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List of JEOL equipment available for sale

The following are the items available for sale related to JEOL. To inquire about the JEOL equipment item you need, click on the relevant link below to get more details, and inquiry if interested. If no result is shown, please try to search for another item or inquiry us about your request of JEOL items.


SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
15055 Jeol JWS-7505ZH CD Scanning Electron Microscope 100-200 mm 01.06.1997 1 as is where is immediately
15289 JEOL JSM 7550 INSPECTION SEM 200 mm 01.06.1996 1 as is where is immediately
15299 JEOL JSM 7700 INSPECTION SEM 200 mm 01.06.1995 1 as is where is immediately
20975 JEOL JWS 7700 CD SEM 200 mm 1 as is where is
34064 JEOL JSM 5300LV SEM 1 as is where is immediately
56132 Jeol JWS-7505 Scanning Electron Microscope 200mm 1 as is where is immediately
55317 JEOL JWS-7515 Metrology Equipment, CD SEM 150mm 01.10.2000 1 as is where is
32811 JEOL JSM6320 Field Emission SEM N/A 1 inquire immediately
35620 JEOL 7515 SEM 1 as is where is immediately
36564 JEOL CD-SEM, JSM-6340F JEOL 1 inquire
38309 JEOL JWS-7500E In-Line Wafer Inspection SEM for up to 200 mm Wafers and 0.5 micron Design Rule. 200mm 1 inquire immediately
71172 JEOL JWS 8755S SEM 1 inquire immediately
60644 Jeol JWS-7555S Wafer Inspection 1 as is where is
60675 JEOL JSM 840 SEM 1 as is where is
61195 JEOL JWS-7505ZH CD-SEM 1 as is where is
66363 JEOL JAMP 30 SCANNING AUGER MICROPROBE 1 as is where is immediately
69647 JEOL JWS-3000 CD SEM 300 mm 1 as is where is
69648 JEOL JWS-3000 CD SEM 300 mm 1 as is where is
71633 JEOL JWS-7700 INSPECTION SEM 1 as is where is
74804 JEOL 7555S INSPECTION SEM 200 MM 1 as is where is
74805 JEOL JM2010-F TEM 200 MM 1 as is where is
74810 JEOL JWS-3000 INSPECTION SEM 200 MM 1 as is where is
74811 JEOL JWS-3000 INSPECTION SEM 200 MM 1 as is where is
74812 JEOL JWS-3000 INSPECTION SEM 200 MM 1 as is where is
78523 JEOL JEM-2500SE Scanning Electron Microscope 300 mm 1 as is where is
78524 JEOL 7555 Scanning Electron Microscope 200 mm 1 as is where is
78525 JEOL JEM-2500SE Scanning Electron Microscope 300 mm 1 as is where is
78526 JEOL 7555 Scanning Electron Microscope 200 mm 01.06.2000 1 as is where is
83590 JEOL JSM 7401F High Resolution FE SEM 200 mm 01.06.2006 1 as is where is immediately
83990 JEOL JBX 5500FS E-Beam lithography system 2 inch, 3 inch and 4 inch 01.12.2008 1 as is where is immediately
84315 JEOL JSM-7401F SEM 300 mm 01.06.2006 1 as is where is immediately
84316 JEOL JSM-7401F SEM 300 mm 01.06.2006 1 as is where is immediately
84435 JEOL 7505 METROLOGY 200 1 as is where is
84540 JEOL 2100F TEM 200 mm 1 as is where is immediately


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