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Pre-owned Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com

Please find below a list of Used Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com .Click on any listed item of Fab Metrology , Inspection and QC Equipment to see further data.


SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
106952 ACCENT (Nanometrix, BioRad) QS2200M FTIR Spectrometer for Epi, SiN, BPSG & CO Measurement, up to 200mm Wafers 100-200 MM 01.11.2000 1 as is where is immediately
105792 Accretech Tiger/ww50 1600 Bright-Field Inspection 300 mm 1 as is where is
105793 Accretech Win-Win 50 1600 Bright-Field Inspection 300 mm 1 as is where is
105794 Accretech Win-Win 50 1600 Bright-Field Inspection 300 mm 1 as is where is
105795 Accretech Win-Win 50 1600 Bright-Field Inspection 300 mm 1 as is where is
91841 ADE Episcan 1000 FT-IR Spectromter for measurement of Epitaxial films 100-200 mm 1 inquire immediately
92686 ADE FIT3120 PARTICLE COUNTER 300 mm 1 as is where is
97846 ADE NANOMAPPER SQM 300 mm 31.05.2001 1 as is where is
102631 ADE 9500 Wafer flatness measurement system with ASC1000 200 mm 1 inquire
102632 ADE 9500 Wafer flatness measurement system with ASC2500 200 mm 1 inquire
103225 ADE NanoMapper FA Nano-Defects Inspection System 300 mm 1 inquire immediately
101393 Agilent 7500a ICP Mass Spectrometer Laboratory 1 as is where is immediately
102974 AGILENT 4155C SEMICONDUCTOR PARAMETER ANALYZER 200 MM 1 as is where is
84360 Alcatel 925-40 Leak Detector 1 as is where is immediately
83514 Applied Materials Opal 7830i Enhanced CD-SEM 100 mm to 200 mm 01.05.1997 1 as is where is immediately
86422 Applied Materials Orbot WF720 Wafer inspection system 125 mm 1 as is where is
90947 Applied Materials UVision 4 Bright field inspection 300 mm 31.05.2009 1 as is where is
92045 Applied Materials UV 5 Wafer Inspection System 300 mm 31.05.2012 1 as is where is immediately
92800 Applied Materials Orbot WF720 Metrology (Metrology) 125 mm 1 as is where is
93395 Applied Materials UVision 3 Wafer Inspection System 200 mm 1 as is where is immediately
98084 Applied Materials UVision 5 Brightfield UV Wafer Inspection System 300 mm 31.05.2011 1 as is where is
98085 Applied Materials UVision 5 Brightfield UV Wafer Inspection System 300 mm 31.05.2012 1 as is where is
102100 Applied Materials NanoSEM 3D CD Metrology 300 mm 31.05.2002 1 as is where is immediately
102101 Applied Materials NanoSEM 3D CD SEM 300 mm 31.05.2002 1 as is where is immediately
102103 Applied Materials NanoSEM 3D Scanning Electron, CDSEM Measurement 300 mm 31.05.2004 1 as is where is
102104 Applied Materials NanoSEM 3D Scanning Electron, CDSEM Measurement 300 mm 31.05.2004 1 as is where is
102105 Applied Materials NanoSEM 3D Scanning Electron, CDSEM Measurement 300 mm 31.05.2004 1 as is where is
102986 Applied Materials Uvision 600SP Brightfield Inspection System 300 mm 31.05.2008 1 as is where is
105797 Applied Materials Uvision 200 Bright-Field Inspection 300 mm 1 as is where is
106078 Applied Materials SEMVISION G3 SEM 300 mm 01.05.2005 1 as is where is immediately
106289 APPLIED MATERIALS UVISION 5 Bright Field Inspection 300 mm 01.06.2013 1 as is where is immediately
106350 Applied Materials Uvision 200 Wafer Inspection 300 mm 01.06.2006 1 as is where is
101427 ASML YieldStar S-200B Overlay Measurement System 300mm 31.01.2011 1 as is where is
103070 ASML YieldStar S-250 Overlay Measurement System 300mm 1 as is where is
91387 AUGUST CV-9812 Wafer Carrier inspection tool 1 as is where is immediately
98447 August 3DI-8000 wafer bump inspection 300mm 1 as is where is immediately
98448 August NSX-95 2D Auto inspection system / Macro defect inspection system 200 mm 4 as is where is immediately
101818 August NSX105 Wafer Bumping Inspection System / Macro defect inspection 200mm 1 inquire
106336 August / Rudolph Technologies CV9812 Wafer Carrier inspection tool 1 as is where is immediately
95016 Bio-Rad Q8 Overlay Metrology 1 as is all rebuilt 1 month
99405 Bio-Rad Q5 (Upgrade to a Q6) Overlay Registration Tool up to 200 mm 2 as is where is immediately
99406 Bio-Rad Q7/Q8 Overlay metrology Tool 150 mm-200 mm 01.05.1997 1 as is where is immediately
99407 Bio-Rad QS-1200 FT-IR Spectrometer 100-200 mm 31.05.2004 1 as is where is immediately
99409 Bio-Rad QS-408M Manual FT-IR Spectrometer 100-200 mm 1 as is where is immediately
102587 Bio-Rad QS-300 FT-IR Spectrometer 1 as is where is immediately
33671 BIORAD Q5 Overlay Metrology Tool 200 mm 2 as is where is immediately
97995 Biorad Q5 Overlay measurement system 150mm 1 as is where is
106642 BROOKS METARA 7200 Overlay 200 mm 01.06.1996 1 as is where is
97850 Bruker DEKTAK-8ADP Scan Profiler 1 as is where is
102149 Bruker Insight 3D Mask House Photomask Inspection 300 mm 31.05.2017 1 as is where is
101769 Cambridge Scientific S360 SEM with EDS 1 as is where is immediately
95610 Cameca TXRF 8300 Automated TXRF with Specimen Chamber and Wafer Handling 300 mm 31.05.2007 1 as is where is immediately
103221 Cameca IMS 5FE7 Secondary Ion Mass Spectrometry System 1 as is where is immediately
106645 CAMECA EX300 Secondary Ion Mass Spectrometer 300 mm 1 as is where is
102151 Camtek X- ACT TEM Sample Preparation System 31.05.2012 1 as is where is
100723 Canon PLA501 Contact and Prossimity Mask Aligner 1 as is where is
102164 Carl Zeiss Axiotron-2 Microscope 200 mm 1 as is where is
102165 Carl Zeiss Axiotron-2 Micro scope 200 mm 1 as is where is
102167 Carl Zeiss Axiotron-2 Microscope 200 mm 1 as is where is
107017 Creative Design Engineering (CDE) ResMap 178 Resistivity Mapping System Up to 200 mm 01.06.2012 1 as is where is immediately
106647 CYBER OPTICS CYBERSCAN C212/110 Laser Measure 200 mm 1 as is where is
103152 Dektak 3030 Profiler 1 inquire
100728 Delta Tech. GM SSR AX-PC/GM-1D X-Ray 31.05.2010 1 as is where is
102589 E+H MX 203-6-33 Wafer Bow Measurement System 100 - 150 mm 31.05.2008 1 as is where is immediately
106200 EDAX Eagle 2 Micro-probe EDX analyser Laboratory 01.06.2000 1 as is where is immediately
89978 Edwards IPX-500 Dry Pump 1 as is where is
92213 ESCO EMD-WA1000S Temperature Desorption Analyzer 200mm 31.05.2000 1 as is where is
100938 ESMO Hermes Testhead Manipulator Test 31.05.2006 3 as is where is immediately
79226 FEI DB 235 Dual Beam FIB SEM 01.06.2000 1 inquire
86292 FEI F30 Technai FIB SEM 1
86294 FEI DB 835 FIB SEM 1
86300 FEI Nova nano 230 FIB SEM 1 inquire immediately
92040 FEI TF30 Super twin 30.09.2007 1 as is all rebuilt immediately
92713 FEI Dual beam 820 FIB SEM 200 mm 01.05.1997 1 as is where is immediately
93961 FEI Altura Dual beam FIB 31.12.2003 1 as is where is immediately
96041 FEI Helios Nanolab 400 FIB SEM 100 mm 31.05.2008 1 inquire
101711 FEI Helios 450S Dual Beam FIB-SEM 1 inquire
101712 FEI Strata 400 Focused Ion Beam System 1 inquire
103002 FEI 200XP Focus Ion Beam System 31.05.2005 1 as is where is
103436 FEI Tecnai G2 F30 TEM electron microscope Laboratory 01.05.2005 1 as is where is immediately
106964 FEI Strata 400 Dual Beam FIB SEM Laboratory 01.06.2006 1 as is where is immediately
107000 FEI Sirion FE SEM with e-beam lithography capability and EDX up to 2.5 inch diameter 01.06.2002 1 as is where is immediately
86235 FEI Company 820 Dual Bem Fib SEM 200 mm 1 as is where is immediately
101441 FEI Company Tecnai G2 F30 TEM Laboratory 1 as is where is immediately
106239 FEI Company 820 Dual Column Focused Ion Beam Laboratory 01.01.1993 1 as is where is immediately
107024 Four Dimensions CV Map 92A Mercury probe CV Plotting System up to 200 mm 01.04.2014 1 as is where is immediately
55974 FRONTIER FSM900TC-VAC FILM STRESS AND WAFER BOW MEASUREMENT 200 mm 30.04.2000 1 as is where is immediately
90155 FSM FSM 500TC THIN FILM STRESS MEASUREMENT 31.01.2007 1 as is where is
90156 FSM 500TC THIN FILM STRESS MEASUREMENT 31.05.2004 1 as is where is immediately
93084 FSM SYMPHONYMC Life Time 300 MM 1 as is where is
96543 Gaertner L115C-8 Ellipsometer, cassette to cassette 100-200 mm 28.02.1995 1 as is where is immediately
99414 GCA/Tropel 9000 Wafer Flatness Analyzer 1 as is where is
102218 GEMETEC Elymat III WSPS 300 mm 1 as is where is
71907 Hamamatsu C7103 PC Controlled IC Back-side Lapping and Wafer Grinding System 200 mm and packages 30.09.2001 1 as is where is immediately
97928 HANRA HRI-580L INSPECTION SYSTEM ASSEMBLY 2 inquire
97859 HERMES NMI-100 DEFECT INSPECTION 1 as is where is
98118 Hermes Microvision eScan320 ebeam Inspection 300 mm 1 as is where is
101442 Hermes Microvision eP3 XP E-beam Inspection 300mm 31.05.2014 1 as is where is
101443 Hermes Microvision eP3 XP E-beam Inspection 300mm 31.05.2014 1 as is where is
102219 Hermes Microvision eP3 XP E-Beam Inspection System 300 mm 31.05.2012 1 as is where is
102220 Hermes Microvision eP4 CFM_EBeam Inspection HMI 300 mm 31.05.2017 1 as is where is
102222 Hermes Microvision eScan500 EBeam Inspection_HMI 300 mm 31.05.2014 1 as is where is
102959 HIMS NMI-100 DEFECT INSPECTION 300 mm 1 as is where is
52166 Hitachi 545-5515 DC power supply module for CD SEM spares 1 as is where is immediately
52167 Hitachi 6280H Power Supply Module 4channels spares 1 as is where is immediately
52168 Hitachi 545-5540 Power Supply unit for CD SEM Spares 1 as is where is immediately
52312 Hitachi 545-5522 VG board for CD SEM spares 31.05.1994 1 as is where is immediately
52339 Hitachi 545-5521 EVAC PCB FOR HITACHI CD-SEM spares 31.05.1994 1 as is where is immediately
52340 Hitachi 545-5537 IP-PC2 for cd-sem spares 31.05.1994 1 as is where is immediately
52343 Hitachi 377-7592 Power Supply Module for CD SEM spares 31.05.1994 1 as is where is immediately
53054 HITACHI 6280H (SPARES) SORD Computer for cd sem system spares 1 as is where is immediately
56838 Hitachi S-4500 FE Inspection SEM Type 1 chamber 1 as is all rebuilt immediately
60939 HITACHI S4160 Scanning electron microscope 31.05.1996 1 as is where is
65359 HITACHI S-9220 SIP baord for CD-SEM S9220,P/N 568-5591 1 as is where is immediately
74794 Hitachi S5200 FE SEM with EDX Inspection 31.05.2005 1 as is where is immediately
78108 Hitachi S4700 Type 2 FE-SEM Up to 6 inch 31.05.2006 1 as is all rebuilt immediately
83585 Hitachi S5000H Field Emission SEM Laboratory 1 as is where is immediately
83849 Hitachi S4500 Type I FE SEM Laboratory 01.05.1995 1 inquire immediately
84345 Hitachi EA8000 X-ray Particle Contaminant Analyzer 1 as is where is immediately
86169 HITACHI FB-2000A FIB Sem 200 mm 31.05.2001 1 as is where is
86171 HITACHI S-4700 (w/EDAX) FE SEM with EDX 31.05.1998 1 as is where is immediately
86172 HITACHI S-5000 FE SEM 200 mm 31.05.1994 1 as is where is
86173 HITACHI S-5000 FE SEM 200 mm 31.05.1996 1 as is where is
86174 HITACHI S-5000 FE SEM 200 mm 31.05.1999 1 as is where is
86175 HITACHI S-5000 FE SEM 200 mm 31.05.2000 1 as is where is
86275 Hitachi RS4000 In-line Defect Review SEM 200 mm / 300 mm 31.12.2006 1 as is where is immediately
86296 Hitachi 3600N SEM 1 as is where is immediately
86297 Hitachi S5200 FE-SEM 1 inquire immediately
88948 Hitachi S9380 CD SEM metrology ( Working ) Spares 1 inquire immediately
88949 Hitachi S9380 II CD SEM metrology (As-Is) Spares 1 as is where is immediately
91085 HITACHI IS-2700 Wafer Inspection Station 300 mm 1 as is where is
91086 HITACHI S-4160 FE SEM Laboratory 31.05.1996 1 as is where is
91087 HITACHI S-4160 FE SEM Laboratory 31.05.1996 1 as is where is
91088 HITACHI S-4800 FE SEM Laboratory 31.05.2005 1 as is where is
91089 HITACHI S-5500 FE SEM Laboratory 31.05.2006 1 as is where is
91090 HITACHI S-5500 FE SEM Laboratory 31.05.2012 1 as is where is
91091 HITACHI S-5500 FE SEM Laboratory 31.05.2010 1 as is where is
91395 HITACHI I-6300 CD SEM 1 as is where is
91397 HITACHI IS2700SE Dark Field inspection 1 as is where is
91403 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91404 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91405 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91407 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91408 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91417 HITACHI LS-6800 wafer surface inspection 300 mm 31.08.2007 1 as is where is immediately
91418 HITACHI UA-7200 Stripper/Asher 31.05.2001 1 as is where is
91848 HITACHI S7000 CD SEM 150 mm 31.05.1989 1 as is where is immediately
95070 Hitachi S5000 SEM Scanning Electron Microscope Hitachi S5000 with Noran 445A-3SES detector Laboratory 31.12.2013 1 as is where is immediately
95361 Hitachi IS3000 DARK FIELD INSPECTION 300 mm 31.05.2007 1 as is where is
95729 Hitachi WA 3300 Atomic Force Microscope 300 mm 31.05.2007 1 as is where is immediately
95952 Hitachi WA3300 Atomic Force Microscope (AFM) 300 mm 01.05.2007 1 as is where is immediately
96044 Hitachi S-4800-II FE SEM 200 mm 31.05.2004 1 inquire
96046 Hitachi S-5200 FE SEM Laboratory and Scientific 1 inquire
96047 Hitachi SU-70 High Resolution Field Emission SEM Laboratory and Scientific 31.05.2008 1 inquire
98206 Hitachi S-5000 FA SEMs/TEMs/Dual Beams 1 inquire
98207 Hitachi S-7800 Metrology and Inspection 200 mm 31.07.1997 1 inquire
98269 HITACHI RS 4000 Defect Review SEM 300 mm 01.05.2003 1 as is where is immediately
98270 HITACHI RS 4000 Defect Review SEM 300 mm 01.05.2003 1 as is where is immediately
98506 Hitachi WA200 SEM 200 mm 1 as is where is
99159 Hitachi CG-4100 SEM - Critical Dimension (CD) Measurement 300mm 1 as is where is
100157 Hitachi CG-4100 SEM - Critical Dimension (CD) Measurement 300mm 1 as is where is
101715 Hitachi HD-2300 STEM (Scanning Transmission Electron Microscope) Laboratory 01.06.2006 1 as is where is immediately
101717 Hitachi S-4700-II FE SEM 1 inquire
101718 Hitachi S-4800-II FE SEM 1 inquire
101719 Hitachi SU-1500 SEM 1 inquire
102223 Hitachi AS5000 Wafer Particle & Defect Analysis System AS-5000 200 mm 31.05.1997 1 as is where is
102225 Hitachi HF-2000 EDX/EELs/STEM imaging 31.05.1995 1 as is where is
102227 Hitachi RS4000 DR SEM 300 mm 31.05.2005 1 as is where is
102699 Hitachi CG-4100 SEM - Critical Dimension (CD) 300 mm 28.02.2013 1 as is where is
102965 HITACHI IS3000 DARK FIELD 300 mm 31.05.2007 1 as is where is
103088 Hitachi CG5000 SEM 300mm 30.04.2014 1 as is where is
103089 Hitachi CG5000 SEM 300mm 30.06.2014 1 as is where is
103525 HITACHI S4700-l Scanning Electron Microscope Laboratory 31.05.2004 1 as is where is immediately
103526 HITACHI S4700-ll FE Sem with Horriba EMAX EDX Laboratory 31.05.2001 1 as is where is immediately
103527 HITACHI S4700-ll FE Sem with Horriba EMAX EDX (Destocking Status) Laboratory 31.05.2003 1 as is where is immediately
103706 Hitachi 4700 FE SEM Laboratory 31.05.2000 1 as is where is immediately
106061 Hitachi SU 8010 Ultra High Resolution Field Emission Scanning Electron Microscope 100 mm 01.06.2007 1 as is where is immediately
106160 HITACHI RS6000 (Enhanced) Defect Review SEM 300 mm 01.06.2013 1 as is where is immediately
106315 HITACHI LS9000 Wafer Surface Inspection System 300mm 01.06.2010 1 as is where is
106367 HITACHI IS-2700 Wafer Inspection 200 mm 01.06.2005 1 as is where is
106368 HITACHI S-9260A Wafer Inspection 200 mm 01.06.2006 1 as is where is
106662 HITACHI FB2100 FIB 200 mm 01.06.2003 1 as is where is
106663 HITACHI IS3000SE WAFER PARTICLE INSPECTION 300 mm 01.06.2006 1 as is where is
106664 HITACHI IS3200SE WAFER PARTICLE INSPECTION 300 mm 01.06.2010 1 as is where is
106665 HITACHI LS9000 Wafer Surface Inspection 300 mm 01.06.2010 1 as is where is
106666 HITACHI LS-6800 Wafer Surface Inspection 300 mm 01.06.2007 1 as is where is
106890 Hitachi RS4000 Defect Review SEM 300 mm 01.05.2007 1 as is where is immediately
106893 Hitachi RS4000 Defect Review SEM 300 mm 01.06.2006 1 as is where is immediately
106918 Hitachi S6280H CD SEM 01.05.1995 1 as is where is immediately
106782 HMI E SCANLIGHT E-Beam inspection system 300 mm 01.06.2008 1 as is where is
87825 Horiba PD3000 Reticle inspection system 200 MM 31.05.1995 1 as is where is immediately
90670 Horiba Jobin Evon PZ2000 Ellipsometer 200 mm 31.05.2000 1 as is where is immediately
97863 HP 16500C Logic Analyser 1 as is where is
102239 HSEB AXIOSPECT 301 Optical Microscope 300 mm 1 as is where is
103092 HSEB Axiospect 300 Optical Review System 300mm 1 as is where is
106667 HSEB AXIOSPECT 300 MICROSCOPE INSPECTION STATION 300 mm 1 as is where is
102559 HSEB Zeiss Axiotron 300 AOI microscope with 2 units of Brooks load port 300 mm 1 as is where is immediately
106501 Irvine Optical Auto Wafer Loader Microscope Inspection WAFER INSPECTION MICROSCOPE WITH AUTOLOADER 150 mm/200 mm 1 as is where is immediately
106502 Irvine Optical Auto Wafer Loader Microscope Inspection WAFER INSPECTION MICROSCOPE WITH AUTOLOADER 150 mm/200 mm 01.06.1990 1 as is where is immediately
106504 Irvine Optical Auto Wafer Loader Microscope Inspection WAFER INSPECTION MICROSCOPE WITH AUTOLOADER 200 mm 01.06.1990 1 as is where is immediately
91419 J.A Woollam VUV-VASE (Gen II) Ellipsometer 300 mm 1 as is where is
91420 J.A Woollam VUV-VASE VU302 (Gen I) Ellipsometer 200 mm 31.05.2001 1 as is where is
87098 JEOL JWS-7505 Defect review SEM w/ EDX, untested 200 mm 31.12.2000 1 as is where is
87627 JEOL JSM 6400 Scanning Electron Microscope 1 as is where is immediately
87828 Jeol JWS7555 Scanning Electron Microscopes 200 mm 31.12.1999 1 as is where is immediately
91422 JEOL JSM-5600 FE SEM 31.05.1999 1 as is where is
91424 JEOL JSM-6700F FE SEM 1 as is where is
91899 Jeol jSM 6330F FIELD EMISSION SEM 1 as is where is immediately
92068 JEOL JSM 6400F Scanning Electron Microscope 1 as is where is immediately
92220 JEOL JWS-7555 SEM - Defect Review (DR) 200mm 1 as is where is immediately
93311 JEOL JSM-6320 Field Emission SEM Laboratory 1 as is where is immediately
97999 JEOL JWS 7700 DR SEM 200 mm 31.05.1996 1 as is where is
98123 JEOL ARM200CF Super X PFA 31.05.2014 1 as is where is
100991 Jeol JWS7500E w/Noran EDX Wafer Inspection System (SEM) 200 mm 31.05.2000 1 as is where is immediately
101692 Jeol JSM-6060LV SEM 1 inquire immediately
102244 JEOL JEM3200FS High Resolution TEM Laboratory 01.05.2006 1 as is where is immediately
102245 JEOL JWS-7515 SEM Wafer Inspection Tool 200 mm 31.05.1999 1 as is where is
102246 JEOL JWS-7555 SEM Wafer Inspection Tool 200 mm 31.05.2000 1 as is where is
102247 JEOL JWS-7555 SEM Wafer Inspection Tool 200 mm 31.05.2002 1 as is where is
102486 Jeol JSM-6600F SEM 31.05.2014 1 as is where is immediately
102651 Jeol JEM-2100 TEM laboratory 1 as is where is immediately
102652 Jeol JSM-7001 FLV SEM 1 inquire 1 month
102653 Jeol JEM-2500SE TEM Laboratory 1 as is where is immediately
102705 JEOL JFS-9855S Focused Ion Beam System 200mm 31.05.2000 1 as is where is immediately
102968 JEOL JSM-7500F SEM Laboratory 31.05.2009 1 as is where is
103158 Jeol JSM-6400F SEM 31.05.2017 1 inquire
103460 Jeol JSM6400 Scanning Electron Microscope Laboratory 31.05.1992 1 as is where is immediately
106668 JEOL JWS-7500E SCANNING ELECTRON MICROSCOPE 200 mm 1 as is where is
106898 JEOL JEM-2500SE Transmission Electron Microscope Laboratory 1 as is where is immediately
91427 Jordan Valley JVX 6200 X-ray metrology (X-Ray Reflectivity) 300 mm 1 as is where is
95012 Jordan Valley JVX 5200T X-Ray Reflectometer 200 MM / 300 MM 31.05.2006 1 as is where is
98000 Jordan Valley VVX 5200T METROLOGY 300 mm 31.05.2006 1 as is where is
99830 JORDAN VALLEY JVX6200I X-ray Metrology System 300 mm 28.02.2011 1 as is where is immediately
100917 Jordan Valley JVX6200 X-Ray Inspection System 300 mm 31.05.2010 1 as is where is
102248 Jordan Valley BedeMetrix-F X-Ray reflectometer 200 mm 31.05.2006 1 as is where is
102250 Jordan Valley JVX6200i Film Thickness Measurement 300 mm 31.05.2011 1 as is where is
102252 Jordan Valley JVX7300 Film Thickness Measurement 300 mm 31.05.2012 1 as is where is
102256 Karl Suss MA200 COMPACT Mask Aligner 200 mm 31.05.2012 1 as is where is
92658 KLA 6220 Defect Inspection System 1
106057 KLA 2915 Brightfield Wafer Defect Inspection System 300 mm 01.02.2014 1 as is where is immediately
106168 KLA Candela CS20 Wafer Surface Inspection System 100 mm to 200 mm 01.06.2006 1 as is where is immediately
106865 KLA 2830 (PARTS) EFEM ONLY with Yaskawa XURCM9206 robot 300 mm 01.02.2010 1 as is where is immediately
106891 KLA 2351 Brightfield Wafer Defect Inspection System 200 mm 01.06.2002 1 as is where is immediately
106922 KLA OP 2600 THIN FILM MEASUREMENT 200 mm 1 as is where is immediately
106966 KLA Aset F5x Thin Film measurement / Ellipsometer 200 mm 01.12.2000 1 inquire 4 months
106968 KLA SP2 (spare parts) Complete set of calibration standard wafers for a KLA SP2 200 mm 01.11.2022 1 inquire immediately
107004 KLA 2135 Wafer Defect Inspection System 200 mm 1 as is where is 1 month
106056 KLA / TENCOR / PROMETRIX SM 200 Spectramap 200 wafer film thickness measurement system 200 mm 01.12.1986 1 as is where is immediately
32230 KLA TENCOR SFS6400 MECHANICAL CALIBRATION Document Number 238 WAFERSURFACE ANALYSIS SYSTEM CUSTOMER MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
32231 KLA TENCOR Surfscan 64X0 Calibration Procedure Surfscan 64X0 Calibration Procedure MANUAL 1 as is where is immediately
32232 KLA TENCOR surfscan 64XX optical alignments Document Number 236 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
32233 KLA TENCOR SFS6x00 MECHANICAL CALIBRATION Document number 200 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
103161 KLA Tencor Surfscan 5500 Unpatterned Wafer Surface Inspection Tool 200 mm 1 inquire
106481 KLA Tencor AIT I Patterned Surface Inspection System 150 mm/200 mm 01.06.1995 1 as is where is immediately
106574 KLA TENCOR SEM-3800C Scanning Electron Microscope N/A 1 as is where is
106674 KLA TENCOR Viper 2430 Macro Defect Inspection 300 mm 01.06.2004 1 as is where is immediately
106675 KLA TENCOR Viper 2435 Macro Defect Inspection 300 mm 01.06.2004 1 as is where is
106676 KLA TENCOR Viper 2435XP Macro Defect Inspection 300 mm 01.06.2004 1 as is where is
106679 KLA TENCOR 2132 (mainbody only) Wafer Inspection System 150 mm,200 mm 01.06.1995 1 as is where is
106680 KLA TENCOR P-12 Profileometer 150 mm,200 mm 1 as is where is
106681 KLA TENCOR P-2 Profileometer 150 mm,200 mm 01.06.1996 1 as is where is
99837 KLA- TENCOR P-22H Metrology Tool 200 mm 1 as is all rebuilt immediately
98061 KLA-TENCOR AIT 1 Dark field, particle inspection 150 mm / 200 mm 1 inquire immediately
102842 KLA-TENCOR UV1280SE Film Thickness Measurement System / Ellipsometer 200 mm 1 inquire immediately
99845 KLA-Tencor 2351 Bright-Field Wafer Inspection System 200 mm 1 as is where is immediately
1691 KLA-TENCOR 259 (spare parts) Reticle Inspection - SPARE PARTS up to 7 inch 01.12.1991 1 inquire immediately
52151 KLA-Tencor Hamamatsu R1924A Photomultiplier spares 31.03.2007 1 inquire immediately
53035 KLA-Tencor 2132 (8 inch Wafer Chuck Assembly) Ceramic Wafer chuck, 8" spares 1 as is where is immediately
53036 KLA-Tencor Compumotor M575L11 Stepping motor drive spares 1 as is where is immediately
70127 KLA-Tencor AIT UV PATTERNED WAFER INSPECTION 200 mm 31.07.2003 1 as is where is immediately
71632 KLA-TENCOR 2122 Brightfield Wafer Defect Inspection System 200 mm 01.04.1996 1 as is where is immediately
76676 KLA-TENCOR AIT XP FUSION Dark Field WAFER PARTICLE DETECTION 200 mm 01.10.2002 1 as is where is immediately
76677 KLA-TENCOR AIT FUSION Dark Field WAFER PARTICLE DETECTION 200 mm 01.06.2002 1 as is where is immediately
83702 KLA-Tencor AMRAY 4200 Review SEM 8" 28.02.1999 1 as is where is immediately
85954 KLA-Tencor AIT XP Parts/Options 200 mm 1 as is where is
86419 KLA-Tencor AIT 1 wafer particle detection 150 mm 1 as is where is
86424 KLA-Tencor 7700 Surfscan 125 mm 31.01.1996 1 as is where is
87421 KLA-Tencor Puma 9550 WAFER INSPECTION 300 mm 01.10.2011 1 as is where is
87790 KLA-Tencor FLX 2908 Thin Film Measurement System 200 mm 31.03.1996 1 as is where is immediately
88266 KLA-Tencor eS20XP E-beam Inspection 200mm 31.12.2000 1 as is where is
88366 Kla-Tencor 2139 Birghtfield wafer defect inspection 150 mm or 200 mm 31.05.2000 1 as is where is immediately
88370 Kla-Tencor FLX 2908 Wafer Stress Measurement 1 inquire
88378 Kla-Tencor Alpha Step IQ Profileometer Manual 1 inquire immediately
88379 Kla-Tencor AIT 2 Surfscan wafer particle detection system 200 mm 31.05.1998 1 inquire
88605 KLA-Tencor EDR5210 Defect Review SEM 300 MM 31.05.2010 1 as is where is
88607 KLA-Tencor INM100+INS10 Metrology 150 MM 1 as is where is
89977 KLA-Tencor Surfscan 4000 Wafer surface particle inspection 150mm 1 as is where is immediately
90957 KLA-Tencor EDR5210 DR SEM 300 mm 1 as is where is
90960 KLA-Tencor NANOMAPPER Nanotopography 300 mm 31.05.2006 1 as is where is
90961 KLA-Tencor Puma 9000 Dark field defect Inspection 300 mm 31.05.2005 1 as is where is
91435 KLA-Tencor AIT Particle Review 200 mm 31.05.1997 1 as is where is
91464 KLA-Tencor PROMETRIX FT750 Film Thickness Measurement 1 as is where is
91466 KLA-Tencor PROMETRIX FT750 Film Thickness Measurement 1 as is where is
91477 KLA-Tencor THERMA-WAVE OP 2600 OPTI-PROBE 200 mm 1 as is where is immediately
92705 KLA-Tencor ES35D E-BEAM INSPECTION 300 MM 31.05.2006 1 as is where is
92813 KLA-Tencor MPV CD2 AMC Optical Wafer Metrology 125 mm 1 as is where is
92814 KLA-Tencor MPV CD2 AMC Optical Wafer Metrology 125 mm 1 as is where is
92815 KLA-Tencor MPV-CD Optical Wafer Metrology 125 mm 1 as is where is
92817 KLA-Tencor Surfscan 7700 Particle Counter (Metrology) 125 mm 1 as is where is
96998 KLA-Tencor Surfscan AIT Patterned Wafer Inspection 200 mm 01.05.1997 1 as is where is immediately
97450 KLA-Tencor SP1-TBI Wafer Particle Inspection System 300 mm 31.08.2004 1 as is where is immediately
98002 KLA-Tencor ES31 ebeam inspection 300 mm 31.05.2011 1 as is where is
98003 KLA-Tencor ES32 ebeam inspection 300 mm 31.05.2005 1 as is where is
98134 KLA-Tencor Viper Macro Defect Detection System 300 mm 31.05.2010 1 as is where is
98400 KLA-Tencor AIT I Surfscan Patterned Wafer Surface Inspection 200 mm 1 as is where is immediately
98403 KLA-Tencor SFS-7600 Patterned Wafer Surface Inspection 150 mm 1 as is where is
98404 KLA-Tencor UV-1050 Thin Film Measurement System 150 mm 1 as is where is
98548 KLA-Tencor AIT XP Fusion Darkfield Pattern Inspection 200 mm 3 inquire
98549 KLA-Tencor AIT XP Darkfield Pattern Inspection 200 mm 1 inquire immediately
98551 KLA-Tencor ES31 SEM Defect Inspection 200 mm 1 as is where is immediately
98553 KLA-Tencor UV1080 Film Thickness Measurement 150 mm-200 mm 1 inquire
98858 KLA-Tencor Surfscan 4500 Unpatterned Wafer Surface Inspection 2 inch to 6 inch 30.11.1989 1 as is where is immediately
98912 KLA-Tencor AIT XP Defect Inspection 1 as is where is
98914 KLA-Tencor Spectra FX-1000 HT Thin film measurement system 1 as is where is
98918 KLA-Tencor Viper 2401 After Develop Inspection Tool 4 inch to 8 inch 31.10.2000 1 as is where is immediately
99912 KLA-Tencor KLA2131 Inspection System 200 mm 31.05.1995 1 as is where is
100186 KLA-Tencor eS32 E-beam Inspection 300mm 31.05.2007 1 as is where is
100187 KLA-Tencor eS37 E-beam Inspection 300mm 31.05.2009 1 as is where is
100730 KLA-Tencor Alpha Step IQ Surface Profiler 31.05.2010 1 as is where is
100907 KLA-Tencor SFX100 Thickness Measurement System 300 mm 31.05.2004 1
101342 KLA-Tencor AIT I Patterned Surface Defect Inspection System 200 mm 31.01.1998 1 as is where is immediately
101452 KLA-Tencor WaferSight Wafer Characterization 300 mm 31.10.2005 1 as is where is immediately
102261 KLA-Tencor CRS1010 Review Station 200 mm 31.05.1998 1 as is where is
102262 KLA-Tencor DP2 Data Prep Station 31.05.2012 1 as is where is
102263 KLA-Tencor eS31 E-beam Inspection 300 mm 31.05.2004 1 as is where is
102267 KLA-Tencor FX200 Thickness measurement 300 mm 31.05.2006 1 as is where is
102270 KLA-Tencor Puma 9000 Dark Field Inspection 300 mm 31.05.2005 1 as is where is
102273 KLA-Tencor Surfscan 2.1 Particle Counter 125 mm 1 as is where is
102472 KLA-Tencor 6220 Bare Wafer Particle Detection System 150 mm / 200 mm 1 inquire immediately
102477 KLA-Tencor P-10 Manual Wafer Load Disk Profilometer 200 mm 1
102634 KLA-Tencor 6400 Patterned Wafer Particle Inspection System 150 mm / 200 mm 1 inquire 1 month
102709 KLA-Tencor eS32 E-beam Inspection 300 mm 1 as is where is
102710 KLA-Tencor eS32 E-beam Inspection 300 mm 1 as is where is
102969 KLA-Tencor FIT3120 PARTICLE COUNTER 300 mm 31.05.2005 1 as is where is
103096 KLA-Tencor AIT UV Darkfield Inspection 300mm 31.05.2004 1 as is where is
103162 KLA-Tencor P-15 Profiler 200 mm 1 inquire
103163 KLA-Tencor P-11 Profiler 1 inquire
103164 KLA-Tencor Surfscan 4000 Unpatterned Wafer Surface Inspection Tool 150 mm 31.05.1986 1 inquire
103166 KLA-Tencor Surfscan 5000 Unpatterned Wafer Surface Inspection Tool 200 mm 31.05.1988 1 inquire
103733 KLA-Tencor Surfscan 4500 Wafer Particle Inspection System 2 to 6 inch 31.05.1986 1 as is where is immediately
105783 KLA-Tencor ES32 E-Beam Inspection System 1 as is where is
105809 KLA-Tencor es32 E-Beam Inspection 300 mm 1 as is where is
105810 KLA-Tencor es32 E-Beam Inspection 300 mm 1 as is where is
105811 KLA-Tencor es32 E-Beam Inspection 300 mm 1 as is where is
106002 KLA-Tencor Archer 200 AIM Overlay Measurement System 300 mm 30.04.2010 1 as is where is immediately
106194 KLA-Tencor Candela 7100 Wafer Inspection system for Hard Disk Substrates 01.12.2010 1 as is where is immediately
106311 KLA-TENCOR VISEDGE CV300 Wafer-Edge Inspection 300 mm 01.06.2007 1 as is where is immediately
102284 Kokusai VR-120SD Resistivity Measurement 300 mm 1 as is where is
97865 KRUSS KRUSSDSA100 CONTECT ANGLE MEASUREMENT 1 as is where is
94475 LASERTEC BGM300 Wafer Surface Analyzing and VIsualization System 200 mm 31.05.2008 1 as is where is
106702 LASERTEC BGM300 Wafer Inspection System 300 mm 1 as is where is
88268 Leica INM20 Microscope 200mm 1 as is where is immediately
88269 Leica INS10 Microscope 200mm 1 as is where is
97106 Leica MZ 12.5 Stereomicroscope 1 as is where is
103110 Leica LDS3300C Macro-Defect 300mm 1 as is where is
106485 Leica LEICA INM20 Microscope inspection station 200 mm 01.06.1995 1 as is where is immediately
86193 LEITZ MPV-SP Wafer Inspection Microscope 200 mm 1 as is where is
86420 Leitz MPV CD2 AMC Wafer inspection microscope 125 mm 1 as is where is
86421 Leitz MPV CD2 AMC Wafer inspection microscope 125 mm 1 as is where is
86423 Leitz MPV-CD Wafer inspection microscope 125 mm 1 as is where is
86426 Leitz INM100+INS10 Wafer inspection microscope 150 mm 1 as is where is
102168 Leo 1530 FE-SEM up to 8 inch 31.05.2002 1 as is where is
99419 MDC CSM Automatic CV Plotter with RM-1600 Computer 1 as is where is immediately
99420 MDC CSM/16 Automatic CV Plotter with RM-1600 Computer 125 MM 1 as is where is immediately
98005 MicoMetrics Precis Overlay measurement system 200 mm 31.05.2010 1 as is where is
99422 Minato MM-6600 Wafer Mobility Tester 2 as is where is
91113 MITUTOYO MP2000 METRO 200 mm 1 as is where is
100737 Mitutoyo YC-H260 Measurement Machine 1 as is where is
106703 N&K ANALYZER 5700-CDRT Wafer Inspection System 1 as is where is
106704 n&k Technology 6700-CDRT Wafer Inspection System 1 as is where is
106705 NANO OPTICS HAZE 2 Nano Optics Haze 2 200 mm 1 as is where is
71741 Nanofab Nano150 Ion Beam Lithography / Implanter System 150 mm 1 inquire immediately
105883 Nanofab Nano200 Ion Beam Lithography / Implanter System 200 mm 1 inquire immediately
86425 Nanometrics Nanospec AFT 210 surface inspection 125 mm 1 as is where is
91526 NANOMETRICS Caliper Mosaic Overlay 300 mm 31.05.2003 1 as is where is immediately
91529 NANOMETRICS Caliper Mosaic Overlay 300 mm 28.02.2010 1 as is where is immediately
91530 NANOMETRICS NANOMETRICS 9-7200-0195E Mask & Wafer Inspection 200 mm 1 as is where is
92041 Nanometrics 9010B Metrology 1 as is where is immediately
92818 Nanometrics NanoSpec 210 Metrology (Metrology) 125 mm 1 as is where is
98153 Nanometrics Caliper Mosaic Overlay Measurement 300 mm 31.05.2011 1 as is where is
98154 Nanometrics Caliper Mosaic Overlay Measurement 300 mm 31.05.2009 1 as is where is
98155 Nanometrics Caliper Mosaic Overlay Measurement 300 mm 31.05.2009 1 as is where is
98289 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 31.05.2005 1 as is where is
98290 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 31.05.2005 1 as is where is
98291 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 30.06.2006 1 as is where is immediately
98480 Nanometrics 8000X film thickness measurement 150mm 2 as is where is immediately
98481 Nanometrics 8000Xse film thickness measurement 200mm 2 as is where is
98508 Nanometrics M6100 Film Thickness Measurement 200 mm 1 as is where is
101585 NANOMETRICS CALIPER-ULTRA Overlay Measurement 300 mm 30.06.2006 1 as is where is
102309 Nanometrics Caliper Q300 Overlay Measurement System 300 mm 31.05.2003 1 as is where is
102310 Nanometrics Caliper Q300 Overlay Measurement 300 mm 31.05.2003 1 as is where is
102311 Nanometrics Caliper Q300 Overlay Inspection 300 mm 31.05.2002 1 as is where is
102312 Nanometrics Caliper Q300 Overlay Measurement 300 mm 31.05.2002 1 as is where is
102314 Nanometrics Q200I Overlay Measurement System 200 mm 31.05.2000 1 as is where is
102315 Nanometrics Q200I Overlay Measurement 200 mm 31.05.2002 1 as is where is
102840 NANOMETRICS 9010 Integrated Metrology System 31.12.2007 5 as is where is immediately
103544 NANOMETRICS CALIPER ELAN Overlay 300 mm 31.05.2004 1 as is where is
106179 Nanometrics 9000 Nanospec Wafer Metrology film thickness measurement tool 200 mm 01.06.2005 1 as is all rebuilt immediately
106302 Nanometrics SIPHER PL Mapping 300 mm 01.06.2002 1 as is where is immediately
106706 NANOMETRICS CALIPER_ULTRA Mask & Wafer Inspection 300 mm 01.06.2006 1 as is where is
106823 Nanometrics Nanospec 9100 Ox film thickness measurement( PC missing) 200mm 1 inquire
107027 NANOMETRICS Caliper Mosaic Overlay measurement System 300 mm 01.08.2010 1 inquire immediately
105817 Negevtech NT3100 Optical Inspection Microscope 300 mm 1 as is where is
105818 Negevtech NT3100 Optical Inspection Microscope 300 mm 1 as is where is
97868 Newport 1830-C Optical Power Meter 1 as is where is
93103 NGR NGR2150 E-beam wafer inspection 300 MM 1 as is where is
102888 Nicolet ECO-1000S FT-IR 200 mm 31.05.1996 1 as is where is
82904 Nikcon AMI-2000 Surface Analyzer 01.06.2003 1 as is where is immediately
33708 NIKON Optiphot 88 Wafer Inspection Microscope 200 mm 1 as is where is immediately
64341 Nikon VMR 3020 Video Measuring System 31.12.2000 1 as is where is immediately
88273 Nikon OPTIPHOT 200 Microscope 200mm 1 as is where is
91863 NIKON Optiphot 150 Wafer Inspection Microscope, 10X, 20X, 50X & 150X Objs., 150mm XY Stage 150 mm 1 as is all rebuilt immediately
91864 NIKON Optiphot 200 (For spares use) Wafer Inspection Microscope (Parts Tool Only) 200 mm 1 as is where is immediately
92616 Nikon OPTISTATION V Optical Review System 200mm 1 as is where is
92617 Nikon OPTISTATION V Optical Review System 200mm 1 as is where is
92707 NIKON VMR-C4540 FOUP INSPECTION 300 MM 31.05.2001 1 as is where is
92825 Nikon OPTIPHOT 66 Microscope (Metrology) 150 mm 1 as is where is
96395 Nikon Lasermark Overlap Inspection System Inspection System 200 - 300 mm 31.05.2013 1 as is where is immediately
99396 Nikon EpiPhot 200 Inspection Microscope 200 mm 1 as is where is immediately
99424 Nikon Optiphot 150 Wafer Inspection Microscope 150 mm 1 as is where is immediately
99425 Nikon Optistation 3 Microscope Wafer Inspection Satation with cassette to cassette handling 150 mm 1 as is where is immediately
99426 Nikon Optistation 3 Microscope Wafer Inspection Station with cassette to cassette handling 150 mm 1 as is where is immediately
99427 Nikon Optistation 3 Wafer Inspection System 150 mm 31.05.1994 1 as is where is immediately
99428 Nikon Optistation 3A Automatic Wafer Inspection Station 200 mm 31.05.1997 1 as is where is immediately
100223 Nikon AMI-3300 Macro-Defect 300mm 1 as is where is
100224 Nikon AMI-3300 Macro-Defect 300mm 1 as is where is
100226 Nikon AMI-3500 Macro-Defect 300mm 1 as is where is
103038 Nikon Optiphot Inspection Microscope w/ Nomarski Optics 1 as is where is
103039 Nikon Optiphot 88 200mm Inspection Microscope w/ Nomarski Optics 200 mm 1 as is where is
103213 Nikon Optiphot-88-AC IN Inspection Microscope 200 mm 1 as is where is
103215 Nikon Optiphot 300 Inspection Microscope 300 mm 1 as is where is
103216 Nikon Optiphot 200 Inspection Microscope 200 mm 1 as is where is
103458 Nikon Optiphot 150 Wafer Inspection Microscope 150 mm 1 as is where is immediately
103827 Nikon Optiphot 150 Wafer Inspection Microscope 150 mm 1 as is where is immediately
103828 Nikon Optiphot 200 Wafer Inspection Microscope 200 mm 1 as is all rebuilt immediately
103834 NIKON Optiphot 88 Wafer Inspection Microscope 200 mm 1 as is where is immediately
106499 Nikon Auto Wafer Loader for Microscope Inspection Controller, Visual Inspect 150 mm/200 mm 1 as is where is immediately
106500 Nikon Auto Wafer Loader for Microscope Inspection WAFER INSPECTION MICROSCOPE WITH AUTOLOADER 150 mm/200 mm 1 as is where is immediately
106503 Nikon Auto Wafer Loader for Microscope Inspection WAFER INSPECTION MICROSCOPE 150 mm/200 mm 1 as is where is immediately
106509 Nikon OPTIPHOT 300 WAFER INSPECTION MICROSCOPE WITH AUTOLOADER 150 mm/200 mm 1 as is where is immediately
106510 Nikon Microscope Wafer Inspection Dual Microscope 150 mm/200 mm 1 as is where is immediately
106511 Nikon SMZ Boom Microscope with Schott Illuminator, on stand, with flat base plate Assembly 1 as is where is immediately
106707 NIKON AMI-3300 Wafer Inspection System 300 mm 1 as is where is
106708 NIKON AMI-3300 Wafer Inspection System 300 mm 1 as is where is
106709 NIKON AMI-3500 Wafer Inspection System 300 mm 1 as is where is
53146 NOVA 210 CMP ENDPOINT MEASUREMENT SYSTEMS 200 mm 5 as is where is immediately
106513 OAI CUSTOM OI Analytical Model 1088 150 mm/200 mm 1 as is where is
69809 Olympus MX-50 Microscopes 3
87492 OLYMPUS BH-BHM Wafer Inspection Microscope 150 mm 1 as is where is immediately
95118 OLYMPUS MX-610 Microscope 200mm - 300mm 1 3 months
96371 Olympus MX61L Wafer Inspection Microscope 300 mm 31.12.2012 1 as is where is immediately
96372 Olympus MX51 Wafer Inspection Microscope 150 mm 1 as is where is immediately
102839 Olympus MX61-L Inspection Microscope 300 mm 1 as is where is immediately
106407 Olympus BHMJL Wafer Inspection Microscope 200 mm 1 as is where is
106408 Olympus BHMJL Wafer Inspection Microscope 200 mm 1 as is where is
106824 Olympus AL100N-LMB8 wafer loader for Olympus microscope 200mm 1 inquire
106825 Olympus AL110-LMB6 with MX51 wafer loader with Microscope 150mm 1 inquire
76711 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 30.11.1996 1 as is where is immediately
76712 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 30.11.1996 1 as is where is immediately
76713 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 30.11.1996 1 as is where is immediately
76714 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 30.11.1996 1 as is where is immediately
103547 ONTO WV320 MACRO INSPECTING 300 mm 31.05.2004 1 as is where is
100233 Oxford X-Strata980 X-ray Fluorescence Spectrometer 31.05.2010 1 as is where is
97003 Philips PHI 680 Auger Nanoprobe Laboratory 31.05.1998 1 as is where is immediately
103115 Philips PW2830 X-ray Fluorescence Spectrometer 300mm 31.05.2004 1 as is where is
103116 Philips PW2830 X-ray Fluorescence Spectrometer 300mm 31.05.2003 1 as is where is
95011 PHILLIPS IMPULSE 300B Thin-film measurement 200 MM / 300 MM 31.05.2004 1 as is where is
91869 PLASMOS SD2000 Automatic Ellipsometer 200 mm 1 inquire immediately
99429 Plasmos SD 2004 Multi-Wavelength Ellipsometer 200 mm 1 as is where is immediately
78159 Plasmos / Yvon Jobin /Philips Analytical SD2000 Laser Ellipsometer 200 mm 01.08.2000 1 as is where is immediately
31246 PMS Liquitrack 776200 Non volatile residual Monitor for water-quality checking facilities 01.10.1999 1 as is where is immediately
98424 Quantronix DRS 820 Inspection System 150 mm 3 as is where is
87792 QVI 600XP Process Control & Measurement 1 as is where is
91552 RAYTEX RXW-800 EDGE SCAN 200 mm 31.05.2008 1 as is where is
98489 Raytex RXW-0826SFIX-SMIF edge scanner 200mm 1 as is where is
105819 Raytex RXW-1226SFI Defect Inspection System 300 mm 1 as is where is
106409 Raytex RXW-1226SFI Wafer Edge Inspection 300 mm 01.06.2008 1 as is where is
79216 ReVera VeraFlex X-Ray Photoelectron Spectroscopy 300 mm 31.05.2008 1 as is where is immediately
97733 ReVera RVX1000 Film Thickness Measurement System 300 mm 1 as is where is
97734 ReVera RVX1000 Film Thickness Measurement System 300 mm 1 as is where is immediately
105820 Revera RVX5000 X-Ray Photo-electron Spectroscopy (XPS) 300 mm 1 as is where is
106410 Revera RVX5000 X-Ray Photoelectron Spectroscopy (XPS) 300 mm 01.06.2008 1 as is where is
35595 RIGAKU 3630 (For spares use) Xray Fluorescence Wafer/Disk Analyzer, Missing Xray Tube 31.05.1997 1 as is where is immediately
71780 Rigaku TXRF 300S X-Ray Diffractometer 150mm to 300 mm 01.12.2000 1 as is where is immediately
79217 Rigaku MFM65 XRR/XRF 300 mm 31.05.2009 1 inquire
82910 RIGAKU 3630 Wafer Inspection Equipment 200 01.06.1996 1 as is where is immediately
87823 Rigaku MFM65 X-ray inspection (For Cu and Au quantification) 300 MM / 200 mm 30.09.2007 1 as is where is immediately
91557 RIGAKU XRF3640 (Handle include) Wafer/ Disk Analyzer 200 mm 31.05.1995 1 as is where is
92691 Rigaku MFM65 In-Line Energy Dispersive X-Ray Fluoresence Wafer Inspection System 300 mm 31.05.2008 1 as is where is immediately
102347 Rigaku 3272 TXRF (X-Ray Fluorescence) 300 mm 31.05.2005 1 as is where is
105821 RION KS-40AF Particle Counter 300 mm 1 as is where is
72034 RUDOLPH MP200 METROLOGY 200 mm 31.05.2000 1 as is where is immediately
91116 RUDOLPH MP200 XCu Thin Film Measurement 200 mm 31.05.2001 1 as is where is
91559 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2005 1 as is where is
91560 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2005 1 as is where is
91561 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2006 1 as is where is
91563 RUDOLPH Meta Pulse Film Metrology 200 mm 31.05.2005 1 as is where is
91566 Rudolph WS3840 3D Bump Metrology 300 mm 31.05.2010 1 as is where is immediately
91567 RUDOLPH META PULSE 200 Surface Film Metrology 200 mm 31.05.2002 1 as is where is immediately
92709 Rudolph WV320 MACRO INSPECTION 300 MM 31.05.2006 1 as is where is immediately
92710 Rudolph WV320 MACRO INSPECTION 300 MM 31.05.2006 1 as is where is
94478 RUDOLPH FE-3 Focus Ellipsometer 200 mm 1 as is where is
94479 RUDOLPH FE-4D Focus Ellipsometer 200 mm 1 as is where is
95619 Rudolph WV320 MACRO INSPECTION 300 MM 31.05.2006 1 as is where is immediately
95621 RUDOLPH WV320 Metrology 300mm 1 as is where is immediately
97965 RUDOLPH NSX320 MACRO DEFECT INSPECTOR 300 MM 1 as is where is immediately
97966 RUDOLPH WHS MACRO DEFECT INSPECTOR 300 MM 1 inquire
98171 Rudolph NSX105C Macro Inspection 200 mm 31.05.2007 1 as is where is
98296 RUDOLPH Meta Pulse 300 Film thickness measurement 300 mm 1 as is where is
98297 RUDOLPH Meta Pulse 300 Film thickness measurement 300 mm 1 as is where is
98298 RUDOLPH MP1-300 Film thickness measurement 300 mm 31.05.2007 1 as is where is
98835 RUDOLPH AXI-S Macro Wafer Inspection 300 mm 30.06.2004 1 as is where is immediately
98837 RUDOLPH MP1-300XCU Film Thickness Measurement System 300 mm 30.04.2008 1 as is where is immediately
100928 RUDOLPH AXI-S Macro Inspection System 300 mm 31.05.2003 1 as is where is
100929 RUDOLPH FE-7 Ellipsometer 200 mm 31.05.1996 1 as is where is
100930 RUDOLPH MP300 Film thickness measurement 200 mm 31.05.2007 1 as is where is
100931 RUDOLPH MP300 Film thickness measurement 200 mm 31.05.2009 1 as is where is
100932 RUDOLPH S3000A Focused Beam Ellipsometer 200 mm 31.05.2012 1 as is where is
101348 Rudolph Auto EL Elipsometer 150mm 1 as is where is
101349 Rudolph FE IIID Dual Wavelength Ellipsometer 200 mm 01.06.1998 1 as is where is immediately
101491 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
101492 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
101493 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
101494 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
101495 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
101496 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
102355 Rudolph 3Di8500 Wafer Inspection 300 mm 31.05.2008 1 as is where is
102356 Rudolph Axi-S Macro inspection 300 mm 31.05.2005 1 as is where is
102359 Rudolph NSX115 Macro Defect Inspection System 300 mm 31.05.2009 1 as is where is
102360 Rudolph NSX115 Macro Defect Inspection System 300 mm 31.05.2010 1 as is where is
102363 Rudolph S3000S Focused Beam Ellipsometer 300 mm 31.05.2011 1 as is where is
102364 Rudolph S3000SX Focused Beam Ellipsometer 300 mm 31.05.2011 1 as is where is
102369 Rudolph WV320 Macro Defect inspection 300 mm 31.05.2005 1 as is where is
102372 Rudolph WV320 Macro Defect inspection 300 mm 31.05.2007 1 as is where is
102373 Rudolph WV320 Macro Defect inspection 300 mm 31.05.2007 1 as is where is
103553 RUDOLPH AXI-S Macro Inspection 300 mm 31.05.2004 1 as is where is
103554 RUDOLPH AXI935D AVI 300 mm 1 as is where is
103555 RUDOLPH MP3 300XCU FLIM THICKNESS MEASUREMENT SYSTEM 300 mm 1 as is where is immediately
103707 Rudolph AXI-S Macro Inspection System 300 mm 31.05.2003 1 as is where is
103708 Rudolph AXI-935D Macro Inspection System 300 mm 1 as is where is
103709 Rudolph AXI-935D Macro Inspection System 300 mm 31.05.2011 1 as is where is
105789 Rudolph WHS220/Axi-940b Wafer Mask Inspection System 100-150 mm 31.05.2009 1 as is where is
105822 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105823 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105824 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105825 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105826 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105827 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105828 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105829 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105830 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105831 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
106298 RUDOLPH MetaPulse 3 300A Film Thickness Measurement 300 mm 01.06.2008 1 as is where is immediately
106420 Rudolph NSX 115 Automated Defect Inspection 200 mm 1 as is where is immediately
106421 Rudolph NSX 95 Automated Macro Defect Inspection 150 mm/200 mm 1 as is where is immediately
106422 Rudolph NSX-105 Automated Defect Inspection 150 mm/200 mm 1 as is where is immediately
106423 Rudolph NSX-105d1 Automated Defect Inspection 150 mm/200 mm 1 as is where is immediately
106424 Rudolph NSX-95 Automated Macro Defect Inspection 150 mm/200 mm 1 as is where is immediately
106425 Rudolph NSX-95 Manual Macro Wafer Defect Inspection 150 mm/200 mm 1 as is where is immediately
106715 RUDOLPH MP3_300A METAL THICKNESS MEASUREMENT 300 mm 01.06.2012 1 as is where is
106716 RUDOLPH MP-300 Film thickness measurement 300 mm 01.06.2005 1 as is where is
106717 RUDOLPH MP1-300 Film Thickness Measurement 300 mm 01.06.2003 1 as is where is
106718 RUDOLPH MP1-300 Film Thickness Measurement 300 mm 1 as is where is
106719 RUDOLPH MP1-300XCU Film thickness measurement system 300 mm 01.06.2008 1 as is where is
106720 RUDOLPH NSX 105 MACRO DEFECT INSPECTION SYSTEM 300 mm 01.06.2008 1 as is where is immediately
106721 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2010 1 as is where is
106722 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2011 1 as is where is
106723 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 1 as is where is
106724 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2011 1 as is where is
106725 RUDOLPH S3000S FBE(focused beam laser ellipsometry) 300 mm 01.06.2010 1 as is where is
106726 RUDOLPH S3000S FBE(focused beam laser ellipsometry) 300 mm 1 as is where is
106727 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2003 1 as is where is
106728 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2003 1 as is where is
106729 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2006 1 as is where is
106730 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2002 1 as is where is
106731 RUDOLPH WV320 Macro Inspection 300 mm 01.06.2006 1 as is where is
106732 RUDOLPH MP200 Film thickness measurement 200 mm 01.06.2003 1 as is where is
106733 RUDOLPH MP200 Film thickness measurement 200 mm 01.06.1999 1 as is where is
106734 RUDOLPH WV320 Macro Defect Inspection System 300 mm 1 as is where is
106735 RUDOLPH WV320 Macro Defect Inspection System 300 mm 1 as is where is
106831 Rudolph MP200XCU Cu Film thickness measurement 200mm 1 inquire
106832 Rudolph MP300 Metal Film thickness measurement 300mm 1 inquire
106833 Rudolph MP300 XCu Cu Film thickness measurement 300mm 2 inquire
106871 RUDOLPH NSX 105 Automated Wafer, Die and Bump Inspection System 300 mm 01.06.2008 1 as is where is immediately
70089 Rudolph Technologies FE-VII Ellipsometer 200 mm 31.05.1996 1 as is where is immediately
88629 Rudolph/August NSX105 Macro Inspection 200 MM 31.05.2004 1 as is where is
88630 Rudolph/August NSX105 Macro Inspection 200 MM 31.05.2003 1 as is where is
101673 RVSI WS-3800 2D/3D Automated Optical Inspection System 200 mm 1 as is where is
106411 SCIENTECH Stacis 2100 Active Piezoelectric Vibration Cancellation System Facilities 01.06.2008 1 as is where is
91875 SDI SPV-300 Surface Photo Voltage Tester for up to 300mm Wafers up to 300 mm 31.05.1997 1 as is where is immediately
102894 SDI SPV-1050 Contamination Monitoring System 200 mm 31.05.1996 1 as is where is immediately
106661 SDI FAAST 230-DP+SPV+SLIC CARRIER LIFETIME MEASUREMENT 200 mm 1 as is where is
91873 SDI / Semilab FAaST-330 Dielectric Characterization Tool with COCOS & Epi-t for up to 300mm Wafers up to 300 mm 31.05.1999 1 as is where is immediately
91117 SEIKO CHIPS-200 metrology system 200 mm 1 as is where is
86199 SEIKO SEIKI SMI2200 SEM 200 mm 1 as is where is
91118 SELA MC100 metrology system 200 mm 1 as is where is
91119 SELA MC500 metrology system 200 mm 1 as is where is
102951 SELA EM3i Saw for TEM sample preparation ASSEMBLY 31.05.2011 1 as is where is
82911 Semiconductor Diagnostics 3030 Surface Profiler 200 01.06.2012 1 as is where is immediately
100747 Semilab WT-2000PVN Carrier Lifetime Measurement System 1 as is where is immediately
102381 Semilab PS-2000 Ellipsometric Porosimeter 31.05.2015 1 as is where is
102382 Semilab SPVCMS4000 Surface Charge Measurement 200 mm 31.05.1995 1 as is where is
89974 Semix Tazmo SOG TR817UD-TM 150mm SOG 150mm 1 as is where is
95377 Sheffield Endeavor Coordinate Measurement Machine 9.12.7 1 as is where is immediately
97877 Siemens 3 DIMESION MEA FAB-METROLOGY 31.05.2006 1 as is where is
105832 SII NANO XV 300DB Particle Measurement System 300 mm 1 as is where is
106412 SII NANO XV 300DB Wafer Inspection 300 mm 01.06.2008 1 as is where is
74946 Sonoscan D6000 C-Sam 30.04.1996 1 as is where is immediately
83703 SOPRA SE 200 Ellipsometer 200 mm 1 as is where is
102394 SOPRA EP12 Optical Dielectric Porosity Measurement System (300mm) 300 mm 1 as is where is
91877 SSM 470i CV Plotter 1 inquire
98012 SSM SSM 6100 CV IMPLANT-CV CURVES 300 mm 31.05.2000 1 as is where is
106742 SSM 5200 Resistivity Measurement 200 mm 01.06.2008 1 as is where is
89975 TecHarmonic EHTVS Water Scrubber 1 as is where is
101503 Technos TVD-900 ICP-MS Spectrometer 1 as is where is
77049 Tecnai TF20 TEM Refurbished 31.05.2001 1 as is where is immediately
33722 TENCOR AlphaStep 300 Profilometer 1 inquire
98935 Thermawave TP 630 Ion Implant Measurement System 1 as is where is
91569 Thermo Fisher ECO 1000 FTIR System 200 mm 01.05.2000 1 as is where is immediately
106303 Thermo Fisher ECO1000-S FTIR 300 mm 01.06.1997 1 as is where is immediately
106040 THERMO NICOLET Continuum Infra-Red Microscope / FTIR Analysis System laboratory 1 as is where is immediately
97887 TOYO SE-4000 Roughness Measurement 31.05.2008 1 as is where is
88284 Veeco Dimension 7000 Atomic Force Microscope (AFM) 200mm 1 as is where is immediately
88375 Veeco D9000 Atomic Force Microscope 200 mm 31.05.1997 1 as is where is immediately
88631 Veeco Dimension X3D Model 340 Atomic Force Microscope 300 MM 31.05.2006 1 as is where is immediately
96382 Veeco D9000 Atomic Force Microscope 200 mm 31.05.2001 1 as is where is immediately
96383 Veeco D9000 Atomic Force Microscope 200 mm 31.05.2001 1 as is where is immediately
96404 Veeco NT3300 Non Contact Profilometer 6 or 8 inch 31.12.2003 1 as is all rebuilt immediately
97839 Veeco Dimension X1D Atomic Force Microscope (AFM) 300 mm 1 as is where is
97840 Veeco Dimension X1D Atomic Force Microscope (AFM) 300 mm 1 as is where is
98373 VEECO V220SI METRO 200 mm 31.05.2002 1 inquire
102464 Veeco NT9800 Optical Profiling System 31.05.2010 1 as is where is
102465 Veeco V220SI Surface Profile Measurement 1 as is where is
103136 Veeco Dimension Vx340 Atomic Force Profiler (AFP) 300mm 31.05.2003 1 as is where is
103182 Veeco Dimension 3100 Atomic Force Microscope 150 mm 01.05.2017 1 as is where is immediately
103373 VEECO Dektak 8 Programmable Surface Profiler Measuring System 200 mm 30.04.2006 1 as is where is immediately
103665 Veeco Dektak 3030 ST Surface Texture Analysis System 1 as is where is
103669 Veeco 9000M Atomic Force Microscope 1 as is where is
103670 Veeco Dektak SXM Atomic Force Microscope 200 mm 1 as is where is
105786 Veeco VX-340 Atomic Force Microscope 1 as is where is
106147 Veeco Dimension 3100 Atomic Force Microscope 200 mm 01.06.2006 1 as is where is immediately
107002 Veeco DekTak 6M Stylus profilometer 150 mm 01.06.2006 1 as is where is immediately
107011 Veeco Dektak 200 Si Contact Profilometer - for spares use (Not operational condition) 150 mm 01.06.2000 1 as is where is immediately
95009 WOOLAM HS-190 Scanning Monochromator 200 MM 1 as is where is
93087 Woollam VUV-VASE (Gen II) Ellipsometer 300 MM 1 as is where is immediately
34091 Wyko NT 2000 Optical Profiling system 200 MM 1 inquire immediately
38870 Wyko NT1100 Optical Profiling system 1 as is where is 2 weeks
66762 WYKO HD 2000 DPC Video Scope 1 as is where is immediately
71792 WYKO NT3300 Optical 3D profiling system 1
96646 WYKO NT3300 Profilometer 200mm 1 as is all rebuilt immediately
106312 WYKO NT-3300 Optical Profiler 300 mm 01.06.2012 1 as is where is immediately
98217 YesTech YTV-B3 AOI Automated Optical Inspection System 31.05.2008 1 as is where is immediately
86716 ZEISS Axiotron Wafer inspection microscope 1 as is where is immediately
97108 Zeiss Axiotech 100 HD Inspection Microscope Assembly 1 as is where is immediately
97610 Zeiss Axiotron 300 Microscope 300 mm 1 as is where is
98211 Zeiss Ultra 55 FA SEMs/TEMs/Dual Beams 1 inquire


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