Please find below a list of Used Probers for sale by fabsurplus.com .Click on any listed Prober to see further data.
SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
---|---|---|---|---|---|---|---|---|
102984 | Accretech | UF3000 | Fully Automated Prober | 300 mm | 01.05.2009 | 11 | as is where is | immediately |
102985 | Accretech | UF3000 | Prober | 300 mm | 31.05.2005 | 1 | as is where is | |
106064 | ACCRETECH | UF 3000 | Fully automatic wafer prober | 300 mm | 01.06.2007 | 2 | as is where is | immediately |
89027 | Accretech / TSK | UF200A | Automatic Prober | 200 mm | 1 | inquire | immediately | |
92435 | Accretech / TSK | EM-11A | Prober | 6 | inquire | |||
92436 | Accretech / TSK | UF190B | Prober | 3 | inquire | |||
96180 | Accretech / TSK | UF200 AL | Prober, AMBIENT AND HOT | 200 mm | 3 | as is where is | immediately | |
98228 | Accretech / TSK | MHF6000 | Manipulator | 1 | inquire | |||
98229 | Accretech / TSK | MHF300L | Manipulator | 11 | inquire | immediately | ||
98230 | Accretech / TSK | MHF 400 | 4000 Series Manipulator | 9 | inquire | immediately | ||
98246 | Accretech / TSK | UF200A | Prober | 200 mm | 1 | inquire | immediately | |
98247 | Accretech / TSK | UF200SA | Prober | 200 mm | 1 | inquire | immediately | |
102624 | Accretech / TSK | UF 200A | 200 mm | 5 | inquire | immediately | ||
103379 | Accretech / TSK | UF3000 | Auto Probing Machine FOUP Type | 300 mm | 2 | as is where is | immediately | |
103453 | Accretech / TSK | UF200SA | Automatic Wafer Prober | 200 mm | 1 | inquire | immediately | |
103679 | Accretech / TSK | UF200A | Prober | 150-200 mm | 31.05.2004 | 1 | as is where is | |
103680 | Accretech / TSK | UF200A | Prober | 150-200 mm | 31.05.2006 | 1 | as is where is | |
54226 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 7 | as is where is | immediately |
95398 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
95399 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
95400 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
95401 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
95402 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
95403 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
102843 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | immediately | |
102844 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | ||
102845 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | ||
102846 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | ||
102847 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | ||
102848 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | ||
102849 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | ||
102850 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | ||
102851 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | ||
102852 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | ||
102853 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | ||
102854 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | ||
103380 | Accretech TSK | UF3000 EX | Auto Probing Machine FOUP Type | 300 mm | 3 | as is where is | immediately | |
100058 | Accretech/TSK | UF3000 | Prober | 300 mm | 1 | as is where is | immediately | |
100059 | Accretech/TSK | UF3000 | Prober | 300mm | 1 | as is where is | ||
100060 | Accretech/TSK | UF3000 | Prober | 300mm | 1 | as is where is | ||
101379 | Accretech/TSK | UF3000 | Wafer Prober | 300mm | 31.10.2006 | 1 | as is where is | |
101380 | Accretech/TSK | UF3000 | Wafer Prober | 300mm | 31.10.2013 | 1 | as is where is | |
101381 | Accretech/TSK | UF3000 | Wafer Prober | 300mm | 31.05.2004 | 1 | as is where is | |
102656 | Accretech/TSK | UF3000 | Production Wafer Prober | 300 mm | 1 | as is where is | ||
91879 | ALESSI | REL-4500 | Analytical Wafer Prober with 6" (dia.) Gold Plated Chuck | 150 mm | 1 | inquire | immediately | |
92046 | Alessi | REL 6100 | Manual Prober (For spares use) | 1 | as is where is | immediately | ||
103636 | Alessi | REL-4500 | Prober & Hypervision Visionary 2 Microscope | 1 | as is where is | |||
92345 | Applied Precision | Probeworx 300 | Wafer Probe Card Test and Analysis System | 31.12.2007 | 1 | as is where is | immediately | |
95279 | Cascade | Alessi REL-5500 | Prober | 200mm | 1 | as is where is | ||
98231 | Cascade | REL-4800 | Prober | 200 mm | 1 | inquire | immediately | |
98232 | Cascade | REL-5500 | Prober | 200 mm | 1 | inquire | immediately | |
103025 | Cascade Microtech | Summit 9000 | Analytical Probe Station | 1 | as is where is | |||
103643 | Cascade Microtech | PS300 | Parametric Automatic Wafer Prober | 300 mm | 1 | as is where is | ||
101678 | CSE | X-300 | Semi-Auto Prober | 300 mm | 1 | inquire | ||
92026 | Electroglas | 4080X | Wafer Prober | 1 | as is where is | immediately | ||
77057 | Electroglas | EG2001X | Prober | 1 | ||||
78132 | Electroglas | Horizon 4085X | Fully Automatic Prober with an inker | 200 mm | 01.01.1998 | 1 | as is where is | immediately |
86457 | Electroglas | EG2001 | prober | 150 mm | 1 | as is where is | immediately | |
86458 | Electroglas | EG2001 | prober | 150 mm | 1 | as is where is | immediately | |
86459 | Electroglas | EG2001 | prober | 150 mm | 1 | as is where is | immediately | |
88820 | Electroglas | 2001 | Automatic Prober | 150 mm | 2 | as is where is | immediately | |
91591 | ELECTROGLAS | EG5300 | Prober | 300 mm | 1 | as is where is | ||
91592 | ELECTROGLAS | EG5/300 A | Prober | 300 mm | 31.12.2004 | 1 | as is where is | immediately |
91593 | ELECTROGLAS | EG5300 | Prober | 300 mm | 1 | as is where is | ||
98235 | Electroglas | 2001X | Prober | 200 mm | 15 | inquire | immediately | |
98237 | Electroglas | 3001X | Prober | 200 mm | 1 | inquire | immediately | |
98238 | Electroglas | 4060 | Prober | 200 mm | 3 | inquire | immediately | |
98239 | Electroglas | 4080 | Prober | 200 mm | 20 | inquire | immediately | |
98240 | Electroglas | 4085 | Prober | 200 mm | 5 | inquire | immediately | |
98241 | Electroglas | 4090u | Prober | 200 mm | 15 | inquire | immediately | |
98242 | Electroglas | 4090u | Prober | 200 mm | 1 | inquire | immediately | |
98244 | Electroglas | 4090u+ | Prober | 200 mm | 2 | inquire | immediately | |
99851 | Electroglas | 2010CX | Prober | 150 mm | 3 | inquire | ||
101337 | Electroglas | EG 2001 | Wafer Prober | 150mm | 1 | as is where is | ||
101679 | Electroglas | 1034 | Prober | 2 | inquire | |||
101680 | Electroglas | 4090u | Tri-temp Prober | 200 MM | 1 | inquire | ||
102195 | Electroglas | EG2001 | Wafer Prober | 200 mm | 1 | as is where is | ||
102196 | Electroglas | EG2001CX | Wafer Prober | 200 mm | 1 | as is where is | ||
102197 | Electroglas | EG2001X | Wafer Prober | 200 mm | 1 | as is where is | ||
102198 | Electroglas | EG2001X | Wafer Prober | 200 mm | 1 | as is where is | ||
102199 | Electroglas | EG2001X | Wafer Prober | 200 mm | 1 | as is where is | ||
102200 | Electroglas | EG2001X | Wafer Prober | 200 mm | 1 | as is where is | ||
102201 | Electroglas | EG2001X | Wafer Prober | 200 mm | 1 | as is where is | ||
103646 | Electroglas | 2001X | Wafer Prober | 200 mm | 1 | as is where is | ||
83524 | ERS | AC3 | 200 MM THERMAL CHUCK SYSTEM FOR A MANUAL PROBER | 200 MM | 1 | inquire | 3 months | |
99397 | KARL SUSS | PM 8 | Manual Prober | 1 | as is where is | immediately | ||
99838 | Karl Suss | AP6 | Manual prober with shield box and 6 probes | 1 | as is where is | immediately | ||
99839 | Karl Suss | PSM4 | Manual prober with 8 probes | 1 | as is where is | immediately | ||
86304 | KLA | 1007 | Chuck, prober, 6" gold chuck assembly | 200 mm | 1 | inquire | immediately | |
96664 | MarTek/Electroglas | EG 4090U | Prober | 1 | as is where is | immediately | ||
71902 | Microcontrol | MWE Plus | UV Wafer Eraser with cassette loading | 200 mm , 150 mm, 125 mm | 31.05.2000 | 1 | as is where is | immediately |
101683 | Micromanipulator | 9900 | Prober | 2 | inquire | |||
102299 | Multiprobe | MP1 | Atomic Force Prober (AFP) | 300 mm | 31.05.2006 | 1 | as is where is | |
94398 | NexGen Technologies | Nexgen Prober 2013 Model | semi-automatic prober with hot chuck | Min 75 mm Max 200 mm Set 200 mm | 31.05.2013 | 1 | as is where is | immediately |
101684 | Probilt | PB6800 | Prober | 1 | inquire | |||
103663 | PWS | P5NMS | Semi-Automatic Prober | 1 | as is where is | |||
103664 | PWS | P8AMS | Probe II Station SemiAuto Wafer Prober | 1 | as is where is | |||
91040 | RUCKER & KOLLS | 683A | PROBER | 200 mm | 1 | as is where is | immediately | |
99341 | Rucker & Kolls | 680A | SEMI-AUTOMATIC PROBER | 31.05.1995 | 1 | as is where is | ||
84169 | SEMICS | OPUS2 | Prober | 300 mm | 1 | as is where is | immediately | |
86465 | SEMICS | Opus 2 | Prober | 300 mm | 31.05.2007 | 1 | as is where is | immediately |
97873 | SEMICS | OPUS II | Wafer Prober | 1 | as is where is | |||
97874 | SEMICS | OPUS II | Wafer Prober | 1 | as is where is | |||
97875 | SEMICS | OPUS II | Wafer Prober | 300 mm | 31.05.2006 | 1 | as is where is | |
97876 | SEMICS | OPUS II | Wafer Prober | 1 | as is where is | |||
97967 | SEMICS | OPUS3 | PROBER | 1 | inquire | immediately | ||
102976 | SEMICS | OPUS II | Wafer Prober | 300 mm | 31.05.2007 | 1 | as is where is | |
102977 | SEMICS | OPUS II | Wafer Prober | 300 mm | 31.05.2007 | 1 | as is where is | |
102978 | SEMICS | OPUS II | Wafer Prober | 300 mm | 31.05.2007 | 1 | as is where is | |
102979 | SEMICS | OPUS II | Wafer Prober | 300 mm | 31.05.2007 | 1 | as is where is | |
103376 | Semics | OPUS II | Wafer Prober | 300 mm | 30.06.2005 | 1 | as is where is | |
103377 | Semics | OPUS II | Wafer Prober | 300 mm | 30.06.2005 | 1 | as is where is | |
103378 | Semics | OPUS III | Wafer Prober | 300 mm | 31.05.2011 | 1 | as is where is | |
102383 | SemiProbe | PS4L FA-12 | Fully Automatic Prober with FOUP Capability | 300 mm | 31.05.2012 | 1 | as is where is | |
90336 | Signatone | S-580 | prober | 200mm | 1 | as is where is | immediately | |
90372 | Signatone | S-1160 | Probe Station | 1 | as is where is | |||
103043 | Signatone | S-1160A-8S | Precision 200mm Manual Analytical Probe Station | 200 mm | 1 | as is where is | ||
71904 | ST Automation | test head | test head for Eprom U 1835 | 1 | as is where is | |||
96554 | TEL | P12 XL | Prober | 31.12.2002 | 1 | as is where is | immediately | |
78323 | TEL Tokyo Electron | P12XL | PROBER | 1 | as is where is | |||
86067 | TEL Tokyo Electron | P8XL | Prober | 1 | inquire | immediately | ||
87848 | TEL TOKYO ELECTRON | P12XLM | Prober | 300 mm | 31.05.2006 | 1 | inquire | immediately |
92348 | TEL Tokyo Electron | WDF DP | Prober | 200 mm | 30.11.2004 | 1 | inquire | immediately |
92368 | TEL Tokyo Electron | P12XLn+ | Fully Automatic Prober | 300 mm | 31.07.2006 | 1 | inquire | 1 month |
92437 | TEL Tokyo Electron | 19S | Prober | 9 | inquire | |||
92440 | TEL Tokyo Electron | P8XL | Prober | 30.09.2002 | 1 | inquire | ||
92441 | TEL Tokyo Electron | P12XL ( WAT ) | Fully Automatic Prober with Gold Hot Chuck and WAT | 300 MM | 31.05.2009 | 1 | inquire | immediately |
93837 | TEL Tokyo Electron | P12XLn | Prober with Hot Chuck | 300 mm | 31.08.2004 | 1 | as is where is | immediately |
95987 | TEL Tokyo Electron | P12XL ( WAT ) | Fully Automatic Prober with Gold Hot Chuck and WAT | 300 MM | 30.09.2008 | 1 | inquire | immediately |
96381 | TEL Tokyo Electron | P-12XL | Prober | 300 mm | 31.01.2006 | 1 | as is where is | immediately |
96724 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
96725 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
96726 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
96727 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
96728 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
96729 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
96730 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
96731 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
96732 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
96733 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
96734 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
96735 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
96736 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
96737 | TEL Tokyo Electron | 19S | Wafer PROBER | 200 mm | 1 | inquire | ||
98042 | TEL Tokyo Electron | P-12XL | Prober | 300 mm | 31.05.2002 | 1 | as is where is | |
98251 | TEL Tokyo Electron | P8XLm | Prober | 200 mm | 30.09.2005 | 2 | as is where is | immediately |
98252 | TEL Tokyo Electron | P8XLm | Prober | 200 mm | 2 | inquire | immediately | |
98253 | TEL Tokyo Electron | P12XLn | Prober | 300 MM | 2 | inquire | immediately | |
98254 | TEL Tokyo Electron | P12XLn | Prober | 300 MM | 2 | inquire | immediately | |
98255 | TEL Tokyo Electron | P-12XLn+ | Prober | 300 MM | 2 | inquire | immediately | |
98256 | TEL Tokyo Electron | P-12XLm | Prober | 300 MM | 1 | inquire | immediately | |
98257 | TEL Tokyo Electron | WDF | Prober, 6 Inch Frame | 150 MM | 2 | inquire | immediately | |
99915 | TEL Tokyo Electron | P12XLM | Prober | 300 mm | 31.05.2006 | 1 | as is where is | |
102941 | TEL Tokyo Electron | P12XL | Automatic Wafer Prober/Probe Station | 300 mm | 1 | as is where is | ||
102942 | TEL Tokyo Electron | P12XL | Automatic Wafer Prober/Probe Station | 300 mm | 1 | as is where is | ||
103803 | TEL Tokyo Electron | Precio | Prober WITH COLD OPTION | 300 mm | 01.05.2010 | 1 | as is where is | immediately |
106088 | TEL Tokyo Electron | P8 | Prober | 200 mm | 01.06.1999 | 8 | inquire | immediately |
96665 | Tokyo Seimitsu | A-PM-90A | Prober | 31.08.1997 | 1 | as is where is | immediately | |
96553 | TSK | UF3000 | Prober | 300mm | 31.03.2007 | 3 | as is where is | immediately |
97982 | TSK | UF300A | PROBER | 300 MM | 10 | inquire | ||
101689 | TSK | UF200S | Prober | 200 MM | 3 | inquire | ||
101690 | TSK | UF200SA | Tri-temp Prober | 200 MM | 4 | inquire | ||
98370 | ULTRACISION | 880E | Manual Wafer Prober, for up to 200mm Wafers | 200 mm | 1 | inquire | ||
98371 | ULTRACISION | 880E | Manual Wafer Prober, for up to 200mm Wafers | 200 mm | 1 | inquire | ||
98372 | ULTRACISION | 880E | Manual Wafer Prober, for up to 200mm Wafers | 200 mm | 1 | inquire | ||
103137 | Wentworth | Pegasus 300S | Wafer Prober | 300 mm | 31.05.2010 | 1 | as is where is | immediately |
99374 | Wentworth Labs | 0-023-0021 | 6" PROBE STATION/ WAFER PROBER MITUTOYO MICROSCOPE | 31.05.1995 | 1 | as is where is |