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Thin Film Solar Testing Equipment Various Thin Film Solar Equipment for Sale


SDI fabsurplus.com is pleased to announce the availability of the following listed used Thin Film Solar Testing Equipment Various Thin Film Solar Equipment.
Please click on the "Send More Details" button at the end of the Various description, if you'd like to get more details, photos and specifications of this Thin Film Solar Equipment, and your request for this equipment will be forwarded to our SDI sales representatives automatically.
This Thin Film Solar Testing Equipment Various Thin Film Solar Equipment is available for immediate sale.
Crating, refurbishment and delivery for this equipment can be quoted on request.


Thin Film Solar Testing Equipment Various Equipment Details

SDI ID: 100057
Manufacturer: Thin Film Solar Testing Equipment
Model: Various
Description: Thin Film Solar Equipment
Version: TEST
Vintage: 01.06.2011
Quantity: 20
Sales Condition: inquire
Lead Time: immediately
Sales Price (each): Inquire
Comments:

Manufacturer

Model

Vintage

Description

Equipment

Achilles

AT 1-2

2013

Light soaking chamber for aging and life testing.

Off-line light soaking

V-Tech

Excel 1651UC

2011

Optical Microcsope.
Inspection Size: 1,600 x 1,200 mm

Optical Microscope

KDI

KD-UV02-1707

2011

UV Chamber.

UV Chamber

KDI

KD-LS02-1707

2011

Light Soaking.

Light Soaking

KDI

KD-MLS01-1707

2011

Mechanical Load.

Mechanical Load

KDI

KD-WL01-1707

2011

Wet Leakage.

Wet Leakage

Chin I Machinery

CIE-7254

2011

Straight Line Glass Cutter.

Glass Cutting

Mogrl Tech

LS-RX2000

2011

Pull Test Equipment - For adhesive tapes and lamination strengths.

Pull Test

Viswell

TF-ATOI plus

2011

EL/IR Visual Inspection Test System.
After passing electricity, the defective spots will heat up. The sensors will locate the defective spots.

EL-IR

KSON

PV-THB-E4T-100

2011

Hood with heater system to test the adhesiveness of the EVA Gel.

TH Chamber -KSON

Voetsch

VCS 7310-5 H/S

2011

Climate Simulation System for Solar Modules.

TH Chamber - Voetsch

LEO-Zeiss

LEO-1530

2011

Climate Simulation System for Solar Modules.

SEM

KOSAKA

ET6100

2011

The LEO 1530 FE-SEM is a hi-resolution SEM capable of sub-nanometer resolution. -detectors: In-Lens SE. and BSE -capable of up to 6" wafer -operational voltage 0.2-30kV -low voltage for viewing non-conductive samples -x/y/z axes motorized stage.

Alpha Step

DNS

RE-800

2011

Alpha Step is used for measurement of micro features, step height and roughness of FPD, wafers, hard disks, and other nano-order application

Spectroscopic Ellipsometer

KOWA

K-MSX-PV

2011

This machine is a Spectroscopic Ellipsometer used to measure both film thickness and optical constants. This unit is suitable for not only controlling film thickness, but also for processes in which film quality is crucial, as well as for developing new thin film materials and in the film creation process.

XRF

Rigaku

UltimaIV

2011

X-ray Fluorescence (XRF) Machine
Thin Film Measurement System - Thickness, Density & Composition Measurement

XRD

HORIBA

23201010 H

2011

Spectroscopic ellipsometry is a non-destructive, noncontact, and non-invasive optical technique which is based on the change in the polarization state of light as it is reflected obliquely from a thin film for for determining film thickness and optical constants (n,k) of thin film structures.

Ellipsometry+4pp

Perkin Elmer

Opti 7300DV

2011

The Optima 7300 DV represents the ultimate ICP-OES instrument in terms of optimizing both performance and productivity. Capable of determining more than 73 elements in seconds, the Optima 7300 DV can run more samples per
hour at a lower cost per analysis than any other system. Sample throughput is maximized in all areas of the instrument, from the sample introduction system to the unique, automated sample integration modes.
With its dual viewing of the plasma and two solid-state detectors (one for UV, one for Vis), the Optima 7300 DV offers superior detection limits and true simultaneous
measurements, ideal for laboratories with moderate to heavy loads of difficult samples.

ICP-OES

PV Measurement

QEX10

2011

The QEX10 Quantum Efficiency Measurement System is a Incident Photon to Current Conversion Efficiency (IPCE) Measurement System

Quantum Efficiency Measurement

Quatek (Nanometrics)

HL-5500

2011

The Nanometrics HL5500 is a turn-key, high performance Hall Effect System for the measurement of resistivity, carrier concentration and mobility in semiconductors.

Hall Effect System

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Any offer by you to purchase the equipment described on this page shall be subject to our standard terms and conditions of sale.

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