Please find below a list of Used Probers for sale by fabsurplus.com .Click on any listed Prober to see further data.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 109540 | Accretech | UF3000 | Prober | 300 mm | 01.05.2005 | 9 | as is where is | immediately | |
| 116802 | Accretech | AP3000e | Prober, Tri-temperature POGO type for 93K | 300 MM | 2 | inquire | |||
| 116803 | Accretech | UF3000EXE | Prober, Tri-Temperature DD Combo | 300 MM | 2 | inquire | |||
| 118848 | Accretech | UF200 | Prober | 200 MM | 1 | inquire | |||
| 118849 | Accretech | APM-90A | Prober | 200 MM | 5 | inquire | |||
| 118860 | Accretech | MHF6000 ( for UF3000 ) | Hinge | TEST | 3 | inquire | |||
| 118861 | Accretech | MHF300 ( for UF200 ) | Hinge | TEST | 1 | inquire | |||
| 109571 | Accretech / TSK | UF3000 | Fully Automated Prober | 300 mm | 01.05.2009 | 9 | as is where is | immediately | |
| 111475 | Accretech / TSK | UF200A | Fully Automatic Prober | 200 mm | 01.06.2005 | 15 | as is where is | immediately | |
| 116901 | Accretech /TSK | UF200A | Prober | 8 INCH | 1 | as is where is | |||
| 116902 | Accretech /TSK | UF3000 | Prober | 12 INCH | 1 | as is where is | |||
| 54226 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 7 | as is where is | immediately | |
| 95398 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
| 95399 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
| 95400 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
| 95401 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
| 95402 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
| 95403 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
| 116752 | Accretech TSK | UF3000EXe | Fully automated Prober | Prober | 01.06.2018 | 9 | as is where is | immediately | |
| 111608 | Accretech/TSK | UF200 | Production Wafer Prober | 200mm | 3 | as is where is | |||
| 116553 | Advantest | M6242 | Test Handler | TEST | 01.12.2012 | 1 | as is where is | ||
| 108726 | ALESSI | REL-4500 | Analytical Wafer Prober with 6" (dia.) Gold Plated Chuck | 150 mm | 1 | inquire | immediately | ||
| 108798 | ALESSI | REL- Series 5000 | Analytical Prober with Mitutoyo FS-70 Zoom Microscope with LWD Objective Lenses, New Wave QuikLaze 532/355 Laser with 50X Lens, Missing Computer | 1 | inquire | ||||
| 108799 | ALESSI | REL-4100A | Analytical Prober | 1 | inquire | ||||
| 112642 | Alessi | REL | Prober | 100 mm | 1 | as is where is | |||
| 108976 | Cascade | Summit 12000 | Semi-automatic probe station with Shield Box, Temptronic thermal chuck -65C to 200 C | 200 mm | 01.06.2005 | 1 | as is where is | immediately | |
| 109579 | Cascade Microtech | Summit 11000M | Prober | 200 mm | 1 | as is where is | immediately | ||
| 110700 | Cascade Microtech | Summit 12000B-HS | Manual Prober with isolation table and heated chuck | 150 mm | 01.11.2009 | 6 | as is where is | immediately | |
| 112677 | Cascade Microtech | M150 | Prober | 1 | as is where is | ||||
| 112678 | Cascade Microtech | REL-3200 | Prober | 1 | as is where is | ||||
| 78132 | Electroglas | Horizon 4085X | Fully Automatic Prober with Optem microscope and an inker | 125 mm, 150 mm and 200 mm | 01.01.1998 | 1 | as is where is | immediately | |
| 116555 | JT Corp | JLS-3000 | Test Handler | TEST | 01.12.2020 | 1 | as is where is | ||
| 108835 | KARL SUSS | PM-8 | Analytical Wafer Prober | 1 | inquire | ||||
| 112776 | Karl Suss | PM5 | Prober | 1 | as is where is | ||||
| 112777 | Karl Suss | PM5 Type: 0577065 | Prober | 150 mm | 1 | as is where is | |||
| 112778 | Karl Suss | SOM4 | Prober | 1 | as is where is | ||||
| 113077 | KARL SUSS | PM8 | Prober | 200 mm | 01.06.1996 | 1 | as is where is | ||
| 106915 | Karl Suss Micro Tec | PA-200 | Wafer Prober Station | 01.06.2001 | 1 | as is where is | immediately | ||
| 86304 | KLA | 1007 (Spares) | Chuck, prober, 6" gold chuck assembly | 150 mm | 1 | as is where is | immediately | ||
| 113787 | KLA | 1007 | Wafer Prober | 150 mm | 01.06.1995 | 1 | as is where is | immediately | |
| 113788 | KLA | 1007 | Wafer Prober | 150 mm | 1 | as is where is | immediately | ||
| 113789 | KLA | 1007 | Wafer Prober | 150 mm | 01.06.1995 | 1 | as is where is | immediately | |
| 113790 | KLA | 1007 | Wafer Prober | 150 mm | 01.06.1995 | 1 | as is where is | immediately | |
| 71902 | Microcontrol | MWE 200 Plus | UV Wafer Eraser with cassette loading | 200 mm , 150 mm, 125 mm | 01.05.2000 | 1 | as is where is | immediately | |
| 108580 | Micromanipulator | Probe Station 1 | Manual Prober with hot and cold chuck | 200 mm | 1 | as is where is | immediately | ||
| 108847 | MICRONICS JAPAN CO. | MP-10 | Manual Probe Station with B&L StereoZoom 7 Microscope & 2ea Micropositioners | 1 | inquire | ||||
| 116969 | Microsense | USM-100 | Wafer Electrical test / Prober | 150 mm | 01.06.2010 | 1 | as is where is | immediately | |
| 116557 | Mirae | M500HT | Test Handler | TEST | 01.06.2013 | 1 | as is where is | ||
| 108588 | SEMICS | OPUS2 | FULLY AUTOMATED PROBER | 300mm | 01.06.2007 | 1 | as is where is | immediately | |
| 108589 | SEMICS | OPUS2 | FULLY AUTOMATED PROBER | 300mm | 01.06.2007 | 1 | as is where is | immediately | |
| 108590 | SEMICS | OPUS2 | FULLY AUTOMATED PROBER | 300mm | 01.06.2007 | 1 | as is where is | immediately | |
| 108591 | SEMICS | OPUS2 | FULLY AUTOMATED PROBER | 300mm | 01.06.2007 | 1 | as is where is | immediately | |
| 108592 | SEMICS | OPUS3 | FULLY AUTOMATED PROBER | 300mm | 01.06.2011 | 1 | as is where is | immediately | |
| 108593 | SEMICS | OPUS3 | FULLY AUTOMATED PROBER | 300mm | 01.06.2011 | 1 | as is where is | immediately | |
| 116562 | SEMICS | OPUS3 SH | Fully automated wafer prober | 300 mm | 01.01.2020 | 1 | as is where is | immediately | |
| 112935 | Signatone | S 463-E | Prober | 1 | as is where is | ||||
| 112936 | Signatone | S-250-5 | Prober | 1 | as is where is | ||||
| 112937 | Signatone | S-250-6 | Prober | 1 | as is where is | ||||
| 112938 | Signatone | S-465 | Prober | 1 | as is where is | ||||
| 116979 | SIGNATONE | 1160 | Manual Probe Station | up to 200 mm | 01.06.2012 | 1 | as is where is | immediately | |
| 111449 | SUSS Microtec | MCS8 + SBS6 Gen 2 + DB12T + SD12 | Spin Coater + Wafer Bonder + Debonder _ Debonded wafer Cleaner | 200 mm | 01.09.2022 | 1 | as is where is | immediately | |
| 106290 | TEL TOKYO ELECTRON | P-8XL | Prober | 200 mm | 1 | as is where is | immediately | ||
| 106291 | TEL TOKYO ELECTRON | P-8 | Prober | 200 mm | 1 | as is where is | immediately | ||
| 106292 | TEL TOKYO ELECTRON | P-12XLm | Prober | 300 mm | 4 | as is where is | immediately | ||
| 106293 | TEL TOKYO ELECTRON | P-12XLm | Prober | 300 mm | 01.06.2006 | 1 | as is where is | immediately | |
| 108599 | TEL TOKYO ELECTRON | P12XLM | Prober | 300 mm | 01.05.2006 | 1 | inquire | immediately | |
| 108603 | TEL Tokyo Electron | P12XLM | Prober | 300 mm | 01.05.2006 | 1 | as is where is | immediately | |
| 108604 | TEL TOKYO ELECTRON | Precio Nano | FULLY AUTOMATED PROBER | 300 mm | 01.06.2012 | 1 | as is where is | immediately | |
| 108614 | TEL Tokyo Electron | P8XL | Fully Automated Prober | 200 mm | 01.06.2001 | 1 | as is where is | immediately | |
| 109548 | TEL Tokyo Electron | P12XL | Automatic Prober | 300 mm | 01.06.2005 | 63 | as is where is | immediately | |
| 111530 | TEL Tokyo Electron | P-12XL | Fully Automatic Prober | 300 mm | 01.06.2005 | 5 | as is where is | ||
| 111531 | TEL Tokyo Electron | P-12XL | Fully Automatic Prober | 300 mm | 01.06.2002 | 1 | as is where is | ||
| 111532 | TEL Tokyo Electron | P-12XL | Fully Automatic Prober | 300 mm | 01.06.2004 | 1 | as is where is | ||
| 111533 | TEL Tokyo Electron | P-12XL | Fully Automatic Prober | 300 mm | 01.06.2006 | 1 | as is where is | ||
| 111534 | TEL Tokyo Electron | P-12XL | Fully Automatic Prober | 300 mm | 01.06.2001 | 1 | as is where is | ||
| 111535 | TEL Tokyo Electron | P-12XLM | Fully Automatic Prober | 300 mm | 01.06.2006 | 1 | as is where is | ||
| 111536 | TEL Tokyo Electron | P-12XLM | Fully Automatic Prober | 300 mm | 01.06.2005 | 1 | as is where is | ||
| 118794 | TEL TOKYO ELECTRON | P8 | PROBER | 200 mm | 1 | as is where is | |||
| 118795 | TEL TOKYO ELECTRON | P8 | PROBER | 200 mm | 1 | as is where is | |||
| 118796 | TEL TOKYO ELECTRON | P-8XL | Fully Automatic Prober | 200 mm | 1 | as is where is | |||
| 118797 | TEL TOKYO ELECTRON | P-8XL | Fully Automatic Prober | 200 mm | 1 | as is where is | |||
| 118798 | TEL TOKYO ELECTRON | P-8XL | Fully Automatic Prober | 200 mm | 1 | as is where is | |||
| 118799 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118800 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118801 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118802 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118803 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118804 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118805 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118806 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118807 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118808 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118809 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118810 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118811 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118812 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118813 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118814 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118815 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118816 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118817 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118818 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118819 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118820 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118821 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118822 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118823 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118824 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118825 | TEL TOKYO ELECTRON | P-12XL | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
| 118850 | TEL TOKYO ELECTRON | P12XLn | Prober (Missing Parts) | 300 MM | 1 | inquire | |||
| 117064 | Tokyo Electron | P-12XLm | Prober | 300mm | 1 | as is where is | |||
| 117065 | Tokyo Electron | P-12XLm | Prober | 300mm | 1 | as is where is | |||
| 116481 | Ultracision | 860 | Manual Prober | 200 mm | 1 | as is where is | immediately | ||
| 112984 | Wentworth Labs | AWP 1050 ATC | Prober | 150 mm | 1 | as is where is | |||
| 112985 | Wentworth Labs | MP0901 | Prober | 1 | as is where is |