040 | RUCKER & KOLLS | 683A | PROBER | 200 mm | 1 | as is where is | immediately | |
| 84169 | SEMICS | OPUS2 | Prober | 300 mm | 1 | as is where is | immediately | |
| 86465 | SEMICS | Opus 2 | Prober | 300 mm | 01.06.2007 | 1 | as is where is | immediately |
| 94920 | SemiProbe | PS4L FA-12 | Automatic Prober | 300 mm | 1 | as is where is | ||
| 94921 | SemiProbe | PS4L FA-12 | Automatic Prober | 300 mm | 1 | as is where is | ||
| 90336 | Signatone | S-580 | prober | 200mm | 1 | as is where is | immediately | |
| 90372 | Signatone | S-1160 | Probe Station | 1 | as is where is | |||
| 93746 | Signatone | S-250 | Prober | 125 MM | 1 | as is where is | ||
| 93747 | Signatone | S-250 - 6 inch | Prober | 1 | as is where is | |||
| 93748 | Signatone | S-250-6 | Prober | 150 MM | 1 | as is where is | ||
| 93749 | Signatone | S-460 | Prober | 150 MM | 1 | as is where is | ||
| 71904 | ST Automation | test head | test head for Eprom U 1835 | 1 | as is where is | |||
| 86328 | Tel | P8 | PROBER PARTS (SEE LIST) | 1 | as is where is | immediately | ||
| 34069 | TEL TOKYO ELECTRON | P8 | PROBER | 200 MM | 01.06.2002 | 1 | as is where is | immediately |
| 68895 | TEL TOKYO ELECTRON | P12XLn+ | PROBER, WITH COOL CHUCK | 300 mm | 01.11.2004 | 2 | as is where is | immediately |
| 74527 | TEL Tokyo Electron | P12XLn | Prober | 300 mm | 01.10.2004 | 2 | as is where is | immediately |
| 74530 | TEL Tokyo Electron | P8 | PROBER | 200 MM | 6 | as is where is | ||
| 78124 | TEL TOKYO ELECTRON | P8 | Wafer Prober | 200 MM | 01.09.1996 | 1 | as is where is | immediately |
| 78131 | TEL TOKYO ELECTRON | P8XL | Fully Automatic Wafer Prober (Gold Chuck) | 200 MM | 01.09.2000 | 1 | as is where is | immediately |
| 78323 | TEL Tokyo Electron | P12XL | PROBER | 1 | as is where is | |||
| 83984 | TEL Tokyo Electron | P8 XL | Fully Automatic prober | 200 mm | 1 | as is where is | immediately | |
| 86067 | TEL Tokyo Electron | P8XL | Prober | 1 | inquire | immediately | ||
| 87848 | TEL TOKYO ELECTRON | P12XLM | Prober | 300 mm | 01.06.2006 | 1 | inquire | immediately |
| 87849 | TEL TOKYO ELECTRON | P-12XLM | Prober | 300 mm | 01.06.2006 | 1 | inquire | immediately |
| 88399 | TEL Tokyo Electron | P12XLn cool chuck ( -30~150 degree ) | Prober | 300 mm | 1 | inquire | immediately | |
| 91594 | TEL TOKYO ELECTRON | P-8 | AUTOMATIC WAFER PROBER | 200 mm | 01.06.2002 | 1 | as is where is | |
| 92285 | TEL Tokyo Electron | P12XL | Automatic wafer prober (VIP 3A) | 300 mm | 1 | inquire | immediately | |
| 92348 | TEL Tokyo Electron | WDF DP | Prober | 200 mm | 01.12.2004 | 1 | inquire | immediately |
| 92360 | TEL TOKYO ELECTRON | P12XLn+ | PROBER, with Ambient and hot Nickel chuck | 300 mm | 01.11.2004 | 1 | as is where is | immediately |
| 92368 | TEL Tokyo Electron | P12XLn+ | Fully Automatic Prober | 300 mm | 01.08.2006 | 1 | inquire | 1 month |
| 92437 | TEL Tokyo Electron | 19S | Prober | 9 | inquire | |||
| 92438 | TEL Tokyo Electron | P8 ( VIP3 ) | Prober | 16 | inquire | |||
| 92439 | TEL Tokyo Electron | P8LC ( WAT / Low current chuck ) | Prober | 1 | inquire | |||
| 92440 | TEL Tokyo Electron | P8XL | Prober | 01.10.2002 | 1 | inquire | ||
| 92441 | TEL Tokyo Electron | P12XL ( WAT ) | Prober | 1 | inquire | |||
| 92442 | TEL Tokyo Electron | P12XLn cool chuck ( -25~150 degree ) | Prober | 1 | inquire | |||
| 92443 | TEL Tokyo Electron | P12XLn+ | Prober | 1 | inquire | |||
| 92711 | TEL Tokyo Electron | P12XLn+ cool chuck ( -25~150 degree ) | Prober with cool chuck D240 | 300 mm | 01.09.2005 | 1 | inquire | immediately |
| 92723 | TEL TOKYO ELECTRON | P8XL | Fully Automated Wafer Prober | 01.06.2000 | 22 | inquire | immediately | |
| 93837 | TEL Tokyo Electron | P12XL | Prober | 300 mm | 01.06.2004 | 1 | inquire | immediately |
| 94023 | TEL Tokyo Electron | P8XL | Fully Automatic Prober with Hot Chuck | 200 mm | 01.06.2001 | 1 | as is where is | immediately |
| 94345 | TEL Tokyo Electron | P12XL | Fully Automatic Wafer Prober | 300 mm | 01.06.2003 | 1 | as is where is | |
| 94346 | TEL Tokyo Electron | P12XL | Fully Automatic Wafer Prober | 300 mm | 01.06.2004 | 1 | as is where is | |
| 94347 | TEL Tokyo Electron | P12XL | Fully Automatic Wafer Prober | 300 mm | 01.06.2002 | 1 | as is where is | |
| 94348 | TEL Tokyo Electron | P12XL | Fully Automatic Wafer Prober | 300 mm | 01.06.2003 | 1 | as is where is | |
| 94349 | TEL Tokyo Electron | P12XL | Fully Automatic Wafer Prober | 300 mm | 01.06.2005 | 1 | as is where is | |
| 94350 | TEL Tokyo Electron | P12XL | Fully Automatic Wafer Prober | 300 mm | 01.06.2005 | 1 | as is where is | |
| 94351 | TEL Tokyo Electron | P12XL | Fully Automatic Wafer Prober | 300 mm | 01.06.2003 | 1 | as is where is | |
| 94352 | TEL Tokyo Electron | P12XL | Fully Automatic Wafer Prober | 300 mm | 01.06.2004 | 1 | as is where is | |
| 94353 | TEL Tokyo Electron | P12XL | Fully Automatic Wafer Prober | 300 mm | 1 | as is where is | ||
| 94354 | TEL Tokyo Electron | P12XL | Fully Automatic Wafer Prober | 300 mm | 01.06.2003 | 1 | as is where is | |
| 94355 | TEL Tokyo Electron | P12XLm | Fully Automatic Wafer Prober | 300 mm | 01.06.2006 | 1 | as is where is | |
| 94985 | TEL Tokyo Electron | P-12XL | Prober (For spares use) | 300 mm | 1 | as is where is | ||
| 94986 | TEL Tokyo Electron | Precio Uflex | Wafer Prober | 300 mm | 1 | as is where is | ||
| 95026 | TEL TOKYO ELECTRON | 19S | Prober | PROBER | 14 | as is where is | ||
| 95349 | TEL Tokyo Electron | P-12XLn | Fully Automatic Prober | 300mm | 01.09.2005 | 1 | as is where is | |
| 95350 | TEL Tokyo Electron | P-12XLn | Fully Automatic Prober | 300mm | 01.09.2005 | 1 | as is where is | |
| 87473 | ULTRACISION | 860 | Manual Wafer Prober, for up to 200mm Wafers | 200 mm | 1 | as is where is | immediately | |
| 90367 | Verigy | E9732-69501 | MCE 4M4S Card | 2 | as is where is | |||
| 90368 | Verigy | E8013-68511 | DPS32 card | spares | 3 | as is where is | immediately | |
| 90369 | Verigy | E9711-69502 | MSDPS card | 4 | as is where is | |||
| 90370 | Verigy | E9722-69501 | MCB8M card | 2 | as is where is | |||
| 90371 | Verigy | EN2491-69500 | Port Scale RF 24-port card | 2 | as is where is | |||
| 93750 | Wentworth | MP 0901 | Prober | 1 | as is where is | |||
| 93751 | Wentworth | MP 0901 | Prober | 100 MM | 1 | as is where is | ||
| 93752 | Wentworth | MP-2000 | Prober | 200 MM | 1 | as is where is | ||
| 91881 | WENTWORTH LABS | MP-2300 | Analytical Wafer Prober, for up to 200mm Wafers | 1 | inquire | |||
| 93753 | West Bond | 7372B | Prober | 1 | as is where is |