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SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
---|---|---|---|---|---|---|---|---|
84063 | Leica | MZ 12.5 | Microscope | 1 | as is where is | |||
84064 | Leica | MZ 8 | Microscope | 1 | as is where is | immediately | ||
84065 | Leica | MZ 6 | Microscope | 1 | as is where is | |||
108171 | LEICA | INM100 | Microscope | 1 | as is where is | |||
108172 | LEICA | INM100 | Microscope | 1 | as is where is | |||
108173 | LEICA | INM100 | Microscope | 1 | as is where is | |||
108174 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
108175 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
108176 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
108177 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
108178 | LEICA | Polyvar SC | POLYVAR SCOPE | 1 | as is where is | |||
108179 | LEICA | Reichert POLYVAR SC | Wafer Inspection Microscope | 200 mm/300 mm | 01.06.2002 | 1 | as is where is | |
108180 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
108181 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
108182 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
108183 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
108718 | Leica | INS 3300 | Wafer Inspection Microscope | 300 MM | 01.06.2005 | 2 | as is where is | immediately |
106485 | Leica | LEICA INM20 | Microscope inspection station | 200 mm | 01.06.1995 | 1 | as is where is | immediately |
69389 | Leica/Wild | M 8 | Stereomicroscope | 1 | as is where is |