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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 97030 | RUDOLPH | METAPULSE-200 | Thick Film Measurement | 200 mm | 01.06.2000 | 1 | as is where is | |
| 97031 | RUDOLPH | METAPULSE-III 300XCU | Thick Film Measurement | 300 mm | 01.06.2011 | 1 | as is where is | |
| 97032 | RUDOLPH | RUDOLPH/FE-7 | Ellipsometer | 200 mm | 01.06.1996 | 1 | as is where is | |
| 94478 | RUDOLPH | FE-3 | Focus Ellipsometer | 200 mm | 1 | as is where is | ||
| 94479 | RUDOLPH | FE-4D | Focus Ellipsometer | 200 mm | 1 | as is where is | ||
| 98835 | RUDOLPH | AXI-S | Macro Wafer Inspection | 300 mm | 01.07.2004 | 1 | as is where is | immediately |
| 98836 | RUDOLPH | AXI-S930B | Macro Defect Inspection System | 300 mm | 01.02.2007 | 1 | as is where is | |
| 98837 | RUDOLPH | MP1-300XCU | Film Thickness Measurement System | 300 mm | 01.05.2008 | 1 | as is where is | immediately |
| 98838 | RUDOLPH | S3000A | focused beam ellipsometry | 300 mm | 01.06.2012 | 1 | as is where is | |
| 92709 | Rudolph | WV320 | MACRO INSPECTION | 300 MM | 01.06.2006 | 1 | as is where is | immediately |
| 92710 | Rudolph | WV320 | MACRO INSPECTION | 300 MM | 01.06.2006 | 1 | as is where is | |
| 100928 | RUDOLPH | AXI-S | Macro Inspection System | 300 mm | 01.06.2003 | 1 | as is where is | |
| 100929 | RUDOLPH | FE-7 | Ellipsometer | 200 mm | 01.06.1996 | 1 | as is where is | |
| 100930 | RUDOLPH | MP300 | Film thickness measurement | 200 mm | 01.06.2007 | 1 | as is where is | |
| 100931 | RUDOLPH | MP300 | Film thickness measurement | 200 mm | 01.06.2009 | 1 | as is where is | |
| 100932 | RUDOLPH | S3000A | Focused Beam Ellipsometer | 200 mm | 01.06.2012 | 1 | as is where is | |
| 98902 | RUDOLPH | AXI-S | Wafer Inspection | 300 mm | 01.06.2005 | 1 | as is where is | |
| 72034 | RUDOLPH | MP200 | METROLOGY | 200 mm | 01.06.2000 | 1 | as is where is | immediately |
| 98171 | Rudolph | NSX105C | Macro Inspection | 200 mm | 01.06.2007 | 1 | as is where is | |
| 95619 | Rudolph | WV320 | MACRO INSPECTION | 300 MM | 01.06.2006 | 1 | as is where is | immediately |
| 95621 | RUDOLPH | WV320 | Metrology | 300mm | 1 | as is where is | immediately | |
| 100235 | Rudolph | Axi 930 | Macro-Defect | 300mm | 01.06.2006 | 1 | as is where is | |
| 100236 | Rudolph | Axi 930 | Macro-Defect | 300mm | 01.06.2007 | 1 | as is where is | |
| 91559 | RUDOLPH | AXL_S | Macro Inspection System | 300 mm | 01.06.2005 | 1 | as is where is | |
| 91560 | RUDOLPH | AXL_S | Macro Inspection System | 300 mm | 01.06.2005 | 1 | as is where is | |
| 91561 | RUDOLPH | AXL_S | Macro Inspection System | 300 mm | 01.06.2006 | 1 | as is where is | |
| 91562 | RUDOLPH | MP1 300 | Film thickness measurement | 300 mm | 01.06.2013 | 1 | as is where is | |
| 91563 | RUDOLPH | Meta Pulse | Film Metrology | 200 mm | 01.06.2005 | 1 | as is where is | |
| 91564 | RUDOLPH | Meta Pulse 200 | Film Metrology | 200 mm | 1 | as is where is | ||
| 91565 | RUDOLPH | MP1 300 | Film Metrology | 300 mm | 1 | as is where is | ||
| 97965 | RUDOLPH | NSX320 | MACRO DEFECT INSPECTOR | 300 MM | 1 | inquire | ||
| 91566 | Rudolph | WS3840 | 3D Bump Metrology | 300 mm | 01.06.2010 | 1 | as is where is | |
| 97966 | RUDOLPH | WHS | MACRO DEFECT INSPECTOR | 300 MM | 1 | inquire | ||
| 91567 | RUDOLPH | META PULSE 200 | Surface Film Metrology | 200 mm | 01.06.2002 | 1 | as is where is | immediately |
| 98493 | Rudolph | MP200 | Cu Film thickness measurement | 200mm | 4 | as is where is | ||
| 98494 | Rudolph | MP300 | Cu Film thickness measurement | 300mm | 1 | as is where is | ||
| 96720 | Rudolph | NSX-105 | macro defect inspection | 1 | inquire | |||
| 99035 | RUDOLPH | AXI-S | Macro Wafer Inspection | 01.03.2004 | 1 | as is where is | ||
| 99036 | RUDOLPH | AXI-S | Macro Defect Inspection System | 01.05.2003 | 1 | as is where is | ||
| 99037 | RUDOLPH | S3000A | focused beam ellipsometry | 01.05.2012 | 1 | as is where is | ||
| 101348 | Rudolph | Auto EL | Elipsometer | 150mm | 1 | as is where is | ||
| 101349 | Rudolph | FE III | Ellipsometer | 1 | as is where is | |||
| 91116 | RUDOLPH | MP200 XCu | Thin Film Measurement | 200 mm | 01.06.2001 | 1 | as is where is | |
| 98296 | RUDOLPH | Meta Pulse 300 | Film thickness measurement | 300 mm | 1 | as is where is | ||
| 98297 | RUDOLPH | Meta Pulse 300 | Film thickness measurement | 300 mm | 1 | as is where is | ||
| 98298 | RUDOLPH | MP1-300 | Film thickness measurement | 300 mm | 01.06.2007 | 1 | as is where is | |
| 70089 | Rudolph Technologies | FE-VII | Ellipsometer | 200 mm | 01.06.1996 | 1 | as is where is | immediately |
| 88629 | Rudolph/August | NSX105 | Macro Inspection | 200 MM | 01.06.2004 | 1 | as is where is | |
| 88630 | Rudolph/August | NSX105 | Macro Inspection | 200 MM | 01.06.2003 | 1 | as is where is |