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KLA-Tencor Surfscan SP2 Wafer Particle Measurement System for Sale


SDI fabsurplus.com is pleased to announce the availability of the following listed used KLA-Tencor Surfscan SP2 Wafer Particle Measurement System.
Please click on the "Get Quote" button at the end of the Surfscan SP2 description, if you'd like to get a quotation, photos and specifications of this Wafer Particle Measurement System, and your request for this equipment will be forwarded to our SDI sales representatives automatically.
This KLA-Tencor Surfscan SP2 Wafer Particle Measurement System is available for immediate sale.
Crating, refurbishment and delivery for this equipment can be quoted on request.


KLA-Tencor Surfscan SP2 Equipment Details

SDI ID: 109198
Manufacturer: KLA-Tencor
Model: Surfscan SP2
Description: Wafer Particle Measurement System
Version: 300 mm
Vintage: 01.12.2010
Quantity: 1
Sales Condition: as is where is
Lead Time: immediately
Sales Price: Inquire
Comments:

Windows System   Windows XP SP3
Main S/W    NGS 5.4 SR3 HF3
Wafer Size   300mm SEMI Notch

Carrier
 3 AdvanTag SW CID, Phx, Shinko (load port)
 8 user-configurable LEDs to display the loadport status
 Load/unload button for manual delivery hand-off
 Cassette / wafer mapping which allows the tool to generate a wafer map of the 300mm FOUP and detect wafer presence, empty slots and cross-slotted wafer. The wafer map can be displayed on the user screen and sent to a SECS host.

Facilities
 Power: 208 VAC, 3W-N
 CDA: > 28.3 Nl/min, > 6.6791 kg/cm2
 Vac: > 28.317 l/min, > -700 mm Hg

Chamber
 Powder Coat Panels Kit
 200/300mm Vacuum option
 Optical Filter

Load port   Vacuum 300mm Dual FIMS

Application
 2mm Edge Exclusion
 Oblique Incidence Illumination (High / Standard / Low)
 Normal Incidence Illumination (High / Standard / Low)
 Enhanced XY Coordinates
 IDM SP2
 Standard Classification package
 LPD-N Classification
 LPD-ES classification
 Grading and Sorting
 Spatial Filter (20 degree)
 Spatial Filter (40 degree)
 Spatial filter (rough films)
 Spatial filter (Back)
 High Sensitivity Inspect Mode
 High Throughput Inspect Mode

Options
 Haze
 Haze Normalization
 Haze Analysis
 IC/OEM Mfg Surf Quality Recipe

Wafer size.   300mm XY Calibration Wafer with first Article

HARDWARE CONFIGURATION   
Others   5 Color Light Tower (RBYGW)

Ethernet
 NFS Client
 E84 enabled for OHT & AGV/RGV
 E87 (Based on E39)
 GEM/SECS and HSMS
 E40/ E94/ E90 / E116

Handler   Secondary UI, Phoenix, SP2

Main Computer
 Intel®Xeon™ CPU 3.20GHz
 3.5 GB RAM Memory
 DVD- ROM
 Mouse
 Keyboard
 3.5" Floppy
 NGS application software

FEC computer
 Intel®Pentium®4 CPU
 512 MB RAM Memory

Damaged/Missing parts list
Damaged- chuck,AC pin, wafer shutter assy., x axis stage leadscrew,x axis motor,center device,y axis assy.


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The data provided herein is not an offer capable of acceptance.
The information contained on this page is, to our knowledge and information, accurate, but it may contain errors and therefore we do not warrant the completeness or accuracy of the information contained on this page.
Any offer by you to purchase the equipment described on this page shall be subject to our standard terms and conditions of sale.

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