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SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
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108174 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | ||||
108175 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | ||||
108176 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | ||||
108177 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | ||||
108180 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | ||||
108181 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | ||||
108182 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | ||||
108183 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is |