NOVA NOVASCAN 3090 P/N 390-10000-11 CMP metrology system for Sale

SDI fabsurplus.com is pleased to announce the availability of the following listed used NOVA NOVASCAN 3090 P/N 390-10000-11 CMP metrology system.
Please click on the "Get Quote" button at the end of the NOVASCAN 3090 P/N 390-10000-11 description, if you'd like to get a quotation, photos and specifications of this CMP metrology system, and your request for this equipment will be forwarded to our SDI sales representatives automatically.
This NOVA NOVASCAN 3090 P/N 390-10000-11 CMP metrology system is available for immediate sale.
Crating, refurbishment and delivery for this equipment can be quoted on request.

NOVA NOVASCAN 3090 P/N 390-10000-11 Equipment Details

SDI ID: 108033
Manufacturer: NOVA
Model: NOVASCAN 3090 P/N 390-10000-11
Description: CMP metrology system
Version: 300 mm
Vintage: Inquire
Quantity: 1
Sales Condition: as is where is
Lead Time: immediately
Sales Price: Inquire

-De-installed, warehoused. Can be inspected by appointment.
-Please refer to the attached photos , showing the items current condition
-Has CE mark
-Includes interface head, computer

The Novascan 3090 system is an advanced CMP metrology platform for all process steps such as Poly, STI, Tungsten (W) plugs and Copper interconnect. That includes, among other, oxide residue and Step-height for STI, profiling for Tungsten plugs, and residue detection, erosion and MLT (Metal Line Thickness) for copper interconnect process.

The NovaScan 3090 is based on Nova's earlier field proven technology platform, the NovaScan 3060 system. NovaScan 3090 is integrated in the exact same configuration as the NovaScan 3060 system, thus offering customers an easy upgrade path. Equipped with a single polarized channel, from Deep-UV to Near-IR, the NovaScan 3090 supports the measurement of solid areas, 2D structures and enables 3D shape characterization. The system provides real-time measurement of thickness and shape of dielectric materials and for a variety of Low-K materials.

The NovaScan 3090 delivers the measurement capability needed to control high-end 65nm and 45nm CMP applications. The unmatched MAM time of NovaScan 3090, the dynamic precision and tool-to-tool matching, along with built-in high reliability, all offer our customers a production worthy tool covering a wide range of metrology solutions, enabling Wafer-to-Wafer process control, without affecting the process tool's overall throughput.

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The data provided herein is not an offer capable of acceptance.
The information contained on this page is, to our knowledge and information, accurate, but it may contain errors and therefore we do not warrant the completeness or accuracy of the information contained on this page.
Any offer by you to purchase the equipment described on this page shall be subject to our standard terms and conditions of sale.

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