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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 113152 | RUDOLPH | S3000S | FBE(focused beam laser ellipsometry) | 300 mm | 1 | as is where is | |||
| 113153 | RUDOLPH | WV320 | Macro Inspection | 300 mm | 01.06.2006 | 1 | as is where is | ||
| 108034 | RUDOLPH | AXI-S930B | Macro Defect Inspection | 300 mm | 01.01.2007 | 1 | as is where is | ||
| 109570 | Rudolph | WaferView 320 | Macro Wafer Defect Inspection System | 300 mm | 1 | as is where is | immediately | ||
| 113154 | RUDOLPH | MP200 | Film thickness measurement | 200 mm | 01.06.1999 | 1 | as is where is | ||
| 113155 | RUDOLPH | MP200 | Film thickness measurement | 200 mm | 01.06.2003 | 1 | as is where is | ||
| 113156 | RUDOLPH | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | |||
| 113157 | RUDOLPH | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | |||
| 94478 | RUDOLPH | FE-3 | Focus Ellipsometer | 200 mm | 1 | as is where is | |||
| 94479 | RUDOLPH | FE-4D | Focus Ellipsometer | 200 mm | 1 | as is where is | |||
| 98835 | RUDOLPH | AXI-S | Macro Wafer Inspection | 300 mm | 01.06.2004 | 1 | as is where is | immediately | |
| 98837 | RUDOLPH | MP1-300XCU | Film Thickness Measurement System | 300 mm | 30.04.2008 | 1 | as is where is | immediately | |
| 108587 | RUDOLPH | WV320 | Wafer Inspection System | 300mm | 1 | as is where is | immediately | ||
| 100928 | RUDOLPH | AXI-S | Macro Inspection System | 300 mm | 31.05.2003 | 1 | as is where is | ||
| 100929 | RUDOLPH | FE-7 | Ellipsometer | 200 mm | 31.05.1996 | 1 | as is where is | ||
| 100930 | RUDOLPH | MP300 | Film thickness measurement | 200 mm | 31.05.2007 | 1 | as is where is | ||
| 100931 | RUDOLPH | MP300 | Film thickness measurement | 200 mm | 31.05.2009 | 1 | as is where is | ||
| 100932 | RUDOLPH | S3000A | Focused Beam Ellipsometer | 200 mm | 31.05.2012 | 1 | as is where is | ||
| 106831 | Rudolph | MP200XCU | Cu Film thickness measurement | 200 mm | 1 | as is where is | immediately | ||
| 106832 | Rudolph | MP-300 | Metal Film thickness measurement | 300mm | 1 | as is where is | immediately | ||
| 106833 | Rudolph | MP300 XCu | Cu Film thickness measurement | 300 mm | 2 | as is where is | immediately | ||
| 106871 | RUDOLPH | NSX 105 | Automated Wafer, Die and Bump Inspection System | 300 mm | 01.06.2008 | 1 | as is where is | immediately | |
| 103553 | RUDOLPH | AXI-S | Macro Inspection | 300 mm | 31.05.2004 | 1 | as is where is | ||
| 103554 | RUDOLPH | AXI935D | AVI | 300 mm | 1 | as is where is | |||
| 103555 | RUDOLPH | MP3 300XCU | FLIM THICKNESS MEASUREMENT SYSTEM | 300 mm | 1 | as is where is | immediately | ||
| 110735 | Rudolph | MetaPulse 200 | Metal film measurement system | 150-200 mm | 01.06.2006 | 1 | as is where is | immediately | |
| 110736 | Rudolph | MetaPulse 200X Cu | Metal film measurement system | 150-200 mm | 01.06.2006 | 1 | as is where is | immediately | |
| 112280 | Rudolph | 3Di8500 | Metrology Macro inspection | 300 mm | 01.06.2008 | 1 | as is where is | ||
| 112281 | Rudolph | Axi-S | Metrology Macro Inspection | 300 mm | 01.06.2005 | 1 | as is where is | ||
| 112282 | Rudolph | Axi-S | Metrology Macro Inspection | 300 mm | 01.06.2005 | 1 | as is where is | ||
| 112283 | Rudolph | NSX105 | Metrology Macro Inspection | 300 mm | 01.06.2007 | 1 | as is where is | ||
| 112284 | Rudolph | NSX105 | Metrology Macro Inspection | 200 mm | 01.06.2004 | 1 | as is where is | ||
| 112285 | Rudolph | NSX105 | Metrology Macro Inspection | 200 mm | 01.06.2003 | 1 | as is where is | ||
| 112286 | Rudolph | NSX105 | Metrology Macro Inspection | 200 mm | 1 | as is where is | |||
| 108195 | RUDOLPH | META PULSE 200 | Film thickness measurement | 200 mm | 01.06.1999 | 1 | as is where is | ||
| 108196 | RUDOLPH | META PULSE 200 | Film thickness measurement | 200 mm | 01.06.2005 | 1 | as is where is | ||
| 108197 | RUDOLPH | META PULSE 200X CU | Film thickness measurement (Including HDD) | 200 mm | 01.06.2003 | 1 | as is where is | ||
| 108198 | RUDOLPH | META PULSE 200X CU | Film thickness measurement (Including HDD) | 200 mm | 01.06.2001 | 1 | as is where is | ||
| 91559 | RUDOLPH | AXI_S | Macro Inspection System | 300 mm | 31.05.2005 | 1 | as is where is | ||
| 108199 | RUDOLPH | META PULSE II 200X CU | Film thickness measurement | 200 mm | 01.06.2008 | 1 | as is where is | ||
| 108711 | Rudolph | Sonus 7800 | Acoustic Metrology and Defect Detection System | 300 MM | 01.06.2015 | 1 | inquire | ||
| 91560 | RUDOLPH | AXI_S | Macro Inspection System | 300 mm | 31.05.2005 | 1 | as is where is | ||
| 108200 | RUDOLPH | MP200 | Film thickness measurement | 200 mm | 01.06.2002 | 1 | as is where is | ||
| 91561 | RUDOLPH | AXI_S | Macro Inspection System | 300 mm | 31.05.2006 | 1 | as is where is | ||
| 91563 | RUDOLPH | Meta Pulse | Film Metrology | 200 mm | 31.05.2005 | 1 | as is where is | ||
| 91566 | Rudolph | WS3840 | 3D Bump Metrology | 300 mm | 31.05.2010 | 1 | as is where is | immediately | |
| 91567 | RUDOLPH | META PULSE 200 | Surface Film Metrology | 200 mm | 31.05.2002 | 1 | as is where is | immediately | |
| 106420 | Rudolph | NSX 115 | Automated Defect Inspection | 200 mm | 1 | as is where is | immediately | ||
| 106421 | Rudolph | NSX 95 | Automated Macro Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | ||
| 106422 | Rudolph | NSX-105 | Automated Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | ||
| 106424 | Rudolph | NSX-95 | Automated Macro Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | ||
| 106425 | Rudolph | NSX-95 | Manual Macro Wafer Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | ||
| 110795 | Rudolph | S300D Ultra II | Thin Film Measurement Tool / Ellipsometer | 300 mm | 01.05.2005 | 1 | as is where is | immediately | |
| 106715 | RUDOLPH | MP3_300A | METAL THICKNESS MEASUREMENT | 300 mm | 01.06.2012 | 1 | as is where is | ||
| 106716 | RUDOLPH | MP-300 | Film thickness measurement | 300 mm | 01.06.2005 | 1 | as is where is | ||
| 106717 | RUDOLPH | MP1-300 | Film Thickness Measurement | 300 mm | 01.06.2003 | 1 | as is where is | ||
| 106718 | RUDOLPH | MP1-300 | Film Thickness Measurement | 300 mm | 1 | as is where is | |||
| 106719 | RUDOLPH | MP1-300XCU | Film thickness measurement system | 300 mm | 01.06.2008 | 1 | as is where is | ||
| 106720 | RUDOLPH | NSX 105 | MACRO DEFECT INSPECTION SYSTEM | 300 mm | 01.06.2008 | 1 | as is where is | immediately | |
| 106721 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2010 | 1 | as is where is | ||
| 106722 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2011 | 1 | as is where is | ||
| 106723 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 1 | as is where is | |||
| 106724 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2011 | 1 | as is where is | ||
| 106725 | RUDOLPH | S3000S | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2010 | 1 | as is where is | ||
| 106726 | RUDOLPH | S3000S | FBE(focused beam laser ellipsometry) | 300 mm | 1 | as is where is | |||
| 106727 | RUDOLPH | WS2500 | Wafer Inspection System | 200 mm | 01.06.2003 | 1 | as is where is | ||
| 106728 | RUDOLPH | WS2500 | Wafer Inspection System | 200 mm | 01.06.2003 | 1 | as is where is | ||
| 106729 | RUDOLPH | WS2500 | Wafer Inspection System | 200 mm | 01.06.2006 | 1 | as is where is | ||
| 106730 | RUDOLPH | WS2500 | Wafer Inspection System | 200 mm | 01.06.2002 | 1 | as is where is | ||
| 106731 | RUDOLPH | WV320 | Macro Inspection | 300 mm | 01.06.2006 | 1 | as is where is | ||
| 113131 | RUDOLPH | AXI-S | Macro Inspection System | 300 mm | 01.06.2004 | 1 | as is where is | ||
| 106732 | RUDOLPH | MP200 | Film thickness measurement | 200 mm | 01.06.2003 | 1 | as is where is | ||
| 113132 | RUDOLPH | META PULSE 200 | Film thickness measurement | 200 mm | 01.06.1999 | 1 | as is where is | ||
| 106733 | RUDOLPH | MP200 | Film thickness measurement | 200 mm | 01.06.1999 | 1 | as is where is | ||
| 113133 | RUDOLPH | META PULSE 200 | Film thickness measurement | 200 mm | 01.06.2005 | 1 | as is where is | ||
| 106734 | RUDOLPH | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | |||
| 109550 | Rudolph | AXI-S | Macro Defect Inspection System | 300 mm | 01.06.2006 | 1 | as is where is | immediately | |
| 113134 | RUDOLPH | META PULSE 200X CU | Film thickness measurement (Including HDD) | 200 mm | 01.06.2003 | 1 | as is where is | ||
| 106735 | RUDOLPH | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | |||
| 113135 | RUDOLPH | META PULSE 200X CU | Film thickness measurement (Including HDD) | 200 mm | 01.06.2001 | 1 | as is where is | ||
| 113136 | RUDOLPH | META PULSE II 200X CU | Film thickness measurement | 200 mm | 01.06.2008 | 1 | as is where is | ||
| 113137 | RUDOLPH | METAPULSE 200C | Film thickness measurement | 200 mm | 01.06.2000 | 1 | as is where is | ||
| 113138 | RUDOLPH | METAPULSE 200cuX | Film thickness measurement | 200 mm | 01.06.2004 | 1 | as is where is | ||
| 113139 | RUDOLPH | MP-300 | Film thickness measurement | 300 mm | 01.06.2005 | 1 | as is where is | ||
| 113140 | RUDOLPH | MP1-300 | Film Thickness Measurement | 300 mm | 1 | as is where is | |||
| 113141 | RUDOLPH | MP1-300 | Film Thickness Measurement | 300 mm | 01.06.2007 | 1 | as is where is | ||
| 113142 | RUDOLPH | MP1-300 | Film Thickness Measurement | 300 mm | 1 | as is where is | |||
| 113143 | RUDOLPH | MP1-300 | Film Thickness Measurement | 300 mm | 01.06.2003 | 1 | as is where is | ||
| 98296 | RUDOLPH | Meta Pulse 300 | Film thickness measurement | 300 mm | 1 | as is where is | |||
| 113144 | RUDOLPH | MP1-300XCU | Film thickness measurement system | 300 mm | 01.06.2008 | 1 | as is where is | ||
| 98297 | RUDOLPH | Meta Pulse 300 | Film thickness measurement | 300 mm | 1 | as is where is | |||
| 113145 | RUDOLPH | MP3_300A | METAL THICKNESS | 300 mm | 01.06.2012 | 1 | as is where is | ||
| 98298 | RUDOLPH | MP1-300 | Film thickness measurement | 300 mm | 31.05.2007 | 1 | as is where is | ||
| 113146 | RUDOLPH | MP3-300XCU | Film Thickness Measurement | 300 mm | 01.06.2008 | 1 | as is where is | ||
| 113147 | RUDOLPH | NSX 105 | Macro Defect Inspection | 300 mm | 01.06.2008 | 1 | as is where is | ||
| 113148 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2010 | 1 | as is where is | ||
| 113149 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2011 | 1 | as is where is | ||
| 113150 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 1 | as is where is | |||
| 113151 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2011 | 1 | as is where is | ||
| 112915 | Rudolph Research | AUTO EL RE-350 | Ellipsometer | 150 mm | 1 | as is where is | |||
| 112916 | Rudolph Technologies | AUTO EL | Ellipsometer | 150 mm | 1 | as is where is | |||
| 111872 | Rudolph Technologies, Inc. | MetaPULSE-IIIa | Film Thickness Measurement System | 300mm | 1 | as is where is | |||
| 111873 | Rudolph Technologies, Inc. | Vanguard SpectraLASER 200XL | Film Thickness Measurement System | 200mm | 1 | as is where is | |||
| 111870 | Rudolph Technologies, Inc. | MetaPULSE 300 | Film Thickness Measurement System | 300mm | 1 | as is where is | |||
| 111871 | Rudolph Technologies, Inc. | MetaPULSE-IIIa | Film Thickness Measurement System | 300mm | 1 | as is where is |