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SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
---|---|---|---|---|---|---|---|---|
106336 | August / Rudolph Technologies | CV9812 | Wafer Carrier inspection tool | 1 | as is where is | immediately | ||
94478 | RUDOLPH | FE-3 | Focus Ellipsometer | 200 mm | 1 | as is where is | ||
94479 | RUDOLPH | FE-4D | Focus Ellipsometer | 200 mm | 1 | as is where is | ||
98835 | RUDOLPH | AXI-S | Macro Wafer Inspection | 300 mm | 30.06.2004 | 1 | as is where is | immediately |
98837 | RUDOLPH | MP1-300XCU | Film Thickness Measurement System | 300 mm | 30.04.2008 | 1 | as is where is | immediately |
103707 | Rudolph | AXI-S | Macro Inspection System | 300 mm | 31.05.2003 | 1 | as is where is | |
103708 | Rudolph | AXI-935D | Macro Inspection System | 300 mm | 1 | as is where is | ||
103709 | Rudolph | AXI-935D | Macro Inspection System | 300 mm | 31.05.2011 | 1 | as is where is | |
92709 | Rudolph | WV320 | MACRO INSPECTION | 300 MM | 31.05.2006 | 1 | as is where is | immediately |
92710 | Rudolph | WV320 | MACRO INSPECTION | 300 MM | 31.05.2006 | 1 | as is where is | |
106298 | RUDOLPH | MetaPulse 3 300A | Film Thickness Measurement | 300 mm | 01.06.2008 | 1 | as is where is | immediately |
105789 | Rudolph | WHS220/Axi-940b | Wafer Mask Inspection System | 100-150 mm | 31.05.2009 | 1 | as is where is | |
100928 | RUDOLPH | AXI-S | Macro Inspection System | 300 mm | 31.05.2003 | 1 | as is where is | |
100929 | RUDOLPH | FE-7 | Ellipsometer | 200 mm | 31.05.1996 | 1 | as is where is | |
100930 | RUDOLPH | MP300 | Film thickness measurement | 200 mm | 31.05.2007 | 1 | as is where is | |
100931 | RUDOLPH | MP300 | Film thickness measurement | 200 mm | 31.05.2009 | 1 | as is where is | |
100932 | RUDOLPH | S3000A | Focused Beam Ellipsometer | 200 mm | 31.05.2012 | 1 | as is where is | |
106831 | Rudolph | MP200XCU | Cu Film thickness measurement | 200mm | 1 | inquire | ||
106832 | Rudolph | MP300 | Metal Film thickness measurement | 300mm | 1 | inquire | ||
106833 | Rudolph | MP300 XCu | Cu Film thickness measurement | 300mm | 2 | inquire | ||
105822 | Rudolph | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
105823 | Rudolph | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
105824 | Rudolph | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
105825 | Rudolph | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
72034 | RUDOLPH | MP200 | METROLOGY | 200 mm | 31.05.2000 | 1 | as is where is | immediately |
105826 | Rudolph | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
105827 | Rudolph | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
105828 | Rudolph | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
105829 | Rudolph | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
105830 | Rudolph | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
105831 | Rudolph | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
101491 | Rudolph | NSX 105 | Macro-Defect Inspection System | 200mm | 1 | as is where is | ||
101492 | Rudolph | NSX 105 | Macro-Defect Inspection System | 200mm | 1 | as is where is | ||
101493 | Rudolph | NSX 105 | Macro-Defect Inspection System | 200mm | 1 | as is where is | ||
101494 | Rudolph | NSX 105 | Macro-Defect Inspection System | 200mm | 1 | as is where is | ||
101495 | Rudolph | NSX 105 | Macro-Defect Inspection System | 200mm | 1 | as is where is | ||
106871 | RUDOLPH | NSX 105 | Automated Wafer, Die and Bump Inspection System | 300 mm | 01.06.2008 | 1 | as is where is | immediately |
101496 | Rudolph | NSX 105 | Macro-Defect Inspection System | 200mm | 1 | as is where is | ||
98171 | Rudolph | NSX105C | Macro Inspection | 200 mm | 31.05.2007 | 1 | as is where is | |
103553 | RUDOLPH | AXI-S | Macro Inspection | 300 mm | 31.05.2004 | 1 | as is where is | |
103554 | RUDOLPH | AXI935D | AVI | 300 mm | 1 | as is where is | ||
95619 | Rudolph | WV320 | MACRO INSPECTION | 300 MM | 31.05.2006 | 1 | as is where is | immediately |
103555 | RUDOLPH | MP3 300XCU | FLIM THICKNESS MEASUREMENT SYSTEM | 300 mm | 1 | as is where is | immediately | |
95621 | RUDOLPH | WV320 | Metrology | 300mm | 1 | as is where is | immediately | |
91559 | RUDOLPH | AXI_S | Macro Inspection System | 300 mm | 31.05.2005 | 1 | as is where is | |
91560 | RUDOLPH | AXI_S | Macro Inspection System | 300 mm | 31.05.2005 | 1 | as is where is | |
91561 | RUDOLPH | AXI_S | Macro Inspection System | 300 mm | 31.05.2006 | 1 | as is where is | |
91563 | RUDOLPH | Meta Pulse | Film Metrology | 200 mm | 31.05.2005 | 1 | as is where is | |
97965 | RUDOLPH | NSX320 | MACRO DEFECT INSPECTOR | 300 MM | 1 | as is where is | immediately | |
91566 | Rudolph | WS3840 | 3D Bump Metrology | 300 mm | 31.05.2010 | 1 | as is where is | immediately |
97966 | RUDOLPH | WHS | MACRO DEFECT INSPECTOR | 300 MM | 1 | inquire | ||
91567 | RUDOLPH | META PULSE 200 | Surface Film Metrology | 200 mm | 31.05.2002 | 1 | as is where is | immediately |
106420 | Rudolph | NSX 115 | Automated Defect Inspection | 200 mm | 1 | as is where is | immediately | |
106421 | Rudolph | NSX 95 | Automated Macro Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | |
106422 | Rudolph | NSX-105 | Automated Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | |
106423 | Rudolph | NSX-105d1 | Automated Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | |
106424 | Rudolph | NSX-95 | Automated Macro Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | |
106425 | Rudolph | NSX-95 | Manual Macro Wafer Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | |
102355 | Rudolph | 3Di8500 | Wafer Inspection | 300 mm | 31.05.2008 | 1 | as is where is | |
102356 | Rudolph | Axi-S | Macro inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
102359 | Rudolph | NSX115 | Macro Defect Inspection System | 300 mm | 31.05.2009 | 1 | as is where is | |
102360 | Rudolph | NSX115 | Macro Defect Inspection System | 300 mm | 31.05.2010 | 1 | as is where is | |
102363 | Rudolph | S3000S | Focused Beam Ellipsometer | 300 mm | 31.05.2011 | 1 | as is where is | |
106715 | RUDOLPH | MP3_300A | METAL THICKNESS MEASUREMENT | 300 mm | 01.06.2012 | 1 | as is where is | |
102364 | Rudolph | S3000SX | Focused Beam Ellipsometer | 300 mm | 31.05.2011 | 1 | as is where is | |
106716 | RUDOLPH | MP-300 | Film thickness measurement | 300 mm | 01.06.2005 | 1 | as is where is | |
106717 | RUDOLPH | MP1-300 | Film Thickness Measurement | 300 mm | 01.06.2003 | 1 | as is where is | |
106718 | RUDOLPH | MP1-300 | Film Thickness Measurement | 300 mm | 1 | as is where is | ||
106719 | RUDOLPH | MP1-300XCU | Film thickness measurement system | 300 mm | 01.06.2008 | 1 | as is where is | |
106720 | RUDOLPH | NSX 105 | MACRO DEFECT INSPECTION SYSTEM | 300 mm | 01.06.2008 | 1 | as is where is | immediately |
102369 | Rudolph | WV320 | Macro Defect inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
106721 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2010 | 1 | as is where is | |
106722 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2011 | 1 | as is where is | |
106723 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 1 | as is where is | ||
101348 | Rudolph | Auto EL | Elipsometer | 150mm | 1 | as is where is | ||
102372 | Rudolph | WV320 | Macro Defect inspection | 300 mm | 31.05.2007 | 1 | as is where is | |
106724 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2011 | 1 | as is where is | |
101349 | Rudolph | FE IIID | Dual Wavelength Ellipsometer | 200 mm | 01.06.1998 | 1 | as is where is | immediately |
102373 | Rudolph | WV320 | Macro Defect inspection | 300 mm | 31.05.2007 | 1 | as is where is | |
106725 | RUDOLPH | S3000S | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2010 | 1 | as is where is | |
106726 | RUDOLPH | S3000S | FBE(focused beam laser ellipsometry) | 300 mm | 1 | as is where is | ||
106727 | RUDOLPH | WS2500 | Wafer Inspection System | 200 mm | 01.06.2003 | 1 | as is where is | |
106728 | RUDOLPH | WS2500 | Wafer Inspection System | 200 mm | 01.06.2003 | 1 | as is where is | |
106729 | RUDOLPH | WS2500 | Wafer Inspection System | 200 mm | 01.06.2006 | 1 | as is where is | |
106730 | RUDOLPH | WS2500 | Wafer Inspection System | 200 mm | 01.06.2002 | 1 | as is where is | |
106731 | RUDOLPH | WV320 | Macro Inspection | 300 mm | 01.06.2006 | 1 | as is where is | |
91116 | RUDOLPH | MP200 XCu | Thin Film Measurement | 200 mm | 31.05.2001 | 1 | as is where is | |
106732 | RUDOLPH | MP200 | Film thickness measurement | 200 mm | 01.06.2003 | 1 | as is where is | |
106733 | RUDOLPH | MP200 | Film thickness measurement | 200 mm | 01.06.1999 | 1 | as is where is | |
106734 | RUDOLPH | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
106735 | RUDOLPH | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
98296 | RUDOLPH | Meta Pulse 300 | Film thickness measurement | 300 mm | 1 | as is where is | ||
98297 | RUDOLPH | Meta Pulse 300 | Film thickness measurement | 300 mm | 1 | as is where is | ||
98298 | RUDOLPH | MP1-300 | Film thickness measurement | 300 mm | 31.05.2007 | 1 | as is where is | |
70089 | Rudolph Technologies | FE-VII | Ellipsometer | 200 mm | 31.05.1996 | 1 | as is where is | immediately |
88629 | Rudolph/August | NSX105 | Macro Inspection | 200 MM | 31.05.2004 | 1 | as is where is | |
88630 | Rudolph/August | NSX105 | Macro Inspection | 200 MM | 31.05.2003 | 1 | as is where is |