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FEI Tecnai G2 F30 TEM electron microscope for Sale


SDI fabsurplus.com is pleased to announce the availability of the following listed used FEI Tecnai G2 F30 TEM electron microscope.
Please click on the "Send More Details" button at the end of the Tecnai G2 F30 description, if you'd like to get more details, photos and specifications of this TEM electron microscope, and your request for this equipment will be forwarded to our SDI sales representatives automatically.
This FEI Tecnai G2 F30 TEM electron microscope is available for immediate sale.
Crating, refurbishment and delivery for this equipment can be quoted on request.


FEI Tecnai G2 F30 Equipment Details

SDI ID: 103436
Manufacturer: FEI
Model: Tecnai G2 F30
Description: TEM electron microscope
Version: Laboratory
Vintage: 01.06.2005
Quantity: 1
Sales Condition: as is where is
Lead Time: immediately
Sales Price: Inquire
Comments:

Services included:-

1. We will show you the tool working in the laboratory at current location.
2. Deinstall tool.
3. Move out of tool.
4. Crating
5. Ship Via air to Switzerland.

Here are some photos of an FEI Tecnai G2-F30 for sale.
The system is still in operation.
It includes LN2 system, Chiller ,external load bench(FEI original) and HT tank.


Essential specifications
Electron source
• Flexible high tension (50, 100, 150, 200, 250, 300 kV and values in between)
• Schottky Field emitter with high maximum beam current ( 100 nA)
• High probe current (0.6 nA in a 1 nm spot, 15 nA in a 10 nm spot)
• Small energy spread (0.8 eV or less)
• Spot drift 1 nm/minute

Imaging

• Patented TWIN, S-TWIN and U-TWIN objective lenses
• Coma-free alignment for high resolution objective-lens centering
• Ranged, rotation-free magnification and diffraction series
• Magnification reproducible within ± 1.5%
• Embedded CCD/energy filter
• Lorentz lens for field free imaging for magnetic field visualization (optional)

STEM

• Fully digital scan system
• Bright Field and Annular Dark Field mode
• High resolution STEM with HAADF detector

Microanalysis

• Excellent EDX in-hole performance ( 1% hole count)
• Low system background in EDX ( 1% spurious peaks)
• High P/B ratio (Fiori number) 4000
• Embedding of EDX, PEELS and energy filter
• Spectrum imaging with multiple detectors

Specimen stage

• Fully computer-controlled, eucentric side-entry, high stability CompuStage
• Maximized tilts for any X,Y,Z, α and β combination
• Choice of a variety of specimen holders
• X, Y movement ± 1 mm, Z movement ± 0.375 mm; specimen size 3 mm
• Specimen recall reproducibility: ≤ 0.3 μm (after movement of 300 μm in x and y) and ≤ 0.1 (α tilt)
• Drift ≤ 0.5 nm/minute with a standard holder attainable

Vacuum

• Fully interlocked differentially pumped column
• Clean vacuum system with turbo molecular pump, prepumping column, gun and specimen airlock
• 150 l/s Ion Getter Pump on specimen area • Liner tubes pumped by additional Ion Getter Pump
• Ultra-high vacuum for contamination-free observation
• Vacuum levels: specimen chamber 2.7 × 10-5 Pa ; gun 5 × 10-7 Pa
• Fast airlock pumping times: user selectable down to 1 min
• Plate camera exchange without switching off high tension or emitter

Software and control

• Operations system: Windows® XP • Remote operation (optional)
• Motorized apertures (optional) • Scripting software (optional)
• Xplore3D™: FEIs intelligent tomography solution for TEM and STEM (optional)
• TrueImage: FEIs patented focal series acquisition and reconstruction software package (optional)

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The data provided herein is not an offer capable of acceptance.
The information contained on this page is, to our knowledge and information, accurate, but it may contain errors and therefore we do not warrant the completeness or accuracy of the information contained on this page.
Any offer by you to purchase the equipment described on this page shall be subject to our standard terms and conditions of sale.

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