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SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
86617 August / Rudolph Technologies NSX 90 macro defect inspection system 200 mm 1 as is where is immediately
90887 Rudolph NSX 105 Macro-Defect 300mm 01.06.2006 1 as is where is
79405 Rudolph Wafer View 220 0
88628 Rudolph MetaPULSE 300 Thickness Measurement 300 MM 01.06.2004 1 as is where is immediately
79430 Rudolph MP 200 Cu Thin film measurement - copper film type 200 mm 1 as is where is immediately
86612 Rudolph WV320 Inspection 200mm 1 as is where is
72034 RUDOLPH MP200 METROLOGY 200 mm 01.06.2000 1 as is where is immediately
78702 RUDOLPH MP300 METRO 300 MM 01.06.2007 1 as is where is
78703 RUDOLPH MP300 METRO 300 MM 01.06.2009 1 as is where is
87156 RUDOLPH FE-7 FILM THICKNESS MEASURING_ELLIPSOMETRY 200 mm 01.06.1997 1 as is where is
87157 RUDOLPH S200 FILM THICKNESS MEASURING_ELLIPSOMETRY 200 mm 01.06.2000 1 as is where is
85411 Rudolph FEVII Ellipsometer 200 mm 1 as is where is immediately
86196 RUDOLPH WS2500 Wafer Inspection 200 mm 01.06.2002 1 as is where is
86197 RUDOLPH WS2500 Wafer Inspection 200 mm 01.06.2003 1 as is where is
90058 RUDOLPH MP1 200 Opaque Film Metrology 200 mm 01.07.2002 1 as is where is
79067 RUDOLPH WV320 Metrology 300mm 1 as is where is
88283 Rudolph NSX 115 Macro-Defect 1 as is where is immediately
90590 Rudolph Matrix S-300 Ellipsometer 300 mm 01.06.2003 1 as is where is
90591 Rudolph Matrix S-300 Ellipsometer 300 mm 01.06.2003 1 as is where is
90592 Rudolph Matrix S-300 Ellipsometer 01.11.2001 1 as is where is
90593 Rudolph Matrix S-300 Ellipsometer 01.12.2001 1 as is where is
85002 Rudolph Technologies Macro Defect WV320 YVS SERVER Optical Inspection Facilities 1 as is where is
85003 Rudolph Technologies S300 wafer surface inspection system 300 MM 01.06.2007 1 as is where is immediately
85004 Rudolph Technologies WaferView 320 Macro defect inspection 300 MM 01.06.2005 1 as is where is
85005 Rudolph Technologies WaferView 320 Macro defect inspection 300 MM 01.06.2005 1 as is where is
88902 Rudolph Technologies AXI-930 B20 Macro Defect Inspection 1 as is where is
88903 Rudolph Technologies WaferView 320 300mm Macro Defect Inspection 300mm 1 as is where is
70089 Rudolph Technologies FE-VII Ellipsometer 200 mm 01.06.1996 1 as is where is immediately
88624 Rudolph/August 3Di8500 Wafer Inspection 300 MM 01.06.2008 1 as is where is
88625 Rudolph/August FE-VII Focus Ellipsometer 200 MM 01.06.1993 1 as is where is
88626 Rudolph/August FE-VII-D Focus Ellipsometer 200 MM 1 as is where is
88627 Rudolph/August FE-VII-D Focus Ellipsometer 200 MM 01.06.1997 1 as is where is
88629 Rudolph/August NSX105 Macro Inspection 200 MM 01.06.2004 1 as is where is
88630 Rudolph/August NSX105 Macro Inspection 200 MM 01.06.2003 1 as is where is


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