Please find below a list of Used Probers for sale by fabsurplus.com .Click on any listed Prober to see further data.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 86068 | Accretech / TSK | UF190A | Prober | 1 | inquire | immediately | ||
| 89027 | Accretech / TSK | UF200A | Automatic Prober | 200 mm | 1 | inquire | immediately | |
| 92435 | Accretech / TSK | EM-11A | Prober | 6 | inquire | |||
| 92436 | Accretech / TSK | UF190B | Prober | 3 | inquire | |||
| 93855 | Accretech / TSK | UF200 SA | prober with cold option (-40C) | 200 mm | 01.02.2005 | 1 | as is where is | immediately |
| 96179 | Accretech / TSK | UF200S | Prober, AMBIENT AND HOT | 200 mm | 3 | as is where is | immediately | |
| 96180 | Accretech / TSK | UF200 AL | Prober, AMBIENT AND HOT | 200 mm | 3 | as is where is | immediately | |
| 96780 | Accretech / TSK | UF200A/AL | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96781 | Accretech / TSK | UF200H Cold | Wafer PROBER | 200 mm | 01.06.2001 | 1 | inquire | |
| 96782 | Accretech / TSK | UF200S | Wafer PROBER | 200 mm | 01.06.2003 | 1 | inquire | |
| 96783 | Accretech / TSK | UF3000EXE | Wafer PROBER | 200 mm | 01.06.2017 | 1 | inquire | |
| 96797 | Accretech / TSK | UF3000 | Production Wafer Prober | 300 mm | 01.11.2005 | 1 | as is where is | immediately |
| 54226 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 01.06.1999 | 1 | as is where is | immediately |
| 95398 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 01.06.1999 | 1 | as is where is | immediately |
| 95399 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 01.06.1999 | 1 | as is where is | immediately |
| 95400 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 01.06.1999 | 1 | as is where is | immediately |
| 95401 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 01.06.1999 | 1 | as is where is | immediately |
| 95402 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 01.06.1999 | 1 | as is where is | immediately |
| 95403 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 01.06.1999 | 1 | as is where is | immediately |
| 90268 | Agilent / HP | 75000 Series | TESTER | 150 mm | 02.10.1995 | 1 | as is where is | |
| 87653 | Alessi | REL 5000 | Semi-Automatic Prober | Prober | 1 | as is where is | immediately | |
| 91879 | ALESSI | REL-4500 | Analytical Wafer Prober with 6" (dia.) Gold Plated Chuck, ECC-1 Controller & B&L MicroZoom Optics | 1 | inquire | |||
| 92046 | Alessi | REL 6100 | Manual Prober (For spares use) | 1 | as is where is | immediately | ||
| 82217 | Amicra | AIS | Wafer Inker | Up to 5 inch | 01.06.2007 | 2 | as is where is | immediately |
| 92345 | Applied Precision | Probeworx 300 | Wafer Probe Card Test and Analysis System | 01.01.2008 | 1 | as is where is | immediately | |
| 90366 | ASM | AD9012A | Flipchip Bonder | 300mm | 10 | as is where is | ||
| 95279 | Cascade | Alessi REL-5500 | Prober | 200mm | 1 | as is where is | ||
| 92346 | Cascade Microtech | 11000 | Prober | 200 mm | 1 | inquire | immediately | |
| 92415 | Cascade Microtech | 11000 | Prober | 200 mm | 1 | inquire | immediately | |
| 93734 | Cascade Microtech | REL-6100 | Prober | 200 MM | 1 | as is where is | immediately | |
| 93736 | Cascade Microtech | RF-1 | Prober | 200 MM | 1 | as is where is | ||
| 93737 | Cascade Microtech | RF-1 | Prober | 150 MM | 1 | as is where is | ||
| 96667 | Cascade Microtech | REL-6100 | Submicron Analytical Wafer Prober | 200 mm | 1 | as is where is | immediately | |
| 92026 | Electroglas | 4080X | Wafer Prober | 1 | as is where is | immediately | ||
| 77057 | Electroglas | EG2001X | Prober | 1 | ||||
| 78132 | Electroglas | Horizon 4085X | Fully Automatic Prober with an inker | 200 mm | 01.02.1998 | 1 | as is where is | immediately |
| 86457 | Electroglas | EG2001 | prober | 150 mm | 1 | as is where is | immediately | |
| 86458 | Electroglas | EG2001 | prober | 150 mm | 1 | as is where is | immediately | |
| 86459 | Electroglas | EG2001 | prober | 150 mm | 1 | as is where is | immediately | |
| 88820 | Electroglas | 2001 | Automatic Prober | 150 mm | 2 | as is where is | immediately | |
| 90269 | Electroglas | 2001CX | Wafer prober | 150 mm | 02.06.1995 | 1 | as is where is | |
| 90270 | Electroglas | 2001CX | Wafer prober | 150 mm | 02.09.1995 | 1 | as is where is | |
| 90271 | Electroglas | 2001CXE | Wafer prober | 150 mm | 02.08.1998 | 1 | as is where is | |
| 90272 | Electroglas | 2001CXE | Wafer prober | 150 mm | 02.08.1998 | 1 | as is where is | |
| 90273 | Electroglas | 2001CXE | Wafer prober | 150 mm | 02.08.1998 | 1 | as is where is | |
| 90274 | Electroglas | 2001CXE | Wafer prober | 150 mm | 02.11.1999 | 1 | as is where is | |
| 90275 | Electroglas | 2001CXE | Wafer prober | 150 mm | 02.06.1998 | 1 | as is where is | |
| 91591 | ELECTROGLAS | EG5300 | Prober | 300 mm | 1 | as is where is | ||
| 91592 | ELECTROGLAS | EG5300 | Prober | 300 mm | 1 | as is where is | ||
| 91593 | ELECTROGLAS | EG5300 | Prober | 300 mm | 1 | as is where is | ||
| 93741 | Electroglas | Horizon 4085X | Prober | 200 MM | 1 | as is where is | ||
| 96707 | Electroglas | EG4080X | Wafer PROBER | 200 MM | 1 | inquire | ||
| 96708 | Electroglas | EG4080X | Wafer PROBER | 200 MM | 1 | inquire | ||
| 96709 | Electroglas | EG4080X | Wafer PROBER | 200 MM | 1 | inquire | ||
| 96710 | Electroglas | EG4090U | Wafer PROBER | 200 MM | 1 | inquire | ||
| 96711 | Electroglas | EG4090U | Wafer PROBER | 200 MM | 1 | inquire | ||
| 96712 | Electroglas | EG4090U | Wafer PROBER | 200 MM | 1 | inquire | ||
| 96713 | Electroglas | EG4090U | Wafer PROBER | 200 MM | 1 | inquire | ||
| 96714 | Electroglas | EG4090U | Wafer PROBER | 200 MM | 1 | inquire | ||
| 96715 | Electroglas | EG4090U | Wafer PROBER | 200 MM | 1 | inquire | ||
| 83524 | ERS | AC3 | 200 MM THERMAL CHUCK SYSTEM FOR A MANUAL PROBER | 200 MM | 1 | inquire | 3 months | |
| 96572 | ETAMAX | Quick Check | LED Prober in Dark Box | Up to 6 inch | 01.05.2011 | 1 | as is where is | immediately |
| 87462 | KARL SUSS | PM-8 | Analytical Wafer Prober | 150 mm | 1 | as is where is | immediately | |
| 88150 | Karl Suss | PM5 / 6 | Wafer Prober | up to 150 mm | 1 | inquire | immediately | |
| 93745 | Karl Suss | PSM6 | Prober | 150 MM | 1 | as is where is | ||
| 97105 | Karl Suss | PSM6 | Wafer Prober | 150 mm | 1 | as is where is | ||
| 86304 | KLA | 1007 | Chuck, prober, 6" gold chuck assembly | 200 mm | 1 | inquire | immediately | |
| 87086 | KLA | 655-6616141-00 | Wafer stage, kla 21xx | 200 mm | 1 | inquire | immediately | |
| 96664 | MarTek/Electroglas | EG 4090U | Prober | 1 | as is where is | immediately | ||
| 71902 | Microcontrol | MWE Plus | UV Wafer Eraser with cassette loading | 200 mm , 150 mm, 125 mm | 01.06.2000 | 1 | as is where is | immediately |
| 91880 | MICRONICS JAPAN CO. | MP-10 | Manual Probe Station with B&L StereoZoom 7 Microscope & 2ea Micropositioners | 1 | inquire | |||
| 93754 | MPI | LEDA-8F 3G Plus-V 110 | Prober | 1 | as is where is | |||
| 92251 | MPI Corporation | LEDA P6801 | LED Die Prober | 200mm | 01.06.2010 | 1 | as is where is | |
| 94398 | NexGen Technologies | Nexgen Prober 2013 Model | semi-automatic prober | Min 75 mm Max 200 mm Set 200 mm | 01.06.2013 | 1 | as is where is | |
| 96611 | QMC | DPS-600 | LED Die Probing System | Up to 6 inch | 01.12.2011 | 1 | as is where is | immediately |
| 96635 | QMC | DPS-600 | LED Die Probing System | Up to 6 inch | 01.12.2011 | 1 | as is where is | immediately |
| 96636 | QMC | DPS-600 | LED Die Probing System | Up to 6 inch | 01.12.2011 | 1 | as is where is | immediately |
| 96637 | QMC | DPS-600 | LED Die Probing System | Up to 6 inch | 01.12.2011 | 1 | as is where is | immediately |
| 96638 | QMC | DPS-600 | LED Die Probing System | Up to 6 inch | 01.12.2011 | 1 | as is where is | immediately |
| 91040 | RUCKER & KOLLS | 683A | PROBER | 200 mm | 1 | as is where is | immediately | |
| 96901 | Samsung | FSL-IW3MA2 | Ink Marking | 300 mm | 01.06.2012 | 1 | as is where is | |
| 84169 | SEMICS | OPUS2 | Prober | 300 mm | 1 | as is where is | immediately | |
| 86465 | SEMICS | Opus 2 | Prober | 300 mm | 01.06.2007 | 1 | as is where is | immediately |
| 90336 | Signatone | S-580 | prober | 200mm | 1 | as is where is | immediately | |
| 90372 | Signatone | S-1160 | Probe Station | 1 | as is where is | |||
| 93746 | Signatone | S-250 | Prober | 125 MM | 1 | as is where is | ||
| 93747 | Signatone | S-250 - 6 inch | Prober | 1 | as is where is | |||
| 93748 | Signatone | S-250-6 | Prober | 150 MM | 1 | as is where is | ||
| 93749 | Signatone | S-460 | Prober | 150 MM | 1 | as is where is | ||
| 96617 | Soritech | TNP | Prober station | 4 inch to 8 inch | 01.06.2011 | 1 | as is where is | |
| 71904 | ST Automation | test head | test head for Eprom U 1835 | 1 | as is where is | |||
| 86328 | Tel | P8 | PROBER PARTS (SEE LIST) | 1 | as is where is | immediately | ||
| 96554 | TEL | P12 XL | Prober | 01.01.2003 | 1 | as is where is | immediately | |
| 34069 | TEL TOKYO ELECTRON | P8 | PROBER | 200 MM | 01.06.2002 | 1 | as is where is | immediately |
| 68895 | TEL TOKYO ELECTRON | P12XLn+ | PROBER, WITH COOL CHUCK | 300 mm | 01.11.2004 | 2 | as is where is | immediately |
| 74527 | TEL Tokyo Electron | P12XLn | Prober | 300 mm | 01.10.2004 | 2 | as is where is | immediately |
| 74530 | TEL Tokyo Electron | P8 | PROBER | 200 MM | 6 | as is where is | ||
| 78124 | TEL TOKYO ELECTRON | P8 | Wafer Prober | 200 MM | 01.09.1996 | 1 | as is where is | immediately |
| 78131 | TEL TOKYO ELECTRON | P8XL | Fully Automatic Wafer Prober (Gold Chuck) | 200 MM | 01.09.2000 | 1 | as is where is | immediately |
| 78323 | TEL Tokyo Electron | P12XL | PROBER | 1 | as is where is | |||
| 83984 | TEL Tokyo Electron | P8 XL | Fully Automatic prober | 200 mm | 1 | as is where is | immediately | |
| 86067 | TEL Tokyo Electron | P8XL | Prober | 1 | inquire | immediately | ||
| 87848 | TEL TOKYO ELECTRON | P12XLM | Prober | 300 mm | 01.06.2006 | 1 | inquire | immediately |
| 87849 | TEL TOKYO ELECTRON | P-12XLM | Prober | 300 mm | 01.06.2006 | 1 | inquire | immediately |
| 88399 | TEL Tokyo Electron | P12XLn cool chuck ( -30~150 degree ) | Prober | 300 mm | 1 | inquire | immediately | |
| 91594 | TEL TOKYO ELECTRON | P-8 | AUTOMATIC WAFER PROBER | 200 mm | 01.06.2002 | 1 | as is where is | |
| 92348 | TEL Tokyo Electron | WDF DP | Prober | 200 mm | 01.12.2004 | 1 | inquire | immediately |
| 92360 | TEL TOKYO ELECTRON | P12XLn+ | PROBER, with Ambient and hot Nickel chuck | 300 mm | 01.11.2004 | 1 | as is where is | immediately |
| 92368 | TEL Tokyo Electron | P12XLn+ | Fully Automatic Prober | 300 mm | 01.08.2006 | 1 | inquire | 1 month |
| 92437 | TEL Tokyo Electron | 19S | Prober | 9 | inquire | |||
| 92438 | TEL Tokyo Electron | P8 ( VIP4 ) | Prober | 16 | inquire | |||
| 92439 | TEL Tokyo Electron | P8LC ( WAT / Low current chuck ) | Prober | 1 | inquire | |||
| 92440 | TEL Tokyo Electron | P8XL | Prober | 01.10.2002 | 1 | inquire | ||
| 92441 | TEL Tokyo Electron | P12XL ( WAT ) | Fully Automatic Prober with Gold Hot Chuck and WAT | 300 MM | 01.06.2009 | 1 | inquire | immediately |
| 92442 | TEL Tokyo Electron | P12XLn cool chuck ( -25~150 degree ) | Prober | 1 | inquire | |||
| 92443 | TEL Tokyo Electron | P12XLn+ | Prober | 1 | inquire | |||
| 92711 | TEL Tokyo Electron | P12XLn+ cool chuck ( -25~150 degree ) | Prober with cool chuck D240 | 300 mm | 01.09.2005 | 1 | inquire | immediately |
| 93837 | TEL Tokyo Electron | P12XL | Prober | 300 mm | 01.06.2004 | 1 | inquire | immediately |
| 94023 | TEL Tokyo Electron | P8XL | Fully Automatic Prober with Hot Chuck | 200 mm | 01.06.2001 | 1 | as is where is | immediately |
| 95987 | TEL Tokyo Electron | P12XL ( WAT ) | Fully Automatic Prober with Gold Hot Chuck and WAT | 300 MM | 01.10.2008 | 1 | inquire | immediately |
| 96381 | TEL Tokyo Electron | P-12XL | Prober | 300 mm | 01.02.2006 | 1 | as is where is | immediately |
| 96724 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96725 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96726 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96727 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96728 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96729 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96730 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96731 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96732 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96733 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96734 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96735 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96736 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96737 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96738 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96739 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96740 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96741 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96742 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96743 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96744 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2003 | 1 | inquire | |
| 96745 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96746 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96747 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96748 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96749 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96750 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96751 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96752 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2003 | 1 | inquire | |
| 96753 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 01.06.2004 | 1 | inquire | |
| 96754 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96755 | TEL Tokyo Electron | P8XL | Wafer PROBER | 200 mm | 1 | inquire | ||
| 96665 | Tokyo Seimitsu | A-PM-90A | Prober | 01.09.1997 | 1 | as is where is | immediately | |
| 96553 | TSK | UF3000 | Prober | 300mm | 01.04.2007 | 3 | inquire | immediately |
| 87473 | ULTRACISION | 860 | Manual Wafer Prober, for up to 200mm Wafers | 200 mm | 1 | as is where is | immediately | |
| 90367 | Verigy | E9732-69501 | MCE 4M4S Card | 2 | as is where is | |||
| 90368 | Verigy | E8013-68511 | DPS32 card | spares | 3 | as is where is | immediately | |
| 90369 | Verigy | E9711-69502 | MSDPS card | 4 | as is where is | |||
| 90370 | Verigy | E9722-69501 | MCB8M card | 2 | as is where is | |||
| 90371 | Verigy | EN2491-69500 | Port Scale RF 24-port card | 2 | as is where is | |||
| 93750 | Wentworth | MP 0901 | Prober | 1 | as is where is | |||
| 93751 | Wentworth | MP 0901 | Prober | 100 MM | 1 | as is where is | ||
| 93752 | Wentworth | MP-2000 | Prober | 200 MM | 1 | as is where is | ||
| 91881 | WENTWORTH LABS | MP-2300 | Analytical Wafer Prober, for up to 200mm Wafers | 1 | inquire | |||
| 93753 | West Bond | 7372B | Prober | 1 | as is where is |