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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 106042 | Hardwall cleanroom | Kingspan Ultratech Versatile | 950 sq mt ISO Class 8 cleanroom | facilities | 01.06.2023 | 1 | as is where is | immediately |
| 101585 | NANOMETRICS | CALIPER-ULTRA | Overlay Measurement | 300 mm | 30.06.2006 | 1 | as is where is | |
| 106706 | NANOMETRICS | CALIPER_ULTRA | Mask & Wafer Inspection | 300 mm | 01.06.2006 | 1 | as is where is | |
| 98289 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
| 98290 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
| 98291 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 30.06.2006 | 1 | as is where is | immediately |
| 108294 | Orbotech | Ultra Discovery VM | IC inspection system for FC-BGA, PBGA, CSP and COF | SMT | 01.06.2011 | 1 | as is where is | |
| 110795 | Rudolph | S300D Ultra II | Thin Film Measurement Tool / Ellipsometer | 300 mm | 01.05.2005 | 1 | as is where is | immediately |
| 84022 | Sun | Ultrasparc 60 | Unix computer from Teradyne J994 | Test | 31.12.1996 | 1 | as is where is | immediately |
| 84023 | Sun | Ultrasparc 60 (Hard Disk Drive) | Hard Disk from Unix computer from Teradyne J994 | Test | 01.01.1997 | 1 | as is where is | immediately |
| 108912 | Teradyne | UltraFLEX | Automated Test System | TEST | 01.05.2011 | 1 | as is where is | immediately |