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Pre-owned Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com

Please find below a list of Used Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com .Click on any listed item of Fab Metrology , Inspection and QC Equipment to see further data.


SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
88877 Accent Caliper Elan Overlay Measurement 1 as is where is
88878 Accent Caliper Q300 Overlay Measurement System 300 mm 1 as is where is
78507 Accretech Win-Win 50 Optical Inspection 300 mm 01.06.2005 1 as is where is immediately
86598 Accretech Win-Win 50 A5000 Hurricane Inspection 200mm 1 as is where is
88879 Accretech Win-Win 50 - A5000, Hurricane Bright Field Inspection 1 as is where is
88880 Accretech Win-Win 50 - A5000, Hurricane Bright Field Inspection 1 as is where is
33668 ADE Episcan 1000 Epi Metrology Spectromter, ONLINE 2110 Spectrometer Head, IRVINE OPTICAL NanoLoader II 1 as is where is immediately
81885 ADE NANOMAPPER Phase Shift NANOMAPPER 300 mm 01.06.2001 1 as is where is immediately
90248 ADE EWM9800 GMR magnetic measurements 150 mm 02.03.2000 1 as is where is
86587 Akrion MP-2000 200mm 1 as is where is
86603 Akrion V3 Cleaner 200mm 1 as is where is
52172 Alcatel ASM 180TD Helium Leak Detector 1
84360 Alcatel 925-40 Leak Detector 1 as is where is immediately
86600 Alcatel ASM 180tD Detector 200mm 1 as is where is
86614 AMAT complus Inspection 200mm 1 as is where is
86563 Applied Komatsu tech 1600 200mm 1 as is where is
57067 Applied Materials Nano SEM Metrology Equipment, CD SEM 200 mm 1 as is where is immediately
71959 Applied Materials SEMVISION Defect Review SEM with EDX 200 mm 01.01.1999 1 as is where is immediately
71960 Applied Materials SEMVISION CX INSPECTION SEM 200 mm 01.06.2000 1 as is where is immediately
79281 Applied Materials Compass Pro 300 SEM 300 mm 01.06.2001 1 as is where is
79282 Applied Materials Compass Pro 300 SEM 300 mm 01.06.2002 1 as is where is
79283 Applied Materials Compass Pro 300 SEM 300 mm 01.06.2001 1 as is where is
82862 Applied Materials NanoSEM CD SEM 200 01.01.2001 1 as is where is immediately
82863 Applied Materials NanoSEM 3D CD SEM 200 mm 01.01.2000 1 as is where is immediately
82870 Applied Materials VeraSEM 3D CD SEM 300 01.06.2001 1 as is where is immediately
83514 Applied Materials Opal 7830i Enhanced CD-SEM 200 mm 01.06.1997 1 as is where is immediately
84981 Applied Materials Complus Optical Inspection 300 MM 1 as is where is
84982 Applied Materials Nanosem 3D Critical Dimension Scanning Electron Microscope 300 MM 01.06.2002 2 as is where is
84983 Applied Materials NANOSEM 3d Critical Dimension Scanning Electron Microscopes 300 mm 1 as is where is
84984 Applied Materials Semvision CX Critical Dimension Scanning Electron Microscope 200 mm 1 as is where is
84985 Applied Materials Uvision 200 Optical Inspection 300 MM 01.06.2005 1 as is where is
85943 Applied Materials VeritySEM 3 Critical Dimension Measurement SEM 300 mm 01.06.2007 1 as is where is immediately
86035 APPLIED MATERIALS SEMVISION CX REVIEW STATION, SEM DEFECT 300 mm 1 as is where is
86166 Applied Materials VERASEM 3D SEM 200 mm 01.06.2001 1 as is where is
86422 Applied Materials Orbot WF720 Wafer inspection system 125 mm 1 as is where is
87415 Applied Materials UVision 4 Wafer Inspection System 300 mm 01.06.2010 1 as is where is
88373 Applied Materials VeraSEM 3D Critical Dimension Measurement CD-SEM 200 mm 01.06.1999 2 as is where is immediately
88583 Applied Materials Compass 300 Patterned Wafer Inspection 200 MM 01.06.2000 1 as is where is
88584 Applied Materials ComPlus MP Wafer Inspection 200 MM 01.06.2004 1 as is where is
88586 Applied Materials SEMVision G2 Defect Review SEM 300 MM 01.06.2003 1 as is where is
88587 Applied Materials SEMVision G3 Defect Review SEM 300 MM 01.06.2006 1 as is where is
88881 Applied Materials Semvision G3 Scanning Electron Microscope- Defect Review 300 mm 01.12.2005 1 as is where is
88882 Applied Materials Elite MS MC E-BEAM INSPECTION SYSTEM 300 mm 1 as is where is
88883 Applied Materials SEMVision G3 Scanning Electron Microscope- Defect Review 300 mm 1 as is where is
88904 Applied Materials SEMVision G3 Scanning Electron Microscope 1 as is where is
90346 Applied Materials DFinder 2 Particle detection system 300 mm 1 as is where is immediately
90546 Applied Materials ComPLUS 3T Darkfield Inspection 300 mm 01.06.2006 1 as is where is
90547 Applied Materials ComPLUS 3T Darkfield Inspection 300 mm 01.06.2006 1 as is where is
90548 Applied Materials ComPLUS 3T Darkfield Inspection 300 mm 01.06.2007 1 as is where is
90549 Applied Materials ComPLUS 3T Darkfield Inspection 300 mm 01.06.2007 1 as is where is
90550 Applied Materials SEMVision G2 SEM - Defect Review (DR) 300 mm 01.06.2004 1 as is where is
90551 Applied Materials SEMVision G2 SEM - Defect Review (DR) 300 mm 01.06.2004 1 as is where is
90552 Applied Materials SEMVision G2 SEM - Defect Review (DR) 300 mm 01.06.2004 1 as is where is
90553 Applied Materials SEMVision G2 SEM - Defect Review (DR) 300 mm 01.06.2004 1 as is where is
90554 Applied Materials SEMVision G2 SEM - Defect Review (DR) 300 mm 01.06.2004 1 as is where is
90555 Applied Materials SEMVision G3 SEM - Defect Review (DR) 300 mm 01.06.2006 1 as is where is
90556 Applied Materials SEMVision G3 SEM - Defect Review (DR) 300 mm 01.06.2008 1 as is where is
90557 Applied Materials SEMVision G3 SEM - Defect Review (DR) 300 mm 01.06.2007 1 as is where is
90558 Applied Materials SEMVision G3 Lite SEM - Defect Review (DR) 300 mm 01.06.2007 1 as is where is
90559 Applied Materials SEMVision G4 SEM - Defect Review (DR) 300 mm 01.06.2010 1 as is where is
90560 Applied Materials SEMVision G4 SEM - Defect Review (DR) 300 mm 01.06.2010 1 as is where is
90561 Applied Materials SEMVision G4 SEM - Defect Review (DR) 01.06.2011 1 as is where is
90563 Applied Materials VeritySEM 2 SEM - Critical Dimension (CD) Measurement 300 mm 01.06.2004 1 as is where is
90564 Applied Materials VeritySEM 2 SEM - Critical Dimension (CD) Measurement 300 mm 01.06.2005 1 as is where is
90565 Applied Materials VeritySEM 2 SEM - Critical Dimension (CD) Measurement 300 mm 01.06.2007 1 as is where is
90566 Applied Materials VeritySEM 2 SEM - Critical Dimension (CD) Measurement 300 mm 01.01.2004 1 as is where is
90567 Applied Materials VeritySEM 3 SEM - Critical Dimension (CD) Measurement 300 mm 01.06.2005 1 as is where is
90568 Applied Materials VeritySEM 3 SEM - Critical Dimension (CD) Measurement 300 mm 01.06.2005 1 as is where is
90569 Applied Materials VeritySEM 3 SEM - Critical Dimension (CD) Measurement 300 mm 01.06.2007 1 as is where is
90680 APPLIED MATERIALS COMPLUS 4T DARK FIELD INSPECTION 300 mm 01.06.2010 1 as is where is
90681 APPLIED MATERIALS UV5 BRIGHT FIELD INSPECTION 300 mm 01.06.2012 1 as is where is
90702 APPLIED MATERIALS COMPLUS 4T WAFER INSPECTION 300 MM 01.06.2006 1 as is where is
90947 Applied Materials UVision 4 Bright field inspection 300 mm 01.06.2009 1 as is where is
87304 ASML YieldStar S-200 Overlay Measurement System 300 mm 1 as is where is
86543 Asymtek S-800 PCB Inspection 200mm 1 as is where is
86167 AUGUST AXI-S Macro Inspection 200 mm 1 as is where is
90703 AUGUST AXI930_ASI(LoadPort_A) MACRO DEFECT INSPECTION 300 MM 01.06.2007 1 as is where is
90704 AUGUST AXI930_ASI(LoadPort_B) MACRO DEFECT INSPECTION 300 MM 01.06.2007 1 as is where is
90705 AUGUST AXI935D(LoadPort_A) Macro Inspection 300 MM 01.06.2008 1 as is where is
90706 AUGUST AXI935D(LoadPort_B) Macro Inspection 300 MM 01.06.2008 1 as is where is
86617 August / Rudolph Technologies NSX 90 macro defect inspection system 200 mm 1 as is where is immediately
83740 BIO-RAD QS300 FT-IR Spectrometer for up to 200mm Wafers 200 mm 01.06.1995 1 inquire immediately
14529 BioRad Q7 Q8 Overlay Metrology Tool 75mm-200mm 01.11.1998 1 inquire 2 months
33671 BIORAD Q5 Overlay Metrology Tool 1 inquire
33672 BIORAD Q6 Overlay Metrology Tool 1 inquire
33673 BIORAD Q7 Overlay Metrology Tool 1 inquire
77065 BIORAD QS-408M Manual FTIR Spectrometer for Epi, SiN, BPSG Measurement, up to 200mm Wafers 1 as is where is immediately
86545 Brewer Science CEE 200 FX coater 200mm 1 as is where is
86549 Brewer Science 300x Stepper 200mm 1 as is where is
86550 Brewer Science CEE 2000 FX Stepper 200mm 1 as is where is
86528 Brookfield DV2THCBCO Metrology 200mm 1 as is where is
88884 Bruker D8Fabline X-Ray Metrology 1 as is where is
67909 Cambridge S260 Scanning Electron Microscope SEM Laboratory Equipment 01.06.1991 1 as is where is immediately
84534 Cameca IMS 6F / 7F (Spares) Eucentric Rotating sample stage spares 1 immediately
88247 CAMECA SC Ultra Total Magnetic Sector SIMS 01.06.2003 1 as is where is
88885 Cameca LEXFAB300 Diffusion Measurement 300 mm 1 as is where is
79191 Camtek Condor 103PD Post saw 2D inspection 300 mm 01.06.2013 1 as is where is immediately
90051 CAMTEK EM3I Sample Preparation 300 mm 01.08.2012 1 as is where is
90052 CAMTEK XACT200 TEM Sample preparation 300 mm 01.08.2012 1 as is where is
86568 Canon Anelva C-7100GT Stepper 200mm 1 as is where is
90707 Carl Zeiss FAB 193 AIMS(AERIAL IMAGE MEASURMENT SYSTEM) 300 MM 01.06.2005 1 as is where is
74929 CDE Resmap 463 OC Resistivity Measurement up to 300 mm 1 as is where is immediately
53036 COMPUMOTOR M575L11 Stepping motor drive spares 1 as is where is immediately
85060 Cressington 208HR Standalone Sputterer Facilities 01.06.1999 1 as is where is immediately
85061 Daitron EMTEC CVP-80 Scientific and Laboratory Equipment 1 as is where is
84986 Digital Instruments NANO-SCOPE 3A AFM 1 as is where is
87099 Disco 3350 Dicing 200mm 4 as is where is immediately
87833 Disco DAD6450 Dicing and handler 200mm 1 as is where is immediately
60946 DNS SS-W60A-AV 24.03.1994 1 as is where is
90249 ECI QP-4000 CVS analysis 150 mm 02.05.1996 1 as is where is
90250 ECI QP-4000 Spectrophotometer 150 mm 02.10.1994 1 as is where is
86548 ECI Technology QL-10EZ Test 200mm 1 as is where is
88248 ECI Technology Qualilab QL-100EX Plating Bath Analysis 200mm 1 as is where is
88249 ECI Technology Qualilab QL-5EX Plating Bath Analysis 200mm 1 as is where is
89978 Edwards IPX-500 Dry Pump 1 as is where is
14505 FEI XL835 Dual beam FIB workstation 01.06.1998 1 inquire 2 weeks
71708 FEI 820 Dual beam Fib 01.06.1996 1 as is where is immediately
79226 FEI DB 235 Dual Beam FIB SEM 01.06.2000 1 inquire
86036 FEI 1265 DUAL BEAM FIB 300 mm 1 as is where is
86037 FEI EXPIDA 1255S MANUAL LOAD, NO STEM, NGSEM COL 300 mm 1 as is where is
86168 FEI STRATA 400S Dual beam FIB 01.06.2005 1 as is where is
86292 FEI F30 Technai FIB SEM 1
86293 FEI Quanta 200 3D FIB SEM 1
86294 FEI DB 835 FIB SEM 1
86295 FEI Quanta 400 FIB SEM 1 inquire immediately
86300 FEI Nova nano 230 FIB SEM 1 inquire immediately
86325 FEI Strata 400S Dual Beam FIB SEM 01.06.2006 1 inquire immediately
86571 FEI T30 Microscope 200mm 1 as is where is
87418 FEI Tecnai G2 F30 S-TEM Unspecified 01.06.2006 1 as is where is
88886 FEI DA300 FIB -Focused Ion Beam Defect Analysis 300 mm 1 as is where is
88998 FEI Tecnai 20 S-TWIN TEM Microscope Lab 01.06.2001 1 as is where is immediately
89021 FEI Vectra + FIB Sem Laboratory 01.10.1998 1 as is where is immediately
90251 FEI AUTO THP 800 FIB SEM 150 mm 02.01.2000 1 as is where is
90326 FEI Helios Nanolab 460HP Dual Beam Fib SEM Laboratory 01.06.2014 1 inquire immediately
90708 FEI STRATA 400S FIB SEM LABORATORY 01.06.2005 1 as is where is
82884 FEI Company DB820 Focused Ion Beam 1 as is where is immediately
86235 FEI Company 820 Dual Bem Fib SEM 200 mm 1 as is where is immediately
90252 FF Trust 2.5GK Magnetic field applied measurement 150 mm 02.02.2000 1 as is where is
88252 First Ten Angstroms FTA3000 Life Sciences, Particle Analysis 300mm 01.01.2010 1 as is where is
90571 Fries Research MicroProf MPR 200 TTV MHU 4 Film Thickness Measurement System 01.06.2011 1 as is where is
86898 Fries Research & Technology (FRT) MicroProf MPR 200 TTV MHU 4 Film Thickness Measurement System 01.01.2011 1 as is where is immediately
55974 FRONTIER FSM900TC-VAC FILM STRESS AND WAFER BOW MEASUREMENT 200 mm 01.05.2000 1 as is where is immediately
88253 FSE FSE-CS-300 Evaporator Deposition Equipment 200mm 1 as is where is
85057 FSM 128 Interferometer 200 mm 1 as is where is
86578 FSM 128 Interferometer 200mm 1 as is where is
90155 FSM 500TC THIN FILM STRESS MEASUREMENT 01.02.2007 1 as is where is
90156 FSM 500TC THIN FILM STRESS MEASUREMENT 01.06.2004 1 as is where is
90157 GAETNER L115C-8 ELLIPSOMETER 01.03.1995 1 as is where is
9961 GCA TROPEL 9000 Surface Flatness Analyzer 1 as is where is immediately
85054 GEMETEC Elymat III wafer contamination measurement 300 MM 1 as is where is
85056 GEMETEC WSPS53 Spectrometers 300 MM 1 as is where is
52151 Hamamatsu R1924A Photomultiplier spares 01.04.2007 1 inquire immediately
71907 Hamamatsu C7103 PC Controlled IC Back-side Lapping and Wafer Grinding System 200 mm and packages 01.10.2001 1 inquire immediately
88255 Hermes Microvision (HMI) eScan-315XP E-beam Inspection 300mm 01.06.2010 1 as is where is
9967 HITACHI S7000 CD SEM 150 mm 01.06.1989 1 inquire immediately
34078 Hitachi S9220 CD SEM 200 mm 01.05.2000 3 inquire immediately
36254 Hitachi S9300 CD-Sem 200 mm 01.12.2000 1 as is where is immediately
36259 HITACHI S-9300 SEM - CD (CRITICAL DIMENSION) 200-300 1 as is where is
52166 Hitachi 545-5515 DC power supply module spares 1 as is where is immediately
52167 Hitachi 6280H Power Supply Module 4channels 1 as is where is immediately
52168 Hitachi 6280H Power Supply unit 1 as is where is immediately
52339 Hitachi 545-5521 spares 01.06.1994 1 as is where is immediately
52340 Hitachi 5455537 IP-PC2 spares 01.06.1994 1 as is where is immediately
52343 Hitachi 377-7592 Power Supply Module 01.06.1994 1 as is where is immediately
53054 HITACHI 6280H SORD Computer spares 1 as is where is immediately
55299 HITACHI S-5000H Metrology Equipment, CD SEM 200mm 01.01.2000 1 as is where is
56838 Hitachi S-4500 FE Inspection SEM Type 1 chamber 1 as is all rebuilt immediately
60937 HITACHI M501AWE 01.06.1996 1 as is where is
60938 HITACHI M501AWE 01.06.1996 1 as is where is
60939 HITACHI S4160 01.06.1996 1 as is where is
60940 HITACHI IS2700 01.06.2005 1 as is where is
60957 HITACHI S6280 1 as is where is
60958 HITACHI S6280 1 as is where is
60959 HITACHI S6180 1 as is where is
60960 HITACHI S8800 1 as is where is
60962 HITACHI S7000 1 as is where is
60963 HITACHI S8800 1 as is where is
60964 HITACHI S7800HSA 1 as is where is
62210 HITACHI S-9300 200 mm 1 as is where is
62211 HITACHI BOND HOT PLATE 1 as is where is
65359 HITACHI S-9220 SIP baord for CD-SEM S9220,P/N 568-5591 1 as is where is immediately
71461 Hitachi S9220 CD SEM 200 mm 1 inquire
71969 HITACHI S4160 FE SEM 8" 1 as is where is
71970 HITACHI S4160 FE SEM 8" 01.06.1996 1 as is where is
74794 Hitachi S5200 FE SEM with EDX Inspection 01.06.2005 1 as is where is immediately
78108 Hitachi S4700 Type 2 FE-SEM Up to 6 inch 01.06.2006 1 as is all rebuilt immediately
78165 Hitachi S8820 CD SEM 200 mm 01.07.1996 1 as is where is immediately
78685 HITACHI DES-9300 METRO 300 MM 01.04.2001 1 as is where is
78690 HITACHI S-9300 CD-SEM 300 MM 01.06.2001 1 as is where is immediately
78693 HITACHI S9360 CD-SEM 300 MM 01.01.2003 1 as is where is
82261 HITACHI S-9360 CD SEM 8"/12" 01.06.2003 1 as is where is immediately
82262 HITACHI S-9360 CD SEM 8"/12" 01.06.2004 1 as is where is immediately
82687 HITACHI S9380Ⅱ CD SEM 300 mm 01.06.2006 1 as is where is
82688 HITACHI S9380Ⅱ CD SEM 300 mm 01.06.2006 1 as is where is
82689 HITACHI S9380Ⅱ CD SEM 300 mm 01.06.2006 1 as is where is
83585 Hitachi S5000H Field Emission SEM Laboratory 1 as is where is immediately
83649 Hitachi IS2700SE Wafer Inspection System 300 mm 01.06.2004 1 inquire immediately
83701 Hitachi S8820 CD SEM 200 mm 1 as is where is immediately
84345 Hitachi EA8000 X-ray Particle Contaminant Analyzer 1 as is where is immediately
84839 Hitachi S2700 Scanning Electron Microscope Laboratory 1 as is where is immediately
85040 Hitachi RS4000E Scanning Electron Microscope 300 mm 01.06.2005 1 as is where is
85041 Hitachi RS4000E Scanning Electron Microscopes 300 mm 01.06.2005 1 as is where is
85043 Hitachi S-4500 FE SEM 200 mm 01.06.1995 1 as is where is
85044 Hitachi S-7800 Critical Dimension Scanning Electron Microscope 200 mm 01.06.2008 1 as is where is
85045 Hitachi S4500 FE SEM 200 mm 1 as is where is
85046 Hitachi s5000 FE SEM 200 MM 01.06.1995 1 as is where is
85047 Hitachi Z-5700 AA spectrophotometer Laboratory and Scientific 1 as is where is
85050 Hitachi AS5000 Scanning Electron Microscope 200 MM 1 as is where is
85051 Hitachi BIST Memory Test System test 01.11.2004 1 as is where is
86169 HITACHI FB-2000A FIB Sem 200 mm 01.06.2001 1 as is where is
86170 HITACHI RS3000 Defect Review SEM 200 mm/300 mm 01.07.2001 1 as is where is immediately
86171 HITACHI S-4700 (w/EDAX) FE SEM with EDX 01.06.1998 1 as is where is
86172 HITACHI S-5000 FE SEM 200 mm 01.06.1994 1 as is where is
86173 HITACHI S-5000 FE SEM 200 mm 01.06.1996 1 as is where is
86174 HITACHI S-5000 FE SEM 200 mm 01.06.1999 1 as is where is
86175 HITACHI S-5000 FE SEM 200 mm 01.06.2000 1 as is where is
86176 HITACHI S-9220 (SMIF) CD-SEM 200 mm 01.06.2001 1 inquire immediately
86177 HITACHI S-9220 (SMIF) CD-SEM 200 mm 01.06.2001 1 as is where is
86178 HITACHI S-9360 CD-SEM 300 mm 01.06.2003 1 as is where is
86275 Hitachi RS4000 In-line Defect Review SEM 200 mm / 300 mm 01.01.2007 1 as is where is immediately
86296 Hitachi 3600N SEM 1 inquire immediately
86297 Hitachi S5200 FE-SEM 1 inquire immediately
86298 Hitachi S4800 FE-SEM 1 inquire immediately
86299 Hitachi s3000H SEM 1 inquire immediately
86463 HITACHI I6300 e-beam WAFER INSPECTION 12 Inch 01.06.2007 1 as is where is immediately
86553 Hitachi S-5500 SEM 200mm 1 as is where is
86574 Hitachi S-4500 SEM 200mm 1 as is where is
86588 Hitachi S-5000 SEM 200mm 1 as is where is
86606 Hitachi RS4000 SEM 200mm 1 as is where is
87141 HITACHI FB2100 FIB 200 mm 01.06.2002 1 as is where is
87142 HITACHI N-6000 NANO PROBER 01.06.2005 1 as is where is
87143 HITACHI RS-3000 REVIEW SEM 300 mm 01.06.2004 1 as is where is
87144 HITACHI S-3000N REVIEW SEM 01.06.2003 1 as is where is
87146 HITACHI S-5200 REVIEW SEM 01.06.2001 1 as is where is
87409 Hitachi S-5500 High Resolution FE SEM 01.06.2006 1 as is where is
87410 Hitachi S-4800-II FE SEM 150/200mm 01.06.2005 1 as is where is
87411 Hitachi S-4700-II FE SEM 150/200mm 1 as is where is
87412 Hitachi HD-2300 STEM 1 as is where is
87413 Hitachi FB-2100 FIB 1 as is where is
88588 Hitachi I6300 Defect Inspection 300 MM 1 as is where is
88589 Hitachi IS2700 Dark Field inspection 300 MM 01.06.2005 1 as is where is
88590 Hitachi RS3000 Review SEM 200 MM, 300 MM 01.06.2003 1 as is where is
88591 Hitachi RS3000T Review SEM 300 MM 01.06.2007 1 as is where is
88592 Hitachi RS4000 Review SEM 300 MM 01.06.2006 1 as is where is
88887 Hitachi S-9380 CD-SEM 1 as is where is
88948 Hitachi S9380 CD SEM metrology ( Working ) Spares 1 inquire immediately
88949 Hitachi S9380 II CD SEM metrology (As-Is) Spares 1 as is where is immediately
88950 Hitachi S9220 CD SEM metrology (Working) 200 mm 1 inquire immediately
88999 Hitachi S-5200 FE SEM Lab 01.06.2004 1 as is where is immediately
90053 HITACHI RS5500 Defect Review Sem 300 mm 01.01.2009 1 as is where is
90054 HITACHI RS5500 Defect Review Sem 300 mm 01.01.2009 1 as is where is
90153 Hitachi S9220 CD-SEM 200 MM 01.01.2002 1 as is where is
90154 Hitachi S9200SA CD-SEM 200 MM 01.09.1999 1 as is where is immediately
90262 Hitachi WR-R30-H13 WF-30 Microscope inspection station 150 mm 02.07.1997 1 as is where is
90353 HITACHI S9380 II CD SEM 300 mm 01.06.2005 1 as is where is immediately
90709 HITACHI FB2100 FIB SEM LABORATORY 01.06.2007 1 as is where is
90875 Hitachi WA-1300 Atomic Force Microscope (AFM) 01.02.2005 1 as is where is
90948 Hitachi I6300 Defect Inspection 300 mm 1 as is where is
90949 Hitachi RS5000 DR SEM 300 mm 01.06.2007 1 as is where is
90950 Hitachi S-5200 FE SEM - 01.06.2001 1 as is where is
91005 Hitachi RS 5500 Defect Review SEM 300 MM 01.06.2009 1 as is where is immediately
91006 Hitachi RS 5500 Defect Review SEM 300 MM 01.06.2009 1 as is where is immediately
90951 Hitachi Kokusai VR-120SD Resistivity Measurement 300 mm 1 as is where is
85048 Horiba emax energy Micro-analysis system for SEM 1 as is where is
85367 Horiba PRPD2 Reticle/Mask Particle Detection System 150 mm 01.06.2006 1 as is where is
87825 Horiba PD3000 Reticle inspection system 200 MM 01.06.1995 1 as is where is immediately
88596 Horiba PR-PD2 Reticle/Mask Particle Detection System 150 MM 01.06.2005 1 as is where is
90670 Horiba Jobin Evon PZ2000 Ellipsometer 200 mm 01.06.2000 1 as is where is immediately
86681 Hypervision PTF1 IR Emission Microscope 01.06.2000 1 as is where is immediately
11069 IRVINE OPTICAL UltraSpec III Wafer Inspection microscope 3 to 6 inch 1 as is where is immediately
90572 ISIS SemDex A31/A32 Wafer Inspection Equipment 300 mm 01.06.2015 1 as is where is immediately
90573 ISIS SemDex A31/A32 Wafer Inspection Equipment 300 mm 01.06.2011 1 as is where is immediately
90574 ISIS SemDex A31/A32 Wafer Inspection Equipment 300 mm 01.01.2011 1 as is where is immediately
15055 Jeol JWS-7505ZH CD Scanning Electron Microscope 100-200 mm 01.06.1997 1 as is where is immediately
32811 JEOL JSM6320 Field Emission SEM N/A 1 inquire immediately
55317 JEOL JWS-7515 Metrology Equipment, CD SEM 150mm 01.10.2000 1 as is where is
84540 JEOL 2100F TEM 200 mm 01.01.2004 1 as is where is immediately
85017 JEOL JEM-2500SE TEM Microscope Laboratory and Scientific 1 as is where is
85018 JEOL JEM-2500SE TEM Microscope Laboratory and Scientific 1 as is where is
85019 JEOL JWS-7515 DEFECT REVIEW SEM 200 mm 01.06.1995 1 as is where is
85020 JEOL JWS7555S Defect review sem 200 mm 01.01.2000 1 as is where is
85021 JEOL JWS7555S Scanning Electron Microscopes 200 mm 01.01.2000 1 as is where is immediately
86179 JEOL JSM-840A FE SEM 1 as is where is
86615 JEOL 7555 SEM 200mm 1 as is where is
87098 JEOL JWS-7505 Defect review SEM w/ EDX, untested 200 mm 01.01.2001 1 as is where is
87627 JEOL JSM 6400 Scanning Electron Microscope 1 as is where is immediately
87789 JEOL JSM-6340F FE SEM Laboratory 1 as is where is
87828 Jeol JWS7555 Scanning Electron Microscopes 200 mm 01.01.2000 1 as is where is immediately
90952 JEOL JSM-7401F FE SEM 300 mm 01.06.2006 1 as is where is
87061 Jordan Valley Bede Metrix X-Ray difractometer (Missing Parts) 200 mm 01.01.2005 1 as is where is immediately
88260 Jordan Valley JVX 6200 X-ray Fluorescence Spectrometer 300mm 01.06.2007 1 as is where is
88261 Jordan Valley JVX 6200 X-ray Fluorescence Spectrometer 300mm 01.06.2010 1 as is where is
90575 Jordan Valley Semiconductors LTD JVX 6200 X-ray Fluorescence Spectrometer 300 mm 01.06.2013 1 as is where is
60932 KE DD-803V PYRO 150 mm 1 as is where is
60933 KE DD-803V PYRO 150 mm 1 as is where is
85022 Keithley 590 CV MEASUREMENT 1 as is where is
86565 Keithley S450 Test 200mm 6 as is where is immediately
86566 Keithley S425 Test 200mm 1 as is where is
83644 Keyence VH-7000 175X Digital HD Microscope 1 as is where is immediately
90253 Keyence VF-7500 Laser dimension measurement 150 mm 02.03.2000 1 as is where is
60971 KIHEVNG KLM-2000 ROUTER M/C 1 as is where is
86607 Kinetic Systems 9101-21-21 Isolation Table 200mm 01.01.1994 1 as is where is immediately
82672 KLA 2132 bright-field WAFER INSPECTION 200mm 1 as is where is immediately
86327 KLA RS35e resistivity measurement 6 1 as is where is
88377 KLA Tencor FLX 2320S Wafer Stress Measurement 200 mm 01.06.2003 1 as is where is immediately
90662 KLA Tencor 2132 Wafer Inspection - 200mm silicon 200 mm 01.04.1996 1 as is where is immediately
90663 KLA Tencor Candela 6120 Wafer Inspection 200 mm 1 as is where is immediately
90664 KLA Tencor Candela C250 Wafer Inspection 200 mm 1 as is where is immediately
87630 KLA - Tencor Alphastep IQ Surface measurement 4 inch 1 as is where is immediately
32230 KLA TENCOR SFS6400 MECHANICAL CALIBRATION Document Number 238 WAFERSURFACE ANALYSIS SYSTEM CUSTOMER MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
32231 KLA TENCOR Surfscan 64X0 Calibration Procedure Surfscan 64X0 Calibration Procedure MANUAL 1 as is where is immediately
32232 KLA TENCOR surfscan 64XX optical alignments Document Number 236 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
32233 KLA TENCOR SFS6x00 MECHANICAL CALIBRATION Document number 200 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
55334 KLA TENCOR 5300 Metrology Equipment, Overlay Measurement System 200mm 01.05.2011 1 as is where is
60947 KLA Tencor 2138-IS 01.06.1999 1 as is where is
60950 KLA Tencor FLX-2908 1 as is where is
60951 KLA Tencor 5100? 1 as is where is
60952 KLA Tencor AIT 1 as is where is
60953 KLA Tencor 2135 brightfield wafer defect inspection 200 mm 01.06.1996 1 as is where is immediately
60976 KLA Tencor ALPHA-STEP 200 1 as is where is
86611 KLA Tencor INS3300 Inspection 200mm 1 as is where is
86613 KLA Tencor Wafersight Inspection 200mm 1 as is where is
86107 KLA-Tencor Archer AIM+ Wafer Overlay Measurement 300 mm 01.06.2006 1 as is where is immediately
1680 KLA-TENCOR 2132 bright-field WAFER INSPECTION 200 mm 01.08.1995 1 as is where is immediately
1691 KLA-TENCOR 259 (spare parts) Reticle Inspection - SPARE PARTS up to 7 inch 01.12.1991 1 inquire immediately
31242 KLA-Tencor 5100 XP registration tool / overlay measurement 200 mm 01.04.1999 1 as is where is immediately
36567 KLA-TENCOR M-GAUGE 300 RESISTANCE MEASUREMENT 1 as is where is immediately
53035 KLA-Tencor 2132 Wafer chuck, 8" spares 1 as is where is immediately
64168 KLA-Tencor 2131 Wafer Defect Inspection 200mm 01.06.1995 1 as is where is immediately
67945 KLA-TENCOR ES30 E-BEAM DEFECT INSPECTION 200 MM 01.12.2002 1 as is where is immediately
70127 KLA-Tencor AIT UV PATTERNED WAFER INSPECTION 200 mm 01.08.2003 1 as is where is immediately
71632 KLA-TENCOR 2122 WAFER DEFECT INSPECTION 200 mm 1 as is where is immediately
74643 KLA-Tencor 710-013838-00 Rev 1 PCB Universal Video Mux spares 01.06.1993 1 as is where is
76676 KLA-TENCOR AIT XP FUSION Dark Field WAFER PARTICLE DETECTION 200 mm 01.10.2002 1 as is where is immediately
76677 KLA-TENCOR AIT FUSION Dark Field WAFER PARTICLE DETECTION 200 mm 01.06.2002 1 as is where is immediately
76681 KLA-TENCOR AIT UV Dark Field WAFER PARTICLE DETECTION 200 mm 01.01.2003 1 as is where is immediately
76682 KLA-TENCOR AIT UV Dark field wafer particle inspection system 200 mm 01.10.2003 1 as is where is immediately
76684 KLA-TENCOR P20H PROFILOMETER 200 mm 01.04.1996 1 as is where is immediately
76947 KLA-Tencor RS 55 Resisitivity Measurement 150 mm and 200 mm 1 as is where is immediately
78697 KLA-Tencor INS3300 MICROSCOPE INSPECTION STATION 300 MM 01.06.2006 1 as is where is
79152 KLA-Tencor 6420 Surface Particle Detection System 200 mm 01.06.1998 1 inquire immediately
79825 KLA-Tencor EV 300 Scanning Electron Microscope with Oxford EDX 01.06.2002 1 as is where is immediately
79847 KLA-Tencor 2915 inspection and metrology 300 mm 01.06.2012 1 inquire immediately
80213 KLA-Tencor 6220 wafer particle inspection 1 as is where is immediately
82896 KLA-Tencor 5300 Overlay Measurement System 200 01.06.2001 1 as is where is immediately
82897 KLA-Tencor 5300 Overlay Measurement System 200 01.06.2001 1 as is where is immediately
83698 KLA-Tencor AIT XP+ Darkfield Inspection 8" 1 as is where is
83700 KLA-Tencor FLX 2908 METRO 8" 1 as is where is immediately
83702 KLA-Tencor AMRAY 4200 Review SEM 8" 01.03.1999 1 as is where is immediately
83704 KLA-TENCOR Optiprobe 2600DUV Metrology 8" 1 as is where is
84034 KLA-Tencor SP2 wafer surface inspection system 300 mm 01.02.2006 1 as is where is immediately
84157 KLA-TENCOR SP2 Darkfield Wafer Inspection 300 mm 01.12.2004 1 as is where is immediately
84255 KLA-Tencor 6220 wafer particle inspection 200 mm 01.01.1999 1 as is where is immediately
84299 KLA-Tencor SP2 XP Wafer surface particle detection 300 mm 01.02.2014 1 as is where is immediately
84523 KLA-Tencor RS 55 (TC) Resisitivity Measurement 150 MM AND 200 MM 01.06.1997 1 as is where is immediately
85023 KLA-Tencor 2132 Optical Inspection 200 mm 01.06.1995 1 as is where is
85024 KLA-Tencor 2132 Optical Inspection 200 mm 01.06.1996 1 as is where is
85027 KLA-Tencor AIT Surfscan Particle Counters 200 mm 01.06.1999 1 as is where is
85028 KLA-Tencor AIT XUV Surface particle measurement 300 MM 01.06.2006 1 as is where is
85029 KLA-Tencor CRS1010 Wafer Inspection Microscopes 200 mm 01.06.1997 1 as is where is
85030 KLA-Tencor ES31 Scanning Electron Microscope 300 MM 01.06.2004 1 as is where is immediately
85031 KLA-Tencor ES32 Scanning Electron Microscope 300 MM 01.06.2007 1 as is where is
85032 KLA-Tencor es810 Scanning Electron Microscopes 300 MM 01.09.2014 1 as is where is
85033 KLA-Tencor es810 Scanning Electron Microscopes 300 MM 01.09.2014 1 as is where is
85034 KLA-Tencor INS3300 Wafer Inspection Microscopes 300 MM 01.06.2005 1 as is where is
85039 KLA-Tencor UV 1050 FTIR – surface film measurement 200 mm 01.06.1995 1 as is where is
85391 KLA-Tencor KLA5200XP Overlay Measurement 200mm 01.01.1998 1 as is where is immediately
85953 KLA-Tencor AIT XP Parts/Options 200 mm 1 as is where is
85954 KLA-Tencor AIT XP Parts/Options 200 mm 1 as is where is
86038 KLA-Tencor AIT UV++ DARKFIELD PATTERN INSPECTION 300 mm 1 as is where is
86039 KLA-Tencor AIT-XP PLUS PATTERNED WAFER INSPECTION, DARK FIELD 300 mm 1 as is where is
86040 KLA-Tencor SCD-XT SCATTEROMETRY METROLOGY TOOL, NC 300 mm 1 as is where is
86041 KLA-Tencor SL3UV-URSA RETICLE INSPECTION 300 mm 1 as is where is
86042 KLA-Tencor SL586H-T3 RETICLE INSPECTION Reticle 1 as is where is
86180 KLA-TENCOR AIT-UV WAFER PARTICLE INSPECTION 200 mm 01.06.2002 1 as is where is
86181 KLA-TENCOR AIT-XP WAFER PARTICLE INSPECTION 200 mm 1 as is where is
86182 KLA-TENCOR ARCHER 10XT OPTICAL OVERLAY MEASUREMENT 300 mm 01.06.2003 1 as is where is
86183 KLA-TENCOR 2370 (BLAZER) BRIGHTFIELD WAFER INSPECTION 300 mm 01.06.2002 1 as is where is immediately
86419 KLA-Tencor AIT 1 wafer particle detection 150 mm 1 as is where is
86424 KLA-Tencor 7700 Surfscan 125 mm 01.02.1996 1 as is where is
86921 KLA-Tencor Aleris CX Film Thickness Measurement System 300 mm 1 as is where is
86922 KLA-Tencor Aleris HT Film Thickness Measurement System 300 mm 1 as is where is
87084 KLA-TENCOR 2135 Brightfield Wafer Inspection 200 mm 01.01.2000 1 as is where is immediately
87414 KLA-Tencor Archer XT+ OVERLAY MEASUREMENT 300 mm 01.06.2006 1 as is where is
87416 KLA-Tencor Candela CS10 WAFER INSPECTION 150/200mm 1 as is where is
87417 KLA-Tencor eDR-5210 Defect review Sem 300 mm 1 as is where is
87421 KLA-Tencor Puma 9550 WAFER INSPECTION 300 mm 01.06.2011 1 as is where is
87422 KLA-Tencor 2360 BRIGHT FIELD WAFER INSPECTION 200 mm 01.06.2001 1 as is where is
87641 KLA-Tencor 6220 Surfscan wafer particle detection system 200 mm 01.03.1997 1 as is where is immediately
87790 KLA-Tencor FLX 2908 Thin Film Measurement System 200 mm 1 as is where is
87791 KLA-Tencor P2 Surface Profiler 200 mm 1 as is where is
88266 KLA-Tencor eS20XP E-beam Inspection 200mm 01.01.2001 1 as is where is
88364 Kla-Tencor 2135 Birghtfield wafer defect inspection 150 mm or 200 mm 01.06.1995 1 inquire
88365 Kla-Tencor 2135 XP Birghtfield wafer defect inspection 150 mm or 200 mm 01.06.1997 1 inquire
88366 Kla-Tencor 2139 Birghtfield wafer defect inspection 150 mm or 200 mm 01.06.2000 1 as is where is immediately
88367 Kla-Tencor P11 WAFER SURFACE PROFILOMETER 200 mm OR SMALLER 01.06.1997 1 as is where is immediately
88368 Kla-Tencor P15 WAFER SURFACE PROFILOMETER 200 mm OR SMALLER 01.06.2007 1 inquire immediately
88369 Kla-Tencor 5200 Overlay measurement (For spares use) 200 mm 01.06.1997 1 inquire immediately
88370 Kla-Tencor FLX 2908 Wafer Stress Measurement 1 inquire
88378 Kla-Tencor Alpha Step IQ Profileometer Manual 1 inquire immediately
88379 Kla-Tencor AIT 2 Surfscan wafer particle detection system 200 mm 01.06.1998 1 inquire
88597 KLA-Tencor AIT Fusion XUV Dark Field inspection 300 MM 01.06.2004 1 as is where is
88598 KLA-Tencor AIT UV Dark Field inspection 200 MM 01.06.2003 1 as is where is
88600 KLA-Tencor Aleris HX8500 Thickness Measurement 300 MM 01.06.2008 1 as is where is
88601 KLA-Tencor Archer 10 AIM+ Overlay 300 MM 01.06.2002 1 as is where is
88602 KLA-Tencor Archer AIM MPX Overlay 300 MM 01.06.2005 1 as is where is
88603 KLA-Tencor Archer AIM+ Overlay 300 MM 01.06.2006 1 as is where is
88605 KLA-Tencor EDR5210 Defect Review SEM 300 MM 01.06.2010 1 as is where is
88607 KLA-Tencor INM100+INS10 Metrology 150 MM 1 as is where is
88608 KLA-Tencor INS3300G1 Macro inspection 300 MM 01.06.2001 1 as is where is
88609 KLA-Tencor KLA2552 Data Review Station 200 MM 01.06.1996 1 as is where is
88610 KLA-Tencor KLA2800 Bright Field Inspection 300 MM 01.06.2007 1 as is where is
88611 KLA-Tencor LDS3300M Macro inspection 200 MM 1 as is where is
88613 KLA-Tencor Puma 9000S Dark Field inspection 300 MM 01.06.2005 1 as is where is
88614 KLA-Tencor Puma 9130 Dark Field inspection 300 MM 01.06.2005 1 as is where is
88888 KLA-Tencor Viper Macro Defect Inspection 1 as is where is
88889 KLA-Tencor Viper Macro Defect Inspection 1 as is where is
88890 KLA-Tencor 5200 Overlay Measurement 1 as is where is
88891 KLA-Tencor Aleris DX Spectroscopic Ellipsometer 1 as is where is
88892 KLA-Tencor HRP Profilometer 01.06.2011 1 as is where is
88893 KLA-Tencor HRP Profilometer 1 as is where is
88894 KLA-Tencor SCD Spectroscopic Critical Dimension Metrology 1 as is where is
88895 KLA-Tencor SCD Spectroscopic Critical Dimension Metrology 1 as is where is
88896 KLA-Tencor SL515 Mask Defect Inspection 1 as is where is
89977 KLA-Tencor Surfscan 4000 Metrology 150mm 1 as is where is
90108 KLA-TENCOR FX200 Film Thickness Measurement 300 mm 01.06.2005 1 as is where is immediately
90307 KLA-Tencor P17 Stylus profileometer 200 mm 01.06.2014 1 as is where is immediately
90324 KLA-Tencor KLA5200XP Overlay Measurement 200mm 1 as is where is immediately
90381 KLA-Tencor SP1-DLS Wafer inspection 300 mm 01.06.2004 1 as is where is immediately
90382 KLA-Tencor SP3 Wafer inspection 300 mm 01.06.2004 1 as is where is immediately
90576 KLA-Tencor Aleris 8330 Film Thickness Measurement System 300 mm 01.06.2013 1 as is where is
90577 KLA-Tencor CIRCL2 Macro-Defect 300 mm 01.06.2014 1 as is where is
90578 KLA-Tencor CIRCL2 Macro-Defect 300 mm 01.06.2013 1 as is where is
90579 KLA-Tencor eS32 E-beam Inspection 300 mm 01.06.2006 1 as is where is
90582 KLA-Tencor SpectraShape 8660 Optical Review System 300 mm 01.04.2013 1 as is where is
90710 KLA-Tencor ES35 E-BEAM INSPECTION 300 MM 01.06.2009 1 as is where is
90876 KLA-Tencor Archer 100 Overlay Measurement System 300mm 1 as is where is
90877 KLA-Tencor Archer 100 Overlay Measurement System 300mm 01.03.2011 1 as is where is
90878 KLA-Tencor Archer 100 Overlay Measurement System 300mm 01.04.2011 1 as is where is
90879 KLA-Tencor Archer 300 Overlay Measurement System 300mm 01.07.2010 1 as is where is
90880 KLA-Tencor Quantox XP In-Line Electrical Monitoring and Characterization 300mm 01.06.2001 1 as is where is
90881 KLA-Tencor Surfscan SP1 DLS Particle Measurement 300mm 01.06.2006 1 as is where is
90882 KLA-Tencor Surfscan SP2 Particle Measurement 300mm 01.06.2004 1 as is where is
90883 KLA-Tencor Surfscan SP2 XP Particle Measurement 300mm 01.06.2011 1 as is where is
90953 KLA-Tencor AIT Fusion Dark Field inspection 200 mm 01.06.2003 1 as is where is
90954 KLA-Tencor Aleris CX Film thickness measurements 300 mm 01.06.2007 1 as is where is
90955 KLA-Tencor AWIS-3110 Particle counter 200 mm 01.06.2003 1 as is where is
90956 KLA-Tencor AWIS-3110 Particle counter 200 mm 01.06.2001 1 as is where is
90957 KLA-Tencor EDR5210 DR SEM 300 mm 1 as is where is
90958 KLA-Tencor KLA2371 Bright field 200 mm 01.06.2004 1 as is where is
90959 KLA-Tencor KLA5100 Overlay Measurement 200 mm 1 as is where is
90960 KLA-Tencor NANOMAPPER Nanotopography 300 mm 01.06.2006 1 as is where is
90961 KLA-Tencor Puma 9000 Dark field defect Inspection 300 mm 01.06.2005 1 as is where is
90962 KLA-Tencor Puma 9100 Dark field defect Inspection 300 mm 01.06.2007 1 as is where is
91007 KLA-Tencor Aset F5x Thin Film measurement 300 MM 01.06.2003 1 as is where is immediately
91012 KLA-TENCOR AIT-XP Wafer particle inspection 300mm 1 as is where is
91013 KLA-TENCOR AIT-XP Wafer particle inspection 300mm 1 as is where is
90348 KLA-Tencor / Thermawave OP2600 Film Thickness Measurement 200 mm 01.06.1994 1 as is where is immediately
87147 KLA/TENCOR FLX2320 FILM STRESS MEASURING 150 mm 01.06.1993 1 as is where is
87148 KLA/TENCOR OP3260 FILM THICKNESS MEASUREMENT 200 mm 01.06.1996 1 as is where is
87149 KLA/TENCOR OP3260 FILM THICKNESS MEASUREMENT 200 mm 01.06.1998 1 as is where is
78700 KOKUSAI VR120S METRO 300 MM 01.06.2006 1 as is where is
86595 Kokusai Quixace Ultimate Furnace 200mm 1 as is where is
87152 KOKUSAI VR-120/08S RESISTIVITY TEST SYSTEM 300 mm 01.06.2010 1 as is where is
86573 LAM 2300 Stretch ATM+VTM Plasma 200mm 1 as is where is
85015 Lasertec Reticle Inspection Tool Reticle inspection 200 mm 01.06.2011 1 as is where is
86184 LASERTEC MD2100 Reticle Inspection System 200 mm 1 as is where is
86602 Lasertech Reticle inspection Inspection 200mm 1 as is where is
64259 Leica INS 3300 Microscope inspection station 200 mm 1 as is where is immediately
71999 LEICA INS3000 Microscope inspection station 200 mm 01.03.2000 1 inquire immediately
74574 Leica Stereo Microscope DMLM Stereo Microscope: Objectives: 5x, 10x, 20x, 100x; Ocular: 10x; 1 as is where is
79428 Leica INS 1000 Microscope Inspection Station 200mm 1
82685 LEICA UV Optic Scope QE 300 mm 01.06.2006 1 as is where is
84158 LEICA INS3000, SMIF Wafer Inspection Microscope 200 mm 1 as is where is
86185 LEICA INS3300 Wafer Inspection Microscope 200 mm/300 mm 01.06.2006 1 as is where is
86186 LEICA INS3300 Wafer Inspection Microscope 200 mm/300 mm 01.06.2003 1 as is where is
86187 LEICA INS3300 Wafer Inspection Microscope 200 mm/300 mm 01.06.2003 1 as is where is
86188 LEICA INS3300 Wafer Inspection Microscope 200 mm/300 mm 01.06.2004 1 as is where is
86189 LEICA INS3300 Wafer Inspection Microscope 200 mm/300 mm 01.06.2003 1 as is where is
86191 LEICA MIS200 Wafer Inspection Microscope 200 mm 1 as is where is immediately
86192 LEICA MIS200 Wafer Inspection Microscope 200 mm 1 as is where is immediately
88268 Leica INM20 Microscope 200mm 1 as is where is
88269 Leica INS10 Microscope 200mm 1 as is where is
88898 Leica INS-3300 Microscope inspection station 1 as is where is
86190 LEICA / VISTEC INS3300 Wafer Inspection Microscope 200 mm/300 mm 01.06.2007 1 as is where is immediately
86193 LEITZ MPV-SP Wafer Inspection Microscope 200 mm 1 as is where is
86420 Leitz MPV CD2 AMC Wafer inspection microscope 125 mm 1 as is where is
86421 Leitz MPV CD2 AMC Wafer inspection microscope 125 mm 1 as is where is
86423 Leitz MPV-CD Wafer inspection microscope 125 mm 1 as is where is
86426 Leitz INM100+INS10 Wafer inspection microscope 150 mm 1 as is where is
74757 Leo 435VP inspection SEM 1 as is where is
86529 MASS-PCB VHF300 Polishing 200mm 1 as is where is
86530 MASS-PCB SV200WV Polishing 200mm 1 as is where is
81917 MDC 986G Automatic CV Plotter 200 MM 01.06.2002 1 as is where is immediately
90254 Met One 227B Particle Counter 150 mm 02.06.1999 1 as is where is
85013 Metron Extraction, Amine Total Molecular Base Real Time Monitor Facilities 01.06.2000 1 as is where is
86583 Metron Extration Amine Lab 200mm 1 as is where is
88270 Mitutoyo Roundtest RA-2000 Roundness Measurement 01.06.2003 1 as is where is
86043 MSP 2300XP1 PARTICLE DEPOSITION Reticle 1 as is where is
85011 Multiprobe APF 2 Atomic Force Prober 300 MM 01.06.2009 1 as is where is
85012 Multiprobe MP1 Atomic Force Prober 300 MM 01.06.2006 1 as is where is
71741 Nanofab Nano150 Ion Beam Lithography / Implanter System 150 mm 1 as is where is immediately
55401 NANOMETRICS NanoSpec M-210AFT Metrology Equipment, Thin Film Measurement System 200mm 1 as is where is
55402 NANOMETRICS NanoSpec M-210AFT Metrology Equipment, Thin Film Measurement System 200mm 01.01.1993 1 as is where is
55403 NANOMETRICS NanoSpec M-5100 Metrology Equipment, Wafer Inspection Equipment 200mm 1 as is where is
55404 NANOMETRICS NanoSpec M-5100 Metrology Equipment, Wafer Inspection Equipment 200mm 1 as is where is
82690 NANOMETRICS ORION METROLOGY 300 mm 01.06.2006 1 as is where is immediately
84832 NANOMETRICS NanoSpec 9000 Metrology Equipment, Wafer Inspection Equipment 200mm 1 as is where is immediately
85010 Nanometrics Q240AT Overlay Measurement 200 mm 01.12.2000 1 as is where is immediately
86044 NANOMETRICS NANOSPEC 8300X THIN FILMS MEASURING SYSTEM 300 mm 1 as is where is
86425 Nanometrics Nanospec AFT 210 surface inspection 125 mm 1 as is where is
86580 Nanometrics Q22I Metrology 200mm 1 as is where is
87153 NANOMETRICS NanoSpec6100 FILM THICKNESS MEASURING 200 mm 01.06.1998 1 as is where is
87154 NANOMETRICS NanoSpec9200 FILM THICKNESS MEASURING 200 mm 01.06.2001 1 as is where is
87155 NANOMETRICS NanoSpec9310 FILM THICKNESS MEASURING 200 mm 01.06.2008 1 as is where is
88271 Nanometrics LYNX Critical Dimension (CD) Measurement (non SEM) 300mm 01.06.2013 1 as is where is
88272 Nanometrics LYNX Critical Dimension (CD) Measurement (non SEM) 300mm 01.06.2010 1 as is where is
88616 Nanometrics Caliper Mosaic Overlay 300 MM 01.06.2005 1 as is where is
88617 Nanometrics Caliper Mosaic Overlay 300 MM 01.06.2002 1 as is where is
88618 Nanometrics Caliper Mosaic Overlay 300 MM 01.06.2009 1 as is where is
88620 Nanometrics METRA 2200M Overlay 200 MM 01.06.1996 1 as is where is
88621 Nanometrics METRA-7200 Overlay 200 MM 1 as is where is
90255 Nanometrics M5100 or M5100UV ? Thickness measurement 150 mm 02.09.1995 1 as is where is
90583 Nanometrics LYNX Critical Dimension (CD) Measurement (non SEM) 300 mm 01.09.2011 1 as is where is
90584 Nanometrics Trajectory T3 Film Thickness Measurement System 1 as is where is
90884 Nanometrics Tevet Trajectory T3 Film Thickness Measurement System 1 as is where is
85009 Negevtech NT3100 Optical Inspection MICROSCOPE 300 MM 01.06.2005 1 as is where is
72024 NICOLET ECO1000 FTIR 8" 01.04.1999 1 as is where is
72025 NICOLET ECO1000 FTIR 8" 01.12.2000 1 as is where is
72026 NICOLET ECO1000S FTIR 8" 01.03.1996 1 as is where is
72027 NICOLET ECO1000S FTIR 8" 01.05.1997 1 as is where is
72028 NICOLET ECO1000S FTIR 8" 01.03.2000 1 as is where is
72029 NICOLET ECO1000S FTIR 8" 01.05.1997 1 as is where is
82904 Nikcon AMI-2000 Surface Analyzer 01.06.2003 1 as is where is immediately
33708 NIKON Optiphot Wafer Inspection Microscope 1 inquire
33711 NIKON Optistation 2A Automatic Wafer Inspection Systems for 75mm- 150mm Wafers, Auto Focus, 4ea Available 1 inquire
64341 Nikon VMR 3020 Video Measuring System 01.01.2001 1 as is where is immediately
74827 Nikon MM40 MEASURING MICROSCOPE 200 mm 1 as is where is
76705 Nikon Opiphot Inspection Microscope with autoloader 200 mm 01.04.1992 1 as is where is immediately
79198 Nikon Lasermark Overlap inspection System 300 mm 01.06.2013 1 as is where is immediately
82905 Nikon AMI-3000 Surface Analyzer 200 2 as is where is immediately
87316 Nikon OPTIPHOT 88 Microscope 1 as is where is
88273 Nikon OPTIPHOT 200 Microscope 200mm 1 as is where is
88695 NIKON Opti-Station 7 Wafer inspection 1 inquire immediately
91014 NIKON UFX MICROSCOPE Microscope 200mm 01.06.1997 1 as is where is
91015 NIKON CROSCOPE M PLAN X10, X40, X1 Microscope 200mm 01.06.1997 1 as is where is
86646 Nitto HR8500 taper 0 as is where is
53146 NOVA 210 CMP ENDPOINT MEASUREMENT SYSTEMS 200 mm 5 as is where is immediately
87419 NOVA 3090 OCD WAFER INSPECTION 300 mm 01.06.2007 1 as is where is
87420 NOVA 3090 OCD WAFER INSPECTION 300 mm 01.06.2007 1 as is where is
15207 Olympus AL100-B8 Programmable Wafer Loader 200 mm 9 as is where is immediately
33714 OLYMPUS SZ3060 StereoZoom Microsope 1 inquire
69809 Olympus MX-50 Microscopes 3
86194 Olympus AL-2000 Wafer Inspection Microscope 200 mm 1 as is where is
86467 OLYMPUS AL110-lmb12 Microscope loader 300 mm 01.06.2005 1 as is where is immediately
87085 Olympus MX61-F Wafer Inspection Microscope 200 mm 01.01.2013 1 as is where is immediately
87320 Olympus LEXT OLS-3000 Optical Review System 1 as is where is
90256 Olympus BX51 IR microscope 150 mm 02.07.2001 1 as is where is
90586 Olympus AL3110F Macro-Defect 300 mm 01.06.2004 1 as is where is
90587 Olympus AL3120F Macro-Defect 300 mm 01.06.2006 1 as is where is
90588 Olympus MX80 Microscope 01.06.2002 1 as is where is
90684 OLYMPUS AL110-LMB12-LP2 MICROSCOPE AUTO LOADER 300 mm 01.06.2005 1 as is where is
90711 OLYMPUS MX50A-873MD HIGH POWER SCOPE 300 MM 01.06.2002 1 as is where is
90712 OLYMPUS MX61&AL110-LMB86 Microscope & Autoloader 300 MM 01.06.2006 1 as is where is
90713 OLYMPUS MX61L&AL110LMB MICROSCOPE 300 MM 01.06.2007 1 as is where is
90885 Olympus AL3130F Macro-Defect 300mm 01.06.2005 1 as is where is
91016 OLYMPUS STM-UM MICROSCOPE Microscope 200mm 01.06.2004 1 as is where is
76711 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76712 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76713 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76714 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76715 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76716 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76717 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76718 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76719 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION WITH AUTOLOADER 200 mm 01.12.1996 1 as is where is immediately
76720 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION WITH AUTOLOADER 200 mm 01.12.1996 1 as is where is immediately
76721 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION WITH AUTOLOADER 200 mm 01.12.1996 1 as is where is immediately
76722 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION WITH AUTOLOADER 200 mm 01.12.1996 1 as is where is immediately
76723 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION WITH AUTOLOADER 200 mm 01.12.1996 1 as is where is immediately
60974 OLYMPUS OPTICAL BX60F5 SCOPH 1 as is where is
90589 Optical Gaging Products (OGP) Avant 400 ZIP Video Measurement System 01.06.1999 1 as is where is
90886 Pacific (JMAR) Precision Mirage S2610-01-01 Vision System 01.06.2000 1 as is where is
86592 Particle Measuring Systems Lasair 110 Particle Counter 200mm 1 as is where is
86552 Perkin Elmer Aanalyst 600 Spectrometer 200mm 1 as is where is
87321 Perkin Elmer Elan 6100 DRC ICP/MS Mass Spectrometer 1 as is where is
83940 Philips CM30 Scanning Transmission Electron Microscope (TEM) Laboratory 01.06.1992 1 as is where is immediately
90257 philips LAMBDA09 Magnetostrictive measurement 150 mm 02.03.1999 1 as is where is
88899 Phoenix Micromex SE 160T X-RAY INSPECTION SYSTEM 1 as is where is
78159 Plasmos / Yvon Jobin /Philips Analytical SD2000 Laser Ellipsometer 200 mm 01.08.2000 1 as is where is immediately
31246 PMS Liquitrack 776200 Non volatile residual Monitor facilities 01.11.1999 1 as is where is immediately
90258 Pony X-ray measurement 150 mm 02.06.2001 1 as is where is
33716 PROMETRIX FT-750 Film Thickness Measuring Tool 1 inquire
86551 Quintel 7000 Stepper 200mm 1 as is where is
87792 QVI 600XP Process Control & Measurement 1 as is where is
85008 Raytek RXW-1226SFI Wafer edge inspection 300 MM 11 as is where is
79216 ReVera VeraFlex X-Ray Photoelectron Spectroscopy 300 mm 01.06.2008 1 inquire
85006 Revera RVX5000 Xray photoelectron spectroscopy 300 MM 01.06.2006 1 as is where is
85007 Revera Veraflex Xray photoelectron spectroscopy 300 MM 01.06.2008 1 as is where is
88900 Revera RVX 5000 X-RAY INSPECTION SYSTEM 300 mm 01.06.2005 1 as is where is
11072 RIGAKU 3700H TXRF Wafer Analyzer 150-200 MM 01.04.1994 1 as is where is immediately
34320 Rigaku 3640 X-Ray Wafer Analyzer 200mm 1 as is where is immediately
71780 Rigaku TXRF 300S X-Ray Diffractometer 150mm to 300 mm 01.01.2001 1 as is where is immediately
78263 Rigaku 3640 TXRF 1 as is where is immediately
78339 Rigaku MFM65 xrf 300 mm 1 as is where is immediately
78562 Rigaku 3272 WD Xray Diffractometer 300 mm 01.01.2005 1 as is where is immediately
78701 RIGAKU XRF3630 TRF 200 mm 01.06.1995 1 as is where is
79066 RIGAKU XRF3640 XRF 200 mm 1 as is where is
79217 Rigaku MFM65 XRR/XRF 300 mm 01.06.2009 1 inquire
80193 RIGAKU TXRF-V300 TXRF inspection system 200mm, 300mm 01.06.2008 1 as is where is immediately
82910 RIGAKU 3630 Wafer Inspection Equipment 200 01.06.1996 1 as is where is immediately
83519 Rigaku 3640 X-ray fluoresence wafer / disk analyzer 200 mm 01.06.2000 1 as is all rebuilt immediately
86195 RIGAKU RIGAKU 3630 XRF 200 mm 1 as is where is
87823 Rigaku MFM65 X-ray inspection (For Cu and Au quantification) 300 MM / 200 mm 01.10.2007 1 as is where is immediately
88901 Rigaku 3620 XRF 1 as is where is
78563 Rion KS-40AF Particle Counter facilities 01.06.2007 1 as is where is
72033 RUDOLPH Meta Pulse 200 Cu Copper Film metrology system 200 mm 01.04.2001 1 as is where is immediately
72034 RUDOLPH MP200 METROLOGY 200 mm 01.06.2000 1 as is where is immediately
78702 RUDOLPH MP300 METRO 300 MM 01.06.2007 1 as is where is
78703 RUDOLPH MP300 METRO 300 MM 01.06.2009 1 as is where is
79067 RUDOLPH WV320 Metrology 300mm 1 as is where is
79430 Rudolph MP 200 Cu Thin film measurement - copper film type 200 mm 1 as is where is immediately
85411 Rudolph FEVII Ellipsometer 200 mm 1 as is where is immediately
86196 RUDOLPH WS2500 Wafer Inspection 200 mm 01.06.2002 1 as is where is
86197 RUDOLPH WS2500 Wafer Inspection 200 mm 01.06.2003 1 as is where is
86612 Rudolph WV320 Inspection 200mm 1 as is where is
87156 RUDOLPH FE-7 FILM THICKNESS MEASURING_ELLIPSOMETRY 200 mm 01.06.1997 1 as is where is
87157 RUDOLPH S200 FILM THICKNESS MEASURING_ELLIPSOMETRY 200 mm 01.06.2000 1 as is where is
88283 Rudolph NSX 115 Macro-Defect 1 as is where is immediately
88628 Rudolph MetaPULSE 300 Thickness Measurement 300 MM 01.06.2004 1 as is where is immediately
90058 RUDOLPH MP1 200 Opaque Film Metrology 200 mm 01.07.2002 1 as is where is
90590 Rudolph Matrix S-300 Ellipsometer 300 mm 01.06.2003 1 as is where is
90591 Rudolph Matrix S-300 Ellipsometer 300 mm 01.06.2003 1 as is where is
90592 Rudolph Matrix S-300 Ellipsometer 01.11.2001 1 as is where is
90593 Rudolph Matrix S-300 Ellipsometer 01.12.2001 1 as is where is
90887 Rudolph NSX 105 Macro-Defect 300mm 01.06.2006 1 as is where is
70089 Rudolph Technologies FE-VII Ellipsometer 200 mm 01.06.1996 1 as is where is immediately
85002 Rudolph Technologies Macro Defect WV320 YVS SERVER Optical Inspection Facilities 1 as is where is
85003 Rudolph Technologies S300 wafer surface inspection system 300 MM 01.06.2007 1 as is where is immediately
85004 Rudolph Technologies WaferView 320 Macro defect inspection 300 MM 01.06.2005 1 as is where is
85005 Rudolph Technologies WaferView 320 Macro defect inspection 300 MM 01.06.2005 1 as is where is
88902 Rudolph Technologies AXI-930 B20 Macro Defect Inspection 1 as is where is
88903 Rudolph Technologies WaferView 320 300mm Macro Defect Inspection 300mm 1 as is where is
88624 Rudolph/August 3Di8500 Wafer Inspection 300 MM 01.06.2008 1 as is where is
88625 Rudolph/August FE-VII Focus Ellipsometer 200 MM 01.06.1993 1 as is where is
88626 Rudolph/August FE-VII-D Focus Ellipsometer 200 MM 1 as is where is
88627 Rudolph/August FE-VII-D Focus Ellipsometer 200 MM 01.06.1997 1 as is where is
88629 Rudolph/August NSX105 Macro Inspection 200 MM 01.06.2004 1 as is where is
88630 Rudolph/August NSX105 Macro Inspection 200 MM 01.06.2003 1 as is where is
86556 Samco PC-1100 Plasna 200mm 1 as is where is
86581 Sankyo SWH80 WET 200mm 1 as is where is
84997 Scientek Technology Stacis 2100 active vibration isolation system 300 MM 1 as is where is
86593 SCP 8500 Wafer 200mm 1 as is where is
86599 SCP Wet Bench WET 200mm 1 as is where is
10076 SDI FAaST 330 Surface Photo Voltage Tester for up to 300mm Wafers 300 mm / 200 mm 1 as is where is immediately
86198 SDI 3020 Carrier Lifetime measurement 200 mm 1 as is where is
79068 SDI Semiconductor Diagnostics FAAST300 Carrier Lifetime measurement 300mm 1 as is where is
90661 SDI Semiconductor Diagnostics Faast 230 Wafer Characterization System 200 mm 01.06.2004 1 inquire immediately
90685 SDI SEMICONDUCTOR DIAGNOSTICS FAAST-350 WAFER CHARACTERIZATION 300 mm 01.06.2008 1 as is where is immediately
87793 Seiko SMI 9800 Focused Ion Beam 200 mm 01.02.1995 1 as is where is
86199 SEIKO SEIKI SMI2200 SEM 200 mm 1 as is where is
77904 SELA MC100 Slicer / Microcleaver / Micro-Cleaver 1 as is where is immediately
77905 SELA MC500 Slicer / Microcleaver / Micro-Cleaver 200 mm 1 as is where is immediately
60972 SEMI-AUTOPROBE MP2000? STATION SYSTEM 1 as is where is
78569 Semicaps SOM 3000 EMMI / Optical microscope inverted tester docked system 300 mm 1 as is where is immediately
82911 Semiconductor Diagnostics 3030 Surface Profiler 200 01.06.2012 1 as is where is immediately
84542 SEMILAB FAAST 300 Carrier lifetime measurement 300 mm 01.06.2006 1 as is where is immediately
84998 Semilab IR3100 FT-IR Spectrometers 300 MM 01.06.2005 1 as is where is
89974 Semix Tazmo SOG TR817UD-TM 150mm SOG 150mm 1 as is where is
90259 shb instruments 109 Hysteresis loop tracer 150 mm 02.06.1998 1 as is where is
82686 Shinsung Eng SGL-30 QE 300 mm 01.06.2011 1 as is where is
84995 SII XV 300DB Dual Beam FIB SEM Microscope 300 MM 01.06.2005 1 as is where is
74942 Sonix HS 1000 Scanning Acoustic Microscope 1 as is where is immediately
74946 Sonoscan D6000 C-Sam 01.05.1996 1 as is where is immediately
83703 SOPRA SE 200 Ellipsometer 8" 1 as is where is
84994 Sopra EP12 OPTICAL POROSITY MEASUREMENT 300 MM 1 as is where is
87158 SOPRA GESP5 FILM THICKNESS MEASURING_ELLIPSOMETRY 200 mm 01.06.2010 1 as is where is
90260 Spectris PW2830XRF WAFER ANALYSER XRF 150 mm 02.06.1999 1 as is where is
60975 SSEC EVERGREEN CLEANER 1 as is where is
84993 Suss Microtec BA300-MIT Wafer inspection system 300 MM 01.06.2006 1 as is where is
89975 TecHarmonic EHTVS Water Scrubber 1 as is where is
82914 Technos TREX 610 Series X-ray Fluorescence Spectrometer 200 1 as is where is immediately
77049 Tecnai TF20 TEM Refurbished 01.06.2001 1 as is where is immediately
86610 Tel Lithius KrF Photoresist 200mm 1 as is where is
33722 TENCOR AlphaStep 300 Profilometer 1 inquire
33723 TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool, for 75mm-150mm Wafers 1 inquire
90594 Tescan FERA3 XMH FE SEM 01.06.2014 1 as is where is
86654 Thermawave TP420 0 as is where is
90261 Tohoku Tokusyu ULMR-3000 MR characterization measurement 150 mm 31.03.2008 1 as is where is
86585 Tokyo Electron Unity 2E Plasma 200mm 1 as is where is
86596 Tokyo Electron Tactras Plasma 200mm 1 as is where is
86597 Tokyo Electron Unity II 855SS Plasma 200mm 1 as is where is
86604 Tokyo Electron Lithius iline Photoresist 200mm 1 as is where is
86605 Tokyo Electron Indy+ Furnace 200mm 1 as is where is
88376 Top Con WM7S surface particle measurement 200 mm or less 01.06.2006 1 as is where is immediately
87159 TOPCON Vi-4202 AUTOMATIC VISUAL INSPECTION 200 mm 01.06.2004 1 as is where is
87160 TOPCON WM-5000 WAFER PARTICLE COUNTER 300 mm 01.06.2005 1 as is where is
86560 Toray HS-830 Particle Counter 200mm 1 as is where is
60944 Varian XM-90 1 as is where is
78309 Veeco VX310 Atomic Force Microscope 200 mm / 300 mm 01.06.2004 1 as is where is immediately
83586 Veeco Dimension X3D Model 340 Atomic Force Microscope 300 mm 01.11.2006 1 as is where is immediately
84987 Veeco DIMENSION X1D AFM 300 MM 01.06.2004 1 as is where is
84988 Veeco DIMENSION X3D AFM 300 MM 01.06.2006 1 as is where is
84989 Veeco DIMENSION X3D AFM 300 MM 01.06.2004 1 as is where is
86200 VEECO V220SI Atomic Force Microscope 200 mm 01.06.2002 1 as is where is
88284 Veeco Dimension 7000 Atomic Force Microscope (AFM) 200mm 1 as is where is
88285 Veeco Dimension AFP Atomic Force Profiler (AFP) 300mm 01.06.2006 1 as is where is
88375 Veeco D9000 Atomic Force Microscope 200 mm 01.06.1997 1 as is where is immediately
88631 Veeco Dimension X3D Atomic Force Microscope 300 MM 01.06.2006 1 as is where is
88633 Veeco V200 Profilometer 200 MM 1 as is where is
86045 Veeco / Digital Instruments D9000 AFM Reticle 1 as is where is
36870 Veeco Wyko NT 3300 Profiler System 1
86594 Veeko X-3D, AFM Microscope 300mm 3 as is where is
87474 WED 6701 Microloader Automatic Microscope Wafer Loader 200 mm 1 as is where is
86546 WENESCO HP 1616 UDVG coater 200mm 1 as is where is
86547 WENESCO HP 1616 UDVG coater 200mm 1 as is where is
86534 Wentworth MP-2300 Prober 200mm 1 as is where is
86535 Wentworth MP-2300 Prober 200mm 1 as is where is
34091 Wyko NT 2000 Optical Profiling system 200 MM 1 inquire immediately
38870 Wyko NT1100 Optical Profiling system 1
66762 WYKO HD 2000 DPC Video Scope 1
71792 WYKO NT3300 Optical 3D profiling system 1
71241 Zeiss Axioscop 2 Microscope 1
86046 Zeiss CDC200 Reticle Cd control Reticle 1 as is where is
86572 Zeiss Aixtron II Microscope 200mm 2 as is where is
86716 ZEISS Axiotron Wafer inspection microscope 1 as is where is immediately
88905 Zeiss Axiotron II Microscope inspection station 01.06.2000 1 as is where is
88906 Zeiss Axiotron II Microscope inspection station 01.06.2000 1 as is where is
88907 Zeiss Axiotron II Microscope inspection station 1 as is where is
88908 Zeiss Axiotron II Microscope inspection station 1 as is where is
88909 Zeiss Axiotron II Microscope inspection station 1 as is where is
90595 Zeiss CDC32 Reticle Inspection 300 mm 01.06.2010 1 as is where is
90596 Zeiss CDC32 Reticle Inspection 300 mm 01.06.2015 1 as is where is


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