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Pre-owned Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com

Please find below a list of Used Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com .Click on any listed item of Fab Metrology , Inspection and QC Equipment to see further data.


SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
74580 Accent CDS-200 SCATTEROMETER 200 MM 1 as is where is
74581 Accent CDS-200 SCATTEROMETER 200 MM 1 as is where is
74582 Accent CDS-200 SCATTEROMETER 200 MM 1 as is where is
74583 Accent CDS-200 SCATTEROMETER 200 MM 1 as is where is
74584 Accent CDS-200 SCATTEROMETER 200 MM 1 as is where is
74585 Accent CDS-200 SCATTEROMETER 200 MM 1 as is where is
74587 Accretech Crystal Edge 2.0 wafer inspection 200 MM 01.05.2008 1 as is where is
78507 Accretech Win-Win 50 Optical Inspection 300 mm 01.06.2005 1 as is where is immediately
33668 ADE Episcan 1000 Epi Metrology Spectromter, ONLINE 2110 Spectrometer Head, IRVINE OPTICAL NanoLoader II 1 as is where is immediately
81885 ADE NANOMAPPER NANOMAPPER 300 mm 01.01.2006 1 as is where is immediately
85343 ADE WaferSight WAFER FLATNESS MEASUREMENT 01.06.2006 1 as is where is
85344 Agilent 4145B CV characterization System TEST 01.06.2008 1 as is where is
85421 Agilent 4280A CV characterization System 1 as is where is
52172 Alcatel ASM 180TD Helium Leak Detector 1
84360 Alcatel 925-40 Leak Detector 1 as is where is immediately
82283 ALTATECH ALTASIGHT Wafer Inspection 300 mm 01.06.2011 1 as is where is immediately
84311 AMAT ComPLUS 4T DF INSPECTION 300 mm 01.06.2007 1 as is where is immediately
37688 Amray 1860 FE Scanning Electron Microscope 1
57067 Applied Materials Nano SEM Metrology Equipment, CD SEM 200 mm 1 as is where is immediately
71570 APPLIED MATERIALS WF720 WAFER INSPECTION 1 as is where is
71636 APPLIED MATERIALS WF720 WAFER INSPECTION 1 as is where is
71959 Applied Materials SEMVISION Defect Review SEM with EDX 200 mm 01.01.1999 1 as is where is immediately
71960 Applied Materials SEMVISION CX INSPECTION SEM 200 mm 01.06.2000 1 as is where is immediately
76657 Applied Materials NANOSEM 3D CD SEM with 3 D capability 200 mm 01.07.2002 1 as is all rebuilt immediately
76658 Applied Materials VERASEM 3D CD SEM with 3D capabilities 200 mm 01.01.2004 1 inquire immediately
76659 Applied Materials VERASEM 3D CD SEM with 3D capability 200 mm 01.03.2004 1 inquire immediately
76661 Applied Materials VERASEM 3D CD SEM with 3 D capability 200 mm 01.08.2003 1 inquire immediately
76662 Applied Materials VERASEM 3D CD SEM with 3 D capability 200 mm 01.10.2003 1 inquire immediately
78329 Applied Materials VERA SEM 3D INSPECTION SEM 1 as is where is
78336 Applied Materials VERITY 4i+ Metrology 1 as is where is immediately
79280 Applied Materials Compass 200mm SEM 200 MM 01.06.2001 1 as is where is
79281 Applied Materials Compass Pro 300 SEM 300 mm 01.06.2001 1 as is where is
79282 Applied Materials Compass Pro 300 SEM 300 mm 01.06.2002 1 as is where is
79283 Applied Materials Compass Pro 300 SEM 300 mm 01.06.2001 1 as is where is
79337 Applied Materials Excite Metrology 1 as is where is
79338 Applied Materials Excite Metrology 1 as is where is
79339 Applied Materials Excite Metrology 1 as is where is
79524 Applied Materials Semvision G5 + EDX defect review SEM 300 mm 01.06.2011 1 inquire immediately
79845 Applied Materials Verity 4i SEM 300 mm 01.06.2009 1 inquire immediately
82149 Applied Materials Verity 4i+ SEM 300 mm 01.06.2009 1 inquire immediately
82862 Applied Materials NanoSEM CD SEM 200 01.01.2001 1 as is where is immediately
82863 Applied Materials NanoSEM 3D CD SEM 200 mm 01.01.2000 1 as is where is immediately
82869 Applied Materials SEMVision cX Defect Review SEM 200 mm 01.02.2000 1 as is where is immediately
82870 Applied Materials VeraSEM 3D CD SEM 300 01.06.2001 1 as is where is immediately
82929 Applied Materials Semvision G2 Plus Defect Review SEM 300 MM 01.06.2002 1 as is where is immediately
83514 Applied Materials Opal 7830i Enhanced CD-SEM 200 mm 01.06.1997 1 as is where is immediately
83667 Applied Materials UVision 200S Bright-field wafer inspection 300 mm 01.06.2006 1 as is where is immediately
83699 Applied Materials CX 200 Semvision DR SEM 200 mm 1 as is where is immediately
83764 Applied Materials SEMVISION G2 SEM Defect review and analysis 300 mm 01.05.2005 1 as is where is immediately
83778 Applied Materials SEMVISION G2 SEM Defect review and analysis 300 mm 01.05.2003 1 as is where is immediately
84327 Applied Materials SEMVISION CX Defect Review SEM 200 mm 01.06.1999 1 as is where is immediately
84777 Applied Materials Semvision G3 with EDX Defect Review Sem 300 mm 1 as is where is immediately
84981 Applied Materials Complus Optical Inspection 300 MM 1 as is where is
84982 Applied Materials Nanosem 3D Critical Dimension Scanning Electron Microscope 300 MM 01.06.2002 2 as is where is
84983 Applied Materials NANOSEM 3d Critical Dimension Scanning Electron Microscopes 300 mm 1 as is where is
84984 Applied Materials Semvision CX Critical Dimension Scanning Electron Microscope 200 mm 1 as is where is
84985 Applied Materials Uvision 200 Optical Inspection 300 MM 01.06.2005 1 as is where is
85345 Applied Materials COMPASS 300 Patterned Wafer Inspection 200 mm 01.06.2000 1 as is where is
85346 Applied Materials ComPLUS MP Wafer Inspection 200 mm 01.06.2004 1 as is where is
85347 Applied Materials SemVision CX Defect Review SEM 200 mm 1 as is where is
85348 Applied Materials SEMVision G2 Defect Review SEM 300 mm 01.06.2003 1 as is where is
85349 Applied Materials WF720 Metrology 150 mm 01.06.1997 1 as is where is
85926 Applied Materials ComPLUS 3T Darkfield Inspection 300 mm 1 as is where is
85927 Applied Materials ComPLUS 3T Darkfield Inspection 300 mm 1 as is where is
85928 Applied Materials ComPLUS 4T Darkfield Inspection 300 mm 1 as is where is
85929 Applied Materials SEMVision ADC Server SEM - Defect Review (DR) 300 mm 1 as is where is
85930 Applied Materials Uvision 200 Brightfield Inspection 300 mm 1 as is where is
85931 Applied Materials Uvision 3 Brightfield Inspection 300 mm 1 as is where is
85932 Applied Materials Uvision 5 Brightfield Inspection 300 mm 1 as is where is
85933 Applied Materials VeritySEM 2 SEM - Critical Dimension (CD) Measurement 300 mm 1 as is where is
85934 Applied Materials VeritySEM 2 SEM - Critical Dimension (CD) Measurement 300 mm 1 as is where is
85935 Applied Materials VeritySEM 2 SEM - Critical Dimension (CD) Measurement 300 mm 1 as is where is
85936 Applied Materials VeritySEM 2 SEM - Critical Dimension (CD) Measurement 300 mm 1 as is where is
85937 Applied Materials VeritySEM 2 SEM - Critical Dimension (CD) Measurement 300 mm 1 as is where is
85938 Applied Materials VeritySEM 2 SEM - Critical Dimension (CD) Measurement 300 mm 1 as is where is
85939 Applied Materials VeritySEM 2 SEM - Critical Dimension (CD) Measurement 300 mm 1 as is where is
85940 Applied Materials VeritySEM 2 SEM - Critical Dimension (CD) Measurement 300 mm 1 as is where is
85941 Applied Materials VeritySEM 2 SEM - Critical Dimension (CD) Measurement 300 mm 1 as is where is
85942 Applied Materials VeritySEM 2 SEM - Critical Dimension (CD) Measurement 300 mm 1 as is where is
85943 Applied Materials VeritySEM 3 SEM - Critical Dimension (CD) Measurement 300 mm 1 as is where is
85944 Applied Materials VeritySEM 3 SEM - Critical Dimension (CD) Measurement 300 mm 1 as is where is
85945 Applied Materials VeritySEM 3 SEM - Critical Dimension (CD) Measurement 300 mm 1 as is where is
85946 Applied Materials VeritySEM 3 SEM - Critical Dimension (CD) Measurement 300 mm 1 as is where is
86035 APPLIED MATERIALS SEMVISION CX REVIEW STATION, SEM DEFECT 300 mm 1 as is where is
86166 Applied Materials VERASEM 3D SEM 200 mm 01.06.2001 1 as is where is
79715 Applied Precision WaferWorx Probe Analysis Microscope Station 200mm 1 as is where is immediately
83742 ASML TS100B Yield Star Single wafer metrology system 300 mm 01.06.2011 1 as is where is immediately
84675 AUGUST CV9812 FOUP INSPECTION 300 mm 1 as is where is
86167 AUGUST AXI-S Macro Inspection 200 mm 1 as is where is
56952 Aviza SPP furnace 12 inch 01.06.2002 1 as is where is immediately
83788 BAL-TEC SCD005 Cool Sputter Coater Laboratory 01.12.2004 1 as is where is immediately
83740 BIO-RAD QS300 FT-IR Spectrometer for up to 200mm Wafers 200 mm 01.06.1995 1 inquire immediately
71744 BIO-RAD / Accent opto QS1200 FT-IR Spectrometer for up to 300mm Wafers 300 mm 01.06.2004 1 as is where is immediately
14529 BioRad Q7 Q8 Overlay Metrology Tool 75mm-200mm 01.11.1998 1 inquire 2 months
33671 BIORAD Q5 Overlay Metrology Tool 1 inquire
33672 BIORAD Q6 Overlay Metrology Tool 1 inquire
33673 BIORAD Q7 Overlay Metrology Tool 1 inquire
77065 BIORAD QS-408M Manual FTIR Spectrometer for Epi, SiN, BPSG Measurement, up to 200mm Wafers 1 as is where is immediately
77149 BioRad Q3 Overlay Metrology Tool 75mm-200mm 01.11.1998 1 as is where is immediately
84676 BioRad QS408M/FTI Metrology N/A 1 as is where is
67909 Cambridge S260 Scanning Electron Microscope SEM Laboratory Equipment 01.06.1991 1 as is where is immediately
84534 Cameca IMS 6F / 7F (Spares) Eucentric Rotating sample stage spares 1 immediately
62738 Camtek Falcon 200Sb Wafer Inspection Station 1 as is where is
78113 CamTek Falcon 620 Macro Defect Inspection Tool 100-200 mm 01.11.2007 1 as is where is immediately
79191 Camtek Condor 103PD Post saw 2D inspection 300 mm 01.06.2013 1 as is where is immediately
74929 CDE Resmap 463 OC Resistivity Measurement up to 300 mm 1 as is where is immediately
53036 COMPUMOTOR M575L11 Stepping motor drive spares 1 as is where is immediately
85060 Cressington 208HR Standalone Sputterer Facilities 01.06.1999 1 as is where is
85061 Daitron EMTEC CVP-80 Scientific and Laboratory Equipment 1 as is where is
84986 Digital Instruments NANO-SCOPE 3A AFM 1 as is where is
60945 DNS SS-W60A-AV 01.06.1994 1 as is where is
60946 DNS SS-W60A-AV 24.03.1994 1 as is where is
61220 Espec TSA-201D-W Thermal Shock Chamber with humidity 1
69327 Espec TSA-71L-A Thermal Shock Chamber 01.01.2008 1 as is where is immediately
14505 FEI XL835 Dual beam FIB workstation 01.06.1998 1 inquire 2 weeks
71708 FEI 820 Dual beam Fib 01.06.1996 1 as is where is immediately
74953 FEI CLM FIB SEM 200 MM 1 as is where is
74954 FEI FEI SNP XP Rapid CD Photomask Metrology System S/N: 31001 1 as is where is
78513 FEI Strata 400 FIB Sem 300 mm 01.06.2005 1 as is where is immediately
79224 FEI Tecnai G2 F30 S/TEM 01.06.2006 1 inquire immediately
79226 FEI DB 235 Dual Beam FIB SEM 01.06.2000 1 inquire
79227 FEI Helios 400 with Omniprobe Dual Beam FIB SEM 01.06.2007 1 inquire 2 months
79228 FEI Strata 400S Dual Beam FIB SEM 01.06.2006 1 inquire 1 month
79562 FEI XL30 SEM 2 inquire immediately
82223 FEI XL 30 e-sem (Strictly for spares use) Laboratory 1 as is where is immediately
83786 FEI STRATA 400S Dual Beam FIB Laboratory 01.06.2005 1 as is where is immediately
85058 FEI Micrion Vectra 986 FIB Microscope Laboratory and Scientific 1 as is where is
85059 FEI Tecnial TF-20 TEM Microscope Laboratory and Scientific 1 as is where is
85947 FEI Strata 400 Focused Ion Beam System 1 as is where is
85948 FEI Strata 400S Focused Ion Beam System 300 mm 1 as is where is
85949 FEI V600FIB Focused Ion Beam System 1 as is where is
86036 FEI 1265 DUAL BEAM FIB 300 mm 1 as is where is
86037 FEI EXPIDA 1255S MANUAL LOAD, NO STEM, NGSEM COL 300 mm 1 as is where is
86168 FEI STRATA 400S Dual beam FIB 01.06.2005 1 as is where is
86292 FEI F30 Technai FIB SEM 1
86293 FEI Quanta 200 3D FIB SEM 1
86294 FEI DB 835 FIB SEM 1
86295 FEI Quanta 400 FIB SEM 1 inquire immediately
86300 FEI Nova nano 230 FIB SEM 1 inquire immediately
82884 FEI Company DB820 Focused Ion Beam 1 as is where is immediately
86235 FEI Company 820 Dual Bem Fib SEM 200 mm 1 as is where is immediately
85950 First Ten Angstroms FTA2000 Life Sciences, Particle Analysis 1 as is where is
79722 Fortrend Lumina 202 PHOTO 5" 1 as is where is
55974 FRONTIER FSM900TC-VAC FILM STRESS AND WAFER BOW MEASUREMENT 200 mm 01.05.2000 1 as is where is immediately
85057 FSM 128 Interferometer 200 mm 1 as is where is
9961 GCA TROPEL 9000 Surface Flatness Analyzer 1 as is where is immediately
85053 GeMeTec Elymat 2 Electrolytical Metal Analysis Tool 200 mm 1 as is where is
85054 GEMETEC Elymat III wafer contamination measurement 300 MM 1 as is where is
85055 GEMETEC WSPS 2 M S Spectrometers 200 mm 01.06.2008 1 as is where is
85056 GEMETEC WSPS53 Spectrometers 300 MM 1 as is where is
52151 Hamamatsu R1924A Photomultiplier spares 01.04.2007 1 inquire immediately
71907 Hamamatsu C7103 IC Back-side Lapping System 200 mm 1 as is where is immediately
85049 Hermes Microvision EScan 320 Ebeam inspection system 300 MM 01.06.2012 1 as is where is
9967 HITACHI S7000 CD SEM 150 mm 01.06.1989 1 inquire immediately
34078 Hitachi S9220 CD SEM 200 mm 01.05.2000 3 inquire immediately
36254 Hitachi S9300 CD-Sem 200 mm 01.12.2000 1 as is where is immediately
36259 HITACHI S-9300 SEM - CD (CRITICAL DIMENSION) 200-300 1 as is where is
38472 Hitachi S9300 CD SEM 200mm, 300mm 1 inquire immediately
52166 Hitachi 545-5515 DC power supply module spares 1 as is where is immediately
52167 Hitachi 6280H Power Supply Module 4channels 1 as is where is immediately
52168 Hitachi 6280H Power Supply unit 1 as is where is immediately
52339 Hitachi 545-5521 spares 01.06.1994 1 as is where is immediately
52340 Hitachi 5455537 IP-PC2 spares 01.06.1994 1 as is where is immediately
52343 Hitachi 377-7592 Power Supply Module 01.06.1994 1 as is where is immediately
53054 HITACHI 6280H SORD Computer spares 1 as is where is immediately
55299 HITACHI S-5000H Metrology Equipment, CD SEM 200mm 01.01.2000 1 as is where is
56838 Hitachi S-4500 FE Inspection SEM Type 1 chamber 1 as is all rebuilt immediately
60937 HITACHI M501AWE 01.06.1996 1 as is where is
60938 HITACHI M501AWE 01.06.1996 1 as is where is
60939 HITACHI S4160 01.06.1996 1 as is where is
60940 HITACHI IS2700 01.06.2005 1 as is where is
60957 HITACHI S6280 1 as is where is
60958 HITACHI S6280 1 as is where is
60959 HITACHI S6180 1 as is where is
60960 HITACHI S8800 1 as is where is
60961 HITACHI S8820 01.06.1999 5 as is where is
60962 HITACHI S7000 1 as is where is
60963 HITACHI S8800 1 as is where is
60964 HITACHI S7800HSA 1 as is where is
62210 HITACHI S-9300 200 mm 1 as is where is
62211 HITACHI BOND HOT PLATE 1 as is where is
65359 HITACHI S-9220 SIP baord for CD-SEM S9220,P/N 568-5591 1 as is where is immediately
70030 Hitachi Mi-Scope 10 Scanning Acoustic Microscope (SAM) ASSEMBLY 01.06.1992 1 as is where is immediately
71461 Hitachi S9220 CD SEM 200 mm 1 inquire
71558 Hitachi S-2400 SEM with new EDX 1
71635 HITACHI 8820 CD SEM 1 as is where is
71969 HITACHI S4160 FE SEM 8" 1 as is where is
71970 HITACHI S4160 FE SEM 8" 01.06.1996 1 as is where is
74576 Hitachi WA1350 AFM 200 MM 1 as is where is
74794 Hitachi S5200 FE SEM with EDX Inspection 01.06.2005 1 as is where is
78108 Hitachi S4700 Type 2 FE-SEM Up to 6 inch 01.06.2006 1 as is all rebuilt immediately
78111 HITACHI FB2000A FIB SEM Laboratory 01.06.2001 1 as is where is immediately
78165 Hitachi S8820 CD SEM 200 mm 01.07.1996 1 as is where is immediately
78166 Hitachi S8620 CD SEM 150 mm 01.06.1995 1 as is where is immediately
78685 HITACHI DES-9300 METRO 300 MM 01.04.2001 1 as is where is
78690 HITACHI S-9300 CD-SEM 300 MM 01.06.2001 1 as is where is immediately
78693 HITACHI S9360 CD-SEM 300 MM 01.01.2003 1 as is where is
78826 HITACHI FB2100 FIB SEM 200 mm 01.06.2006 1 as is where is immediately
78827 HITACHI S-5000 Inspection sem Laboratory 01.06.1998 1 as is where is immediately
78828 HITACHI S5000 Inspection sem 200 mm 01.06.2000 1 as is where is immediately
79221 Hitachi S-9220 CD SEM 300 mm 01.06.2000 1 inquire
79222 Hitachi S-9200 CD SEM 300 mm 01.06.1999 1 inquire
79724 Hitachi S-5000 FE SEM Laboratory 01.06.1999 1 as is where is immediately
82151 Hitachi S-9260A SMIF CD SEM 300 mm 01.06.2005 1 inquire
82261 HITACHI S-9360 CD SEM 8"/12" 01.06.2003 1 as is where is immediately
82262 HITACHI S-9360 CD SEM 8"/12" 01.06.2004 1 as is where is immediately
82687 HITACHI S9380Ⅱ CD SEM 300 mm 01.06.2006 1 as is where is
82688 HITACHI S9380Ⅱ CD SEM 300 mm 01.06.2006 1 as is where is
82689 HITACHI S9380Ⅱ CD SEM 300 mm 01.06.2006 1 as is where is
82820 HITACHI S-8620 CD SEM 5 01.06.1996 1 as is where is
83585 Hitachi S5000H Field Emission SEM Laboratory 1 as is where is immediately
83649 Hitachi IS2700SE Wafer Inspection System 300 mm 01.06.2004 1 inquire immediately
83701 Hitachi S8820 CD SEM 8" 1 as is where is
83750 Hitachi S9360 CD SEM 300 MM 01.12.2003 1 as is where is immediately
83776 HITACHI S9380 CD SEM 300 mm 01.10.2004 1 as is where is immediately
83779 HITACHI S9360 CD SEM 300 mm 01.05.2003 1 as is where is immediately
84206 Hitachi S9380 II CD SEM 300 mm 01.11.2005 1 as is where is immediately
84313 Hitachi HD2300/FB2100 STEM / FIB 300 mm 01.06.2006 1 as is where is immediately
84345 Hitachi EA8000 X-ray Particle Contaminant Analyzer 1 as is where is
84677 Hitachi S-4500 INSPECTION SEM N/A 1 as is where is
84678 Hitachi S-6000 CD SEM 150 mm 1 as is where is
84679 Hitachi S-628OH CD SEM 150 mm 1 as is where is
84680 HITACHI S-8840 CD SEM 1 as is where is
84839 Hitachi S2700 Scanning Electron Microscope Laboratory 1 as is where is immediately
85040 Hitachi RS4000E Scanning Electron Microscope 300 mm 01.06.2005 1 as is where is
85041 Hitachi RS4000E Scanning Electron Microscopes 300 mm 01.06.2005 1 as is where is
85042 Hitachi RS5000 Defect review sem 300 mm 01.06.2006 1 as is where is
85043 Hitachi S-4500 FE SEM 200 mm 01.06.1995 1 as is where is
85044 Hitachi S-7800 Critical Dimension Scanning Electron Microscope 200 mm 01.06.2008 1 as is where is
85045 Hitachi S4500 FE SEM 200 mm 1 as is where is
85046 Hitachi s5000 FE SEM 200 MM 01.06.1995 1 as is where is
85047 Hitachi Z-5700 AA spectrophotometer Laboratory and Scientific 1 as is where is
85050 Hitachi AS5000 Scanning Electron Microscope 200 MM 1 as is where is
85051 Hitachi BIST Memory Test System test 01.11.2004 1 as is where is
85052 Hitachi LA-3100 Lithography Equipment 200 mm 1 as is where is
85350 Hitachi I6300 Inspection station 300 mm 1 as is where is
85351 Hitachi I6300 Inspection station 300 mm 1 as is where is
85352 Hitachi IS2700 Defect inspection 300 mm 01.06.2005 1 as is where is
85353 Hitachi RS3000 Review SEM 200 mm, 300 mm 01.06.2003 1 as is where is
85354 Hitachi RS3000T Review SEM 300 mm 01.06.2007 1 as is where is
85355 Hitachi RS4000 Review SEM 300 mm 01.06.2006 1 as is where is
85356 Hitachi S4700 FE SEM 300 mm 01.06.2002 1 as is where is
85357 Hitachi S5200 FE SEM 01.06.2001 1 as is where is
85358 Hitachi S8640 CD SEM 150 mm 01.06.1997 1 as is where is
85359 Hitachi S9200S CD SEM 200 mm 01.06.1999 1 as is where is
85360 Hitachi S9300T CD SEM 300 mm 01.06.2002 1 as is where is
85361 Hitachi S9360 CD SEM 300 mm 01.06.2003 1 as is where is
85362 Hitachi S9380 CD SEM 300 mm 01.06.2004 1 as is where is
85363 Hitachi S9380II CD SEM 300 mm 01.06.2007 1 as is where is
85364 Hitachi S9380II CD SEM 300 mm 01.06.2007 1 as is where is
85365 Hitachi S9380II CD SEM 300 mm 01.06.2007 1 as is where is
85366 Hitachi VR120SD Resistivity Measurement 300 mm 1 as is where is
85951 Hitachi FB-2100 Focused Ion Beam System 300 mm 1 as is where is
85952 Hitachi LS6800 Particle Measurement 300 mm 1 as is where is
86169 HITACHI FB-2000A FIB Sem 200 mm 01.06.2001 1 as is where is
86170 HITACHI RS3000 Defect Review SEM 200 mm/300 mm 1 as is where is
86171 HITACHI S-4700 (w/EDAX) FE SEM with EDX 01.06.1998 1 as is where is
86172 HITACHI S-5000 FE SEM 200 mm 01.06.1994 1 as is where is
86173 HITACHI S-5000 FE SEM 200 mm 01.06.1996 1 as is where is
86174 HITACHI S-5000 FE SEM 200 mm 01.06.1999 1 as is where is
86175 HITACHI S-5000 FE SEM 200 mm 01.06.2000 1 as is where is
86176 HITACHI S-9220 (SMIF) CD-SEM 200 mm 01.06.2001 1 as is where is
86177 HITACHI S-9220 (SMIF) CD-SEM 200 mm 01.06.2001 1 as is where is
86178 HITACHI S-9360 CD-SEM 300 mm 01.06.2003 1 as is where is
86296 Hitachi 3600N SEM 1 inquire immediately
86297 Hitachi S5200 FE-SEM 1 inquire immediately
86298 Hitachi S4800 FE-SEM 1 inquire immediately
86299 Hitachi s3000H SEM 1 inquire immediately
82893 Hitachi Finetech WA1200 AFM Surface Profiler 200 1 as is where is immediately
84681 Horiba PD-3000A Reticle inspection system N/A 1 as is where is
85048 Horiba emax energy Micro-analysis system for SEM 1 as is where is
85367 Horiba PRPD2 Reticle/Mask Particle Detection System 150 mm 01.06.2006 1 as is where is
85368 Horiba PRPD2 Reticle/Mask Particle Detection System 150 mm 01.06.2005 1 as is where is
71500 HUVITZ Trinocular Microscope 1
79725 Infrared Labratories IREM1 Infrared Emission Microscope 200mm/300mm 1 as is where is immediately
11069 IRVINE OPTICAL UltraSpec III Wafer Inspection microscope 3 to 6 inch 1 as is where is immediately
85016 Irvine Optical Co. UL208 wafer mapper 200 mm 1 as is where is
74803 IVS 8000-05 CD MEASUREMENT 200 MM 1 as is where is
84682 IVS ACV-4 8000 measurement tool 150 mm 1 as is where is
78173 J.A.Woollam VASE Ellipsometer 200 mm 1 as is where is immediately
15055 Jeol JWS-7505ZH CD Scanning Electron Microscope 100-200 mm 01.06.1997 1 as is where is immediately
32811 JEOL JSM6320 Field Emission SEM N/A 1 inquire immediately
35620 JEOL 7515 SEM 1 as is where is immediately
55317 JEOL JWS-7515 Metrology Equipment, CD SEM 150mm 01.10.2000 1 as is where is
71172 JEOL JWS 8755S SEM 1 inquire immediately
71633 JEOL JWS-7700 INSPECTION SEM 1 as is where is
74804 JEOL 7555S INSPECTION SEM 200 MM 1 as is where is
74805 JEOL JM2010-F TEM 200 MM 1 as is where is
83590 JEOL JSM 7401F High Resolution FE SEM 200 mm 01.06.2006 1 as is where is immediately
84315 JEOL JSM-7401F SEM 300 mm 01.06.2006 1 as is where is immediately
84316 JEOL JSM-7401F SEM 300 mm 01.06.2006 1 as is where is immediately
84540 JEOL 2100F TEM 200 mm 1 as is where is immediately
84683 JEOL JOL7505 01 TE SEM 150 mm 1 as is where is
84684 JEOL JSM6600FX SEM N/A 1 as is where is
84685 JEOL JWS-3000 Defect Review Sem 300 mm 1 as is where is
84686 JEOL JWS-3000 Defect Review Sem 300 mm 1 as is where is
85017 JEOL JEM-2500SE TEM Microscope Laboratory and Scientific 1 as is where is
85018 JEOL JEM-2500SE TEM Microscope Laboratory and Scientific 1 as is where is
85019 JEOL JWS-7515 DEFECT REVIEW SEM 200 mm 01.06.1995 1 as is where is
85020 JEOL JWS7555S Defect review sem 200 mm 01.01.2000 1 as is where is
85021 JEOL JWS7555S Scanning Electron Microscopes 200 mm 01.01.2000 1 as is where is
86179 JEOL JSM-840A FE SEM 1 as is where is
70118 Jordan Valley JVX 6200 X-ray reflectometer including small spot XRF 200 mm 01.06.2007 1 as is where is immediately
60932 KE DD-803V PYRO 150 mm 1 as is where is
60933 KE DD-803V PYRO 150 mm 1 as is where is
85022 Keithley 590 CV MEASUREMENT 1 as is where is
85369 Keithley 2430 CV characterization System 01.06.2006 1 as is where is
83644 Keyence VH-7000 175X Digital HD Microscope 1 as is where is immediately
60971 KIHEVNG KLM-2000 ROUTER M/C 1 as is where is
54874 KLA P2 Long Scan Surface Profilometer 1 as is where is
55922 KLA AIT XP Patterned Wafer Inspection 01.05.2001 1
76948 KLA RS 50e resistivity mapping system 1
77044 KLA Alpha Step 500 Surface Profiler 01.05.2001 1
82672 KLA 2132 bright-field WAFER INSPECTION 200mm 1 as is where is immediately
82821 KLA OmniMap Auto RS35C resistivity measurement 6 01.06.1990 1 as is where is
82822 KLA P-1 profilometer 6 01.06.1990 1 as is where is
32230 KLA TENCOR SFS6400 MECHANICAL CALIBRATION Document Number 238 WAFERSURFACE ANALYSIS SYSTEM CUSTOMER MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
32231 KLA TENCOR Surfscan 64X0 Calibration Procedure Surfscan 64X0 Calibration Procedure MANUAL 1 as is where is immediately
32232 KLA TENCOR surfscan 64XX optical alignments Document Number 236 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
32233 KLA TENCOR SFS6x00 MECHANICAL CALIBRATION Document number 200 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
55334 KLA TENCOR 5300 Metrology Equipment, Overlay Measurement System 200mm 01.05.2011 1 as is where is
55365 KLA TENCOR Surfscan-6200 Metrology Equipment, Surface Analyzer 200mm 1 as is where is
55368 KLA TENCOR Surfscan-6200 Metrology Equipment, Surface Analyzer 200mm 01.11.1994 1 as is where is
60935 KLA Tencor Archer 10XT Overlay measurement 200 mm 1 as is where is immediately
60947 KLA Tencor 2138-IS 01.06.1999 1 as is where is
60950 KLA Tencor FLX-2908 1 as is where is
60951 KLA Tencor 5100? 1 as is where is
60952 KLA Tencor AIT 1 as is where is
60953 KLA Tencor 2135 brightfield wafer defect inspection 200 mm 01.06.1996 1 as is where is immediately
60976 KLA Tencor ALPHA-STEP 200 1 as is where is
79440 KLA Tencor SP1 TBI DARKFIELD SURFACE INSPECTION SYSTEM 200 mm 01.03.2001 1 as is where is immediately
84275 KLA Tencor 5105 Overlay Measurement 1 as is where is immediately
86107 KLA-Tencor Archer AIM+ Wafer Overlay Measurement 300 mm 01.06.2006 1 as is where is immediately
1680 KLA-TENCOR 2132 bright-field WAFER INSPECTION 200 mm 01.08.1995 1 as is where is immediately
1691 KLA-TENCOR 259 (spare parts) Reticle Inspection - SPARE PARTS up to 7 inch 01.12.1991 1 inquire immediately
31242 KLA-Tencor 5100 XP registration tool / overlay measurement 200 mm 01.04.1999 1 as is where is immediately
33694 KLA-TENCOR Surfscan 7700 Patterned Wafer Surface Inspection Tool 1 inquire
33695 KLA-TENCOR Surfscan AIT Patterned Wafer Surface Inspection Tool 1 inquire
33696 KLA-TENCOR Surfscan AIT 8020 Patterned Wafer Surface Inspection Tool with Autofocus Review 1 inquire
34905 KLA-TENCOR AIT XP Fusion Darkfield defect inspection system 300 mm 01.06.2002 2 as is where is immediately
36532 KLA-TENCOR 2135 brightfield wafer defect inspection 200 mm 01.06.2000 1 as is where is immediately
36533 KLA-TENCOR 2135 Brightfield Wafer Inspection 200 mm 01.06.1996 1 as is where is immediately
36567 KLA-TENCOR M-GAUGE 300 RESISTANCE MEASUREMENT 1 as is where is immediately
53035 KLA-Tencor 2132 Wafer chuck, 8" spares 1 as is where is immediately
55862 KLA-TENCOR UV 1080 UV Film Thickness Tool, for up to 200mm Wafers 1 as is where is
64089 KLA-Tencor RS-35A RESISTIVITY MEASUREMENT 100 mm to 200 mm 1 as is where is immediately
64168 KLA-Tencor 2131 Wafer Defect Inspection 200mm 01.06.1995 1 as is where is immediately
64776 KLA-Tencor 2351 WAFER INSPECTION 300 MM 01.05.2002 1 as is where is immediately
66414 KLA-Tencor Archer 10XT overlay measurement 200 mm 1 as is where is immediately
67945 KLA-TENCOR ES30 E-BEAM DEFECT INSPECTION 200 MM 01.12.2002 1 as is where is immediately
70127 KLA-Tencor AIT UV PATTERNED WAFER INSPECTION 200 mm 01.08.2003 1 as is where is immediately
71628 KLA-TENCOR 6200 WAFER DEFECT INSPECTION 1 as is where is
71629 KLA-TENCOR 2552 WAFER DEFECT INSPECTION 1 as is where is
71630 KLA-TENCOR 2132 WAFER DEFECT INSPECTION 1 as is where is
71631 KLA-TENCOR 2132 WAFER DEFECT INSPECTION 1 as is where is
71632 KLA-TENCOR 2122 WAFER DEFECT INSPECTION 200 mm 1 as is where is immediately
74625 KLA-Tencor 2410 STRESS MEASUREMENT 200 MM 1 as is where is
74643 KLA-Tencor 710-013838-00 Rev 1 PCB Universal Video Mux spares 01.06.1993 1 as is where is
74682 KLA-Tencor Starlight SL3-UV HR URSA Reticle inspection system reticle 01.06.1999 1 as is where is immediately
76676 KLA-TENCOR AIT XP FUSION Dark Field WAFER PARTICLE DETECTION 200 mm 01.10.2002 1 as is where is immediately
76677 KLA-TENCOR AIT FUSION Dark Field WAFER PARTICLE DETECTION 200 mm 01.06.2002 1 as is where is immediately
76681 KLA-TENCOR AIT UV Dark Field WAFER PARTICLE DETECTION 200 mm 01.01.2003 1 as is where is immediately
76682 KLA-TENCOR AIT UV Dark field wafer particle inspection system 200 mm 01.10.2003 1 as is where is immediately
76684 KLA-TENCOR P20H PROFILOMETER 200 mm 01.04.1996 1 as is where is immediately
76947 KLA-Tencor RS 55 Resisitivity Measurement 150 mm and 200 mm 1 as is where is immediately
77051 KLA-Tencor 2351 WAFER INSPECTION 300 MM 01.01.2002 1 as is where is immediately
78697 KLA-Tencor INS3300 MICROSCOPE INSPECTION STATION 300 MM 01.06.2006 1 as is where is
79056 KLA-TENCOR AIT-XP Wafer particle measurement 200 mm 1 as is where is
79057 KLA-TENCOR AIT-XP Wafer particle measurement 200 mm 1 as is where is
79152 KLA-Tencor 6420 Surface Particle Detection System 200 mm 01.06.1998 1 inquire immediately
79214 KLA-Tencor Aleris 8350 Thin Film Measurement System 300 mm 01.06.2010 1 inquire
79726 KLA-TENCOR ES20 e-beam defect inspection system 200 mm 1 as is where is immediately
79825 KLA-Tencor EV 300 Scanning Electron Microscope with Oxford EDX 01.06.2002 1 as is where is immediately
79847 KLA-Tencor 2915 inspection and metrology 300 mm 01.06.2012 1 inquire immediately
80213 KLA-Tencor 6220 wafer particle inspection 1 as is where is immediately
80214 KLA-Tencor 6420 wafer particle inspection 1 as is where is immediately
80262 KLA-Tencor SP3 wafer inspection system 1 inquire immediately
82153 KLA-Tencor Aleris 8360 Thin Film Metrology 300 mm 01.06.2010 1 inquire
82221 KLA-Tencor Aleris HX Thin Film Metrology 200mm, 300mm 01.06.2006 1 as is where is immediately
82895 KLA-Tencor 2139 Wafer Inspection Equipment 200 01.06.1997 1 as is where is immediately
82896 KLA-Tencor 5300 Overlay Measurement System 200 01.06.2001 1 as is where is immediately
82897 KLA-Tencor 5300 Overlay Measurement System 200 01.06.2001 1 as is where is immediately
82898 KLA-Tencor ICOS HM-200 Wafer Handler 150 01.06.1996 4 as is where is immediately
82899 KLA-Tencor ICOS WI-2000 Wafer Inspection Equipment 150 8 as is where is immediately
82900 KLA-Tencor Viper 2401 Wafer Inspection Equipment 200 01.06.2000 1 as is where is immediately
82931 KLA-Tencor ALERIS CX Thin Film charaterization / Spectroscopic Ellipsometer 300 mm 01.09.2007 1 as is where is immediately
83698 KLA-Tencor AIT XP+ Darkfield Inspection 8" 1 as is where is
83700 KLA-Tencor FLX 2908 METRO 8" 1 as is where is immediately
83702 KLA-Tencor AMRAY 4200 Review SEM 8" 1 as is where is
83704 KLA-TENCOR Optiprobe 2600DUV Metrology 8" 1 as is where is
83777 KLA-Tencor ARCHER10XT Overlay measurement 300 mm 01.11.2003 1 as is where is immediately
84034 KLA-Tencor SP2 wafer surface inspection system 300 mm 01.02.2006 1 as is where is immediately
84156 KLA-TENCOR SP1 TBI Darkfield Wafer Inspection 300 mm 01.12.2002 1 as is where is immediately
84157 KLA-TENCOR SP2 Darkfield Wafer Inspection 300 mm 01.12.2004 1 as is where is immediately
84255 KLA-Tencor 6220 wafer particle inspection, as-is 01.01.1999 1 as is where is immediately
84299 KLA-Tencor SP2 XP Wafer surface particle detection 300 mm 01.02.2014 1 as is where is immediately
84523 KLA-Tencor RS 55 (TC) Resisitivity Measurement 150 MM AND 200 MM 01.06.1997 1 as is where is immediately
84687 KLA-TENCOR 6220 Wafer Particle inspection 1 as is where is
84688 KLA-TENCOR 6420 Wafer Particle inspection 1 as is where is
84689 KLA-TENCOR 6420 Wafer Particle inspection 1 as is where is
84690 KLA-TENCOR eS20XP Inspection SEM 1 as is where is
84691 KLA-TENCOR FLX-5400 Auto TF Stress Measure 1 as is where is
85023 KLA-Tencor 2132 Optical Inspection 200 mm 01.06.1995 1 as is where is
85024 KLA-Tencor 2132 Optical Inspection 200 mm 01.06.1996 1 as is where is
85025 KLA-Tencor 5300 Overlay Measurement 200 mm 01.12.2007 1 as is where is
85026 KLA-Tencor 8100XP Critical Dimension Scanning Electron Microscope 200 mm 01.12.1999 1 as is where is
85027 KLA-Tencor AIT Surfscan Particle Counters 200 mm 01.06.1999 1 as is where is
85028 KLA-Tencor AIT XUV Surface particle measurement 300 MM 01.06.2006 1 as is where is
85029 KLA-Tencor CRS1010 Wafer Inspection Microscopes 200 mm 01.06.1997 1 as is where is
85030 KLA-Tencor ES31 Scanning Electron Microscope 300 MM 01.06.2004 1 as is where is
85031 KLA-Tencor ES32 Scanning Electron Microscope 300 MM 01.06.2007 1 as is where is
85032 KLA-Tencor es810 Scanning Electron Microscopes 300 MM 01.09.2014 1 as is where is
85033 KLA-Tencor es810 Scanning Electron Microscopes 300 MM 01.09.2014 1 as is where is
85034 KLA-Tencor INS3300 Wafer Inspection Microscopes 300 MM 01.06.2005 1 as is where is
85035 KLA-Tencor LMS IPRO5 Photomask registration and CD Metrology system reticle 01.06.2012 1 as is where is
85036 KLA-Tencor OP-2600 Interferometers 200 mm 01.06.2000 1 as is where is
85037 KLA-Tencor RS 55 Resistivity Measurement 200 mm 01.06.1994 1 as is where is
85038 KLA-Tencor RS55 Resistivity Measurement 200 mm 01.06.1994 1 as is where is
85039 KLA-Tencor UV 1050 FTIR – surface film measurement 200 mm 01.06.1995 1 as is where is
85370 KLA-Tencor AIT Dark field inspection 150 mm 1 as is where is
85371 KLA-Tencor AIT FUSION XUV Dark field inspection 300 mm 1 as is where is
85372 KLA-Tencor AITUV Dark field inspection 200 mm 01.06.2002 1 as is where is
85373 KLA-Tencor AITUV Dark field inspection 200 mm 01.06.2003 1 as is where is
85374 KLA-Tencor Aleris Thickness measurement 300 mm 01.06.2008 1 as is where is
85375 KLA-Tencor Archer 10 AIM+ Overlay 300 mm 01.06.2002 1 as is where is
85376 KLA-Tencor Archer 10XT Overlay 300 mm 01.06.2008 1 as is where is
85377 KLA-Tencor Archer AIM MPX Overlay 300 mm 01.06.2005 1 as is where is
85378 KLA-Tencor Archer AIM+ OVERLAY 300 mm 01.06.2006 1 as is where is
85379 KLA-Tencor Archer XT+ Overlay 300 mm 01.06.2005 1 as is where is
85380 KLA-Tencor Caliper Elan OVERALY 200 mm 1 as is where is
85381 KLA-Tencor EDR5210 Defect Review SEM 1 as is where is
85382 KLA-Tencor EDR5210 METRO 300 mm 01.06.2010 1 as is where is
85383 KLA-Tencor HRP340 Profiler 300 mm 01.06.2005 1 as is where is
85384 KLA-Tencor INM100+INS10 Metrology 150 mm 1 as is where is
85385 KLA-Tencor INS3300G1 Optical Review 300 mm 01.06.2001 1 as is where is
85386 KLA-Tencor KLA2133 Metrology 150 mm 1 as is where is
85387 KLA-Tencor 2370 Bright field inspection 300 mm 01.06.2002 1 as is where is immediately
85388 KLA-Tencor KLA2552 Data review station 200 mm 01.06.1996 1 as is where is
85389 KLA-Tencor KLA2830 Bright field 300 mm 01.06.2010 1 as is where is
85390 KLA-Tencor KLA5200XP Overlay 150 mm 1 as is where is
85391 KLA-Tencor KLA5200XP Overlay Measurement 1 as is where is
85392 KLA-Tencor LDS3300M Defect Review Microscope 200 mm 1 as is where is
85393 KLA-Tencor P11 Profiler 200 mm 1 as is where is
85394 KLA-Tencor Puma 9000S Dark field inspection 1 as is where is
85395 KLA-Tencor Puma 9130 Dark field inspection 300 mm 01.06.2005 1 as is where is
85396 KLA-Tencor SP2XP Particle counter 300 mm 01.06.2014 1 as is where is
85953 KLA-Tencor AIT XP Parts/Options 200 mm 1 as is where is
85954 KLA-Tencor AIT XP Parts/Options 200 mm 1 as is where is
85955 KLA-Tencor Archer AIM+ Overlay Measurement System 300 mm 1 as is where is
85956 KLA-Tencor Archer AIM+ Overlay Measurement System 300 mm 1 as is where is
85957 KLA-Tencor Archer AIM+ Overlay Measurement System 300 mm 1 as is where is
85958 KLA-Tencor Puma 9000D Darkfield Inspection 300 mm 1 as is where is
85959 KLA-Tencor Puma 9000D Darkfield Inspection 300 mm 1 as is where is
85960 KLA-Tencor Quantox XP In-Line Electrical Monitoring and Characterization 300 mm 1 as is where is
86038 KLA-Tencor AIT UV++ DARKFIELD PATTERN INSPECTION 300 mm 1 as is where is
86039 KLA-Tencor AIT-XP PLUS PATTERNED WAFER INSPECTION, DARK FIELD 300 mm 1 as is where is
86040 KLA-Tencor SCD-XT SCATTEROMETRY METROLOGY TOOL, NC 300 mm 1 as is where is
86041 KLA-Tencor SL3UV-URSA RETICLE INSPECTION 300 mm 1 as is where is
86042 KLA-Tencor SL586H-T3 RETICLE INSPECTION Reticle 1 as is where is
86180 KLA-TENCOR AIT-UV WAFER PARTICLE INSPECTION 200 mm 01.06.2002 1 as is where is
86181 KLA-TENCOR AIT-XP WAFER PARTICLE INSPECTION 200 mm 1 as is where is
86182 KLA-TENCOR ARCHER 10XT OPTICAL OVERLAY MEASUREMENT 300 mm 01.06.2003 1 as is where is
86183 KLA-TENCOR 2370 (BLAZER) BRIGHTFIELD WAFER INSPECTION 300 mm 01.06.2002 1 as is where is immediately
70458 KLA-Tencor Corp. AIT XP+ Darkfield Inspection 200 mm 1 as is where is
79727 Kobelco LEM-310C Wafer edge inspection Microscope 300mm/200mm 1 as is where is
78700 KOKUSAI VR120S METRO 300 MM 01.06.2006 1 as is where is
79344 Kokusai VR-120/085D resistivity measurement 1 as is where is
79345 Kokusai VR-120/085D resistivity measurement 1 as is where is
79346 Kyowa Interface Science Drop Master 700D surface analyser 1 as is where is
85014 Lasertec 2PG20 Reticle inspection 300 MM 01.06.2005 1 as is where is
85015 Lasertec Reticle Inspection Tool Reticle inspection 200 mm 01.06.2011 1 as is where is
86184 LASERTEC MD2100 Reticle Inspection System 200 mm 1 as is where is
33697 LEICA INS 2000 Defect Review System 1 inquire
33699 LEICA SZ6 StereoZoom Microscope on Boom Stand with 10X WF EPs 1 inquire
64259 Leica INS 3300 Microscope inspection station 200 mm 1 as is where is immediately
71999 LEICA INS3000 Microscope inspection station 8" 01.03.2000 1 inquire immediately
74574 Leica Stereo Microscope DMLM Stereo Microscope: Objectives: 5x, 10x, 20x, 100x; Ocular: 10x; 1 as is where is
77899 LEICA INS3000 DUV INSPECTION MICROSCOPE WITH DUV OPTION 200 mm 01.04.2003 1 as is where is immediately
78262 LEICA INS3000 DUV Microscope inspection station 8" 01.03.2003 1 inquire immediately
79347 Leica LEI200 Microscope 1 as is where is
79428 Leica INS 1000 Microscope Inspection Station 200mm 1
82685 LEICA UV Optic Scope QE 300 mm 01.06.2006 1 as is where is
84158 LEICA INS3000, SMIF Wafer Inspection Microscope 200 mm 1 as is where is
84692 Leica LEI200 Microscope 150 mm 1 as is where is
84693 LEICA MIS200 Review Station 1 as is where is
85961 Leica INS3300 Macro-Defect 300 mm 1 as is where is
86185 LEICA INS3300 Wafer Inspection Microscope 200 mm/300 mm 01.06.2006 1 as is where is
86186 LEICA INS3300 Wafer Inspection Microscope 200 mm/300 mm 01.06.2003 1 as is where is
86187 LEICA INS3300 Wafer Inspection Microscope 200 mm/300 mm 01.06.2003 1 as is where is
86188 LEICA INS3300 Wafer Inspection Microscope 200 mm/300 mm 01.06.2004 1 as is where is
86189 LEICA INS3300 Wafer Inspection Microscope 200 mm/300 mm 01.06.2003 1 as is where is
86190 LEICA INS3300 Wafer Inspection Microscope 200 mm/300 mm 01.06.2007 1 as is where is
86191 LEICA MIS200 Wafer Inspection Microscope 200 mm 1 as is where is
86192 LEICA MIS200 Wafer Inspection Microscope 200 mm 1 as is where is
86232 Leica INM 200 Inspection Microscopes 200 mm 4 as is where is immediately
86233 Leica INS 1000 Inspection Microscopes 200 mm 1 as is where is immediately
78148 Leitz MPV SP Automatic Microscope inspection station 200 mm 1 as is where is immediately
86193 LEITZ MPV-SP Wafer Inspection Microscope 200 mm 1 as is where is
74757 Leo 435VP inspection SEM 1 as is where is
85422 LEO LTA700 LIFETIME TESTER 200 mm 01.06.1997 1 as is where is
84694 Lucas Signatone A2MM1 Laser and scope N/A 1 as is where is
81917 MDC 986G Automatic CV Plotter 200 MM 01.06.2002 1 as is where is immediately
85013 Metron Extraction, Amine Total Molecular Base Real Time Monitor Facilities 01.06.2000 1 as is where is
85962 Metryx Mentor OC23 Mass Measurement 300 mm 1 as is where is
82902 Micro Instruments PE9020 Electromigration Evaluation 01.06.2000 2 as is where is immediately
81914 Micromass 386 Mass Spectrometer Laboratory 1 as is where is immediately
86043 MSP 2300XP1 PARTICLE DEPOSITION Reticle 1 as is where is
85011 Multiprobe APF 2 Atomic Force Prober 300 MM 01.06.2009 1 as is where is
85012 Multiprobe MP1 Atomic Force Prober 300 MM 01.06.2006 1 as is where is
71741 Nanofab Nano150 Ion Beam Lithography / Implanter System 150 mm 1 as is where is immediately
33700 NANOMETRICS Nanoline CD-50 CD Measurement Tool 1 inquire
33701 NANOMETRICS Nanospec 181 Film Thickness Measurement System 1 inquire
33703 NANOMETRICS Nanospec 2100 Film Thickness Measurement System with Irvine Optical Optistation 200 Automatic Wafer Loader 1 inquire
33704 NANOMETRICS Nanospec 212 Film Thickness Measurement System with 125mm/150mm Dual Wafer Sliding Stage 1 inquire
55401 NANOMETRICS NanoSpec M-210AFT Metrology Equipment, Thin Film Measurement System 200mm 1 as is where is
55402 NANOMETRICS NanoSpec M-210AFT Metrology Equipment, Thin Film Measurement System 200mm 01.01.1993 1 as is where is
55403 NANOMETRICS NanoSpec M-5100 Metrology Equipment, Wafer Inspection Equipment 200mm 1 as is where is
55404 NANOMETRICS NanoSpec M-5100 Metrology Equipment, Wafer Inspection Equipment 200mm 1 as is where is
79528 Nanometrics Nanoline CRD-III CD Measurement Tool 1 as is where is immediately
82690 NANOMETRICS ORION METROLOGY 300 mm 01.06.2006 1 as is where is immediately
82823 Nanometrics M-215 Thickness 6 01.06.1989 1 as is where is
82824 Nanometrics M-215 Thickness 6 01.06.1989 1 as is where is
84695 Nanometrics Q200I Overlay 1 as is where is
84832 NANOMETRICS NanoSpec 9000 Metrology Equipment, Wafer Inspection Equipment 200mm 1 as is where is immediately
85010 Nanometrics Q240AT Overlay Measurement 200 mm 01.12.2000 1 as is where is
85397 Nanometrics CALIPER_MOSAIC Overlay Measurement 300 mm 01.06.2009 1 as is where is
85398 Nanometrics CALIPER_MOSAIC Overlay Measurement 300 mm 01.06.2002 1 as is where is
85399 Nanometrics CDS200 Overlay Measurement 200 mm 01.06.2003 1 as is where is
85400 Nanometrics METRA7200 Overlay Measurement 200 mm 1 as is where is
85401 Nanometrics METRA7200 Overlay Measurement 200 mm 1 as is where is
85402 Nanometrics Nanospec AFT400 Film Thickness Measurement 200 mm 01.06.1997 1 as is where is
85403 Nanometrics SIPHER EPI SLIP AND DEFECT 200 mm 01.06.2002 1 as is where is
86044 NANOMETRICS NANOSPEC 8300X THIN FILMS MEASURING SYSTEM 300 mm 1 as is where is
85009 Negevtech NT3100 Optical Inspection MICROSCOPE 300 MM 01.06.2005 1 as is where is
72024 NICOLET ECO1000 FTIR 8" 01.04.1999 1 as is where is
72025 NICOLET ECO1000 FTIR 8" 01.12.2000 1 as is where is
72026 NICOLET ECO1000S FTIR 8" 01.03.1996 1 as is where is
72027 NICOLET ECO1000S FTIR 8" 01.05.1997 1 as is where is
72028 NICOLET ECO1000S FTIR 8" 01.03.2000 1 as is where is
72029 NICOLET ECO1000S FTIR 8" 01.05.1997 1 as is where is
85963 Nicolet Continuum XL FT-IR 1 as is where is
85964 Nicolet ECO 3000 FT-IR 300 mm 1 as is where is
71625 NIDEK IM-11 WAFER LOADER 1 as is where is
82904 Nikcon AMI-2000 Surface Analyzer 01.06.2003 1 as is where is immediately
33708 NIKON Optiphot Wafer Inspection Microscope 1 inquire
33711 NIKON Optistation 2A Automatic Wafer Inspection Systems for 75mm- 150mm Wafers, Auto Focus, 4ea Available 1 inquire
35882 Nikon OPTISTATION V WAFER INSPECTION SYSTEM 1
49807 Nikon V12 Profile Projector 1
55968 Nikon MM-40 Measurment Microscope 1
56922 Nikon MM-40 Measurment Microscope 1
64341 Nikon VMR 3020 Video Measuring System 01.01.2001 1 as is where is immediately
74827 Nikon MM40 MEASURING MICROSCOPE 200 mm 1 as is where is
74828 Nikon NEXIV VMA-2520 Video Measuring System 1 as is where is
74839 Nikon Optistation 3 MICROSCOPE 200 MM 1 as is where is
76705 Nikon Opiphot Inspection Microscope with autoloader 200 mm 01.04.1992 1 as is where is immediately
76918 Nikon MM-40 Measuring Microscope 1
79198 Nikon Lasermark Overlap inspection System 300 mm 01.06.2013 1 as is where is immediately
79731 Nikon Optistation 7 Wafer Inspection Microscope 300mm 1 as is where is immediately
82905 Nikon AMI-3000 Surface Analyzer 200 2 as is where is immediately
85965 Nikon Optistation 3200 Optical Review System 300 mm 1 as is where is
85966 Nikon Optistation 3200 Optical Review System 300 mm 1 as is where is
71618 NORAN 683A1SPS EDX 1 as is where is
53146 NOVA 210 CMP ENDPOINT MEASUREMENT SYSTEMS 200 mm 5 as is where is immediately
74950 Novascan 420 CMP measurement system 1 as is where is
15207 Olympus AL100-B8 Programmable Wafer Loader 200 mm 9 as is where is immediately
33713 OLYMPUS BHM Wafer Inspection Microscope with NeoSPlan 5X, 10X, 20X & 50X Objectives 1 inquire
33714 OLYMPUS SZ3060 StereoZoom Microsope 1 inquire
69809 Olympus MX-50 Microscopes 3
74877 Olympus AL2100 MICROSCOPE 200 MM 1 as is where is
74905 OLYMPUS SZ40 Microscope 1 as is where is
85967 Olympus AL3120F Macro-Defect 300 mm 1 as is where is
85968 Olympus AL3120F Macro-Defect 300 mm 1 as is where is
86194 Olympus AL-2000 Wafer Inspection Microscope 200 mm 1 as is where is
76711 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76712 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76713 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76714 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76715 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76716 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76717 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76718 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76719 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION WITH AUTOLOADER 200 mm 01.12.1996 1 as is where is immediately
76720 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION WITH AUTOLOADER 200 mm 01.12.1996 1 as is where is immediately
76721 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION WITH AUTOLOADER 200 mm 01.12.1996 1 as is where is immediately
76722 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION WITH AUTOLOADER 200 mm 01.12.1996 1 as is where is immediately
76723 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION WITH AUTOLOADER 200 mm 01.12.1996 1 as is where is immediately
60974 OLYMPUS OPTICAL BX60F5 SCOPH 1 as is where is
79284 OXFORD INCA L300QI EDX FOR CAMBRIDGE SEM 01.06.2000 1 as is where is
79285 Oxford Instruments CMI 950 X-ray fluorescence spectrometer 01.06.2000 1 as is where is
85404 Panalytical(Spectris) XpertProMRdXL Xray Analyzer 200 mm 01.06.2011 1 as is where is
61180 PHILIPS SPW-2800 Xray Fluorescence Metrology Tool for up to 200mm Wafers 200 mm 1 as is where is
83940 Philips CM30 Scanning Transmission Electron Microscope (TEM) Laboratory 01.06.1992 1 as is where is immediately
78159 Plasmos / Yvon Jobin /Philips Analytical SD2000 Laser Ellipsometer 200 mm 01.08.2000 1 as is where is immediately
31246 PMS Liquitrack 776200 Non volatile residual Monitor facilities 01.11.1999 1 as is where is immediately
33716 PROMETRIX FT-750 Film Thickness Measuring Tool 1 inquire
35594 PROMETRIX VP-10 Four Point Probe for up to 200mm Wafers 01.05.1990 1 inquire
60711 Prometrix FT-750? Film Thickness Mapping System 1 as is where is
85405 QMC SLS200 Laser Saw 100 mm 01.06.2013 1 as is where is
85008 Raytek RXW-1226SFI Wafer edge inspection 300 MM 11 as is where is
82909 Reichert-Jung Ultracut E 70 17 04 Specimen Preparation 200 01.06.2012 1 as is where is immediately
79216 ReVera VeraFlex X-Ray Photoelectron Spectroscopy 300 mm 01.06.2008 1 inquire
85006 Revera RVX5000 Xray photoelectron spectroscopy 300 MM 01.06.2006 1 as is where is
85007 Revera Veraflex Xray photoelectron spectroscopy 300 MM 01.06.2008 1 as is where is
11072 RIGAKU 3700H TXRF Wafer Analyzer 150-200 MM 01.04.1994 1 as is where is immediately
34320 Rigaku 3640 X-Ray Wafer Analyzer 200mm 1 as is where is immediately
71780 Rigaku TXRF 300S X-Ray Diffractometer 150mm to 300 mm 01.01.2001 1 as is where is immediately
78263 Rigaku 3640 TXRF 1 as is where is immediately
78339 Rigaku MFM65 xrf 300 mm 1 as is where is immediately
78562 Rigaku 3272 WD Xray Diffractometer 300 mm 01.01.2005 1 as is where is immediately
78701 RIGAKU XRF3630 TRF 200 mm 01.06.1995 1 as is where is
79066 RIGAKU XRF3640 XRF 200 mm 1 as is where is
79217 Rigaku MFM65 XRR/XRF 300 mm 01.06.2009 1 inquire
79350 Rigaku MFM65 X-Ray Thickness Measurement / X-ray fluorescence 300 mm and 200 mm 01.06.2010 1 as is where is immediately
79732 Rigaku Wafer X300 XRF 300mm/200mm 1 as is where is
79733 RIGAKU XRF-3640 XRF 200mm 1 as is where is
79868 Rigaku MFM65 XRF 300 mm 01.06.2005 1 inquire immediately
80193 RIGAKU TXRF-V300 TXRF inspection system 200mm, 300mm 01.06.2008 1 as is where is immediately
82825 Rigaku 3620 B P Tester 01.06.1986 1 as is where is
82826 Rigaku 3630 X-RAY 1 as is where is
82910 RIGAKU 3630 Wafer Inspection Equipment 200 01.06.1996 1 as is where is immediately
83519 Rigaku 3640 X-ray fluoresence wafer / disk analyzer 200 mm 01.06.2000 1 as is all rebuilt immediately
85406 Rigaku TXRF3750 XRay Fluorescence 200 mm 01.06.2007 1 as is where is
86195 RIGAKU RIGAKU 3630 XRF 200 mm 1 as is where is
78563 Rion KS-40AF Particle Counter facilities 01.06.2007 1 as is where is
72033 RUDOLPH Meta Pulse 200 Cu Copper Film metrology system 8" 01.04.2001 1 as is where is immediately
72034 RUDOLPH MP200 METROLOGY 200 mm 1 as is where is immediately
78702 RUDOLPH MP300 METRO 300 MM 01.06.2007 1 as is where is
78703 RUDOLPH MP300 METRO 300 MM 01.06.2009 1 as is where is
79067 RUDOLPH WV320 Metrology 300mm 1 as is where is
79430 Rudolph MP 200 Cu Thin film measurement - copper film type 200 mm 1 as is where is immediately
83662 Rudolph NSX 105 macro defect inspection system 6 inch film frames 01.06.2006 1 inquire 2 months
84696 Rudolph FE-IV ellipsometer 150 mm 1 as is where is
85969 Rudolph NSX-105 Wafer Level Inspection 1 as is where is
85970 Rudolph NSX-105 Wafer Level Inspection 1 as is where is
85971 Rudolph NSX-105 Wafer Level Inspection 1 as is where is
85972 Rudolph S3000S Film Thickness Measurement System 300 mm 1 as is where is
85973 Rudolph S3000S Film Thickness Measurement System 300 mm 1 as is where is
85974 Rudolph WS 3880 Bump Inspection 300 mm 1 as is where is
86196 RUDOLPH WS2500 Wafer Inspection 200 mm 01.06.2002 1 as is where is
86197 RUDOLPH WS2500 Wafer Inspection 200 mm 01.06.2003 1 as is where is
85000 Rudolph Research 200XL Ellipsometer 200 mm 01.06.2001 1 as is where is
85001 Rudolph Research SE200XL Ellipsometer 200 mm 01.06.1999 1 as is where is
70089 Rudolph Technologies FE-VII Ellipsometer 200 mm 01.06.1996 1 as is where is immediately
85002 Rudolph Technologies Macro Defect WV320 YVS SERVER Optical Inspection Facilities 1 as is where is
85003 Rudolph Technologies S300 Wafer defect inspection 300 MM 01.06.2007 1 as is where is
85004 Rudolph Technologies WaferView 320 Macro defect inspection 300 MM 01.06.2005 1 as is where is
85005 Rudolph Technologies WaferView 320 Macro defect inspection 300 MM 01.06.2005 1 as is where is
85407 Rudolph/August 3Di8500 wafer inspection 300 mm 01.06.2008 1 as is where is
85408 Rudolph/August AxiS Defect Inspection 300 mm 01.06.2005 1 as is where is
85409 Rudolph/August AxiS Macro Wafer Inspection 200 mm 01.06.2005 1 as is where is
85410 Rudolph/August FEIV Ellipsometer 200 mm 01.06.1995 1 as is where is
85411 Rudolph/August FEVII Ellipsometer 200 mm 1 as is where is
85412 Rudolph/August FEVII Ellipsometer 200 mm 01.06.1993 1 as is where is
85413 Rudolph/August FEVII Ellipsometer 150 mm 01.06.2000 1 as is where is
85414 Rudolph/August FEVII Ellipsometer 150 mm 1 as is where is
85415 Rudolph/August FEVII Ellipsometer 150 mm 01.06.2001 1 as is where is
85416 Rudolph/August FEVIID Ellipsometer 200 mm 1 as is where is
85417 Rudolph/August FEVIID Ellipsometer 200 mm 01.06.1997 1 as is where is
85418 Rudolph/August MP300(Meta Pulse 300) Thickness measurement 300 mm 01.06.2004 1 as is where is
84996 Scientek MSP2300XP PSL deposition system 300 MM 01.06.2005 1 as is where is
84997 Scientek Technology Stacis 2100 active vibration isolation system 300 MM 1 as is where is
10076 SDI FAaST 330 Surface Photo Voltage Tester for up to 300mm Wafers 300 mm / 200 mm 1 as is where is immediately
83578 SDI FAaST 230 Wafer Characterization Tool up to 200 mm 01.06.2004 1 inquire immediately
86198 SDI 3020 Carrier Lifetime measurement 200 mm 1 as is where is
79068 SDI Semiconductor Diagnostics FAAST300 Carrier Lifetime measurement 300mm 1 as is where is
84697 SEIKO Sxi200P Inspection SEM 1 as is where is
84698 SEIKO Sxi200P Inspection SEM 1 as is where is
86199 SEIKO SEIKI SMI2200 SEM 200 mm 1 as is where is
77904 SELA MC100 Slicer / Microcleaver / Micro-Cleaver 1 as is where is immediately
77905 SELA MC500 Slicer / Microcleaver / Micro-Cleaver 200 mm 1 as is where is immediately
79286 SELA EM2 sem sample preparation 01.06.2004 1 as is where is
60972 SEMI-AUTOPROBE MP2000? STATION SYSTEM 1 as is where is
78569 Semicaps SOM 3000 EMMI / Optical microscope inverted tester docked system 300 mm 1 as is where is immediately
82911 Semiconductor Diagnostics 3030 Surface Profiler 200 01.06.2012 1 as is where is immediately
84542 SEMILAB FAAST 300 Carrier lifetime measurement 300 mm 01.06.2006 1 as is where is immediately
84998 Semilab IR3100 FT-IR Spectrometers 300 MM 01.06.2005 1 as is where is
84999 SemiTest EpiMet 2 EPI film measurement 200 mm 01.06.1999 1 as is where is
82686 Shinsung Eng SGL-30 QE 300 mm 01.06.2011 1 as is where is
84995 SII XV 300DB Dual Beam FIB SEM Microscope 300 MM 01.06.2005 1 as is where is
69723 Sloan Dektak 11 Profiler 1
74942 Sonix HS 1000 Scanning Acoustic Microscope 1 as is where is immediately
74944 Sonix HS1000 C-SAM 1 as is where is
85975 Sonix AW-3000 Scanning Acoustic Microscopy (SAM) / Tomography (SAT) 200 mm 1 as is where is
74946 Sonoscan D6000 C-Sam 01.05.1996 1 as is where is immediately
78258 Sonoscan D6000 C-SAM System 01.05.2003 1 as is where is immediately
83703 SOPRA SE 200 Ellipsometer 8" 1 as is where is
84994 Sopra EP12 OPTICAL POROSITY MEASUREMENT 300 MM 1 as is where is
82284 SPEEDFAM EP300 X Edge Polishing 300 mm 01.06.2008 1 as is where is immediately
60975 SSEC EVERGREEN CLEANER 1 as is where is
60943 SUSS Microtec FC150 01.01.2004 1 as is where is
84993 Suss Microtec BA300-MIT Wafer inspection system 300 MM 01.06.2006 1 as is where is
33720 TECHNICAL INSTRUMENT K2 IND/NIKON Confocal Microscope 1 inquire
82827 TECHNOS TREX-610 TXRF 6 01.06.1995 1 as is where is
82914 Technos TREX 610 Series X-ray Fluorescence Spectrometer 200 1 as is where is immediately
77049 Tecnai TF20 TEM Refurbished 01.06.2001 1 as is where is immediately
60934 TEL Mark8 Clean Track 01.12.1995 1 as is where is
60965 TEL ALPHA-805C 1 as is where is
60966 TEL ALPHA-805C 1 as is where is
60967 TEL ALPHA-805C 1 as is where is
60968 TEL ALPHA-805C 1 as is where is
60980 TEL P-8 01.06.2002 1 as is where is
62212 TEL P-8 01.06.2002 1 as is where is
79740 TEL Tokyo Electron UNITY 2E 855 DD DRY ETCH - oxide 200 mm 01.05.1998 1 as is where is immediately
79742 TEL Tokyo Electron Unity2e : DRM DRY ETCH 200mm 1 as is where is
33722 TENCOR AlphaStep 300 Profilometer 1 inquire
33723 TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool, for 75mm-150mm Wafers 1 inquire
71620 THERMA-WAVE TP 500XP Ion implant dose measurement 200 mm 1 as is where is immediately
71621 THERMA-WAVE 2600B METROLOGY 3 as is where is
82828 THERMA-WAVE TP500 Tester 125 mm 1 as is where is immediately
84992 Therma-Wave Optiprobe 2600 DUV Interferometers 200 mm 01.06.1997 1 as is where is
74857 Thermawave Opti-Probe 2600 Thin Film Measurement System 200 01.11.1995 1 as is where is
74859 Thermawave Opti-Probe 2600 Thin Film Measurement System 200 01.10.1995 1 as is where is
84699 THERMAWAVE OP-2600 Thickness Measurement 1 as is where is
82147 TSK WIN-WIN 50 DEFECT INSPECTION 300 MM 01.06.2007 1 as is where is immediately
60944 Varian XM-90 1 as is where is
54497 VEECO DEKTAK V200 Si THICKNESS MEASUREMENT 150MM AND 200MM 01.07.2001 1 as is where is immediately
78309 Veeco VX310 Atomic Force Microscope 200 mm / 300 mm 01.06.2004 1 as is where is immediately
79351 Veeco V200SL Profilometer 1 as is where is
83586 Veeco Dimension X3D Model 340 Atomic Force Microscope 300 mm 01.11.2006 1 as is where is immediately
84987 Veeco DIMENSION X1D AFM 300 MM 01.06.2004 1 as is where is
84988 Veeco DIMENSION X3D AFM 300 MM 01.06.2006 1 as is where is
84989 Veeco DIMENSION X3D AFM 300 MM 01.06.2004 1 as is where is
85419 Veeco UVX310 Step Profiler 200 mm 01.06.2003 1 as is where is
85420 Veeco V200 Profiler 200 mm 1 as is where is
86200 VEECO V220SI Atomic Force Microscope 200 mm 01.06.2002 1 as is where is
86045 Veeco / Digital Instruments D9000 AFM Reticle 1 as is where is
36870 Veeco Wyko NT 3300 Profiler System 1
83787 VG MICROTECH SC7640 sputter coater Laboratory 01.04.2002 1 as is where is immediately
80156 VG Scientific Escalab Mark 2 X-ray Photoelectron Spectrometer (XPS) Laboratory 01.06.1986 1 inquire immediately
70086 Vistec / KLA LDS 3300M Macro defect inspection tool 300 mm 01.06.2005 1 as is where is immediately
70087 Vistec / KLA LDS 3300M Macro defect inspection tool 300 mm 01.06.2006 1 as is where is immediately
79352 Waferworx 3D Inspection Tool 1 as is where is
34091 Wyko NT 2000 Optical Profiling system 200 MM 1 inquire immediately
38870 Wyko NT1100 Optical Profiling system 1
66762 WYKO HD 2000 DPC Video Scope 1
71792 WYKO NT3300 Optical 3D profiling system 1
85976 X-Tek Orbita 160Xi X-Ray Inspection System 1 as is where is
71241 Zeiss Axioscop 2 Microscope 1
71619 ZEISS AXIOTRON MICROSCOPE 4 as is where is
79746 Zeiss AXIOTRON 200 WAFER INSPECTION MICROSCOPE 200mm 1 as is where is
84700 ZEISS LSR LASER SCAN MICROSCOPE N/A 1 as is where is
84990 Zeiss AXIOTRON 2 Wafer Inspection Microscopes 200 mm 7 as is where is
86046 Zeiss CDC200 Reticle Cd control Reticle 1 as is where is
84991 Zeiss / HSEB Axiospect 300 Wafer Inspection Microscope 300 MM 01.06.2007 1 as is where is


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