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List of RUDOLPH equipment available for sale at fabsurplus.com

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SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
108034 RUDOLPH AXI-S930B Macro Defect Inspection 300 mm 01.01.2007 1 as is where is
109570 Rudolph WaferView 320 Macro Wafer Defect Inspection System 300 mm 1 as is where is immediately
94478 RUDOLPH FE-3 Focus Ellipsometer 200 mm 1 as is where is
94479 RUDOLPH FE-4D Focus Ellipsometer 200 mm 1 as is where is
98835 RUDOLPH AXI-S Macro Wafer Inspection 300 mm 01.06.2004 1 as is where is immediately
98837 RUDOLPH MP1-300XCU Film Thickness Measurement System 300 mm 30.04.2008 1 as is where is immediately
108587 RUDOLPH WV320 Wafer Inspection System 300mm 1 as is where is immediately
100928 RUDOLPH AXI-S Macro Inspection System 300 mm 31.05.2003 1 as is where is
100929 RUDOLPH FE-7 Ellipsometer 200 mm 31.05.1996 1 as is where is
100930 RUDOLPH MP300 Film thickness measurement 200 mm 31.05.2007 1 as is where is
100931 RUDOLPH MP300 Film thickness measurement 200 mm 31.05.2009 1 as is where is
100932 RUDOLPH S3000A Focused Beam Ellipsometer 200 mm 31.05.2012 1 as is where is
106831 Rudolph MP200XCU Cu Film thickness measurement 200mm 1 inquire
106832 Rudolph MP300 Metal Film thickness measurement 300mm 1 inquire
106833 Rudolph MP300 XCu Cu Film thickness measurement 300mm 2 inquire
106871 RUDOLPH NSX 105 Automated Wafer, Die and Bump Inspection System 300 mm 01.06.2008 1 as is where is immediately
103553 RUDOLPH AXI-S Macro Inspection 300 mm 31.05.2004 1 as is where is
103554 RUDOLPH AXI935D AVI 300 mm 1 as is where is
103555 RUDOLPH MP3 300XCU FLIM THICKNESS MEASUREMENT SYSTEM 300 mm 1 as is where is immediately
108195 RUDOLPH META PULSE 200 Film thickness measurement 200 mm 01.06.1999 1 as is where is
108196 RUDOLPH META PULSE 200 Film thickness measurement 200 mm 01.06.2005 1 as is where is
108197 RUDOLPH META PULSE 200X CU Film thickness measurement (Including HDD) 200 mm 01.06.2003 1 as is where is
108198 RUDOLPH META PULSE 200X CU Film thickness measurement (Including HDD) 200 mm 01.06.2001 1 as is where is
91559 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2005 1 as is where is
108199 RUDOLPH META PULSE II 200X CU Film thickness measurement 200 mm 01.06.2008 1 as is where is
108711 Rudolph Sonus 7800 Acoustic Metrology and Defect Detection System 300 MM 01.06.2015 1 inquire
91560 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2005 1 as is where is
108200 RUDOLPH MP200 Film thickness measurement 200 mm 01.06.2002 1 as is where is
91561 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2006 1 as is where is
91563 RUDOLPH Meta Pulse Film Metrology 200 mm 31.05.2005 1 as is where is
91566 Rudolph WS3840 3D Bump Metrology 300 mm 31.05.2010 1 as is where is immediately
91567 RUDOLPH META PULSE 200 Surface Film Metrology 200 mm 31.05.2002 1 as is where is immediately
106420 Rudolph NSX 115 Automated Defect Inspection 200 mm 1 as is where is immediately
106421 Rudolph NSX 95 Automated Macro Defect Inspection 150 mm/200 mm 1 as is where is immediately
106422 Rudolph NSX-105 Automated Defect Inspection 150 mm/200 mm 1 as is where is immediately
106424 Rudolph NSX-95 Automated Macro Defect Inspection 150 mm/200 mm 1 as is where is immediately
106425 Rudolph NSX-95 Manual Macro Wafer Defect Inspection 150 mm/200 mm 1 as is where is immediately
108482 Rudolph Axi 935 Macro-Defect 1 as is where is
108483 Rudolph Matrix S-300 Ellipsometer 300 mm 1 as is where is
108484 Rudolph MetaPULSE 300 Film Thickness Measurement System 300 mm 3 as is where is
108485 Rudolph NSX 105 Macro-Defect 300 mm 8 as is where is
106715 RUDOLPH MP3_300A METAL THICKNESS MEASUREMENT 300 mm 01.06.2012 1 as is where is
106716 RUDOLPH MP-300 Film thickness measurement 300 mm 01.06.2005 1 as is where is
106717 RUDOLPH MP1-300 Film Thickness Measurement 300 mm 01.06.2003 1 as is where is
106718 RUDOLPH MP1-300 Film Thickness Measurement 300 mm 1 as is where is
106719 RUDOLPH MP1-300XCU Film thickness measurement system 300 mm 01.06.2008 1 as is where is
106720 RUDOLPH NSX 105 MACRO DEFECT INSPECTION SYSTEM 300 mm 01.06.2008 1 as is where is immediately
106721 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2010 1 as is where is
106722 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2011 1 as is where is
106723 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 1 as is where is
106724 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2011 1 as is where is
106725 RUDOLPH S3000S FBE(focused beam laser ellipsometry) 300 mm 01.06.2010 1 as is where is
106726 RUDOLPH S3000S FBE(focused beam laser ellipsometry) 300 mm 1 as is where is
106727 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2003 1 as is where is
106728 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2003 1 as is where is
106729 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2006 1 as is where is
106730 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2002 1 as is where is
106731 RUDOLPH WV320 Macro Inspection 300 mm 01.06.2006 1 as is where is
106732 RUDOLPH MP200 Film thickness measurement 200 mm 01.06.2003 1 as is where is
106733 RUDOLPH MP200 Film thickness measurement 200 mm 01.06.1999 1 as is where is
106734 RUDOLPH WV320 Macro Defect Inspection System 300 mm 1 as is where is
109550 Rudolph AXI-S Macro Defect Inspection System 300 mm 01.06.2006 1 as is where is immediately
106735 RUDOLPH WV320 Macro Defect Inspection System 300 mm 1 as is where is
98296 RUDOLPH Meta Pulse 300 Film thickness measurement 300 mm 1 as is where is
98297 RUDOLPH Meta Pulse 300 Film thickness measurement 300 mm 1 as is where is
98298 RUDOLPH MP1-300 Film thickness measurement 300 mm 31.05.2007 1 as is where is


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