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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 113838 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1990 | 1 | as is where is | ||
| 113839 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113840 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113841 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113842 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113843 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113844 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113845 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113846 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113847 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113848 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113849 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113850 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113851 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113852 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1990 | 1 | as is where is | ||
| 113853 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113854 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1990 | 1 | as is where is | ||
| 113855 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1990 | 1 | as is where is | ||
| 113856 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113857 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113858 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is |