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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 111379 | Leica | INS3000 | Defect Inspection | 1 | as is where is | immediately | |||
| 111399 | Leica | M165C | Reflected light and transmitted light microscope | Assembly | 1 | as is where is | immediately | ||
| 111451 | Leica | INS 3000 | Microscope Inspection station | 200 mm | 01.01.1998 | 1 | as is where is | immediately | |
| 108171 | LEICA | INM100 | Microscope | 1 | as is where is | ||||
| 108172 | LEICA | INM100 | Microscope | 1 | as is where is | ||||
| 108173 | LEICA | INM100 | Microscope | 1 | as is where is | ||||
| 108174 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | ||||
| 108175 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | ||||
| 108176 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | ||||
| 108177 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | ||||
| 112785 | Leica | INM 100 | Microscope,Bright & Dark,Reflected Light | 1 | as is where is | ||||
| 108178 | LEICA | Polyvar SC | POLYVAR SCOPE | 1 | as is where is | ||||
| 112786 | Leica | INM20 | Microscope, BF/DF/DIC 200 | 1 | as is where is | ||||
| 108179 | LEICA | Reichert POLYVAR SC | Wafer Inspection Microscope | 200 mm/300 mm | 01.06.2002 | 1 | as is where is | ||
| 112787 | Leica | POLYLITE 88 | Microscope, BF/DF/DIC 200 | 1 | as is where is | ||||
| 108180 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | ||||
| 112788 | Leica | POLYLITE 88 | Microscope, Bright & Dark 200 | 1 | as is where is | ||||
| 108181 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | ||||
| 112789 | Leica | POLYLITE 88 | Microscope, Bright & Dark 200 | 1 | as is where is | ||||
| 108182 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | ||||
| 112790 | Leica | Polylite 88 | Microscope,Bright & Dark,Reflected Light | 2 | as is where is | ||||
| 108183 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | ||||
| 112791 | Leica | Polylite 88 | Microscope,Bright & Dark,Reflected Light | 1 | as is where is | ||||
| 112792 | Leica | POLYLITE88 | Microscope,BF/DF/DIC,Reflected Light | 1 | as is where is | ||||
| 109211 | Leica | INS3300 | Macro-Defect | 300mm | 1 | as is where is | |||
| 109212 | Leica | INS3300 | Macro-Defect | 300mm | 1 | as is where is | |||
| 109213 | Leica | INS3300 | Macro-Defect | 300mm | 1 | as is where is | |||
| 106485 | Leica | LEICA INM20 | Microscope inspection station | 200 mm | 01.06.1995 | 1 | as is where is | immediately |