| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 93848 | ACS | EOS35TC | Environmental chamber | 35 litres | 31.12.1998 | 1 | as is where is | immediately |
| 106773 | Brown & Sharpe | Reflex 454 | Coordinate measuring system | Lab | 01.06.1997 | 1 | as is where is | |
| 102949 | BRUKER | Quantax 200 | EDS | Laboratory | 1 | as is where is | ||
| 80083 | COLUSSI | UG 50 E | AUTOCLAVE FOR STERILIZATION | Laboratory | 01.06.2000 | 1 | as is where is | immediately |
| 101850 | ESPEC | EPL-4H | Reliability Oven | Reliability | 31.01.2014 | 1 | as is where is | immediately |
| 93961 | FEI | Altura | Dual beam FIB | 31.12.2003 | 1 | as is where is | immediately | |
| 103436 | FEI | Tecnai G2 F30 | TEM electron microscope | Laboratory | 01.05.2005 | 1 | as is where is | immediately |
| 106964 | FEI | Strata 400 | Dual Beam FIB SEM | Laboratory | 01.06.2006 | 1 | as is where is | immediately |
| 107000 | FEI | Sirion | FE SEM with e-beam lithography capability and EDX | up to 2.5 inch diameter | 01.06.2002 | 1 | as is where is | immediately |
| 106009 | FEI Company | FIB 200 | Single Beam FIB | 03.06.2003 | 1 | as is where is | ||
| 106004 | FEI ® | Quanta 200 3D | FIB/SEM dual beam | 31.05.2005 | 1 | as is where is | immediately | |
| 83585 | Hitachi | S5000H | Field Emission SEM | Laboratory | 1 | as is where is | immediately | |
| 95070 | Hitachi | S5000 | SEM Scanning Electron Microscope Hitachi S5000 with Noran 445A-3SES detector | Laboratory | 31.12.2013 | 1 | as is where is | immediately |
| 95934 | Hitachi | HD2300 | STEM (Scanning Transmission Electron Microscope) | Laboratory | 01.06.2006 | 1 | as is where is | immediately |
| 106061 | Hitachi | SU 8010 | Ultra High Resolution Field Emission Scanning Electron Microscope | 100 mm | 01.06.2007 | 1 | as is where is | immediately |
| 77264 | HOLADAY | HI-1801 | MICROWAVE SURVEY METER | Laboratory | 1 | as is where is | immediately | |
| 83989 | Jasco | FP 8500 | Fluorescence Spectrometer | Laboratory | 1 | as is where is | immediately | |
| 87627 | JEOL | JSM 6400 | Scanning Electron Microscope | 1 | as is where is | immediately | ||
| 102244 | JEOL | JEM3200FS | High Resolution TEM | Laboratory | 01.05.2006 | 1 | as is where is | immediately |
| 106898 | JEOL | JEM-2500SE | Transmission Electron Microscope | Laboratory | 1 | as is where is | immediately | |
| 102971 | LEICA | EM_TIC3X | Ion Beam MILLING SYSTEM FOR TEM SAMPLE PREPARATION | Laboratory | 31.05.2012 | 1 | as is where is | |
| 93413 | LEO | LEO 435VP | SEM | 1 | as is where is | |||
| 106788 | Mitutoyo | QVT1-X606P1L-D | quick vision apex cnc vision measuring machine | Lab | 01.06.2016 | 1 | as is where is | |
| 91860 | NICOLET | Magna 550 | FT-IR Spectrophotometer | Laboratory | 01.05.1993 | 1 | as is all rebuilt | immediately |
| 93404 | OLYMPUS | BX51TRF | Transmitted and Reflected Light Research Microscope | Laboratory | 31.10.2006 | 1 | inquire | immediately |
| 102579 | Oxford Instruments | X-Strata 980 | XRF Coating thickness and element analyzer | 31.08.2009 | 1 | as is where is | ||
| 106180 | Physical Electronics | PHI 680 | Auger Nanoprobe | Laboratory | 01.06.2005 | 1 | as is where is | immediately |
| 72930 | Seiko | SFT-3200 | Coating thickness Gauge Refurbished | Assembly | 1 | inquire | immediately | |
| 95377 | Sheffield | Endeavor | Coordinate Measurement Machine | 9.12.7 | 1 | as is where is | immediately | |
| 101851 | Thermo Fisher | OMH60-S | Ovens Heratherm | oven | 31.01.2012 | 6 | as is where is | immediately |
| 106040 | THERMO NICOLET | Continuum | Infra-Red Microscope / FTIR Analysis System | laboratory | 1 | as is where is | immediately | |
| 34526 | VARIAN | SPECTRAAA 400 | ATOMIC ABSORPTION MASS SPEC | 200mm | 1 | as is where is |