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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 100668 | Advantest | V3300 | Memory Tester | TEST | 1 | as is where is | |||
| 115495 | Akrion | V3 | Wet Wafer Processing System | 200 mm | 1 | as is where is | |||
| 103547 | ONTO | WV320 | MACRO INSPECTING | 300 mm | 31.05.2004 | 1 | as is where is | ||
| 108865 | RIGAKU | V300 | Total Reflection Xray Fluoroescence Spectrometer | 1 | inquire | ||||
| 113156 | RUDOLPH | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | immediately | ||
| 113157 | RUDOLPH | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | immediately | ||
| 108587 | RUDOLPH | WV320 | Wafer Inspection System | 300mm | 1 | as is where is | immediately | ||
| 106731 | RUDOLPH | WV320 | Macro Defect Inspection | 300 mm | 01.06.2006 | 1 | as is where is | immediately | |
| 108507 | TEL Tokyo Electron | Tactras Vesta NV3 | Polysilicon Etch | 300 mm | 1 | as is where is | |||
| 108508 | TEL Tokyo Electron | Tactras Vesta NV3 | Polysilicon Etch | 300 mm | 1 | as is where is | |||
| 113943 | WATKINS JOHNSON | WJ999 TEOS V3.5 | TEOS APCVD FOR USG / PSG AND BPSG | 150 mm | 01.06.1996 | 1 | as is where is | immediately | |
| 113944 | WATKINS JOHNSON | WJ999 TEOS V3.47R | TF BPSG - APCVD BPSG | 150 mm | 01.06.2000 | 1 | as is where is | immediately |