Please find below a list of Used Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com .Click on any listed item of Fab Metrology , Inspection and QC Equipment to see further data.
SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
---|---|---|---|---|---|---|---|---|
106952 | ACCENT (Nanometrix, BioRad) | QS2200M | FTIR Spectrometer for Epi, SiN, BPSG & CO Measurement, up to 200mm Wafers | 100-200 MM | 01.11.2000 | 1 | as is where is | immediately |
105792 | Accretech | Tiger/ww50 1600 | Bright-Field Inspection | 300 mm | 1 | as is where is | ||
105793 | Accretech | Win-Win 50 1600 | Bright-Field Inspection | 300 mm | 1 | as is where is | ||
105794 | Accretech | Win-Win 50 1600 | Bright-Field Inspection | 300 mm | 1 | as is where is | ||
105795 | Accretech | Win-Win 50 1600 | Bright-Field Inspection | 300 mm | 1 | as is where is | ||
91841 | ADE | Episcan 1000 | FT-IR Spectromter for measurement of Epitaxial films | 100-200 mm | 1 | inquire | immediately | |
92686 | ADE | FIT3120 | PARTICLE COUNTER | 300 mm | 1 | as is where is | ||
97846 | ADE | NANOMAPPER | SQM | 300 mm | 31.05.2001 | 1 | as is where is | |
102631 | ADE | 9500 | Wafer flatness measurement system with ASC1000 | 200 mm | 1 | inquire | ||
102632 | ADE | 9500 | Wafer flatness measurement system with ASC2500 | 200 mm | 1 | inquire | ||
103225 | ADE | NanoMapper FA | Nano-Defects Inspection System | 300 mm | 1 | inquire | immediately | |
101393 | Agilent | 7500a | ICP Mass Spectrometer | Laboratory | 1 | as is where is | immediately | |
102974 | AGILENT | 4155C | SEMICONDUCTOR PARAMETER ANALYZER | 200 MM | 1 | as is where is | ||
84360 | Alcatel | 925-40 | Leak Detector | 1 | as is where is | immediately | ||
83514 | Applied Materials | Opal 7830i Enhanced | CD-SEM | 100 mm to 200 mm | 01.05.1997 | 1 | as is where is | immediately |
86422 | Applied Materials | Orbot WF720 | Wafer inspection system | 125 mm | 1 | as is where is | ||
90947 | Applied Materials | UVision 4 | Bright field inspection | 300 mm | 31.05.2009 | 1 | as is where is | |
92045 | Applied Materials | UV 5 | Wafer Inspection System | 300 mm | 31.05.2012 | 1 | as is where is | immediately |
92800 | Applied Materials | Orbot WF720 | Metrology (Metrology) | 125 mm | 1 | as is where is | ||
93395 | Applied Materials | UVision 3 | Wafer Inspection System | 200 mm | 1 | as is where is | immediately | |
98084 | Applied Materials | UVision 5 | Brightfield UV Wafer Inspection System | 300 mm | 31.05.2011 | 1 | as is where is | |
98085 | Applied Materials | UVision 5 | Brightfield UV Wafer Inspection System | 300 mm | 31.05.2012 | 1 | as is where is | |
102100 | Applied Materials | NanoSEM 3D | CD Metrology | 300 mm | 31.05.2002 | 1 | as is where is | immediately |
102101 | Applied Materials | NanoSEM 3D | CD SEM | 300 mm | 31.05.2002 | 1 | as is where is | immediately |
102103 | Applied Materials | NanoSEM 3D | Scanning Electron, CDSEM Measurement | 300 mm | 31.05.2004 | 1 | as is where is | |
102104 | Applied Materials | NanoSEM 3D | Scanning Electron, CDSEM Measurement | 300 mm | 31.05.2004 | 1 | as is where is | |
102105 | Applied Materials | NanoSEM 3D | Scanning Electron, CDSEM Measurement | 300 mm | 31.05.2004 | 1 | as is where is | |
102986 | Applied Materials | Uvision 600SP | Brightfield Inspection System | 300 mm | 31.05.2008 | 1 | as is where is | |
105797 | Applied Materials | Uvision 200 | Bright-Field Inspection | 300 mm | 1 | as is where is | ||
106078 | Applied Materials | SEMVISION G3 | SEM | 300 mm | 01.05.2005 | 1 | as is where is | immediately |
106289 | APPLIED MATERIALS | UVISION 5 | Bright Field Inspection | 300 mm | 01.06.2013 | 1 | as is where is | immediately |
106350 | Applied Materials | Uvision 200 | Wafer Inspection | 300 mm | 01.06.2006 | 1 | as is where is | |
101427 | ASML | YieldStar S-200B | Overlay Measurement System | 300mm | 31.01.2011 | 1 | as is where is | |
103070 | ASML | YieldStar S-250 | Overlay Measurement System | 300mm | 1 | as is where is | ||
91387 | AUGUST | CV-9812 | Wafer Carrier inspection tool | 1 | as is where is | immediately | ||
98447 | August | 3DI-8000 | wafer bump inspection | 300mm | 1 | as is where is | immediately | |
98448 | August | NSX-95 | 2D Auto inspection system / Macro defect inspection system | 200 mm | 4 | as is where is | immediately | |
101818 | August | NSX105 | Wafer Bumping Inspection System / Macro defect inspection | 200mm | 1 | inquire | ||
106336 | August / Rudolph Technologies | CV9812 | Wafer Carrier inspection tool | 1 | as is where is | immediately | ||
95016 | Bio-Rad | Q8 | Overlay Metrology | 1 | as is all rebuilt | 1 month | ||
99405 | Bio-Rad | Q5 (Upgrade to a Q6) | Overlay Registration Tool | up to 200 mm | 2 | as is where is | immediately | |
99406 | Bio-Rad | Q7/Q8 | Overlay metrology Tool | 150 mm-200 mm | 01.05.1997 | 1 | as is where is | immediately |
99407 | Bio-Rad | QS-1200 | FT-IR Spectrometer | 100-200 mm | 31.05.2004 | 1 | as is where is | immediately |
99409 | Bio-Rad | QS-408M | Manual FT-IR Spectrometer | 100-200 mm | 1 | as is where is | immediately | |
102587 | Bio-Rad | QS-300 | FT-IR Spectrometer | 1 | as is where is | immediately | ||
33671 | BIORAD | Q5 | Overlay Metrology Tool | 200 mm | 2 | as is where is | immediately | |
97995 | Biorad | Q5 | Overlay measurement system | 150mm | 1 | as is where is | ||
106642 | BROOKS | METARA 7200 | Overlay | 200 mm | 01.06.1996 | 1 | as is where is | |
97850 | Bruker | DEKTAK-8ADP | Scan Profiler | 1 | as is where is | |||
102149 | Bruker | Insight 3D | Mask House Photomask Inspection | 300 mm | 31.05.2017 | 1 | as is where is | |
101769 | Cambridge Scientific | S360 | SEM with EDS | 1 | as is where is | immediately | ||
95610 | Cameca | TXRF 8300 | Automated TXRF with Specimen Chamber and Wafer Handling | 300 mm | 31.05.2007 | 1 | as is where is | immediately |
103221 | Cameca | IMS 5FE7 | Secondary Ion Mass Spectrometry System | 1 | as is where is | immediately | ||
106645 | CAMECA | EX300 | Secondary Ion Mass Spectrometer | 300 mm | 1 | as is where is | ||
102151 | Camtek | X- ACT | TEM Sample Preparation System | 31.05.2012 | 1 | as is where is | ||
100723 | Canon | PLA501 | Contact and Prossimity Mask Aligner | 1 | as is where is | |||
102164 | Carl Zeiss | Axiotron-2 | Microscope | 200 mm | 1 | as is where is | ||
102165 | Carl Zeiss | Axiotron-2 | Micro scope | 200 mm | 1 | as is where is | ||
102167 | Carl Zeiss | Axiotron-2 | Microscope | 200 mm | 1 | as is where is | ||
107017 | Creative Design Engineering (CDE) | ResMap 178 | Resistivity Mapping System | Up to 200 mm | 01.06.2012 | 1 | as is where is | immediately |
106647 | CYBER OPTICS | CYBERSCAN C212/110 | Laser Measure | 200 mm | 1 | as is where is | ||
103152 | Dektak | 3030 | Profiler | 1 | inquire | |||
100728 | Delta Tech. | GM SSR AX-PC/GM-1D | X-Ray | 31.05.2010 | 1 | as is where is | ||
102589 | E+H | MX 203-6-33 | Wafer Bow Measurement System | 100 - 150 mm | 31.05.2008 | 1 | as is where is | immediately |
106200 | EDAX | Eagle 2 | Micro-probe EDX analyser | Laboratory | 01.06.2000 | 1 | as is where is | immediately |
89978 | Edwards | IPX-500 | Dry Pump | 1 | as is where is | |||
92213 | ESCO | EMD-WA1000S | Temperature Desorption Analyzer | 200mm | 31.05.2000 | 1 | as is where is | |
100938 | ESMO | Hermes | Testhead Manipulator | Test | 31.05.2006 | 3 | as is where is | immediately |
79226 | FEI | DB 235 Dual Beam | FIB SEM | 01.06.2000 | 1 | inquire | ||
86292 | FEI | F30 Technai | FIB SEM | 1 | ||||
86294 | FEI | DB 835 | FIB SEM | 1 | ||||
86300 | FEI | Nova nano 230 | FIB SEM | 1 | inquire | immediately | ||
92040 | FEI | TF30 | Super twin | 30.09.2007 | 1 | as is all rebuilt | immediately | |
92713 | FEI | Dual beam 820 | FIB SEM | 200 mm | 01.05.1997 | 1 | as is where is | immediately |
93961 | FEI | Altura | Dual beam FIB | 31.12.2003 | 1 | as is where is | immediately | |
96041 | FEI | Helios Nanolab 400 | FIB SEM | 100 mm | 31.05.2008 | 1 | inquire | |
101711 | FEI | Helios 450S | Dual Beam FIB-SEM | 1 | inquire | |||
101712 | FEI | Strata 400 | Focused Ion Beam System | 1 | inquire | |||
103002 | FEI | 200XP | Focus Ion Beam System | 31.05.2005 | 1 | as is where is | ||
103436 | FEI | Tecnai G2 F30 | TEM electron microscope | Laboratory | 01.05.2005 | 1 | as is where is | immediately |
106964 | FEI | Strata 400 | Dual Beam FIB SEM | Laboratory | 01.06.2006 | 1 | as is where is | immediately |
107000 | FEI | Sirion | FE SEM with e-beam lithography capability and EDX | up to 2.5 inch diameter | 01.06.2002 | 1 | as is where is | immediately |
86235 | FEI Company | 820 | Dual Bem Fib SEM | 200 mm | 1 | as is where is | immediately | |
101441 | FEI Company | Tecnai G2 F30 | TEM | Laboratory | 1 | as is where is | immediately | |
106239 | FEI Company | 820 | Dual Column Focused Ion Beam | Laboratory | 01.01.1993 | 1 | as is where is | immediately |
107024 | Four Dimensions | CV Map 92A | Mercury probe CV Plotting System | up to 200 mm | 01.04.2014 | 1 | as is where is | immediately |
55974 | FRONTIER | FSM900TC-VAC | FILM STRESS AND WAFER BOW MEASUREMENT | 200 mm | 30.04.2000 | 1 | as is where is | immediately |
90155 | FSM | FSM 500TC | THIN FILM STRESS MEASUREMENT | 31.01.2007 | 1 | as is where is | ||
90156 | FSM | 500TC | THIN FILM STRESS MEASUREMENT | 31.05.2004 | 1 | as is where is | immediately | |
93084 | FSM | SYMPHONYMC | Life Time | 300 MM | 1 | as is where is | ||
96543 | Gaertner | L115C-8 | Ellipsometer, cassette to cassette | 100-200 mm | 28.02.1995 | 1 | as is where is | immediately |
99414 | GCA/Tropel | 9000 | Wafer Flatness Analyzer | 1 | as is where is | |||
102218 | GEMETEC | Elymat III | WSPS | 300 mm | 1 | as is where is | ||
71907 | Hamamatsu | C7103 | PC Controlled IC Back-side Lapping and Wafer Grinding System | 200 mm and packages | 30.09.2001 | 1 | as is where is | immediately |
97928 | HANRA | HRI-580L | INSPECTION SYSTEM | ASSEMBLY | 2 | inquire | ||
97859 | HERMES | NMI-100 | DEFECT INSPECTION | 1 | as is where is | |||
98118 | Hermes Microvision | eScan320 | ebeam Inspection | 300 mm | 1 | as is where is | ||
101442 | Hermes Microvision | eP3 XP | E-beam Inspection | 300mm | 31.05.2014 | 1 | as is where is | |
101443 | Hermes Microvision | eP3 XP | E-beam Inspection | 300mm | 31.05.2014 | 1 | as is where is | |
102219 | Hermes Microvision | eP3 XP | E-Beam Inspection System | 300 mm | 31.05.2012 | 1 | as is where is | |
102220 | Hermes Microvision | eP4 | CFM_EBeam Inspection HMI | 300 mm | 31.05.2017 | 1 | as is where is | |
102222 | Hermes Microvision | eScan500 | EBeam Inspection_HMI | 300 mm | 31.05.2014 | 1 | as is where is | |
102959 | HIMS | NMI-100 | DEFECT INSPECTION | 300 mm | 1 | as is where is | ||
52166 | Hitachi | 545-5515 | DC power supply module for CD SEM | spares | 1 | as is where is | immediately | |
52167 | Hitachi | 6280H | Power Supply Module 4channels | spares | 1 | as is where is | immediately | |
52168 | Hitachi | 545-5540 | Power Supply unit for CD SEM | Spares | 1 | as is where is | immediately | |
52312 | Hitachi | 545-5522 | VG board for CD SEM | spares | 31.05.1994 | 1 | as is where is | immediately |
52339 | Hitachi | 545-5521 | EVAC PCB FOR HITACHI CD-SEM | spares | 31.05.1994 | 1 | as is where is | immediately |
52340 | Hitachi | 545-5537 | IP-PC2 for cd-sem | spares | 31.05.1994 | 1 | as is where is | immediately |
52343 | Hitachi | 377-7592 | Power Supply Module for CD SEM | spares | 31.05.1994 | 1 | as is where is | immediately |
53054 | HITACHI | 6280H (SPARES) | SORD Computer for cd sem system | spares | 1 | as is where is | immediately | |
56838 | Hitachi | S-4500 | FE Inspection SEM Type 1 chamber | 1 | as is all rebuilt | immediately | ||
60939 | HITACHI | S4160 | Scanning electron microscope | 31.05.1996 | 1 | as is where is | ||
65359 | HITACHI | S-9220 | SIP baord for CD-SEM S9220,P/N 568-5591 | 1 | as is where is | immediately | ||
74794 | Hitachi | S5200 | FE SEM with EDX | Inspection | 31.05.2005 | 1 | as is where is | immediately |
78108 | Hitachi | S4700 Type 2 | FE-SEM | Up to 6 inch | 31.05.2006 | 1 | as is all rebuilt | immediately |
83585 | Hitachi | S5000H | Field Emission SEM | Laboratory | 1 | as is where is | immediately | |
83849 | Hitachi | S4500 Type I | FE SEM | Laboratory | 01.05.1995 | 1 | inquire | immediately |
84345 | Hitachi | EA8000 | X-ray Particle Contaminant Analyzer | 1 | as is where is | immediately | ||
86169 | HITACHI | FB-2000A | FIB Sem | 200 mm | 31.05.2001 | 1 | as is where is | |
86171 | HITACHI | S-4700 (w/EDAX) | FE SEM with EDX | 31.05.1998 | 1 | as is where is | immediately | |
86172 | HITACHI | S-5000 | FE SEM | 200 mm | 31.05.1994 | 1 | as is where is | |
86173 | HITACHI | S-5000 | FE SEM | 200 mm | 31.05.1996 | 1 | as is where is | |
86174 | HITACHI | S-5000 | FE SEM | 200 mm | 31.05.1999 | 1 | as is where is | |
86175 | HITACHI | S-5000 | FE SEM | 200 mm | 31.05.2000 | 1 | as is where is | |
86275 | Hitachi | RS4000 | In-line Defect Review SEM | 200 mm / 300 mm | 31.12.2006 | 1 | as is where is | immediately |
86296 | Hitachi | 3600N | SEM | 1 | as is where is | immediately | ||
86297 | Hitachi | S5200 | FE-SEM | 1 | inquire | immediately | ||
88948 | Hitachi | S9380 | CD SEM metrology ( Working ) | Spares | 1 | inquire | immediately | |
88949 | Hitachi | S9380 II | CD SEM metrology (As-Is) | Spares | 1 | as is where is | immediately | |
91085 | HITACHI | IS-2700 | Wafer Inspection Station | 300 mm | 1 | as is where is | ||
91086 | HITACHI | S-4160 | FE SEM | Laboratory | 31.05.1996 | 1 | as is where is | |
91087 | HITACHI | S-4160 | FE SEM | Laboratory | 31.05.1996 | 1 | as is where is | |
91088 | HITACHI | S-4800 | FE SEM | Laboratory | 31.05.2005 | 1 | as is where is | |
91089 | HITACHI | S-5500 | FE SEM | Laboratory | 31.05.2006 | 1 | as is where is | |
91090 | HITACHI | S-5500 | FE SEM | Laboratory | 31.05.2012 | 1 | as is where is | |
91091 | HITACHI | S-5500 | FE SEM | Laboratory | 31.05.2010 | 1 | as is where is | |
91395 | HITACHI | I-6300 | CD SEM | 1 | as is where is | |||
91397 | HITACHI | IS2700SE | Dark Field inspection | 1 | as is where is | |||
91403 | HITACHI | S-5000 | FE SEM | 150 mm,200 mm | 1 | as is where is | ||
91404 | HITACHI | S-5000 | FE SEM | 150 mm,200 mm | 1 | as is where is | ||
91405 | HITACHI | S-5000 | FE SEM | 150 mm,200 mm | 1 | as is where is | ||
91407 | HITACHI | S-5000 | FE SEM | 150 mm,200 mm | 1 | as is where is | ||
91408 | HITACHI | S-5000 | FE SEM | 150 mm,200 mm | 1 | as is where is | ||
91417 | HITACHI | LS-6800 | wafer surface inspection | 300 mm | 31.08.2007 | 1 | as is where is | immediately |
91418 | HITACHI | UA-7200 | Stripper/Asher | 31.05.2001 | 1 | as is where is | ||
91848 | HITACHI | S7000 | CD SEM | 150 mm | 31.05.1989 | 1 | as is where is | immediately |
95070 | Hitachi | S5000 | SEM Scanning Electron Microscope Hitachi S5000 with Noran 445A-3SES detector | Laboratory | 31.12.2013 | 1 | as is where is | immediately |
95361 | Hitachi | IS3000 | DARK FIELD INSPECTION | 300 mm | 31.05.2007 | 1 | as is where is | |
95729 | Hitachi | WA 3300 | Atomic Force Microscope | 300 mm | 31.05.2007 | 1 | as is where is | immediately |
95952 | Hitachi | WA3300 | Atomic Force Microscope (AFM) | 300 mm | 01.05.2007 | 1 | as is where is | immediately |
96044 | Hitachi | S-4800-II | FE SEM | 200 mm | 31.05.2004 | 1 | inquire | |
96046 | Hitachi | S-5200 | FE SEM | Laboratory and Scientific | 1 | inquire | ||
96047 | Hitachi | SU-70 | High Resolution Field Emission SEM | Laboratory and Scientific | 31.05.2008 | 1 | inquire | |
98206 | Hitachi | S-5000 | FA SEMs/TEMs/Dual Beams | 1 | inquire | |||
98207 | Hitachi | S-7800 | Metrology and Inspection | 200 mm | 31.07.1997 | 1 | inquire | |
98269 | HITACHI | RS 4000 | Defect Review SEM | 300 mm | 01.05.2003 | 1 | as is where is | immediately |
98270 | HITACHI | RS 4000 | Defect Review SEM | 300 mm | 01.05.2003 | 1 | as is where is | immediately |
98506 | Hitachi | WA200 | SEM | 200 mm | 1 | as is where is | ||
99159 | Hitachi | CG-4100 | SEM - Critical Dimension (CD) Measurement | 300mm | 1 | as is where is | ||
100157 | Hitachi | CG-4100 | SEM - Critical Dimension (CD) Measurement | 300mm | 1 | as is where is | ||
101715 | Hitachi | HD-2300 | STEM (Scanning Transmission Electron Microscope) | Laboratory | 01.06.2006 | 1 | as is where is | immediately |
101717 | Hitachi | S-4700-II | FE SEM | 1 | inquire | |||
101718 | Hitachi | S-4800-II | FE SEM | 1 | inquire | |||
101719 | Hitachi | SU-1500 | SEM | 1 | inquire | |||
102223 | Hitachi | AS5000 | Wafer Particle & Defect Analysis System AS-5000 | 200 mm | 31.05.1997 | 1 | as is where is | |
102225 | Hitachi | HF-2000 | EDX/EELs/STEM imaging | 31.05.1995 | 1 | as is where is | ||
102227 | Hitachi | RS4000 | DR SEM | 300 mm | 31.05.2005 | 1 | as is where is | |
102699 | Hitachi | CG-4100 | SEM - Critical Dimension (CD) | 300 mm | 28.02.2013 | 1 | as is where is | |
102965 | HITACHI | IS3000 | DARK FIELD | 300 mm | 31.05.2007 | 1 | as is where is | |
103088 | Hitachi | CG5000 | SEM | 300mm | 30.04.2014 | 1 | as is where is | |
103089 | Hitachi | CG5000 | SEM | 300mm | 30.06.2014 | 1 | as is where is | |
103525 | HITACHI | S4700-l | Scanning Electron Microscope | Laboratory | 31.05.2004 | 1 | as is where is | immediately |
103526 | HITACHI | S4700-ll | FE Sem with Horriba EMAX EDX | Laboratory | 31.05.2001 | 1 | as is where is | immediately |
103527 | HITACHI | S4700-ll | FE Sem with Horriba EMAX EDX (Destocking Status) | Laboratory | 31.05.2003 | 1 | as is where is | immediately |
103706 | Hitachi | 4700 | FE SEM | Laboratory | 31.05.2000 | 1 | as is where is | immediately |
106061 | Hitachi | SU 8010 | Ultra High Resolution Field Emission Scanning Electron Microscope | 100 mm | 01.06.2007 | 1 | as is where is | immediately |
106160 | HITACHI | RS6000 (Enhanced) | Defect Review SEM | 300 mm | 01.06.2013 | 1 | as is where is | immediately |
106315 | HITACHI | LS9000 | Wafer Surface Inspection System | 300mm | 01.06.2010 | 1 | as is where is | |
106367 | HITACHI | IS-2700 | Wafer Inspection | 200 mm | 01.06.2005 | 1 | as is where is | |
106368 | HITACHI | S-9260A | Wafer Inspection | 200 mm | 01.06.2006 | 1 | as is where is | |
106662 | HITACHI | FB2100 | FIB | 200 mm | 01.06.2003 | 1 | as is where is | |
106663 | HITACHI | IS3000SE | WAFER PARTICLE INSPECTION | 300 mm | 01.06.2006 | 1 | as is where is | |
106664 | HITACHI | IS3200SE | WAFER PARTICLE INSPECTION | 300 mm | 01.06.2010 | 1 | as is where is | |
106665 | HITACHI | LS9000 | Wafer Surface Inspection | 300 mm | 01.06.2010 | 1 | as is where is | |
106666 | HITACHI | LS-6800 | Wafer Surface Inspection | 300 mm | 01.06.2007 | 1 | as is where is | |
106890 | Hitachi | RS4000 | Defect Review SEM | 300 mm | 01.05.2007 | 1 | as is where is | immediately |
106893 | Hitachi | RS4000 | Defect Review SEM | 300 mm | 01.06.2006 | 1 | as is where is | immediately |
106918 | Hitachi | S6280H | CD SEM | 01.05.1995 | 1 | as is where is | immediately | |
106782 | HMI | E SCANLIGHT | E-Beam inspection system | 300 mm | 01.06.2008 | 1 | as is where is | |
87825 | Horiba | PD3000 | Reticle inspection system | 200 MM | 31.05.1995 | 1 | as is where is | immediately |
90670 | Horiba Jobin Evon | PZ2000 | Ellipsometer | 200 mm | 31.05.2000 | 1 | as is where is | immediately |
97863 | HP | 16500C | Logic Analyser | 1 | as is where is | |||
102239 | HSEB | AXIOSPECT 301 | Optical Microscope | 300 mm | 1 | as is where is | ||
103092 | HSEB | Axiospect 300 | Optical Review System | 300mm | 1 | as is where is | ||
106667 | HSEB | AXIOSPECT 300 | MICROSCOPE INSPECTION STATION | 300 mm | 1 | as is where is | ||
102559 | HSEB Zeiss | Axiotron 300 | AOI microscope with 2 units of Brooks load port | 300 mm | 1 | as is where is | immediately | |
106501 | Irvine Optical | Auto Wafer Loader Microscope Inspection | WAFER INSPECTION MICROSCOPE WITH AUTOLOADER | 150 mm/200 mm | 1 | as is where is | immediately | |
106502 | Irvine Optical | Auto Wafer Loader Microscope Inspection | WAFER INSPECTION MICROSCOPE WITH AUTOLOADER | 150 mm/200 mm | 01.06.1990 | 1 | as is where is | immediately |
106504 | Irvine Optical | Auto Wafer Loader Microscope Inspection | WAFER INSPECTION MICROSCOPE WITH AUTOLOADER | 200 mm | 01.06.1990 | 1 | as is where is | immediately |
91419 | J.A Woollam | VUV-VASE (Gen II) | Ellipsometer | 300 mm | 1 | as is where is | ||
91420 | J.A Woollam | VUV-VASE VU302 (Gen I) | Ellipsometer | 200 mm | 31.05.2001 | 1 | as is where is | |
87098 | JEOL | JWS-7505 | Defect review SEM w/ EDX, untested | 200 mm | 31.12.2000 | 1 | as is where is | |
87627 | JEOL | JSM 6400 | Scanning Electron Microscope | 1 | as is where is | immediately | ||
87828 | Jeol | JWS7555 | Scanning Electron Microscopes | 200 mm | 31.12.1999 | 1 | as is where is | immediately |
91422 | JEOL | JSM-5600 | FE SEM | 31.05.1999 | 1 | as is where is | ||
91424 | JEOL | JSM-6700F | FE SEM | 1 | as is where is | |||
91899 | Jeol | jSM 6330F | FIELD EMISSION SEM | 1 | as is where is | immediately | ||
92068 | JEOL | JSM 6400F | Scanning Electron Microscope | 1 | as is where is | immediately | ||
92220 | JEOL | JWS-7555 | SEM - Defect Review (DR) | 200mm | 1 | as is where is | immediately | |
93311 | JEOL | JSM-6320 | Field Emission SEM | Laboratory | 1 | as is where is | immediately | |
97999 | JEOL | JWS 7700 | DR SEM | 200 mm | 31.05.1996 | 1 | as is where is | |
98123 | JEOL | ARM200CF Super X | PFA | 31.05.2014 | 1 | as is where is | ||
100991 | Jeol | JWS7500E w/Noran EDX | Wafer Inspection System (SEM) | 200 mm | 31.05.2000 | 1 | as is where is | immediately |
101692 | Jeol | JSM-6060LV | SEM | 1 | inquire | immediately | ||
102244 | JEOL | JEM3200FS | High Resolution TEM | Laboratory | 01.05.2006 | 1 | as is where is | immediately |
102245 | JEOL | JWS-7515 | SEM Wafer Inspection Tool | 200 mm | 31.05.1999 | 1 | as is where is | |
102246 | JEOL | JWS-7555 | SEM Wafer Inspection Tool | 200 mm | 31.05.2000 | 1 | as is where is | |
102247 | JEOL | JWS-7555 | SEM Wafer Inspection Tool | 200 mm | 31.05.2002 | 1 | as is where is | |
102486 | Jeol | JSM-6600F | SEM | 31.05.2014 | 1 | as is where is | immediately | |
102651 | Jeol | JEM-2100 | TEM | laboratory | 1 | as is where is | immediately | |
102652 | Jeol | JSM-7001 | FLV SEM | 1 | inquire | 1 month | ||
102653 | Jeol | JEM-2500SE | TEM | Laboratory | 1 | as is where is | immediately | |
102705 | JEOL | JFS-9855S | Focused Ion Beam System | 200mm | 31.05.2000 | 1 | as is where is | immediately |
102968 | JEOL | JSM-7500F | SEM | Laboratory | 31.05.2009 | 1 | as is where is | |
103158 | Jeol | JSM-6400F | SEM | 31.05.2017 | 1 | inquire | ||
103460 | Jeol | JSM6400 | Scanning Electron Microscope | Laboratory | 31.05.1992 | 1 | as is where is | immediately |
106668 | JEOL | JWS-7500E | SCANNING ELECTRON MICROSCOPE | 200 mm | 1 | as is where is | ||
106898 | JEOL | JEM-2500SE | Transmission Electron Microscope | Laboratory | 1 | as is where is | immediately | |
91427 | Jordan Valley | JVX 6200 | X-ray metrology (X-Ray Reflectivity) | 300 mm | 1 | as is where is | ||
95012 | Jordan Valley | JVX 5200T | X-Ray Reflectometer | 200 MM / 300 MM | 31.05.2006 | 1 | as is where is | |
98000 | Jordan Valley | VVX 5200T | METROLOGY | 300 mm | 31.05.2006 | 1 | as is where is | |
99830 | JORDAN VALLEY | JVX6200I | X-ray Metrology System | 300 mm | 28.02.2011 | 1 | as is where is | immediately |
100917 | Jordan Valley | JVX6200 | X-Ray Inspection System | 300 mm | 31.05.2010 | 1 | as is where is | |
102248 | Jordan Valley | BedeMetrix-F | X-Ray reflectometer | 200 mm | 31.05.2006 | 1 | as is where is | |
102250 | Jordan Valley | JVX6200i | Film Thickness Measurement | 300 mm | 31.05.2011 | 1 | as is where is | |
102252 | Jordan Valley | JVX7300 | Film Thickness Measurement | 300 mm | 31.05.2012 | 1 | as is where is | |
102256 | Karl Suss | MA200 COMPACT | Mask Aligner | 200 mm | 31.05.2012 | 1 | as is where is | |
92658 | KLA | 6220 | Defect Inspection System | 1 | ||||
106057 | KLA | 2915 | Brightfield Wafer Defect Inspection System | 300 mm | 01.02.2014 | 1 | as is where is | immediately |
106168 | KLA | Candela CS20 | Wafer Surface Inspection System | 100 mm to 200 mm | 01.06.2006 | 1 | as is where is | immediately |
106865 | KLA | 2830 (PARTS) | EFEM ONLY with Yaskawa XURCM9206 robot | 300 mm | 01.02.2010 | 1 | as is where is | immediately |
106891 | KLA | 2351 | Brightfield Wafer Defect Inspection System | 200 mm | 01.06.2002 | 1 | as is where is | immediately |
106922 | KLA | OP 2600 | THIN FILM MEASUREMENT | 200 mm | 1 | as is where is | immediately | |
106966 | KLA | Aset F5x | Thin Film measurement / Ellipsometer | 200 mm | 01.12.2000 | 1 | inquire | 4 months |
106968 | KLA | SP2 (spare parts) | Complete set of calibration standard wafers for a KLA SP2 | 200 mm | 01.11.2022 | 1 | inquire | immediately |
107004 | KLA | 2135 | Wafer Defect Inspection System | 200 mm | 1 | as is where is | 1 month | |
106056 | KLA / TENCOR / PROMETRIX | SM 200 | Spectramap 200 wafer film thickness measurement system | 200 mm | 01.12.1986 | 1 | as is where is | immediately |
32230 | KLA TENCOR | SFS6400 MECHANICAL CALIBRATION Document Number 238 | WAFERSURFACE ANALYSIS SYSTEM CUSTOMER MAINTENANCE REFERENCE | MANUAL | 1 | as is where is | immediately | |
32231 | KLA TENCOR | Surfscan 64X0 Calibration Procedure | Surfscan 64X0 Calibration Procedure | MANUAL | 1 | as is where is | immediately | |
32232 | KLA TENCOR | surfscan 64XX optical alignments Document Number 236 | WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE | MANUAL | 1 | as is where is | immediately | |
32233 | KLA TENCOR | SFS6x00 MECHANICAL CALIBRATION Document number 200 | WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE | MANUAL | 1 | as is where is | immediately | |
103161 | KLA Tencor | Surfscan 5500 | Unpatterned Wafer Surface Inspection Tool | 200 mm | 1 | inquire | ||
106481 | KLA Tencor | AIT I | Patterned Surface Inspection System | 150 mm/200 mm | 01.06.1995 | 1 | as is where is | immediately |
106574 | KLA TENCOR | SEM-3800C | Scanning Electron Microscope | N/A | 1 | as is where is | ||
106674 | KLA TENCOR | Viper 2430 | Macro Defect Inspection | 300 mm | 01.06.2004 | 1 | as is where is | immediately |
106675 | KLA TENCOR | Viper 2435 | Macro Defect Inspection | 300 mm | 01.06.2004 | 1 | as is where is | |
106676 | KLA TENCOR | Viper 2435XP | Macro Defect Inspection | 300 mm | 01.06.2004 | 1 | as is where is | |
106679 | KLA TENCOR | 2132 (mainbody only) | Wafer Inspection System | 150 mm,200 mm | 01.06.1995 | 1 | as is where is | |
106680 | KLA TENCOR | P-12 | Profileometer | 150 mm,200 mm | 1 | as is where is | ||
106681 | KLA TENCOR | P-2 | Profileometer | 150 mm,200 mm | 01.06.1996 | 1 | as is where is | |
99837 | KLA- TENCOR | P-22H | Metrology Tool | 200 mm | 1 | as is all rebuilt | immediately | |
98061 | KLA-TENCOR | AIT 1 | Dark field, particle inspection | 150 mm / 200 mm | 1 | inquire | immediately | |
102842 | KLA-TENCOR | UV1280SE | Film Thickness Measurement System / Ellipsometer | 200 mm | 1 | inquire | immediately | |
99845 | KLA-Tencor | 2351 | Bright-Field Wafer Inspection System | 200 mm | 1 | as is where is | immediately | |
1691 | KLA-TENCOR | 259 (spare parts) | Reticle Inspection - SPARE PARTS | up to 7 inch | 01.12.1991 | 1 | inquire | immediately |
52151 | KLA-Tencor | Hamamatsu R1924A | Photomultiplier | spares | 31.03.2007 | 1 | inquire | immediately |
53035 | KLA-Tencor | 2132 (8 inch Wafer Chuck Assembly) | Ceramic Wafer chuck, 8" | spares | 1 | as is where is | immediately | |
53036 | KLA-Tencor | Compumotor M575L11 | Stepping motor drive | spares | 1 | as is where is | immediately | |
70127 | KLA-Tencor | AIT UV | PATTERNED WAFER INSPECTION | 200 mm | 31.07.2003 | 1 | as is where is | immediately |
71632 | KLA-TENCOR | 2122 | Brightfield Wafer Defect Inspection System | 200 mm | 01.04.1996 | 1 | as is where is | immediately |
76676 | KLA-TENCOR | AIT XP FUSION | Dark Field WAFER PARTICLE DETECTION | 200 mm | 01.10.2002 | 1 | as is where is | immediately |
76677 | KLA-TENCOR | AIT FUSION | Dark Field WAFER PARTICLE DETECTION | 200 mm | 01.06.2002 | 1 | as is where is | immediately |
83702 | KLA-Tencor | AMRAY 4200 | Review SEM | 8" | 28.02.1999 | 1 | as is where is | immediately |
85954 | KLA-Tencor | AIT XP | Parts/Options | 200 mm | 1 | as is where is | ||
86419 | KLA-Tencor | AIT 1 | wafer particle detection | 150 mm | 1 | as is where is | ||
86424 | KLA-Tencor | 7700 | Surfscan | 125 mm | 31.01.1996 | 1 | as is where is | |
87421 | KLA-Tencor | Puma 9550 | WAFER INSPECTION | 300 mm | 01.10.2011 | 1 | as is where is | |
87790 | KLA-Tencor | FLX 2908 | Thin Film Measurement System | 200 mm | 31.03.1996 | 1 | as is where is | immediately |
88266 | KLA-Tencor | eS20XP | E-beam Inspection | 200mm | 31.12.2000 | 1 | as is where is | |
88366 | Kla-Tencor | 2139 | Birghtfield wafer defect inspection | 150 mm or 200 mm | 31.05.2000 | 1 | as is where is | immediately |
88370 | Kla-Tencor | FLX 2908 | Wafer Stress Measurement | 1 | inquire | |||
88378 | Kla-Tencor | Alpha Step IQ | Profileometer | Manual | 1 | inquire | immediately | |
88379 | Kla-Tencor | AIT 2 | Surfscan wafer particle detection system | 200 mm | 31.05.1998 | 1 | inquire | |
88605 | KLA-Tencor | EDR5210 | Defect Review SEM | 300 MM | 31.05.2010 | 1 | as is where is | |
88607 | KLA-Tencor | INM100+INS10 | Metrology | 150 MM | 1 | as is where is | ||
89977 | KLA-Tencor | Surfscan 4000 | Wafer surface particle inspection | 150mm | 1 | as is where is | immediately | |
90957 | KLA-Tencor | EDR5210 | DR SEM | 300 mm | 1 | as is where is | ||
90960 | KLA-Tencor | NANOMAPPER | Nanotopography | 300 mm | 31.05.2006 | 1 | as is where is | |
90961 | KLA-Tencor | Puma 9000 | Dark field defect Inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
91435 | KLA-Tencor | AIT | Particle Review | 200 mm | 31.05.1997 | 1 | as is where is | |
91464 | KLA-Tencor | PROMETRIX FT750 | Film Thickness Measurement | 1 | as is where is | |||
91466 | KLA-Tencor | PROMETRIX FT750 | Film Thickness Measurement | 1 | as is where is | |||
91477 | KLA-Tencor | THERMA-WAVE OP 2600 | OPTI-PROBE | 200 mm | 1 | as is where is | immediately | |
92705 | KLA-Tencor | ES35D | E-BEAM INSPECTION | 300 MM | 31.05.2006 | 1 | as is where is | |
92813 | KLA-Tencor | MPV CD2 AMC | Optical Wafer Metrology | 125 mm | 1 | as is where is | ||
92814 | KLA-Tencor | MPV CD2 AMC | Optical Wafer Metrology | 125 mm | 1 | as is where is | ||
92815 | KLA-Tencor | MPV-CD | Optical Wafer Metrology | 125 mm | 1 | as is where is | ||
92817 | KLA-Tencor | Surfscan 7700 | Particle Counter (Metrology) | 125 mm | 1 | as is where is | ||
96998 | KLA-Tencor | Surfscan AIT | Patterned Wafer Inspection | 200 mm | 01.05.1997 | 1 | as is where is | immediately |
97450 | KLA-Tencor | SP1-TBI | Wafer Particle Inspection System | 300 mm | 31.08.2004 | 1 | as is where is | immediately |
98002 | KLA-Tencor | ES31 | ebeam inspection | 300 mm | 31.05.2011 | 1 | as is where is | |
98003 | KLA-Tencor | ES32 | ebeam inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
98134 | KLA-Tencor | Viper | Macro Defect Detection System | 300 mm | 31.05.2010 | 1 | as is where is | |
98400 | KLA-Tencor | AIT I Surfscan | Patterned Wafer Surface Inspection | 200 mm | 1 | as is where is | immediately | |
98403 | KLA-Tencor | SFS-7600 | Patterned Wafer Surface Inspection | 150 mm | 1 | as is where is | ||
98404 | KLA-Tencor | UV-1050 | Thin Film Measurement System | 150 mm | 1 | as is where is | ||
98548 | KLA-Tencor | AIT XP Fusion | Darkfield Pattern Inspection | 200 mm | 3 | inquire | ||
98549 | KLA-Tencor | AIT XP | Darkfield Pattern Inspection | 200 mm | 1 | inquire | immediately | |
98551 | KLA-Tencor | ES31 | SEM Defect Inspection | 200 mm | 1 | as is where is | immediately | |
98553 | KLA-Tencor | UV1080 | Film Thickness Measurement | 150 mm-200 mm | 1 | inquire | ||
98858 | KLA-Tencor | Surfscan 4500 | Unpatterned Wafer Surface Inspection | 2 inch to 6 inch | 30.11.1989 | 1 | as is where is | immediately |
98912 | KLA-Tencor | AIT XP | Defect Inspection | 1 | as is where is | |||
98914 | KLA-Tencor | Spectra FX-1000 HT | Thin film measurement system | 1 | as is where is | |||
98918 | KLA-Tencor | Viper 2401 | After Develop Inspection Tool | 4 inch to 8 inch | 31.10.2000 | 1 | as is where is | immediately |
99912 | KLA-Tencor | KLA2131 | Inspection System | 200 mm | 31.05.1995 | 1 | as is where is | |
100186 | KLA-Tencor | eS32 | E-beam Inspection | 300mm | 31.05.2007 | 1 | as is where is | |
100187 | KLA-Tencor | eS37 | E-beam Inspection | 300mm | 31.05.2009 | 1 | as is where is | |
100730 | KLA-Tencor | Alpha Step IQ | Surface Profiler | 31.05.2010 | 1 | as is where is | ||
100907 | KLA-Tencor | SFX100 | Thickness Measurement System | 300 mm | 31.05.2004 | 1 | ||
101342 | KLA-Tencor | AIT I | Patterned Surface Defect Inspection System | 200 mm | 31.01.1998 | 1 | as is where is | immediately |
101452 | KLA-Tencor | WaferSight | Wafer Characterization | 300 mm | 31.10.2005 | 1 | as is where is | immediately |
102261 | KLA-Tencor | CRS1010 | Review Station | 200 mm | 31.05.1998 | 1 | as is where is | |
102262 | KLA-Tencor | DP2 | Data Prep Station | 31.05.2012 | 1 | as is where is | ||
102263 | KLA-Tencor | eS31 | E-beam Inspection | 300 mm | 31.05.2004 | 1 | as is where is | |
102267 | KLA-Tencor | FX200 | Thickness measurement | 300 mm | 31.05.2006 | 1 | as is where is | |
102270 | KLA-Tencor | Puma 9000 | Dark Field Inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
102273 | KLA-Tencor | Surfscan 2.1 | Particle Counter | 125 mm | 1 | as is where is | ||
102472 | KLA-Tencor | 6220 | Bare Wafer Particle Detection System | 150 mm / 200 mm | 1 | inquire | immediately | |
102477 | KLA-Tencor | P-10 | Manual Wafer Load Disk Profilometer | 200 mm | 1 | |||
102634 | KLA-Tencor | 6400 | Patterned Wafer Particle Inspection System | 150 mm / 200 mm | 1 | inquire | 1 month | |
102709 | KLA-Tencor | eS32 | E-beam Inspection | 300 mm | 1 | as is where is | ||
102710 | KLA-Tencor | eS32 | E-beam Inspection | 300 mm | 1 | as is where is | ||
102969 | KLA-Tencor | FIT3120 | PARTICLE COUNTER | 300 mm | 31.05.2005 | 1 | as is where is | |
103096 | KLA-Tencor | AIT UV | Darkfield Inspection | 300mm | 31.05.2004 | 1 | as is where is | |
103162 | KLA-Tencor | P-15 | Profiler | 200 mm | 1 | inquire | ||
103163 | KLA-Tencor | P-11 | Profiler | 1 | inquire | |||
103164 | KLA-Tencor | Surfscan 4000 | Unpatterned Wafer Surface Inspection Tool | 150 mm | 31.05.1986 | 1 | inquire | |
103166 | KLA-Tencor | Surfscan 5000 | Unpatterned Wafer Surface Inspection Tool | 200 mm | 31.05.1988 | 1 | inquire | |
103733 | KLA-Tencor | Surfscan 4500 | Wafer Particle Inspection System | 2 to 6 inch | 31.05.1986 | 1 | as is where is | immediately |
105783 | KLA-Tencor | ES32 | E-Beam Inspection System | 1 | as is where is | |||
105809 | KLA-Tencor | es32 | E-Beam Inspection | 300 mm | 1 | as is where is | ||
105810 | KLA-Tencor | es32 | E-Beam Inspection | 300 mm | 1 | as is where is | ||
105811 | KLA-Tencor | es32 | E-Beam Inspection | 300 mm | 1 | as is where is | ||
106002 | KLA-Tencor | Archer 200 AIM | Overlay Measurement System | 300 mm | 30.04.2010 | 1 | as is where is | immediately |
106194 | KLA-Tencor | Candela 7100 | Wafer Inspection system for Hard Disk Substrates | 01.12.2010 | 1 | as is where is | immediately | |
106311 | KLA-TENCOR | VISEDGE CV300 | Wafer-Edge Inspection | 300 mm | 01.06.2007 | 1 | as is where is | immediately |
102284 | Kokusai | VR-120SD | Resistivity Measurement | 300 mm | 1 | as is where is | ||
97865 | KRUSS | KRUSSDSA100 | CONTECT ANGLE MEASUREMENT | 1 | as is where is | |||
94475 | LASERTEC | BGM300 | Wafer Surface Analyzing and VIsualization System | 200 mm | 31.05.2008 | 1 | as is where is | |
106702 | LASERTEC | BGM300 | Wafer Inspection System | 300 mm | 1 | as is where is | ||
88268 | Leica | INM20 | Microscope | 200mm | 1 | as is where is | immediately | |
88269 | Leica | INS10 | Microscope | 200mm | 1 | as is where is | ||
97106 | Leica | MZ 12.5 | Stereomicroscope | 1 | as is where is | |||
103110 | Leica | LDS3300C | Macro-Defect | 300mm | 1 | as is where is | ||
106485 | Leica | LEICA INM20 | Microscope inspection station | 200 mm | 01.06.1995 | 1 | as is where is | immediately |
86193 | LEITZ | MPV-SP | Wafer Inspection Microscope | 200 mm | 1 | as is where is | ||
86420 | Leitz | MPV CD2 AMC | Wafer inspection microscope | 125 mm | 1 | as is where is | ||
86421 | Leitz | MPV CD2 AMC | Wafer inspection microscope | 125 mm | 1 | as is where is | ||
86423 | Leitz | MPV-CD | Wafer inspection microscope | 125 mm | 1 | as is where is | ||
86426 | Leitz | INM100+INS10 | Wafer inspection microscope | 150 mm | 1 | as is where is | ||
102168 | Leo | 1530 | FE-SEM | up to 8 inch | 31.05.2002 | 1 | as is where is | |
99419 | MDC | CSM | Automatic CV Plotter with RM-1600 Computer | 1 | as is where is | immediately | ||
99420 | MDC | CSM/16 | Automatic CV Plotter with RM-1600 Computer | 125 MM | 1 | as is where is | immediately | |
98005 | MicoMetrics | Precis | Overlay measurement system | 200 mm | 31.05.2010 | 1 | as is where is | |
99422 | Minato | MM-6600 | Wafer Mobility Tester | 2 | as is where is | |||
91113 | MITUTOYO | MP2000 | METRO | 200 mm | 1 | as is where is | ||
100737 | Mitutoyo | YC-H260 | Measurement Machine | 1 | as is where is | |||
106703 | N&K | ANALYZER 5700-CDRT | Wafer Inspection System | 1 | as is where is | |||
106704 | n&k Technology | 6700-CDRT | Wafer Inspection System | 1 | as is where is | |||
106705 | NANO OPTICS | HAZE 2 | Nano Optics Haze 2 | 200 mm | 1 | as is where is | ||
71741 | Nanofab | Nano150 | Ion Beam Lithography / Implanter System | 150 mm | 1 | inquire | immediately | |
105883 | Nanofab | Nano200 | Ion Beam Lithography / Implanter System | 200 mm | 1 | inquire | immediately | |
86425 | Nanometrics | Nanospec AFT 210 | surface inspection | 125 mm | 1 | as is where is | ||
91526 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 31.05.2003 | 1 | as is where is | immediately |
91529 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 28.02.2010 | 1 | as is where is | immediately |
91530 | NANOMETRICS | NANOMETRICS 9-7200-0195E | Mask & Wafer Inspection | 200 mm | 1 | as is where is | ||
92041 | Nanometrics | 9010B | Metrology | 1 | as is where is | immediately | ||
92818 | Nanometrics | NanoSpec 210 | Metrology (Metrology) | 125 mm | 1 | as is where is | ||
98153 | Nanometrics | Caliper Mosaic | Overlay Measurement | 300 mm | 31.05.2011 | 1 | as is where is | |
98154 | Nanometrics | Caliper Mosaic | Overlay Measurement | 300 mm | 31.05.2009 | 1 | as is where is | |
98155 | Nanometrics | Caliper Mosaic | Overlay Measurement | 300 mm | 31.05.2009 | 1 | as is where is | |
98289 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
98290 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
98291 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 30.06.2006 | 1 | as is where is | immediately |
98480 | Nanometrics | 8000X | film thickness measurement | 150mm | 2 | as is where is | immediately | |
98481 | Nanometrics | 8000Xse | film thickness measurement | 200mm | 2 | as is where is | ||
98508 | Nanometrics | M6100 | Film Thickness Measurement | 200 mm | 1 | as is where is | ||
101585 | NANOMETRICS | CALIPER-ULTRA | Overlay Measurement | 300 mm | 30.06.2006 | 1 | as is where is | |
102309 | Nanometrics | Caliper Q300 | Overlay Measurement System | 300 mm | 31.05.2003 | 1 | as is where is | |
102310 | Nanometrics | Caliper Q300 | Overlay Measurement | 300 mm | 31.05.2003 | 1 | as is where is | |
102311 | Nanometrics | Caliper Q300 | Overlay Inspection | 300 mm | 31.05.2002 | 1 | as is where is | |
102312 | Nanometrics | Caliper Q300 | Overlay Measurement | 300 mm | 31.05.2002 | 1 | as is where is | |
102314 | Nanometrics | Q200I | Overlay Measurement System | 200 mm | 31.05.2000 | 1 | as is where is | |
102315 | Nanometrics | Q200I | Overlay Measurement | 200 mm | 31.05.2002 | 1 | as is where is | |
102840 | NANOMETRICS | 9010 | Integrated Metrology System | 31.12.2007 | 5 | as is where is | immediately | |
103544 | NANOMETRICS | CALIPER ELAN | Overlay | 300 mm | 31.05.2004 | 1 | as is where is | |
106179 | Nanometrics | 9000 | Nanospec Wafer Metrology film thickness measurement tool | 200 mm | 01.06.2005 | 1 | as is all rebuilt | immediately |
106302 | Nanometrics | SIPHER | PL Mapping | 300 mm | 01.06.2002 | 1 | as is where is | immediately |
106706 | NANOMETRICS | CALIPER_ULTRA | Mask & Wafer Inspection | 300 mm | 01.06.2006 | 1 | as is where is | |
106823 | Nanometrics | Nanospec 9100 | Ox film thickness measurement( PC missing) | 200mm | 1 | inquire | ||
107027 | NANOMETRICS | Caliper Mosaic | Overlay measurement System | 300 mm | 01.08.2010 | 1 | inquire | immediately |
105817 | Negevtech | NT3100 | Optical Inspection Microscope | 300 mm | 1 | as is where is | ||
105818 | Negevtech | NT3100 | Optical Inspection Microscope | 300 mm | 1 | as is where is | ||
97868 | Newport | 1830-C | Optical Power Meter | 1 | as is where is | |||
93103 | NGR | NGR2150 | E-beam wafer inspection | 300 MM | 1 | as is where is | ||
102888 | Nicolet | ECO-1000S | FT-IR | 200 mm | 31.05.1996 | 1 | as is where is | |
82904 | Nikcon | AMI-2000 | Surface Analyzer | 01.06.2003 | 1 | as is where is | immediately | |
33708 | NIKON | Optiphot 88 | Wafer Inspection Microscope | 200 mm | 1 | as is where is | immediately | |
64341 | Nikon | VMR 3020 | Video Measuring System | 31.12.2000 | 1 | as is where is | immediately | |
88273 | Nikon | OPTIPHOT 200 | Microscope | 200mm | 1 | as is where is | ||
91863 | NIKON | Optiphot 150 | Wafer Inspection Microscope, 10X, 20X, 50X & 150X Objs., 150mm XY Stage | 150 mm | 1 | as is all rebuilt | immediately | |
91864 | NIKON | Optiphot 200 (For spares use) | Wafer Inspection Microscope (Parts Tool Only) | 200 mm | 1 | as is where is | immediately | |
92616 | Nikon | OPTISTATION V | Optical Review System | 200mm | 1 | as is where is | ||
92617 | Nikon | OPTISTATION V | Optical Review System | 200mm | 1 | as is where is | ||
92707 | NIKON | VMR-C4540 | FOUP INSPECTION | 300 MM | 31.05.2001 | 1 | as is where is | |
92825 | Nikon | OPTIPHOT 66 | Microscope (Metrology) | 150 mm | 1 | as is where is | ||
96395 | Nikon | Lasermark Overlap Inspection System | Inspection System | 200 - 300 mm | 31.05.2013 | 1 | as is where is | immediately |
99396 | Nikon | EpiPhot 200 | Inspection Microscope | 200 mm | 1 | as is where is | immediately | |
99424 | Nikon | Optiphot 150 | Wafer Inspection Microscope | 150 mm | 1 | as is where is | immediately | |
99425 | Nikon | Optistation 3 | Microscope Wafer Inspection Satation with cassette to cassette handling | 150 mm | 1 | as is where is | immediately | |
99426 | Nikon | Optistation 3 | Microscope Wafer Inspection Station with cassette to cassette handling | 150 mm | 1 | as is where is | immediately | |
99427 | Nikon | Optistation 3 | Wafer Inspection System | 150 mm | 31.05.1994 | 1 | as is where is | immediately |
99428 | Nikon | Optistation 3A | Automatic Wafer Inspection Station | 200 mm | 31.05.1997 | 1 | as is where is | immediately |
100223 | Nikon | AMI-3300 | Macro-Defect | 300mm | 1 | as is where is | ||
100224 | Nikon | AMI-3300 | Macro-Defect | 300mm | 1 | as is where is | ||
100226 | Nikon | AMI-3500 | Macro-Defect | 300mm | 1 | as is where is | ||
103038 | Nikon | Optiphot | Inspection Microscope w/ Nomarski Optics | 1 | as is where is | |||
103039 | Nikon | Optiphot 88 | 200mm Inspection Microscope w/ Nomarski Optics | 200 mm | 1 | as is where is | ||
103213 | Nikon | Optiphot-88-AC IN | Inspection Microscope | 200 mm | 1 | as is where is | ||
103215 | Nikon | Optiphot 300 | Inspection Microscope | 300 mm | 1 | as is where is | ||
103216 | Nikon | Optiphot 200 | Inspection Microscope | 200 mm | 1 | as is where is | ||
103458 | Nikon | Optiphot 150 | Wafer Inspection Microscope | 150 mm | 1 | as is where is | immediately | |
103827 | Nikon | Optiphot 150 | Wafer Inspection Microscope | 150 mm | 1 | as is where is | immediately | |
103828 | Nikon | Optiphot 200 | Wafer Inspection Microscope | 200 mm | 1 | as is all rebuilt | immediately | |
103834 | NIKON | Optiphot 88 | Wafer Inspection Microscope | 200 mm | 1 | as is where is | immediately | |
106499 | Nikon | Auto Wafer Loader for Microscope Inspection | Controller, Visual Inspect | 150 mm/200 mm | 1 | as is where is | immediately | |
106500 | Nikon | Auto Wafer Loader for Microscope Inspection | WAFER INSPECTION MICROSCOPE WITH AUTOLOADER | 150 mm/200 mm | 1 | as is where is | immediately | |
106503 | Nikon | Auto Wafer Loader for Microscope Inspection | WAFER INSPECTION MICROSCOPE | 150 mm/200 mm | 1 | as is where is | immediately | |
106509 | Nikon | OPTIPHOT 300 | WAFER INSPECTION MICROSCOPE WITH AUTOLOADER | 150 mm/200 mm | 1 | as is where is | immediately | |
106510 | Nikon | Microscope | Wafer Inspection Dual Microscope | 150 mm/200 mm | 1 | as is where is | immediately | |
106511 | Nikon | SMZ | Boom Microscope with Schott Illuminator, on stand, with flat base plate | Assembly | 1 | as is where is | immediately | |
106707 | NIKON | AMI-3300 | Wafer Inspection System | 300 mm | 1 | as is where is | ||
106708 | NIKON | AMI-3300 | Wafer Inspection System | 300 mm | 1 | as is where is | ||
106709 | NIKON | AMI-3500 | Wafer Inspection System | 300 mm | 1 | as is where is | ||
53146 | NOVA | 210 | CMP ENDPOINT MEASUREMENT SYSTEMS | 200 mm | 5 | as is where is | immediately | |
106513 | OAI | CUSTOM | OI Analytical Model 1088 | 150 mm/200 mm | 1 | as is where is | ||
69809 | Olympus | MX-50 | Microscopes | 3 | ||||
87492 | OLYMPUS | BH-BHM | Wafer Inspection Microscope | 150 mm | 1 | as is where is | immediately | |
95118 | OLYMPUS | MX-610 | Microscope | 200mm - 300mm | 1 | 3 months | ||
96371 | Olympus | MX61L | Wafer Inspection Microscope | 300 mm | 31.12.2012 | 1 | as is where is | immediately |
96372 | Olympus | MX51 | Wafer Inspection Microscope | 150 mm | 1 | as is where is | immediately | |
102839 | Olympus | MX61-L | Inspection Microscope | 300 mm | 1 | as is where is | immediately | |
106407 | Olympus | BHMJL | Wafer Inspection Microscope | 200 mm | 1 | as is where is | ||
106408 | Olympus | BHMJL | Wafer Inspection Microscope | 200 mm | 1 | as is where is | ||
106824 | Olympus | AL100N-LMB8 | wafer loader for Olympus microscope | 200mm | 1 | inquire | ||
106825 | Olympus | AL110-LMB6 with MX51 | wafer loader with Microscope | 150mm | 1 | inquire | ||
76711 | OLYMPUS / ZEISS | AL100 / AXIOTRON | MICROSCOPE INSPECTION STATION | 200 mm | 30.11.1996 | 1 | as is where is | immediately |
76712 | OLYMPUS / ZEISS | AL100 / AXIOTRON | MICROSCOPE INSPECTION STATION | 200 mm | 30.11.1996 | 1 | as is where is | immediately |
76713 | OLYMPUS / ZEISS | AL100 / AXIOTRON | MICROSCOPE INSPECTION STATION | 200 mm | 30.11.1996 | 1 | as is where is | immediately |
76714 | OLYMPUS / ZEISS | AL100 / AXIOTRON | MICROSCOPE INSPECTION STATION | 200 mm | 30.11.1996 | 1 | as is where is | immediately |
103547 | ONTO | WV320 | MACRO INSPECTING | 300 mm | 31.05.2004 | 1 | as is where is | |
100233 | Oxford | X-Strata980 | X-ray Fluorescence Spectrometer | 31.05.2010 | 1 | as is where is | ||
97003 | Philips | PHI 680 | Auger Nanoprobe | Laboratory | 31.05.1998 | 1 | as is where is | immediately |
103115 | Philips | PW2830 | X-ray Fluorescence Spectrometer | 300mm | 31.05.2004 | 1 | as is where is | |
103116 | Philips | PW2830 | X-ray Fluorescence Spectrometer | 300mm | 31.05.2003 | 1 | as is where is | |
95011 | PHILLIPS | IMPULSE 300B | Thin-film measurement | 200 MM / 300 MM | 31.05.2004 | 1 | as is where is | |
91869 | PLASMOS | SD2000 | Automatic Ellipsometer | 200 mm | 1 | inquire | immediately | |
99429 | Plasmos | SD 2004 | Multi-Wavelength Ellipsometer | 200 mm | 1 | as is where is | immediately | |
78159 | Plasmos / Yvon Jobin /Philips Analytical | SD2000 | Laser Ellipsometer | 200 mm | 01.08.2000 | 1 | as is where is | immediately |
31246 | PMS | Liquitrack 776200 | Non volatile residual Monitor for water-quality checking | facilities | 01.10.1999 | 1 | as is where is | immediately |
98424 | Quantronix | DRS 820 | Inspection System | 150 mm | 3 | as is where is | ||
87792 | QVI | 600XP | Process Control & Measurement | 1 | as is where is | |||
91552 | RAYTEX | RXW-800 | EDGE SCAN | 200 mm | 31.05.2008 | 1 | as is where is | |
98489 | Raytex | RXW-0826SFIX-SMIF | edge scanner | 200mm | 1 | as is where is | ||
105819 | Raytex | RXW-1226SFI | Defect Inspection System | 300 mm | 1 | as is where is | ||
106409 | Raytex | RXW-1226SFI | Wafer Edge Inspection | 300 mm | 01.06.2008 | 1 | as is where is | |
79216 | ReVera | VeraFlex | X-Ray Photoelectron Spectroscopy | 300 mm | 31.05.2008 | 1 | as is where is | immediately |
97733 | ReVera | RVX1000 | Film Thickness Measurement System | 300 mm | 1 | as is where is | ||
97734 | ReVera | RVX1000 | Film Thickness Measurement System | 300 mm | 1 | as is where is | immediately | |
105820 | Revera | RVX5000 | X-Ray Photo-electron Spectroscopy (XPS) | 300 mm | 1 | as is where is | ||
106410 | Revera | RVX5000 | X-Ray Photoelectron Spectroscopy (XPS) | 300 mm | 01.06.2008 | 1 | as is where is | |
35595 | RIGAKU | 3630 (For spares use) | Xray Fluorescence Wafer/Disk Analyzer, Missing Xray Tube | 31.05.1997 | 1 | as is where is | immediately | |
71780 | Rigaku | TXRF 300S | X-Ray Diffractometer | 150mm to 300 mm | 01.12.2000 | 1 | as is where is | immediately |
79217 | Rigaku | MFM65 | XRR/XRF | 300 mm | 31.05.2009 | 1 | inquire | |
82910 | RIGAKU | 3630 | Wafer Inspection Equipment | 200 | 01.06.1996 | 1 | as is where is | immediately |
87823 | Rigaku | MFM65 | X-ray inspection (For Cu and Au quantification) | 300 MM / 200 mm | 30.09.2007 | 1 | as is where is | immediately |
91557 | RIGAKU | XRF3640 (Handle include) | Wafer/ Disk Analyzer | 200 mm | 31.05.1995 | 1 | as is where is | |
92691 | Rigaku | MFM65 | In-Line Energy Dispersive X-Ray Fluoresence Wafer Inspection System | 300 mm | 31.05.2008 | 1 | as is where is | immediately |
102347 | Rigaku | 3272 | TXRF (X-Ray Fluorescence) | 300 mm | 31.05.2005 | 1 | as is where is | |
105821 | RION | KS-40AF | Particle Counter | 300 mm | 1 | as is where is | ||
72034 | RUDOLPH | MP200 | METROLOGY | 200 mm | 31.05.2000 | 1 | as is where is | immediately |
91116 | RUDOLPH | MP200 XCu | Thin Film Measurement | 200 mm | 31.05.2001 | 1 | as is where is | |
91559 | RUDOLPH | AXI_S | Macro Inspection System | 300 mm | 31.05.2005 | 1 | as is where is | |
91560 | RUDOLPH | AXI_S | Macro Inspection System | 300 mm | 31.05.2005 | 1 | as is where is | |
91561 | RUDOLPH | AXI_S | Macro Inspection System | 300 mm | 31.05.2006 | 1 | as is where is | |
91563 | RUDOLPH | Meta Pulse | Film Metrology | 200 mm | 31.05.2005 | 1 | as is where is | |
91566 | Rudolph | WS3840 | 3D Bump Metrology | 300 mm | 31.05.2010 | 1 | as is where is | immediately |
91567 | RUDOLPH | META PULSE 200 | Surface Film Metrology | 200 mm | 31.05.2002 | 1 | as is where is | immediately |
92709 | Rudolph | WV320 | MACRO INSPECTION | 300 MM | 31.05.2006 | 1 | as is where is | immediately |
92710 | Rudolph | WV320 | MACRO INSPECTION | 300 MM | 31.05.2006 | 1 | as is where is | |
94478 | RUDOLPH | FE-3 | Focus Ellipsometer | 200 mm | 1 | as is where is | ||
94479 | RUDOLPH | FE-4D | Focus Ellipsometer | 200 mm | 1 | as is where is | ||
95619 | Rudolph | WV320 | MACRO INSPECTION | 300 MM | 31.05.2006 | 1 | as is where is | immediately |
95621 | RUDOLPH | WV320 | Metrology | 300mm | 1 | as is where is | immediately | |
97965 | RUDOLPH | NSX320 | MACRO DEFECT INSPECTOR | 300 MM | 1 | as is where is | immediately | |
97966 | RUDOLPH | WHS | MACRO DEFECT INSPECTOR | 300 MM | 1 | inquire | ||
98171 | Rudolph | NSX105C | Macro Inspection | 200 mm | 31.05.2007 | 1 | as is where is | |
98296 | RUDOLPH | Meta Pulse 300 | Film thickness measurement | 300 mm | 1 | as is where is | ||
98297 | RUDOLPH | Meta Pulse 300 | Film thickness measurement | 300 mm | 1 | as is where is | ||
98298 | RUDOLPH | MP1-300 | Film thickness measurement | 300 mm | 31.05.2007 | 1 | as is where is | |
98835 | RUDOLPH | AXI-S | Macro Wafer Inspection | 300 mm | 30.06.2004 | 1 | as is where is | immediately |
98837 | RUDOLPH | MP1-300XCU | Film Thickness Measurement System | 300 mm | 30.04.2008 | 1 | as is where is | immediately |
100928 | RUDOLPH | AXI-S | Macro Inspection System | 300 mm | 31.05.2003 | 1 | as is where is | |
100929 | RUDOLPH | FE-7 | Ellipsometer | 200 mm | 31.05.1996 | 1 | as is where is | |
100930 | RUDOLPH | MP300 | Film thickness measurement | 200 mm | 31.05.2007 | 1 | as is where is | |
100931 | RUDOLPH | MP300 | Film thickness measurement | 200 mm | 31.05.2009 | 1 | as is where is | |
100932 | RUDOLPH | S3000A | Focused Beam Ellipsometer | 200 mm | 31.05.2012 | 1 | as is where is | |
101348 | Rudolph | Auto EL | Elipsometer | 150mm | 1 | as is where is | ||
101349 | Rudolph | FE IIID | Dual Wavelength Ellipsometer | 200 mm | 01.06.1998 | 1 | as is where is | immediately |
101491 | Rudolph | NSX 105 | Macro-Defect Inspection System | 200mm | 1 | as is where is | ||
101492 | Rudolph | NSX 105 | Macro-Defect Inspection System | 200mm | 1 | as is where is | ||
101493 | Rudolph | NSX 105 | Macro-Defect Inspection System | 200mm | 1 | as is where is | ||
101494 | Rudolph | NSX 105 | Macro-Defect Inspection System | 200mm | 1 | as is where is | ||
101495 | Rudolph | NSX 105 | Macro-Defect Inspection System | 200mm | 1 | as is where is | ||
101496 | Rudolph | NSX 105 | Macro-Defect Inspection System | 200mm | 1 | as is where is | ||
102355 | Rudolph | 3Di8500 | Wafer Inspection | 300 mm | 31.05.2008 | 1 | as is where is | |
102356 | Rudolph | Axi-S | Macro inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
102359 | Rudolph | NSX115 | Macro Defect Inspection System | 300 mm | 31.05.2009 | 1 | as is where is | |
102360 | Rudolph | NSX115 | Macro Defect Inspection System | 300 mm | 31.05.2010 | 1 | as is where is | |
102363 | Rudolph | S3000S | Focused Beam Ellipsometer | 300 mm | 31.05.2011 | 1 | as is where is | |
102364 | Rudolph | S3000SX | Focused Beam Ellipsometer | 300 mm | 31.05.2011 | 1 | as is where is | |
102369 | Rudolph | WV320 | Macro Defect inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
102372 | Rudolph | WV320 | Macro Defect inspection | 300 mm | 31.05.2007 | 1 | as is where is | |
102373 | Rudolph | WV320 | Macro Defect inspection | 300 mm | 31.05.2007 | 1 | as is where is | |
103553 | RUDOLPH | AXI-S | Macro Inspection | 300 mm | 31.05.2004 | 1 | as is where is | |
103554 | RUDOLPH | AXI935D | AVI | 300 mm | 1 | as is where is | ||
103555 | RUDOLPH | MP3 300XCU | FLIM THICKNESS MEASUREMENT SYSTEM | 300 mm | 1 | as is where is | immediately | |
103707 | Rudolph | AXI-S | Macro Inspection System | 300 mm | 31.05.2003 | 1 | as is where is | |
103708 | Rudolph | AXI-935D | Macro Inspection System | 300 mm | 1 | as is where is | ||
103709 | Rudolph | AXI-935D | Macro Inspection System | 300 mm | 31.05.2011 | 1 | as is where is | |
105789 | Rudolph | WHS220/Axi-940b | Wafer Mask Inspection System | 100-150 mm | 31.05.2009 | 1 | as is where is | |
105822 | Rudolph | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
105823 | Rudolph | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
105824 | Rudolph | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
105825 | Rudolph | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
105826 | Rudolph | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
105827 | Rudolph | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
105828 | Rudolph | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
105829 | Rudolph | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
105830 | Rudolph | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
105831 | Rudolph | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
106298 | RUDOLPH | MetaPulse 3 300A | Film Thickness Measurement | 300 mm | 01.06.2008 | 1 | as is where is | immediately |
106420 | Rudolph | NSX 115 | Automated Defect Inspection | 200 mm | 1 | as is where is | immediately | |
106421 | Rudolph | NSX 95 | Automated Macro Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | |
106422 | Rudolph | NSX-105 | Automated Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | |
106423 | Rudolph | NSX-105d1 | Automated Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | |
106424 | Rudolph | NSX-95 | Automated Macro Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | |
106425 | Rudolph | NSX-95 | Manual Macro Wafer Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | |
106715 | RUDOLPH | MP3_300A | METAL THICKNESS MEASUREMENT | 300 mm | 01.06.2012 | 1 | as is where is | |
106716 | RUDOLPH | MP-300 | Film thickness measurement | 300 mm | 01.06.2005 | 1 | as is where is | |
106717 | RUDOLPH | MP1-300 | Film Thickness Measurement | 300 mm | 01.06.2003 | 1 | as is where is | |
106718 | RUDOLPH | MP1-300 | Film Thickness Measurement | 300 mm | 1 | as is where is | ||
106719 | RUDOLPH | MP1-300XCU | Film thickness measurement system | 300 mm | 01.06.2008 | 1 | as is where is | |
106720 | RUDOLPH | NSX 105 | MACRO DEFECT INSPECTION SYSTEM | 300 mm | 01.06.2008 | 1 | as is where is | immediately |
106721 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2010 | 1 | as is where is | |
106722 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2011 | 1 | as is where is | |
106723 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 1 | as is where is | ||
106724 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2011 | 1 | as is where is | |
106725 | RUDOLPH | S3000S | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2010 | 1 | as is where is | |
106726 | RUDOLPH | S3000S | FBE(focused beam laser ellipsometry) | 300 mm | 1 | as is where is | ||
106727 | RUDOLPH | WS2500 | Wafer Inspection System | 200 mm | 01.06.2003 | 1 | as is where is | |
106728 | RUDOLPH | WS2500 | Wafer Inspection System | 200 mm | 01.06.2003 | 1 | as is where is | |
106729 | RUDOLPH | WS2500 | Wafer Inspection System | 200 mm | 01.06.2006 | 1 | as is where is | |
106730 | RUDOLPH | WS2500 | Wafer Inspection System | 200 mm | 01.06.2002 | 1 | as is where is | |
106731 | RUDOLPH | WV320 | Macro Inspection | 300 mm | 01.06.2006 | 1 | as is where is | |
106732 | RUDOLPH | MP200 | Film thickness measurement | 200 mm | 01.06.2003 | 1 | as is where is | |
106733 | RUDOLPH | MP200 | Film thickness measurement | 200 mm | 01.06.1999 | 1 | as is where is | |
106734 | RUDOLPH | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
106735 | RUDOLPH | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
106831 | Rudolph | MP200XCU | Cu Film thickness measurement | 200mm | 1 | inquire | ||
106832 | Rudolph | MP300 | Metal Film thickness measurement | 300mm | 1 | inquire | ||
106833 | Rudolph | MP300 XCu | Cu Film thickness measurement | 300mm | 2 | inquire | ||
106871 | RUDOLPH | NSX 105 | Automated Wafer, Die and Bump Inspection System | 300 mm | 01.06.2008 | 1 | as is where is | immediately |
70089 | Rudolph Technologies | FE-VII | Ellipsometer | 200 mm | 31.05.1996 | 1 | as is where is | immediately |
88629 | Rudolph/August | NSX105 | Macro Inspection | 200 MM | 31.05.2004 | 1 | as is where is | |
88630 | Rudolph/August | NSX105 | Macro Inspection | 200 MM | 31.05.2003 | 1 | as is where is | |
101673 | RVSI | WS-3800 | 2D/3D Automated Optical Inspection System | 200 mm | 1 | as is where is | ||
106411 | SCIENTECH | Stacis 2100 | Active Piezoelectric Vibration Cancellation System | Facilities | 01.06.2008 | 1 | as is where is | |
91875 | SDI | SPV-300 | Surface Photo Voltage Tester for up to 300mm Wafers | up to 300 mm | 31.05.1997 | 1 | as is where is | immediately |
102894 | SDI | SPV-1050 | Contamination Monitoring System | 200 mm | 31.05.1996 | 1 | as is where is | immediately |
106661 | SDI | FAAST 230-DP+SPV+SLIC | CARRIER LIFETIME MEASUREMENT | 200 mm | 1 | as is where is | ||
91873 | SDI / Semilab | FAaST-330 | Dielectric Characterization Tool with COCOS & Epi-t for up to 300mm Wafers | up to 300 mm | 31.05.1999 | 1 | as is where is | immediately |
91117 | SEIKO | CHIPS-200 | metrology system | 200 mm | 1 | as is where is | ||
86199 | SEIKO SEIKI | SMI2200 | SEM | 200 mm | 1 | as is where is | ||
91118 | SELA | MC100 | metrology system | 200 mm | 1 | as is where is | ||
91119 | SELA | MC500 | metrology system | 200 mm | 1 | as is where is | ||
102951 | SELA | EM3i | Saw for TEM sample preparation | ASSEMBLY | 31.05.2011 | 1 | as is where is | |
82911 | Semiconductor Diagnostics | 3030 | Surface Profiler | 200 | 01.06.2012 | 1 | as is where is | immediately |
100747 | Semilab | WT-2000PVN | Carrier Lifetime Measurement System | 1 | as is where is | immediately | ||
102381 | Semilab | PS-2000 | Ellipsometric Porosimeter | 31.05.2015 | 1 | as is where is | ||
102382 | Semilab | SPVCMS4000 | Surface Charge Measurement | 200 mm | 31.05.1995 | 1 | as is where is | |
89974 | Semix | Tazmo SOG TR817UD-TM | 150mm SOG | 150mm | 1 | as is where is | ||
95377 | Sheffield | Endeavor | Coordinate Measurement Machine | 9.12.7 | 1 | as is where is | immediately | |
97877 | Siemens | 3 DIMESION MEA | FAB-METROLOGY | 31.05.2006 | 1 | as is where is | ||
105832 | SII NANO | XV 300DB | Particle Measurement System | 300 mm | 1 | as is where is | ||
106412 | SII NANO | XV 300DB | Wafer Inspection | 300 mm | 01.06.2008 | 1 | as is where is | |
74946 | Sonoscan | D6000 | C-Sam | 30.04.1996 | 1 | as is where is | immediately | |
83703 | SOPRA | SE 200 | Ellipsometer | 200 mm | 1 | as is where is | ||
102394 | SOPRA | EP12 | Optical Dielectric Porosity Measurement System (300mm) | 300 mm | 1 | as is where is | ||
91877 | SSM | 470i | CV Plotter | 1 | inquire | |||
98012 | SSM | SSM 6100 | CV IMPLANT-CV CURVES | 300 mm | 31.05.2000 | 1 | as is where is | |
106742 | SSM | 5200 | Resistivity Measurement | 200 mm | 01.06.2008 | 1 | as is where is | |
89975 | TecHarmonic | EHTVS | Water Scrubber | 1 | as is where is | |||
101503 | Technos | TVD-900 ICP-MS | Spectrometer | 1 | as is where is | |||
77049 | Tecnai | TF20 | TEM Refurbished | 31.05.2001 | 1 | as is where is | immediately | |
33722 | TENCOR | AlphaStep 300 | Profilometer | 1 | inquire | |||
98935 | Thermawave | TP 630 | Ion Implant Measurement System | 1 | as is where is | |||
91569 | Thermo Fisher | ECO 1000 | FTIR System | 200 mm | 01.05.2000 | 1 | as is where is | immediately |
106303 | Thermo Fisher | ECO1000-S | FTIR | 300 mm | 01.06.1997 | 1 | as is where is | immediately |
106040 | THERMO NICOLET | Continuum | Infra-Red Microscope / FTIR Analysis System | laboratory | 1 | as is where is | immediately | |
97887 | TOYO | SE-4000 | Roughness Measurement | 31.05.2008 | 1 | as is where is | ||
88284 | Veeco | Dimension 7000 | Atomic Force Microscope (AFM) | 200mm | 1 | as is where is | immediately | |
88375 | Veeco | D9000 | Atomic Force Microscope | 200 mm | 31.05.1997 | 1 | as is where is | immediately |
88631 | Veeco | Dimension X3D | Model 340 Atomic Force Microscope | 300 MM | 31.05.2006 | 1 | as is where is | immediately |
96382 | Veeco | D9000 | Atomic Force Microscope | 200 mm | 31.05.2001 | 1 | as is where is | immediately |
96383 | Veeco | D9000 | Atomic Force Microscope | 200 mm | 31.05.2001 | 1 | as is where is | immediately |
96404 | Veeco | NT3300 | Non Contact Profilometer | 6 or 8 inch | 31.12.2003 | 1 | as is all rebuilt | immediately |
97839 | Veeco | Dimension X1D | Atomic Force Microscope (AFM) | 300 mm | 1 | as is where is | ||
97840 | Veeco | Dimension X1D | Atomic Force Microscope (AFM) | 300 mm | 1 | as is where is | ||
98373 | VEECO | V220SI | METRO | 200 mm | 31.05.2002 | 1 | inquire | |
102464 | Veeco | NT9800 | Optical Profiling System | 31.05.2010 | 1 | as is where is | ||
102465 | Veeco | V220SI | Surface Profile Measurement | 1 | as is where is | |||
103136 | Veeco | Dimension Vx340 | Atomic Force Profiler (AFP) | 300mm | 31.05.2003 | 1 | as is where is | |
103182 | Veeco | Dimension 3100 | Atomic Force Microscope | 150 mm | 01.05.2017 | 1 | as is where is | immediately |
103373 | VEECO | Dektak 8 | Programmable Surface Profiler Measuring System | 200 mm | 30.04.2006 | 1 | as is where is | immediately |
103665 | Veeco | Dektak 3030 | ST Surface Texture Analysis System | 1 | as is where is | |||
103669 | Veeco | 9000M | Atomic Force Microscope | 1 | as is where is | |||
103670 | Veeco | Dektak SXM | Atomic Force Microscope | 200 mm | 1 | as is where is | ||
105786 | Veeco | VX-340 | Atomic Force Microscope | 1 | as is where is | |||
106147 | Veeco | Dimension 3100 | Atomic Force Microscope | 200 mm | 01.06.2006 | 1 | as is where is | immediately |
107002 | Veeco | DekTak 6M | Stylus profilometer | 150 mm | 01.06.2006 | 1 | as is where is | immediately |
107011 | Veeco | Dektak 200 Si | Contact Profilometer - for spares use (Not operational condition) | 150 mm | 01.06.2000 | 1 | as is where is | immediately |
95009 | WOOLAM | HS-190 | Scanning Monochromator | 200 MM | 1 | as is where is | ||
93087 | Woollam | VUV-VASE (Gen II) | Ellipsometer | 300 MM | 1 | as is where is | immediately | |
34091 | Wyko | NT 2000 | Optical Profiling system | 200 MM | 1 | inquire | immediately | |
38870 | Wyko | NT1100 | Optical Profiling system | 1 | as is where is | 2 weeks | ||
66762 | WYKO | HD 2000 | DPC Video Scope | 1 | as is where is | immediately | ||
71792 | WYKO | NT3300 | Optical 3D profiling system | 1 | ||||
96646 | WYKO | NT3300 | Profilometer | 200mm | 1 | as is all rebuilt | immediately | |
106312 | WYKO | NT-3300 | Optical Profiler | 300 mm | 01.06.2012 | 1 | as is where is | immediately |
98217 | YesTech | YTV-B3 AOI | Automated Optical Inspection System | 31.05.2008 | 1 | as is where is | immediately | |
86716 | ZEISS | Axiotron | Wafer inspection microscope | 1 | as is where is | immediately | ||
97108 | Zeiss | Axiotech 100 HD | Inspection Microscope | Assembly | 1 | as is where is | immediately | |
97610 | Zeiss | Axiotron 300 | Microscope | 300 mm | 1 | as is where is | ||
98211 | Zeiss | Ultra 55 | FA SEMs/TEMs/Dual Beams | 1 | inquire |