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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 108822 | JEOL | JSM-6600F | Scanning Electron Microscope | 1 | inquire | ||||
| 91424 | JEOL | JSM-6700F | FE SEM | 1 | as is where is | ||||
| 110627 | JEOL | JSM-6460LV | Scanning Electron Microscope | Laboratory | 1 | as is where is | |||
| 114026 | JEOL | JWS-7515 | Wafer Inspection System | 200 MM | 1 | as is where is | |||
| 108907 | JEOL | JEM3200FS | High Resolution TEM | Laboratory | 01.05.2006 | 1 | as is where is | immediately | |
| 109185 | JEOL | JEM-2010F | TEM | Laboratory | 1 | as is where is | |||
| 108164 | JEOL | JSM-6340F | FE Sem | 1 | as is where is | ||||
| 113313 | JEOL | JWS7550 | SEM Wafer inspection | 1 | as is where is | immediately | |||
| 113073 | JEOL | JSM-5600 | CD Sem | N/A | 01.06.1999 | 1 | as is where is | ||
| 113074 | JEOL | JSM-6340F | FE Sem | N/A | 1 | as is where is | |||
| 113075 | JEOL | JWS-7500E | SEM | 200 mm | 1 | as is where is | |||
| 113076 | JEOL | JWS-7515 | SEM | N/A | 1 | as is where is | |||
| 114107 | JEOL | JFS-9815 | Focused Ion Beam System | 200 mm | 1 | as is where is | |||
| 114108 | JEOL | JFS-9855S | Focused Ion Beam System | 200 mm | 1 | as is where is | |||
| 114109 | JEOL | JWS-7555 | SEM - Defect Review (DR) | 200 mm | 1 | as is where is | |||
| 114110 | JEOL | JWS-7555S | SEM - Defect Review (DR) | 200 mm | 1 | as is where is | |||
| 36564 | JEOL | CD-SEM, JSM-6340F | JEOL | 1 | inquire | ||||
| 109558 | JEOL | JSM-7500F | SEM | Laboratory | 01.05.2009 | 1 | as is where is | immediately |