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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 118672 | LEICA AG | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | ||||
| 118673 | LEICA AG | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | ||||
| 118674 | LEICA AG | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | ||||
| 118675 | LEICA AG | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is |