Wanted to buy items

Must be able to handle the following package.

1)  QFN 7X7,

The handler must be: 

1) Gravity Feed

2) Tube in tube out  TUBE TO TUBE)

3) Temperature requirements is ambient and elevated (hot).

4) Interface standard TTL,

5) Single Test site  or what is available,

6) Supply voltage 220V

7) It will be a full production handler.

8) It must be rack and stack docking,

Applied Materials

Model: 0010-12814

Description: Dual Zone Ceramic Heater 200mm HI7 RIGID TE 

Need AMAT TxZ 300mm chamber for immediate purchase

I am always on the lookout for:

·        IN USA Corporation

o   dDFOZ Sensors (Dissolved ozone sensors)

o   MINI SCI MUX Controllers

§  Both for

·        gFFOZ and

·        dFFOZ

o   gFFOZ Sensors (Ozone gas concentration)

o   SCI MUX Controllers

§  Works for both dFFOZ and gFFOZ sensors

·        ASTEX

o   Semozone 90.2 LP, HP or XP model Ozone generators

·        MKS

o   Semozone 90.2 LP, HP or XP model Ozone Generators

·        Entegris

o   Phasor Infusers

Manufacturer: BIORAD

Model: QS-408M

Description: Manual FT-IR Spectrometer for Epi, SiN, BPSG Measurement & More, up to 200mm Wafers,

THE CANON PART NUMBERS FOR THESE ARE AS FOLLOWS:-

Canon BG4-6485 ZMI1000A Board    
Canon BG4-6466 ZMI1000A Board    
Canon BG4-6467 ZMI1000A (theta) Board

NEEDED FOR 3 INCH, 4 INCH AND 6 INCH WAFERS

must be low cost

Used for GaN lift-off from Sapphire - beam 1x1mm FOV 248nm or 193nm

Karl Suss ACS200 needed, not with developer included

Looking to purchase KLA 5300 or Archer 200mm for immediate sale

KLA-Tencor 5300 in good condition needed immediately

KLA-Tencor Macro-Defect for 100mm – 200mm wafers, preferably a CERCL2 or an 8000-8900 series. 

for 200 mm wafers

Leica MIS200 Wafer Inspection Microscope needed in very good condition

Wanted immediately:

Manufacturer: LEICA

Model: MIS 200

Description: Wafer Inspection Microscope

Olympus GX71 microscope needed in good/working condition

Wanted immediately:

Manufacturer: Rudolph

Model: WS3840

Description: 3D Bump Metrology