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SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
106336 August / Rudolph Technologies CV9812 Wafer Carrier inspection tool 1 as is where is immediately
94478 RUDOLPH FE-3 Focus Ellipsometer 200 mm 1 as is where is
94479 RUDOLPH FE-4D Focus Ellipsometer 200 mm 1 as is where is
98835 RUDOLPH AXI-S Macro Wafer Inspection 300 mm 30.06.2004 1 as is where is immediately
98837 RUDOLPH MP1-300XCU Film Thickness Measurement System 300 mm 30.04.2008 1 as is where is immediately
103707 Rudolph AXI-S Macro Inspection System 300 mm 31.05.2003 1 as is where is
103708 Rudolph AXI-935D Macro Inspection System 300 mm 1 as is where is
103709 Rudolph AXI-935D Macro Inspection System 300 mm 31.05.2011 1 as is where is
106274 Rudolph AXI 940B Wafer Inspection Equipment 300 MM 1 as is where is
106275 Rudolph AXI 940B Wafer Inspection Equipment 300 MM 1 as is where is
92709 Rudolph WV320 MACRO INSPECTION 300 MM 31.05.2006 1 as is where is immediately
92710 Rudolph WV320 MACRO INSPECTION 300 MM 31.05.2006 1 as is where is
106298 RUDOLPH MetaPulse 3 300A Film Thickness Measurement 300 mm 01.06.2008 1 as is where is immediately
105789 Rudolph WHS220/Axi-940b Wafer Mask Inspection System 100-150 mm 31.05.2009 1 as is where is
100928 RUDOLPH AXI-S Macro Inspection System 300 mm 31.05.2003 1 as is where is
100929 RUDOLPH FE-7 Ellipsometer 200 mm 31.05.1996 1 as is where is
100930 RUDOLPH MP300 Film thickness measurement 200 mm 31.05.2007 1 as is where is
100931 RUDOLPH MP300 Film thickness measurement 200 mm 31.05.2009 1 as is where is
100932 RUDOLPH S3000A Focused Beam Ellipsometer 200 mm 31.05.2012 1 as is where is
106831 Rudolph MP200XCU Cu Film thickness measurement 200mm 1 inquire
106832 Rudolph MP300 Metal Film thickness measurement 300mm 1 inquire
106833 Rudolph MP300 XCu Cu Film thickness measurement 300mm 2 inquire
105822 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105823 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105824 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105825 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
72034 RUDOLPH MP200 METROLOGY 200 mm 31.05.2000 1 as is where is immediately
105826 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105827 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105828 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105829 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105830 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105831 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
101491 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
101492 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
101493 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
101494 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
101495 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
106871 RUDOLPH NSX 105 Automated Wafer, Die and Bump Inspection System 300 mm 01.06.2008 1 as is where is immediately
101496 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
98171 Rudolph NSX105C Macro Inspection 200 mm 31.05.2007 1 as is where is
103553 RUDOLPH AXI-S Macro Inspection 300 mm 31.05.2004 1 as is where is
103554 RUDOLPH AXI935D AVI 300 mm 1 as is where is
95619 Rudolph WV320 MACRO INSPECTION 300 MM 31.05.2006 1 as is where is immediately
103555 RUDOLPH MP3 300XCU FLIM THICKNESS MEASUREMENT SYSTEM 300 mm 1 as is where is immediately
95621 RUDOLPH WV320 Metrology 300mm 1 as is where is immediately
91559 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2005 1 as is where is
91560 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2005 1 as is where is
91561 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2006 1 as is where is
91563 RUDOLPH Meta Pulse Film Metrology 200 mm 31.05.2005 1 as is where is
97965 RUDOLPH NSX320 MACRO DEFECT INSPECTOR 300 MM 1 as is where is immediately
91566 Rudolph WS3840 3D Bump Metrology 300 mm 31.05.2010 1 as is where is immediately
97966 RUDOLPH WHS MACRO DEFECT INSPECTOR 300 MM 1 inquire
91567 RUDOLPH META PULSE 200 Surface Film Metrology 200 mm 31.05.2002 1 as is where is immediately
106420 Rudolph NSX 115 Automated Defect Inspection 200 mm 1 as is where is immediately
106421 Rudolph NSX 95 Automated Macro Defect Inspection 150 mm/200 mm 1 as is where is immediately
106422 Rudolph NSX-105 Automated Defect Inspection 150 mm/200 mm 1 as is where is immediately
106423 Rudolph NSX-105d1 Automated Defect Inspection 150 mm/200 mm 1 as is where is immediately
106424 Rudolph NSX-95 Automated Macro Defect Inspection 150 mm/200 mm 1 as is where is immediately
106425 Rudolph NSX-95 Manual Macro Wafer Defect Inspection 150 mm/200 mm 1 as is where is immediately
102355 Rudolph 3Di8500 Wafer Inspection 300 mm 31.05.2008 1 as is where is
102356 Rudolph Axi-S Macro inspection 300 mm 31.05.2005 1 as is where is
102359 Rudolph NSX115 Macro Defect Inspection System 300 mm 31.05.2009 1 as is where is
102360 Rudolph NSX115 Macro Defect Inspection System 300 mm 31.05.2010 1 as is where is
102363 Rudolph S3000S Focused Beam Ellipsometer 300 mm 31.05.2011 1 as is where is
106715 RUDOLPH MP3_300A METAL THICKNESS MEASUREMENT 300 mm 01.06.2012 1 as is where is
102364 Rudolph S3000SX Focused Beam Ellipsometer 300 mm 31.05.2011 1 as is where is
106716 RUDOLPH MP-300 Film thickness measurement 300 mm 01.06.2005 1 as is where is
106717 RUDOLPH MP1-300 Film Thickness Measurement 300 mm 01.06.2003 1 as is where is
106718 RUDOLPH MP1-300 Film Thickness Measurement 300 mm 1 as is where is
106719 RUDOLPH MP1-300XCU Film thickness measurement system 300 mm 01.06.2008 1 as is where is
106720 RUDOLPH NSX 105 MACRO DEFECT INSPECTION SYSTEM 300 mm 01.06.2008 1 as is where is immediately
102369 Rudolph WV320 Macro Defect inspection 300 mm 31.05.2005 1 as is where is
106721 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2010 1 as is where is
106722 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2011 1 as is where is
106723 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 1 as is where is
101348 Rudolph Auto EL Elipsometer 150mm 1 as is where is
102372 Rudolph WV320 Macro Defect inspection 300 mm 31.05.2007 1 as is where is
106724 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2011 1 as is where is
101349 Rudolph FE IIID Dual Wavelength Ellipsometer 200 mm 01.06.1998 1 as is where is immediately
102373 Rudolph WV320 Macro Defect inspection 300 mm 31.05.2007 1 as is where is
106725 RUDOLPH S3000S FBE(focused beam laser ellipsometry) 300 mm 01.06.2010 1 as is where is
106726 RUDOLPH S3000S FBE(focused beam laser ellipsometry) 300 mm 1 as is where is
106727 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2003 1 as is where is
106728 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2003 1 as is where is
106729 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2006 1 as is where is
106730 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2002 1 as is where is
106731 RUDOLPH WV320 Macro Inspection 300 mm 01.06.2006 1 as is where is
91116 RUDOLPH MP200 XCu Thin Film Measurement 200 mm 31.05.2001 1 as is where is
106732 RUDOLPH MP200 Film thickness measurement 200 mm 01.06.2003 1 as is where is
106733 RUDOLPH MP200 Film thickness measurement 200 mm 01.06.1999 1 as is where is
106734 RUDOLPH WV320 Macro Defect Inspection System 300 mm 1 as is where is
106735 RUDOLPH WV320 Macro Defect Inspection System 300 mm 1 as is where is
98296 RUDOLPH Meta Pulse 300 Film thickness measurement 300 mm 1 as is where is
98297 RUDOLPH Meta Pulse 300 Film thickness measurement 300 mm 1 as is where is
98298 RUDOLPH MP1-300 Film thickness measurement 300 mm 31.05.2007 1 as is where is
70089 Rudolph Technologies FE-VII Ellipsometer 200 mm 31.05.1996 1 as is where is immediately
88629 Rudolph/August NSX105 Macro Inspection 200 MM 31.05.2004 1 as is where is
88630 Rudolph/August NSX105 Macro Inspection 200 MM 31.05.2003 1 as is where is


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