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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 84063 | Leica | MZ 12.5 | Microscope | 1 | as is where is | |||
| 84064 | Leica | MZ 8 | Microscope | 1 | as is where is | immediately | ||
| 84065 | Leica | MZ 6 | Microscope | 1 | as is where is | |||
| 108171 | LEICA | INM100 | Microscope | 1 | as is where is | |||
| 108172 | LEICA | INM100 | Microscope | 1 | as is where is | |||
| 108173 | LEICA | INM100 | Microscope | 1 | as is where is | |||
| 108174 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
| 108175 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
| 108176 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
| 108177 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
| 108178 | LEICA | Polyvar SC | POLYVAR SCOPE | 1 | as is where is | |||
| 108179 | LEICA | Reichert POLYVAR SC | Wafer Inspection Microscope | 200 mm/300 mm | 01.06.2002 | 1 | as is where is | |
| 108180 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
| 108181 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
| 108182 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
| 108183 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
| 108718 | Leica | INS 3300 | Wafer Inspection Microscope | 300 MM | 01.06.2005 | 2 | as is where is | immediately |
| 106485 | Leica | LEICA INM20 | Microscope inspection station | 200 mm | 01.06.1995 | 1 | as is where is | immediately |
| 69389 | Leica/Wild | M 8 | Stereomicroscope | 1 | as is where is |