Buy and Sell Semiconductor, Assembly, Test and SMT Equipment at fabsurplus.com
SDI-Fabsurplus.com is pleased to present the following refurbished and reconditioned KLA and KLA-Tencor equipment for immediate sale. Equipment is supplied re-conditioned and demonstrated to OEM specifications at our Avezzano tech centre, located near Rome in Italy.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q.ty | Sales Cond. | Lead Time | Att. |
|---|---|---|---|---|---|---|---|---|---|
| 1680 | KLA TENCOR | 2132 | bright-field WAFER INSPECTION | 200 mm | 01.08.1995 | 1 | inquire | immediately | 40 |
| 9991 | KLA TENCOR | RS 55 | Resistivity Mapping Tool | 100mm - 200 mm | 01.06.1991 | 1 | as is all rebuilt | immediately | 3 |
| 15493 | KLA Tencor | Surfscan 7700 | Patterned Wafer Surface Inspection Tool | 200 mm | 01.06.1997 | 1 | inquire | immediately | 4 |
| 17831 | KLA TENCOR | 2135 | Defect Metrology | 200mm | 1 | 1 | |||
| 21834 | KLA TENCOR | 6200 | bare wafer surface inspection | 200 MM | 2 | inquire | immediately | 0 | |
| 21343 | KLA Tencor | AIT 2 + Fusion | Patterned and unpatterened wafer inspection | 200 mm | 01.06.2005 | 1 | inquire | immediately | 2 |
| 21345 | KLA Tencor | AIT 2 + FUSION | Wafer inspection System | 200 MM | 01.06.2005 | 1 | inquire | immediately | 2 |
| 21853 | KLA TENCOR | 6200 | wafer surface inspection | 150 MM AND 200 MM | 01.03.1993 | 1 | inquire | immediately | 3 |
| 21962 | KLA Tencor | Stealth | Defect Inspection | 200 MM | 1 | inquire | immediately | 0 | |
| 34062 | KLA TENCOR | 2135 | Bight field wafer inspection | 200mm | 1 | as is where is | immediately | 10 | |
| 33935 | KLA TENCOR | QUANTOX 64100 | Metrology | 200mm | 1 | as is where is | 0 | ||
| 15563 | KLA-TENCOR | 8100XP | CD SEM WITH SMIF | 100-200 MM | 01.07.2001 | 1 | as is where is | immediately | 0 |
| 15564 | KLA-TENCOR | 8100XP | CD SEM SMIF FITTED | 100-200 MM | 01.11.1998 | 1 | as is where is | immediately | 0 |
| 16441 | KLA-TENCOR | 2132 | Patterned wafer brightfield defect inspection | 200 mm | 1 | as is where is | immediately | 0 | |
| 17464 | KLA-TENCOR | 2550 | WAFER INSPECTION COMPUTER | facilities | 01.02.1992 | 1 | as is where is | immediately | 0 |
| 20142 | KLA-Tencor | Viper 2401 | MACRO DEFECT INSPECTION SYSTEM | 150 MM | 01.12.1998 | 1 | inquire | immediately | 5 |
| 20480 | KLA-TENCOR | 6220 | WAFER INSPECTION | 2 to 8 inch | 1 | inquire | immediately | 0 | |
| 21857 | KLA-TENCOR | AIT | WAFER SURFACE PARTICLE INSPECTION SYSTEM | 125-200 MM | 1 | as is where is | immediately | 0 | |
| 22719 | KLA-Tencor | Surfscan SP-1 Classic | Wafer Surface Inspection System | Multiple | 01.06.2002 | 1 | inquire | 2 weeks | 8 |
| 23203 | KLA-TENCOR | 6220 | SURFSCAN BARE | 200 mm | 01.02.1999 | 1 | inquire | immediately | 0 |
| 26160 | KLA-TENCOR | 2139 | WAFER INSPECTION SYSTEM | 200 mm | 01.05.1996 | 1 | inquire | immediately | 1 |
| 26158 | KLA-TENCOR | 2139 | WAFER INSPECTION SYSTEM | 200 mm | 01.05.1996 | 1 | inquire | immediately | 1 |
| 26138 | KLA-TENCOR | 2139 | WAFER INSPECTION | 150 mm | 01.01.2001 | 1 | inquire | immediately | 1 |
| 26574 | KLA-Tencor | 2135 XP | BRIGHTFIELD WAFER DEFECT INSPECTION | 200 mm | 01.09.1996 | 1 | as is where is | immediately | 9 |
| 27789 | KLA-Tencor | SP1 TBI | unpatterned wafer surface inspecion system | 200 and 300 mm | 01.06.2000 | 1 | inquire | immediately | 1 |
| 27796 | KLA-Tencor | Surfscan SP-1 Classic | Wafer Surface Inspection System | Multiple | 01.03.1997 | 1 | inquire | 2 weeks | 2 |
| 30512 | THERMAWAVE | THERMA-PROBE 630XP | IMPLANT MONITOR | 200 mm and 300 mm | 01.06.2005 | 1 | as is where is | immediately | 0 |
click here to Search again for used semiconductor equipment