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SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
---|---|---|---|---|---|---|---|---|
100668 | Advantest | V3300 | Memory Tester | TEST | 1 | as is where is | ||
108431 | KLA | VisEdge CV300R | Edge Defect | 300 mm | 1 | as is where is | ||
103547 | ONTO | WV320 | MACRO INSPECTING | 300 mm | 31.05.2004 | 1 | as is where is | |
108865 | RIGAKU | V300 | Total Reflection Xray Fluoroescence Spectrometer | 1 | inquire | |||
108587 | RUDOLPH | WV320 | Wafer Inspection System | 300mm | 1 | as is where is | immediately | |
106731 | RUDOLPH | WV320 | Macro Inspection | 300 mm | 01.06.2006 | 1 | as is where is | |
106734 | RUDOLPH | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
106735 | RUDOLPH | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
108507 | TEL Tokyo Electron | Tactras Vesta NV3 | Polysilicon Etch | 300 mm | 1 | as is where is | ||
108508 | TEL Tokyo Electron | Tactras Vesta NV3 | Polysilicon Etch | 300 mm | 1 | as is where is |