Please find below a list of Used Probers for sale by fabsurplus.com .Click on any listed Prober to see further data.
SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
---|---|---|---|---|---|---|---|---|---|
109540 | Accretech | UF3000 | Prober | 300 mm | 01.05.2005 | 9 | as is where is | immediately | |
113345 | ACCRETECH | UF3000EXE | Tri-temp Prober | 300 MM | 1 | inquire | |||
109571 | Accretech / TSK | UF3000 | Fully Automated Prober | 300 mm | 01.05.2009 | 9 | as is where is | immediately | |
111446 | Accretech / TSK | FP2000 | Prober | 200 mm | 01.03.2023 | 1 | as is where is | immediately | |
111448 | Accretech / TSK | UF2000 | Fully Automatic Prober | 200 mm | 01.06.2020 | 2 | as is where is | immediately | |
111475 | Accretech / TSK | UF200A | Fully Automatic Prober | 200 mm | 01.06.2005 | 15 | as is where is | immediately | |
113333 | Accretech / TSK | UF3000 | Prober with Ambient and hot (Up to 150 C) | 300 mm | 01.06.2010 | 6 | as is where is | immediately | |
113334 | Accretech / TSK | UF3000Exe | Prober with Ambient and hot (Up to 150 C) | 300 mm | 01.06.2010 | 1 | as is where is | immediately | |
54226 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 7 | as is where is | immediately | |
95398 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
95399 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
95400 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
95401 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
95402 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
95403 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
111608 | Accretech/TSK | UF200 | Production Wafer Prober | 200mm | 3 | as is where is | |||
114042 | Accretech/TSK | UF3000EX-i5 | Production Wafer Prober | 300 mm | 1 | as is where is | |||
115456 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115457 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115458 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115459 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115460 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115461 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115462 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115463 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115464 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115465 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115466 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115467 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115468 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115469 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115470 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115471 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115472 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115473 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115474 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115475 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115476 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115477 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115478 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115479 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115480 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115481 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115482 | Accretech/TSK | UF3000EX | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
115483 | Accretech/TSK | UF3000EX-i5 | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
108726 | ALESSI | REL-4500 | Analytical Wafer Prober with 6" (dia.) Gold Plated Chuck | 150 mm | 1 | inquire | immediately | ||
108798 | ALESSI | REL- Series 5000 | Analytical Prober with Mitutoyo FS-70 Zoom Microscope with LWD Objective Lenses, New Wave QuikLaze 532/355 Laser with 50X Lens, Missing Computer | 1 | inquire | ||||
108799 | ALESSI | REL-4100A | Analytical Prober | 1 | inquire | ||||
112642 | Alessi | REL | Prober | 100 mm | 1 | as is where is | |||
108976 | Cascade | Summit 12000 | Semi-automatic probe station with Shield Box, Temptronic thermal chuck -65C to 200 C | 200 mm | 01.06.2005 | 1 | as is where is | immediately | |
115675 | Cascade | PM8 | Engineering Wafer Prober | 200 mm | 1 | as is where is | |||
115743 | Cascade | Alessi REL-4800 | Engineering Wafer Prober | 200 mm | 1 | as is where is | |||
115744 | Cascade | Summit 12000 | Engineering Wafer Prober | 200 mm | 1 | as is where is | |||
109579 | Cascade Microtech | Summit 11000M | Prober | 200 mm | 1 | as is where is | immediately | ||
110700 | Cascade Microtech | Summit 12000B-HS | Manual Prober with isolation table and heated chuck | 150 mm | 01.11.2009 | 6 | as is where is | immediately | |
112677 | Cascade Microtech | M150 | Prober | 1 | as is where is | ||||
112678 | Cascade Microtech | REL-3200 | Prober | 1 | as is where is | ||||
78132 | Electroglas | Horizon 4085X | Fully Automatic Prober with Optem microscope and an inker | 125 mm, 150 mm and 200 mm | 01.01.1998 | 1 | as is where is | immediately | |
114302 | Electroglas | 3001X Prober | 200 mm | 1 | as is where is | ||||
108835 | KARL SUSS | PM-8 | Analytical Wafer Prober | 1 | inquire | ||||
110619 | KARL SUSS | PA200HS | Prober | 200 mm | 1 | as is where is | |||
112776 | Karl Suss | PM5 | Prober | 1 | as is where is | ||||
112777 | Karl Suss | PM5 Type: 0577065 | Prober | 150 mm | 1 | as is where is | |||
112778 | Karl Suss | SOM4 | Prober | 1 | as is where is | ||||
113077 | KARL SUSS | PM8 | Prober | 200 mm | 01.06.1996 | 1 | as is where is | ||
106915 | Karl Suss Micro Tec | PA-200 | Wafer Prober Station | 01.06.2001 | 1 | as is where is | immediately | ||
86304 | KLA | 1007 | Chuck, prober, 6" gold chuck assembly | 200 mm | 1 | inquire | immediately | ||
113787 | KLA | 1007 | Wafer Prober | 150 mm | 1 | as is where is | |||
113788 | KLA | 1007 | Wafer Prober | 150 mm | 1 | as is where is | |||
113789 | KLA | 1007 | Wafer Prober | 150 mm | 1 | as is where is | |||
113790 | KLA | 1007 | Wafer Prober | 150 mm | 1 | as is where is | |||
71902 | Microcontrol | MWE Plus | UV Wafer Eraser with cassette loading | 200 mm , 150 mm, 125 mm | 01.05.2000 | 1 | as is where is | immediately | |
108580 | Micromanipulator | Probe Station 1 | Manual Prober with hot and cold chuck | 200 mm | 1 | as is where is | immediately | ||
115988 | Micromanipulator (MM) | P300J | Engineering Wafer Prober | 200 mm | 1 | as is where is | |||
108847 | MICRONICS JAPAN CO. | MP-10 | Manual Probe Station with B&L StereoZoom 7 Microscope & 2ea Micropositioners | 1 | inquire | ||||
115991 | MPI | TS-2500 series | Fully Automatic Prober | 200 mm | 1 | as is where is | |||
115992 | MPI Corporation | TS-2500 series | Fully Automatic Prober | 200 mm | 1 | as is where is | |||
106740 | SECRON | IP 300 | Prober | 300 mm | 1 | as is where is | |||
108588 | SEMICS | OPUS2 | FULLY AUTOMATED PROBER | 300mm | 01.06.2007 | 1 | as is where is | immediately | |
108589 | SEMICS | OPUS2 | FULLY AUTOMATED PROBER | 300mm | 01.06.2007 | 1 | as is where is | immediately | |
108590 | SEMICS | OPUS2 | FULLY AUTOMATED PROBER | 300mm | 01.06.2007 | 1 | as is where is | immediately | |
108591 | SEMICS | OPUS2 | FULLY AUTOMATED PROBER | 300mm | 01.06.2007 | 1 | as is where is | immediately | |
108592 | SEMICS | OPUS3 | FULLY AUTOMATED PROBER | 300mm | 01.06.2011 | 1 | as is where is | immediately | |
108593 | SEMICS | OPUS3 | FULLY AUTOMATED PROBER | 300mm | 01.06.2011 | 1 | as is where is | immediately | |
113336 | SEMICS | OPUS 2 | Prober with Ambient and hot (Up to 150 C) | 300 mm | 01.06.2010 | 2 | as is where is | immediately | |
113337 | SEMICS | OPUS 3 | Prober with Ambient and hot (Up to 150 C) | 300 mm | 01.06.2010 | 2 | as is where is | immediately | |
112935 | Signatone | S 463-E | Prober | 1 | as is where is | ||||
112936 | Signatone | S-250-5 | Prober | 1 | as is where is | ||||
112937 | Signatone | S-250-6 | Prober | 1 | as is where is | ||||
112938 | Signatone | S-465 | Prober | 1 | as is where is | ||||
114348 | Signatone | CM-465-22 | Wafer Prober | N/A | 1 | as is where is | |||
114349 | Signatone | S-M90 | Wafer Prober | N/A | 1 | as is where is | |||
71904 | ST Automation | test head | test head for Eprom U 1835 | 1 | as is where is | ||||
111449 | SUSS Microtec | MCS8 + SBS6 Gen 2 + DB12T + SD12 | Spin Coater + Wafer Bonder + Debonder _ Debonded wafer Cleaner | 200 mm | 01.09.2022 | 1 | as is where is | immediately | |
106290 | TEL TOKYO ELECTRON | P-8XL | Prober | 200 mm | 1 | as is where is | immediately | ||
106291 | TEL TOKYO ELECTRON | P-8 | Prober | 200 mm | 1 | as is where is | immediately | ||
106292 | TEL TOKYO ELECTRON | P-12XLm | Prober | 300 mm | 4 | as is where is | immediately | ||
106293 | TEL TOKYO ELECTRON | P-12XLm | Prober | 300 mm | 01.06.2006 | 1 | as is where is | immediately | |
108599 | TEL TOKYO ELECTRON | P12XLM | Prober | 300 mm | 01.05.2006 | 1 | inquire | immediately | |
108603 | TEL Tokyo Electron | P12XLM | Prober | 300 mm | 01.05.2006 | 1 | as is where is | immediately | |
108604 | TEL TOKYO ELECTRON | Precio Nano | FULLY AUTOMATED PROBER | 300 mm | 01.06.2012 | 1 | as is where is | immediately | |
108614 | TEL Tokyo Electron | P8XL | Fully Automated Prober | 200 mm | 01.06.2001 | 1 | as is where is | immediately | |
109548 | TEL Tokyo Electron | P12XL | Automatic Prober | 300 mm | 01.06.2005 | 63 | as is where is | immediately | |
110639 | TEL Tokyo Electron | P-12XL | Prober | 300 mm | 1 | as is where is | |||
110640 | TEL Tokyo Electron | P-12XL | prober | 300 mm | 1 | as is where is | |||
111530 | TEL Tokyo Electron | P-12XL | Fully Automatic Prober | 300 mm | 01.06.2005 | 5 | as is where is | ||
111531 | TEL Tokyo Electron | P-12XL | Fully Automatic Prober | 300 mm | 01.06.2002 | 1 | as is where is | ||
111532 | TEL Tokyo Electron | P-12XL | Fully Automatic Prober | 300 mm | 01.06.2004 | 1 | as is where is | ||
111533 | TEL Tokyo Electron | P-12XL | Fully Automatic Prober | 300 mm | 01.06.2006 | 1 | as is where is | ||
111534 | TEL Tokyo Electron | P-12XL | Fully Automatic Prober | 300 mm | 01.06.2001 | 1 | as is where is | ||
111535 | TEL Tokyo Electron | P-12XLM | Fully Automatic Prober | 300 mm | 01.06.2006 | 1 | as is where is | ||
111536 | TEL Tokyo Electron | P-12XLM | Fully Automatic Prober | 300 mm | 01.06.2005 | 1 | as is where is | ||
114196 | TEL Tokyo Electron | Precio | Production Wafer Prober | 300 mm | 1 | as is where is | |||
114197 | TEL Tokyo Electron | Precio | Production Wafer Prober | 300 mm | 1 | as is where is | |||
116252 | TEL Tokyo Electron | Cellcia | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
116253 | TEL Tokyo Electron | Cellcia | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
116254 | TEL Tokyo Electron | Cellcia | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
116255 | TEL Tokyo Electron | Cellcia | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
116256 | TEL Tokyo Electron | Cellcia | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
116257 | TEL Tokyo Electron | Cellcia | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
116258 | TEL Tokyo Electron | Cellcia | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
116259 | TEL Tokyo Electron | Cellcia | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
116260 | TEL Tokyo Electron | Cellcia | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
116261 | TEL Tokyo Electron | Cellcia | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
116336 | TEL Tokyo Electron | P-8XL | Fully Automatic Prober | 200 mm | 1 | as is where is | |||
116337 | TEL Tokyo Electron | P-8XL | Fully Automatic Prober | 200 mm | 1 | as is where is | |||
116338 | TEL Tokyo Electron | P-8XL | Fully Automatic Prober | 200 mm | 1 | as is where is | |||
116339 | TEL Tokyo Electron | P-8XL | Fully Automatic Prober | 200 mm | 1 | as is where is | |||
116340 | TEL Tokyo Electron | P-8XL | Fully Automatic Prober | 200 mm | 1 | as is where is | |||
116341 | TEL Tokyo Electron | P-8XL | Fully Automatic Prober | 200 mm | 1 | as is where is | |||
116342 | TEL Tokyo Electron | P-8XL | Fully Automatic Prober | 200 mm | 1 | as is where is | |||
116343 | TEL Tokyo Electron | P-8XL | Fully Automatic Prober | 200 mm | 1 | as is where is | |||
116344 | TEL Tokyo Electron | P-8XL | Fully Automatic Prober | 200 mm | 1 | as is where is | |||
116345 | TEL Tokyo Electron | P-8XL | Fully Automatic Prober | 200 mm | 1 | as is where is | |||
116346 | TEL Tokyo Electron | P-8XL | Fully Automatic Prober | 200 mm | 1 | as is where is | |||
116347 | TEL Tokyo Electron | P-8XL | Fully Automatic Prober | 200 mm | 1 | as is where is | |||
116348 | TEL Tokyo Electron | P-8XL | Fully Automatic Prober | 200 mm | 1 | as is where is | |||
116349 | TEL Tokyo Electron | P-8XL | Fully Automatic Prober | 200 mm | 1 | as is where is | |||
116350 | TEL Tokyo Electron | P-8XL | Fully Automatic Prober | 200 mm | 1 | as is where is | |||
116351 | TEL Tokyo Electron | Precio | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
116352 | TEL Tokyo Electron | Precio | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
116353 | TEL Tokyo Electron | Precio | Fully Automatic Prober | 300 mm | 1 | as is where is | |||
116481 | Ultracision | 860 | Manual Prober | 200 mm | 1 | as is where is | immediately | ||
112984 | Wentworth Labs | AWP 1050 ATC | Prober | 150 mm | 1 | as is where is | |||
112985 | Wentworth Labs | MP0901 | Prober | 1 | as is where is |