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Pre-owned Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com

Please find below a list of Used Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com .Click on any listed item of Fab Metrology , Inspection and QC Equipment to see further data.


SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
106952 ACCENT (Nanometrix, BioRad) QS2200M FTIR Spectrometer for Epi, SiN, BPSG & CO Measurement, up to 200mm Wafers 100-200 MM 01.11.2000 1 as is where is immediately
103225 ADE NanoMapper FA Nano-Defects Inspection System 300 mm 1 inquire immediately
108791 ADE 5810 Non-Contact Capacitance Gauging Module with 2ea ADE 2248 Probes 1 inquire
108792 ADE 6033 Wafer Thickness Tester 1 inquire
108793 ADE 6033T Wafer Thickness Tester 1 inquire
109005 Agar Sputter Coater Sputter Coater for SEM Sample preparation Laboratory 01.06.2021 1 as is where is immediately
83514 Applied Materials Opal 7830i Enhanced CD-SEM 100 mm to 200 mm 01.05.1997 1 as is where is immediately
106289 APPLIED MATERIALS UVISION 5 Bright Field Inspection 300 mm 01.06.2013 1 as is where is immediately
106350 Applied Materials Uvision 200 Wafer Inspection 300 mm 01.06.2006 1 as is where is
108374 Applied Materials VeritySEM 2 SEM - Critical Dimension (CD) Measurement 300 mm 1 as is where is
108375 Applied Materials VeritySEM 4i SEM - Critical Dimension (CD) Measurement 300 mm 1 as is where is
108376 Applied Materials VeritySEM 4i+ SEM - Critical Dimension (CD) Measurement 300 mm 1 as is where is
108556 Applied Materials Uvision 600SP Brightfield Inspection System 300 mm 01.05.2008 1 as is where is immediately
108931 Applied Materials SEMVISION G5 MAX Defect Review SEM 300 mm 01.06.2011 1 as is where is immediately
108153 ATI OAK-1 Auto Scope Inspection 01.06.2013 1 as is where is
98447 August 3DI-8000 wafer bump inspection 300mm 1 as is where is immediately
98448 August NSX-95 2D Auto inspection system / Macro defect inspection system 200 mm 4 as is where is immediately
101818 August NSX105 Wafer Bumping Inspection System / Macro defect inspection 200mm 1 inquire
106336 August / Rudolph Technologies CV9812 Wafer Carrier inspection tool 1 as is where is immediately
108734 Bio-Rad Q8 Overlay Metrology 1 as is all rebuilt 1 month
108735 Bio-Rad QS-1200 FT-IR Spectrometer 100-200 mm 01.05.2004 1 as is where is immediately
108736 Bio-Rad QS-300 FT-IR Spectrometer 1 as is where is immediately
108800 BIO-RAD ECN4900PC Profilers, 2ea Available - Parts Only 1 inquire
108801 BIO-RAD Q7 Overlay Metrology Tool 1 inquire
108802 BIO-RAD Q8 Overlay Metrology / CD Measurement Tool for up to 200mm Wafers 1 inquire
108737 BIORAD Q5 Overlay Metrology Tool 200 mm 2 as is where is immediately
106642 BROOKS METARA 7200 Overlay 200 mm 01.06.1996 1 as is where is
108025 BRUKER VERTEX 80V FT-IR Spectrometer 1 as is where is
108998 Brunel SP400 Inspection Microscope with Nikon Camera and image capture PC Laboratory 1 as is where is immediately
108999 Brunel Boom Microscope Long Focal Length Microscope with Nikon Camera Laboratory 1 as is where is immediately
106645 CAMECA EX300 Secondary Ion Mass Spectrometer 300 mm 1 as is where is
108394 CAMECA EX-300 Implant Dosing Measurement 300 mm 1 as is where is
108154 CDE RESMAP_273 Resistivity measurement 1 as is where is
106647 CYBER OPTICS CYBERSCAN C212/110 Laser Measure 200 mm 1 as is where is
108201 DNS INSPECTION SCOPE Inspection Scope 1 as is where is
106200 EDAX Eagle 2 Micro-probe EDX analyser Laboratory 01.06.2000 1 as is where is immediately
106964 FEI Strata 400 Dual Beam FIB SEM Laboratory 01.06.2006 1 as is where is immediately
107000 FEI Sirion FE SEM with e-beam lithography capability and EDX up to 2.5 inch diameter 01.06.2002 1 as is where is immediately
108026 FEI CLM-PLUS (CRT-082) FIB SEM 300 mm 01.04.2012 1 as is where is
108932 FEI ExSolve CLM Next Gen High Accuracy FIB SEM 300 mm 01.06.2016 2 as is where is immediately
109004 FEI Quanta 3D FEG Scanning Electron Microscope with FIB cross section capability Laboratory 1 as is where is immediately
108710 Fogale DeepProbe 300M Low Coherence IR wafer interferometry 200 mm and 300 mm 01.06.2014 1 inquire
108817 FOUR DIMENSIONS CV92A Semi Auomatic Mercury Probe CV Plotter up to 200 mm 01.06.1998 1 inquire immediately
93084 FSM SYMPHONYMC Life Time 300 MM 1 as is where is
96543 Gaertner L115C-8 Ellipsometer, cassette to cassette 100-200 mm 28.02.1995 1 as is where is immediately
108751 GCA TROPEL 9000 Wafer Flatness Analyzer 1 as is where is
71907 Hamamatsu C7103 PC Controlled IC Back-side Lapping and Wafer Grinding System 200 mm and packages 30.09.2001 1 as is where is immediately
52166 Hitachi 545-5515 DC power supply module for CD SEM spares 1 as is where is immediately
52167 Hitachi 6280H Power Supply Module 4channels spares 1 as is where is immediately
52168 Hitachi 545-5540 Power Supply unit for CD SEM Spares 1 as is where is immediately
52312 Hitachi 545-5522 VG board for CD SEM spares 31.05.1994 1 as is where is immediately
52339 Hitachi 545-5521 EVAC PCB FOR HITACHI CD-SEM spares 31.05.1994 1 as is where is immediately
52340 Hitachi 545-5537 IP-PC2 for cd-sem spares 31.05.1994 1 as is where is immediately
52343 Hitachi 377-7592 Power Supply Module for CD SEM spares 31.05.1994 1 as is where is immediately
53054 HITACHI 6280H (SPARES) SORD Computer for cd sem system spares 1 as is where is immediately
60939 HITACHI S4160 Scanning electron microscope 31.05.1996 1 as is where is
74794 Hitachi S5200 FE SEM with EDX Inspection 31.05.2005 1 as is where is immediately
83849 Hitachi S4500 Type I FE SEM Laboratory 01.05.1995 1 inquire immediately
86169 HITACHI FB-2000A FIB Sem 200 mm 31.05.2001 1 as is where is
86171 HITACHI S-4700 (w/EDAX) FE SEM with EDX 31.05.1998 1 as is where is immediately
86172 HITACHI S-5000 FE SEM 200 mm 31.05.1994 1 as is where is
86173 HITACHI S-5000 FE SEM 200 mm 31.05.1996 1 as is where is
86174 HITACHI S-5000 FE SEM 200 mm 31.05.1999 1 as is where is
86175 HITACHI S-5000 FE SEM 200 mm 01.05.2000 1 as is where is immediately
91085 HITACHI IS-2700 Wafer Inspection Station 300 mm 1 as is where is
91086 HITACHI S-4160 FE SEM Laboratory 31.05.1996 1 as is where is
91087 HITACHI S-4160 FE SEM Laboratory 31.05.1996 1 as is where is
91088 HITACHI S-4800 FE SEM Laboratory 31.05.2005 1 as is where is
91089 HITACHI S-5500 FE SEM Laboratory 31.05.2006 1 as is where is
91090 HITACHI S-5500 FE SEM Laboratory 31.05.2012 1 as is where is
91091 HITACHI S-5500 FE SEM Laboratory 31.05.2010 1 as is where is
91397 HITACHI IS2700SE Dark Field inspection 1 as is where is
91403 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91404 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91405 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91407 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91408 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91417 HITACHI LS-6800 wafer surface inspection 300 mm 31.08.2007 1 as is where is immediately
91418 HITACHI UA-7200 Stripper/Asher 31.05.2001 1 as is where is
98269 HITACHI RS 4000 Defect Review SEM 300 mm 01.05.2003 1 as is where is immediately
98270 HITACHI RS 4000 Defect Review SEM 300 mm 01.05.2003 1 as is where is immediately
98506 Hitachi WA200 SEM 200 mm 1 as is where is
103525 HITACHI S4700-l Scanning Electron Microscope Laboratory 31.05.2004 1 as is where is immediately
103526 HITACHI S4700-ll FE Sem with Horriba EMAX EDX Laboratory 31.05.2001 1 as is where is immediately
103527 HITACHI S4700-ll FE Sem with Horriba EMAX EDX (Destocking Status) Laboratory 31.05.2003 1 as is where is immediately
106160 HITACHI RS6000 (Enhanced) Defect Review SEM 300 mm 01.06.2013 1 as is where is immediately
106367 HITACHI IS-2700 Wafer Inspection 200 mm 01.06.2005 1 as is where is
106368 HITACHI S-9260A Wafer Inspection 200 mm 01.06.2006 1 as is where is
106662 HITACHI FB2100 FIB 200 mm 01.06.2003 1 as is where is
106663 HITACHI IS3000SE WAFER PARTICLE INSPECTION 300 mm 01.06.2006 1 as is where is
106664 HITACHI IS3200SE WAFER PARTICLE INSPECTION 300 mm 01.06.2010 1 as is where is
106665 HITACHI LS9000 Wafer Surface Inspection 300 mm 01.06.2010 1 as is where is
106666 HITACHI LS-6800 Wafer Surface Inspection 300 mm 01.06.2007 1 as is where is
108021 HITACHI S-8820 CD SEM 150 mm 1 as is where is
108027 HITACHI N-6000 NANO PROBER Laboratory 01.09.2007 1 as is where is
108072 Hitachi S-6280H CD SEM 1 as is where is
108159 HITACHI S4700II FE SEM with EDAX (Detecting Unit) 1 as is where is
108160 HITACHI CV4000 High Voltage SEM 300 mm 01.06.2014 1 as is where is
108413 Hitachi CG4000 SEM 300 mm 3 as is where is
108568 HITACHI LS9000 Wafer Surface Inspection System 300mm 01.06.2010 1 as is where is immediately
108646 Hitachi S9260A CD SEM 200 mm 01.06.2011 1 inquire immediately
108647 Hitachi S9380 Type II CD SEM 200 mm and 300 mm 01.06.2009 1 inquire immediately
108752 HITACHI S7000 CD SEM 150 mm 01.05.1989 1 as is where is immediately
108896 Hitachi RS4000 Defect Review SEM 300 mm 01.06.2006 1 as is where is immediately
108902 Hitachi RS4000 Defect Review SEM 300 mm 01.05.2007 1 as is where is immediately
108161 HP 4145B CV Measurement 1 as is where is
106667 HSEB AXIOSPECT 300 MICROSCOPE INSPECTION STATION 300 mm 1 as is where is
102559 HSEB Zeiss Axiotron 300 AOI microscope with 2 units of Brooks load port 300 mm 1 as is where is immediately
108819 HYPERVISION Visionary 2 Emmission Microscope with Karl Suss PM-8 Analytical Prober 1 inquire
106504 Irvine Optical Auto Wafer Loader Microscope Inspection WAFER INSPECTION MICROSCOPE WITH AUTOLOADER 200 mm 01.06.1990 1 as is where is immediately
91419 J.A Woollam VUV-VASE (Gen II) Ellipsometer 300 mm 1 as is where is
91420 J.A Woollam VUV-VASE VU302 (Gen I) Ellipsometer 200 mm 31.05.2001 1 as is where is
109019 J.A.Woollam M2000 Bench-top Spectroscopic Ellipsometer 200 mm 01.12.2017 1 as is where is immediately
91422 JEOL JSM-5600 FE SEM 31.05.1999 1 as is where is
91424 JEOL JSM-6700F FE SEM 1 as is where is
106668 JEOL JWS-7500E SCANNING ELECTRON MICROSCOPE 200 mm 1 as is where is
108164 JEOL JSM-6340F FE Sem 1 as is where is
108323 JEOL JFS-9855S Focused Ion Beam System 200mm 01.05.2000 1 as is where is immediately
108324 JEOL JWS-7555 SEM - Defect Review (DR) 200mm 1 as is where is immediately
108822 JEOL JSM-6600F Scanning Electron Microscope 1 inquire
108907 JEOL JEM3200FS High Resolution TEM Laboratory 01.05.2006 1 as is where is immediately
91427 Jordan Valley JVX 6200 X-ray metrology (X-Ray Reflectivity) 300 mm 1 as is where is
99830 JORDAN VALLEY JVX6200I X-ray Metrology System 300 mm 28.02.2011 1 as is where is immediately
100917 Jordan Valley JVX6200 X-Ray Inspection System 300 mm 31.05.2010 1 as is where is
108415 Jordan Valley Semiconductors LTD JVX 7200 X-ray Fluorescence Spectrometer 300 mm 1 as is where is
106865 KLA 2830 (PARTS) EFEM ONLY with Yaskawa XURCM9206 robot 300 mm 01.02.2010 1 as is where is immediately
106966 KLA Aset F5x Thin Film measurement / Ellipsometer 200 mm 01.12.2000 1 inquire 4 months
106968 KLA SP2 (spare parts) Complete set of calibration standard wafers for a KLA SP2 200 mm 01.11.2022 1 inquire immediately
108009 KLA UV1250SE Wafer Film measurement / Ellipsometer 200 mm 01.10.1996 1 as is where is immediately
108325 KLA WaferSight Wafer Characterization 300 mm 01.10.2005 1 as is where is immediately
108418 KLA Archer 300 AIM Overlay Measurement System 300 mm 2 as is where is
108419 KLA Archer 300+ Overlay Measurement System 300 mm 2 as is where is
108420 KLA ASET-F5x Film Thickness Measurement System 300 mm 7 as is where is
108421 KLA eDR-5210 SEM - Defect Review (DR) 300 mm 4 as is where is
108422 KLA eDR-7380 SEM - Defect Review (DR) 300 mm 1 as is where is
108423 KLA eS37 E-beam Inspection 300 mm 1 as is where is
108424 KLA eS805 E-beam Inspection 300 mm 1 as is where is
108425 KLA Puma 9120 Darkfield Inspection 300 mm 1 as is where is
108426 KLA SM-300/SpectraMap Film Thickness Measurement System 1 as is where is
108427 KLA SpectraShape 8660 Optical Review System 300 mm 2 as is where is
108428 KLA Surfscan 7700 Particle Measurement 200 MM 1 as is where is
108429 KLA Surfscan SP2 Particle Measurement 300 mm 3 as is where is
108430 KLA TP300 Implant Dosing Measurement 200 MM 1 as is where is
108431 KLA VisEdge CV300R Edge Defect 300 mm 1 as is where is
108569 KLA 2131 Inspection System 200 mm 01.05.1995 1 as is where is immediately
108775 KLA AlphaStep 300 Profilometer 1 inquire
108930 KLA Archer AIM Plus Overlay measurement System 300 mm 01.06.2005 2 as is where is immediately
32230 KLA TENCOR SFS6400 MECHANICAL CALIBRATION Document Number 238 WAFERSURFACE ANALYSIS SYSTEM CUSTOMER MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
32231 KLA TENCOR Surfscan 64X0 Calibration Procedure Surfscan 64X0 Calibration Procedure MANUAL 1 as is where is immediately
32232 KLA TENCOR surfscan 64XX optical alignments Document Number 236 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
32233 KLA TENCOR SFS6x00 MECHANICAL CALIBRATION Document number 200 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
106481 KLA Tencor AIT I Patterned Surface Inspection System 150 mm/200 mm 01.06.1995 1 as is where is immediately
106574 KLA TENCOR SEM-3800C Scanning Electron Microscope N/A 1 as is where is
106674 KLA TENCOR Viper 2430 Macro Defect Inspection 300 mm 01.06.2004 1 as is where is immediately
106675 KLA TENCOR Viper 2435 Macro Defect Inspection 300 mm 01.06.2004 1 as is where is
106676 KLA TENCOR Viper 2435XP Macro Defect Inspection 300 mm 01.06.2004 1 as is where is
106679 KLA TENCOR 2132 (mainbody only) Wafer Inspection System 150 mm,200 mm 01.06.1995 1 as is where is
106680 KLA TENCOR P-12 Profileometer 150 mm,200 mm 1 as is where is
106681 KLA TENCOR P-2 Profileometer 150 mm,200 mm 01.06.1996 1 as is where is
108075 KLA Tencor 2131 Wafer Defect Inspection 150 mm 1 as is where is
108165 KLA TENCOR Surfscan 7200 Surfscan wafer particle detection 150 mm,200 mm 01.06.1991 1 as is where is
108166 KLA TENCOR Surfscan 7200 Surfscan wafer particle detection 150 mm,200 mm 01.06.1990 1 as is where is
1691 KLA-TENCOR 259 (spare parts) Reticle Inspection - SPARE PARTS up to 7 inch 01.12.1991 1 inquire immediately
52151 KLA-Tencor Hamamatsu R1924A Photomultiplier spares 01.03.2007 1 as is where is immediately
53035 KLA-Tencor 2132 (8 inch Wafer Chuck Assembly) Ceramic Wafer chuck, 8" spares 1 as is where is immediately
53036 KLA-Tencor Compumotor M575L11 Stepping motor drive spares 1 as is where is immediately
71632 KLA-TENCOR 2122 Brightfield Wafer Defect Inspection System 200 mm 01.04.1996 1 as is where is immediately
83702 KLA-Tencor AMRAY 4200 Review SEM 8" 28.02.1999 1 as is where is immediately
91435 KLA-Tencor AIT Particle Review 200 mm 31.05.1997 1 as is where is
91464 KLA-Tencor PROMETRIX FT750 Film Thickness Measurement 1 as is where is
91466 KLA-Tencor PROMETRIX FT750 Film Thickness Measurement 1 as is where is
91477 KLA-Tencor THERMA-WAVE OP 2600 OPTI-PROBE 200 mm 1 as is where is immediately
96998 KLA-Tencor Surfscan AIT Patterned Wafer Inspection 200 mm 01.05.1997 1 as is where is immediately
106194 KLA-Tencor Candela 7100 Wafer Inspection system for Hard Disk Substrates 01.12.2010 1 as is where is immediately
106311 KLA-TENCOR VISEDGE CV300 Wafer-Edge Inspection 300 mm 01.06.2007 1 as is where is immediately
108020 KLA-TENCOR SPECTRA FX200 Wafer surface measurement 300 mm 01.06.2010 1 as is where is
108716 KLA-Tencor Surfscan 4500 Unpatterned Wafer Surface Inspection 2 inch to 6 inch 01.11.1989 1 as is where is immediately
108760 KLA-Tencor Surfscan 4500 Wafer Particle Inspection System 2 to 6 inch 01.05.1986 1 as is where is immediately
108837 KOKUSAI VR70 Resistivity Test Tool 1 inquire
94475 LASERTEC BGM300 Wafer Surface Analyzing and VIsualization System 200 mm 31.05.2008 1 as is where is
106702 LASERTEC BGM300 Wafer Inspection System 300 mm 1 as is where is
106485 Leica LEICA INM20 Microscope inspection station 200 mm 01.06.1995 1 as is where is immediately
108171 LEICA INM100 Microscope 1 as is where is
108172 LEICA INM100 Microscope 1 as is where is
108173 LEICA INM100 Microscope 1 as is where is
108174 LEICA KENSINGTON 300901 Wafer Inspection Microscope 1 as is where is
108175 LEICA KENSINGTON 300901 Wafer Inspection Microscope 1 as is where is
108176 LEICA KENSINGTON 300901 Wafer Inspection Microscope 1 as is where is
108177 LEICA KENSINGTON 300901 Wafer Inspection Microscope 1 as is where is
108178 LEICA Polyvar SC POLYVAR SCOPE 1 as is where is
108179 LEICA Reichert POLYVAR SC Wafer Inspection Microscope 200 mm/300 mm 01.06.2002 1 as is where is
108180 LEICA Reichert-Jung, Kensington 300901 Wafer Inspection Microscope 1 as is where is
108181 LEICA Reichert-Jung, Kensington 300901 Wafer Inspection Microscope 1 as is where is
108182 LEICA Reichert-Jung, Kensington 300901 Wafer Inspection Microscope 1 as is where is
108183 LEICA Reichert-Jung, Kensington 300901 Wafer Inspection Microscope 1 as is where is
108718 Leica INS 3300 Wafer Inspection Microscope 300 MM 01.06.2005 2 as is where is immediately
86193 LEITZ MPV-SP Wafer Inspection Microscope 200 mm 1 as is where is
108464 Metryx Mentor DF3 Mass Measurement 300 mm 1 as is where is
108465 Metryx Mentor OC23 Mass Measurement 200-300 mm 1 as is where is immediately
108848 MINATO MM-6600 Wafer Mobility Tester with MECS UX-1000 Wafer Robot, 2ea Available 1 inquire
91113 MITUTOYO MP2000 METRO 200 mm 1 as is where is
108029 MSP CORP. 2300XP1 Particle Depositioning 300 mm 1 as is where is
106703 N&K ANALYZER 5700-CDRT Wafer Inspection System 1 as is where is
106704 n&k Technology 6700-CDRT Wafer Inspection System 1 as is where is
106705 NANO OPTICS HAZE 2 Nano Optics Haze 2 200 mm 1 as is where is
91526 NANOMETRICS Caliper Mosaic Overlay 300 mm 31.05.2003 1 as is where is immediately
91529 NANOMETRICS Caliper Mosaic Overlay 300 mm 28.02.2010 1 as is where is immediately
91530 NANOMETRICS NANOMETRICS 9-7200-0195E Mask & Wafer Inspection 200 mm 1 as is where is
98289 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 31.05.2005 1 as is where is
98290 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 31.05.2005 1 as is where is
98291 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 30.06.2006 1 as is where is immediately
98480 Nanometrics 8000X film thickness measurement 150mm 2 as is where is immediately
98481 Nanometrics 8000Xse film thickness measurement 200mm 2 as is where is
98508 Nanometrics M6100 Film Thickness Measurement 200 mm 1 as is where is
101585 NANOMETRICS CALIPER-ULTRA Overlay Measurement 300 mm 30.06.2006 1 as is where is
103544 NANOMETRICS CALIPER ELAN Overlay 300 mm 31.05.2004 1 as is where is
106179 Nanometrics 9000 Nanospec Wafer Metrology film thickness measurement tool 200 mm 01.06.2005 1 as is all rebuilt immediately
106302 Nanometrics SIPHER PL Mapping 300 mm 01.06.2002 1 as is where is immediately
106706 NANOMETRICS CALIPER_ULTRA Mask & Wafer Inspection 300 mm 01.06.2006 1 as is where is
106823 Nanometrics Nanospec 9100 Ox film thickness measurement (PC missing) 200mm 1 as is where is immediately
107027 NANOMETRICS Caliper Mosaic Overlay measurement System 300 mm 01.08.2010 1 inquire immediately
108186 NANOMETRICS CALIPER_MOSAIC Overlay 300 mm 01.06.2001 1 as is where is
108466 Nanometrics Atlas II+ Critical Dimension (CD) Measurement (non SEM) 300 mm 1 as is where is
108467 Nanometrics Tevet Trajectory T3 Film Thickness Measurement System 300 mm 1 as is where is
93103 NGR NGR2150 E-beam wafer inspection 300 MM 1 as is where is
102888 Nicolet ECO-1000S FT-IR 200 mm 31.05.1996 1 as is where is
108853 NICOLET Avatar 370 DTGS FT-IR Spectrometer 1 inquire
108189 NIDEC Im15 Wafer inspection 1 as is where is
108190 NIDEC Im800 Wafer inspection 1 as is where is
99396 Nikon EpiPhot 200 Inspection Microscope 200 mm 1 as is where is immediately
106503 Nikon Auto Wafer Loader for Microscope Inspection WAFER INSPECTION MICROSCOPE 150 mm/200 mm 1 as is where is immediately
106707 NIKON AMI-3300 Wafer Inspection System 300 mm 1 as is where is
106708 NIKON AMI-3300 Wafer Inspection System 300 mm 1 as is where is
106709 NIKON AMI-3500 Wafer Inspection System 300 mm 1 as is where is
108092 Nikon OPTIPHOT-200 Wafer inspection microscope 200 mm 3 as is where is
108093 Nikon OPTIPHOT-300 Wafer inspection microscope 300 mm 1 as is where is
108094 Nikon OPTIPHOT-88-AC IN Wafer inspection microscope 200 mm 1 as is where is
108643 Nikon Eclipse L200 Wafer Inspection Microscope 150 mm/200 mm 01.06.2006 1 as is where is immediately
108772 Nikon Optistation 3 Wafer Inspection System 150 mm 01.05.1994 1 as is where is immediately
108784 Nikon Optistation 3A Automatic Wafer Inspection Station 200 mm 01.05.1997 1 as is where is immediately
108785 NIKON Optiphot 200 (For spares use) Wafer Inspection Microscope (Parts Tool Only) 200 mm 1 as is where is immediately
108789 Nikon Optiphot 200 Wafer Inspection Microscope 200 mm 1 as is all rebuilt immediately
108790 NIKON Optiphot 88 Wafer Inspection Microscope 200 mm 1 as is where is immediately
108854 NIKON NWL-860 Automatic Microscope Wafer Loader for up to 200mm Wafers 1 inquire
108855 NIKON Optiphot 200 Wafer Inspection Microscope, B/Dfield & DIC Microscopy, Motorized Turret with 5ea Objectives, Prior ProScan Programmable Stage, 200mm X 200mm XY Travel, Color CCD Camera & More 1 inquire
108033 NOVA NOVASCAN 3090 P/N 390-10000-11 Etch OCD Measuring 300 mm 1 as is where is
108967 NOVA T600 MMSR Ellipsometer for CD and thin film measurements 300 mm 01.01.2018 1 as is where is immediately
106513 OAI 1030 OI Analytical Model 1088 150 mm/200 mm 1 as is where is
106407 Olympus BHMJL Wafer Inspection Microscope 200 mm 1 as is where is
106408 Olympus BHMJL Wafer Inspection Microscope 200 mm 1 as is where is
106824 Olympus AL100N-LMB8 wafer loader for Olympus microscope 200mm 1 inquire
106825 Olympus AL110-LMB6 with MX51 wafer loader with Microscope 150mm 1 inquire
108786 OLYMPUS BH-BHM Wafer Inspection Microscope 150 mm 1 as is where is immediately
108857 OLYMPUS AL100-L8 Wafer Loader, 200mm, Parts Tool 200 MM 1 inquire
103547 ONTO WV320 MACRO INSPECTING 300 mm 31.05.2004 1 as is where is
31246 PMS Liquitrack 776200 Non volatile residual Monitor for water-quality checking facilities 01.10.1999 1 as is where is immediately
91552 RAYTEX RXW-800 EDGE SCAN 200 mm 31.05.2008 1 as is where is
98489 Raytex RXW-0826SFIX-SMIF edge scanner 200mm 1 as is where is
106409 Raytex RXW-1226SFI Wafer Edge Inspection 300 mm 01.06.2008 1 as is where is
108479 Raytex RXW-1227 EdgeScan Edge Defect 1 as is where is
106410 Revera RVX5000 X-Ray Photoelectron Spectroscopy (XPS) 300 mm 01.06.2008 1 as is where is
108329 ReVera RVX1000 Film Thickness Measurement System 300 mm 1 as is where is immediately
108480 ReVera RVX1000 Film Thickness Measurement System 1 as is where is
108481 ReVera VeraFlex X-ray Fluorescence Spectrometer 1 as is where is
91557 RIGAKU XRF3640 (Handle include) Wafer/ Disk Analyzer 200 mm 01.05.1995 1 as is where is
108194 RIGAKU 3640 WAFER/DISK Analyzer 200 mm 01.06.2000 1 as is where is immediately
108865 RIGAKU V300 Total Reflection Xray Fluoroescence Spectrometer 1 inquire
72034 RUDOLPH MP200 METROLOGY 200 mm 31.05.2000 1 as is where is immediately
91116 RUDOLPH MP200 XCu Thin Film Measurement 200 mm 31.05.2001 1 as is where is
91559 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2005 1 as is where is
91560 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2005 1 as is where is
91561 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2006 1 as is where is
91563 RUDOLPH Meta Pulse Film Metrology 200 mm 31.05.2005 1 as is where is
91566 Rudolph WS3840 3D Bump Metrology 300 mm 31.05.2010 1 as is where is immediately
91567 RUDOLPH META PULSE 200 Surface Film Metrology 200 mm 31.05.2002 1 as is where is immediately
94478 RUDOLPH FE-3 Focus Ellipsometer 200 mm 1 as is where is
94479 RUDOLPH FE-4D Focus Ellipsometer 200 mm 1 as is where is
98296 RUDOLPH Meta Pulse 300 Film thickness measurement 300 mm 1 as is where is
98297 RUDOLPH Meta Pulse 300 Film thickness measurement 300 mm 1 as is where is
98298 RUDOLPH MP1-300 Film thickness measurement 300 mm 31.05.2007 1 as is where is
98835 RUDOLPH AXI-S Macro Wafer Inspection 300 mm 30.06.2004 1 as is where is immediately
98837 RUDOLPH MP1-300XCU Film Thickness Measurement System 300 mm 30.04.2008 1 as is where is immediately
100928 RUDOLPH AXI-S Macro Inspection System 300 mm 31.05.2003 1 as is where is
100929 RUDOLPH FE-7 Ellipsometer 200 mm 31.05.1996 1 as is where is
100930 RUDOLPH MP300 Film thickness measurement 200 mm 31.05.2007 1 as is where is
100931 RUDOLPH MP300 Film thickness measurement 200 mm 31.05.2009 1 as is where is
100932 RUDOLPH S3000A Focused Beam Ellipsometer 200 mm 31.05.2012 1 as is where is
103553 RUDOLPH AXI-S Macro Inspection 300 mm 31.05.2004 1 as is where is
103554 RUDOLPH AXI935D AVI 300 mm 1 as is where is
103555 RUDOLPH MP3 300XCU FLIM THICKNESS MEASUREMENT SYSTEM 300 mm 1 as is where is immediately
106298 RUDOLPH MetaPulse 3 300A Film Thickness Measurement 300 mm 01.06.2008 1 as is where is immediately
106420 Rudolph NSX 115 Automated Defect Inspection 200 mm 1 as is where is immediately
106421 Rudolph NSX 95 Automated Macro Defect Inspection 150 mm/200 mm 1 as is where is immediately
106422 Rudolph NSX-105 Automated Defect Inspection 150 mm/200 mm 1 as is where is immediately
106423 Rudolph NSX-105d1 Automated Defect Inspection 150 mm/200 mm 1 as is where is immediately
106424 Rudolph NSX-95 Automated Macro Defect Inspection 150 mm/200 mm 1 as is where is immediately
106425 Rudolph NSX-95 Manual Macro Wafer Defect Inspection 150 mm/200 mm 1 as is where is immediately
106715 RUDOLPH MP3_300A METAL THICKNESS MEASUREMENT 300 mm 01.06.2012 1 as is where is
106716 RUDOLPH MP-300 Film thickness measurement 300 mm 01.06.2005 1 as is where is
106717 RUDOLPH MP1-300 Film Thickness Measurement 300 mm 01.06.2003 1 as is where is
106718 RUDOLPH MP1-300 Film Thickness Measurement 300 mm 1 as is where is
106719 RUDOLPH MP1-300XCU Film thickness measurement system 300 mm 01.06.2008 1 as is where is
106720 RUDOLPH NSX 105 MACRO DEFECT INSPECTION SYSTEM 300 mm 01.06.2008 1 as is where is immediately
106721 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2010 1 as is where is
106722 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2011 1 as is where is
106723 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 1 as is where is
106724 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2011 1 as is where is
106725 RUDOLPH S3000S FBE(focused beam laser ellipsometry) 300 mm 01.06.2010 1 as is where is
106726 RUDOLPH S3000S FBE(focused beam laser ellipsometry) 300 mm 1 as is where is
106727 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2003 1 as is where is
106728 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2003 1 as is where is
106729 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2006 1 as is where is
106730 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2002 1 as is where is
106731 RUDOLPH WV320 Macro Inspection 300 mm 01.06.2006 1 as is where is
106732 RUDOLPH MP200 Film thickness measurement 200 mm 01.06.2003 1 as is where is
106733 RUDOLPH MP200 Film thickness measurement 200 mm 01.06.1999 1 as is where is
106734 RUDOLPH WV320 Macro Defect Inspection System 300 mm 1 as is where is
106735 RUDOLPH WV320 Macro Defect Inspection System 300 mm 1 as is where is
106831 Rudolph MP200XCU Cu Film thickness measurement 200mm 1 inquire
106832 Rudolph MP300 Metal Film thickness measurement 300mm 1 inquire
106833 Rudolph MP300 XCu Cu Film thickness measurement 300mm 2 inquire
106871 RUDOLPH NSX 105 Automated Wafer, Die and Bump Inspection System 300 mm 01.06.2008 1 as is where is immediately
108034 RUDOLPH AXI-S930B Macro Defect Inspection 300 mm 01.01.2007 1 as is where is
108195 RUDOLPH META PULSE 200 Film thickness measurement 200 mm 01.06.1999 1 as is where is
108196 RUDOLPH META PULSE 200 Film thickness measurement 200 mm 01.06.2005 1 as is where is
108197 RUDOLPH META PULSE 200X CU Film thickness measurement (Including HDD) 200 mm 01.06.2003 1 as is where is
108198 RUDOLPH META PULSE 200X CU Film thickness measurement (Including HDD) 200 mm 01.06.2001 1 as is where is
108199 RUDOLPH META PULSE II 200X CU Film thickness measurement 200 mm 01.06.2008 1 as is where is
108200 RUDOLPH MP200 Film thickness measurement 200 mm 01.06.2002 1 as is where is
108296 Rudolph NSX THIN WAFER Loader NSX 200 mm 01.06.2008 1 as is where is
108297 Rudolph NSX-115 Macro Defect Inspection 01.06.2011 1 as is where is
108482 Rudolph Axi 935 Macro-Defect 1 as is where is
108483 Rudolph Matrix S-300 Ellipsometer 300 mm 1 as is where is
108484 Rudolph MetaPULSE 300 Film Thickness Measurement System 300 mm 3 as is where is
108485 Rudolph NSX 105 Macro-Defect 300 mm 8 as is where is
108587 RUDOLPH WV320 Wafer Inspection System 300mm 1 as is where is immediately
108711 Rudolph Sonus 7800 Acoustic Metrology and Defect Detection System 300 MM 01.06.2015 1 inquire
106411 SCIENTECH Stacis 2100 Active Piezoelectric Vibration Cancellation System Facilities 01.06.2008 1 as is where is
102894 SDI SPV-1050 Contamination Monitoring System 200 mm 31.05.1996 1 as is where is immediately
106661 SDI FAAST 230-DP+SPV+SLIC CARRIER LIFETIME MEASUREMENT 200 mm 1 as is where is
91117 SEIKO CHIPS-200 metrology system 200 mm 1 as is where is
86199 SEIKO SEIKI SMI2200 SEM 200 mm 1 as is where is
91118 SELA MC100 metrology system 200 mm 1 as is where is
91119 SELA MC500 metrology system 200 mm 1 as is where is
108035 SEMILAB PMR_3000 Dose Monitoring 300 mm 1 as is where is
108696 SENTECH Senduro 300 Thin Film measurement Up to 300 MM 01.06.2008 1 inquire
106412 SII NANO XV 300DB Wafer Inspection 300 mm 01.06.2008 1 as is where is
83703 SOPRA SE 200 Ellipsometer 200 mm 1 as is where is
106742 SSM 5200 Resistivity Measurement 200 mm 01.06.2008 1 as is where is
108773 SSM 470i CV Plotter 1 inquire
91569 Thermo Fisher ECO 1000 FTIR System 200 mm 01.05.2000 1 as is where is immediately
106303 Thermo Fisher ECO1000-S FTIR 300 mm 01.06.1997 1 as is where is immediately
96382 Veeco D9000 Atomic Force Microscope 200 mm 31.05.2001 1 as is where is immediately
96383 Veeco D9000 Atomic Force Microscope 200 mm 31.05.2001 1 as is where is immediately
98373 VEECO V220SI METRO 200 mm 31.05.2002 1 inquire
107002 Veeco DekTak 6M Stylus profilometer 150 mm 01.06.2006 1 as is where is immediately
107011 Veeco Dektak 200 Si Contact Profilometer - for spares use (Not operational condition) 150 mm 01.06.2000 1 as is where is immediately
108331 Veeco Dimension 7000 Atomic Force Microscope (AFM) 200mm 1 as is where is immediately
108893 VEECO AP-150 Automtic Four Point Probe, for up to 6" Wafers 150 MM 1 inquire
108894 VEECO Dektak 3030ST Profilometer 1 inquire
108916 Veeco Dimension X3D Model 340 Atomic Force Microscope 300 MM 01.05.2006 1 as is where is immediately
108544 Veeco Instruments Inc. Dimension X3D Atomic Force Microscope (AFM) 300 mm 1 as is where is
93087 Woollam VUV-VASE (Gen II) Ellipsometer 300 MM 1 as is where is immediately
106312 WYKO NT-3300 Optical Profiler 300 mm 01.06.2012 1 as is where is immediately
108216 ZEISS AXIOTRON Inspection Micro Scope 1 as is where is
108217 ZEISS AXIOTRON Inspection Micro Scope 1 as is where is
108218 ZEISS AXIOTRON High Perfomance Micro Scope 01.06.2008 1 as is where is
108545 Zeiss Axiospect 300 Optical Review System 300 mm 4 as is where is
108972 Zeiss Axiospect Wafer Inspection Microscope 300 mm 01.06.2011 1 as is where is immediately


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