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SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
---|---|---|---|---|---|---|---|---|---|
114309 | JEOL | JWS-7555 | Wafer Inspection SEM | 200 mm | 01.06.1998 | 1 | as is where is | ||
114109 | JEOL | JWS-7555 | SEM - Defect Review (DR) | 200 mm | 1 | as is where is | |||
114110 | JEOL | JWS-7555S | SEM - Defect Review (DR) | 200 mm | 1 | as is where is |