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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 108803 | BOONTON | 72B | Capacitance Meter | SPARES | 1 | inquire | |||
| 103547 | ONTO | WV320 | MACRO INSPECTING | 300 mm | 31.05.2004 | 1 | as is where is | ||
| 118696 | ONTO | ATLAS | Wafer Metrology | 300 mm | 01.06.2006 | 1 | as is where is | ||
| 118697 | ONTO | ATLAS | Wafer Metrology | 300 mm | 1 | as is where is | |||
| 118698 | ONTO | ATLAS | Wafer Metrology | 300 mm | 01.06.2009 | 1 | as is where is | ||
| 118699 | ONTO | ATLAS | Wafer Metrology | 300 mm | 01.06.2013 | 1 | as is where is | ||
| 118700 | ONTO | ATLAS | Wafer Metrology | 300 mm | 01.06.2005 | 1 | as is where is | ||
| 118701 | ONTO | AXI-S | Macro Defect Inspection | 300 mm | 01.06.2006 | 1 | as is where is | ||
| 118702 | ONTO | AXI-S | Macro Defect Inspection | 300 mm | 1 | as is where is | |||
| 118703 | ONTO | F30 | Macro Defect Inspection | 300 mm | 1 | as is where is | |||
| 118704 | ONTO | MP-300 | Metapulse Wafer Inspection | 300 mm | 01.06.2011 | 1 | as is where is | ||
| 118705 | ONTO | AXI-S | Macro Defect Inspection | 300 mm | 1 | as is where is | |||
| 118706 | ONTO | UNIFIRE7900 | Metrology | 300 mm | 1 | as is where is | |||
| 116858 | Onto / Nanometrics | Atlas XP+ | Thin Film Measurement | 200/300mm | 1 | as is where is |