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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 106663 | HITACHI | IS3000SE | WAFER PARTICLE INSPECTION | 300 mm | 01.06.2006 | 1 | as is where is | |
| 109555 | Hitachi | IS3000 | DARK FIELD INSPECTION | 300 mm | 01.05.2007 | 1 | as is where is | |
| 106701 | LAM | TORUS300K | DRY Bevel Etcher | 300 mm | 01.06.2006 | 1 | as is where is | |
| 111379 | Leica | INS3000 | Defect Inspection | 1 | as is where is | immediately | ||
| 103552 | RORZE | RASS300F | Wafer Sorter / 4Foup type | 300 mm | 31.05.2006 | 1 | as is where is | |
| 100932 | RUDOLPH | S3000A | Focused Beam Ellipsometer | 200 mm | 31.05.2012 | 1 | as is where is | |
| 110759 | Rudolph | S300 Ultra II | METROLOGY | 300 mm | 1 | as is where is | immediately | |
| 110795 | Rudolph | S300D Ultra II | Thin Film Measurement Tool / Ellipsometer | 300 mm | 01.05.2005 | 1 | as is where is | immediately |
| 106721 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2010 | 1 | as is where is | |
| 106722 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2011 | 1 | as is where is | |
| 106723 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 1 | as is where is | ||
| 106724 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2011 | 1 | as is where is | |
| 106725 | RUDOLPH | S3000S | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2010 | 1 | as is where is | |
| 106726 | RUDOLPH | S3000S | FBE(focused beam laser ellipsometry) | 300 mm | 1 | as is where is |