| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 93848 | ACS | EOS35TC | Environmental chamber | 35 litres | 01.01.1999 | 1 | as is where is | immediately |
| 102949 | BRUKER | Quantax 200 | EDS | Laboratory | 1 | as is where is | ||
| 80083 | COLUSSI | UG 50 E | AUTOCLAVE FOR STERILIZATION | Laboratory | 01.06.2000 | 1 | as is where is | immediately |
| 101850 | ESPEC | EPL-4H | Reliability Oven | Reliability | 01.02.2014 | 1 | as is where is | immediately |
| 93961 | FEI | Altura | Dual beam FIB | 01.01.2004 | 1 | as is where is | immediately | |
| 103436 | FEI | Tecnai G2 F30 | TEM electron microscope | Laboratory | 01.06.2005 | 1 | as is where is | immediately |
| 83585 | Hitachi | S5000H | Field Emission SEM | Laboratory | 1 | as is where is | immediately | |
| 93374 | Hitachi | S4700 | FIELD EMISSION SEM | Laboratory | 01.06.2004 | 1 | as is where is | immediately |
| 95070 | Hitachi | S5000 | SEM Scanning Electron Microscope Hitachi S5000 with Noran 445A-3SES detector | Laboratory | 01.01.2014 | 1 | as is where is | immediately |
| 97070 | Hitachi | S4800 | Field emission scanning electron microscope (FE-SEM) | Laboratory | 01.04.2004 | 1 | as is where is | immediately |
| 83989 | Jasco | FP 8500 | Fluorescence Spectrometer | Laboratory | 1 | as is where is | immediately | |
| 87627 | JEOL | JSM 6400 | Scanning Electron Microscope | 1 | as is where is | immediately | ||
| 102971 | LEICA | EM_TIC3X | Ion Beam MILLING SYSTEM FOR TEM SAMPLE PREPARATION | Laboratory | 01.06.2012 | 1 | as is where is | |
| 93413 | LEO | LEO 435VP | SEM | 1 | as is where is | |||
| 91860 | NICOLET | Magna 550 | FT-IR Spectrophotometer | Laboratory | 01.06.1993 | 1 | as is where is | immediately |
| 93404 | OLYMPUS | BX51TRF | Transmitted and Reflected Light Research Microscope | Laboratory | 01.11.2006 | 1 | inquire | immediately |
| 87614 | Optosystems | Ardis 100 | MW CVD Diamond | up to 100 mm | 01.04.2011 | 1 | as is where is | immediately |
| 102579 | Oxford Instruments | X-Strata 980 | XRF Coating thickness and element analyzer | 01.09.2009 | 1 | as is where is | ||
| 83940 | Philips | CM30 | Scanning Transmission Electron Microscope (TEM) | Laboratory | 01.06.1992 | 1 | as is where is | immediately |
| 72930 | Seiko | SFT-3200 | Coating thickness Gauge Refurbished | Assembly | 1 | inquire | immediately | |
| 95377 | Sheffield | Endeavor | Coordinate Measurement Machine | 9.12.7 | 1 | as is where is | immediately | |
| 84787 | TEMPTRONICS | X-Stream 4300 | TEMPERATURE FORCING SYSTEM | Facilities | 01.07.2006 | 2 | as is where is | immediately |
| 101851 | Thermo Fisher | OMH60-S | Ovens Heratherm | oven | 01.02.2012 | 6 | as is where is | immediately |
| 34526 | VARIAN | SPECTRAAA 400 | ATOMIC ABSORPTION MASS SPEC | 200mm | 1 | as is where is | ||
| 102057 | ZEISS | EVO 50 XVP | Scanning electron microscope, variable pressure | 01.01.2003 | 1 | as is where is |