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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 98448 | August | NSX-95 | 2D Auto inspection system / Macro defect inspection system | 200 mm | 4 | as is where is | immediately | |
| 101818 | August | NSX-105 | Wafer Bumping Inspection System / Macro defect inspection | 200 mm | 1 | as is where is | immediately | |
| 109233 | ONTO | NSX 105 | Macro-Defect | 200mm | 1 | as is where is | ||
| 106871 | RUDOLPH | NSX 105 | Automated Wafer, Die and Bump Inspection System | 300 mm | 01.06.2008 | 1 | as is where is | immediately |
| 106420 | Rudolph | NSX 115 | Automated Defect Inspection | 200 mm | 1 | as is where is | immediately | |
| 106421 | Rudolph | NSX 95 | Automated Macro Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | |
| 106422 | Rudolph | NSX-105 | Automated Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | |
| 106424 | Rudolph | NSX-95 | Automated Macro Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | |
| 106425 | Rudolph | NSX-95 | Manual Macro Wafer Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | |
| 108485 | Rudolph | NSX 105 | Macro-Defect | 300 mm | 8 | as is where is | ||
| 106720 | RUDOLPH | NSX 105 | MACRO DEFECT INSPECTION SYSTEM | 300 mm | 01.06.2008 | 1 | as is where is | immediately |