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SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
86617 August / Rudolph Technologies NSX 90 macro defect inspection system 200 mm 1 as is where is immediately
91915 Rudolph FE4 Ellipsometer 200 MM 01.06.1995 1 as is where is immediately
92709 Rudolph WV320 MACRO INSPECTION 300 MM 01.06.2006 1 as is where is
92710 Rudolph WV320 MACRO INSPECTION 300 MM 01.06.2006 1 as is where is
79405 Rudolph Wafer View 220 0
88628 Rudolph MetaPULSE 300 Thickness Measurement 300 MM 01.06.2004 1 as is where is immediately
92236 Rudolph S3000A Ellipsometer 300 mm 01.06.2007 1 as is where is
92237 Rudolph S3000A Ellipsometer 300 mm 01.06.2007 1 as is where is
92238 Rudolph S3000A Ellipsometer 300 mm 01.06.2007 1 as is where is
72034 RUDOLPH MP200 METROLOGY 200 mm 01.06.2000 1 as is where is immediately
78702 RUDOLPH MP300 METRO 300 MM 01.06.2007 1 as is where is
78703 RUDOLPH MP300 METRO 300 MM 01.06.2009 1 as is where is
92822 Rudolph Axi-S Macro Inspection (Metrology) 300 mm 01.06.2007 1 as is where is
92823 Rudolph Axi-S Macro inspection (Metrology) 300 mm 01.06.2006 1 as is where is
92824 Rudolph FE-IV Ellipsometer (Metrology) 200 mm 01.06.1995 1 as is where is
85411 Rudolph FEVII Ellipsometer 200 mm 1 as is where is immediately
91559 RUDOLPH AXL_S Macro Inspection System 300 mm 01.06.2005 1 as is where is
91560 RUDOLPH AXL_S Macro Inspection System 300 mm 01.06.2005 1 as is where is
91561 RUDOLPH AXL_S Macro Inspection System 300 mm 01.06.2006 1 as is where is
91562 RUDOLPH MP1 300 Film thickness measurement 300 mm 01.06.2013 1 as is where is
91563 RUDOLPH Meta Pulse Film Metrology 200 mm 01.06.2005 1 as is where is
91564 RUDOLPH Meta Pulse 200 Film Metrology 200 mm 1 as is where is
91565 RUDOLPH MP1 300 Film Metrology 300 mm 1 as is where is
91566 Rudolph WS3840 3D Bump Metrology 300 mm 01.06.2010 1 as is where is
91822 RUDOLPH FE-7 ELLIPSOMETER 01.06.1997 1 as is where is
91567 RUDOLPH META PULSE 200 Surface Film Metrology 200 mm 01.06.2002 1 as is where is immediately
86196 RUDOLPH WS2500 Wafer Inspection 200 mm 01.06.2002 1 as is where is
86197 RUDOLPH WS2500 Wafer Inspection 200 mm 01.06.2003 1 as is where is
79067 RUDOLPH WV320 Metrology 300mm 1 as is where is
91116 RUDOLPH MP200 XCu Thin Film Measurement 200 mm 01.06.2001 1 as is where is
70089 Rudolph Technologies FE-VII Ellipsometer 200 mm 01.06.1996 1 as is where is immediately
88624 Rudolph/August 3Di8500 Wafer Inspection 300 MM 01.06.2008 1 as is where is
88625 Rudolph/August FE-VII Focus Ellipsometer 200 MM 01.06.1993 1 as is where is
88626 Rudolph/August FE-VII-D Focus Ellipsometer 200 MM 1 as is where is
88627 Rudolph/August FE-VII-D Focus Ellipsometer 200 MM 01.06.1997 1 as is where is
88629 Rudolph/August NSX105 Macro Inspection 200 MM 01.06.2004 1 as is where is
88630 Rudolph/August NSX105 Macro Inspection 200 MM 01.06.2003 1 as is where is


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