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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 103225 | ADE | NanoMapper FA | Nano-Defects Inspection System | 300 mm | 1 | inquire | immediately | ||
| 114043 | ADE | AFS-3220 | Wafer Characterization | 300 mm | 1 | as is where is | |||
| 4247 | ADE | 020986-10 | 259.82 uM thickness standard | Spares | 1 | as is where is | immediately | ||
| 4249 | ADE | 020986-14 | 360.01 uM thickness standard | Spares | 1 | as is where is | immediately | ||
| 113388 | ADE | 9350 | Film stress measurement | 150 mm | 01.06.1993 | 1 | as is where is | ||
| 109554 | ADE | NANOMAPPER Phase Shift | nano defect inspection system | 300 mm | 01.11.2001 | 1 | as is where is | immediately | |
| 108791 | ADE | 5810 | Non-Contact Capacitance Gauging Module with 2ea ADE 2248 Probes | 1 | inquire | ||||
| 108792 | ADE | 6033 | Wafer Thickness Tester | 1 | inquire | ||||
| 108793 | ADE | 6033T | Wafer Thickness Tester | 1 | inquire | ||||
| 110790 | Cadence | Protium S1 | Hardware Emulation System | 1 | as is where is | immediately | |||
| 112148 | Cascade | REL4800 | Manual prober | - | 1 | as is where is | |||
| 112149 | Cascade | REL4800 | Manual prober | - | 1 | as is where is | |||
| 108976 | Cascade | Summit 12000 | Semi-automatic probe station with Shield Box, Temptronic thermal chuck -65C to 200 C | 200 mm | 01.06.2005 | 1 | as is where is | immediately | |
| 109579 | Cascade Microtech | Summit 11000M | Prober | 200 mm | 1 | as is where is | immediately | ||
| 112677 | Cascade Microtech | M150 | Prober | 1 | as is where is | ||||
| 112678 | Cascade Microtech | REL-3200 | Prober | 1 | as is where is | ||||
| 110700 | Cascade Microtech | Summit 12000B-HS | Manual Prober with isolation table and heated chuck | 150 mm | 01.11.2009 | 6 | as is where is | immediately | |
| 77161 | Shimaden | SR91-8P-90-1N0 | Temperature Regulator | Spares | 1 | as is where is | immediately |