Please find below an alphabetically ordered list of used semiconductor manufacturing equipment , test equipment, assembly equipment and SMT equipment we have for sale, updated in real time on fabsurplus.com via the SDI worldwide "DataNET".
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 99379 | ADVANTEST | T5375 | High-Speed Flash Memory tester | TEST | 1 | as is where is | immediately | |
| 99380 | ADVANTEST | T5771ES | Automated Test Equipment for laboratory or office use | TEST | 1 | as is where is | immediately | |
| 109551 | ASML | TWINSCAN XT1250D | 193nm (ArF) Scanner - Cymer laser not included | 300 mm | 01.05.2004 | 1 | as is where is | immediately |
| 83616 | FSP GROUP INC | 100-240 W | POWER SUPPLY for a p.c. | 10A 50-60 Hz | 01.01.2008 | 10 | as is where is | immediately |
| 94601 | Group 3 | 1981001 | Digital Teslameter | SPARES | 1 | as is where is | ||
| 31614 | KLA | 8100 | PICOAMP 11 P/N 720-02964-000 | 2 | ||||
| 106896 | Omniguard | 860UV-IR | UV-IR Fire detector, w/ mount | Spares | 2 | as is where is | immediately | |
| 106868 | Riber ® | MBE 32 | Molecular Beam Epitaxy system for R and D | Laboratory | 01.03.1999 | 1 | as is where is | immediately |
| 108607 | TERADYNE | IP750EX | AUTOMATED TEST EQUIPMENT For CMOS Image Sensor testing | TEST | 01.06.2012 | 1 | as is where is | immediately |