Please find below a list of Used Probers for sale by fabsurplus.com .Click on any listed Prober to see further data.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 109540 | Accretech | UF3000 | Prober | 300 mm | 01.05.2005 | 9 | as is where is | immediately |
| 110709 | Accretech | UF200A | Prober | 200 MM | 01.06.2001 | 1 | as is where is | immediately |
| 110710 | Accretech | UF200A | Prober | 200 MM | 01.12.2000 | 1 | as is where is | immediately |
| 109571 | Accretech / TSK | UF3000 | Fully Automated Prober | 300 mm | 01.05.2009 | 9 | as is where is | immediately |
| 54226 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 7 | as is where is | immediately |
| 95398 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 95399 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 95400 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 95401 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 95402 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 95403 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 108333 | Accretech/TSK | UF3000 | Production Wafer Prober | 300 mm | 7 | as is where is | ||
| 108726 | ALESSI | REL-4500 | Analytical Wafer Prober with 6" (dia.) Gold Plated Chuck | 150 mm | 1 | inquire | immediately | |
| 108798 | ALESSI | REL- Series 5000 | Analytical Prober with Mitutoyo FS-70 Zoom Microscope with LWD Objective Lenses, New Wave QuikLaze 532/355 Laser with 50X Lens, Missing Computer | 1 | inquire | |||
| 108799 | ALESSI | REL-4100A | Analytical Prober | 1 | inquire | |||
| 108976 | Cascade | Summit 12000 | Semi-automatic probe station with Shield Box, Temptronic thermal chuck -65C to 200 C | 200 mm | 01.06.2005 | 1 | as is where is | immediately |
| 109579 | Cascade Microtech | Summit 11000M | Prober | 200 mm | 1 | as is where is | immediately | |
| 110700 | Cascade Microtech | 12000B-HS | Prober | 150 mm | 1 | as is where is | immediately | |
| 78132 | Electroglas | Horizon 4085X | Fully Automatic Prober with Optem microscope and an inker | 125 mm, 150 mm and 200 mm | 01.01.1998 | 1 | as is where is | immediately |
| 91591 | ELECTROGLAS | EG5300 | Prober | 300 mm | 1 | as is where is | ||
| 91592 | ELECTROGLAS | EG5/300 A | Prober | 300 mm | 31.12.2004 | 1 | as is where is | immediately |
| 91593 | ELECTROGLAS | EG5300 | Prober | 300 mm | 1 | as is where is | ||
| 99397 | KARL SUSS | PM 8 | Manual Prober | 1 | as is where is | immediately | ||
| 108835 | KARL SUSS | PM-8 | Analytical Wafer Prober | 1 | inquire | |||
| 110619 | KARL SUSS | PA200HS | Prober | 200 mm | 1 | as is where is | ||
| 106915 | Karl Suss Micro Tec | PA-200 | Wafer Prober Station | 01.06.2001 | 1 | as is where is | immediately | |
| 86304 | KLA | 1007 | Chuck, prober, 6" gold chuck assembly | 200 mm | 1 | inquire | immediately | |
| 71902 | Microcontrol | MWE Plus | UV Wafer Eraser with cassette loading | 200 mm , 150 mm, 125 mm | 01.05.2000 | 1 | as is where is | immediately |
| 108580 | Micromanipulator | Probe Station 1 | Manual Prober with hot and cold chuck | 200 mm | 1 | as is where is | immediately | |
| 108847 | MICRONICS JAPAN CO. | MP-10 | Manual Probe Station with B&L StereoZoom 7 Microscope & 2ea Micropositioners | 1 | inquire | |||
| 106740 | SECRON | IP 300 | Prober | 300 mm | 1 | as is where is | ||
| 108588 | SEMICS | OPUS2 | FULLY AUTOMATED PROBER | 300mm | 01.06.2007 | 1 | as is where is | immediately |
| 108589 | SEMICS | OPUS2 | FULLY AUTOMATED PROBER | 300mm | 01.06.2007 | 1 | as is where is | immediately |
| 108590 | SEMICS | OPUS2 | FULLY AUTOMATED PROBER | 300mm | 01.06.2007 | 1 | as is where is | immediately |
| 108591 | SEMICS | OPUS2 | FULLY AUTOMATED PROBER | 300mm | 01.06.2007 | 1 | as is where is | immediately |
| 108592 | SEMICS | OPUS3 | FULLY AUTOMATED PROBER | 300mm | 01.06.2011 | 1 | as is where is | immediately |
| 108593 | SEMICS | OPUS3 | FULLY AUTOMATED PROBER | 300mm | 01.06.2011 | 1 | as is where is | immediately |
| 71904 | ST Automation | test head | test head for Eprom U 1835 | 1 | as is where is | |||
| 106669 | SUSS MICROTECH | PM8 | Prober | 200 mm | 01.06.1996 | 1 | as is where is | |
| 108599 | TEL TOKYO ELECTRON | P12XLM | Prober | 300 mm | 01.05.2006 | 1 | inquire | immediately |
| 108603 | TEL Tokyo Electron | P12XLM | Prober | 300 mm | 01.05.2006 | 1 | as is where is | immediately |
| 108604 | TEL TOKYO ELECTRON | Precio Nano | FULLY AUTOMATED PROBER | 300 mm | 01.06.2012 | 1 | as is where is | immediately |
| 108614 | TEL Tokyo Electron | P8XL | Fully Automated Prober | 200 mm | 01.06.2001 | 1 | as is where is | immediately |
| 109548 | TEL Tokyo Electron | P12XL | Automatic Prober | 300 mm | 01.06.2005 | 63 | as is where is | immediately |
| 110639 | TEL Tokyo Electron | P-12XL | Prober | 300 mm | 1 | as is where is | ||
| 110640 | TEL Tokyo Electron | P-12XL | prober | 300 mm | 1 | as is where is | ||
| 108890 | ULTRACISION | 860 | Manual Wafer Prober, for up to 200mm Wafers | 200 MM | 1 | inquire |