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SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
---|---|---|---|---|---|---|---|---|---|
115993 | MueTec | IRIS 2000 | Wafer macro-Defect Inspection system | 200 mm | 1 | as is where is | |||
115994 | MueTec | IRIS 2000 | Wafer macro-Defect Inspection system | 200 mm | 1 | as is where is | |||
115995 | MueTec | IRIS 2000 | Wafer macro-Defect Inspection system | 200 mm | 1 | as is where is | |||
115996 | MueTec | IRIS 2000 | Wafer macro-Defect Inspection system | 200 mm | 1 | as is where is | |||
115997 | MueTec | IRIS 2000 | Wafer macro-Defect Inspection system | 200 mm | 1 | as is where is |