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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 108803 | BOONTON | 72B | Capacitance Meter | SPARES | 1 | inquire | |||
| 116030 | Onto | Imperia | Wafer Characterization | 200 mm | 1 | as is where is | |||
| 116031 | Onto | NanoSpec 3000 | Film Thickness Measurement System | 150 mm | 1 | as is where is | |||
| 116032 | Onto | NanoSpec 8000XSE | Film Thickness Measurement System | 150 mm | 1 | as is where is | |||
| 116033 | Onto | NanoSpec 8000XSE | Film Thickness Measurement System | 150 mm | 1 | as is where is | |||
| 116034 | Onto | NanoSpec II | Film Thickness Measurement System | 200 mm | 1 | as is where is | |||
| 116035 | Onto | NSX 330 | Macro-Defect | 1 | as is where is | ||||
| 103547 | ONTO | WV320 | MACRO INSPECTING | 300 mm | 31.05.2004 | 1 | as is where is |