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Pre-owned Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com

Please find below a list of Used Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com .Click on any listed item of Fab Metrology , Inspection and QC Equipment to see further data.


SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
105792 Accretech Tiger/ww50 1600 Bright-Field Inspection 300 mm 1 as is where is
105793 Accretech Win-Win 50 1600 Bright-Field Inspection 300 mm 1 as is where is
105794 Accretech Win-Win 50 1600 Bright-Field Inspection 300 mm 1 as is where is
105795 Accretech Win-Win 50 1600 Bright-Field Inspection 300 mm 1 as is where is
91841 ADE Episcan 1000 FT-IR Spectromter for measurement of Epitaxial films 100-200 mm 1 inquire immediately
92686 ADE FIT3120 PARTICLE COUNTER 300 mm 1 as is where is
97846 ADE NANOMAPPER SQM 300 mm 31.05.2001 1 as is where is
102631 ADE 9500 Wafer flatness measurement system with ASC1000 200 mm 1 inquire
102632 ADE 9500 Wafer flatness measurement system with ASC2500 200 mm 1 inquire
103225 ADE NanoMapper FA Nano-Defects Inspection System 300 mm 1 inquire immediately
101393 Agilent 7500a ICP Mass Spectrometer Laboratory 1 as is where is immediately
102974 AGILENT 4155C SEMICONDUCTOR PARAMETER ANALYZER 200 MM 1 as is where is
84360 Alcatel 925-40 Leak Detector 1 as is where is immediately
83514 Applied Materials Opal 7830i Enhanced CD-SEM 100 mm to 200 mm 01.05.1997 1 as is where is immediately
86422 Applied Materials Orbot WF720 Wafer inspection system 125 mm 1 as is where is
90947 Applied Materials UVision 4 Bright field inspection 300 mm 31.05.2009 1 as is where is
92045 Applied Materials UV 5 Wafer Inspection System 300 mm 31.05.2012 1 as is where is immediately
92800 Applied Materials Orbot WF720 Metrology (Metrology) 125 mm 1 as is where is
93395 Applied Materials UVision 3 Wafer Inspection System 200 mm 1 as is where is immediately
98084 Applied Materials UVision 5 Brightfield UV Wafer Inspection System 300 mm 31.05.2011 1 as is where is
98085 Applied Materials UVision 5 Brightfield UV Wafer Inspection System 300 mm 31.05.2012 1 as is where is
102100 Applied Materials NanoSEM 3D CD Metrology 300 mm 31.05.2002 1 as is where is immediately
102101 Applied Materials NanoSEM 3D CD SEM 300 mm 31.05.2002 1 as is where is immediately
102103 Applied Materials NanoSEM 3D Scanning Electron, CDSEM Measurement 300 mm 31.05.2004 1 as is where is
102104 Applied Materials NanoSEM 3D Scanning Electron, CDSEM Measurement 300 mm 31.05.2004 1 as is where is
102105 Applied Materials NanoSEM 3D Scanning Electron, CDSEM Measurement 300 mm 31.05.2004 1 as is where is
102986 Applied Materials Uvision 600SP Brightfield Inspection System 300 mm 31.05.2008 1 as is where is
105797 Applied Materials Uvision 200 Bright-Field Inspection 300 mm 1 as is where is
106078 Applied Materials SEMVISION G3 SEM 300 mm 01.05.2005 1 as is where is immediately
106186 Applied Materials Compass Pro 300 Patterned Wafer Inspection System 300 mm 01.06.2003 1 as is where is immediately
106289 APPLIED MATERIALS UVISION 5 Bright Field Inspection 300 mm 01.06.2013 1 as is where is immediately
106350 Applied Materials Uvision 200 Wafer Inspection 300 mm 01.06.2006 1 as is where is
101427 ASML YieldStar S-200B Overlay Measurement System 300mm 31.01.2011 1 as is where is
103070 ASML YieldStar S-250 Overlay Measurement System 300mm 1 as is where is
91387 AUGUST CV-9812 Wafer Carrier inspection tool 1 as is where is immediately
98447 August 3DI-8000 wafer bump inspection 300mm 1 as is where is immediately
98448 August NSX-95 2D Auto inspection system / Macro defect inspection system 200 mm 4 as is where is immediately
101818 August NSX105 Wafer Bumping Inspection System / Macro defect inspection 200mm 1 inquire
106336 August / Rudolph Technologies CV9812 Wafer Carrier inspection tool 1 as is where is immediately
95016 Bio-Rad Q8 Overlay Metrology 1 as is all rebuilt 1 month
99405 Bio-Rad Q5 (Upgrade to a Q6) Overlay Registration Tool up to 200 mm 2 as is where is immediately
99406 Bio-Rad Q7/Q8 Overlay metrology Tool 150 mm-200 mm 31.05.1997 1 as is where is immediately
99407 Bio-Rad QS-1200 FT-IR Spectrometer 100-200 mm 31.05.2004 1 as is where is immediately
99409 Bio-Rad QS-408M Manual FT-IR Spectrometer 100-200 mm 1 as is where is immediately
102587 Bio-Rad QS-300 FT-IR Spectrometer 1 as is where is immediately
33671 BIORAD Q5 Overlay Metrology Tool 200 mm 2 as is where is immediately
97995 Biorad Q5 Overlay measurement system 150mm 1 as is where is
106642 BROOKS METARA 7200 Overlay 200 mm 01.06.1996 1 as is where is
97850 Bruker DEKTAK-8ADP Scan Profiler 1 as is where is
102149 Bruker Insight 3D Mask House Photomask Inspection 300 mm 31.05.2017 1 as is where is
101769 Cambridge Scientific S360 SEM with EDS 1 as is where is immediately
95610 Cameca TXRF 8300 Automated TXRF with Specimen Chamber and Wafer Handling 300 mm 31.05.2007 1 as is where is immediately
102950 CAMECA IMS WF SECONDARY ION MASS SPECTROMETER Laboratory 31.05.2007 1 as is where is
103221 Cameca IMS 5FE7 Secondary Ion Mass Spectrometry System 1 as is where is immediately
105849 Cameca IMS 5FE7 Secondary Ion Mass Spectrometry System 1 as is where is immediately
106645 CAMECA EX300 Secondary Ion Mass Spectrometer 300 mm 1 as is where is
102151 Camtek X- ACT TEM Sample Preparation System 31.05.2012 1 as is where is
100723 Canon PLA501 Contact and Prossimity Mask Aligner 1 as is where is
102164 Carl Zeiss Axiotron-2 Microscope 200 mm 1 as is where is
102165 Carl Zeiss Axiotron-2 Micro scope 200 mm 1 as is where is
102167 Carl Zeiss Axiotron-2 Microscope 200 mm 1 as is where is
106434 CDE ResMap 168 RESISTIVITY MEASUREMENT 150 mm/200 mm 01.06.2015 1 as is where is immediately
106647 CYBER OPTICS CYBERSCAN C212/110 Laser Measure 200 mm 1 as is where is
103152 Dektak 3030 Profiler 1 inquire
100728 Delta Tech. GM SSR AX-PC/GM-1D X-Ray 31.05.2010 1 as is where is
102589 E+H MX 203-6-33 Wafer Bow Measurement System 100 - 150 mm 31.05.2008 1 as is where is immediately
106200 EDAX Eagle 2 Micro-probe EDX analyser Laboratory 01.06.2000 1 as is where is immediately
89978 Edwards IPX-500 Dry Pump 1 as is where is
92213 ESCO EMD-WA1000S Temperature Desorption Analyzer 200mm 31.05.2000 1 as is where is
100938 ESMO Hermes Testhead Manipulator Test 31.05.2006 3 as is where is immediately
79226 FEI DB 235 Dual Beam FIB SEM 01.06.2000 1 inquire
86292 FEI F30 Technai FIB SEM 1
86294 FEI DB 835 FIB SEM 1
86300 FEI Nova nano 230 FIB SEM 1 inquire immediately
92040 FEI TF30 Super twin 30.09.2007 1 as is all rebuilt immediately
92713 FEI Dual beam 820 FIB SEM 200 mm 01.05.1997 1 as is where is immediately
93961 FEI Altura Dual beam FIB 31.12.2003 1 as is where is immediately
96041 FEI Helios Nanolab 400 FIB SEM 100 mm 31.05.2008 1 inquire
99853 FEI XL40 Cross Section SEM 1 inquire
101711 FEI Helios 450S Dual Beam FIB-SEM 1 inquire
101712 FEI Strata 400 Focused Ion Beam System 1 inquire
103002 FEI 200XP Focus Ion Beam System 31.05.2005 1 as is where is
103436 FEI Tecnai G2 F30 TEM electron microscope Laboratory 01.05.2005 1 as is where is immediately
86235 FEI Company 820 Dual Bem Fib SEM 200 mm 1 as is where is immediately
101441 FEI Company Tecnai G2 F30 TEM Laboratory 1 as is where is immediately
106239 FEI Company 820 Dual Column Focused Ion Beam Laboratory 01.01.1993 1 as is where is immediately
101843 Filmetrics F50 Thin Film Analyzer 1 as is where is immediately
106473 Four Dimensions MODEL 280 / 280C Resistivity Measurement / Four Point Probe 200 mm 01.06.1995 1 as is where is immediately
55974 FRONTIER FSM900TC-VAC FILM STRESS AND WAFER BOW MEASUREMENT 200 mm 30.04.2000 1 as is where is immediately
90155 FSM FSM 500TC THIN FILM STRESS MEASUREMENT 31.01.2007 1 as is where is
90156 FSM 500TC THIN FILM STRESS MEASUREMENT 31.05.2004 1 as is where is immediately
93084 FSM SYMPHONYMC Life Time 300 MM 1 as is where is
96543 Gaertner L115C-8 Ellipsometer, cassette to cassette 100-200 mm 28.02.1995 1 as is where is immediately
99414 GCA/Tropel 9000 Wafer Flatness Analyzer 1 as is where is
102218 GEMETEC Elymat III WSPS 300 mm 1 as is where is
71907 Hamamatsu C7103 PC Controlled IC Back-side Lapping and Wafer Grinding System 200 mm and packages 30.09.2001 1 as is where is immediately
97928 HANRA HRI-580L INSPECTION SYSTEM ASSEMBLY 2 inquire
97859 HERMES NMI-100 DEFECT INSPECTION 1 as is where is
98118 Hermes Microvision eScan320 ebeam Inspection 300 mm 1 as is where is
101442 Hermes Microvision eP3 XP E-beam Inspection 300mm 31.05.2014 1 as is where is
101443 Hermes Microvision eP3 XP E-beam Inspection 300mm 31.05.2014 1 as is where is
102219 Hermes Microvision eP3 XP E-Beam Inspection System 300 mm 31.05.2012 1 as is where is
102220 Hermes Microvision eP4 CFM_EBeam Inspection HMI 300 mm 31.05.2017 1 as is where is
102222 Hermes Microvision eScan500 EBeam Inspection_HMI 300 mm 31.05.2014 1 as is where is
102959 HIMS NMI-100 DEFECT INSPECTION 300 mm 1 as is where is
52166 Hitachi 545-5515 DC power supply module for CD SEM spares 1 as is where is immediately
52167 Hitachi 6280H Power Supply Module 4channels spares 1 as is where is immediately
52168 Hitachi 545-5540 Power Supply unit for CD SEM Spares 1 as is where is immediately
52312 Hitachi 545-5522 VG board for CD SEM spares 31.05.1994 1 as is where is immediately
52339 Hitachi 545-5521 EVAC PCB FOR HITACHI CD-SEM spares 31.05.1994 1 as is where is immediately
52340 Hitachi 545-5537 IP-PC2 for cd-sem spares 31.05.1994 1 as is where is immediately
52343 Hitachi 377-7592 Power Supply Module for CD SEM spares 31.05.1994 1 as is where is immediately
53054 HITACHI 6280H (SPARES) SORD Computer for cd sem system spares 1 as is where is immediately
56838 Hitachi S-4500 FE Inspection SEM Type 1 chamber 1 as is all rebuilt immediately
60939 HITACHI S4160 Scanning electron microscope 31.05.1996 1 as is where is
65359 HITACHI S-9220 SIP baord for CD-SEM S9220,P/N 568-5591 1 as is where is immediately
74794 Hitachi S5200 FE SEM with EDX Inspection 31.05.2005 1 as is where is immediately
78108 Hitachi S4700 Type 2 FE-SEM Up to 6 inch 31.05.2006 1 as is all rebuilt immediately
83585 Hitachi S5000H Field Emission SEM Laboratory 1 as is where is immediately
84345 Hitachi EA8000 X-ray Particle Contaminant Analyzer 1 as is where is immediately
86169 HITACHI FB-2000A FIB Sem 200 mm 31.05.2001 1 as is where is
86171 HITACHI S-4700 (w/EDAX) FE SEM with EDX 31.05.1998 1 as is where is immediately
86172 HITACHI S-5000 FE SEM 200 mm 31.05.1994 1 as is where is
86173 HITACHI S-5000 FE SEM 200 mm 31.05.1996 1 as is where is
86174 HITACHI S-5000 FE SEM 200 mm 31.05.1999 1 as is where is
86175 HITACHI S-5000 FE SEM 200 mm 31.05.2000 1 as is where is
86275 Hitachi RS4000 In-line Defect Review SEM 200 mm / 300 mm 31.12.2006 1 as is where is immediately
86296 Hitachi 3600N SEM 1 inquire immediately
86297 Hitachi S5200 FE-SEM 1 inquire immediately
88948 Hitachi S9380 CD SEM metrology ( Working ) Spares 1 inquire immediately
88949 Hitachi S9380 II CD SEM metrology (As-Is) Spares 1 as is where is immediately
91085 HITACHI IS-2700 Wafer Inspection Station 300 mm 1 as is where is
91086 HITACHI S-4160 FE SEM Laboratory 31.05.1996 1 as is where is
91087 HITACHI S-4160 FE SEM Laboratory 31.05.1996 1 as is where is
91088 HITACHI S-4800 FE SEM Laboratory 31.05.2005 1 as is where is
91089 HITACHI S-5500 FE SEM Laboratory 31.05.2006 1 as is where is
91090 HITACHI S-5500 FE SEM Laboratory 31.05.2012 1 as is where is
91091 HITACHI S-5500 FE SEM Laboratory 31.05.2010 1 as is where is
91395 HITACHI I-6300 CD SEM 1 as is where is
91397 HITACHI IS2700SE Dark Field inspection 1 as is where is
91403 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91404 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91405 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91407 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91408 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91417 HITACHI LS-6800 wafer surface inspection 300 mm 31.08.2007 1 as is where is immediately
91418 HITACHI UA-7200 Stripper/Asher 31.05.2001 1 as is where is
91848 HITACHI S7000 CD SEM 150 mm 31.05.1989 1 as is where is immediately
95070 Hitachi S5000 SEM Scanning Electron Microscope Hitachi S5000 with Noran 445A-3SES detector Laboratory 31.12.2013 1 as is where is immediately
95361 Hitachi IS3000 DARK FIELD INSPECTION 300 mm 31.05.2007 1 as is where is
95729 Hitachi WA 3300 Atomic Force Microscope 300 mm 31.05.2007 1 as is where is immediately
95934 Hitachi HD-2300 Scanning Transmission Electron Microscope 300 mm 1 as is where is
95952 Hitachi WA3300 Atomic Force Microscope (AFM) 300 mm 01.05.2007 1 as is where is immediately
95998 HITACHI EDAX 136-5 Energy Dispersive X-ray Spectrometer Laboratory and Scientific 1 as is where is
96044 Hitachi S-4800-II FE SEM 200 mm 31.05.2004 1 inquire
96046 Hitachi S-5200 FE SEM Laboratory and Scientific 1 inquire
96047 Hitachi SU-70 High Resolution Field Emission SEM Laboratory and Scientific 31.05.2008 1 inquire
98206 Hitachi S-5000 FA SEMs/TEMs/Dual Beams 1 inquire
98207 Hitachi S-7800 Metrology and Inspection 200 mm 31.07.1997 1 inquire
98269 HITACHI RS 4000 Defect Review SEM 300 mm 31.05.2003 1 as is where is
98270 HITACHI RS 4000 Defect Review SEM 300 mm 31.05.2003 1 as is where is
98506 Hitachi WA200 SEM 200 mm 1 as is where is
99159 Hitachi CG-4100 SEM - Critical Dimension (CD) Measurement 300mm 1 as is where is
99856 Hitachi S4500 Field Emission SEM 31.05.1993 1 inquire
100157 Hitachi CG-4100 SEM - Critical Dimension (CD) Measurement 300mm 1 as is where is
101715 Hitachi HD-2300 STEM 1 inquire
101716 Hitachi Regulus SU-8230 FE SEM 1 inquire
101717 Hitachi S-4700-II FE SEM 1 inquire
101718 Hitachi S-4800-II FE SEM 1 inquire
101719 Hitachi SU-1500 SEM 1 inquire
102223 Hitachi AS5000 Wafer Particle & Defect Analysis System AS-5000 200 mm 31.05.1997 1 as is where is
102225 Hitachi HF-2000 EDX/EELs/STEM imaging 31.05.1995 1 as is where is
102227 Hitachi RS4000 DR SEM 300 mm 31.05.2005 1 as is where is
102228 Hitachi RS4000 Defect SEM inspection 300 mm 31.05.2006 1 as is where is
102229 Hitachi RS4000 DR SEM 300 mm 31.05.2006 1 as is where is
102230 Hitachi RS4000 DR SEM 300 mm 31.05.2007 1 as is where is
102231 Hitachi RS4000 DR SEM 300 mm 31.05.2007 1 as is where is
102232 Hitachi RS4000 DR SEM 300 mm 31.05.2007 1 as is where is
102699 Hitachi CG-4100 SEM - Critical Dimension (CD) 300 mm 28.02.2013 1 as is where is
102965 HITACHI IS3000 DARK FIELD 300 mm 31.05.2007 1 as is where is
103088 Hitachi CG5000 SEM 300mm 30.04.2014 1 as is where is
103089 Hitachi CG5000 SEM 300mm 30.06.2014 1 as is where is
103525 HITACHI S4700-l Scanning Electron Microscope Laboratory 31.05.2004 1 as is where is immediately
103526 HITACHI S4700-ll FE Sem with Horriba EMAX EDX Laboratory 31.05.2001 1 as is where is immediately
103527 HITACHI S4700-ll FE Sem with Horriba EMAX EDX (Destocking Status) Laboratory 31.05.2003 1 as is where is immediately
103706 Hitachi 4700 FE SEM Laboratory 31.05.2000 1 as is where is immediately
106061 Hitachi SU 8010 Ultra High Resolution Field Emission Scanning Electron Microscope 100 mm 01.06.2007 1 as is where is immediately
106255 Hitachi HD-2700 STEM Laboratory 1 as is where is
106315 HITACHI LS9000 Wafer Surface Inspection System 300mm 01.06.2010 1 as is where is
106367 HITACHI IS-2700 Wafer Inspection 200 mm 01.06.2005 1 as is where is
106368 HITACHI S-9260A Wafer Inspection 200 mm 01.06.2006 1 as is where is
106662 HITACHI FB2100 FIB 200 mm 01.06.2003 1 as is where is
106663 HITACHI IS3000SE WAFER PARTICLE INSPECTION 300 mm 01.06.2006 1 as is where is
106664 HITACHI IS3200SE WAFER PARTICLE INSPECTION 300 mm 01.06.2010 1 as is where is
106665 HITACHI LS9000 Wafer Surface Inspection 300 mm 01.06.2010 1 as is where is
106666 HITACHI LS-6800 Wafer Surface Inspection 300 mm 01.06.2007 1 as is where is
106782 HMI E SCANLIGHT E-Beam inspection system 300 mm 01.06.2008 1 as is where is
87825 Horiba PD3000 Reticle inspection system 200 MM 31.05.1995 1 as is where is immediately
88596 Horiba PR-PD2 Reticle/Mask Particle Detection System 150 MM 01.03.2006 1 as is where is immediately
90670 Horiba Jobin Evon PZ2000 Ellipsometer 200 mm 31.05.2000 1 as is where is immediately
97863 HP 16500C Logic Analyser 1 as is where is
102239 HSEB AXIOSPECT 301 Optical Microscope 300 mm 1 as is where is
103092 HSEB Axiospect 300 Optical Review System 300mm 1 as is where is
106667 HSEB AXIOSPECT 300 MICROSCOPE INSPECTION STATION 300 mm 1 as is where is
102559 HSEB Zeiss Axiotron 300 AOI microscope with 2 units of Brooks load port 300 mm 1 as is where is immediately
106501 Irvine Optical Auto Wafer Loader Microscope Inspection WAFER INSPECTION MICROSCOPE WITH AUTOLOADER 150 mm/200 mm 1 as is where is immediately
106502 Irvine Optical Auto Wafer Loader Microscope Inspection WAFER INSPECTION MICROSCOPE WITH AUTOLOADER 150 mm/200 mm 01.06.1990 1 as is where is immediately
106504 Irvine Optical Auto Wafer Loader Microscope Inspection WAFER INSPECTION MICROSCOPE WITH AUTOLOADER 200 mm 01.06.1990 1 as is where is immediately
91419 J.A Woollam VUV-VASE (Gen II) Ellipsometer 300 mm 1 as is where is
91420 J.A Woollam VUV-VASE VU302 (Gen I) Ellipsometer 200 mm 31.05.2001 1 as is where is
87098 JEOL JWS-7505 Defect review SEM w/ EDX, untested 200 mm 31.12.2000 1 as is where is
87627 JEOL JSM 6400 Scanning Electron Microscope 1 as is where is immediately
87828 Jeol JWS7555 Scanning Electron Microscopes 200 mm 31.12.1999 1 as is where is immediately
91422 JEOL JSM-5600 FE SEM 31.05.1999 1 as is where is
91424 JEOL JSM-6700F FE SEM 1 as is where is
91899 Jeol jSM 6330F FIELD EMISSION SEM 1 as is where is immediately
92068 JEOL JSM 6400F Scanning Electron Microscope 1 as is where is immediately
92220 JEOL JWS-7555 SEM - Defect Review (DR) 200mm 1 as is where is immediately
93311 JEOL JSM-6320 Field Emission SEM Laboratory 1 as is where is immediately
97999 JEOL JWS 7700 DR SEM 200 mm 31.05.1996 1 as is where is
98123 JEOL ARM200CF Super X PFA 31.05.2014 1 as is where is
100991 Jeol JWS7500E w/Noran EDX Wafer Inspection System (SEM) 200 mm 31.05.2000 1 as is where is immediately
101692 Jeol JSM-6060LV SEM 1 inquire immediately
102244 JEOL JEM3200FS High Resolution TEM 300 mm 31.05.2006 1 as is where is
102245 JEOL JWS-7515 SEM Wafer Inspection Tool 200 mm 31.05.1999 1 as is where is
102246 JEOL JWS-7555 SEM Wafer Inspection Tool 200 mm 31.05.2000 1 as is where is
102247 JEOL JWS-7555 SEM Wafer Inspection Tool 200 mm 31.05.2002 1 as is where is
102486 Jeol JSM-6600F SEM 31.05.2014 1 as is where is immediately
102651 Jeol JEM-2100 TEM laboratory 1 as is where is immediately
102652 Jeol JSM-7001 FLV SEM 1 inquire 1 month
102653 Jeol JEM-2500SE TEM 1 inquire 1 month
102705 JEOL JFS-9855S Focused Ion Beam System 200mm 31.05.2000 1 as is where is immediately
102968 JEOL JSM-7500F SEM Laboratory 31.05.2009 1 as is where is
103158 Jeol JSM-6400F SEM 31.05.2017 1 inquire
103460 Jeol JSM6400 Scanning Electron Microscope Laboratory 31.05.1992 1 as is where is immediately
105807 JEOL JEM-2500SE Transmission Electron Microscope 300 mm 1 as is where is
105808 JEOL JEM-2500SE Transmission Electron Microscope 300 mm 1 as is where is
106668 JEOL JWS-7500E SCANNING ELECTRON MICROSCOPE 200 mm 1 as is where is
91427 Jordan Valley JVX 6200 X-ray metrology (X-Ray Reflectivity) 300 mm 1 as is where is
95012 Jordan Valley JVX 5200T X-Ray Reflectometer 200 MM / 300 MM 31.05.2006 1 as is where is
98000 Jordan Valley VVX 5200T METROLOGY 300 mm 31.05.2006 1 as is where is
99830 JORDAN VALLEY JVX6200I X-ray Metrology System 300 mm 28.02.2011 1 as is where is immediately
100917 Jordan Valley JVX6200 X-Ray Inspection System 300 mm 31.05.2010 1 as is where is
102248 Jordan Valley BedeMetrix-F X-Ray reflectometer 200 mm 31.05.2006 1 as is where is
102250 Jordan Valley JVX6200i Film Thickness Measurement 300 mm 31.05.2011 1 as is where is
102252 Jordan Valley JVX7300 Film Thickness Measurement 300 mm 31.05.2012 1 as is where is
102256 Karl Suss MA200 COMPACT Mask Aligner 200 mm 31.05.2012 1 as is where is
88368 KLA P15 WAFER SURFACE PROFILOMETER 200 mm OR SMALLER 01.05.2007 1 inquire immediately
92658 KLA 6220 Defect Inspection System 1
106057 KLA 2915 Brightfield Wafer Defect Inspection System 300 mm 01.02.2014 1 as is where is immediately
106168 KLA Candela CS20 Wafer Surface Inspection System 100 mm to 200 mm 01.06.2006 1 as is where is immediately
91992 KLA -TENCOR 8100 Critical Dimension Measurement CD-SEM (FOR SPARES USE) 200 mm 31.05.1999 2 as is where is immediately
106056 KLA / TENCOR / PROMETRIX SM 200 Spectramap 200 wafer film thickness measurement system 200 mm 01.12.1986 1 as is where is immediately
32230 KLA TENCOR SFS6400 MECHANICAL CALIBRATION Document Number 238 WAFERSURFACE ANALYSIS SYSTEM CUSTOMER MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
32231 KLA TENCOR Surfscan 64X0 Calibration Procedure Surfscan 64X0 Calibration Procedure MANUAL 1 as is where is immediately
32232 KLA TENCOR surfscan 64XX optical alignments Document Number 236 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
32233 KLA TENCOR SFS6x00 MECHANICAL CALIBRATION Document number 200 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
103161 KLA Tencor Surfscan 5500 Unpatterned Wafer Surface Inspection Tool 200 mm 1 inquire
106481 KLA Tencor AIT I Patterned Surface Inspection System 150 mm/200 mm 01.06.1995 1 as is where is immediately
106574 KLA TENCOR SEM-3800C Scanning Electron Microscope N/A 1 as is where is
106674 KLA TENCOR Viper 2430 Macro Defect Inspection 300 mm 01.06.2004 1 as is where is
106675 KLA TENCOR Viper 2435 Macro Defect Inspection 300 mm 01.06.2004 1 as is where is
106676 KLA TENCOR Viper 2435XP Macro Defect Inspection 300 mm 01.06.2004 1 as is where is
106679 KLA TENCOR 2132 (mainbody only) Wafer Inspection System 150 mm,200 mm 01.06.1995 1 as is where is
106680 KLA TENCOR P-12 Profileometer 150 mm,200 mm 1 as is where is
106681 KLA TENCOR P-2 Profileometer 150 mm,200 mm 01.06.1996 1 as is where is
99837 KLA- TENCOR P-22H Metrology Tool 200 mm 1 as is all rebuilt immediately
91991 KLA-TENCOR 8100 XP Critical Dimension Measurement CD-SEM 200 mm 31.05.2000 2 as is where is immediately
98061 KLA-TENCOR AIT 1 Dark field, particle inspection 150 mm / 200 mm 1 inquire immediately
102842 KLA-TENCOR UV1280SE Film Thickness Measurement System / Ellipsometer 200 mm 1 inquire immediately
99845 KLA-Tencor 2351 Bright-Field Wafer Inspection System 200 mm 1 as is where is immediately
1691 KLA-TENCOR 259 (spare parts) Reticle Inspection - SPARE PARTS up to 7 inch 01.12.1991 1 inquire immediately
52151 KLA-Tencor Hamamatsu R1924A Photomultiplier spares 31.03.2007 1 inquire immediately
53035 KLA-Tencor 2132 (8 inch Wafer Chuck Assembly) Ceramic Wafer chuck, 8" spares 1 as is where is immediately
53036 KLA-Tencor Compumotor M575L11 Stepping motor drive spares 1 as is where is immediately
70127 KLA-Tencor AIT UV PATTERNED WAFER INSPECTION 200 mm 31.07.2003 1 as is where is immediately
71632 KLA-TENCOR 2122 Brightfield Wafer Defect Inspection System 200 mm 01.04.1996 1 as is where is immediately
76676 KLA-TENCOR AIT XP FUSION Dark Field WAFER PARTICLE DETECTION 200 mm 01.10.2002 1 as is where is immediately
76677 KLA-TENCOR AIT FUSION Dark Field WAFER PARTICLE DETECTION 200 mm 01.06.2002 1 as is where is immediately
76681 KLA-TENCOR AIT UV Dark Field WAFER PARTICLE DETECTION 200 mm 31.12.2002 1 as is where is immediately
76684 KLA-TENCOR P20H PROFILOMETER 200 mm 01.03.1996 1 as is where is immediately
83702 KLA-Tencor AMRAY 4200 Review SEM 8" 28.02.1999 1 as is where is immediately
85954 KLA-Tencor AIT XP Parts/Options 200 mm 1 as is where is
86419 KLA-Tencor AIT 1 wafer particle detection 150 mm 1 as is where is
86424 KLA-Tencor 7700 Surfscan 125 mm 31.01.1996 1 as is where is
87421 KLA-Tencor Puma 9550 WAFER INSPECTION 300 mm 01.10.2011 1 as is where is
87790 KLA-Tencor FLX 2908 Thin Film Measurement System 200 mm 31.03.1996 1 as is where is immediately
88266 KLA-Tencor eS20XP E-beam Inspection 200mm 31.12.2000 1 as is where is
88365 Kla-Tencor 2135 XP Brightfield wafer defect inspection 150 mm or 200 mm 31.05.1997 1 inquire immediately
88366 Kla-Tencor 2139 Birghtfield wafer defect inspection 150 mm or 200 mm 31.05.2000 1 as is where is immediately
88370 Kla-Tencor FLX 2908 Wafer Stress Measurement 1 inquire
88378 Kla-Tencor Alpha Step IQ Profileometer Manual 1 inquire immediately
88379 Kla-Tencor AIT 2 Surfscan wafer particle detection system 200 mm 31.05.1998 1 inquire
88605 KLA-Tencor EDR5210 Defect Review SEM 300 MM 31.05.2010 1 as is where is
88607 KLA-Tencor INM100+INS10 Metrology 150 MM 1 as is where is
89977 KLA-Tencor Surfscan 4000 Wafer surface particle inspection 150mm 1 as is where is immediately
90957 KLA-Tencor EDR5210 DR SEM 300 mm 1 as is where is
90960 KLA-Tencor NANOMAPPER Nanotopography 300 mm 31.05.2006 1 as is where is
90961 KLA-Tencor Puma 9000 Dark field defect Inspection 300 mm 31.05.2005 1 as is where is
91435 KLA-Tencor AIT Particle Review 200 mm 31.05.1997 1 as is where is
91464 KLA-Tencor PROMETRIX FT750 Film Thickness Measurement 1 as is where is
91466 KLA-Tencor PROMETRIX FT750 Film Thickness Measurement 1 as is where is
91477 KLA-Tencor THERMA-WAVE OP 2600 OPTI-PROBE 200 mm 1 as is where is immediately
91990 KLA-TENCOR AIT I Surfscan wafer particle detection system 200 mm 31.05.1998 2 as is where is immediately
92705 KLA-Tencor ES35D E-BEAM INSPECTION 300 MM 31.05.2006 1 as is where is
92813 KLA-Tencor MPV CD2 AMC Optical Wafer Metrology 125 mm 1 as is where is
92814 KLA-Tencor MPV CD2 AMC Optical Wafer Metrology 125 mm 1 as is where is
92815 KLA-Tencor MPV-CD Optical Wafer Metrology 125 mm 1 as is where is
92817 KLA-Tencor Surfscan 7700 Particle Counter (Metrology) 125 mm 1 as is where is
96052 KLA-Tencor ASET F5 Film Thickness Measurement System 200 mm 1 inquire
96053 KLA-Tencor Spectra CD F5X w/CD Surface Characterization 200 mm 31.05.2002 1 inquire
96998 KLA-Tencor Surfscan AIT 8010 Patterned Wafer Inspection 200 mm 31.05.1997 1 as is where is immediately
97450 KLA-Tencor SP1-TBI Wafer Particle Inspection System 300 mm 31.08.2004 1 as is where is immediately
98002 KLA-Tencor ES31 ebeam inspection 300 mm 31.05.2011 1 as is where is
98003 KLA-Tencor ES32 ebeam inspection 300 mm 31.05.2005 1 as is where is
98134 KLA-Tencor Viper Macro Defect Detection System 300 mm 31.05.2010 1 as is where is
98399 KLA-Tencor 2132 Brightfield Wafer Defect Inspection System 200 mm 31.07.1997 1 as is where is immediately
98400 KLA-Tencor AIT I Surfscan Patterned Wafer Surface Inspection 200 mm 1 as is where is immediately
98403 KLA-Tencor SFS-7600 Patterned Wafer Surface Inspection 150 mm 1 as is where is
98404 KLA-Tencor UV-1050 Thin Film Measurement System 150 mm 1 as is where is
98548 KLA-Tencor AIT XP Fusion Darkfield Pattern Inspection 200 mm 3 inquire
98549 KLA-Tencor AIT XP Darkfield Pattern Inspection 200 mm 1 inquire immediately
98551 KLA-Tencor ES31 SEM Defect Inspection 200 mm 1 as is where is immediately
98552 KLA-Tencor UV1050 Film Thickness Measurement 150 mm-200 mm 1 inquire
98553 KLA-Tencor UV1080 Film Thickness Measurement 150 mm-200 mm 1 inquire
98858 KLA-Tencor Surfscan 4500 Unpatterned Wafer Surface Inspection 2 inch to 6 inch 30.11.1989 1 as is where is immediately
98912 KLA-Tencor AIT XP Defect Inspection 1 as is where is
98914 KLA-Tencor Spectra FX-1000 HT Thin film measurement system 1 as is where is
98918 KLA-Tencor Viper 2401 After Develop Inspection Tool 4 inch to 8 inch 31.10.2000 1 as is where is immediately
99441 KLA-Tencor 5200 Overlay Measurement System 200 mm 2 inquire immediately
99859 KLA-Tencor 5011 Overlay precision measurement system 1 inquire
99912 KLA-Tencor KLA2131 Inspection System 200 mm 31.05.1995 1 as is where is
100186 KLA-Tencor eS32 E-beam Inspection 300mm 31.05.2007 1 as is where is
100187 KLA-Tencor eS37 E-beam Inspection 300mm 31.05.2009 1 as is where is
100730 KLA-Tencor Alpha Step IQ Surface Profiler 31.05.2010 1 as is where is
100907 KLA-Tencor SFX100 Thickness Measurement System 300 mm 31.05.2004 1
101342 KLA-Tencor AIT I Patterned Surface Defect Inspection System 200 mm 31.01.1998 1 as is where is immediately
101452 KLA-Tencor WaferSight Wafer Characterization 300 mm 31.10.2005 1 as is where is immediately
102261 KLA-Tencor CRS1010 Review Station 200 mm 31.05.1998 1 as is where is
102262 KLA-Tencor DP2 Data Prep Station 31.05.2012 1 as is where is
102263 KLA-Tencor eS31 E-beam Inspection 300 mm 31.05.2004 1 as is where is
102267 KLA-Tencor FX200 Thickness measurement 300 mm 31.05.2006 1 as is where is
102270 KLA-Tencor Puma 9000 Dark Field Inspection 300 mm 31.05.2005 1 as is where is
102273 KLA-Tencor Surfscan 2.1 Particle Counter 125 mm 1 as is where is
102472 KLA-Tencor 6220 Bare Wafer Particle Detection System 150 mm / 200 mm 1 inquire immediately
102477 KLA-Tencor P-10 Manual Wafer Load Disk Profilometer 200 mm 1
102634 KLA-Tencor 6400 Patterned Wafer Particle Inspection System 150 mm / 200 mm 1 inquire 1 month
102709 KLA-Tencor eS32 E-beam Inspection 300 mm 1 as is where is
102710 KLA-Tencor eS32 E-beam Inspection 300 mm 1 as is where is
102969 KLA-Tencor FIT3120 PARTICLE COUNTER 300 mm 31.05.2005 1 as is where is
103096 KLA-Tencor AIT UV Darkfield Inspection 300mm 31.05.2004 1 as is where is
103162 KLA-Tencor P-15 Profiler 200 mm 1 inquire
103163 KLA-Tencor P-11 Profiler 1 inquire
103164 KLA-Tencor Surfscan 4000 Unpatterned Wafer Surface Inspection Tool 150 mm 31.05.1986 1 inquire
103166 KLA-Tencor Surfscan 5000 Unpatterned Wafer Surface Inspection Tool 200 mm 31.05.1988 1 inquire
103733 KLA-Tencor Surfscan 4500 Wafer Particle Inspection System 2 to 6 inch 31.05.1986 1 as is where is immediately
105783 KLA-Tencor ES32 E-Beam Inspection System 1 as is where is
105809 KLA-Tencor es32 E-Beam Inspection 300 mm 1 as is where is
105810 KLA-Tencor es32 E-Beam Inspection 300 mm 1 as is where is
105811 KLA-Tencor es32 E-Beam Inspection 300 mm 1 as is where is
106002 KLA-Tencor Archer 200 AIM Overlay Measurement System 300 mm 30.04.2010 1 as is where is immediately
106194 KLA-Tencor Candela 7100 Wafer Inspection system for Hard Disk Substrates 01.12.2010 1 as is where is immediately
106256 KLA-Tencor Spectra-Shape 8660 Optical CD Measurement System 300 MM 1 as is where is
106311 KLA-TENCOR VISEDGE CV300 Wafer-Edge Inspection 300 mm 01.06.2007 1 as is where is immediately
102284 Kokusai VR-120SD Resistivity Measurement 300 mm 1 as is where is
97865 KRUSS KRUSSDSA100 CONTECT ANGLE MEASUREMENT 1 as is where is
94475 LASERTEC BGM300 Wafer Surface Analyzing and VIsualization System 200 mm 31.05.2008 1 as is where is
106702 LASERTEC BGM300 Wafer Inspection System 300 mm 1 as is where is
88268 Leica INM20 Microscope 200mm 1 as is where is immediately
88269 Leica INS10 Microscope 200mm 1 as is where is
97106 Leica MZ 12.5 Stereomicroscope 1 as is where is
103110 Leica LDS3300C Macro-Defect 300mm 1 as is where is
106485 Leica LEICA INM20 Microscope inspection station 200 mm 01.06.1995 1 as is where is immediately
86193 LEITZ MPV-SP Wafer Inspection Microscope 200 mm 1 as is where is
86420 Leitz MPV CD2 AMC Wafer inspection microscope 125 mm 1 as is where is
86421 Leitz MPV CD2 AMC Wafer inspection microscope 125 mm 1 as is where is
86423 Leitz MPV-CD Wafer inspection microscope 125 mm 1 as is where is
86426 Leitz INM100+INS10 Wafer inspection microscope 150 mm 1 as is where is
102168 Leo 1530 FE-SEM up to 8 inch 31.05.2002 1 as is where is
99419 MDC CSM Automatic CV Plotter with RM-1600 Computer 1 as is where is immediately
99420 MDC CSM/16 Automatic CV Plotter with RM-1600 Computer 125 MM 1 as is where is immediately
98005 MicoMetrics Precis Overlay measurement system 200 mm 31.05.2010 1 as is where is
99422 Minato MM-6600 Wafer Mobility Tester 2 as is where is
91113 MITUTOYO MP2000 METRO 200 mm 1 as is where is
100737 Mitutoyo YC-H260 Measurement Machine 1 as is where is
106703 N&K ANALYZER 5700-CDRT Wafer Inspection System 1 as is where is
106704 n&k Technology 6700-CDRT Wafer Inspection System 1 as is where is
106705 NANO OPTICS HAZE 2 Nano Optics Haze 2 200 mm 1 as is where is
71741 Nanofab Nano150 Ion Beam Lithography / Implanter System 150 mm 1 inquire immediately
105883 Nanofab Nano200 Ion Beam Lithography / Implanter System 200 mm 1 inquire immediately
86425 Nanometrics Nanospec AFT 210 surface inspection 125 mm 1 as is where is
91526 NANOMETRICS Caliper Mosaic Overlay 300 mm 31.05.2003 1 as is where is immediately
91527 NANOMETRICS Caliper Mosaic Overlay 300 mm 31.05.2010 1 as is where is immediately
91529 NANOMETRICS Caliper Mosaic Overlay 300 mm 28.02.2010 1 as is where is immediately
91530 NANOMETRICS NANOMETRICS 9-7200-0195E Mask & Wafer Inspection 200 mm 1 as is where is
92041 Nanometrics 9010B Metrology 1 as is where is immediately
92818 Nanometrics NanoSpec 210 Metrology (Metrology) 125 mm 1 as is where is
98153 Nanometrics Caliper Mosaic Overlay Measurement 300 mm 31.05.2011 1 as is where is
98154 Nanometrics Caliper Mosaic Overlay Measurement 300 mm 31.05.2009 1 as is where is
98155 Nanometrics Caliper Mosaic Overlay Measurement 300 mm 31.05.2009 1 as is where is
98289 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 31.05.2005 1 as is where is
98290 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 31.05.2005 1 as is where is
98291 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 30.06.2006 1 as is where is immediately
98480 Nanometrics 8000X film thickness measurement 150mm 2 as is where is immediately
98481 Nanometrics 8000Xse film thickness measurement 200mm 2 as is where is
98508 Nanometrics M6100 Film Thickness Measurement 200 mm 1 as is where is
101585 NANOMETRICS CALIPER-ULTRA Overlay Measurement 300 mm 30.06.2006 1 as is where is
102309 Nanometrics Caliper Q300 Overlay Measurement System 300 mm 31.05.2003 1 as is where is
102310 Nanometrics Caliper Q300 Overlay Measurement 300 mm 31.05.2003 1 as is where is
102311 Nanometrics Caliper Q300 Overlay Inspection 300 mm 31.05.2002 1 as is where is
102312 Nanometrics Caliper Q300 Overlay Measurement 300 mm 31.05.2002 1 as is where is
102314 Nanometrics Q200I Overlay Measurement System 200 mm 31.05.2000 1 as is where is
102315 Nanometrics Q200I Overlay Measurement 200 mm 31.05.2002 1 as is where is
102840 NANOMETRICS 9010 Integrated Metrology System 31.12.2007 5 as is where is immediately
103544 NANOMETRICS CALIPER ELAN Overlay 300 mm 31.05.2004 1 as is where is
106179 Nanometrics 9000 Nanospec 9000 Metrology thickness tool 200 mm 01.06.2005 1 as is all rebuilt immediately
106264 Nanometrics 9010 Lithos CD Measurement System 300 MM 1 as is where is
106302 Nanometrics SIPHER PL Mapping 300 mm 01.06.2002 1 as is where is immediately
106706 NANOMETRICS CALIPER_ULTRA Mask & Wafer Inspection 300 mm 01.06.2006 1 as is where is
105817 Negevtech NT3100 Optical Inspection Microscope 300 mm 1 as is where is
105818 Negevtech NT3100 Optical Inspection Microscope 300 mm 1 as is where is
97868 Newport 1830-C Optical Power Meter 1 as is where is
93103 NGR NGR2150 E-beam wafer inspection 300 MM 1 as is where is
102888 Nicolet ECO-1000S FT-IR 200 mm 31.05.1996 1 as is where is
82904 Nikcon AMI-2000 Surface Analyzer 01.06.2003 1 as is where is immediately
33708 NIKON Optiphot 88 Wafer Inspection Microscope 200 mm 1 as is where is immediately
64341 Nikon VMR 3020 Video Measuring System 31.12.2000 1 as is where is immediately
88273 Nikon OPTIPHOT 200 Microscope 200mm 1 as is where is
91863 NIKON Optiphot 150 Wafer Inspection Microscope, 10X, 20X, 50X & 150X Objs., 150mm XY Stage 150 mm 1 as is all rebuilt immediately
91864 NIKON Optiphot 200 (For spares use) Wafer Inspection Microscope (Parts Tool Only) 200 mm 1 as is where is immediately
92616 Nikon OPTISTATION V Optical Review System 200mm 1 as is where is
92617 Nikon OPTISTATION V Optical Review System 200mm 1 as is where is
92707 NIKON VMR-C4540 FOUP INSPECTION 300 MM 31.05.2001 1 as is where is
92825 Nikon OPTIPHOT 66 Microscope (Metrology) 150 mm 1 as is where is
96395 Nikon Lasermark Overlap Inspection System Inspection System 200 - 300 mm 31.05.2013 1 as is where is immediately
99396 Nikon EpiPhot 200 Inspection Microscope 200 mm 1 as is where is immediately
99424 Nikon Optiphot 150 Wafer Inspection Microscope 150 mm 1 as is where is immediately
99425 Nikon Optistation 3 Microscope Wafer Inspection Satation with cassette to cassette handling 150 mm 1 as is where is immediately
99426 Nikon Optistation 3 Microscope Wafer Inspection Station with cassette to cassette handling 150 mm 1 as is where is immediately
99427 Nikon Optistation 3 Wafer Inspection System 150 mm 31.05.1994 1 as is where is immediately
99428 Nikon Optistation 3A Automatic Wafer Inspection Station 200 mm 31.05.1997 1 as is where is immediately
100223 Nikon AMI-3300 Macro-Defect 300mm 1 as is where is
100224 Nikon AMI-3300 Macro-Defect 300mm 1 as is where is
100226 Nikon AMI-3500 Macro-Defect 300mm 1 as is where is
103038 Nikon Optiphot Inspection Microscope w/ Nomarski Optics 1 as is where is
103039 Nikon Optiphot 88 200mm Inspection Microscope w/ Nomarski Optics 200 mm 1 as is where is
103213 Nikon Optiphot-88-AC IN Inspection Microscope 200 mm 1 as is where is
103215 Nikon Optiphot 300 Inspection Microscope 300 mm 1 as is where is
103216 Nikon Optiphot 200 Inspection Microscope 200 mm 1 as is where is
103458 Nikon Optiphot 150 Wafer Inspection Microscope 150 mm 1 as is where is immediately
103827 Nikon Optiphot 150 Wafer Inspection Microscope 150 mm 1 as is where is immediately
103828 Nikon Optiphot 200 Wafer Inspection Microscope 200 mm 1 as is all rebuilt immediately
103834 NIKON Optiphot 88 Wafer Inspection Microscope 200 mm 1 as is where is immediately
106499 Nikon Auto Wafer Loader for Microscope Inspection Controller, Visual Inspect 150 mm/200 mm 1 as is where is immediately
106500 Nikon Auto Wafer Loader for Microscope Inspection WAFER INSPECTION MICROSCOPE WITH AUTOLOADER 150 mm/200 mm 1 as is where is immediately
106503 Nikon Auto Wafer Loader for Microscope Inspection WAFER INSPECTION MICROSCOPE 150 mm/200 mm 1 as is where is immediately
106505 Nikon Eclipse L200 WAFER INSPECTION MICROSCOPE 150 mm/200 mm 1 as is where is immediately
106506 Nikon Eclipse L200 WAFER INSPECTION MICROSCOPE 1 as is where is immediately
106509 Nikon OPTIPHOT 300 WAFER INSPECTION MICROSCOPE WITH AUTOLOADER 150 mm/200 mm 1 as is where is immediately
106510 Nikon Microscope Wafer Inspection Dual Microscope 150 mm/200 mm 1 as is where is immediately
106511 Nikon SMZ Boom Microscope with Schott Illuminator, on stand, with flat base plate Assembly 1 as is where is immediately
106707 NIKON AMI-3300 Wafer Inspection System 300 mm 1 as is where is
106708 NIKON AMI-3300 Wafer Inspection System 300 mm 1 as is where is
106709 NIKON AMI-3500 Wafer Inspection System 300 mm 1 as is where is
53146 NOVA 210 CMP ENDPOINT MEASUREMENT SYSTEMS 200 mm 5 as is where is immediately
106513 OAI CUSTOM OI Analytical Model 1088 150 mm/200 mm 1 as is where is
69809 Olympus MX-50 Microscopes 3
87492 OLYMPUS BH-BHM Wafer Inspection Microscope 150 mm 1 as is where is immediately
95118 OLYMPUS MX-610 Microscope 200mm - 300mm 1 3 months
96371 Olympus MX61L Wafer Inspection Microscope 300 mm 31.12.2012 1 as is where is immediately
96372 Olympus MX51 Wafer Inspection Microscope 150 mm 1 as is where is immediately
102839 Olympus MX61-L Inspection Microscope 300 mm 1 as is where is immediately
106407 Olympus BHMJL Wafer Inspection Microscope 200 mm 1 as is where is
106408 Olympus BHMJL Wafer Inspection Microscope 200 mm 1 as is where is
76711 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 30.11.1996 1 as is where is immediately
76712 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 30.11.1996 1 as is where is immediately
76713 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 30.11.1996 1 as is where is immediately
76714 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 30.11.1996 1 as is where is immediately
103547 ONTO WV320 MACRO INSPECTING 300 mm 31.05.2004 1 as is where is
100233 Oxford X-Strata980 X-ray Fluorescence Spectrometer 31.05.2010 1 as is where is
97003 Philips PHI 680 Auger Nanoprobe Laboratory 31.05.1998 1 as is where is immediately
103115 Philips PW2830 X-ray Fluorescence Spectrometer 300mm 31.05.2004 1 as is where is
103116 Philips PW2830 X-ray Fluorescence Spectrometer 300mm 31.05.2003 1 as is where is
95011 PHILLIPS IMPULSE 300B Thin-film measurement 200 MM / 300 MM 31.05.2004 1 as is where is
91869 PLASMOS SD2000 Automatic Ellipsometer 200 mm 1 inquire immediately
99429 Plasmos SD 2004 Multi-Wavelength Ellipsometer 200 mm 1 as is where is immediately
78159 Plasmos / Yvon Jobin /Philips Analytical SD2000 Laser Ellipsometer 200 mm 01.08.2000 1 as is where is immediately
31246 PMS Liquitrack 776200 Non volatile residual Monitor for water-quality checking facilities 01.10.1999 1 as is where is immediately
98424 Quantronix DRS 820 Inspection System 150 mm 3 as is where is
87792 QVI 600XP Process Control & Measurement 1 as is where is
91552 RAYTEX RXW-800 EDGE SCAN 200 mm 31.05.2008 1 as is where is
98489 Raytex RXW-0826SFIX-SMIF edge scanner 200mm 1 as is where is
105819 Raytex RXW-1226SFI Defect Inspection System 300 mm 1 as is where is
106409 Raytex RXW-1226SFI Wafer Edge Inspection 300 mm 01.06.2008 1 as is where is
79216 ReVera VeraFlex X-Ray Photoelectron Spectroscopy 300 mm 31.05.2008 1 as is where is immediately
97733 ReVera RVX1000 Film Thickness Measurement System 300 mm 1 as is where is
97734 ReVera RVX1000 Film Thickness Measurement System 300 mm 1 as is where is immediately
105820 Revera RVX5000 X-Ray Photo-electron Spectroscopy (XPS) 300 mm 1 as is where is
106410 Revera RVX5000 X-Ray Photoelectron Spectroscopy (XPS) 300 mm 01.06.2008 1 as is where is
35595 RIGAKU 3630 (For spares use) Xray Fluorescence Wafer/Disk Analyzer, Missing Xray Tube 31.05.1997 1 as is where is immediately
71780 Rigaku TXRF 300S X-Ray Diffractometer 150mm to 300 mm 31.12.2000 1 as is where is immediately
79217 Rigaku MFM65 XRR/XRF 300 mm 31.05.2009 1 inquire
82910 RIGAKU 3630 Wafer Inspection Equipment 200 01.06.1996 1 as is where is immediately
87823 Rigaku MFM65 X-ray inspection (For Cu and Au quantification) 300 MM / 200 mm 30.09.2007 1 as is where is immediately
91557 RIGAKU XRF3640 (Handle include) Wafer/ Disk Analyzer 200 mm 31.05.1995 1 as is where is
92691 Rigaku MFM65 In-Line Energy Dispersive X-Ray Fluoresence Wafer Inspection System 300 mm 31.05.2008 1 as is where is immediately
102347 Rigaku 3272 TXRF (X-Ray Fluorescence) 300 mm 31.05.2005 1 as is where is
105821 RION KS-40AF Particle Counter 300 mm 1 as is where is
72034 RUDOLPH MP200 METROLOGY 200 mm 31.05.2000 1 as is where is immediately
91116 RUDOLPH MP200 XCu Thin Film Measurement 200 mm 31.05.2001 1 as is where is
91559 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2005 1 as is where is
91560 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2005 1 as is where is
91561 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2006 1 as is where is
91563 RUDOLPH Meta Pulse Film Metrology 200 mm 31.05.2005 1 as is where is
91566 Rudolph WS3840 3D Bump Metrology 300 mm 31.05.2010 1 as is where is immediately
91567 RUDOLPH META PULSE 200 Surface Film Metrology 200 mm 31.05.2002 1 as is where is immediately
92709 Rudolph WV320 MACRO INSPECTION 300 MM 31.05.2006 1 as is where is immediately
92710 Rudolph WV320 MACRO INSPECTION 300 MM 31.05.2006 1 as is where is
94478 RUDOLPH FE-3 Focus Ellipsometer 200 mm 1 as is where is
94479 RUDOLPH FE-4D Focus Ellipsometer 200 mm 1 as is where is
95619 Rudolph WV320 MACRO INSPECTION 300 MM 31.05.2006 1 as is where is immediately
95621 RUDOLPH WV320 Metrology 300mm 1 as is where is immediately
97965 RUDOLPH NSX320 MACRO DEFECT INSPECTOR 300 MM 1 as is where is immediately
97966 RUDOLPH WHS MACRO DEFECT INSPECTOR 300 MM 1 inquire
98171 Rudolph NSX105C Macro Inspection 200 mm 31.05.2007 1 as is where is
98296 RUDOLPH Meta Pulse 300 Film thickness measurement 300 mm 1 as is where is
98297 RUDOLPH Meta Pulse 300 Film thickness measurement 300 mm 1 as is where is
98298 RUDOLPH MP1-300 Film thickness measurement 300 mm 31.05.2007 1 as is where is
98493 Rudolph MP200 Cu Film thickness measurement 200mm 1 as is where is immediately
98494 Rudolph MP300 Cu Film thickness measurement 300mm 2 as is where is immediately
98835 RUDOLPH AXI-S Macro Wafer Inspection 300 mm 30.06.2004 1 as is where is immediately
98837 RUDOLPH MP1-300XCU Film Thickness Measurement System 300 mm 30.04.2008 1 as is where is immediately
100928 RUDOLPH AXI-S Macro Inspection System 300 mm 31.05.2003 1 as is where is
100929 RUDOLPH FE-7 Ellipsometer 200 mm 31.05.1996 1 as is where is
100930 RUDOLPH MP300 Film thickness measurement 200 mm 31.05.2007 1 as is where is
100931 RUDOLPH MP300 Film thickness measurement 200 mm 31.05.2009 1 as is where is
100932 RUDOLPH S3000A Focused Beam Ellipsometer 200 mm 31.05.2012 1 as is where is
101348 Rudolph Auto EL Elipsometer 150mm 1 as is where is
101349 Rudolph FE IIID Dual Wavelength Ellipsometer 200 mm 01.06.1998 1 as is where is immediately
101491 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
101492 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
101493 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
101494 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
101495 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
101496 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
102355 Rudolph 3Di8500 Wafer Inspection 300 mm 31.05.2008 1 as is where is
102356 Rudolph Axi-S Macro inspection 300 mm 31.05.2005 1 as is where is
102359 Rudolph NSX115 Macro Defect Inspection System 300 mm 31.05.2009 1 as is where is
102360 Rudolph NSX115 Macro Defect Inspection System 300 mm 31.05.2010 1 as is where is
102363 Rudolph S3000S Focused Beam Ellipsometer 300 mm 31.05.2011 1 as is where is
102364 Rudolph S3000SX Focused Beam Ellipsometer 300 mm 31.05.2011 1 as is where is
102369 Rudolph WV320 Macro Defect inspection 300 mm 31.05.2005 1 as is where is
102372 Rudolph WV320 Macro Defect inspection 300 mm 31.05.2007 1 as is where is
102373 Rudolph WV320 Macro Defect inspection 300 mm 31.05.2007 1 as is where is
103553 RUDOLPH AXI-S Macro Inspection 300 mm 31.05.2004 1 as is where is
103554 RUDOLPH AXI935D AVI 300 mm 1 as is where is
103555 RUDOLPH MP3 300XCU FLIM THICKNESS MEASUREMENT SYSTEM 300 mm 1 as is where is
103707 Rudolph AXI-S Macro Inspection System 300 mm 31.05.2003 1 as is where is
103708 Rudolph AXI-935D Macro Inspection System 300 mm 1 as is where is
103709 Rudolph AXI-935D Macro Inspection System 300 mm 31.05.2011 1 as is where is
105789 Rudolph WHS220/Axi-940b Wafer Mask Inspection System 100-150 mm 31.05.2009 1 as is where is
105822 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105823 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105824 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105825 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105826 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105827 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105828 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105829 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105830 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
105831 Rudolph WV320 Macro Defect Inspection System 300 mm 1 as is where is
106274 Rudolph AXI 940B Wafer Inspection Equipment 300 MM 1 as is where is
106275 Rudolph AXI 940B Wafer Inspection Equipment 300 MM 1 as is where is
106298 RUDOLPH MetaPulse 3 300A Film Thickness Measurement 300 mm 01.06.2008 1 as is where is immediately
106420 Rudolph NSX 115 Automated Defect Inspection 200 mm 1 as is where is immediately
106421 Rudolph NSX 95 Automated Macro Defect Inspection 150 mm/200 mm 1 as is where is immediately
106422 Rudolph NSX-105 Automated Defect Inspection 150 mm/200 mm 1 as is where is immediately
106423 Rudolph NSX-105d1 Automated Defect Inspection 150 mm/200 mm 1 as is where is immediately
106424 Rudolph NSX-95 Automated Macro Defect Inspection 150 mm/200 mm 1 as is where is immediately
106425 Rudolph NSX-95 Manual Macro Wafer Defect Inspection 150 mm/200 mm 1 as is where is immediately
106715 RUDOLPH MP3_300A METAL THICKNESS MEASUREMENT 300 mm 01.06.2012 1 as is where is
106716 RUDOLPH MP-300 Film thickness measurement 300 mm 01.06.2005 1 as is where is
106717 RUDOLPH MP1-300 Film Thickness Measurement 300 mm 01.06.2003 1 as is where is
106718 RUDOLPH MP1-300 Film Thickness Measurement 300 mm 1 as is where is
106719 RUDOLPH MP1-300XCU Film thickness measurement system 300 mm 01.06.2008 1 as is where is
106720 RUDOLPH NSX 105 MACRO DEFECT INSPECTION SYSTEM 300 mm 01.06.2008 1 as is where is
106721 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2010 1 as is where is
106722 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2011 1 as is where is
106723 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 1 as is where is
106724 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2011 1 as is where is
106725 RUDOLPH S3000S FBE(focused beam laser ellipsometry) 300 mm 01.06.2010 1 as is where is
106726 RUDOLPH S3000S FBE(focused beam laser ellipsometry) 300 mm 1 as is where is
106727 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2003 1 as is where is
106728 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2003 1 as is where is
106729 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2006 1 as is where is
106730 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2002 1 as is where is
106731 RUDOLPH WV320 Macro Inspection 300 mm 01.06.2006 1 as is where is
106732 RUDOLPH MP200 Film thickness measurement 200 mm 01.06.2003 1 as is where is
106733 RUDOLPH MP200 Film thickness measurement 200 mm 01.06.1999 1 as is where is
106734 RUDOLPH WV320 Macro Defect Inspection System 300 mm 1 as is where is
106735 RUDOLPH WV320 Macro Defect Inspection System 300 mm 1 as is where is
70089 Rudolph Technologies FE-VII Ellipsometer 200 mm 31.05.1996 1 as is where is immediately
88629 Rudolph/August NSX105 Macro Inspection 200 MM 31.05.2004 1 as is where is
88630 Rudolph/August NSX105 Macro Inspection 200 MM 31.05.2003 1 as is where is
101673 RVSI WS-3800 2D/3D Automated Optical Inspection System 200 mm 1 as is where is
106411 SCIENTECH Stacis 2100 Active Piezoelectric Vibration Cancellation System Facilities 01.06.2008 1 as is where is
91875 SDI SPV-300 Surface Photo Voltage Tester for up to 300mm Wafers up to 300 mm 31.05.1997 1 as is where is immediately
102894 SDI SPV-1050 Contamination Monitoring System 200 mm 31.05.1996 1 as is where is immediately
106661 SDI FAAST 230-DP+SPV+SLIC CARRIER LIFETIME MEASUREMENT 200 mm 1 as is where is
91873 SDI / Semilab FAaST-330 Dielectric Characterization Tool with COCOS & Epi-t for up to 300mm Wafers up to 300 mm 31.05.1999 1 as is where is immediately
91117 SEIKO CHIPS-200 metrology system 200 mm 1 as is where is
86199 SEIKO SEIKI SMI2200 SEM 200 mm 1 as is where is
91118 SELA MC100 metrology system 200 mm 1 as is where is
91119 SELA MC500 metrology system 200 mm 1 as is where is
102951 SELA EM3i Saw for TEM sample preparation ASSEMBLY 31.05.2011 1 as is where is
82911 Semiconductor Diagnostics 3030 Surface Profiler 200 01.06.2012 1 as is where is immediately
100747 Semilab WT-2000PVN Carrier Lifetime Measurement System 1 as is where is immediately
102381 Semilab PS-2000 Ellipsometric Porosimeter 31.05.2015 1 as is where is
102382 Semilab SPVCMS4000 Surface Charge Measurement 200 mm 31.05.1995 1 as is where is
89974 Semix Tazmo SOG TR817UD-TM 150mm SOG 150mm 1 as is where is
95377 Sheffield Endeavor Coordinate Measurement Machine 9.12.7 1 as is where is immediately
97877 Siemens 3 DIMESION MEA FAB-METROLOGY 31.05.2006 1 as is where is
105832 SII NANO XV 300DB Particle Measurement System 300 mm 1 as is where is
106412 SII NANO XV 300DB Wafer Inspection 300 mm 01.06.2008 1 as is where is
74946 Sonoscan D6000 C-Sam 30.04.1996 1 as is where is immediately
83703 SOPRA SE 200 Ellipsometer 200 mm 1 as is where is
102394 SOPRA EP12 Optical Dielectric Porosity Measurement System (300mm) 300 mm 1 as is where is
91877 SSM 470i CV Plotter 1 inquire
98012 SSM SSM 6100 CV IMPLANT-CV CURVES 300 mm 31.05.2000 1 as is where is
106742 SSM 5200 Resistivity Measurement 200 mm 01.06.2008 1 as is where is
89975 TecHarmonic EHTVS Water Scrubber 1 as is where is
101503 Technos TVD-900 ICP-MS Spectrometer 1 as is where is
77049 Tecnai TF20 TEM Refurbished 31.05.2001 1 as is where is immediately
33722 TENCOR AlphaStep 300 Profilometer 1 inquire
98438 Thermawave OP 5340 Inspection System 150/200/300 mm 1 as is where is
98935 Thermawave TP 630 Ion Implant Measurement System 1 as is where is
99874 Thermawave OP2600 Film Thickness 150 mm 30.04.1995 1 inquire
91569 Thermo Fisher ECO 1000 FTIR System 200 mm 01.05.2000 1 as is where is immediately
106303 Thermo Fisher ECO1000-S FTIR 300 mm 01.06.1997 1 as is where is immediately
106040 THERMO NICOLET Continuum Infra-Red Microscope / FTIR Analysis System laboratory 1 as is where is immediately
97887 TOYO SE-4000 Roughness Measurement 31.05.2008 1 as is where is
88284 Veeco Dimension 7000 Atomic Force Microscope (AFM) 200mm 1 as is where is immediately
88375 Veeco D9000 Atomic Force Microscope 200 mm 31.05.1997 1 as is where is immediately
88631 Veeco Dimension X3D Model 340 Atomic Force Microscope 300 MM 31.05.2006 1 as is where is immediately
96382 Veeco D9000 Atomic Force Microscope 200 mm 31.05.2001 1 as is where is immediately
96383 Veeco D9000 Atomic Force Microscope 200 mm 31.05.2001 1 as is where is immediately
96404 Veeco NT3300 Non Contact Profilometer 6 or 8 inch 31.12.2003 1 as is all rebuilt immediately
97839 Veeco Dimension X1D Atomic Force Microscope (AFM) 300 mm 1 as is where is
97840 Veeco Dimension X1D Atomic Force Microscope (AFM) 300 mm 1 as is where is
98373 VEECO V220SI METRO 200 mm 31.05.2002 1 inquire
102464 Veeco NT9800 Optical Profiling System 31.05.2010 1 as is where is
102465 Veeco V220SI Surface Profile Measurement 1 as is where is
103136 Veeco Dimension Vx340 Atomic Force Profiler (AFP) 300mm 31.05.2003 1 as is where is
103182 Veeco Dimension 3100 Atomic Force Microscope 150 mm 01.05.2017 1 as is where is immediately
103373 VEECO Dektak 8 Programmable Surface Profiler Measuring System 200 mm 30.04.2006 1 as is where is immediately
103665 Veeco Dektak 3030 ST Surface Texture Analysis System 1 as is where is
103669 Veeco 9000M Atomic Force Microscope 1 as is where is
103670 Veeco Dektak SXM Atomic Force Microscope 200 mm 1 as is where is
105786 Veeco VX-340 Atomic Force Microscope 1 as is where is
106147 Veeco Dimension 3100 Atomic Force Microscope 200 mm 01.06.2006 1 as is where is immediately
95009 WOOLAM HS-190 Scanning Monochromator 200 MM 1 as is where is
93087 Woollam VUV-VASE (Gen II) Ellipsometer 300 MM 1 as is where is immediately
34091 Wyko NT 2000 Optical Profiling system 200 MM 1 inquire immediately
38870 Wyko NT1100 Optical Profiling system 1 as is where is 2 weeks
66762 WYKO HD 2000 DPC Video Scope 1 as is where is immediately
71792 WYKO NT3300 Optical 3D profiling system 1
96646 WYKO NT3300 Profilometer 200mm 1 as is all rebuilt immediately
106312 WYKO NT-3300 Optical Profiler 300 mm 01.06.2012 1 as is where is immediately
98217 YesTech YTV-B3 AOI Automated Optical Inspection System 31.05.2008 1 as is where is immediately
86716 ZEISS Axiotron Wafer inspection microscope 1 as is where is immediately
97108 Zeiss Axiotech 100 HD Inspection Microscope Assembly 1 as is where is immediately
97610 Zeiss Axiotron 300 Microscope 300 mm 1 as is where is
98211 Zeiss Ultra 55 FA SEMs/TEMs/Dual Beams 1 inquire


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