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Pre-owned Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com

Please find below a list of Used Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com .Click on any listed item of Fab Metrology , Inspection and QC Equipment to see further data.


SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
88877 Accent Caliper Elan Overlay Measurement 1 as is where is
81885 ADE NANOMAPPER Phase Shift NANOMAPPER 300 mm 01.06.2001 1 as is where is immediately
90248 ADE ＥＷＭ9800 GMR magnetic measurements 150 mm 02.03.2000 1 as is where is
91840 ADE 5810 Non-Contact Capacitance Gauging Module with 2ea ADE 2248 Probes 1 inquire
91841 ADE Episcan 1000 FT-IR Spectromter, ONLINE 2110 Spectrometer Head, IRVINE OPTICAL NanoLoader II 1 inquire
92685 ADE WAFER SIGHT WAFER FLATNESS GAGE 300 mm 1 as is where is
92686 ADE FIT3120 PARTICLE COUNTER 300 mm 1 as is where is
84360 Alcatel 925-40 Leak Detector 1 as is where is immediately
92208 Amray 3800c SEM - Defect Review (DR) 200mm 1 as is where is
71959 Applied Materials SEMVISION Defect Review SEM with EDX 200 mm 01.01.1999 1 as is where is immediately
71960 Applied Materials SEMVISION CX INSPECTION SEM 200 mm 01.06.2000 1 as is where is immediately
83514 Applied Materials Opal 7830i Enhanced CD-SEM 200 mm 01.06.1997 1 as is where is immediately
84982 Applied Materials Nanosem 3D Critical Dimension Scanning Electron Microscope 300 MM 01.06.2002 2 as is where is
84983 Applied Materials NANOSEM 3d Critical Dimension Scanning Electron Microscopes 300 mm 1 as is where is
84985 Applied Materials Uvision 200 Optical Inspection 300 MM 01.06.2005 1 as is where is
85943 Applied Materials VeritySEM 3 Critical Dimension Measurement SEM 300 mm 01.06.2007 1 as is where is immediately
86035 APPLIED MATERIALS SEMVISION CX REVIEW STATION, SEM DEFECT 300 mm 1 as is where is
86166 Applied Materials VERASEM 3D SEM 200 mm 01.06.2001 1 as is where is
86422 Applied Materials Orbot WF720 Wafer inspection system 125 mm 1 as is where is
87415 Applied Materials UVision 4 Wafer Inspection System 300 mm 01.06.2010 1 as is where is
88373 Applied Materials VeraSEM 3D Critical Dimension Measurement CD-SEM 200 mm 01.06.1999 2 as is where is immediately
88587 Applied Materials SEMVision G3 Defect Review SEM 300 MM 01.06.2006 1 as is where is immediately
88882 Applied Materials Elite MS MC E-BEAM INSPECTION SYSTEM 300 mm 1 as is where is
90564 Applied Materials VeritySEM 2 SEM - Critical Dimension (CD) Measurement 300 mm 01.06.2005 1 as is where is immediately
90565 Applied Materials VeritySEM 2 SEM - Critical Dimension (CD) Measurement 300 mm 01.06.2007 1 as is where is immediately
90566 Applied Materials VeritySEM 2 SEM - Critical Dimension (CD) Measurement 300 mm 01.01.2004 1 as is where is immediately
90567 Applied Materials VeritySEM 3 SEM - Critical Dimension (CD) Measurement 300 mm 01.06.2005 1 as is where is immediately
90568 Applied Materials VeritySEM 3 SEM - Critical Dimension (CD) Measurement 300 mm 01.06.2005 1 as is where is immediately
90569 Applied Materials VeritySEM 3 SEM - Critical Dimension (CD) Measurement 300 mm 01.06.2007 1 as is where is immediately
90947 Applied Materials UVision 4 Bright field inspection 300 mm 01.06.2009 1 as is where is
91712 Applied Materials Uvision 4 Wafer Inspection 300mm 1 as is where is
91951 APPLIED MATERIALS COMPLUS 4T WAFER INSPECTION 300 mm 01.03.2010 1 as is where is
92045 Applied Materials UV 5 Wafer Inspection System 300 mm 01.06.2012 1 as is where is immediately
92209 Applied Materials Uvision 200 Brightfield Inspection 300 mm 1 as is where is
92210 Applied Materials Uvision 4 Brightfield Inspection 300 mm 01.06.2011 1 as is where is
92401 Applied Materials SEMVision G3 Defect Review SEM with FIB 300 mm 01.01.2004 1 as is where is immediately
92800 Applied Materials Orbot WF720 Metrology (Metrology) 125 mm 1 as is where is
92801 Applied Materials SEMVision G3 Defect Review SEM 300 mm 01.06.2006 1 as is where is
92802 Applied Materials SEMVision G3 Lite Defect Review SEM 300 mm 01.06.2008 1 as is where is immediately
92803 Applied Materials SEMVision G3 FIB Defect Review SEM 300 mm 01.06.2011 1 as is where is
92804 Applied Materials WF720 Metrology (Metrology) 150 mm 01.06.1997 1 as is where is
92805 Applied Materials WF730 Metrology (Metrology) 150 mm 01.06.1996 1 as is where is
93395 Applied Materials UVision 3 Wafer Inspection System 200 mm 1 inquire immediately
93658 Applied Materials Excite High Speed Particle Detection System for Bare Wafer or Patterned Wafer Inspection 200 MM 1 as is where is
93847 Applied Materials Complus 4T Darkfield Defect Inspection System 300 mm 01.06.2007 1 as is where is immediately
91386 ASML YIELDSTAR_S100 300 mm 1 as is where is
86167 AUGUST AXI-S Macro Inspection 200 mm 1 as is where is
91387 AUGUST CV-9812 Wafer Carrier inspection tool 1 as is where is
86617 August / Rudolph Technologies NSX 90 macro defect inspection system 200 mm 1 as is where is immediately
93660 August Technology NSX-85 Automated Defect Inspection System 1 as is where is
33671 BIORAD Q5 Overlay Metrology Tool 1 inquire
33672 BIORAD Q6 Overlay Metrology Tool 1 inquire
33673 BIORAD Q7 Overlay Metrology Tool 1 inquire
77065 BIORAD QS-408M Manual FTIR Spectrometer for Epi, SiN, BPSG Measurement, up to 200mm Wafers 1 as is where is immediately
91842 BIORAD Q7/Q8 Overlay Metrology / CD Measurement Tool for up to 200mm Wafers, 2ea Available 1 inquire
91845 BIORAD QS-300 FT-IR Spectrometer for up to 200mm Wafers 1 inquire
91846 BIORAD QS-312 FT-IR Spectrometer for up to 300mm Wafers 1 inquire
91847 BIORAD QS-408M Manual FT-IR Spectrometer for Epi, SiN, BPSG Measurement & More, up to 200mm Wafers, 2ea Available 1 inquire
93339 Brooks Zaris Mask Exchange and Cleaner 300 mm 1 as is where is
88884 Bruker D8 Fabline X-Ray Metrology 1 as is where is immediately
93340 Bruker D8 Diffractometer X RAY DIFFRACTOMETER 300 MM 01.06.2008 1 as is where is
93341 Bruker D8 Fabline Xray Metrology 200MM / 300 mm 01.06.2009 1 as is where is
93661 Bruker Dektak XT Precision Stylus Profiler 1 as is where is
84534 Cameca IMS 6F / 7F (Spares) Eucentric Rotating sample stage spares 1 immediately
88247 CAMECA SC Ultra Total Magnetic Sector SIMS 01.06.2003 1 as is where is
88885 Cameca LEXFAB300 Diffusion Measurement 300 mm 1 as is where is
92678 CAMECA IMS-6F Magnetic Sector SIMS 01.06.1998 1 as is where is immediately
93342 Cameca IMS-6F Secondary Ion Mass Spectroscopy LABORATORY 01.06.1998 1 as is where is
93343 Cameca IMS-7F Secondary Ion Mass Spectroscopy LABORATORY 01.06.2005 1 as is where is
79191 Camtek Condor 103PD Post saw 2D inspection 300 mm 01.06.2013 1 as is where is immediately
91952 CAMTEK EM3I WAFER INSPECTION SYSTEM 300 MM 01.08.2012 1 as is where is
86568 Canon Anelva C-7100GT Stepper 300mm 1 as is where is
74929 CDE Resmap 463 OC Resistivity Measurement up to 300 mm 1 as is where is immediately
93662 CDE Resmap 273 Large Substrate Resistivity Mapping System 1 as is where is
53036 COMPUMOTOR M575L11 Stepping motor drive spares 1 as is where is immediately
87099 Disco 3350 Dicing 200mm 4 as is where is immediately
87833 Disco DAD6450 Dicing and handler 200mm 1 as is where is immediately
90249 ECI QP-4000 CVS analysis 150 mm 02.05.1996 1 as is where is
90250 ECI QP-4000 Spectrophotometer 150 mm 02.10.1994 1 as is where is
88248 ECI Technology Qualilab QL-100EX Plating Bath Analysis 200mm 1 as is where is
88249 ECI Technology Qualilab QL-5EX Plating Bath Analysis 200mm 1 as is where is
89978 Edwards IPX-500 Dry Pump 1 as is where is
92213 ESCO EMD-WA1000S Temperature Desorption Analyzer 200mm 01.06.2000 1 as is where is
14505 FEI XL835 Dual beam FIB workstation 01.06.1998 1 inquire 2 weeks
79226 FEI DB 235 Dual Beam FIB SEM 01.06.2000 1 inquire
86036 FEI 1265 DUAL BEAM FIB 300 mm 1 as is where is
86037 FEI EXPIDA 1255S MANUAL LOAD, NO STEM, NGSEM COL 300 mm 1 as is where is
86168 FEI STRATA 400S Dual beam FIB 01.06.2005 1 as is where is immediately
86292 FEI F30 Technai FIB SEM 1
86293 FEI Quanta 200 3D FIB SEM 1
86294 FEI DB 835 FIB SEM 1
86295 FEI Quanta 400 FIB SEM 1 inquire immediately
86300 FEI Nova nano 230 FIB SEM 1 inquire immediately
86325 FEI Strata 400S Dual Beam FIB SEM 01.06.2006 1 inquire immediately
87418 FEI Tecnai G2 F30 S-TEM Unspecified 01.06.2006 1 as is where is
88886 FEI DA300 FIB -Focused Ion Beam Defect Analysis 300 mm 1 as is where is
89021 FEI Vectra + FIB Sem Laboratory 01.10.1998 1 as is where is immediately
90251 FEI AUTO THP 800 FIB SEM 150 mm 02.01.2000 1 as is where is
90326 FEI Helios Nanolab 460HP Dual Beam Fib SEM Laboratory 01.06.2014 1 inquire immediately
91391 FEI EXPIDIA DB 1255 Dual Beam FIB-SEM N/A 1 as is where is
91392 FEI FEM2010F Dual Beam FIB-SEM N/A 1 as is where is
91393 FEI HELIOS_400S Dual Beam FIB-SEM N/A 1 as is where is
91394 FEI STRATA_400S Dual Beam FIB-SEM N/A 1 as is where is
92040 FEI TF30 Super twin 01.10.2007 1 as is all rebuilt immediately
92216 FEI Helios NanoLab 1200HP Focused Ion Beam System 300 mm 1 as is where is
92679 FEI Helios 400S FIB SEM 1 as is where is
92680 FEI Quanta3D FIB SEM 1 as is where is
92682 FEI HELIOS NNL FIB SEM 1 as is where is
93344 FEI CLM 3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool LABORATORY 1 as is where is
93345 FEI EXPIDA FiB sem 300 mm 01.06.2004 1 as is where is
93346 FEI Titan Advanced Analytical TEM Laboratory 01.06.2010 1 as is where is
93579 FEI Tecnai 20 S-TWIN 200 kv TEM Laboratory 01.06.2001 1 as is where is immediately
86235 FEI Company 820 Dual Bem Fib SEM 200 mm 1 as is where is immediately
90252 FF Trust 2.5GK Magnetic field applied measurement 150 mm 02.02.2000 1 as is where is
88252 First Ten Angstroms FTA3000 Life Sciences, Particle Analysis 300mm 01.01.2010 1 as is where is
86898 Fries Research & Technology (FRT) MicroProf MPR 200 TTV MHU 4 Film Thickness Measurement System 200 mm 01.01.2011 1 as is where is immediately
90571 Fries Research & Technology (FRT) MicroProf MPR 200 TTV MHU 4 Film Thickness Measurement System 200 mm 01.06.2011 1 as is where is immediately
55974 FRONTIER FSM900TC-VAC FILM STRESS AND WAFER BOW MEASUREMENT 200 mm 01.05.2000 1 as is where is immediately
88253 FSE FSE-CS-300 Evaporator Deposition Equipment 200mm 1 as is where is
90155 FSM FSM 500TC THIN FILM STRESS MEASUREMENT 01.02.2007 1 as is where is
90156 FSM 500TC THIN FILM STRESS MEASUREMENT 01.06.2004 1 as is where is
93084 FSM SYMPHONYMC Life Time 300 MM 1 as is where is
90157 GAETNER L115C-8 ELLIPSOMETER 01.03.1995 1 as is where is
91999 H-Square QBL 150 Flat and notch aligner 150 mm 01.06.2000 1 as is where is immediately
52151 Hamamatsu R1924A Photomultiplier spares 01.04.2007 1 inquire immediately
71907 Hamamatsu C7103 PC Controlled IC Back-side Lapping and Wafer Grinding System 200 mm and packages 01.10.2001 1 inquire immediately
91105 Hermes EPOINTER E-beam inspection 300 mm 1 as is where is
93347 Hermes Microvision ep3 XP 300mm, e-beam inspection system 300 mm 01.06.2012 1 as is where is
92611 Hermes Microvision (HMI) eScan-315XP E-beam Inspection 300mm 01.09.2008 1 as is where is
92687 HIMS NMI-100 DEFECT INSPECTION SYSTEM 300 mm 1 as is where is
36259 HITACHI S-9300 SEM - CD (CRITICAL DIMENSION) 200mm 01.06.2005 1 inquire 1 month
52166 Hitachi 545-5515 DC power supply module spares 1 as is where is immediately
52167 Hitachi 6280H Power Supply Module 4channels 1 as is where is immediately
52168 Hitachi 6280H Power Supply unit 1 as is where is immediately
52339 Hitachi 545-5521 spares 01.06.1994 1 as is where is immediately
52340 Hitachi 5455537 IP-PC2 spares 01.06.1994 1 as is where is immediately
52343 Hitachi 377-7592 Power Supply Module 01.06.1994 1 as is where is immediately
53054 HITACHI 6280H SORD Computer spares 1 as is where is immediately
56838 Hitachi S-4500 FE Inspection SEM Type 1 chamber 1 as is all rebuilt immediately
60939 HITACHI S4160 01.06.1996 1 as is where is
60958 HITACHI S6280 1 as is where is
60964 HITACHI S7800HSA 1 as is where is
65359 HITACHI S-9220 SIP baord for CD-SEM S9220,P/N 568-5591 1 as is where is immediately
74794 Hitachi S5200 FE SEM with EDX Inspection 01.06.2005 1 as is where is immediately
78108 Hitachi S4700 Type 2 FE-SEM Up to 6 inch 01.06.2006 1 as is all rebuilt immediately
78165 Hitachi S8820 CD SEM 200 mm 01.07.1996 1 as is where is immediately
78685 HITACHI DES-9300 METRO 300 MM 01.04.2001 1 as is where is
78690 HITACHI S-9300 CD-SEM 300 MM 01.06.2001 1 as is where is immediately
78693 HITACHI S9360 CD-SEM 300 MM 01.01.2003 1 as is where is
82262 HITACHI S-9360 CD SEM 8"/12" 01.06.2004 1 as is where is immediately
82687 HITACHI S9380Ⅱ CD SEM 300 mm 01.06.2006 1 as is where is
82688 HITACHI S9380Ⅱ CD SEM 300 mm 01.06.2006 1 as is where is
83585 Hitachi S5000H Field Emission SEM Laboratory 1 as is where is immediately
83649 Hitachi IS2700SE Wafer Inspection System 300 mm 01.06.2004 1 inquire immediately
84345 Hitachi EA8000 X-ray Particle Contaminant Analyzer 1 as is where is immediately
84839 Hitachi S2700 Scanning Electron Microscope Laboratory 1 as is where is immediately
85952 Hitachi LS6800 Particle Measurement 300 mm 01.01.2008 1 as is where is immediately
86169 HITACHI FB-2000A FIB Sem 200 mm 01.06.2001 1 as is where is
86170 HITACHI RS3000 Defect Review SEM 200 mm/300 mm 01.07.2001 1 as is where is immediately
86171 HITACHI S-4700 (w/EDAX) FE SEM with EDX 01.06.1998 1 as is where is
86172 HITACHI S-5000 FE SEM 200 mm 01.06.1994 1 as is where is
86173 HITACHI S-5000 FE SEM 200 mm 01.06.1996 1 as is where is
86174 HITACHI S-5000 FE SEM 200 mm 01.06.1999 1 as is where is
86175 HITACHI S-5000 FE SEM 200 mm 01.06.2000 1 as is where is
86178 HITACHI S-9360 CD-SEM 300 mm 01.06.2003 1 as is where is
86275 Hitachi RS4000 In-line Defect Review SEM 200 mm / 300 mm 01.01.2007 1 as is where is immediately
86296 Hitachi 3600N SEM 1 inquire immediately
86297 Hitachi S5200 FE-SEM 1 inquire immediately
86298 Hitachi S4800 FE-SEM 1 inquire immediately
86299 Hitachi s3000H SEM 1 inquire immediately
86463 HITACHI I6300 e-beam WAFER INSPECTION 12 Inch 01.06.2007 1 as is where is immediately
86553 Hitachi S-5500 SEM 200mm 1 as is where is
87409 Hitachi S-5500 High Resolution FE SEM 01.06.2006 1 as is where is
87410 Hitachi S-4800-II FE SEM 150/200mm 01.06.2005 1 as is where is
87411 Hitachi S-4700-II FE SEM 150/200mm 1 as is where is
87412 Hitachi HD-2300 STEM 1 as is where is
88588 Hitachi I6300 Defect Inspection 300 MM 1 as is where is
88589 Hitachi IS2700 Dark Field inspection 300 MM 01.06.2005 1 as is where is
88590 Hitachi RS3000 Review SEM 200 MM, 300 MM 01.06.2003 1 as is where is
88591 Hitachi RS3000T Review SEM 300 MM 01.06.2007 1 as is where is
88592 Hitachi RS4000 Review SEM 300 MM 01.06.2006 1 as is where is
88887 Hitachi S-9380 CD-SEM 1 as is where is
88948 Hitachi S9380 CD SEM metrology ( Working ) Spares 1 inquire immediately
88949 Hitachi S9380 II CD SEM metrology (As-Is) Spares 1 as is where is immediately
90262 Hitachi WR-R30-H13 WF-30 Microscope inspection station 150 mm 02.07.1997 1 as is where is
90353 HITACHI S9380 II CD SEM 300 mm 01.06.2005 1 as is where is immediately
90948 Hitachi I6300 Defect Inspection 300 mm 1 as is where is
90949 Hitachi RS5000 DR SEM 300 mm 01.06.2007 1 as is where is
90950 Hitachi S-5200 FE SEM - 01.06.2001 1 as is where is
91005 Hitachi RS 5500 Defect Review SEM 300 MM 01.06.2009 1 as is where is immediately
91006 Hitachi RS 5500 Defect Review SEM 300 MM 01.06.2009 1 as is where is immediately
91085 HITACHI IS-2700 Wafer Inspection Station 300 mm 1 as is where is
91086 HITACHI S-4160 FE SEM Laboratory 01.06.1996 1 as is where is
91087 HITACHI S-4160 FE SEM Laboratory 01.06.1996 1 as is where is
91088 HITACHI S-4800 FE SEM Laboratory 01.06.2005 1 as is where is
91089 HITACHI S-5500 FE SEM Laboratory 01.06.2006 1 as is where is
91090 HITACHI S-5500 FE SEM Laboratory 01.06.2012 1 as is where is
91091 HITACHI S-5500 FE SEM Laboratory 01.06.2010 1 as is where is
91092 HITACHI S-9380 II CD SEM 300 mm 01.06.2006 1 as is where is
91093 HITACHI S-9380 II CD SEM 300 mm 01.06.2006 1 as is where is
91094 HITACHI S-9380 II CD SEM 300 mm 01.06.2007 1 as is where is
91095 HITACHI S-9380 II CD SEM 300 mm 01.06.2007 1 as is where is
91096 HITACHI S-9380 II CD SEM 300 mm 01.06.2005 1 as is where is
91097 HITACHI S-9380 II CD SEM 300 mm 01.06.2007 1 as is where is
91098 HITACHI S-9380 II CD SEM 300 mm 01.06.2006 1 as is where is
91099 HITACHI S-9380 II CD SEM 300 mm 01.06.2006 1 as is where is
91100 HITACHI S-9380 II CD SEM 300 mm 01.06.2007 1 inquire immediately
91101 HITACHI S-9380 II CD SEM 300 mm 01.06.2004 1 as is where is
91102 HITACHI S-9380 II CD SEM 300 mm 01.06.2003 1 as is where is
91103 HITACHI WA-1300 ATOMIC FORCE MICROSCOPE 300 mm 1 as is where is
91104 HITACHI WA3300 atomic force microscope - 1 as is where is
91395 HITACHI I-6300 CD SEM 1 as is where is
91396 HITACHI IS2700SE Dark Field inspection 300 mm 01.06.2006 1 as is where is
91397 HITACHI IS2700SE Dark Field inspection 1 as is where is
91398 HITACHI IS3000E High Speed Dark Field inspection 300 mm 01.06.2007 1 as is where is
91399 HITACHI IS3000E High Speed Dark Field inspection 300 mm 01.06.2007 1 as is where is
91400 HITACHI IS3000E High Speed Dark Field inspection 300 mm 01.06.2007 1 as is where is
91401 HITACHI IS3000E High Speed Dark Field inspection 300 mm 01.06.2007 1 as is where is
91402 HITACHI IS3000E High Speed Dark Field inspection 300 mm 01.06.2007 1 as is where is
91403 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91404 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91405 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91406 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91407 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91408 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91409 HITACHI S-7800HSA CD SEM 150 mm,200 mm 01.06.1996 1 as is where is
91410 HITACHI S-8820 CD SEM 200 mm 01.06.1994 1 as is where is
91411 HITACHI S-9260A CD SEM 200 mm 01.06.2018 1 as is where is immediately
91416 HITACHI LS-6800 wafer surface inspection 200 mm /300 mm 1 as is where is
91417 HITACHI LS-6800 wafer surface inspection 300 mm 01.06.2007 1 as is where is
91418 HITACHI UA-7200 Stripper/Asher 01.06.2001 1 as is where is
91714 Hitachi LS-7800 Bare wafer inspection 300mm 1 as is where is
91715 Hitachi S-4300 FE SEM Laboratory 1 as is where is
91716 Hitachi S-5000 FE SEM Laboratory 1 as is where is
91717 Hitachi S-4160 FE SEM Laboratory 1 as is where is immediately
91821 HITACHI S9380Ⅱ CD SEM 01.06.2007 1 as is where is
91848 HITACHI S-7000 CD SEM Measurement Tool 1 inquire
91953 HITACHI S9380 II CD SEM 300 MM 01.06.2006 1 as is where is
91954 HITACHI S9380 II CD SEM 300 MM 01.10.2007 1 as is where is
91955 HITACHI S9380 II CD SEM 300 mm 01.12.2003 1 as is where is
91956 HITACHI S9380 II CD SEM 300 mm 01.09.2005 1 as is where is
91957 HITACHI S9380 II CD SEM 300 mm 01.02.2004 1 as is where is
91958 HITACHI S9380 II CD SEM 300 mm 01.06.2006 1 as is where is
91959 HITACHI S9380 II CD SEM 300 mm 01.05.2005 1 as is where is
91960 HITACHI S9380 II CD SEM 300 mm 01.07.2004 1 as is where is
91961 HITACHI S9380 II CD SEM 300 mm 01.07.2006 1 as is where is
92027 HITACHI S9300 CD SEM 200-300 mm 01.06.2001 4 as is where is immediately
92217 Hitachi LS6800 Particle Measurement 300 mm 01.10.2007 1 as is where is
92218 Hitachi WA3300 Atomic Force Microscope (AFM) 300 mm 1 as is where is
92683 HITACHI S-5500 REVIEW-SEM 1 as is where is
92684 HITACHI S-5500 REVIEW 1 as is where is
92688 HITACHI I6300 E-BEAM 300 mm 1 as is where is
92701 HITACHI S5500 SEM 01.06.2007 1 as is where is
92806 Hitachi RS4000 Defect Review SEM 300 mm 1 as is where is
92807 Hitachi S-8840 CD-SEM (Metrology) 200 mm 01.06.1997 1 as is where is
92808 Hitachi S-9360 CD SEM (Metrology) 300 mm 01.06.2003 1 as is where is
92809 Hitachi S-9380II CD SEM (Metrology) 01.06.2007 1 as is where is
92810 Hitachi S-9380II CD SEM (Metrology) 300 mm 01.06.2007 1 as is where is
93085 HITACHI S9380 2 CD SEM 300 mm 01.06.2004 1 as is where is
93086 HITACHI S9380 2 CD SEM 300 mm 01.06.2004 1 as is where is
93348 Hitachi HF-2000 200 kev advanced EDX/EELs/STEM imaging LABORATORY 01.06.1995 1 as is where is
93349 Hitachi S-9380 II CD SEM 300 mm 01.06.2005 1 as is where is
93350 Hitachi S-9380 II CD SEM 300 mm 01.06.2005 1 as is where is
93374 Hitachi S4700 FIELD EMISSION SEM Laboratory 01.06.2004 1 as is where is immediately
93394 Hitachi S9380 ii CD SEM 300 mm 01.08.2007 1 inquire immediately
93580 Hitachi S-5200 FE Sem Laboratory 01.06.2004 1 as is where is immediately
90951 Hitachi Kokusai VR-120SD Resistivity Measurement 300 mm 1 as is where is
87825 Horiba PD3000 Reticle inspection system 200 MM 01.06.1995 1 as is where is immediately
88596 Horiba PR-PD2 Reticle/Mask Particle Detection System 150 MM 01.06.2005 1 as is where is
90670 Horiba Jobin Evon PZ2000 Ellipsometer 200 mm 01.06.2000 1 as is where is immediately
93351 HSEB Axiospect300 300 mm wafer inspection microscope 300 mm 01.07.2006 1 as is where is
86681 Hypervision PTF1 IR Emission Microscope 01.06.2000 1 as is where is immediately
91849 IONIC SYSTEMS Stressgauge II Wafer Stress Measurement Tool, 150mm Wafers 1 inquire
91850 IRVINE OPTICAL UltraSpec III Wafer Inspection Station with Nikon Optiphot Optics 1 inquire
91851 IRVINE OPTICAL Ultrastation 3 Macro Inspection Station 1 inquire
91852 IRVINE OPTICAL Ultrastation 3.B Wafer Inspection Station with Nikon BD Plan Optics, Trinocular Head, For up to 150mm Wafers 1 inquire
91419 J.A Woollam VUV-VASE (Gen II) Ellipsometer 300 mm 1 as is where is
91420 J.A Woollam VUV-VASE VU302 (Gen I) Ellipsometer 200 mm 01.06.2001 1 as is where is
93087 J.A Woollam VUV-VASE (Gen II) Ellipsometer 300 MM 1 as is where is
91421 J.A.WOOLAM M-2000X spectroscopic ellipsometers 1 as is where is
93088 J.A.WOOLAM VUV-VASE VU302 (Gen I) Ellipsometer 200 mm 01.06.2001 1 as is where is
84540 JEOL 2100F TEM 200 mm 01.01.2004 1 as is where is immediately
86179 JEOL JSM-840A FE SEM 1 as is where is
87098 JEOL JWS-7505 Defect review SEM w/ EDX, untested 200 mm 01.01.2001 1 as is where is
87627 JEOL JSM 6400 Scanning Electron Microscope 1 as is where is immediately
87828 Jeol JWS7555 Scanning Electron Microscopes 200 mm 01.01.2000 1 as is where is immediately
90952 JEOL JSM-7401F FE SEM 300 mm 01.06.2006 1 as is where is
91422 JEOL JSM-5600 FE SEM 01.06.1999 1 as is where is
91423 JEOL JSM-6340F FE SEM 1 as is where is
91424 JEOL JSM-6700F FE SEM 1 as is where is
91425 JEOL JWS-7515 WAFER INSPECTION 1 as is where is
91426 JEOL JWS-7515 WAFER INSPECTION 1 as is where is
91899 Jeol jSM 6330F FIELD EMISSION SEM 1 as is where is immediately
92068 JEOL JSM 6400F Scanning Electron Microscope 1 as is where is immediately
92219 JEOL JSM-6460LV FE SEM 01.06.2004 1 as is where is
92220 JEOL JWS-7555 SEM - Defect Review (DR) 200mm 1 as is where is
93089 JEOL JSM-5600 FE SEM 01.06.1999 1 as is where is
93311 JEOL JSM-6320 Field Emission SEM Laboratory 1 as is where is immediately
93663 Jeol JWS-7515 In-Line Wafer Inspection Electron Microscope. 1 as is where is
93664 Jeol JWS-7515 In-Line Wafer Inspection Electron Microscope 1 as is where is
93665 Jeol JWS-7555 Wafer Inspection SEM 1 as is where is
92062 JOEL JSM-6550F INSPECTION SEM 1 as is fob immediately
87061 Jordan Valley Bede Metrix X-Ray difractometer (Missing Parts) 200 mm 01.01.2005 1 as is where is immediately
90575 JORDAN VALLEY JVX 6200i X-ray Fluorescence Spectrometer 300 mm 01.06.2013 1 as is where is immediately
91427 Jordan Valley JVX 6200 X-ray metrology (X-Ray Reflectivity) 300 mm 1 as is where is
91428 Jordan Valley JVX 6200i X-ray metrology (X-Ray Reflectivity) 300 mm 01.06.2010 1 as is where is
91429 KEITHLEY KEITHLEY 236 SOURCE MEASURE UNIT 1 as is where is
91430 KEITHLEY KEITHLEY 236 SOURCE MEASURE UNIT 1 as is where is
83644 Keyence VH-7000 175X Digital HD Microscope 1 as is where is immediately
90253 Keyence VF-7500 Laser dimension measurement 150 mm 02.03.2000 1 as is where is
82672 KLA 2132 bright-field WAFER INSPECTION 200mm 1 as is where is immediately
86327 KLA RS35e resistivity measurement 6 1 as is where is
88377 KLA Tencor FLX 2320S Wafer Stress Measurement 200 mm 01.06.2003 1 as is where is immediately
87630 KLA - Tencor Alphastep IQ Surface measurement 4 inch 1 as is where is immediately
91992 KLA -TENCOR 8100 Critical Dimension Measurement CD-SEM (FOR SPARES USE) 200 mm 01.06.1999 2 as is where is immediately
32230 KLA TENCOR SFS6400 MECHANICAL CALIBRATION Document Number 238 WAFERSURFACE ANALYSIS SYSTEM CUSTOMER MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
32231 KLA TENCOR Surfscan 64X0 Calibration Procedure Surfscan 64X0 Calibration Procedure MANUAL 1 as is where is immediately
32232 KLA TENCOR surfscan 64XX optical alignments Document Number 236 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
32233 KLA TENCOR SFS6x00 MECHANICAL CALIBRATION Document number 200 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
60951 KLA Tencor 5100? 1 as is where is
60952 KLA Tencor AIT 1 as is where is
60953 KLA Tencor 2135 brightfield wafer defect inspection 200 mm 01.06.1996 1 as is where is immediately
86613 KLA Tencor Wafersight Inspection 200mm 1 as is where is
90663 KLA- TENCOR Candela 6120 Wafer Inspection 200 mm 1 as is where is immediately
90662 KLA-TENCOR 2132 Wafer Inspection - 200mm silicon 200 mm 01.04.1996 1 as is where is immediately
91991 KLA-TENCOR 8100 XP Critical Dimension Measurement CD-SEM 200 mm 01.06.2000 2 as is where is immediately
1680 KLA-TENCOR 2132 bright-field WAFER INSPECTION 200 mm 01.08.1995 1 as is where is immediately
1691 KLA-TENCOR 259 (spare parts) Reticle Inspection - SPARE PARTS up to 7 inch 01.12.1991 1 inquire immediately
53035 KLA-Tencor 2132 Wafer chuck, 8" spares 1 as is where is immediately
64168 KLA-Tencor 2131 Wafer Defect Inspection 200mm 01.06.1995 1 as is where is immediately
70127 KLA-Tencor AIT UV PATTERNED WAFER INSPECTION 200 mm 01.08.2003 1 as is where is immediately
71632 KLA-TENCOR 2122 WAFER DEFECT INSPECTION 200 mm 1 as is where is immediately
74643 KLA-Tencor 710-013838-00 Rev 1 PCB Universal Video Mux spares 01.06.1993 1 as is where is
76676 KLA-TENCOR AIT XP FUSION Dark Field WAFER PARTICLE DETECTION 200 mm 01.10.2002 1 as is where is immediately
76677 KLA-TENCOR AIT FUSION Dark Field WAFER PARTICLE DETECTION 200 mm 01.06.2002 1 as is where is immediately
76681 KLA-TENCOR AIT UV Dark Field WAFER PARTICLE DETECTION 200 mm 01.01.2003 1 as is where is immediately
76682 KLA-TENCOR AIT UV Dark field wafer particle inspection system 200 mm 01.10.2003 1 as is where is immediately
76684 KLA-TENCOR P20H PROFILOMETER 200 mm 01.04.1996 1 as is where is immediately
76947 KLA-Tencor RS 55 Resisitivity Measurement 150 mm and 200 mm 1 as is where is immediately
78697 KLA-Tencor INS3300 MICROSCOPE INSPECTION STATION 300 MM 01.06.2006 1 as is where is
79152 KLA-Tencor 6420 Surface Particle Detection System 200 mm 01.06.1998 1 inquire immediately
79825 KLA-Tencor EV 300 Scanning Electron Microscope with Oxford EDX 01.06.2002 1 as is where is immediately
79847 KLA-Tencor 2915 inspection and metrology 300 mm 01.06.2012 1 inquire immediately
80213 KLA-Tencor 6220 wafer particle inspection 1 as is where is immediately
83698 KLA-Tencor AIT XP+ Darkfield Inspection 8" 1 as is where is
83700 KLA-Tencor FLX 2908 Thin film stress measurement system 200 mm 01.08.2001 1 as is where is immediately
83702 KLA-Tencor AMRAY 4200 Review SEM 8" 01.03.1999 1 as is where is immediately
83704 KLA-TENCOR Optiprobe 2600DUV Metrology 8" 1 as is where is
84034 KLA-Tencor SP2 wafer surface inspection system 300 mm 01.02.2006 1 inquire immediately
84157 KLA-TENCOR SP2 Darkfield Wafer Inspection 300 mm 01.12.2004 1 as is where is immediately
84299 KLA-Tencor SP2 XP Wafer surface particle detection 300 mm 01.02.2014 1 as is where is immediately
84523 KLA-Tencor RS 55 (TC) Resisitivity Measurement 150 MM AND 200 MM 01.06.1997 1 as is where is immediately
85023 KLA-Tencor 2132 Optical Inspection 200 mm 01.06.1995 1 as is where is
85024 KLA-Tencor 2132 Optical Inspection 200 mm 01.06.1996 1 as is where is
85027 KLA-Tencor AIT Surfscan Particle Counters 200 mm 01.06.1999 1 as is where is
85028 KLA-Tencor AIT XUV Surface particle measurement 300 MM 01.06.2006 1 as is where is
85039 KLA-Tencor UV 1050 FTIR – surface film measurement 200 mm 01.06.1995 1 as is where is immediately
85391 KLA-Tencor KLA5200XP Overlay Measurement 200mm 01.01.1998 1 as is where is immediately
85953 KLA-Tencor AIT XP Parts/Options 200 mm 1 as is where is
85954 KLA-Tencor AIT XP Parts/Options 200 mm 1 as is where is
86038 KLA-Tencor AIT UV++ DARKFIELD PATTERN INSPECTION 300 mm 1 as is where is
86039 KLA-Tencor AIT-XP PLUS PATTERNED WAFER INSPECTION, DARK FIELD 300 mm 1 as is where is
86040 KLA-Tencor SCD-XT SCATTEROMETRY METROLOGY TOOL, NC 300 mm 1 as is where is
86180 KLA-TENCOR AIT-UV WAFER PARTICLE INSPECTION 200 mm 01.06.2002 1 as is where is
86181 KLA-TENCOR AIT-XP WAFER PARTICLE INSPECTION 200 mm 1 as is where is
86182 KLA-TENCOR ARCHER 10XT OPTICAL OVERLAY MEASUREMENT 300 mm 01.06.2003 1 as is where is
86183 KLA-TENCOR 2370 (BLAZER) BRIGHTFIELD WAFER INSPECTION 300 mm 01.06.2002 1 as is where is immediately
86419 KLA-Tencor AIT 1 wafer particle detection 150 mm 1 as is where is
86424 KLA-Tencor 7700 Surfscan 125 mm 01.02.1996 1 as is where is
87084 KLA-TENCOR 2135 Brightfield Wafer Inspection 200 mm 01.01.2000 1 as is where is immediately
87417 KLA-Tencor eDR-5210 Defect review Sem 300 mm 1 as is where is
87421 KLA-Tencor Puma 9550 WAFER INSPECTION 300 mm 01.06.2011 1 as is where is
87422 KLA-Tencor 2360 BRIGHT FIELD WAFER INSPECTION 200 mm 01.06.2001 1 as is where is
87790 KLA-Tencor FLX 2908 Thin Film Measurement System 200 mm 01.04.1996 1 as is where is immediately
87791 KLA-Tencor P2 Surface Profiler 200 mm 1 as is where is
88266 KLA-Tencor eS20XP E-beam Inspection 200mm 01.01.2001 1 as is where is
88364 Kla-Tencor 2135 Birghtfield wafer defect inspection 150 mm or 200 mm 01.06.1995 1 inquire
88365 Kla-Tencor 2135 XP Birghtfield wafer defect inspection 150 mm or 200 mm 01.06.1997 1 inquire
88366 Kla-Tencor 2139 Birghtfield wafer defect inspection 150 mm or 200 mm 01.06.2000 1 as is where is immediately
88367 Kla-Tencor P11 WAFER SURFACE PROFILOMETER 200 mm OR SMALLER 01.06.1997 1 as is where is immediately
88368 Kla-Tencor P15 WAFER SURFACE PROFILOMETER 200 mm OR SMALLER 01.06.2007 1 inquire immediately
88369 Kla-Tencor 5200 Overlay measurement (For spares use) 200 mm 01.06.1997 1 inquire immediately
88370 Kla-Tencor FLX 2908 Wafer Stress Measurement 1 inquire
88378 Kla-Tencor Alpha Step IQ Profileometer Manual 1 inquire immediately
88379 Kla-Tencor AIT 2 Surfscan wafer particle detection system 200 mm 01.06.1998 1 inquire
88597 KLA-Tencor AIT Fusion XUV Dark Field inspection 300 MM 01.06.2004 1 as is where is
88600 KLA-Tencor Aleris HX8500 Thickness Measurement 300 MM 01.06.2008 1 as is where is
88601 KLA-Tencor Archer 10 AIM+ Overlay 300 MM 01.06.2002 1 as is where is
88602 KLA-Tencor Archer AIM MPX Overlay 300 MM 01.06.2005 1 as is where is
88603 KLA-Tencor Archer AIM+ Overlay 300 MM 01.06.2006 1 as is where is
88605 KLA-Tencor EDR5210 Defect Review SEM 300 MM 01.06.2010 1 as is where is
88607 KLA-Tencor INM100+INS10 Metrology 150 MM 1 as is where is
88608 KLA-Tencor INS3300G1 Macro inspection 300 MM 01.06.2001 1 as is where is
88609 KLA-Tencor KLA2552 Data Review Station 200 MM 01.06.1996 1 as is where is
88610 KLA-Tencor KLA2800 Bright Field Inspection 300 MM 01.06.2007 1 as is where is
88611 KLA-Tencor LDS3300M Macro inspection 200 MM 1 as is where is
88613 KLA-Tencor Puma 9000S Dark Field inspection 300 MM 01.06.2005 1 as is where is
88614 KLA-Tencor Puma 9130 Dark Field inspection 300 MM 01.06.2005 1 as is where is
88896 KLA-Tencor SL515 Mask Defect Inspection 1 as is where is
89977 KLA-Tencor Surfscan 4000 Metrology 150mm 1 as is where is
90108 KLA-TENCOR FX200 Film Thickness Measurement 300 mm 01.06.2005 1 as is where is immediately
90307 KLA-Tencor P17 Stylus profileometer 200 mm 01.06.2014 1 as is where is immediately
90324 KLA-Tencor KLA5200XP Overlay Measurement 200mm 1 as is where is immediately
90576 KLA-Tencor Aleris 8330 Film Thickness Measurement System 300 mm 01.06.2013 1 as is where is
90953 KLA-Tencor AIT Fusion Dark Field inspection 200 mm 01.06.2003 1 as is where is
90954 KLA-Tencor Aleris CX Film thickness measurements 300 mm 01.06.2007 1 as is where is
90955 KLA-Tencor AWIS-3110 Particle counter 200 mm 01.06.2003 1 as is where is
90956 KLA-Tencor AWIS-3110 Particle counter 200 mm 01.06.2001 1 as is where is
90957 KLA-Tencor EDR5210 DR SEM 300 mm 1 as is where is
90958 KLA-Tencor KLA2371 Bright field 200 mm 01.06.2004 1 as is where is
90959 KLA-Tencor KLA5100 Overlay Measurement 200 mm 1 as is where is
90960 KLA-Tencor NANOMAPPER Nanotopography 300 mm 01.06.2006 1 as is where is
90961 KLA-Tencor Puma 9000 Dark field defect Inspection 300 mm 01.06.2005 1 as is where is
90962 KLA-Tencor Puma 9100 Dark field defect Inspection 300 mm 01.06.2007 1 as is where is
91007 KLA-Tencor Aset F5x Thin Film measurement 300 MM 01.11.2003 1 as is where is immediately
91012 KLA-TENCOR AIT-XP Wafer particle inspection 300mm 1 as is where is
91013 KLA-TENCOR AIT-XP Wafer particle inspection 300mm 1 as is where is
91106 KLA-Tencor ARCHER 100AIM Overlay Measurement 300 mm 1 as is where is
91107 KLA-Tencor ARCHER 100AIM Overlay Measurement 300 mm 1 as is where is
91108 KLA-Tencor 2131 Brightfield wafer inspection - 1 as is where is
91109 KLA-Tencor 2810 Brightfield wafer inspection 300 mm 01.06.2008 1 as is where is
91110 KLA-Tencor PUMA 9000D Wafer Inspection System 200 mm 1 as is where is
91111 KLA-Tencor PUMA 9000D Wafer Inspection System 300 mm 01.06.2006 1 as is where is
91112 KLA-Tencor PUMA 9000D Wafer Inspection System 300 mm 01.06.2005 1 as is where is
91431 KLA-Tencor 2350 Brightfield Wafer Defect Inspection 200 mm 01.06.2001 1 as is where is
91432 KLA-Tencor 2350 Brightfield Wafer Defect Inspection 200 mm 01.06.2001 1 as is where is
91433 KLA-Tencor 2350 Brightfield Wafer Defect Inspection 300 mm 1 as is where is
91434 KLA-Tencor 2800 IS Brightfield Wafer Defect Inspection 300 mm 01.06.2005 1 as is where is
91435 KLA-Tencor AIT Particle Review 200 mm 01.06.1997 1 as is where is
91436 KLA-Tencor AIT I Patterned Wafer Inspection 150 mm,200 mm 01.06.1997 1 as is where is
91437 KLA-Tencor AIT UV DARKFIELD DEFECT INSPECTION 200 mm 1 as is where is
91440 KLA-Tencor ARCHER 10 XT Overlay measurement system 300 mm 01.06.2008 1 as is where is immediately
91441 KLA-Tencor ARCHER AIM Overlay measurement system 300 mm 1 as is where is
91442 KLA-Tencor ARCHER XT+ Overlay measurement system 300 mm 01.06.2007 1 as is where is immediately
91443 KLA-Tencor ARCHER XT+ Overlay measurement system 300 mm 01.06.2003 1 as is where is
91444 KLA-Tencor ARCHER XT+ Overlay measurement system 300 mm 1 as is where is
91445 KLA-Tencor ARCHERXT+ Overlay measurement system 300 mm 01.06.2006 1 as is where is
91446 KLA-Tencor ARCHERXT+ Overlay measurement system 300 mm 01.06.2007 1 as is where is
91447 KLA-Tencor ARCHERXT+ Overlay measurement system 300 mm 01.06.2007 1 as is where is
91449 KLA-Tencor FLX-2320 Film stress measurement 150 mm,200 mm 1 as is where is
91450 KLA-Tencor FLX-2320 Film stress measurement 150 mm,200 mm 01.06.1994 1 as is where is
91451 KLA-Tencor HRP_340 Surface Profiler 300 mm 01.06.2005 1 as is where is
91452 KLA-Tencor HRP_340 Surface Profiler 300 mm 01.06.2007 1 as is where is
91453 KLA-Tencor KLA 5100XP OVERLAY REGISTRATION 150 mm,200 mm 1 as is where is
91454 KLA-Tencor KLA 5200 OVERLAY REGISTRATION 150 mm,200 mm 1 as is where is
91455 KLA-Tencor KLA AIT XP+ Darkfield 1 as is where is
91456 KLA-Tencor KLA AIT XP+ Darkfield 1 as is where is
91457 KLA-Tencor M-GAUGE 200 Thickness measurement 4", 150 mm 1 as is where is
91458 KLA-Tencor P-12 DISK PROFILER 1 as is where is
91464 KLA-Tencor PROMETRIX FT750 Film Thickness Measurement 1 as is where is
91465 KLA-Tencor PROMETRIX FT750 Film Thickness Measurement 1 as is where is
91466 KLA-Tencor PROMETRIX FT750 Film Thickness Measurement 1 as is where is
91467 KLA-Tencor PROMETRIX RS35 Auto Type Resistivity 150 mm,200 mm 1 as is where is
91468 KLA-Tencor PROMETRIX RS55 Auto Type Resistivity 150 mm,200 mm 1 as is where is
91469 KLA-Tencor PROMETRIX RS55 Manual Type Resistivity 200 mm 1 as is where is
91470 KLA-Tencor PROMETRIX UV-1050 THIN FILM MEASUREMENT 1 as is where is
91474 KLA-Tencor THERMA-WAVE OP 2600 OPTI-PROBE 200 mm 1 as is where is
91475 KLA-Tencor THERMA-WAVE OP 2600 OPTI-PROBE 200 mm 1 as is where is immediately
91476 KLA-Tencor THERMA-WAVE OP 2600 OPTI-PROBE 200 mm 01.06.1995 1 as is where is immediately
91477 KLA-Tencor THERMA-WAVE OP 2600 OPTI-PROBE 200 mm 1 as is where is immediately
91478 KLA-Tencor THERMA-WAVE OP 2600 DUV OPTI-PROBE 200 mm 01.08.1997 1 as is where is immediately
91479 KLA-Tencor THERMA-WAVE OP 2600B OPTI-PROBE 200 mm 01.06.1997 1 as is where is immediately
91480 KLA-Tencor THERMA-WAVE OP 2600B OPTI-PROBE 200 mm 1 as is where is immediately
91481 KLA-Tencor THERMA-WAVE OP 2600B OPTI-PROBE 200 mm 01.06.1997 1 as is where is immediately
91482 KLA-Tencor THERMA-WAVE OP 2600B OPTI-PROBE 200 mm 01.06.1997 1 as is where is immediately
91483 KLA-Tencor THERMA-WAVE OP 2600B OPTI-PROBE 200 mm 01.06.1999 1 as is where is immediately
91484 KLA-Tencor THERMA-WAVE OP 2600B OPTI-PROBE 200 mm 01.06.1997 1 as is where is immediately
91718 KLA-Tencor 2131 Brightfield wafer inspection 200mm 1 as is where is
91824 KLA-TENCOR UV-1050 FILM MEASUREMENT 01.06.1997 1 as is where is
91853 KLA-TENCOR 2132 Brightfield Inspection Tool 1 inquire
91854 KLA-TENCOR AlphaStep 300 Profilometer 1 inquire
91855 KLA-TENCOR Viper 2401 After Develop Inspection Tool 1 inquire
91962 KLA-TENCOR ARCHER 10XT+ OVERLAY MEASUREMENT 300 mm 01.09.2007 1 as is where is
91963 KLA-TENCOR ARCHER 10XT OVERLAY MEASUREMENT 300 mm 01.11.2003 1 as is where is
91990 KLA-TENCOR AIT I Surfscan wafer particle detection system 200 mm 01.06.1998 2 as is where is immediately
92061 KLA-Tencor Candela 6120 Disk Inspection 200 mm 1 as is fob immediately
92221 KLA-Tencor Archer 100 Overlay Measurement System 300 mm 1 as is where is
92222 KLA-Tencor Archer 300 Overlay Measurement System 300 mm 01.06.2012 1 as is where is
92408 KLA-Tencor SP3 Darkfield Wafer inspection system 300 mm 01.08.2011 1 as is where is immediately
92612 KLA-Tencor Archer AIM+ Overlay Measurement System 300mm 01.06.2006 1 as is where is
92613 KLA-Tencor eS32 E-beam Inspection 300mm 1 as is where is
92614 KLA-Tencor SpectraShape 8660 Optical Review System 300mm 01.11.2017 1 as is where is
92615 KLA-Tencor Surfscan SP2 XP Wafer Particle Measurement 300 mm 01.06.2011 1 as is where is immediately
92670 KLA-Tencor 2815 PATTERNED WAFER INSPECTION SYSTEM 300 mm 01.08.2008 1 as is where is immediately
92671 KLA-Tencor 2139 Brightfiield wafer defect inspection system 200 mm 01.09.2000 1 as is where is immediately
92672 KLA-Tencor PUMA 9100 Darkfield Wafer inspection system 300 mm 01.09.2006 1 as is where is immediately
92676 KLA-Tencor Archer 300 AIM Overlay Measurement System 300 mm 01.04.2012 1 as is where is immediately
92705 KLA-Tencor ES35D E-BEAM INSPECTION 300 MM 01.06.2006 1 as is where is
92706 KLA-Tencor ES35 E-BEAM INSPECTION 300 MM 01.06.2009 1 as is where is
92811 KLA-Tencor Archer 10XT+ Overlay (Metrology) 300 mm 01.06.2008 1 as is where is
92812 KLA-Tencor Archer AIM+ Overlay (Metrology) 300 mm 01.06.2007 1 as is where is
92813 KLA-Tencor MPV CD2 AMC Optical Wafer Metrology 125 mm 1 as is where is
92814 KLA-Tencor MPV CD2 AMC Optical Wafer Metrology 125 mm 1 as is where is
92815 KLA-Tencor MPV-CD Optical Wafer Metrology 125 mm 1 as is where is
92816 KLA-Tencor P11 Profiler (Metrology) 150 mm 1 as is where is
92817 KLA-Tencor Surfscan 7700 Particle Counter (Metrology) 125 mm 1 as is where is
93090 KLA-Tencor ARCHER 100AIM Overlay 300 mm 1 as is where is
93091 KLA-Tencor ARCHER 300 PLUS Overlay 300 mm 01.06.2011 1 as is where is
93092 KLA-Tencor ARCHER 300LCM Overlay 300 mm 1 as is where is
93093 KLA-Tencor SP3 wafer inspection 300 mm 1 as is where is
93094 KLA-Tencor AIT UV DARKFIELD DEFECT INSPECTION 200 mm 1 as is where is
93095 KLA-Tencor AIT XP+ DARKFIELD DEFECT INSPECTION 200 mm 01.06.1998 1 as is where is
93096 KLA-Tencor ARCHER AIM� Overlay 300 MM 01.06.2003 1 as is where is
93097 KLA-Tencor P-10 DISK PROFILER 150 mm,200 mm 1 as is where is
93098 KLA-Tencor P-12 DISK PROFILER 150 mm/200 mm 1 as is where is
93099 KLA-Tencor P-2 DISK PROFILER 150 mm,200 mm 1 as is where is
93100 KLA-Tencor P-2 DISK PROFILER 150 mm,200 mm 01.06.1996 1 as is where is
93101 KLA-Tencor P-20H DISK PROFILER 150 mm,200 mm 1 as is where is
93102 KLA-Tencor P-2H DISK PROFILER 150 mm,200 mm 01.06.1996 1 as is where is
93352 KLA-Tencor 2351 Brightfield wafer inspection 300 mm 01.06.2002 1 as is where is
93353 KLA-Tencor 2367 Brightfield inspection (MISSING PARTS) 300 mm 1 as is where is
93354 KLA-Tencor HRP-340 High Resolution Surface Profilometer 300 mm 01.06.2007 1 as is where is
93355 KLA-Tencor HRP-340 High Resolution Surface Profilometer 300 mm 01.06.2007 1 as is where is
93356 KLA-Tencor HRP-340 High Resolution Surface Profilometer 300 mm 01.06.2007 1 as is where is
93357 KLA-Tencor SP1 - DLS Darkfield wafer inspection 300 mm 01.06.2004 1 as is where is immediately
93358 KLA-Tencor SP1 - DLS Darkfield wafer inspection 300 mm 01.06.2005 1 as is where is immediately
93870 KLA-Tencor 2810 Brightfield wafer defect inspection system 300 mm 01.06.2009 1 as is where is immediately
78700 KOKUSAI VR120S METRO 300 MM 01.06.2006 1 as is where is
86595 Kokusai Quixace Ultimate Furnace 200mm 1 as is where is
91856 KOKUSAI VR70 Resistivity Test Tool 1 inquire
86184 LASERTEC MD2100 Reticle Inspection System 200 mm 1 as is where is
92233 Lasertec BGM300 Wafer Thickness Measurement Tool 300 mm 01.06.2014 1 as is where is
86602 Lasertech Reticle inspection Inspection 200mm 1 as is where is
64259 Leica INS 3300 Microscope inspection station 200 mm 1 as is where is immediately
71999 LEICA INS3000 Microscope inspection station 200 mm 01.03.2000 1 inquire immediately
79428 Leica INS 1000 Microscope Inspection Station 200mm 1
82685 LEICA UV Optic Scope QE 300 mm 01.06.2006 1 as is where is
84158 LEICA INS3000, SMIF Wafer Inspection Microscope 200 mm 01.05.1999 1 as is where is immediately
86185 LEICA INS3300 Wafer Inspection Microscope 200 mm/300 mm 01.06.2006 1 as is where is
86186 LEICA INS3300 Wafer Inspection Microscope 200 mm/300 mm 01.06.2003 1 as is where is
88268 Leica INM20 Microscope 200mm 1 as is where is
88269 Leica INS10 Microscope 200mm 1 as is where is
91486 LEICA INS 2000 REVIEW STATION 1 as is where is
91487 LEICA INS-3000 Wafer Defect Inspection ( NT OS) 200 mm 1 as is where is
91488 LEICA INS-3000 Wafer Defect Inspection ( UV / NT OS) 200 mm 01.06.2000 1 as is where is
91489 LEICA INS-3000 DUV Wafer Defect Inspection ( NT OS) 200 mm 01.06.2003 1 as is where is
91490 LEICA INS-3000 DUV Wafer Defect Inspection ( NT OS) 200 mm 01.06.2003 1 as is where is
91492 LEICA Leica INM100 Operation Manual Optical Microscope 1 as is where is
91493 LEICA Leica INM100 Operation Manual Optical Microscope 1 as is where is
91494 LEICA Leica INM100 Operation Manual Optical Microscope 1 as is where is
91498 LEICA Reichert-Jung POLYVAR SC Wafer Inspection Microscope 1 as is where is
91499 LEICA Reichert-Jung POLYVAR SC Wafer Inspection Microscope 1 as is where is
91719 Leica INS3300 Wafer Inspection Microscope 300mm 1 as is where is
91720 Leica INS3300 Wafer Inspection Microscope 300mm 1 as is where is
86190 LEICA / VISTEC INS3300 Wafer Inspection Microscope 200 mm/300 mm 01.06.2007 1 as is where is immediately
86193 LEITZ MPV-SP Wafer Inspection Microscope 200 mm 1 as is where is
86420 Leitz MPV CD2 AMC Wafer inspection microscope 125 mm 1 as is where is
86421 Leitz MPV CD2 AMC Wafer inspection microscope 125 mm 1 as is where is
86423 Leitz MPV-CD Wafer inspection microscope 125 mm 1 as is where is
86426 Leitz INM100+INS10 Wafer inspection microscope 150 mm 1 as is where is
74757 Leo 435VP inspection SEM 1 as is where is
81917 MDC 986G Automatic CV Plotter 200 MM 01.06.2002 1 as is where is immediately
91857 MDC CSM/16 Automatic CV Plotter with 150mm DuoChuck, Dual 6"(dia.) Chucks 1 inquire
91858 MDC CSM/16 Automatic CV Plotter with 150mm DuoChuck, Dual 6"(dia.) Chucks 1 inquire
90254 Met One 227B Particle Counter 150 mm 02.06.1999 1 as is where is
88270 Mitutoyo Roundtest RA-2000 Roundness Measurement 01.06.2003 1 as is where is
91113 MITUTOYO MP2000 METRO 200 mm 1 as is where is
71741 Nanofab Nano150 Ion Beam Lithography / Implanter System 150 mm 1 as is where is immediately
92689 Nanogeometry NGR2170 e-beam wafer inspection system 300 mm 01.06.2010 1 as is where is immediately
82690 NANOMETRICS ORION METROLOGY 300 mm 01.06.2006 1 as is where is immediately
84832 NANOMETRICS NanoSpec 9000 Metrology Equipment, Wafer Inspection Equipment 200mm 1 as is where is immediately
86044 NANOMETRICS NANOSPEC 8300X THIN FILMS MEASURING SYSTEM 300 mm 1 as is where is
86425 Nanometrics Nanospec AFT 210 surface inspection 125 mm 1 as is where is
88271 Nanometrics LYNX Critical Dimension (CD) Measurement (non SEM) 300mm 01.06.2013 1 as is where is
88272 Nanometrics LYNX Critical Dimension (CD) Measurement (non SEM) 300mm 01.06.2010 1 as is where is
88616 Nanometrics Caliper Mosaic Overlay 300 MM 01.06.2005 1 as is where is
88617 Nanometrics Caliper Mosaic Overlay 300 MM 01.06.2002 1 as is where is
88618 Nanometrics Caliper Mosaic Overlay 300 MM 01.06.2009 1 as is where is
88620 Nanometrics METRA 2200M Overlay 200 MM 01.06.1996 1 as is where is
88621 Nanometrics METRA-7200 Overlay 200 MM 1 as is where is
90255 Nanometrics M5100 or M5100UV ? Thickness measurement 150 mm 02.09.1995 1 as is where is
90583 Nanometrics LYNX Critical Dimension (CD) Measurement (non SEM) 300 mm 01.09.2011 1 as is where is
90584 Nanometrics Trajectory T3 Film Thickness Measurement System 1 as is where is
90884 Nanometrics Tevet Trajectory T3 Film Thickness Measurement System 1 as is where is
91526 NANOMETRICS CALIPER_MOSAIC Overlay 300 mm 01.06.2003 1 as is where is
91527 NANOMETRICS CALIPER_MOSAIC Overlay 300 mm 01.06.2010 1 as is where is
91528 NANOMETRICS CALIPER_MOSAIC Overlay 300 mm 01.06.2001 1 as is where is
91529 NANOMETRICS CALIPER_MOSAIC Overlay 1 as is where is
91530 NANOMETRICS NANOMETRICS 9-7200-0195E Mask & Wafer Inspection 200 mm 1 as is where is
91531 NANOMETRICS NANOSPEC ATF210 Film Thickness Measurement 1 as is where is
91532 NANOMETRICS Q230 Wafer Inspection System 1 as is where is
91721 Nanometrics Lynx with OCD Metrology 300mm 1 as is where is
91964 NANOMETRICS CALIPER MOSAIC WAFER INSPECTION 300 mm 01.05.2003 1 as is where is
92041 Nanometrics 9010B Metrology 1 as is where is immediately
92818 Nanometrics NanoSpec 210 Metrology (Metrology) 125 mm 1 as is where is
92819 Nanometrics Nanospec 9100 Thickness measurement (Metrology) 200 mm 01.06.2000 1 as is where is
93666 Nanometrics 3000 Tabletop Thin Film Analysis System 1 as is where is
93667 Nanometrics 8300X Thin Film Metrology Tool. 1 as is where is
93668 Nanometrics Nanospec 6100 Automated Film Thickness Measurement System 1 as is where is
93669 Nanometrics Nanospec 6100 Automated Film Thickness Measurement System 1 as is where is
91533 NGR NGR2150 CD SEM 300 mm 1 as is where is
93103 NGR NGR2150 E-beam wafer inspection 300 MM 1 as is where is
91534 NICOLET Magna 410 ft-ir Spectrometer 01.06.1996 1 as is where is
91535 NICOLET Magna 560 ft-ir Spectrometer 01.06.1998 1 as is where is
91859 NICOLET Avatar 370 DTGS FT-IR Spectrometer 1 inquire
91860 NICOLET Magna 550 FT-IR Spectrometer 1 inquire
91536 Nidec im15 Wafer inspection 1 as is where is
91537 Nidec im800 Wafer inspection 1 as is where is
82904 Nikcon AMI-2000 Surface Analyzer 01.06.2003 1 as is where is immediately
33708 NIKON Optiphot Wafer Inspection Microscope 1 inquire
33711 NIKON Optistation 2A Automatic Wafer Inspection Systems for 75mm- 150mm Wafers, Auto Focus, 4ea Available 1 inquire
64341 Nikon VMR 3020 Video Measuring System 01.01.2001 1 as is where is immediately
74827 Nikon MM40 MEASURING MICROSCOPE 200 mm 1 as is where is
76705 Nikon Opiphot Inspection Microscope with autoloader 200 mm 01.04.1992 1 as is where is immediately
79198 Nikon Lasermark Overlap inspection System 300 mm 01.06.2013 1 as is where is immediately
87316 Nikon OPTIPHOT 88 Microscope 1 as is where is
88273 Nikon OPTIPHOT 200 Microscope 200mm 1 as is where is
91014 NIKON UFX MICROSCOPE Microscope 200mm 01.06.1997 1 as is where is
91015 NIKON CROSCOPE M PLAN X10, X40, X1 Microscope 200mm 01.06.1997 1 as is where is
91861 NIKON NWL-860 Automatic Wafer Loader, for up to 200mm Wafers 1 inquire
91862 NIKON Optiphot -88 Wafer Inspection Microscope, 10X, 20X, 50X & 150X Objs., 200mm XY Stage 1 inquire
91863 NIKON Optiphot 150 Wafer Inspection Microscope, 10X, 20X, 50X & 150X Objs., 150mm XY Stage 1 inquire
91864 NIKON Optiphot 200 Wafer Inspection Microscope (Parts Tool Only) 1 inquire
92616 Nikon OPTISTATION V Optical Review System 200mm 1 as is where is
92617 Nikon OPTISTATION V Optical Review System 200mm 1 as is where is
92707 NIKON VMR-C4540 FOUP INSPECTION 300 MM 01.06.2001 1 as is where is
92825 Nikon OPTIPHOT 66 Microscope (Metrology) 150 mm 1 as is where is
86646 Nitto HR8500 taper 1 as is where is
53146 NOVA 210 CMP ENDPOINT MEASUREMENT SYSTEMS 200 mm 5 as is where is immediately
87419 NOVA 3090 OCD WAFER INSPECTION 300 mm 01.06.2007 1 as is where is
92618 Nova NovaScan 3090 Next SA Critical Dimension (CD) Measurement (non SEM) 300mm 1 as is where is
33714 OLYMPUS SZ3060 StereoZoom Microsope 1 inquire
69809 Olympus MX-50 Microscopes 3
86194 Olympus AL-2000 Wafer Inspection Microscope 200 mm 1 as is where is
87085 Olympus MX61-F Wafer Inspection Microscope 200 mm 01.01.2013 1 as is where is immediately
87320 Olympus LEXT OLS-3000 Optical Review System 1 as is where is
90256 Olympus BX51 IR microscope 150 mm 02.07.2001 1 as is where is
90586 Olympus AL3110F Macro-Defect 300 mm 01.06.2004 1 as is where is
91016 OLYMPUS STM-UM MICROSCOPE Microscope 200mm 01.06.2004 1 as is where is
91538 OLYMPUS BH3-MJLA4-383D HIGH POWER SCOPE N/a 01.06.1995 1 as is where is
91539 OLYMPUS MX80 AF-F MICRO Scope 1 as is where is
91540 Olympus Olympus AL3120F MICROSCOPE (ASYST300FL - 2L/P) 300 mm 1 as is where is
91541 Olympus Olympus AL3120F MICROSCOPE (TAS300(E3)- 2L/P) 300 mm 1 as is where is
91542 Olympus Olympus AL3120F MICROSCOPE (TAS300(E3)- 2L/P) 300 mm 01.06.2003 1 as is where is
91543 Olympus Olympus AL3120F MICROSCOPE (TAS300(E3) - 3L/P) 300 mm 01.06.2004 1 as is where is
91544 Olympus Olympus AL3120F-DUV MICROSCOPE (TAS300 - 2L/P) 300 mm 01.06.2003 1 as is where is
91545 Olympus Olympus AL3120F-DUV-EL MICROSCOPE (ASYST300FL - 2L/P) 300 mm 01.06.2002 1 as is where is
91546 Olympus Olympus AL3130F MICROSCOPE (KWF12 - 3L/P) 300 mm 01.06.2005 1 as is where is
91547 Olympus Olympus AL3130F MICROSCOPE (KWF12 - 3L/P) 300 mm 01.06.2005 1 as is where is
91548 Olympus Olympus AL3130F MICROSCOPE (KWF12 - 3L/P) 300 mm 01.06.2005 1 as is where is
91549 Olympus Olympus AL3130F MICROSCOPE (KWF12 - 3L/P) 300 mm 01.06.2006 1 as is where is
91550 Olympus Olympus AL3130F MICROSCOPE (TAS300(E4) - 3L/P) 300 mm 01.06.2007 1 as is where is
91551 Olympus Olympus AL3130F MICROSCOPE (TAS300(E4) - 3L/P) 300 mm 01.06.2007 1 as is where is
91865 OLYMPUS AL100 Wafer Loader 1 inquire
91866 OLYMPUS AL100 Wafer Loader, 200mm 1 inquire
91867 OLYMPUS AL100-B8 Microscope Wafer Loader for Backside Macro Inspection - No Transfer to Microscope Stage 1 inquire
91868 OLYMPUS AL100-L8 Wafer Loader, 200mm, Parts Tool 1 inquire
92619 Olympus PME3 Microscope 300mm 1 as is where is
92690 OLYMPUS MX61LR Auto Loader&Scope 1 as is where is
92708 OLYMPUS MX50A-873MD High Power Scope ASSEMBLY 01.06.2002 1 as is where is
92820 Olympus BHMJL Microscope (Metrology) 150 mm 1 as is where is
92821 Olympus BHMJL Microscope (Metrology) 150 mm 1 as is where is
76711 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76712 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76713 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76714 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76715 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76716 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76717 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76718 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76719 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION WITH AUTOLOADER 200 mm 01.12.1996 1 as is where is immediately
76720 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION WITH AUTOLOADER 200 mm 01.12.1996 1 as is where is immediately
76721 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION WITH AUTOLOADER 200 mm 01.12.1996 1 as is where is immediately
76722 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION WITH AUTOLOADER 200 mm 01.12.1996 1 as is where is immediately
76723 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION WITH AUTOLOADER 200 mm 01.12.1996 1 as is where is immediately
90589 Optical Gaging Products (OGP) Avant 400 ZIP Video Measurement System 01.06.1999 1 as is where is
87321 Perkin Elmer Elan 6100 DRC Plus ICP/MS Mass Spectrometer Laboratory 1 as is where is immediately
83940 Philips CM30 Scanning Transmission Electron Microscope (TEM) Laboratory 01.06.1992 1 as is where is immediately
90257 philips LAMBDA09 Magnetostrictive measurement 150 mm 02.03.1999 1 as is where is
88899 Phoenix Micromex SE 160T X-RAY INSPECTION SYSTEM 1 as is where is
91869 PLASMOS SD2000 Automatic Ellipsometer 1 inquire
91870 PLASMOS SD2003 Automatic Ellipsometer with 3ea Wavelengths for up to 200mm Wafers 1 inquire
78159 Plasmos / Yvon Jobin /Philips Analytical SD2000 Laser Ellipsometer 200 mm 01.08.2000 1 as is where is immediately
31246 PMS Liquitrack 776200 Non volatile residual Monitor facilities 01.11.1999 1 as is where is immediately
90258 Pony X-ray measurement 150 mm 02.06.2001 1 as is where is
33716 PROMETRIX FT-750 Film Thickness Measuring Tool 1 inquire
87792 QVI 600XP Process Control & Measurement 1 as is where is
85008 Raytek RXW-1226SFI Wafer edge inspection 300 MM 11 as is where is
91552 RAYTEX RXW-800 EDGE SCAN 200 mm 01.06.2008 1 as is where is
79216 ReVera VeraFlex X-Ray Photoelectron Spectroscopy 300 mm 01.06.2008 1 inquire
85006 Revera RVX5000 Xray photoelectron spectroscopy 300 MM 01.06.2006 1 as is where is
85007 Revera Veraflex Xray photoelectron spectroscopy 300 MM 01.06.2008 1 as is where is
93360 Revera VeraFlex II Metrology 300 mm 01.06.2010 1 as is where is
11072 RIGAKU 3700H TXRF Wafer Analyzer 150-200 MM 01.04.1994 1 as is where is immediately
34320 Rigaku 3640 X-Ray Wafer Analyzer 200mm 1 as is where is immediately
71780 Rigaku TXRF 300S X-Ray Diffractometer 150mm to 300 mm 01.01.2001 1 as is where is immediately
78339 Rigaku MFM65 xrf 300 mm 1 as is where is immediately
78701 RIGAKU XRF3630 TRF 200 mm 01.06.1995 1 as is where is
79066 RIGAKU XRF3640 XRF 200 mm 1 as is where is
79217 Rigaku MFM65 XRR/XRF 300 mm 01.06.2009 1 inquire
80193 RIGAKU V300 TXRF inspection system 200 mm or 300 mm 01.12.2008 1 as is where is immediately
82910 RIGAKU 3630 Wafer Inspection Equipment 200 01.06.1996 1 as is where is immediately
83519 Rigaku 3640 X-ray fluoresence wafer / disk analyzer 200 mm 01.06.2000 1 as is all rebuilt immediately
86195 RIGAKU RIGAKU 3630 XRF 200 mm 1 as is where is
87823 Rigaku MFM65 X-ray inspection (For Cu and Au quantification) 300 MM / 200 mm 01.10.2007 1 as is where is immediately
91553 RIGAKU RIGAKU 3640 (Handle include) X-Ray fluorescence wafer / Disk analyzer 5" 01.06.1999 1 as is where is
91554 RIGAKU XRF3630 Wafer/ Disk Analyzer 1 as is where is
91555 RIGAKU XRF3630 Wafer/ Disk Analyzer 1 as is where is
91556 RIGAKU XRF3630 Wafer/ Disk Analyzer 1 as is where is
91557 RIGAKU XRF3640 (Handle include) Wafer/ Disk Analyzer 200 mm 01.06.1995 1 as is where is
91558 RIGAKU XRF3640 (Handle not include) Wafer/ Disk Analyzer 01.06.1998 1 as is where is
91871 RIGAKU V300 Total Reflection Xray Fluoroescence Spectrometer 1 inquire
91872 RIGAKU 3640 Xray Fluorescence Wafer/Disk Analyzer 1 inquire
92691 Rigaku MFM65 In-Line Energy Dispersive X-Ray Fluoresence Wafer Inspection System 300 mm 01.06.2008 1 as is where is immediately
93104 RIGAKU 3640 X-Ray fluorescence wafer / Disk analyzer (AL,Fe,Ni,Si,Pt,Cr ) 125 mm 01.06.1999 1 as is where is
93361 Rigaku MFM65 Micro XRF small spot Energy Dispersive X-ray Fluorescence 300 MM 1 as is where is
93362 Rigaku ZSX 400 WDXRF Sequential WDXRF Spectrometer LABORATORY 01.06.2005 1 as is where is
72034 RUDOLPH MP200 METROLOGY 200 mm 01.06.2000 1 as is where is immediately
78702 RUDOLPH MP300 METRO 300 MM 01.06.2007 1 as is where is
78703 RUDOLPH MP300 METRO 300 MM 01.06.2009 1 as is where is
79067 RUDOLPH WV320 Metrology 300mm 1 as is where is
85411 Rudolph FEVII Ellipsometer 200 mm 1 as is where is immediately
86196 RUDOLPH WS2500 Wafer Inspection 200 mm 01.06.2002 1 as is where is
86197 RUDOLPH WS2500 Wafer Inspection 200 mm 01.06.2003 1 as is where is
88628 Rudolph MetaPULSE 300 Thickness Measurement 300 MM 01.06.2004 1 as is where is immediately
91116 RUDOLPH MP200 XCu Thin Film Measurement 200 mm 01.06.2001 1 as is where is
91559 RUDOLPH AXL_S Macro Inspection System 300 mm 01.06.2005 1 as is where is
91560 RUDOLPH AXL_S Macro Inspection System 300 mm 01.06.2005 1 as is where is
91561 RUDOLPH AXL_S Macro Inspection System 300 mm 01.06.2006 1 as is where is
91562 RUDOLPH MP1 300 Film thickness measurement 300 mm 01.06.2013 1 as is where is
91563 RUDOLPH Meta Pulse Film Metrology 200 mm 01.06.2005 1 as is where is
91564 RUDOLPH Meta Pulse 200 Film Metrology 200 mm 1 as is where is
91565 RUDOLPH MP1 300 Film Metrology 300 mm 1 as is where is
91566 Rudolph WS3840 3D Bump Metrology 300 mm 01.06.2010 1 as is where is
91567 RUDOLPH META PULSE 200 Surface Film Metrology 200 mm 01.06.2002 1 as is where is immediately
91822 RUDOLPH FE-7 ELLIPSOMETER 01.06.1997 1 as is where is
91915 Rudolph FE4 Ellipsometer 200 MM 01.06.1995 1 as is where is immediately
92236 Rudolph S3000A Ellipsometer 300 mm 01.06.2007 1 as is where is
92237 Rudolph S3000A Ellipsometer 300 mm 01.06.2007 1 as is where is
92238 Rudolph S3000A Ellipsometer 300 mm 01.06.2007 1 as is where is
92709 Rudolph WV320 MACRO INSPECTION 300 MM 01.06.2006 1 as is where is
92710 Rudolph WV320 MACRO INSPECTION 300 MM 01.06.2006 1 as is where is
92822 Rudolph Axi-S Macro Inspection (Metrology) 300 mm 01.06.2007 1 as is where is
92823 Rudolph Axi-S Macro inspection (Metrology) 300 mm 01.06.2006 1 as is where is
92824 Rudolph FE-IV Ellipsometer (Metrology) 200 mm 01.06.1995 1 as is where is
70089 Rudolph Technologies FE-VII Ellipsometer 200 mm 01.06.1996 1 as is where is immediately
88624 Rudolph/August 3Di8500 Wafer Inspection 300 MM 01.06.2008 1 as is where is
88625 Rudolph/August FE-VII Focus Ellipsometer 200 MM 01.06.1993 1 as is where is
88626 Rudolph/August FE-VII-D Focus Ellipsometer 200 MM 1 as is where is
88627 Rudolph/August FE-VII-D Focus Ellipsometer 200 MM 01.06.1997 1 as is where is
88629 Rudolph/August NSX105 Macro Inspection 200 MM 01.06.2004 1 as is where is
88630 Rudolph/August NSX105 Macro Inspection 200 MM 01.06.2003 1 as is where is
91873 SDI FAaST-330 Dielectric Characterization Tool with COCOS & Epi-t for up to 300mm Wafers 1 inquire
91874 SDI SPV Station 1010 Surface Photo Voltage Tester 1 inquire
91875 SDI SPV-300 Surface Photo Voltage Tester for up to 300mm Wafers 1 inquire
79068 SDI Semiconductor Diagnostics FAAST300 Carrier Lifetime measurement 300mm 1 as is where is
90685 SDI SEMICONDUCTOR DIAGNOSTICS FAAST-350 WAFER CHARACTERIZATION 300 mm 01.06.2008 1 as is where is immediately
91117 SEIKO CHIPS-200 metrology system 200 mm 1 as is where is
86199 SEIKO SEIKI SMI2200 SEM 200 mm 1 as is where is
91118 SELA MC100 metrology system 200 mm 1 as is where is
91119 SELA MC500 metrology system 200 mm 1 as is where is
82911 Semiconductor Diagnostics 3030 Surface Profiler 200 01.06.2012 1 as is where is immediately
84542 SEMILAB FAAST 300 Carrier lifetime measurement 300 mm 01.06.2006 1 as is where is immediately
84998 Semilab IR3100 FT-IR Spectrometers 300 MM 01.06.2005 1 as is where is
93670 Semilab WT-2000PVN Multifunction Wafer Mapping Tool 1 as is where is
89974 Semix Tazmo SOG TR817UD-TM 150mm SOG 150mm 1 as is where is
90259 shb instruments 109 Hysteresis loop tracer 150 mm 02.06.1998 1 as is where is
91965 SHIMADZU SMX-160CT-SV3S WAFER ANALYSIS SYSTEM 300 mm 01.12.2007 1 as is where is
82686 Shinsung Eng SGL-30 QE 300 mm 01.06.2011 1 as is where is
74942 Sonix HS 1000 Scanning Acoustic Microscope 1 as is where is immediately
74946 Sonoscan D6000 C-Sam 01.05.1996 1 as is where is immediately
83703 SOPRA SE 200 Ellipsometer 8" 1 as is where is
90260 Spectris PW2830XRF WAFER ANALYSER XRF 150 mm 02.06.1999 1 as is where is
91568 SSM SSM 5200 Resistivity 01.06.2008 1 as is where is
91876 SSM 530 CV Plotter 1 as is where is immediately
91877 SSM 470i CV Plotter 1 inquire
93105 SSM SSM 5200 Resistivity 01.06.2008 1 as is where is
89975 TecHarmonic EHTVS Water Scrubber 1 as is where is
77049 Tecnai TF20 TEM Refurbished 01.06.2001 1 as is where is immediately
33722 TENCOR AlphaStep 300 Profilometer 1 inquire
33723 TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool, for 75mm-150mm Wafers 1 inquire
93671 Tencor AS 500 Profilometer 1 as is where is
90594 Tescan FERA3 XMH FE SEM 01.06.2014 1 as is where is
61012 THERMA-WAVE OP 2600B OPTI-PROBE 200mm 01.01.1997 1 as is where is immediately
91825 THERMAWAVE OP-2600 METROLOGY 01.06.2002 1 as is where is
91569 Thermo Fisher ECO 1000 FTIR System 200 mm 01.06.2000 1 as is where is immediately
90261 Tohoku Tokusyu ULMR-3000 MR characterization measurement 150 mm 31.03.2008 1 as is where is
86596 Tokyo Electron Tactras Plasma 200mm 1 as is where is
86605 Tokyo Electron Indy+ Furnace 200mm 1 as is where is
88376 Top Con WM7S surface particle measurement 200 mm or less 01.06.2006 1 as is where is immediately
91120 TOPCON WM-10 Wafer Metrology system 200 mm/300 mm 01.06.2006 1 as is where is
91570 Toray SP-500w Bump Height Measurement 300 mm 01.06.2010 1 as is where is
93363 Ulvac PHI ADEPT 1010 Quadrupole SIMS LABORATORY 01.06.2013 1 as is where is
78309 Veeco VX310 Atomic Force Microscope 200 mm / 300 mm 01.06.2004 1 as is where is immediately
83586 Veeco Dimension X3D Model 340 Atomic Force Microscope 300 mm 01.11.2006 1 as is where is immediately
86200 VEECO V220SI Atomic Force Microscope 200 mm 01.06.2002 1 as is where is
88284 Veeco Dimension 7000 Atomic Force Microscope (AFM) 200mm 1 as is where is
88285 Veeco Dimension AFP Atomic Force Profiler (AFP) 300mm 01.06.2006 1 as is where is
88375 Veeco D9000 Atomic Force Microscope 200 mm 01.06.1997 1 as is where is immediately
88631 Veeco Dimension X3D Atomic Force Microscope 300 MM 01.06.2006 1 as is where is
88633 Veeco V200 Profilometer 200 MM 1 as is where is
91823 VEECO X-200 PROFILOMETER 01.06.2006 1 as is where is
91878 VEECO AP-150 Automtic Four Point Probe, for up to 6" Wafers 1 inquire
91966 VEECO VX340 WAFER SURFACE MEASUREMENT 300 mm 01.06.2005 1 as is where is
93672 Veeco Autoprobe Di CP-II Atomic Force Microscope.�Scanning probe microscope 1 as is where is
93673 Veeco Dektak 150 High Performance Surface Profiler 1 as is where is
93674 Veeco Dimension X3D-DS Three Dimensional AFM Atomic Force Microscope Metrology System 1 as is where is
86045 Veeco / Digital Instruments D9000 AFM Reticle 1 as is where is
93675 Veeco Bruker Wyko SP9900 Large Format Optical Surface Profile 1 as is where is
93676 Veeco Digital Instruments Dimension 3100 Atomic Force Microscope 1 as is where is
36870 Veeco Wyko NT 3300 Profiler System 1
87474 WED 6701 Microloader Automatic Microscope Wafer Loader 200 mm 1 as is where is
34091 Wyko NT 2000 Optical Profiling system 200 MM 1 inquire immediately
38870 Wyko NT1100 Optical Profiling system 1
66762 WYKO HD 2000 DPC Video Scope 1
71792 WYKO NT3300 Optical 3D profiling system 1
93677 Wyko BP2000W Bump Measurement Profiling System 1 as is where is
86046 Zeiss CDC200 Reticle Cd control Reticle 1 as is where is
86716 ZEISS Axiotron Wafer inspection microscope 1 as is where is immediately
90595 Zeiss CDC32 Reticle Inspection 6 inch 01.06.2010 1 as is where is immediately
90596 Zeiss CDC32 Reticle Inspection 6 inch 01.06.2015 1 as is where is immediately
91388 Zeiss AXIOTRON INSPECTION MICROSCOPE 1 as is where is
91389 Zeiss AXIOTRON INSPECTION MICROSCOPE 1 as is where is
91390 Zeiss AXIOTON High Perpomance MICRO SCOPE N/a 01.06.2008 1 as is where is
93364 Zeiss Ultra 55, LEO Gemini SEM 300 mm 01.06.2004 1 as is where is
93678 Zeiss EVO 50 Research Grade Variable Pressure Scanning Electron Microscope 1 as is where is
93679 Zygo SXM300 Multimode Scanning Probe Microscope 1 as is where is


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