Please find below a list of Used Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com .Click on any listed item of Fab Metrology , Inspection and QC Equipment to see further data.
SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
---|---|---|---|---|---|---|---|---|
91841 | ADE | Episcan 1000 | FT-IR Spectromter for measurement of Epitaxial films | 100-200 mm | 1 | inquire | immediately | |
92686 | ADE | FIT3120 | PARTICLE COUNTER | 300 mm | 1 | as is where is | ||
97846 | ADE | NANOMAPPER | SQM | 300 mm | 01.06.2001 | 1 | as is where is | |
102061 | ADE | Episcan 1000 | Epi Thickness Measurement System | 200 mm | 1 | as is where is | ||
102631 | ADE | 9500 | Wafer flatness measurement system with ASC1000 | 200 mm | 1 | inquire | ||
102632 | ADE | 9500 | Wafer flatness measurement system with ASC2500 | 200 mm | 1 | inquire | ||
101393 | Agilent | 7500 | Spectrometer | Laboratory | 1 | as is where is | ||
102974 | AGILENT | 4155C | SEMICONDUCTOR PARAMETER ANALYZER | 200 MM | 1 | as is where is | ||
84360 | Alcatel | 925-40 | Leak Detector | 1 | as is where is | immediately | ||
71960 | Applied Materials | SEMVISION CX | INSPECTION SEM | 200 mm | 01.06.2000 | 1 | as is where is | immediately |
83514 | Applied Materials | Opal 7830i Enhanced | CD-SEM | 200 mm | 01.06.1997 | 1 | as is where is | immediately |
86422 | Applied Materials | Orbot WF720 | Wafer inspection system | 125 mm | 1 | as is where is | ||
90947 | Applied Materials | UVision 4 | Bright field inspection | 300 mm | 01.06.2009 | 1 | as is where is | |
92045 | Applied Materials | UV 5 | Wafer Inspection System | 300 mm | 01.06.2012 | 1 | as is where is | immediately |
92800 | Applied Materials | Orbot WF720 | Metrology (Metrology) | 125 mm | 1 | as is where is | ||
93395 | Applied Materials | UVision 3 | Wafer Inspection System | 200 mm | 1 | as is where is | immediately | |
97213 | Applied Materials | COMPLUS 4T | Darkfield Inspection System | 300 mm | 01.07.2010 | 1 | as is where is | |
97214 | Applied Materials | COMPLUS 4T | Darkfield Inspection System | 300 mm | 01.04.2010 | 1 | as is where is | |
98084 | Applied Materials | UVision 5 | Brightfield UV Wafer Inspection System | 300 mm | 01.06.2011 | 1 | as is where is | |
98085 | Applied Materials | UVision 5 | Brightfield UV Wafer Inspection System | 300 mm | 01.06.2012 | 1 | as is where is | |
98329 | Applied Materials | PRODUCER GT (Chamber) | UV CURE CHAMBER | 300 mm | 1 | inquire | ||
98796 | Applied Materials | COMPLUS4T | Darkfield Inspection System | 300 mm | 01.04.2010 | 1 | as is where is | |
99000 | Applied Materials | UVISION7 | Brightfield Inspection | 300 mm | 01.09.2011 | 1 | as is where is | |
99903 | Applied Materials | Semvision CX | Inspection SEM | 1 | as is where is | immediately | ||
102093 | Applied Materials | Elite M5 MC | eBeam Inspection | 300 mm | 1 | as is where is | ||
102094 | Applied Materials | Elite MS MC | eBeam Inspection | 300 mm | 1 | as is where is | ||
102100 | Applied Materials | NanoSEM 3D | CD Metrology | 300 mm | 01.06.2002 | 1 | as is where is | |
102101 | Applied Materials | NanoSEM 3D | CD Metrology | 300 mm | 01.06.2002 | 1 | as is where is | |
102102 | Applied Materials | NanoSEM 3D | CD-SEM | 300 mm | 01.06.2003 | 1 | as is where is | |
102103 | Applied Materials | NanoSEM 3D | Scanning Electron, CDSEM Measurement | 300 mm | 01.06.2004 | 1 | as is where is | |
102104 | Applied Materials | NanoSEM 3D | Scanning Electron, CDSEM Measurement | 300 mm | 01.06.2004 | 1 | as is where is | |
102105 | Applied Materials | NanoSEM 3D | Scanning Electron, CDSEM Measurement | 300 mm | 01.06.2004 | 1 | as is where is | |
102129 | Applied Materials | SEMVision CX | Defect Review SEM | 200 mm | 01.06.2000 | 1 | as is where is | |
102130 | Applied Materials | UVision 200 | Bright-Field Inspection | 300 mm | 01.06.2005 | 1 | as is where is | |
102673 | Applied Materials | SEMVision G3 | SEM - Defect Review (DR) | 300 mm | 1 | as is where is | ||
102674 | Applied Materials | SEMVision G3 | SEM - Defect Review (DR) | 300 mm | 1 | as is where is | ||
102986 | Applied Materials | Uvision 600SP | Brightfield Inspection System | 300 mm | 01.06.2008 | 1 | as is where is | |
97046 | ASML | Yeldstar S-100 | Advanced Process Control / Yield Opimization System | 300 mm | 1 | as is where is | immediately | |
98559 | ASML | Yieldstar S1250D | Overlay Measurement | 300 mm | 1 | as is where is | ||
101427 | ASML | YieldStar S-200B | Overlay Measurement System | 300mm | 01.02.2011 | 1 | as is where is | |
103070 | ASML | YieldStar S-250 | Overlay Measurement System | 300mm | 1 | as is where is | ||
91387 | AUGUST | CV-9812 | Wafer Carrier inspection tool | 1 | as is where is | immediately | ||
98447 | August | 3DI-8000 | wafer bump inspection | 300mm | 1 | as is where is | immediately | |
98448 | August | NSX-95 | 2D Auto inspection system / Macro defect inspection system | 200 mm | 4 | as is where is | immediately | |
101818 | August | NSX105 | Wafer Bumping Inspection System / Macro defect inspection | 200mm | 1 | inquire | ||
95016 | Bio-Rad | Q8 | Overlay Metrology | 1 | as is all rebuilt | 1 month | ||
99405 | Bio-Rad | Q5 (Upgrade to a Q6) | Overlay Registration Tool | up to 200 mm | 2 | as is where is | immediately | |
99406 | Bio-Rad | Q7/Q8 | Overlay metrology Tool | 150 mm-200 mm | 01.06.1997 | 1 | as is where is | immediately |
99407 | Bio-Rad | QS-1200 | FT-IR Spectrometer | 100-200 mm | 01.06.2004 | 1 | as is where is | immediately |
99409 | Bio-Rad | QS-408M | Manual FT-IR Spectrometer | 100-200 mm | 1 | as is where is | immediately | |
102587 | Bio-Rad | QS-300 | FT-IR Spectrometer | 1 | as is where is | immediately | ||
33671 | BIORAD | Q5 | Overlay Metrology Tool | 200 mm | 2 | as is where is | immediately | |
91847 | BIORAD | QS-408M | Manual FT-IR Spectrometer for Epi, SiN, BPSG Measurement & More, up to 200mm Wafers, 2ea Available | 1 | inquire | immediately | ||
97995 | Biorad | Q5 | Overlay measurement system | 150mm | 1 | as is where is | ||
97850 | Bruker | DEKTAK-8ADP | Scan Profiler | 1 | as is where is | |||
98851 | Bruker | D8 Fabline | X-ray Diffractometer | 150 mm / 200 mm | 01.05.2011 | 1 | as is where is | immediately |
101543 | BRUKER | JVX6200 | X-Ray Inspection System | 300 mm | 01.11.2010 | 1 | as is where is | |
102148 | Bruker | D8FABLINE | X-ray | 300 mm | 01.06.2015 | 1 | as is where is | |
102149 | Bruker | Insight 3D | Mask House Photomask Inspection | 300 mm | 01.06.2017 | 1 | as is where is | |
101769 | Cambridge Scientific | S360 | SEM with EDS | 1 | as is where is | immediately | ||
95610 | Cameca | TXRF 8300 | Automated TXRF with Specimen Chamber and Wafer Handling | 300 mm | 01.06.2007 | 1 | as is where is | immediately |
102075 | Cameca | LEXFAB300 | Low Energy Electron-induced X-Ray emission spectrometer | 300 mm | 01.06.2007 | 1 | as is where is | |
102950 | CAMECA | IMS WF | SECONDARY ION MASS SPECTROMETER | Laboratory | 01.06.2007 | 1 | as is where is | |
102151 | Camtek | X- ACT | TEM Sample Preparation System | 01.06.2012 | 1 | as is where is | ||
100723 | Canon | PLA501 | Contact and Prossimity Mask Aligner | 1 | as is where is | |||
102159 | Carl Zeiss | Axiospect 300 | Wafer inspection microscope | 300 mm | 01.06.2007 | 1 | as is where is | |
102160 | Carl Zeiss | Axiotron-2 | Microscope | 200 mm | 01.06.2000 | 1 | as is where is | |
102161 | Carl Zeiss | Axiotron-2 | Microcope | 200 mm | 01.06.2000 | 1 | as is where is | |
102162 | Carl Zeiss | Axiotron-2 | Microscope | 200 mm | 01.06.2000 | 1 | as is where is | |
102163 | Carl Zeiss | Axiotron-2 | Microscope | 200 mm | 1 | as is where is | ||
102164 | Carl Zeiss | Axiotron-2 | Microscope | 200 mm | 1 | as is where is | ||
102165 | Carl Zeiss | Axiotron-2 | Micro scope | 200 mm | 1 | as is where is | ||
102166 | Carl Zeiss | Axiotron-2 | Inspection Microscope | 200 mm | 1 | as is where is | ||
102167 | Carl Zeiss | Axiotron-2 | Microscope | 200 mm | 1 | as is where is | ||
74929 | CDE | Resmap 463 OC | Four-point prober Resistivity Measurement | up to 300 mm | 1 | as is where is | immediately | |
103152 | Dektak | 3030 | Profiler | 1 | inquire | |||
100728 | Delta Tech. | GM SSR AX-PC/GM-1D | X-Ray | 01.06.2010 | 1 | as is where is | ||
102589 | E+H | MX 203-6-33 | Wafer Bow Measurement System | 100 - 150 mm | 01.06.2008 | 1 | as is where is | immediately |
89978 | Edwards | IPX-500 | Dry Pump | 1 | as is where is | |||
92213 | ESCO | EMD-WA1000S | Temperature Desorption Analyzer | 200mm | 01.06.2000 | 1 | as is where is | |
100938 | ESMO | Hermes | Testhead Manipulator | Test | 01.06.2006 | 3 | as is where is | immediately |
79226 | FEI | DB 235 Dual Beam | FIB SEM | 01.06.2000 | 1 | inquire | ||
86292 | FEI | F30 Technai | FIB SEM | 1 | ||||
86294 | FEI | DB 835 | FIB SEM | 1 | ||||
86300 | FEI | Nova nano 230 | FIB SEM | 1 | inquire | immediately | ||
89021 | FEI | Vectra + | FIB Sem | Laboratory | 01.10.1998 | 1 | as is where is | immediately |
91392 | FEI | FEM2010F | Dual Beam FIB-SEM | N/A | 1 | as is where is | ||
92040 | FEI | TF30 | Super twin | 01.10.2007 | 1 | as is all rebuilt | immediately | |
93961 | FEI | Altura | Dual beam FIB | 01.01.2004 | 1 | as is where is | immediately | |
96041 | FEI | Helios Nanolab 400 | FIB SEM | 100 mm | 01.06.2008 | 1 | inquire | |
99400 | FEI | Quanta Inspect fp | Tungsten filament SEM | 200 mm | 1 | as is where is | immediately | |
99853 | FEI | XL40 | Cross Section SEM | 1 | inquire | |||
101622 | FEI | Expida 1255 | DUAL BEAM FIB w/MANUAL WAFER LOAD | 300 mm | 1 | as is where is | immediately | |
101711 | FEI | Helios 450S | Dual Beam FIB-SEM | 1 | inquire | |||
101712 | FEI | Strata 400 | Focused Ion Beam System | 1 | inquire | |||
103002 | FEI | 200XP | Focus Ion Beam System | 01.06.2005 | 1 | as is where is | ||
86235 | FEI Company | 820 | Dual Bem Fib SEM | 200 mm | 1 | as is where is | immediately | |
101441 | FEI Company | Tecnai G2 F30 | TEM | Laboratory | 1 | as is where is | ||
97925 | Filmetrics | F50 | UV Mapping Reflectometer | 200 mm | 1 | as is where is | immediately | |
101843 | Filmetrics | F50 | Thin Film Analyzer | 1 | as is where is | immediately | ||
55974 | FRONTIER | FSM900TC-VAC | FILM STRESS AND WAFER BOW MEASUREMENT | 200 mm | 01.05.2000 | 1 | as is where is | immediately |
90155 | FSM | FSM 500TC | THIN FILM STRESS MEASUREMENT | 01.02.2007 | 1 | as is where is | ||
90156 | FSM | 500TC | THIN FILM STRESS MEASUREMENT | 01.06.2004 | 1 | as is where is | ||
93084 | FSM | SYMPHONYMC | Life Time | 300 MM | 1 | as is where is | ||
96543 | Gaertner | L115C-8 | Ellipsometer, cassette to cassette | 100-200 mm | 01.03.1995 | 1 | as is where is | immediately |
99414 | GCA/Tropel | 9000 | Wafer Flatness Analyzer | 1 | as is where is | |||
102218 | GEMETEC | Elymat III | WSPS | 300 mm | 1 | as is where is | ||
71907 | Hamamatsu | C7103 | PC Controlled IC Back-side Lapping and Wafer Grinding System | 200 mm and packages | 01.10.2001 | 1 | as is where is | immediately |
97928 | HANRA | HRI-580L | INSPECTION SYSTEM | ASSEMBLY | 2 | inquire | ||
97859 | HERMES | NMI-100 | DEFECT INSPECTION | 1 | as is where is | |||
98118 | Hermes Microvision | eScan320 | ebeam Inspection | 300 mm | 1 | as is where is | ||
101442 | Hermes Microvision | eP3 XP | E-beam Inspection | 300mm | 01.06.2014 | 1 | as is where is | |
101443 | Hermes Microvision | eP3 XP | E-beam Inspection | 300mm | 01.06.2014 | 1 | as is where is | |
102219 | Hermes Microvision | eP3 XP | E-Beam Inspection System | 300 mm | 01.06.2012 | 1 | as is where is | |
102220 | Hermes Microvision | eP4 | CFM_EBeam Inspection HMI | 300 mm | 01.06.2017 | 1 | as is where is | |
102221 | Hermes Microvision | eScan500 | ebeam Inspection | 300 mm | 01.06.2014 | 1 | as is where is | |
102222 | Hermes Microvision | eScan500 | EBeam Inspection_HMI | 300 mm | 01.06.2014 | 1 | as is where is | |
102959 | HIMS | NMI-100 | DEFECT INSPECTION | 300 mm | 1 | as is where is | ||
36259 | HITACHI | S-9300 | SEM - CD (CRITICAL DIMENSION) | 300 mm | 01.06.2005 | 1 | as is all rebuilt | 2 months |
52166 | Hitachi | 545-5515 | DC power supply module for CD SEM | spares | 1 | as is where is | immediately | |
52167 | Hitachi | 6280H | Power Supply Module 4channels | spares | 1 | as is where is | immediately | |
52168 | Hitachi | 545-5540 | Power Supply unit for CD SEM | Spares | 1 | as is where is | immediately | |
52312 | Hitachi | 545-5522 | VG board for CD SEM | spares | 01.06.1994 | 1 | as is where is | immediately |
52339 | Hitachi | 545-5521 | EVAC PCB FOR HITACHI CD-SEM | spares | 01.06.1994 | 1 | as is where is | immediately |
52340 | Hitachi | 545-5537 | IP-PC2 for cd-sem | spares | 01.06.1994 | 1 | as is where is | immediately |
52343 | Hitachi | 377-7592 | Power Supply Module for CD SEM | spares | 01.06.1994 | 1 | as is where is | immediately |
53054 | HITACHI | 6280H (SPARES) | SORD Computer for cd sem system | spares | 1 | as is where is | immediately | |
56838 | Hitachi | S-4500 | FE Inspection SEM Type 1 chamber | 1 | as is all rebuilt | immediately | ||
60939 | HITACHI | S4160 | Scanning electron microscope | 01.06.1996 | 1 | as is where is | ||
65359 | HITACHI | S-9220 | SIP baord for CD-SEM S9220,P/N 568-5591 | 1 | as is where is | immediately | ||
74794 | Hitachi | S5200 | FE SEM with EDX | Inspection | 01.06.2005 | 1 | as is where is | immediately |
78108 | Hitachi | S4700 Type 2 | FE-SEM | Up to 6 inch | 01.06.2006 | 1 | as is all rebuilt | immediately |
83585 | Hitachi | S5000H | Field Emission SEM | Laboratory | 1 | as is where is | immediately | |
84345 | Hitachi | EA8000 | X-ray Particle Contaminant Analyzer | 1 | as is where is | immediately | ||
86169 | HITACHI | FB-2000A | FIB Sem | 200 mm | 01.06.2001 | 1 | as is where is | |
86171 | HITACHI | S-4700 (w/EDAX) | FE SEM with EDX | 01.06.1998 | 1 | as is where is | ||
86172 | HITACHI | S-5000 | FE SEM | 200 mm | 01.06.1994 | 1 | as is where is | |
86173 | HITACHI | S-5000 | FE SEM | 200 mm | 01.06.1996 | 1 | as is where is | |
86174 | HITACHI | S-5000 | FE SEM | 200 mm | 01.06.1999 | 1 | as is where is | |
86175 | HITACHI | S-5000 | FE SEM | 200 mm | 01.06.2000 | 1 | as is where is | |
86275 | Hitachi | RS4000 | In-line Defect Review SEM | 200 mm / 300 mm | 01.01.2007 | 1 | as is where is | immediately |
86296 | Hitachi | 3600N | SEM | 1 | inquire | immediately | ||
86297 | Hitachi | S5200 | FE-SEM | 1 | inquire | immediately | ||
86298 | Hitachi | S4800 | FE-SEM | 1 | inquire | immediately | ||
88948 | Hitachi | S9380 | CD SEM metrology ( Working ) | Spares | 1 | inquire | immediately | |
88949 | Hitachi | S9380 II | CD SEM metrology (As-Is) | Spares | 1 | as is where is | immediately | |
91006 | Hitachi | RS 5500 | Defect Review SEM | 300 MM | 01.06.2009 | 1 | as is where is | immediately |
91085 | HITACHI | IS-2700 | Wafer Inspection Station | 300 mm | 1 | as is where is | ||
91086 | HITACHI | S-4160 | FE SEM | Laboratory | 01.06.1996 | 1 | as is where is | |
91087 | HITACHI | S-4160 | FE SEM | Laboratory | 01.06.1996 | 1 | as is where is | |
91088 | HITACHI | S-4800 | FE SEM | Laboratory | 01.06.2005 | 1 | as is where is | |
91089 | HITACHI | S-5500 | FE SEM | Laboratory | 01.06.2006 | 1 | as is where is | |
91090 | HITACHI | S-5500 | FE SEM | Laboratory | 01.06.2012 | 1 | as is where is | |
91091 | HITACHI | S-5500 | FE SEM | Laboratory | 01.06.2010 | 1 | as is where is | |
91092 | HITACHI | S-9380 II | CD SEM | 300 mm | 01.06.2006 | 1 | as is where is | |
91093 | HITACHI | S-9380 II | CD SEM | 300 mm | 01.06.2006 | 1 | as is where is | |
91094 | HITACHI | S-9380 II | CD SEM | 300 mm | 01.06.2007 | 1 | as is where is | |
91095 | HITACHI | S-9380 II | CD SEM | 300 mm | 01.06.2007 | 1 | as is where is | |
91096 | HITACHI | S-9380 II | CD SEM | 300 mm | 01.06.2005 | 1 | as is where is | |
91097 | HITACHI | S-9380 II | CD SEM | 300 mm | 01.06.2007 | 1 | as is where is | |
91100 | HITACHI | S-9380 II | CD SEM | 300 mm | 01.06.2007 | 1 | inquire | immediately |
91102 | HITACHI | S-9380 II | CD SEM | 300 mm | 01.06.2003 | 1 | as is where is | |
91103 | HITACHI | WA-1300 | ATOMIC FORCE MICROSCOPE | 300 mm | 1 | as is where is | ||
91104 | HITACHI | WA3300 | atomic force microscope | - | 1 | as is where is | ||
91395 | HITACHI | I-6300 | CD SEM | 1 | as is where is | |||
91396 | HITACHI | IS2700SE | Dark Field inspection | 300 mm | 01.06.2006 | 1 | as is where is | |
91397 | HITACHI | IS2700SE | Dark Field inspection | 1 | as is where is | |||
91398 | HITACHI | IS3000E | High Speed Dark Field inspection | 300 mm | 01.06.2007 | 1 | as is where is | |
91399 | HITACHI | IS3000E | High Speed Dark Field inspection | 300 mm | 01.06.2007 | 1 | as is where is | |
91400 | HITACHI | IS3000E | High Speed Dark Field inspection | 300 mm | 01.06.2007 | 1 | as is where is | |
91401 | HITACHI | IS3000E | High Speed Dark Field inspection | 300 mm | 01.06.2007 | 1 | as is where is | |
91402 | HITACHI | IS3000E | High Speed Dark Field inspection | 300 mm | 01.06.2007 | 1 | as is where is | |
91403 | HITACHI | S-5000 | FE SEM | 150 mm,200 mm | 1 | as is where is | ||
91404 | HITACHI | S-5000 | FE SEM | 150 mm,200 mm | 1 | as is where is | ||
91405 | HITACHI | S-5000 | FE SEM | 150 mm,200 mm | 1 | as is where is | ||
91407 | HITACHI | S-5000 | FE SEM | 150 mm,200 mm | 1 | as is where is | ||
91408 | HITACHI | S-5000 | FE SEM | 150 mm,200 mm | 1 | as is where is | ||
91411 | HITACHI | S9260A | CD SEM | 200 mm | 01.05.2003 | 1 | as is where is | immediately |
91417 | HITACHI | LS-6800 | wafer surface inspection | 300 mm | 01.09.2007 | 1 | as is where is | immediately |
91418 | HITACHI | UA-7200 | Stripper/Asher | 01.06.2001 | 1 | as is where is | ||
91848 | HITACHI | S7000 | CD SEM | 150 mm | 01.06.1989 | 1 | as is where is | immediately |
92027 | HITACHI | S9300 | CD SEM | 200-300 mm | 01.06.2001 | 3 | as is where is | immediately |
93085 | HITACHI | S9380 II | CD SEM | 300 mm | 01.06.2004 | 1 | as is where is | immediately |
93374 | Hitachi | S4700 | FIELD EMISSION SEM | Laboratory | 01.06.2004 | 1 | as is where is | immediately |
94459 | HITACHI | S-7800 | CD SEM | 150 mm,200 mm | 01.06.1996 | 1 | as is where is | |
94460 | HITACHI | S-7800HSA | CD SEM | 150 mm,200 mm | 01.06.1997 | 1 | as is where is | |
95070 | Hitachi | S5000 | SEM Scanning Electron Microscope Hitachi S5000 with Noran 445A-3SES detector | Laboratory | 01.01.2014 | 1 | as is where is | immediately |
95095 | HITACHI | S-9380 II | Metrology | 12" | 01.06.2003 | 1 | as is where is | |
95361 | Hitachi | IS3000 | DARK FIELD INSPECTION | 300 mm | 01.06.2007 | 1 | as is where is | |
95729 | Hitachi | WA 3300 | Atomic Force Microscope | 300 mm | 01.06.2007 | 1 | as is where is | immediately |
95934 | Hitachi | HD-2300 | Scanning Transmission Electron Microscope | 300 mm | 1 | as is where is | ||
95998 | HITACHI | EDAX 136-5 | Energy Dispersive X-ray Spectrometer | Laboratory and Scientific | 1 | as is where is | ||
96042 | Hitachi | CG-4000 | CD Sem | 300 mm | 1 | inquire | ||
96044 | Hitachi | S-4800-II | FE SEM | 200 mm | 01.06.2004 | 1 | inquire | |
96045 | Hitachi | S-4800-II | FE SEM | 200 mm | 01.06.2007 | 1 | inquire | |
96046 | Hitachi | S-5200 | FE SEM | Laboratory and Scientific | 1 | inquire | ||
96047 | Hitachi | SU-70 | High Resolution Field Emission SEM | Laboratory and Scientific | 01.06.2008 | 1 | inquire | |
96377 | Hitachi | S9380 II | CD SEM | 300 mm | 01.06.2006 | 1 | as is where is | immediately |
97014 | Hitachi | S-4700 | SEM | 200 mm | 01.06.2000 | 1 | as is where is | |
97043 | Hitachi | SU 8010 | Ultra High Resolution Field Emission Scanning Electron Microscope | 100 mm | 01.06.2014 | 1 | as is where is | immediately |
98206 | Hitachi | S-5000 | FA SEMs/TEMs/Dual Beams | 1 | inquire | |||
98207 | Hitachi | S-7800 | Metrology and Inspection | 200 mm | 01.08.1997 | 1 | inquire | |
98269 | HITACHI | RS 4000 | Defect Review SEM | 300 mm | 01.06.2003 | 1 | as is where is | |
98270 | HITACHI | RS 4000 | Defect Review SEM | 300 mm | 01.06.2003 | 1 | as is where is | |
98272 | HITACHI | S4700-I | Scanning Electron Microscope | 300 mm | 01.06.2001 | 1 | as is where is | |
98273 | HITACHI | S4700 | FE SEM | 1 | as is where is | |||
98275 | HITACHI | S9380 II | CD SEM | 300 mm | 01.06.2013 | 1 | as is where is | |
98506 | Hitachi | WA200 | SEM | 200 mm | 1 | as is where is | ||
98813 | HITACHI | S9380-2 | CD SEM | 300 mm | 01.02.2007 | 1 | as is where is | |
99005 | HITACHI | S-5500 | Ultra-high Resolution SEM | 200/300 mm | 01.06.2005 | 1 | as is where is | |
99158 | Hitachi | CG-4100 | SEM - Critical Dimension (CD) Measurement | 300mm | 1 | as is where is | ||
99159 | Hitachi | CG-4100 | SEM - Critical Dimension (CD) Measurement | 300mm | 1 | as is where is | ||
99856 | Hitachi | S4500 | Field Emission SEM | 01.06.1993 | 1 | inquire | ||
100157 | Hitachi | CG-4100 | SEM - Critical Dimension (CD) Measurement | 300mm | 1 | as is where is | ||
100729 | Hitachi | SU1510 | SEM | 1 | as is where is | |||
101020 | HITACHI | S-9300 | SEM - CD (CRITICAL DIMENSION) | 200 mm | 01.06.2005 | 1 | inquire | 2 months |
101623 | HITACHI | CG4000 | CD SEM, Copper Tool | 300 mm | 1 | as is where is | ||
101713 | Hitachi | CG-4000 2 LP | SEM | 300 mm | 1 | inquire | ||
101714 | Hitachi | CG-4000 3LP | SEM | 300 mm | 1 | inquire | ||
101715 | Hitachi | HD-2300 | STEM | 1 | inquire | |||
101716 | Hitachi | Regulus SU-8230 | FE SEM | 1 | inquire | |||
101717 | Hitachi | S-4700-II | FE SEM | 1 | inquire | |||
101718 | Hitachi | S-4800-II | FE SEM | 1 | inquire | |||
101719 | Hitachi | SU-1500 | SEM | 1 | inquire | |||
102223 | Hitachi | AS5000 | Wafer Particle & Defect Analysis System AS-5000 | 200 mm | 01.06.1997 | 1 | as is where is | |
102224 | Hitachi | HD2300 | STEM | 300 mm | 01.06.2006 | 1 | as is where is | |
102225 | Hitachi | HF-2000 | EDX/EELs/STEM imaging | 01.06.1995 | 1 | as is where is | ||
102226 | Hitachi | IS2700 | Dark Field inspection | 300 mm | 01.06.2005 | 1 | as is where is | |
102227 | Hitachi | RS4000 | DR SEM | 300 mm | 01.06.2005 | 1 | as is where is | |
102228 | Hitachi | RS4000 | Defect SEM inspection | 300 mm | 01.06.2006 | 1 | as is where is | |
102229 | Hitachi | RS4000 | DR SEM | 300 mm | 01.06.2006 | 1 | as is where is | |
102230 | Hitachi | RS4000 | DR SEM | 300 mm | 01.06.2007 | 1 | as is where is | |
102231 | Hitachi | RS4000 | DR SEM | 300 mm | 01.06.2007 | 1 | as is where is | |
102232 | Hitachi | RS4000 | DR SEM | 300 mm | 01.06.2007 | 1 | as is where is | |
102234 | Hitachi | S-4500 | Scanning Electron Microscope | 01.06.1997 | 1 | as is where is | ||
102236 | Hitachi | S-5200 | SEM, Ultra High Resolution | 01.06.2004 | 1 | as is where is | ||
102237 | Hitachi | S-9380 | CDSEM | 300 mm | 1 | as is where is | ||
102699 | Hitachi | CG-4100 | SEM - Critical Dimension (CD) | 300 mm | 01.03.2013 | 1 | as is where is | |
102965 | HITACHI | IS3000 | DARK FIELD | 300 mm | 01.06.2007 | 1 | as is where is | |
102966 | HITACHI | S-4800 | FE-SEM | Laboratory | 01.06.2006 | 1 | as is where is | |
103088 | Hitachi | CG5000 | SEM | 300mm | 01.05.2014 | 1 | as is where is | |
103089 | Hitachi | CG5000 | SEM | 300mm | 01.07.2014 | 1 | as is where is | |
103090 | Hitachi | S-9360 | SEM - Critical Dimension (CD) Measurement | 300mm | 01.06.2003 | 1 | as is where is | |
103091 | Hitachi | S-9360 | SEM - Critical Dimension (CD) Measurement | 300mm | 01.06.2003 | 1 | as is where is | |
101550 | HMI | ESCAN400 | Defect Inspection System | 300 mm | 01.03.2011 | 1 | as is where is | |
101551 | HMI | ESCAN405 | Defect Inspection System | 300 mm | 01.03.2015 | 1 | as is where is | |
87825 | Horiba | PD3000 | Reticle inspection system | 200 MM | 01.06.1995 | 1 | as is where is | immediately |
88596 | Horiba | PR-PD2 | Reticle/Mask Particle Detection System | 150 MM | 01.04.2006 | 1 | as is where is | immediately |
90670 | Horiba Jobin Evon | PZ2000 | Ellipsometer | 200 mm | 01.06.2000 | 1 | as is where is | immediately |
97863 | HP | 16500C | Logic Analyser | 1 | as is where is | |||
102238 | HSEB | AXIOSPECT 301 | Optical Microscope | 300 mm | 1 | as is where is | ||
102239 | HSEB | AXIOSPECT 301 | Optical Microscope | 300 mm | 1 | as is where is | ||
103092 | HSEB | Axiospect 300 | Optical Review System | 300mm | 1 | as is where is | ||
91419 | J.A Woollam | VUV-VASE (Gen II) | Ellipsometer | 300 mm | 1 | as is where is | ||
91420 | J.A Woollam | VUV-VASE VU302 (Gen I) | Ellipsometer | 200 mm | 01.06.2001 | 1 | as is where is | |
91421 | J.A.WOOLAM | M-2000X | spectroscopic ellipsometers | 1 | as is where is | |||
93088 | J.A.WOOLAM | VUV-VASE VU302 (Gen I) | Ellipsometer | 200 mm | 01.06.2001 | 1 | as is where is | |
87098 | JEOL | JWS-7505 | Defect review SEM w/ EDX, untested | 200 mm | 01.01.2001 | 1 | as is where is | |
87627 | JEOL | JSM 6400 | Scanning Electron Microscope | 1 | as is where is | immediately | ||
87828 | Jeol | JWS7555 | Scanning Electron Microscopes | 200 mm | 01.01.2000 | 1 | as is where is | immediately |
91422 | JEOL | JSM-5600 | FE SEM | 01.06.1999 | 1 | as is where is | ||
91423 | JEOL | JSM-6340F | FE SEM | 1 | as is where is | |||
91424 | JEOL | JSM-6700F | FE SEM | 1 | as is where is | |||
91425 | JEOL | JWS-7515 | WAFER INSPECTION | 1 | as is where is | |||
91426 | JEOL | JWS-7515 | WAFER INSPECTION | 1 | as is where is | |||
91899 | Jeol | jSM 6330F | FIELD EMISSION SEM | 1 | as is where is | immediately | ||
92068 | JEOL | JSM 6400F | Scanning Electron Microscope | 1 | as is where is | immediately | ||
92220 | JEOL | JWS-7555 | SEM - Defect Review (DR) | 200mm | 1 | as is where is | immediately | |
93311 | JEOL | JSM-6320 | Field Emission SEM | Laboratory | 1 | as is where is | immediately | |
97999 | JEOL | JWS 7700 | DR SEM | 200 mm | 01.06.1996 | 1 | as is where is | |
98123 | JEOL | ARM200CF Super X | PFA | 01.06.2014 | 1 | as is where is | ||
98611 | JEOL | JEM-3000F | Ultra High pressure Electron Microscope | LABORATORY | 1 | as is where is | ||
100991 | Jeol | JWS7500E w/Noran EDX | Wafer Inspection System (SEM) | 200 mm | 01.06.2000 | 1 | as is where is | immediately |
101692 | Jeol | JSM-6060LV | SEM | 1 | inquire | immediately | ||
102242 | JEOL | JEM-2500SE | High Resolution TEM | 300 mm | 1 | as is where is | ||
102243 | JEOL | JEM-2500SE | High Resolution TEM | 300 mm | 1 | as is where is | ||
102244 | JEOL | JEM3200FS | High Resolution TEM | 300 mm | 01.06.2006 | 1 | as is where is | |
102245 | JEOL | JWS-7515 | SEM Wafer Inspection Tool | 200 mm | 01.06.1999 | 1 | as is where is | |
102246 | JEOL | JWS-7555 | SEM Wafer Inspection Tool | 200 mm | 01.06.2000 | 1 | as is where is | |
102247 | JEOL | JWS-7555 | SEM Wafer Inspection Tool | 200 mm | 01.06.2002 | 1 | as is where is | |
102486 | Jeol | JSM-6600F | SEM | 01.06.2014 | 1 | as is where is | immediately | |
102651 | Jeol | JEM-2100 | TEM | 1 | inquire | 1 month | ||
102652 | Jeol | JSM-7001 | FLV SEM | 1 | inquire | 1 month | ||
102653 | Jeol | JEM-2500SE | TEM | 1 | inquire | 1 month | ||
102705 | JEOL | JFS-9855S | Focused Ion Beam System | 200mm | 01.06.2000 | 1 | as is where is | |
102968 | JEOL | JSM-7500F | SEM | Laboratory | 01.06.2009 | 1 | as is where is | |
103158 | Jeol | JSM-6400F | SEM | 01.06.2017 | 1 | inquire | ||
91427 | Jordan Valley | JVX 6200 | X-ray metrology (X-Ray Reflectivity) | 300 mm | 1 | as is where is | ||
95012 | Jordan Valley | JVX 5200T | X-Ray Reflectometer | 200 MM / 300 MM | 01.06.2006 | 1 | as is where is | |
98000 | Jordan Valley | VVX 5200T | METROLOGY | 300 mm | 01.06.2006 | 1 | as is where is | |
99001 | Jordan Valley | JVX6200 | X-Ray Reflectometer | 01.11.2010 | 1 | as is where is | ||
99830 | JORDAN VALLEY | JVX6200I | X-ray Metrology System | 300 mm | 01.03.2011 | 1 | as is where is | immediately |
100917 | Jordan Valley | JVX6200 | X-Ray Inspection System | 300 mm | 01.06.2010 | 1 | as is where is | |
102248 | Jordan Valley | BedeMetrix-F | X-Ray reflectometer | 200 mm | 01.06.2006 | 1 | as is where is | |
102249 | Jordan Valley | JVX5200T | Layer thickness, density and roughness metrology | 300 mm | 01.06.2004 | 1 | as is where is | |
102250 | Jordan Valley | JVX6200i | Film Thickness Measurement | 300 mm | 01.06.2011 | 1 | as is where is | |
102252 | Jordan Valley | JVX7300 | Film Thickness Measurement | 300 mm | 01.06.2012 | 1 | as is where is | |
102253 | Jordan Valley | JVX7300 | Film Thickness Measurement | 300 mm | 1 | as is where is | ||
103093 | Jordan Valley | JVX 6200 | X-ray Fluorescence Spectrometer | 200mm | 01.08.2008 | 1 | as is where is | |
102256 | Karl Suss | MA200 COMPACT | Mask Aligner | 200 mm | 01.06.2012 | 1 | as is where is | |
91429 | KEITHLEY | KEITHLEY 236 | SOURCE MEASURE UNIT | 1 | as is where is | |||
91430 | KEITHLEY | KEITHLEY 236 | SOURCE MEASURE UNIT | 1 | as is where is | |||
92658 | KLA | 6220 | Defect Inspection System | 1 | ||||
87630 | KLA - Tencor | Alphastep IQ | Surface measurement | 4 inch | 1 | as is where is | immediately | |
95510 | KLA - Tencor | Spectra F5X | Surface Characterization | 01.07.2002 | 0 | as is where is | immediately | |
91992 | KLA -TENCOR | 8100 | Critical Dimension Measurement CD-SEM (FOR SPARES USE) | 200 mm | 01.06.1999 | 2 | as is where is | immediately |
32230 | KLA TENCOR | SFS6400 MECHANICAL CALIBRATION Document Number 238 | WAFERSURFACE ANALYSIS SYSTEM CUSTOMER MAINTENANCE REFERENCE | MANUAL | 1 | as is where is | immediately | |
32231 | KLA TENCOR | Surfscan 64X0 Calibration Procedure | Surfscan 64X0 Calibration Procedure | MANUAL | 1 | as is where is | immediately | |
32233 | KLA TENCOR | SFS6x00 MECHANICAL CALIBRATION Document number 200 | WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE | MANUAL | 1 | as is where is | immediately | |
60953 | KLA Tencor | 2135 | brightfield wafer defect inspection | 200 mm | 01.06.1996 | 1 | as is where is | immediately |
95098 | KLA TENCOR | 2139 | Metrology | 8" | 01.06.2000 | 1 | as is where is | |
103161 | KLA Tencor | Surfscan 5500 | Unpatterned Wafer Surface Inspection Tool | 200 mm | 1 | inquire | ||
99837 | KLA- TENCOR | P-22H | Metrology Tool | 200 mm | 1 | as is all rebuilt | immediately | |
91991 | KLA-TENCOR | 8100 XP | Critical Dimension Measurement CD-SEM | 200 mm | 01.06.2000 | 2 | as is where is | immediately |
98061 | KLA-TENCOR | AIT 1 | Dark field, particle inspection | 150 mm / 200 mm | 1 | inquire | immediately | |
102842 | KLA-TENCOR | UV1280SE | Film Thickness Measurement System / Ellipsometer | 200 mm | 1 | inquire | immediately | |
96997 | KLA-Tencor | Surfscan AIT 8020 | Particle Review | 200 mm | 01.06.1997 | 1 | as is where is | immediately |
99845 | KLA-Tencor | 2351 | Bright-Field Wafer Inspection System | 200 mm | 1 | as is where is | immediately | |
101359 | KLA-Tencor | Candela 8600 | Film Thickness Measurement | 200 mm | 01.11.2011 | 1 | as is where is | immediately |
1691 | KLA-TENCOR | 259 (spare parts) | Reticle Inspection - SPARE PARTS | up to 7 inch | 01.12.1991 | 1 | inquire | immediately |
52151 | KLA-Tencor | Hamamatsu R1924A | Photomultiplier | spares | 01.04.2007 | 1 | inquire | immediately |
53035 | KLA-Tencor | 2132 | Wafer chuck, 8" | spares | 1 | as is where is | immediately | |
53036 | KLA-Tencor | Compumotor M575L11 | Stepping motor drive | spares | 1 | as is where is | immediately | |
70127 | KLA-Tencor | AIT UV | PATTERNED WAFER INSPECTION | 200 mm | 01.08.2003 | 1 | as is where is | immediately |
71632 | KLA-TENCOR | 2122 | WAFER DEFECT INSPECTION | 200 mm | 1 | as is where is | immediately | |
74643 | KLA-Tencor | 710-013838-00 Rev 1 | PCB Universal Video Mux | spares | 01.06.1993 | 1 | as is where is | |
76676 | KLA-TENCOR | AIT XP FUSION | Dark Field WAFER PARTICLE DETECTION | 200 mm | 01.10.2002 | 1 | as is where is | immediately |
76677 | KLA-TENCOR | AIT FUSION | Dark Field WAFER PARTICLE DETECTION | 200 mm | 01.06.2002 | 1 | as is where is | immediately |
76681 | KLA-TENCOR | AIT UV | Dark Field WAFER PARTICLE DETECTION | 200 mm | 01.01.2003 | 1 | as is where is | immediately |
76684 | KLA-TENCOR | P20H | PROFILOMETER | 200 mm | 01.04.1996 | 1 | as is where is | immediately |
83702 | KLA-Tencor | AMRAY 4200 | Review SEM | 8" | 01.03.1999 | 1 | as is where is | immediately |
84299 | KLA-Tencor | SP2 XP | Wafer surface particle detection | 300 mm | 01.02.2014 | 1 | as is all rebuilt | immediately |
85954 | KLA-Tencor | AIT XP | Parts/Options | 200 mm | 1 | as is where is | ||
86180 | KLA-TENCOR | AIT-UV | WAFER PARTICLE INSPECTION | 200 mm | 01.06.2002 | 1 | as is where is | |
86419 | KLA-Tencor | AIT 1 | wafer particle detection | 150 mm | 1 | as is where is | ||
86424 | KLA-Tencor | 7700 | Surfscan | 125 mm | 01.02.1996 | 1 | as is where is | |
87421 | KLA-Tencor | Puma 9550 | WAFER INSPECTION | 300 mm | 01.11.2011 | 1 | as is where is | |
87790 | KLA-Tencor | FLX 2908 | Thin Film Measurement System | 200 mm | 01.04.1996 | 1 | as is where is | immediately |
88266 | KLA-Tencor | eS20XP | E-beam Inspection | 200mm | 01.01.2001 | 1 | as is where is | |
88365 | Kla-Tencor | 2135 XP | Brightfield wafer defect inspection | 150 mm or 200 mm | 01.06.1997 | 1 | inquire | immediately |
88366 | Kla-Tencor | 2139 | Birghtfield wafer defect inspection | 150 mm or 200 mm | 01.06.2000 | 1 | as is where is | immediately |
88368 | Kla-Tencor | P15 | WAFER SURFACE PROFILOMETER | 200 mm OR SMALLER | 01.06.2007 | 1 | inquire | immediately |
88369 | KLA-Tencor | 5200 | Overlay measurement (For spares use) | 200 mm | 01.06.1997 | 1 | inquire | immediately |
88370 | Kla-Tencor | FLX 2908 | Wafer Stress Measurement | 1 | inquire | |||
88378 | Kla-Tencor | Alpha Step IQ | Profileometer | Manual | 1 | inquire | immediately | |
88379 | Kla-Tencor | AIT 2 | Surfscan wafer particle detection system | 200 mm | 01.06.1998 | 1 | inquire | |
88605 | KLA-Tencor | EDR5210 | Defect Review SEM | 300 MM | 01.06.2010 | 1 | as is where is | |
88607 | KLA-Tencor | INM100+INS10 | Metrology | 150 MM | 1 | as is where is | ||
89977 | KLA-Tencor | Surfscan 4000 | Wafer surface particle inspection | 150mm | 1 | as is where is | immediately | |
90957 | KLA-Tencor | EDR5210 | DR SEM | 300 mm | 1 | as is where is | ||
90960 | KLA-Tencor | NANOMAPPER | Nanotopography | 300 mm | 01.06.2006 | 1 | as is where is | |
90961 | KLA-Tencor | Puma 9000 | Dark field defect Inspection | 300 mm | 01.06.2005 | 1 | as is where is | |
91007 | KLA-Tencor | Aset F5x | Thin Film measurement | 300 MM | 01.11.2003 | 1 | as is where is | immediately |
91106 | KLA-Tencor | ARCHER 100AIM | Overlay Measurement | 300 mm | 1 | as is where is | ||
91107 | KLA-Tencor | ARCHER 100AIM | Overlay Measurement | 300 mm | 01.06.2007 | 1 | as is where is | immediately |
91110 | KLA-Tencor | PUMA 9000D | Wafer Inspection System | 200 mm | 1 | as is where is | ||
91111 | KLA-Tencor | PUMA 9000D | Wafer Inspection System | 300 mm | 01.06.2006 | 1 | as is where is | |
91112 | KLA-Tencor | PUMA 9000D | Wafer Inspection System | 300 mm | 01.06.2005 | 1 | as is where is | |
91431 | KLA-Tencor | 2350 | Brightfield Wafer Defect Inspection | 200 mm | 01.06.2001 | 1 | as is where is | |
91432 | KLA-Tencor | 2350 | Brightfield Wafer Defect Inspection | 200 mm | 01.06.2001 | 1 | as is where is | |
91433 | KLA-Tencor | 2350 | Brightfield Wafer Defect Inspection | 300 mm | 1 | as is where is | ||
91435 | KLA-Tencor | AIT | Particle Review | 200 mm | 01.06.1997 | 1 | as is where is | |
91436 | KLA-Tencor | AIT I | Patterned Wafer Inspection | 150 mm,200 mm | 01.06.1997 | 1 | as is where is | |
91440 | KLA-Tencor | ARCHER 10 XT | Overlay measurement system | 300 mm | 01.06.2008 | 1 | as is where is | immediately |
91441 | KLA-Tencor | ARCHER AIM | Overlay measurement system | 300 mm | 1 | as is where is | ||
91442 | KLA-Tencor | ARCHER XT+ | Overlay measurement system | 300 mm | 01.06.2007 | 1 | as is where is | immediately |
91443 | KLA-Tencor | ARCHER XT+ | Overlay measurement system | 300 mm | 01.06.2003 | 1 | as is where is | |
91444 | KLA-Tencor | ARCHER XT+ | Overlay measurement system | 300 mm | 1 | as is where is | ||
91445 | KLA-Tencor | ARCHERXT+ | Overlay measurement system | 300 mm | 01.06.2006 | 1 | as is where is | |
91446 | KLA-Tencor | ARCHERXT+ | Overlay measurement system | 300 mm | 01.06.2007 | 1 | as is where is | |
91447 | KLA-Tencor | ARCHERXT+ | Overlay measurement system | 300 mm | 01.06.2007 | 1 | as is where is | |
91451 | KLA-Tencor | HRP_340 | Surface Profiler | 300 mm | 01.06.2005 | 1 | as is where is | |
91452 | KLA-Tencor | HRP_340 | Surface Profiler | 300 mm | 01.06.2007 | 1 | as is where is | |
91453 | KLA-Tencor | KLA 5100XP | OVERLAY REGISTRATION | 150 mm,200 mm | 1 | as is where is | ||
91457 | KLA-Tencor | M-GAUGE 200 | Thickness measurement | 4", 150 mm | 1 | as is where is | ||
91464 | KLA-Tencor | PROMETRIX FT750 | Film Thickness Measurement | 1 | as is where is | |||
91466 | KLA-Tencor | PROMETRIX FT750 | Film Thickness Measurement | 1 | as is where is | |||
91469 | KLA-Tencor | PROMETRIX RS55 Manual Type | Resistivity | 200 mm | 1 | as is where is | ||
91474 | KLA-Tencor | THERMA-WAVE OP 2600 | OPTI-PROBE | 200 mm | 1 | as is where is | ||
91475 | KLA-Tencor | THERMA-WAVE OP 2600 | OPTI-PROBE | 200 mm | 1 | as is where is | immediately | |
91476 | KLA-Tencor | THERMA-WAVE OP 2600 | OPTI-PROBE | 200 mm | 01.06.1995 | 1 | as is where is | immediately |
91477 | KLA-Tencor | THERMA-WAVE OP 2600 | OPTI-PROBE | 200 mm | 1 | as is where is | immediately | |
91478 | KLA-Tencor | THERMA-WAVE OP 2600 DUV | OPTI-PROBE | 200 mm | 01.08.1997 | 1 | as is where is | immediately |
91479 | KLA-Tencor | THERMA-WAVE OP 2600B | OPTI-PROBE | 200 mm | 01.06.1997 | 1 | as is where is | immediately |
91480 | KLA-Tencor | THERMA-WAVE OP 2600B | OPTI-PROBE | 200 mm | 1 | as is where is | immediately | |
91481 | KLA-Tencor | THERMA-WAVE OP 2600B | OPTI-PROBE | 200 mm | 01.06.1997 | 1 | as is where is | immediately |
91482 | KLA-Tencor | THERMA-WAVE OP 2600B | OPTI-PROBE | 200 mm | 01.06.1997 | 1 | as is where is | immediately |
91483 | KLA-Tencor | THERMA-WAVE OP 2600B | OPTI-PROBE | 200 mm | 01.06.1999 | 1 | as is where is | immediately |
91484 | KLA-Tencor | THERMA-WAVE OP 2600B | OPTI-PROBE | 200 mm | 01.06.1997 | 1 | as is where is | immediately |
91990 | KLA-TENCOR | AIT I | Surfscan wafer particle detection system | 200 mm | 01.06.1998 | 2 | as is where is | immediately |
92705 | KLA-Tencor | ES35D | E-BEAM INSPECTION | 300 MM | 01.06.2006 | 1 | as is where is | |
92813 | KLA-Tencor | MPV CD2 AMC | Optical Wafer Metrology | 125 mm | 1 | as is where is | ||
92814 | KLA-Tencor | MPV CD2 AMC | Optical Wafer Metrology | 125 mm | 1 | as is where is | ||
92815 | KLA-Tencor | MPV-CD | Optical Wafer Metrology | 125 mm | 1 | as is where is | ||
92817 | KLA-Tencor | Surfscan 7700 | Particle Counter (Metrology) | 125 mm | 1 | as is where is | ||
93090 | KLA-Tencor | ARCHER 100AIM | Overlay | 300 mm | 1 | as is where is | ||
93091 | KLA-Tencor | ARCHER 300 PLUS | Overlay | 300 mm | 01.11.2011 | 1 | as is where is | immediately |
93092 | KLA-Tencor | ARCHER 300LCM | Overlay | 300 mm | 01.07.2010 | 1 | as is where is | |
93094 | KLA-Tencor | AIT UV | DARKFIELD DEFECT INSPECTION | 200 mm | 1 | as is where is | ||
93095 | KLA-Tencor | AIT XP+ | DARKFIELD DEFECT INSPECTION | 200 mm | 01.06.1998 | 1 | as is where is | |
93096 | KLA-Tencor | ARCHER AIM� | Overlay | 300 MM | 01.06.2003 | 1 | as is where is | |
93097 | KLA-Tencor | P-10 | DISK PROFILER | 150 mm,200 mm | 1 | as is where is | ||
93098 | KLA-Tencor | P-12 | DISK PROFILER | 150 mm/200 mm | 1 | as is where is | immediately | |
93099 | KLA-Tencor | P-2 | DISK PROFILER | 150 mm,200 mm | 1 | as is where is | ||
93100 | KLA-Tencor | P-2 | DISK PROFILER | 150 mm,200 mm | 01.06.1996 | 1 | as is where is | |
93101 | KLA-Tencor | P-20H | DISK PROFILER | 150 mm,200 mm | 1 | as is where is | ||
93102 | KLA-Tencor | P-2H | DISK PROFILER | 150 mm,200 mm | 01.06.1996 | 1 | as is where is | |
93910 | KLA-Tencor | SP3 | DARKFIELD WAFER INSPECTION SYSTEM | 300 mm | 01.06.2011 | 1 | as is where is | immediately |
93911 | KLA-Tencor | UV1080 | THIN FILM MEASUREMENT | 200 mm | 01.06.1999 | 1 | as is where is | |
94461 | KLA-Tencor | 2132 (mainbody only) | INSPECTION UNIT | 150 mm,200 mm | 01.06.1995 | 1 | as is where is | |
94462 | KLA-Tencor | AIT | Particle Review | 200 mm | 01.06.1997 | 1 | as is where is | |
94464 | KLA-Tencor | Archer AIM | Overlay | 200 mm | 01.10.2004 | 1 | as is where is | immediately |
94465 | KLA-Tencor | ARCHER XT+ | Overlay | 300 mm | 01.06.2007 | 1 | as is where is | |
94466 | KLA-Tencor | ARCHER XT+ | Overlay | 300 mm | 01.06.2007 | 1 | as is where is | |
94469 | KLA-Tencor | KLA 5100 | OVERLAY REGISTRATION | 150 mm,200 mm | 1 | as is where is | ||
94470 | KLA-Tencor | KLA- Aleris CX | FilmThickness Mesuarement | 300 mm | 01.06.2007 | 1 | as is where is | |
94471 | KLA-Tencor | KLA- Aleris HT | FilmThickness Mesuarement | 300 mm | 01.06.2005 | 1 | as is where is | |
94472 | KLA-Tencor | PUMA 9130 | Darkfield Wafer inspection system | 300 mm | 01.06.2006 | 1 | as is where is | immediately |
94473 | KLA-Tencor | SP1 Tbi | Unpatterned wafer inspection System | 200 mm | 01.02.2007 | 1 | as is where is | immediately |
94577 | KLA-Tencor | AIT-UV | Dark Field Inspection | 200 mm | 01.01.2003 | 1 | as is where is | immediately |
96049 | KLA-Tencor | 2365 | Bright Field Inspection | 300 mm or 200 mm | 01.06.2006 | 1 | inquire | |
96052 | KLA-Tencor | ASET F5 | Film Thickness Measurement System | 200 mm | 1 | inquire | ||
96053 | KLA-Tencor | Spectra CD F5X w/CD | Surface Characterization | 200 mm | 01.06.2002 | 1 | inquire | |
96998 | KLA-Tencor | Surfscan AIT 8010 | Patterned Wafer Inspection | 200 mm | 01.06.1997 | 1 | as is where is | immediately |
97020 | KLA-Tencor | VISEDGE_CV300 | Etch Inspection | 300 mm | 01.06.2007 | 1 | as is where is | |
97450 | KLA-Tencor | SP1-TBI | Wafer Particle Inspection System | 300 mm | 01.09.2004 | 1 | as is where is | immediately |
97453 | KLA-Tencor | Archer 200 AIM | Overlay Measurement System | 300 mm | 01.05.2010 | 1 | as is where is | immediately |
98002 | KLA-Tencor | ES31 | ebeam inspection | 300 mm | 01.06.2011 | 1 | as is where is | |
98003 | KLA-Tencor | ES32 | ebeam inspection | 300 mm | 01.06.2005 | 1 | as is where is | |
98032 | KLA-Tencor | SFX100 | Thickness Measurement System | 300 mm | 01.06.2004 | 1 | as is where is | |
98033 | KLA-Tencor | SP1 TBI | Unpatterned wafer inspection System | 200 mm | 01.06.2000 | 1 | as is where is | |
98034 | KLA-Tencor | SP2 (Parts Missing) | Darkfield Wafer Particle Detection System | 300 mm | 01.06.2005 | 1 | as is where is | |
98126 | KLA-Tencor | 3905 | Broadband Plasma Patterned Wafer Inspection | 300 mm | 01.06.2017 | 1 | as is where is | |
98127 | KLA-Tencor | Aleris CX | Film thickness measurements | 300 mm | 01.06.2007 | 1 | as is where is | |
98128 | KLA-Tencor | Archer 300 AIM | Overlay | 300 mm | 01.06.2012 | 1 | as is where is | |
98131 | KLA-Tencor | 5100 | Overlay Measurement | 200 mm | 01.06.1995 | 1 | as is where is | |
98132 | KLA-Tencor | Puma 9100 | Dark Field Inspection | 300 mm | 01.06.2007 | 1 | as is where is | |
98134 | KLA-Tencor | Viper | Macro Defect Detection System | 300 mm | 01.06.2010 | 1 | as is where is | |
98209 | KLA-Tencor | 2365 | Metrology and Inspection | 200 mm | 01.06.2006 | 1 | inquire | |
98344 | KLA-Tencor | 2810 | METRO | 300 mm | 01.06.2008 | 1 | inquire | |
98399 | KLA-Tencor | 2132 | Brightfield Wafer Defect Inspection System | 200 mm | 01.08.1997 | 1 | as is where is | immediately |
98400 | KLA-Tencor | AIT I Surfscan | Patterned Wafer Surface Inspection | 200 mm | 1 | as is where is | immediately | |
98403 | KLA-Tencor | SFS-7600 | Patterned Wafer Surface Inspection | 150 mm | 1 | as is where is | ||
98404 | KLA-Tencor | UV-1050 | Thin Film Measurement System | 150 mm | 1 | as is where is | ||
98548 | KLA-Tencor | AIT XP Fusion | Darkfield Pattern Inspection | 200 mm | 3 | inquire | ||
98549 | KLA-Tencor | AIT XP | Darkfield Pattern Inspection | 200 mm | 1 | inquire | immediately | |
98550 | KLA-Tencor | SP1-DLS | Darkfield Non-Patterned Wafer Inspection | 300 mm | 1 | inquire | 3 months | |
98551 | KLA-Tencor | ES31 | SEM Defect Inspection | 200 mm | 1 | as is where is | immediately | |
98552 | KLA-Tencor | UV1050 | Film Thickness Measurement | 150 mm-200 mm | 1 | inquire | ||
98553 | KLA-Tencor | UV1080 | Film Thickness Measurement | 150 mm-200 mm | 1 | inquire | ||
98816 | KLA-Tencor | ARCHER10XT | Overlay Measurement | 300 mm | 01.02.2005 | 1 | as is where is | |
98817 | KLA-Tencor | ARCHERXT-PLUS | Overlay Measurement | 300 mm | 01.06.2006 | 1 | as is where is | |
98818 | KLA-Tencor | F5X | Film Thickness Measurement System | 300 mm | 01.09.2001 | 1 | as is where is | immediately |
98819 | KLA-Tencor | PUMA 2 | Darkfield Inspection System | 300 mm | 01.02.2007 | 1 | as is where is | |
98858 | KLA-Tencor | Surfscan 4500 | Unpatterned Wafer Surface Inspection | 1 | as is where is | |||
98912 | KLA-Tencor | AIT XP | Defect Inspection | 1 | as is where is | |||
98913 | KLA-Tencor | AIT XUV | Darkfield Wafer Inspection | 1 | as is where is | |||
98914 | KLA-Tencor | Spectra FX-1000 HT | Thin film measurement system | 1 | as is where is | |||
98915 | KLA-Tencor | Puma 9550i | Wafer Inspection | 1 | as is where is | |||
98916 | KLA-Tencor | Stealth 2350 | Defect Inspection | 1 | as is where is | |||
98917 | KLA-Tencor | TP 420XP | Post Implant measurement | 1 | as is where is | |||
98918 | KLA-Tencor | Viper 2401 | After Develop Inspection Tool | 1 | as is where is | |||
98969 | KLA-Tencor | 8100XP | CD SEM | 01.06.1998 | 1 | as is where is | immediately | |
99010 | KLA-Tencor | F5X | Surface Characterization | 300 mm | 01.05.2003 | 1 | as is where is | |
99011 | KLA-Tencor | PUMA2 | Darkfield Inspection | 01.06.2005 | 1 | as is where is | ||
99055 | KLA-Tencor | Candela CS20R | Optical Surface Analyzer | 01.04.2012 | 1 | as is where is | immediately | |
99441 | KLA-Tencor | 5200 | Overlay Measurement System | 200 mm | 2 | inquire | immediately | |
99859 | KLA-Tencor | 5011 | Overlay precision measurement system | 1 | inquire | |||
99860 | KLA-Tencor | P10 | Surface Profiler | 150/200 mm | 01.01.2000 | 1 | inquire | |
99861 | KLA-Tencor | SFS-7600 | Surfscan Patterned Wafer Inspection System | 150/200 mm | 01.01.1994 | 2 | inquire | |
99912 | KLA-Tencor | KLA2131 | Inspection System | 200 mm | 01.06.1995 | 1 | as is where is | |
100186 | KLA-Tencor | eS32 | E-beam Inspection | 300mm | 01.06.2007 | 1 | as is where is | |
100187 | KLA-Tencor | eS37 | E-beam Inspection | 300mm | 01.06.2009 | 1 | as is where is | |
100730 | KLA-Tencor | Alpha Step IQ | Surface Profiler | 01.06.2010 | 1 | as is where is | ||
100731 | KLA-Tencor | Candela CS20V | Wafer Inspection | 1 | as is where is | |||
100907 | KLA-Tencor | SFX100 | Thickness Measurement System | 300 mm | 01.06.2004 | 1 | ||
100918 | KLA-Tencor | PUMA 9000 | Defect Inspection | 300 mm | 01.06.2008 | 1 | as is where is | |
101342 | KLA-Tencor | AIT I | Patterned Surface Defect Inspection System | 200 mm | 01.02.1998 | 1 | as is where is | immediately |
101452 | KLA-Tencor | WaferSight | Wafer Characterization | 300mm | 1 | as is where is | ||
101557 | KLA-Tencor | Therma-Wave TP630XP | METRO | 01.07.2004 | 1 | inquire | immediately | |
101614 | KLA-Tencor | SFX200 | Thickness Measurement System | 200 - 300 mm | 01.11.2005 | 1 | inquire | immediately |
101625 | KLA-Tencor | CI-T130 | INSPECTION W/RB PYRAMID & MVS7 (GEN 2) | Assembly | 1 | as is where is | ||
101626 | KLA-Tencor | CI-T130 | INSPECTION W/RBP, 70X70, MVS7K (GEN 2) | Assembly | 1 | as is where is | ||
101627 | KLA-Tencor | AIM+ | OVERLAY REGISTRATION TOOL, Copper Tool | 300 mm | 1 | as is where is | ||
101651 | KLA-Tencor | Alpha-Step 500 | Thickness Measurement System | 200 mm | 1 | as is where is | ||
101801 | KLA-Tencor | M-gage300 | Al Thickness measurement | 200 mm | 01.06.2001 | 1 | inquire | |
102258 | KLA-Tencor | AIT Fusion | Dark Field inspection | 200 mm | 01.06.2003 | 1 | as is where is | |
102259 | KLA-Tencor | Archer AIM+ | Overlay measurement | 300 mm | 01.06.2008 | 1 | as is where is | |
102260 | KLA-Tencor | ASET-F5x | Thickness measurement | 200 mm, 300 mm | 01.06.2001 | 1 | as is where is | |
102261 | KLA-Tencor | CRS1010 | Review Station | 200 mm | 01.06.1998 | 1 | as is where is | |
102262 | KLA-Tencor | DP2 | Data Prep Station | 01.06.2012 | 1 | as is where is | ||
102263 | KLA-Tencor | eS31 | E-beam Inspection | 300 mm | 01.06.2004 | 1 | as is where is | |
102264 | KLA-Tencor | eS32 | Electron-Beam Inspection | 300 mm | 01.06.2007 | 1 | as is where is | |
102265 | KLA-Tencor | eS32 | Electron-Beam Inspection | 300 mm | 01.06.2007 | 1 | as is where is | |
102266 | KLA-Tencor | eS32 | E-beam Inspection | 300 mm | 01.06.2007 | 1 | as is where is | |
102267 | KLA-Tencor | FX200 | Thickness measurement | 300 mm | 01.06.2006 | 1 | as is where is | |
102268 | KLA-Tencor | 2371 | Bright Defect inspection | 200 mm | 01.06.2006 | 1 | as is where is | |
102270 | KLA-Tencor | Puma 9000 | Dark Field Inspection | 300 mm | 01.06.2005 | 1 | as is where is | |
102272 | KLA-Tencor | SLF576 | Reticle inspection system | 01.06.2003 | 1 | as is where is | ||
102273 | KLA-Tencor | Surfscan 2.1 | Particle Counter | 125 mm | 1 | as is where is | ||
102274 | KLA-Tencor | Viper 2435 | MACRO INSPECTION | 300 mm | 1 | as is where is | ||
102472 | KLA-Tencor | 6220 | Bare Wafer Particle Detection System | 150 mm / 200 mm | 1 | inquire | immediately | |
102477 | KLA-Tencor | P-10 | Manual Wafer Load Disk Profilometer | 200 mm | 1 | |||
102634 | KLA-Tencor | 6400 | Patterned Wafer Particle Inspection System | 150 mm / 200 mm | 1 | inquire | 1 month | |
102708 | KLA-Tencor | Archer 300 AIM | Overlay Measurement System | 300 mm | 01.06.2012 | 1 | as is where is | |
102709 | KLA-Tencor | eS32 | E-beam Inspection | 300 mm | 1 | as is where is | ||
102710 | KLA-Tencor | eS32 | E-beam Inspection | 300 mm | 1 | as is where is | ||
102711 | KLA-Tencor | Surfscan SP2 | Wafer Particle Measurement System | 300 mm | 1 | as is where is | ||
102712 | KLA-Tencor | Surfscan SP2 | Wafer Particle Measurement System | 300 mm | 1 | as is where is | ||
102714 | KLA-Tencor | Surfscan SP2 | Wafer Particle Measurement System | 300 mm | 1 | as is where is | ||
102715 | KLA-Tencor | Surfscan SP2 | Wafer Particle Measurement System | 300 mm | 1 | as is where is | ||
102716 | KLA-Tencor | Surfscan SP2 | Wafer Particle Measurement System | 300 mm | 01.06.2007 | 1 | as is where is | |
102969 | KLA-Tencor | FIT3120 | PARTICLE COUNTER | 300 mm | 01.06.2005 | 1 | as is where is | |
102987 | KLA-Tencor | SP3 | Wafer Surface Inspection System | 300 mm | 01.06.2011 | 1 | as is where is | |
102988 | KLA-Tencor | UV1080 | Thin Film Measurement System | 200 mm | 01.06.1999 | 1 | as is where is | |
103095 | KLA-Tencor | 2800 | Brightfield Inspection | 300mm | 01.06.2006 | 1 | as is where is | |
103096 | KLA-Tencor | AIT UV | Darkfield Inspection | 300mm | 01.06.2004 | 1 | as is where is | |
103097 | KLA-Tencor | Archer 10 | Overlay Measurement System | 300mm | 1 | as is where is | ||
103098 | KLA-Tencor | Archer 10 | Overlay Measurement System | 300mm | 1 | as is where is | ||
103099 | KLA-Tencor | Surfscan SP3 | Particle Measurement | 300mm | 01.06.2014 | 1 | as is where is | |
103141 | KLA-Tencor | FX-200 (Initialized) | Thin Film Measurement | 300 mm | 1 | as is where is | ||
103162 | KLA-Tencor | P-15 | Profiler | 200 mm | 1 | inquire | ||
103163 | KLA-Tencor | P-11 | Profiler | 1 | inquire | |||
103164 | KLA-Tencor | Surfscan 4000 | Unpatterned Wafer Surface Inspection Tool | 150 mm | 01.06.1986 | 1 | inquire | |
103165 | KLA-Tencor | Surfscan 4500 | Unpatterned Wafer Surface Inspection Tool | 150 mm | 1 | inquire | ||
103166 | KLA-Tencor | Surfscan 5000 | Unpatterned Wafer Surface Inspection Tool | 200 mm | 01.06.1988 | 1 | inquire | |
102284 | Kokusai | VR-120SD | Resistivity Measurement | 300 mm | 1 | as is where is | ||
97865 | KRUSS | KRUSSDSA100 | CONTECT ANGLE MEASUREMENT | 1 | as is where is | |||
94475 | LASERTEC | BGM300 | Wafer Surface Analyzing and VIsualization System | 200 mm | 01.06.2008 | 1 | as is where is | |
86186 | LEICA | INS3300 | Wafer Inspection Microscope | 200 mm/300 mm | 01.06.2003 | 1 | as is where is | immediately |
88268 | Leica | INM20 | Microscope | 200mm | 1 | as is where is | immediately | |
88269 | Leica | INS10 | Microscope | 200mm | 1 | as is where is | ||
91486 | LEICA | INS 2000 | REVIEW STATION | 1 | as is where is | |||
91492 | LEICA | Leica INM100 | Operation Manual Optical Microscope | 1 | as is where is | |||
91493 | LEICA | Leica INM100 | Operation Manual Optical Microscope | 1 | as is where is | |||
91494 | LEICA | Leica INM100 | Operation Manual Optical Microscope | 1 | as is where is | |||
97106 | Leica | MZ 12.5 | Stereomicroscope | 1 | as is where is | |||
98920 | Leica | INM 300 | Microscope | 1 | as is where is | |||
103110 | Leica | LDS3300C | Macro-Defect | 300mm | 1 | as is where is | ||
86193 | LEITZ | MPV-SP | Wafer Inspection Microscope | 200 mm | 1 | as is where is | ||
86420 | Leitz | MPV CD2 AMC | Wafer inspection microscope | 125 mm | 1 | as is where is | ||
86421 | Leitz | MPV CD2 AMC | Wafer inspection microscope | 125 mm | 1 | as is where is | ||
86423 | Leitz | MPV-CD | Wafer inspection microscope | 125 mm | 1 | as is where is | ||
86426 | Leitz | INM100+INS10 | Wafer inspection microscope | 150 mm | 1 | as is where is | ||
102168 | Leo | 1530 | FE-SEM | up to 8 inch | 01.06.2002 | 1 | as is where is | |
81917 | MDC | 986G | Automatic CV Plotter | 200 MM | 01.06.2002 | 1 | as is where is | immediately |
99419 | MDC | CSM | Automatic CV Plotter with RM-1600 Computer | 1 | as is where is | immediately | ||
99420 | MDC | CSM/16 | Automatic CV Plotter with RM-1600 Computer | 125 MM | 1 | as is where is | immediately | |
98005 | MicoMetrics | Precis | Overlay measurement system | 200 mm | 01.06.2010 | 1 | as is where is | |
99422 | Minato | MM-6600 | Wafer Mobility Tester | 2 | as is where is | |||
91113 | MITUTOYO | MP2000 | METRO | 200 mm | 1 | as is where is | ||
100734 | Mitutoyo | SJ-401 | Surface Roughness Tester | 1 | as is where is | |||
100735 | Mitutoyo | SJ-411 | Surface Roughness Tester | 1 | as is where is | |||
100736 | Mitutoyo | YC-H250 | Measurement Machine | 01.06.2011 | 1 | as is where is | ||
100737 | Mitutoyo | YC-H260 | Measurement Machine | 1 | as is where is | |||
101628 | N&K | GEMINI | SCATTEROMETER/REFLECTANCE-TRANSMISSION | 300 mm | 1 | as is where is | ||
71741 | Nanofab | Nano150 | Ion Beam Lithography / Implanter System | 150 mm | 1 | inquire | immediately | |
84832 | NANOMETRICS | NanoSpec 9000 | Metrology Equipment, Wafer Inspection Equipment | 200mm | 1 | as is where is | immediately | |
86425 | Nanometrics | Nanospec AFT 210 | surface inspection | 125 mm | 1 | as is where is | ||
91526 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 01.06.2003 | 1 | as is where is | immediately |
91527 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 01.06.2010 | 1 | as is where is | immediately |
91528 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 01.09.2009 | 1 | as is where is | immediately |
91529 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 01.03.2010 | 1 | as is where is | immediately |
91530 | NANOMETRICS | NANOMETRICS 9-7200-0195E | Mask & Wafer Inspection | 200 mm | 1 | as is where is | ||
91531 | NANOMETRICS | NANOSPEC ATF210 | Film Thickness Measurement | 1 | as is where is | |||
91532 | Nanometrics | Q230 | OVERLAY MEASUREMENT | 200 mm | 1 | as is where is | immediately | |
92041 | Nanometrics | 9010B | Metrology | 1 | as is where is | immediately | ||
92818 | Nanometrics | NanoSpec 210 | Metrology (Metrology) | 125 mm | 1 | as is where is | ||
98153 | Nanometrics | Caliper Mosaic | Overlay Measurement | 300 mm | 01.06.2011 | 1 | as is where is | |
98154 | Nanometrics | Caliper Mosaic | Overlay Measurement | 300 mm | 01.06.2009 | 1 | as is where is | |
98155 | Nanometrics | Caliper Mosaic | Overlay Measurement | 300 mm | 01.06.2009 | 1 | as is where is | |
98289 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 01.06.2005 | 1 | as is where is | |
98290 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 01.06.2005 | 1 | as is where is | |
98291 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 01.07.2006 | 1 | as is where is | immediately |
98480 | Nanometrics | 8000X | film thickness measurement | 150mm | 2 | as is where is | immediately | |
98481 | Nanometrics | 8000Xse | film thickness measurement | 200mm | 2 | as is where is | ||
98508 | Nanometrics | M6100 | Film Thickness Measurement | 200 mm | 1 | as is where is | ||
98831 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 300 mm | 01.03.2005 | 1 | as is where is | |
98832 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 300 mm | 01.11.2009 | 1 | as is where is | |
99027 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 01.06.2007 | 1 | as is where is | ||
99028 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 300 mm | 01.10.2006 | 1 | as is where is | |
99029 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 01.10.2006 | 1 | as is where is | ||
99030 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 300 mm | 01.02.2008 | 1 | as is where is | |
100923 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 300 mm | 01.06.2006 | 1 | as is where is | |
101583 | NANOMETRICS | ATLAS | CD Measurement | 300 mm | 01.03.2007 | 1 | as is where is | |
101584 | NANOMETRICS | ATLAS | CD Measurement | 300 mm | 01.08.2006 | 1 | as is where is | |
101585 | NANOMETRICS | CALIPER-ULTRA | Overlay Measurement | 300 mm | 01.07.2006 | 1 | as is where is | |
102302 | Nanometrics | Atlas | Film Thickness measurement | 200 mm | 01.06.2007 | 1 | as is where is | |
102303 | Nanometrics | Caliper Elan | Overlay Measurement System | 300 mm | 1 | as is where is | ||
102304 | Nanometrics | Caliper Elan | Overlay Measurement | 300 mm | 01.06.2004 | 1 | as is where is | |
102305 | Nanometrics | Caliper Elan | Overlay Measurement | 300 mm | 01.06.2006 | 1 | as is where is | |
102306 | Nanometrics | Caliper Elan | Overlay Measurement | 300 mm | 01.06.2006 | 1 | as is where is | |
102307 | Nanometrics | Caliper Elan | Overlay Measurement | 300 mm | 01.06.2006 | 1 | as is where is | |
102308 | Nanometrics | Caliper Elan | Overlay Measurement | 300 mm | 01.06.2006 | 1 | as is where is | |
102309 | Nanometrics | Caliper Q300 | Overlay Measurement System | 300 mm | 01.06.2003 | 1 | as is where is | |
102310 | Nanometrics | Caliper Q300 | Overlay Measurement | 300 mm | 01.06.2003 | 1 | as is where is | |
102311 | Nanometrics | Caliper Q300 | Overlay Inspection | 300 mm | 01.06.2002 | 1 | as is where is | |
102312 | Nanometrics | Caliper Q300 | Overlay Measurement | 300 mm | 01.06.2002 | 1 | as is where is | |
102313 | Nanometrics | Caliper Q300 | Overlay Measurement | 300 mm | 1 | as is where is | ||
102314 | Nanometrics | Q200I | Overlay Measurement System | 200 mm | 01.06.2000 | 1 | as is where is | |
102315 | Nanometrics | Q200I | Overlay Measurement | 200 mm | 01.06.2002 | 1 | as is where is | |
102840 | NANOMETRICS | 9010 | Integrated Metrology System | 01.01.2008 | 5 | as is where is | immediately | |
97868 | Newport | 1830-C | Optical Power Meter | 1 | as is where is | |||
93103 | NGR | NGR2150 | E-beam wafer inspection | 300 MM | 1 | as is where is | ||
91534 | NICOLET | Magna 410 ft-ir | Spectrometer | 01.06.1996 | 1 | as is where is | ||
91535 | NICOLET | Magna 560 ft-ir | Spectrometer | 01.06.1998 | 1 | as is where is | ||
98922 | Nicolet | ECO 3000 | FTIR | 1 | as is where is | |||
102316 | Nicolet | ECO1000 | Film Thickness Gauge | 200 mm | 1 | as is where is | ||
102888 | Nicolet | ECO-1000S | FT-IR | 200 mm | 01.06.1996 | 1 | as is where is | |
91536 | Nidec | im15 | Wafer inspection | 1 | as is where is | |||
82904 | Nikcon | AMI-2000 | Surface Analyzer | 01.06.2003 | 1 | as is where is | immediately | |
33708 | NIKON | Optiphot 88 | Wafer Inspection Microscope | 200 mm | 1 | as is where is | immediately | |
64341 | Nikon | VMR 3020 | Video Measuring System | 01.01.2001 | 1 | as is where is | immediately | |
76705 | Nikon | Opiphot | Inspection Microscope with autoloader | 200 mm | 01.04.1992 | 1 | as is where is | immediately |
88273 | Nikon | OPTIPHOT 200 | Microscope | 200mm | 1 | as is where is | ||
91863 | NIKON | Optiphot 150 | Wafer Inspection Microscope, 10X, 20X, 50X & 150X Objs., 150mm XY Stage | 150 mm | 1 | as is where is | immediately | |
91864 | NIKON | Optiphot 200 (For spares use) | Wafer Inspection Microscope (Parts Tool Only) | 200 mm | 1 | as is where is | immediately | |
92616 | Nikon | OPTISTATION V | Optical Review System | 200mm | 1 | as is where is | ||
92617 | Nikon | OPTISTATION V | Optical Review System | 200mm | 1 | as is where is | ||
92707 | NIKON | VMR-C4540 | FOUP INSPECTION | 300 MM | 01.06.2001 | 1 | as is where is | |
92825 | Nikon | OPTIPHOT 66 | Microscope (Metrology) | 150 mm | 1 | as is where is | ||
96395 | Nikon | Lasermark Overlap Inspection System | Inspection System | 200 - 300 mm | 01.06.2013 | 1 | as is where is | immediately |
97712 | Nikon | OPTISTATION 3100 | Microscope inspection station | 300 mm | 1 | as is where is | ||
97713 | Nikon | OPTISTATION 3100 | Microscope inspection station | 300 mm | 1 | as is where is | ||
98923 | Nikon | Optiphot 200 | Inspection Microscope | 1 | as is where is | |||
99396 | Nikon | EpiPhot 200 | Inspection Microscope | 200 mm | 1 | as is where is | immediately | |
99424 | Nikon | Optiphot 150 | Wafer Inspection Microscope | 150 mm | 1 | as is where is | immediately | |
99425 | Nikon | Optistation 3 | Microscope Wafer Inspection Satation with cassette to cassette handling | 150 mm | 1 | as is where is | immediately | |
99426 | Nikon | Optistation 3 | Microscope Wafer Inspection Station with cassette to cassette handling | 150 mm | 1 | as is where is | immediately | |
99427 | Nikon | Optistation 3 | Wafer Inspection System | 150 mm | 01.06.1994 | 1 | as is where is | immediately |
99428 | Nikon | Optistation 3A | Automatic Wafer Inspection Station | 200 mm | 01.06.1997 | 1 | as is where is | immediately |
100223 | Nikon | AMI-3300 | Macro-Defect | 300mm | 1 | as is where is | ||
100224 | Nikon | AMI-3300 | Macro-Defect | 300mm | 1 | as is where is | ||
100226 | Nikon | AMI-3500 | Macro-Defect | 300mm | 1 | as is where is | ||
102323 | Nikon | Optistation 3000 | Microscope inspection station | 01.06.2011 | 1 | as is where is | ||
103038 | Nikon | Optiphot | Inspection Microscope w/ Nomarski Optics | 1 | as is where is | |||
103039 | Nikon | Optiphot 88 | 200mm Inspection Microscope w/ Nomarski Optics | 200 mm | 1 | as is where is | ||
86646 | Nitto | HR8500 | taper | 1 | as is where is | |||
53146 | NOVA | 210 | CMP ENDPOINT MEASUREMENT SYSTEMS | 200 mm | 5 | as is where is | immediately | |
101732 | NOVA | 3090 | Etch OCD Measuring | 1 | inquire | |||
69809 | Olympus | MX-50 | Microscopes | 3 | ||||
86194 | Olympus | AL-2000 | Wafer Inspection Microscope | 200 mm | 1 | as is where is | immediately | |
87492 | OLYMPUS | BH-BHM | Wafer Inspection Microscope | 150 mm | 1 | as is where is | immediately | |
91538 | OLYMPUS | BH3-MJLA4-383D | HIGH POWER SCOPE | N/a | 01.06.1995 | 1 | as is where is | |
91539 | OLYMPUS | MX80 AF-F | Microscope inspection station | 150 / 200 mm | 1 | as is where is | immediately | |
91540 | Olympus | Olympus AL3120F | MICROSCOPE (ASYST300FL - 2L/P) | 300 mm | 1 | as is where is | ||
91541 | Olympus | Olympus AL3120F | MICROSCOPE (TAS300(E3)- 2L/P) | 300 mm | 1 | as is where is | ||
91542 | Olympus | Olympus AL3120F | MICROSCOPE (TAS300(E3)- 2L/P) | 300 mm | 01.06.2003 | 1 | as is where is | |
91543 | Olympus | Olympus AL3120F | MICROSCOPE (TAS300(E3) - 3L/P) | 300 mm | 01.06.2004 | 1 | as is where is | |
91544 | Olympus | Olympus AL3120F-DUV | MICROSCOPE (TAS300 - 2L/P) | 300 mm | 01.06.2003 | 1 | as is where is | |
91545 | Olympus | Olympus AL3120F-DUV-EL | MICROSCOPE (ASYST300FL - 2L/P) | 300 mm | 01.06.2002 | 1 | as is where is | |
91546 | Olympus | Olympus AL3130F | MICROSCOPE (KWF12 - 3L/P) | 300 mm | 01.06.2005 | 1 | as is where is | |
91547 | Olympus | Olympus AL3130F | MICROSCOPE (KWF12 - 3L/P) | 300 mm | 01.06.2005 | 1 | as is where is | |
91548 | Olympus | Olympus AL3130F | MICROSCOPE (KWF12 - 3L/P) | 300 mm | 01.06.2005 | 1 | as is where is | |
91549 | Olympus | Olympus AL3130F | MICROSCOPE (KWF12 - 3L/P) | 300 mm | 01.06.2006 | 1 | as is where is | |
91550 | Olympus | Olympus AL3130F | MICROSCOPE (TAS300(E4) - 3L/P) | 300 mm | 01.06.2007 | 1 | as is where is | |
91551 | Olympus | Olympus AL3130F | MICROSCOPE (TAS300(E4) - 3L/P) | 300 mm | 01.06.2007 | 1 | as is where is | |
92820 | Olympus | BHMJL | Microscope (Metrology) | 150 mm | 1 | as is where is | ||
92821 | Olympus | BHMJL | Microscope (Metrology) | 150 mm | 1 | as is where is | ||
95118 | OLYMPUS | MX-610 | Microscope | 200mm - 300mm | 1 | 3 months | ||
96371 | Olympus | MX61L | Wafer Inspection Microscope | 300 mm | 01.01.2013 | 1 | as is where is | immediately |
96372 | Olympus | MX51 | Wafer Inspection Microscope | 150 mm | 1 | as is where is | immediately | |
98970 | Olympus | Olympus AL3120F-DUV | MICROSCOPE (TAS300 - 2L/P) | 300 mm | 01.06.2003 | 1 | as is where is | |
101975 | Olympus | AL3100 | Microscope Inspection Station | 300mm | 1 | as is where is | ||
102839 | Olympus | MX61-L | Inspection Microscope | 300 mm | 1 | as is where is | immediately | |
76711 | OLYMPUS / ZEISS | AL100 / AXIOTRON | MICROSCOPE INSPECTION STATION | 200 mm | 01.12.1996 | 1 | as is where is | immediately |
76712 | OLYMPUS / ZEISS | AL100 / AXIOTRON | MICROSCOPE INSPECTION STATION | 200 mm | 01.12.1996 | 1 | as is where is | immediately |
76713 | OLYMPUS / ZEISS | AL100 / AXIOTRON | MICROSCOPE INSPECTION STATION | 200 mm | 01.12.1996 | 1 | as is where is | immediately |
76714 | OLYMPUS / ZEISS | AL100 / AXIOTRON | MICROSCOPE INSPECTION STATION | 200 mm | 01.12.1996 | 1 | as is where is | immediately |
76715 | OLYMPUS / ZEISS | AL100 / AXIOTRON | MICROSCOPE INSPECTION STATION | 200 mm | 01.12.1996 | 1 | as is where is | immediately |
76716 | OLYMPUS / ZEISS | AL100 / AXIOTRON | MICROSCOPE INSPECTION STATION | 200 mm | 01.12.1996 | 1 | as is where is | immediately |
76717 | OLYMPUS / ZEISS | AL100 / AXIOTRON | MICROSCOPE INSPECTION STATION | 200 mm | 01.12.1996 | 1 | as is where is | immediately |
76718 | OLYMPUS / ZEISS | AL100 / AXIOTRON | MICROSCOPE INSPECTION STATION | 200 mm | 01.12.1996 | 1 | as is where is | immediately |
76719 | OLYMPUS / ZEISS | AL100 / AXIOTRON | MICROSCOPE INSPECTION STATION WITH AUTOLOADER | 200 mm | 01.12.1996 | 1 | as is where is | immediately |
76720 | OLYMPUS / ZEISS | AL100 / AXIOTRON | MICROSCOPE INSPECTION STATION WITH AUTOLOADER | 200 mm | 01.12.1996 | 1 | as is where is | immediately |
76721 | OLYMPUS / ZEISS | AL100 / AXIOTRON | MICROSCOPE INSPECTION STATION WITH AUTOLOADER | 200 mm | 01.12.1996 | 1 | as is where is | immediately |
76722 | OLYMPUS / ZEISS | AL100 / AXIOTRON | MICROSCOPE INSPECTION STATION WITH AUTOLOADER | 200 mm | 01.12.1996 | 1 | as is where is | immediately |
76723 | OLYMPUS / ZEISS | AL100 / AXIOTRON | MICROSCOPE INSPECTION STATION WITH AUTOLOADER | 200 mm | 01.12.1996 | 1 | as is where is | immediately |
100233 | Oxford | X-Strata980 | X-ray Fluorescence Spectrometer | 01.06.2010 | 1 | as is where is | ||
83940 | Philips | CM30 | Scanning Transmission Electron Microscope (TEM) | Laboratory | 01.06.1992 | 1 | as is where is | immediately |
97003 | Philips | PHI 680 | Auger Nanoprobe | Laboratory | 01.06.1998 | 1 | as is where is | immediately |
103115 | Philips | PW2830 | X-ray Fluorescence Spectrometer | 300mm | 01.06.2004 | 1 | as is where is | |
103116 | Philips | PW2830 | X-ray Fluorescence Spectrometer | 300mm | 01.06.2003 | 1 | as is where is | |
95011 | PHILLIPS | IMPULSE 300B | Thin-film measurement | 200 MM / 300 MM | 01.06.2004 | 1 | as is where is | |
98929 | Phillips | TreX 610 | X-ray Fluorescence Spectrometer | 1 | as is where is | |||
91869 | PLASMOS | SD2000 | Automatic Ellipsometer | 200 mm | 1 | inquire | immediately | |
99429 | Plasmos | SD 2004 | Multi-Wavelength Ellipsometer | 200 mm | 1 | as is where is | immediately | |
78159 | Plasmos / Yvon Jobin /Philips Analytical | SD2000 | Laser Ellipsometer | 200 mm | 01.08.2000 | 1 | as is where is | immediately |
31246 | PMS | Liquitrack 776200 | Non volatile residual Monitor | facilities | 01.11.1999 | 1 | as is where is | immediately |
98424 | Quantronix | DRS 820 | Inspection System | 150 mm | 3 | as is where is | ||
87792 | QVI | 600XP | Process Control & Measurement | 1 | as is where is | |||
91552 | RAYTEX | RXW-800 | EDGE SCAN | 200 mm | 01.06.2008 | 1 | as is where is | |
98489 | Raytex | RXW-0826SFIX-SMIF | edge scanner | 200mm | 1 | as is where is | ||
79216 | ReVera | VeraFlex | X-Ray Photoelectron Spectroscopy | 300 mm | 01.06.2008 | 1 | inquire | |
97733 | ReVera | RVX1000 | Film Thickness Measurement System | 300 mm | 1 | as is where is | ||
97734 | ReVera | RVX1000 | Film Thickness Measurement System | 300 mm | 1 | as is where is | ||
102378 | Revera | RVX5000 | X-Ray Photo-electron Spectroscopy (XPS) | 300 mm | 01.06.2006 | 1 | as is where is | |
34320 | Rigaku | 3640 | X-Ray Wafer Analyzer | 200mm | 1 | as is where is | immediately | |
35595 | RIGAKU | 3630 (For spares use) | Xray Fluorescence Wafer/Disk Analyzer, Missing Xray Tube | 01.06.1997 | 1 | as is where is | immediately | |
71780 | Rigaku | TXRF 300S | X-Ray Diffractometer | 150mm to 300 mm | 01.01.2001 | 1 | as is where is | immediately |
79217 | Rigaku | MFM65 | XRR/XRF | 300 mm | 01.06.2009 | 1 | inquire | |
82910 | RIGAKU | 3630 | Wafer Inspection Equipment | 200 | 01.06.1996 | 1 | as is where is | immediately |
83519 | Rigaku | 3640 | X-ray fluoresence wafer / disk analyzer | 200 mm | 01.06.2000 | 1 | as is all rebuilt | immediately |
87823 | Rigaku | MFM65 | X-ray inspection (For Cu and Au quantification) | 300 MM / 200 mm | 01.10.2007 | 1 | as is where is | immediately |
91554 | RIGAKU | XRF3630 | Wafer/ Disk Analyzer | 1 | as is where is | |||
91555 | RIGAKU | XRF3630 | Wafer/ Disk Analyzer | 1 | as is where is | |||
91556 | RIGAKU | XRF3630 | Wafer/ Disk Analyzer | 1 | as is where is | |||
91557 | RIGAKU | XRF3640 (Handle include) | Wafer/ Disk Analyzer | 200 mm | 01.06.1995 | 1 | as is where is | |
91558 | RIGAKU | XRF3640 (Handle not include) | Wafer / Disk Analyzer / XRF | 200 mm | 01.06.1998 | 1 | as is where is | immediately |
92691 | Rigaku | MFM65 | In-Line Energy Dispersive X-Ray Fluoresence Wafer Inspection System | 300 mm | 01.06.2008 | 1 | as is where is | immediately |
93104 | RIGAKU | 3640 | X-Ray fluorescence wafer / Disk analyzer (AL,Fe,Ni,Si,Pt,Cr ) | 125 mm | 01.06.1999 | 1 | as is where is | |
96900 | Rigaku | MFM310 | X-ray Reflectivity (XRR) | 300 mm | 1 | as is where is | ||
99430 | Rigaku | 3640 | X-Ray Fluorescence Wafer/Disk Analyzer | 200 mm | 1 | as is where is | immediately | |
101802 | Rigaku | XRF3640 | Metal thickness measurement | 200 mm | 1 | inquire | ||
102347 | Rigaku | 3272 | TXRF (X-Ray Fluorescence) | 300 mm | 01.06.2005 | 1 | as is where is | |
102348 | Rigaku | SYS3630 | XRF (X-Ray Fluorescence) | 200 mm | 01.06.1996 | 1 | as is where is | |
102350 | Rigaku | TXRF3750 | TXRF (X-Ray Fluorescence) | 200 mm | 01.06.1999 | 1 | as is where is | |
102351 | RION | KS-40AF | Particle Measurement | 300 mm | 01.06.2007 | 1 | as is where is | |
72034 | RUDOLPH | MP200 | METROLOGY | 200 mm | 01.06.2000 | 1 | as is where is | immediately |
91116 | RUDOLPH | MP200 XCu | Thin Film Measurement | 200 mm | 01.06.2001 | 1 | as is where is | |
91559 | RUDOLPH | AXL_S | Macro Inspection System | 300 mm | 01.06.2005 | 1 | as is where is | |
91560 | RUDOLPH | AXL_S | Macro Inspection System | 300 mm | 01.06.2005 | 1 | as is where is | |
91561 | RUDOLPH | AXL_S | Macro Inspection System | 300 mm | 01.06.2006 | 1 | as is where is | |
91562 | RUDOLPH | MP1 300 | Film thickness measurement | 300 mm | 01.06.2013 | 1 | as is where is | |
91563 | RUDOLPH | Meta Pulse | Film Metrology | 200 mm | 01.06.2005 | 1 | as is where is | |
91564 | RUDOLPH | Meta Pulse 200 | Film Metrology | 200 mm | 1 | as is where is | ||
91565 | RUDOLPH | MP1 300 | Film Metrology | 300 mm | 1 | as is where is | ||
91566 | Rudolph | WS3840 | 3D Bump Metrology | 300 mm | 01.06.2010 | 1 | as is where is | immediately |
91567 | RUDOLPH | META PULSE 200 | Surface Film Metrology | 200 mm | 01.06.2002 | 1 | as is where is | immediately |
92709 | Rudolph | WV320 | MACRO INSPECTION | 300 MM | 01.06.2006 | 1 | as is where is | immediately |
92710 | Rudolph | WV320 | MACRO INSPECTION | 300 MM | 01.06.2006 | 1 | as is where is | |
94478 | RUDOLPH | FE-3 | Focus Ellipsometer | 200 mm | 1 | as is where is | ||
94479 | RUDOLPH | FE-4D | Focus Ellipsometer | 200 mm | 1 | as is where is | ||
95619 | Rudolph | WV320 | MACRO INSPECTION | 300 MM | 01.06.2006 | 1 | as is where is | immediately |
95621 | RUDOLPH | WV320 | Metrology | 300mm | 1 | as is where is | immediately | |
97030 | RUDOLPH | METAPULSE-200 | Thick Film Measurement | 200 mm | 01.06.2000 | 1 | as is where is | |
97031 | RUDOLPH | METAPULSE-III 300XCU | Thick Film Measurement | 300 mm | 01.06.2011 | 1 | as is where is | |
97965 | RUDOLPH | NSX320 | MACRO DEFECT INSPECTOR | 300 MM | 1 | inquire | ||
97966 | RUDOLPH | WHS | MACRO DEFECT INSPECTOR | 300 MM | 1 | inquire | ||
98171 | Rudolph | NSX105C | Macro Inspection | 200 mm | 01.06.2007 | 1 | as is where is | |
98296 | RUDOLPH | Meta Pulse 300 | Film thickness measurement | 300 mm | 1 | as is where is | ||
98297 | RUDOLPH | Meta Pulse 300 | Film thickness measurement | 300 mm | 1 | as is where is | ||
98298 | RUDOLPH | MP1-300 | Film thickness measurement | 300 mm | 01.06.2007 | 1 | as is where is | |
98493 | Rudolph | MP200 | Cu Film thickness measurement | 200mm | 1 | as is where is | immediately | |
98494 | Rudolph | MP300 | Cu Film thickness measurement | 300mm | 2 | as is where is | immediately | |
98835 | RUDOLPH | AXI-S | Macro Wafer Inspection | 300 mm | 01.07.2004 | 1 | as is where is | immediately |
98836 | RUDOLPH | AXI-S930B | Macro Defect Inspection System | 300 mm | 01.02.2007 | 1 | as is where is | |
98837 | RUDOLPH | MP1-300XCU | Film Thickness Measurement System | 300 mm | 01.05.2008 | 1 | as is where is | immediately |
98838 | RUDOLPH | S3000A | focused beam ellipsometry | 300 mm | 01.06.2012 | 1 | as is where is | |
99035 | RUDOLPH | AXI-S | Macro Wafer Inspection | 01.03.2004 | 1 | as is where is | ||
99036 | RUDOLPH | AXI-S | Macro Defect Inspection System | 01.05.2003 | 1 | as is where is | ||
99037 | RUDOLPH | S3000A | focused beam ellipsometry | 01.05.2012 | 1 | as is where is | ||
100928 | RUDOLPH | AXI-S | Macro Inspection System | 300 mm | 01.06.2003 | 1 | as is where is | |
100929 | RUDOLPH | FE-7 | Ellipsometer | 200 mm | 01.06.1996 | 1 | as is where is | |
100930 | RUDOLPH | MP300 | Film thickness measurement | 200 mm | 01.06.2007 | 1 | as is where is | |
100931 | RUDOLPH | MP300 | Film thickness measurement | 200 mm | 01.06.2009 | 1 | as is where is | |
100932 | RUDOLPH | S3000A | Focused Beam Ellipsometer | 200 mm | 01.06.2012 | 1 | as is where is | |
101348 | Rudolph | Auto EL | Elipsometer | 150mm | 1 | as is where is | ||
101349 | Rudolph | FE III | Ellipsometer | 1 | as is where is | |||
101491 | Rudolph | NSX 105 | Macro-Defect Inspection System | 200mm | 1 | as is where is | ||
101492 | Rudolph | NSX 105 | Macro-Defect Inspection System | 200mm | 1 | as is where is | ||
101493 | Rudolph | NSX 105 | Macro-Defect Inspection System | 200mm | 1 | as is where is | ||
101494 | Rudolph | NSX 105 | Macro-Defect Inspection System | 200mm | 1 | as is where is | ||
101495 | Rudolph | NSX 105 | Macro-Defect Inspection System | 200mm | 1 | as is where is | ||
101496 | Rudolph | NSX 105 | Macro-Defect Inspection System | 200mm | 1 | as is where is | ||
101594 | RUDOLPH | AXI-S | Macro Wafer Inspection | 300 mm | 01.07.2004 | 1 | as is where is | |
101595 | RUDOLPH | AXI-S930B | Macro Wafer Inspection | 300 mm | 01.08.2005 | 1 | as is where is | |
101596 | RUDOLPH | AXI-S930B | Macro Wafer Inspection | 300 mm | 01.06.2007 | 1 | as is where is | |
101597 | RUDOLPH | MP1-300 | Film Thickness Measurement System | 300 mm | 01.06.2007 | 1 | as is where is | |
101598 | RUDOLPH | S3000A | Focused Beam Ellipsometer | 300 mm | 01.05.2005 | 1 | as is where is | |
101803 | Rudolph | AXI-935 | Macro Defect Inspection System | 300 mm | 01.06.2007 | 1 | inquire | |
101804 | Rudolph | FE-Ⅳ | Thickness Measurement | 200 mm | 01.04.1995 | 1 | inquire | |
101805 | Rudolph | FE-Ⅶ | Thickness Measurement | 200 mm | 01.04.2002 | 1 | inquire | |
101806 | Rudolph | NSX-105 | Macro Defect Inspection System | 200 mm | 01.06.2008 | 2 | inquire | |
102355 | Rudolph | 3Di8500 | Wafer Inspection | 300 mm | 01.06.2008 | 1 | as is where is | |
102356 | Rudolph | Axi-S | Macro inspection | 300 mm | 01.06.2005 | 1 | as is where is | |
102357 | Rudolph | NSX105 | Macro Defect Inspection System | 01.06.2008 | 1 | as is where is | ||
102358 | Rudolph | NSX115 | Macro Defect Inspection System | 300 mm | 01.06.2009 | 1 | as is where is | |
102359 | Rudolph | NSX115 | Macro Defect Inspection System | 300 mm | 01.06.2009 | 1 | as is where is | |
102360 | Rudolph | NSX115 | Macro Defect Inspection System | 300 mm | 01.06.2010 | 1 | as is where is | |
102361 | Rudolph | S300 | Spectroscopic Reflectometer | 300 mm | 1 | as is where is | ||
102363 | Rudolph | S3000S | Focused Beam Ellipsometer | 300 mm | 01.06.2011 | 1 | as is where is | |
102364 | Rudolph | S3000SX | Focused Beam Ellipsometer | 300 mm | 01.06.2011 | 1 | as is where is | |
102365 | Rudolph | WV320 | Macro inspection | 300 mm | 01.06.2005 | 1 | as is where is | |
102366 | Rudolph | WV320 | Macro inspection | 300 mm | 01.06.2005 | 1 | as is where is | |
102367 | Rudolph | WV320 | Macro Defect inspection | 300 mm | 01.06.2005 | 1 | as is where is | |
102368 | Rudolph | WV320 | Macro inspection | 300 mm | 1 | as is where is | ||
102369 | Rudolph | WV320 | Macro Defect inspection | 300 mm | 01.06.2005 | 1 | as is where is | |
102370 | Rudolph | WV320 | Macro inspection | 300 mm | 1 | as is where is | ||
102371 | Rudolph | WV320 | Macro inspection | 300 mm | 1 | as is where is | ||
102372 | Rudolph | WV320 | Macro Defect inspection | 300 mm | 01.06.2007 | 1 | as is where is | |
102373 | Rudolph | WV320 | Macro Defect inspection | 300 mm | 01.06.2007 | 1 | as is where is | |
102374 | Rudolph | WV320 | Macro Defect inspection | 300 mm | 1 | as is where is | ||
102375 | Rudolph | WV320 | Macro inspection | 300 mm | 01.06.2005 | 1 | as is where is | |
102376 | Rudolph | WV320 | Macro Defect inspection | 300 mm | 1 | as is where is | ||
102377 | Rudolph | WV320 | Macro inspection | 300 mm | 1 | as is where is | ||
70089 | Rudolph Technologies | FE-VII | Ellipsometer | 200 mm | 01.06.1996 | 1 | as is where is | immediately |
88629 | Rudolph/August | NSX105 | Macro Inspection | 200 MM | 01.06.2004 | 1 | as is where is | |
88630 | Rudolph/August | NSX105 | Macro Inspection | 200 MM | 01.06.2003 | 1 | as is where is | |
101673 | RVSI | WS-3800 | 2D/3D Automated Optical Inspection System | 200 mm | 1 | as is where is | ||
91875 | SDI | SPV-300 | Surface Photo Voltage Tester for up to 300mm Wafers | up to 300 mm | 01.06.1997 | 1 | as is where is | immediately |
102894 | SDI | SPV-1050 | Contamination Monitoring System | 200 mm | 01.06.1996 | 1 | as is where is | |
91873 | SDI / Semilab | FAaST-330 | Dielectric Characterization Tool with COCOS & Epi-t for up to 300mm Wafers | up to 300 mm | 01.06.1999 | 1 | as is where is | immediately |
91117 | SEIKO | CHIPS-200 | metrology system | 200 mm | 1 | as is where is | ||
102379 | Seiko Instruments | Xvision 300DB | Fib-SEM | 300 mm | 1 | as is where is | immediately | |
86199 | SEIKO SEIKI | SMI2200 | SEM | 200 mm | 1 | as is where is | ||
91118 | SELA | MC100 | metrology system | 200 mm | 1 | as is where is | ||
91119 | SELA | MC500 | metrology system | 200 mm | 1 | as is where is | ||
102951 | SELA | EM3i | Saw for TEM sample preparation | ASSEMBLY | 01.06.2011 | 1 | as is where is | |
82911 | Semiconductor Diagnostics | 3030 | Surface Profiler | 200 | 01.06.2012 | 1 | as is where is | immediately |
100747 | Semilab | WT-2000PVN | Carrier Lifetime Measurement System | 1 | as is where is | immediately | ||
102381 | Semilab | PS-2000 | Ellipsometric Porosimeter | 01.06.2015 | 1 | as is where is | ||
102382 | Semilab | SPVCMS4000 | Surface Charge Measurement | 200 mm | 01.06.1995 | 1 | as is where is | |
89974 | Semix | Tazmo SOG TR817UD-TM | 150mm SOG | 150mm | 1 | as is where is | ||
95377 | Sheffield | Endeavor | Coordinate Measurement Machine | 9.12.7 | 1 | as is where is | immediately | |
97877 | Siemens | 3 DIMESION MEA | FAB-METROLOGY | 01.06.2006 | 1 | as is where is | ||
74946 | Sonoscan | D6000 | C-Sam | 01.05.1996 | 1 | as is where is | immediately | |
83703 | SOPRA | SE 200 | Ellipsometer | 200 mm | 1 | as is where is | ||
102394 | SOPRA | EP12 | Optical Dielectric Porosity Measurement System (300mm) | 300 mm | 1 | as is where is | ||
91877 | SSM | 470i | CV Plotter | 1 | inquire | |||
98012 | SSM | SSM 6100 | CV IMPLANT-CV CURVES | 300 mm | 01.06.2000 | 1 | as is where is | |
89975 | TecHarmonic | EHTVS | Water Scrubber | 1 | as is where is | |||
101356 | Technos | TREX610T | Total Reflection X-Ray Flourescence Spectrometer | 150mm | 1 | as is where is | ||
101503 | Technos | TVD-900 ICP-MS | Spectrometer | 1 | as is where is | |||
77049 | Tecnai | TF20 | TEM Refurbished | 01.06.2001 | 1 | as is where is | immediately | |
33722 | TENCOR | AlphaStep 300 | Profilometer | 1 | inquire | |||
61012 | THERMA-WAVE | OP 2600B | OPTI-PROBE | 200mm | 01.01.1997 | 1 | as is where is | immediately |
98438 | Thermawave | OP 5340 | Inspection System | 150/200/300 mm | 1 | as is where is | ||
98935 | Thermawave | TP 630 | Ion Implant Measurement System | 1 | as is where is | |||
99874 | Thermawave | OP2600 | Film Thickness | 150 mm | 01.05.1995 | 1 | inquire | |
101809 | Thermawave | OP-2600 | thickness measurement System | 200 mm | 1 | inquire | ||
101810 | Thermawave | ThrmaProbe-420 | Lattice Defects measurement | 200 mm | 01.06.1999 | 1 | inquire | |
91569 | Thermo Fisher | ECO 1000 | FTIR System | 200 mm | 01.06.2000 | 1 | as is where is | immediately |
98905 | THERMO-FISHER | ECO3000 | Spectrometer FT-IR | 300 mm | 01.06.2005 | 1 | as is where is | |
91570 | Toray | SP-500w | Bump Height Measurement | 300 mm | 01.06.2010 | 1 | as is where is | |
97887 | TOYO | SE-4000 | Roughness Measurement | 01.06.2008 | 1 | as is where is | ||
102456 | TSK / Accretech | Win-Win 50 1600 | Bright Field Inspection | 300 mm | 1 | as is where is | ||
102457 | TSK / Accretech | Win-Win 50 1600 | Bright-Field Inspection | 300 mm | 01.06.2005 | 1 | as is where is | |
102458 | TSK / Accretech | Win-Win 50 1600 | Bright Field Inspection | 300 mm | 01.06.2005 | 1 | as is where is | |
102459 | TSK / Accretech | Win-Win 50 1600 | Bright Field Inspection | 300 mm | 1 | as is where is | ||
88284 | Veeco | Dimension 7000 | Atomic Force Microscope (AFM) | 200mm | 1 | as is where is | ||
88375 | Veeco | D9000 | Atomic Force Microscope | 200 mm | 01.06.1997 | 1 | as is where is | immediately |
88631 | Veeco | Dimension X3D | Model 340 Atomic Force Microscope | 300 MM | 01.06.2006 | 1 | as is where is | immediately |
96382 | Veeco | D9000 | Atomic Force Microscope | 200 mm | 01.06.2001 | 1 | as is where is | immediately |
96383 | Veeco | D9000 | Atomic Force Microscope | 200 mm | 01.06.2001 | 1 | as is where is | immediately |
96404 | Veeco | NT3300 | Non Contact Profilometer | 6 or 8 inch | 01.01.2004 | 1 | as is all rebuilt | immediately |
97839 | Veeco | Dimension X1D | Atomic Force Microscope (AFM) | 300 mm | 1 | as is where is | ||
97840 | Veeco | Dimension X1D | Atomic Force Microscope (AFM) | 300 mm | 1 | as is where is | ||
98373 | VEECO | V220SI | METRO | 200 mm | 01.06.2002 | 1 | inquire | |
102461 | Veeco | Dimension X1D | ATOMIC FORCE MICROSCOPE (AFM) | 300 mm | 01.06.2004 | 1 | as is where is | |
102462 | Veeco | Dimension X3D | Atomic Force Microscope (AFM) | 300 mm | 01.06.2004 | 1 | as is where is | |
102463 | Veeco | Dimension X3D | ATOMIC FORCE MICROSCOPE (AFM) | 300 mm | 01.06.2006 | 1 | as is where is | |
102464 | Veeco | NT9800 | Optical Profiling System | 01.06.2010 | 1 | as is where is | ||
102465 | Veeco | V220SI | Surface Profile Measurement | 1 | as is where is | |||
103136 | Veeco | Dimension Vx340 | Atomic Force Profiler (AFP) | 300mm | 01.06.2003 | 1 | as is where is | |
103182 | Veeco | Dimension 3100 | Atomic Force Microscope | 150 mm | 01.06.2017 | 1 | inquire | |
95009 | WOOLAM | HS-190 | Scanning Monochromator | 200 MM | 1 | as is where is | ||
93087 | Woollam | VUV-VASE (Gen II) | Ellipsometer | 300 MM | 1 | as is where is | immediately | |
34091 | Wyko | NT 2000 | Optical Profiling system | 200 MM | 1 | inquire | immediately | |
38870 | Wyko | NT1100 | Optical Profiling system | 1 | as is where is | 2 weeks | ||
66762 | WYKO | HD 2000 | DPC Video Scope | 1 | as is where is | immediately | ||
71792 | WYKO | NT3300 | Optical 3D profiling system | 1 | ||||
96646 | WYKO | NT3300 | Profilometer | 200mm | 1 | as is all rebuilt | immediately | |
98217 | YesTech | YTV-B3 AOI | Automated Optical Inspection System | 01.06.2008 | 1 | as is where is | immediately | |
86716 | ZEISS | Axiotron | Wafer inspection microscope | 1 | as is where is | immediately | ||
91388 | Zeiss | AXIOTRON | INSPECTION MICROSCOPE | 1 | as is where is | |||
91389 | Zeiss | AXIOTRON | INSPECTION MICROSCOPE | 1 | as is where is | |||
91390 | Zeiss | AXIOTON | High Perpomance MICRO SCOPE | N/a | 01.06.2008 | 1 | as is where is | |
97108 | Zeiss | Axiotech 100 HD | Inspection Microscope | Assembly | 1 | as is where is | immediately | |
97610 | Zeiss | Axiotron 300 | Microscope | 300 mm | 1 | as is where is | ||
98211 | Zeiss | Ultra 55 | FA SEMs/TEMs/Dual Beams | 1 | inquire |