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SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
86617 August / Rudolph Technologies NSX 90 macro defect inspection system 200 mm 1 as is where is immediately
79405 Rudolph Wafer View 220 0
79430 Rudolph MP 200 Cu Thin film measurement - copper film type 200 mm 1 as is where is immediately
86612 Rudolph WV320 Inspection 200mm 1 as is where is
72033 RUDOLPH Meta Pulse 200 Cu Copper Film metrology system 8" 01.04.2001 1 as is where is immediately
72034 RUDOLPH MP200 METROLOGY 200 mm 1 as is where is immediately
78702 RUDOLPH MP300 METRO 300 MM 01.06.2007 1 as is where is
78703 RUDOLPH MP300 METRO 300 MM 01.06.2009 1 as is where is
86196 RUDOLPH WS2500 Wafer Inspection 200 mm 01.06.2002 1 as is where is
86197 RUDOLPH WS2500 Wafer Inspection 200 mm 01.06.2003 1 as is where is
83662 Rudolph NSX 105 macro defect inspection system 6 inch film frames 01.06.2006 1 inquire 2 months
84432 RUDOLPH FE-VII METROLOGY 150/200 1 as is where is
85969 Rudolph NSX-105 Wafer Level Inspection 1 as is where is
85970 Rudolph NSX-105 Wafer Level Inspection 1 as is where is
85971 Rudolph NSX-105 Wafer Level Inspection 1 as is where is
85972 Rudolph S3000S Film Thickness Measurement System 300 mm 1 as is where is
85973 Rudolph S3000S Film Thickness Measurement System 300 mm 1 as is where is
85974 Rudolph WS 3880 Bump Inspection 300 mm 1 as is where is
84696 Rudolph FE-IV ellipsometer 150 mm 1 as is where is
79067 RUDOLPH WV320 Metrology 300mm 1 as is where is
85000 Rudolph Research 200XL Ellipsometer 200 mm 01.06.2001 1 as is where is
85001 Rudolph Research SE200XL Ellipsometer 200 mm 01.06.1999 1 as is where is
85002 Rudolph Technologies Macro Defect WV320 YVS SERVER Optical Inspection Facilities 1 as is where is
85003 Rudolph Technologies S300 Wafer defect inspection 300 MM 01.06.2007 1 as is where is
85004 Rudolph Technologies WaferView 320 Macro defect inspection 300 MM 01.06.2005 1 as is where is
85005 Rudolph Technologies WaferView 320 Macro defect inspection 300 MM 01.06.2005 1 as is where is
70089 Rudolph Technologies FE-VII Ellipsometer 200 mm 01.06.1996 1 as is where is immediately
85407 Rudolph/August 3Di8500 wafer inspection 300 mm 01.06.2008 1 as is where is
85408 Rudolph/August AxiS Defect Inspection 300 mm 01.06.2005 1 as is where is
85409 Rudolph/August AxiS Macro Wafer Inspection 200 mm 01.06.2005 1 as is where is
85410 Rudolph/August FEIV Ellipsometer 200 mm 01.06.1995 1 as is where is
85411 Rudolph/August FEVII Ellipsometer 200 mm 1 as is where is
85412 Rudolph/August FEVII Ellipsometer 200 mm 01.06.1993 1 as is where is
85413 Rudolph/August FEVII Ellipsometer 150 mm 01.06.2000 1 as is where is
85414 Rudolph/August FEVII Ellipsometer 150 mm 1 as is where is
85415 Rudolph/August FEVII Ellipsometer 150 mm 01.06.2001 1 as is where is
85416 Rudolph/August FEVIID Ellipsometer 200 mm 1 as is where is
85417 Rudolph/August FEVIID Ellipsometer 200 mm 01.06.1997 1 as is where is
85418 Rudolph/August MP300(Meta Pulse 300) Thickness measurement 300 mm 01.06.2004 1 as is where is


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