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SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
---|---|---|---|---|---|---|---|---|---|
106871 | RUDOLPH | NSX 105 | Automated Wafer, Die and Bump Inspection System | 200 mm and 300 mm | 01.06.2008 | 1 | as is where is | immediately | |
116094 | Rudolph | NSX 105 | Macro-Defect Inspection System | 200 mm | 1 | as is where is | |||
116095 | Rudolph | NSX 105D | Macro-Defect Inspection System | 200 mm | 1 | as is where is | |||
106720 | RUDOLPH | NSX 105 | MACRO DEFECT INSPECTION SYSTEM | 300 mm | 01.06.2008 | 1 | as is where is | immediately | |
113147 | RUDOLPH | NSX 105 | Macro Defect Inspection | 300 mm | 01.06.2008 | 1 | as is where is |