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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 113454 | Bruker | Dimension Icon | Atomic force microscope | 150 mm | 1 | as is where is | |||
| 113455 | Bruker | GT-X Contour | Profiler measurement | 150 mm | 01.06.2013 | 1 | as is where is | ||
| 113456 | Bruker | QC3 | XRD measurement | 150 mm | 1 | as is where is | |||
| 110694 | BRUKER | D8 Fabline | X-Ray Diffraction wafer measurement | 300 mm | 01.06.2008 | 1 | as is where is | immediately | |
| 113312 | Bruker | ContourGT-K0 | Atomic Force Microscopy | 01.06.2012 | 1 | as is where is | immediately | ||
| 111557 | BRUKER | NT3300 | RF GENERATOR | SPARES | 1 | as is where is | |||
| 109557 | BRUKER | Quantax 200 | Energy Dispersive X- Ray Spectrometer | Laboratory | 1 | as is where is | immediately | ||
| 108025 | BRUKER | VERTEX 80V | FT-IR Spectrometer | 1 | as is where is | ||||
| 113953 | Bruker / Eco-Snow | WaferClean 2200 | Wafer Cleaning System | 1 | inquire |