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SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
---|---|---|---|---|---|---|---|---|
108643 | Nikon | Eclipse L200 | Wafer Inspection Microscope | 150 mm/200 mm | 01.06.2006 | 1 | as is where is | immediately |
98484 | Nikon | ECLIPSE L150 | Microscope | 100/150mm | 1 | as is where is | immediately |