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Pre-owned Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com

Please find below a list of Used Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com .Click on any listed item of Fab Metrology , Inspection and QC Equipment to see further data.


SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
91841 ADE Episcan 1000 FT-IR Spectromter for measurement of Epitaxial films 100-200 mm 1 inquire immediately
92686 ADE FIT3120 PARTICLE COUNTER 300 mm 1 as is where is
97846 ADE NANOMAPPER SQM 300 mm 01.06.2001 1 as is where is
102061 ADE Episcan 1000 Epi Thickness Measurement System 200 mm 1 as is where is
102631 ADE 9500 Wafer flatness measurement system with ASC1000 200 mm 1 inquire
102632 ADE 9500 Wafer flatness measurement system with ASC2500 200 mm 1 inquire
103225 ADE NanoMapper FA Nano-Defects Inspection System 300 mm 1 inquire immediately
101393 Agilent 7500a ICP Mass Spectrometer Laboratory 1 as is where is immediately
102974 AGILENT 4155C SEMICONDUCTOR PARAMETER ANALYZER 200 MM 1 as is where is
84360 Alcatel 925-40 Leak Detector 1 as is where is immediately
71960 Applied Materials SEMVISION CX INSPECTION SEM 200 mm 01.06.2000 1 as is where is immediately
83514 Applied Materials Opal 7830i Enhanced CD-SEM 200 mm 01.06.1997 1 as is where is immediately
86422 Applied Materials Orbot WF720 Wafer inspection system 125 mm 1 as is where is
90947 Applied Materials UVision 4 Bright field inspection 300 mm 01.06.2009 1 as is where is
92045 Applied Materials UV 5 Wafer Inspection System 300 mm 01.06.2012 1 as is where is immediately
92800 Applied Materials Orbot WF720 Metrology (Metrology) 125 mm 1 as is where is
93395 Applied Materials UVision 3 Wafer Inspection System 200 mm 1 as is where is immediately
98084 Applied Materials UVision 5 Brightfield UV Wafer Inspection System 300 mm 01.06.2011 1 as is where is
98085 Applied Materials UVision 5 Brightfield UV Wafer Inspection System 300 mm 01.06.2012 1 as is where is
98329 Applied Materials PRODUCER GT (Chamber) UV CURE CHAMBER 300 mm 1 inquire
102093 Applied Materials Elite M5 MC eBeam Inspection 300 mm 1 as is where is
102094 Applied Materials Elite MS MC eBeam Inspection 300 mm 1 as is where is
102100 Applied Materials NanoSEM 3D CD Metrology 300 mm 01.06.2002 1 as is where is
102101 Applied Materials NanoSEM 3D CD Metrology 300 mm 01.06.2002 1 as is where is
102102 Applied Materials NanoSEM 3D CD-SEM 300 mm 01.06.2003 1 as is where is
102103 Applied Materials NanoSEM 3D Scanning Electron, CDSEM Measurement 300 mm 01.06.2004 1 as is where is
102104 Applied Materials NanoSEM 3D Scanning Electron, CDSEM Measurement 300 mm 01.06.2004 1 as is where is
102105 Applied Materials NanoSEM 3D Scanning Electron, CDSEM Measurement 300 mm 01.06.2004 1 as is where is
102129 Applied Materials SEMVision CX Defect Review SEM 200 mm 01.06.2000 1 as is where is
102130 Applied Materials UVision 200 Bright-Field Inspection 300 mm 01.06.2005 1 as is where is
102673 Applied Materials SEMVision G3 Defect Review SEM 300 mm 01.06.2007 1 as is where is immediately
102674 Applied Materials SEMVision G3 Lite Defect Review SEM 300 mm 01.06.2007 1 as is where is immediately
102986 Applied Materials Uvision 600SP Brightfield Inspection System 300 mm 01.06.2008 1 as is where is
103514 Applied Materials SEMVISION SEM 300 mm 01.06.2007 1 as is where is
103684 Applied Materials Semvision 200CX Inspection SEM 150-200 mm 01.06.2000 1 as is where is immediately
97046 ASML Yeldstar S-100 Advanced Process Control / Yield Opimization System 300 mm 1 as is where is immediately
101427 ASML YieldStar S-200B Overlay Measurement System 300mm 01.02.2011 1 as is where is
103070 ASML YieldStar S-250 Overlay Measurement System 300mm 1 as is where is
103736 Aspex Explorer VP SEM 1 as is where is immediately
91387 AUGUST CV-9812 Wafer Carrier inspection tool 1 as is where is immediately
98447 August 3DI-8000 wafer bump inspection 300mm 1 as is where is immediately
98448 August NSX-95 2D Auto inspection system / Macro defect inspection system 200 mm 4 as is where is immediately
101818 August NSX105 Wafer Bumping Inspection System / Macro defect inspection 200mm 1 inquire
95016 Bio-Rad Q8 Overlay Metrology 1 as is all rebuilt 1 month
99405 Bio-Rad Q5 (Upgrade to a Q6) Overlay Registration Tool up to 200 mm 2 as is where is immediately
99406 Bio-Rad Q7/Q8 Overlay metrology Tool 150 mm-200 mm 01.06.1997 1 as is where is immediately
99407 Bio-Rad QS-1200 FT-IR Spectrometer 100-200 mm 01.06.2004 1 as is where is immediately
99409 Bio-Rad QS-408M Manual FT-IR Spectrometer 100-200 mm 1 as is where is immediately
102587 Bio-Rad QS-300 FT-IR Spectrometer 1 as is where is immediately
33671 BIORAD Q5 Overlay Metrology Tool 200 mm 2 as is where is immediately
91847 BIORAD QS-408M Manual FT-IR Spectrometer for Epi, SiN, BPSG Measurement & More, up to 200mm Wafers, 2ea Available 1 inquire immediately
97995 Biorad Q5 Overlay measurement system 150mm 1 as is where is
97850 Bruker DEKTAK-8ADP Scan Profiler 1 as is where is
98851 Bruker D8 Fabline X-ray Diffractometer 150 mm / 200 mm 01.05.2011 1 as is where is immediately
102148 Bruker D8FABLINE X-ray 300 mm 01.06.2015 1 as is where is
102149 Bruker Insight 3D Mask House Photomask Inspection 300 mm 01.06.2017 1 as is where is
101769 Cambridge Scientific S360 SEM with EDS 1 as is where is immediately
95610 Cameca TXRF 8300 Automated TXRF with Specimen Chamber and Wafer Handling 300 mm 01.06.2007 1 as is where is immediately
102075 Cameca LEXFAB300 Low Energy Electron-induced X-Ray emission spectrometer 300 mm 01.06.2007 1 as is where is
102950 CAMECA IMS WF SECONDARY ION MASS SPECTROMETER Laboratory 01.06.2007 1 as is where is
103221 Cameca IMS 5FE7 Secondary Ion Mass Spectrometry System 1 as is where is immediately
102151 Camtek X- ACT TEM Sample Preparation System 01.06.2012 1 as is where is
100723 Canon PLA501 Contact and Prossimity Mask Aligner 1 as is where is
102159 Carl Zeiss Axiospect 300 Wafer inspection microscope 300 mm 01.06.2007 1 as is where is
102160 Carl Zeiss Axiotron-2 Microscope 200 mm 01.06.2000 1 as is where is
102161 Carl Zeiss Axiotron-2 Microcope 200 mm 01.06.2000 1 as is where is
102162 Carl Zeiss Axiotron-2 Microscope 200 mm 01.06.2000 1 as is where is
102163 Carl Zeiss Axiotron-2 Microscope 200 mm 1 as is where is
102164 Carl Zeiss Axiotron-2 Microscope 200 mm 1 as is where is
102165 Carl Zeiss Axiotron-2 Micro scope 200 mm 1 as is where is
102166 Carl Zeiss Axiotron-2 Inspection Microscope 200 mm 1 as is where is
102167 Carl Zeiss Axiotron-2 Microscope 200 mm 1 as is where is
74929 CDE Resmap 463 OC Four-point prober Resistivity Measurement up to 300 mm 1 as is where is immediately
103152 Dektak 3030 Profiler 1 inquire
100728 Delta Tech. GM SSR AX-PC/GM-1D X-Ray 01.06.2010 1 as is where is
102589 E+H MX 203-6-33 Wafer Bow Measurement System 100 - 150 mm 01.06.2008 1 as is where is immediately
89978 Edwards IPX-500 Dry Pump 1 as is where is
92213 ESCO EMD-WA1000S Temperature Desorption Analyzer 200mm 01.06.2000 1 as is where is
100938 ESMO Hermes Testhead Manipulator Test 01.06.2006 3 as is where is immediately
79226 FEI DB 235 Dual Beam FIB SEM 01.06.2000 1 inquire
86292 FEI F30 Technai FIB SEM 1
86294 FEI DB 835 FIB SEM 1
86300 FEI Nova nano 230 FIB SEM 1 inquire immediately
91392 FEI FEM2010F Dual Beam FIB-SEM N/A 1 as is where is
92040 FEI TF30 Super twin 01.10.2007 1 as is all rebuilt immediately
93961 FEI Altura Dual beam FIB 01.01.2004 1 as is where is immediately
96041 FEI Helios Nanolab 400 FIB SEM 100 mm 01.06.2008 1 inquire
99400 FEI Quanta Inspect fp Tungsten filament SEM 200 mm 1 as is where is immediately
99853 FEI XL40 Cross Section SEM 1 inquire
101622 FEI Expida 1255 DUAL BEAM FIB w/MANUAL WAFER LOAD 300 mm 1 as is where is immediately
101711 FEI Helios 450S Dual Beam FIB-SEM 1 inquire
101712 FEI Strata 400 Focused Ion Beam System 1 inquire
103002 FEI 200XP Focus Ion Beam System 01.06.2005 1 as is where is
103436 FEI Tecnai G2 F30 TEM electron microscope Laboratory 01.06.2005 1 as is where is immediately
86235 FEI Company 820 Dual Bem Fib SEM 200 mm 1 as is where is immediately
101441 FEI Company Tecnai G2 F30 TEM Laboratory 1 as is where is immediately
97925 Filmetrics F50 UV Mapping Reflectometer 200 mm 1 as is where is immediately
101843 Filmetrics F50 Thin Film Analyzer 1 as is where is immediately
55974 FRONTIER FSM900TC-VAC FILM STRESS AND WAFER BOW MEASUREMENT 200 mm 01.05.2000 1 as is where is immediately
90155 FSM FSM 500TC THIN FILM STRESS MEASUREMENT 01.02.2007 1 as is where is
90156 FSM 500TC THIN FILM STRESS MEASUREMENT 01.06.2004 1 as is where is immediately
93084 FSM SYMPHONYMC Life Time 300 MM 1 as is where is
96543 Gaertner L115C-8 Ellipsometer, cassette to cassette 100-200 mm 01.03.1995 1 as is where is immediately
99414 GCA/Tropel 9000 Wafer Flatness Analyzer 1 as is where is
102218 GEMETEC Elymat III WSPS 300 mm 1 as is where is
71907 Hamamatsu C7103 PC Controlled IC Back-side Lapping and Wafer Grinding System 200 mm and packages 01.10.2001 1 as is where is immediately
97928 HANRA HRI-580L INSPECTION SYSTEM ASSEMBLY 2 inquire
97859 HERMES NMI-100 DEFECT INSPECTION 1 as is where is
98118 Hermes Microvision eScan320 ebeam Inspection 300 mm 1 as is where is
101442 Hermes Microvision eP3 XP E-beam Inspection 300mm 01.06.2014 1 as is where is
101443 Hermes Microvision eP3 XP E-beam Inspection 300mm 01.06.2014 1 as is where is
102219 Hermes Microvision eP3 XP E-Beam Inspection System 300 mm 01.06.2012 1 as is where is
102220 Hermes Microvision eP4 CFM_EBeam Inspection HMI 300 mm 01.06.2017 1 as is where is
102221 Hermes Microvision eScan500 ebeam Inspection 300 mm 01.06.2014 1 as is where is
102222 Hermes Microvision eScan500 EBeam Inspection_HMI 300 mm 01.06.2014 1 as is where is
102959 HIMS NMI-100 DEFECT INSPECTION 300 mm 1 as is where is
36259 HITACHI S-9300 SEM - CD (CRITICAL DIMENSION) 300 mm 01.06.2005 1 as is all rebuilt 2 months
52166 Hitachi 545-5515 DC power supply module for CD SEM spares 1 as is where is immediately
52167 Hitachi 6280H Power Supply Module 4channels spares 1 as is where is immediately
52168 Hitachi 545-5540 Power Supply unit for CD SEM Spares 1 as is where is immediately
52312 Hitachi 545-5522 VG board for CD SEM spares 01.06.1994 1 as is where is immediately
52339 Hitachi 545-5521 EVAC PCB FOR HITACHI CD-SEM spares 01.06.1994 1 as is where is immediately
52340 Hitachi 545-5537 IP-PC2 for cd-sem spares 01.06.1994 1 as is where is immediately
52343 Hitachi 377-7592 Power Supply Module for CD SEM spares 01.06.1994 1 as is where is immediately
53054 HITACHI 6280H (SPARES) SORD Computer for cd sem system spares 1 as is where is immediately
56838 Hitachi S-4500 FE Inspection SEM Type 1 chamber 1 as is all rebuilt immediately
60939 HITACHI S4160 Scanning electron microscope 01.06.1996 1 as is where is
65359 HITACHI S-9220 SIP baord for CD-SEM S9220,P/N 568-5591 1 as is where is immediately
74794 Hitachi S5200 FE SEM with EDX Inspection 01.06.2005 1 as is where is immediately
78108 Hitachi S4700 Type 2 FE-SEM Up to 6 inch 01.06.2006 1 as is all rebuilt immediately
83585 Hitachi S5000H Field Emission SEM Laboratory 1 as is where is immediately
84345 Hitachi EA8000 X-ray Particle Contaminant Analyzer 1 as is where is immediately
86169 HITACHI FB-2000A FIB Sem 200 mm 01.06.2001 1 as is where is
86171 HITACHI S-4700 (w/EDAX) FE SEM with EDX 01.06.1998 1 as is where is
86172 HITACHI S-5000 FE SEM 200 mm 01.06.1994 1 as is where is
86173 HITACHI S-5000 FE SEM 200 mm 01.06.1996 1 as is where is
86174 HITACHI S-5000 FE SEM 200 mm 01.06.1999 1 as is where is
86175 HITACHI S-5000 FE SEM 200 mm 01.06.2000 1 as is where is
86275 Hitachi RS4000 In-line Defect Review SEM 200 mm / 300 mm 01.01.2007 1 as is where is immediately
86296 Hitachi 3600N SEM 1 inquire immediately
86297 Hitachi S5200 FE-SEM 1 inquire immediately
86298 Hitachi S4800 FE-SEM 1 inquire immediately
88948 Hitachi S9380 CD SEM metrology ( Working ) Spares 1 inquire immediately
88949 Hitachi S9380 II CD SEM metrology (As-Is) Spares 1 as is where is immediately
91006 Hitachi RS 5500 Defect Review SEM 300 MM 01.06.2009 1 as is where is immediately
91085 HITACHI IS-2700 Wafer Inspection Station 300 mm 1 as is where is
91086 HITACHI S-4160 FE SEM Laboratory 01.06.1996 1 as is where is
91087 HITACHI S-4160 FE SEM Laboratory 01.06.1996 1 as is where is
91088 HITACHI S-4800 FE SEM Laboratory 01.06.2005 1 as is where is
91089 HITACHI S-5500 FE SEM Laboratory 01.06.2006 1 as is where is
91090 HITACHI S-5500 FE SEM Laboratory 01.06.2012 1 as is where is
91091 HITACHI S-5500 FE SEM Laboratory 01.06.2010 1 as is where is
91103 HITACHI WA-1300 ATOMIC FORCE MICROSCOPE 300 mm 1 as is where is
91104 HITACHI WA3300 atomic force microscope - 1 as is where is
91395 HITACHI I-6300 CD SEM 1 as is where is
91396 HITACHI IS2700SE Dark Field inspection 300 mm 01.06.2006 1 as is where is
91397 HITACHI IS2700SE Dark Field inspection 1 as is where is
91398 HITACHI IS3000E High Speed Dark Field inspection 300 mm 01.06.2007 1 as is where is
91399 HITACHI IS3000E High Speed Dark Field inspection 300 mm 01.06.2007 1 as is where is
91400 HITACHI IS3000E High Speed Dark Field inspection 300 mm 01.06.2007 1 as is where is
91401 HITACHI IS3000E High Speed Dark Field inspection 300 mm 01.06.2007 1 as is where is
91402 HITACHI IS3000E High Speed Dark Field inspection 300 mm 01.06.2007 1 as is where is
91403 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91404 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91405 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91407 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91408 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91411 HITACHI S9260A CD SEM 200 mm 01.05.2003 1 as is where is immediately
91417 HITACHI LS-6800 wafer surface inspection 300 mm 01.09.2007 1 as is where is immediately
91418 HITACHI UA-7200 Stripper/Asher 01.06.2001 1 as is where is
91848 HITACHI S7000 CD SEM 150 mm 01.06.1989 1 as is where is immediately
92027 HITACHI S9300 CD SEM 200-300 mm 01.06.2001 3 as is where is immediately
93374 Hitachi S4700 FIELD EMISSION SEM Laboratory 01.06.2004 1 as is where is immediately
94459 HITACHI S-7800 CD SEM 150 mm,200 mm 01.06.1996 1 as is where is
94460 HITACHI S-7800HSA CD SEM 150 mm,200 mm 01.06.1997 1 as is where is
95070 Hitachi S5000 SEM Scanning Electron Microscope Hitachi S5000 with Noran 445A-3SES detector Laboratory 01.01.2014 1 as is where is immediately
95361 Hitachi IS3000 DARK FIELD INSPECTION 300 mm 01.06.2007 1 as is where is
95729 Hitachi WA 3300 Atomic Force Microscope 300 mm 01.06.2007 1 as is where is immediately
95934 Hitachi HD-2300 Scanning Transmission Electron Microscope 300 mm 1 as is where is
95998 HITACHI EDAX 136-5 Energy Dispersive X-ray Spectrometer Laboratory and Scientific 1 as is where is
96042 Hitachi CG-4000 CD Sem 300 mm 1 inquire
96044 Hitachi S-4800-II FE SEM 200 mm 01.06.2004 1 inquire
96045 Hitachi S-4800-II FE SEM 200 mm 01.06.2007 1 inquire
96046 Hitachi S-5200 FE SEM Laboratory and Scientific 1 inquire
96047 Hitachi SU-70 High Resolution Field Emission SEM Laboratory and Scientific 01.06.2008 1 inquire
97043 Hitachi SU 8010 Ultra High Resolution Field Emission Scanning Electron Microscope 100 mm 01.06.2014 1 as is where is immediately
98206 Hitachi S-5000 FA SEMs/TEMs/Dual Beams 1 inquire
98207 Hitachi S-7800 Metrology and Inspection 200 mm 01.08.1997 1 inquire
98269 HITACHI RS 4000 Defect Review SEM 300 mm 01.06.2003 1 as is where is
98270 HITACHI RS 4000 Defect Review SEM 300 mm 01.06.2003 1 as is where is
98272 HITACHI S4700-I Scanning Electron Microscope 300 mm 01.06.2001 1 as is where is
98273 HITACHI S4700 FE SEM 1 as is where is
98506 Hitachi WA200 SEM 200 mm 1 as is where is
99158 Hitachi CG-4100 SEM - Critical Dimension (CD) Measurement 300mm 1 as is where is
99159 Hitachi CG-4100 SEM - Critical Dimension (CD) Measurement 300mm 1 as is where is
99856 Hitachi S4500 Field Emission SEM 01.06.1993 1 inquire
100157 Hitachi CG-4100 SEM - Critical Dimension (CD) Measurement 300mm 1 as is where is
100729 Hitachi SU1510 SEM 1 as is where is
101020 HITACHI S-9300 SEM - CD (CRITICAL DIMENSION) 200 mm 01.06.2005 1 inquire 2 months
101623 HITACHI CG4000 CD SEM, Copper Tool 300 mm 1 as is where is
101713 Hitachi CG-4000 2 LP SEM 300 mm 1 inquire
101714 Hitachi CG-4000 3LP SEM 300 mm 1 inquire
101715 Hitachi HD-2300 STEM 1 inquire
101716 Hitachi Regulus SU-8230 FE SEM 1 inquire
101717 Hitachi S-4700-II FE SEM 1 inquire
101718 Hitachi S-4800-II FE SEM 1 inquire
101719 Hitachi SU-1500 SEM 1 inquire
102223 Hitachi AS5000 Wafer Particle & Defect Analysis System AS-5000 200 mm 01.06.1997 1 as is where is
102224 Hitachi HD2300 STEM 300 mm 01.06.2006 1 as is where is
102225 Hitachi HF-2000 EDX/EELs/STEM imaging 01.06.1995 1 as is where is
102226 Hitachi IS2700 Dark Field inspection 300 mm 01.06.2005 1 as is where is
102227 Hitachi RS4000 DR SEM 300 mm 01.06.2005 1 as is where is
102228 Hitachi RS4000 Defect SEM inspection 300 mm 01.06.2006 1 as is where is
102229 Hitachi RS4000 DR SEM 300 mm 01.06.2006 1 as is where is
102230 Hitachi RS4000 DR SEM 300 mm 01.06.2007 1 as is where is
102231 Hitachi RS4000 DR SEM 300 mm 01.06.2007 1 as is where is
102232 Hitachi RS4000 DR SEM 300 mm 01.06.2007 1 as is where is
102234 Hitachi S-4500 Scanning Electron Microscope 01.06.1997 1 as is where is
102236 Hitachi S-5200 SEM, Ultra High Resolution 01.06.2004 1 as is where is
102699 Hitachi CG-4100 SEM - Critical Dimension (CD) 300 mm 01.03.2013 1 as is where is
102965 HITACHI IS3000 DARK FIELD 300 mm 01.06.2007 1 as is where is
103088 Hitachi CG5000 SEM 300mm 01.05.2014 1 as is where is
103089 Hitachi CG5000 SEM 300mm 01.07.2014 1 as is where is
103090 Hitachi S-9360 SEM - Critical Dimension (CD) Measurement 300mm 01.06.2003 1 as is where is
103091 Hitachi S-9360 SEM - Critical Dimension (CD) Measurement 300mm 01.06.2003 1 as is where is
103525 HITACHI S4700-l Scanning Electron Microscope (No EDX) Laboratory 01.06.2004 1 as is where is
103526 HITACHI S4700-ll FE Sem with Horriba EMAX EDX Laboratory 01.06.2005 1 as is where is
103527 HITACHI S4700-ll FE Sem with Horriba EMAX EDX (Destocking Status) Laboratory 01.06.2004 1 as is where is
103706 Hitachi 4700 FE SEM Laboratory 01.06.2000 1 as is where is
87825 Horiba PD3000 Reticle inspection system 200 MM 01.06.1995 1 as is where is immediately
88596 Horiba PR-PD2 Reticle/Mask Particle Detection System 150 MM 01.04.2006 1 as is where is immediately
90670 Horiba Jobin Evon PZ2000 Ellipsometer 200 mm 01.06.2000 1 as is where is immediately
97863 HP 16500C Logic Analyser 1 as is where is
102238 HSEB AXIOSPECT 301 Optical Microscope 300 mm 1 as is where is
102239 HSEB AXIOSPECT 301 Optical Microscope 300 mm 1 as is where is
103092 HSEB Axiospect 300 Optical Review System 300mm 1 as is where is
102559 HSEB Zeiss Axiotron 300 AOI microscope with 2 units of Brooks load port 300 mm 1 as is where is immediately
91419 J.A Woollam VUV-VASE (Gen II) Ellipsometer 300 mm 1 as is where is
91420 J.A Woollam VUV-VASE VU302 (Gen I) Ellipsometer 200 mm 01.06.2001 1 as is where is
91421 J.A.WOOLAM M-2000X spectroscopic ellipsometers 1 as is where is
93088 J.A.WOOLAM VUV-VASE VU302 (Gen I) Ellipsometer 200 mm 01.06.2001 1 as is where is
87098 JEOL JWS-7505 Defect review SEM w/ EDX, untested 200 mm 01.01.2001 1 as is where is
87627 JEOL JSM 6400 Scanning Electron Microscope 1 as is where is immediately
87828 Jeol JWS7555 Scanning Electron Microscopes 200 mm 01.01.2000 1 as is where is immediately
91422 JEOL JSM-5600 FE SEM 01.06.1999 1 as is where is
91423 JEOL JSM-6340F FE SEM 1 as is where is
91424 JEOL JSM-6700F FE SEM 1 as is where is
91425 JEOL JWS-7515 WAFER INSPECTION 1 as is where is
91426 JEOL JWS-7515 WAFER INSPECTION 1 as is where is
91899 Jeol jSM 6330F FIELD EMISSION SEM 1 as is where is immediately
92068 JEOL JSM 6400F Scanning Electron Microscope 1 as is where is immediately
92220 JEOL JWS-7555 SEM - Defect Review (DR) 200mm 1 as is where is immediately
93311 JEOL JSM-6320 Field Emission SEM Laboratory 1 as is where is immediately
97999 JEOL JWS 7700 DR SEM 200 mm 01.06.1996 1 as is where is
98123 JEOL ARM200CF Super X PFA 01.06.2014 1 as is where is
100991 Jeol JWS7500E w/Noran EDX Wafer Inspection System (SEM) 200 mm 01.06.2000 1 as is where is immediately
101692 Jeol JSM-6060LV SEM 1 inquire immediately
102242 JEOL JEM-2500SE High Resolution TEM 300 mm 1 as is where is
102243 JEOL JEM-2500SE High Resolution TEM 300 mm 1 as is where is
102244 JEOL JEM3200FS High Resolution TEM 300 mm 01.06.2006 1 as is where is
102245 JEOL JWS-7515 SEM Wafer Inspection Tool 200 mm 01.06.1999 1 as is where is
102246 JEOL JWS-7555 SEM Wafer Inspection Tool 200 mm 01.06.2000 1 as is where is
102247 JEOL JWS-7555 SEM Wafer Inspection Tool 200 mm 01.06.2002 1 as is where is
102486 Jeol JSM-6600F SEM 01.06.2014 1 as is where is immediately
102651 Jeol JEM-2100 TEM 1 inquire 1 month
102652 Jeol JSM-7001 FLV SEM 1 inquire 1 month
102653 Jeol JEM-2500SE TEM 1 inquire 1 month
102705 JEOL JFS-9855S Focused Ion Beam System 200mm 01.06.2000 1 as is where is immediately
102968 JEOL JSM-7500F SEM Laboratory 01.06.2009 1 as is where is
103158 Jeol JSM-6400F SEM 01.06.2017 1 inquire
103460 Jeol JSM6400 Scanning Electron Microscope Laboratory 01.06.1992 1 as is where is immediately
91427 Jordan Valley JVX 6200 X-ray metrology (X-Ray Reflectivity) 300 mm 1 as is where is
95012 Jordan Valley JVX 5200T X-Ray Reflectometer 200 MM / 300 MM 01.06.2006 1 as is where is
98000 Jordan Valley VVX 5200T METROLOGY 300 mm 01.06.2006 1 as is where is
99830 JORDAN VALLEY JVX6200I X-ray Metrology System 300 mm 01.03.2011 1 as is where is immediately
100917 Jordan Valley JVX6200 X-Ray Inspection System 300 mm 01.06.2010 1 as is where is
102248 Jordan Valley BedeMetrix-F X-Ray reflectometer 200 mm 01.06.2006 1 as is where is
102249 Jordan Valley JVX5200T Layer thickness, density and roughness metrology 300 mm 01.06.2004 1 as is where is
102250 Jordan Valley JVX6200i Film Thickness Measurement 300 mm 01.06.2011 1 as is where is
102252 Jordan Valley JVX7300 Film Thickness Measurement 300 mm 01.06.2012 1 as is where is
102253 Jordan Valley JVX7300 Film Thickness Measurement 300 mm 1 as is where is
103093 Jordan Valley JVX 6200 X-ray Fluorescence Spectrometer 200mm 01.08.2008 1 as is where is
102256 Karl Suss MA200 COMPACT Mask Aligner 200 mm 01.06.2012 1 as is where is
91429 KEITHLEY KEITHLEY 236 SOURCE MEASURE UNIT 1 as is where is
91430 KEITHLEY KEITHLEY 236 SOURCE MEASURE UNIT 1 as is where is
92658 KLA 6220 Defect Inspection System 1
87630 KLA - Tencor Alphastep IQ Surface measurement 4 inch 1 as is where is immediately
95510 KLA - Tencor Spectra F5X Surface Characterization 01.07.2002 0 as is where is immediately
91992 KLA -TENCOR 8100 Critical Dimension Measurement CD-SEM (FOR SPARES USE) 200 mm 01.06.1999 2 as is where is immediately
103705 KLA -Tencor 2365 Brightfield Wafer Defect Inspection System 200 mm 01.09.2004 1 as is where is immediately
32230 KLA TENCOR SFS6400 MECHANICAL CALIBRATION Document Number 238 WAFERSURFACE ANALYSIS SYSTEM CUSTOMER MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
32231 KLA TENCOR Surfscan 64X0 Calibration Procedure Surfscan 64X0 Calibration Procedure MANUAL 1 as is where is immediately
32233 KLA TENCOR SFS6x00 MECHANICAL CALIBRATION Document number 200 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
60953 KLA Tencor 2135 brightfield wafer defect inspection 200 mm 01.06.1996 1 as is where is immediately
103161 KLA Tencor Surfscan 5500 Unpatterned Wafer Surface Inspection Tool 200 mm 1 inquire
99837 KLA- TENCOR P-22H Metrology Tool 200 mm 1 as is all rebuilt immediately
91991 KLA-TENCOR 8100 XP Critical Dimension Measurement CD-SEM 200 mm 01.06.2000 2 as is where is immediately
98061 KLA-TENCOR AIT 1 Dark field, particle inspection 150 mm / 200 mm 1 inquire immediately
102842 KLA-TENCOR UV1280SE Film Thickness Measurement System / Ellipsometer 200 mm 1 inquire immediately
96997 KLA-Tencor Surfscan AIT 8020 Particle Review 200 mm 01.06.1997 1 as is where is immediately
99845 KLA-Tencor 2351 Bright-Field Wafer Inspection System 200 mm 1 as is where is immediately
101359 KLA-Tencor Candela 8600 Film Thickness Measurement 200 mm 01.11.2011 1 as is where is immediately
1691 KLA-TENCOR 259 (spare parts) Reticle Inspection - SPARE PARTS up to 7 inch 01.12.1991 1 inquire immediately
52151 KLA-Tencor Hamamatsu R1924A Photomultiplier spares 01.04.2007 1 inquire immediately
53035 KLA-Tencor 2132 (8 inch Wafer Chuck Assembly) Ceramic Wafer chuck, 8" spares 1 as is where is immediately
53036 KLA-Tencor Compumotor M575L11 Stepping motor drive spares 1 as is where is immediately
70127 KLA-Tencor AIT UV PATTERNED WAFER INSPECTION 200 mm 01.08.2003 1 as is where is immediately
71632 KLA-TENCOR 2122 WAFER DEFECT INSPECTION 200 mm 1 as is where is immediately
74643 KLA-Tencor 710-013838-00 Rev 1 PCB Universal Video Mux spares 01.06.1993 1 as is where is
76676 KLA-TENCOR AIT XP FUSION Dark Field WAFER PARTICLE DETECTION 200 mm 01.10.2002 1 as is where is immediately
76677 KLA-TENCOR AIT FUSION Dark Field WAFER PARTICLE DETECTION 200 mm 01.06.2002 1 as is where is immediately
76681 KLA-TENCOR AIT UV Dark Field WAFER PARTICLE DETECTION 200 mm 01.01.2003 1 as is where is immediately
76684 KLA-TENCOR P20H PROFILOMETER 200 mm 01.04.1996 1 as is where is immediately
83702 KLA-Tencor AMRAY 4200 Review SEM 8" 01.03.1999 1 as is where is immediately
84299 KLA-Tencor SP2 XP Wafer surface particle detection 300 mm 01.02.2014 1 as is all rebuilt immediately
85954 KLA-Tencor AIT XP Parts/Options 200 mm 1 as is where is
86180 KLA-TENCOR AIT-UV WAFER PARTICLE INSPECTION 200 mm 01.06.2002 1 as is where is
86419 KLA-Tencor AIT 1 wafer particle detection 150 mm 1 as is where is
86424 KLA-Tencor 7700 Surfscan 125 mm 01.02.1996 1 as is where is
87421 KLA-Tencor Puma 9550 WAFER INSPECTION 300 mm 01.11.2011 1 as is where is
87790 KLA-Tencor FLX 2908 Thin Film Measurement System 200 mm 01.04.1996 1 as is where is immediately
88266 KLA-Tencor eS20XP E-beam Inspection 200mm 01.01.2001 1 as is where is
88365 Kla-Tencor 2135 XP Brightfield wafer defect inspection 150 mm or 200 mm 01.06.1997 1 inquire immediately
88366 Kla-Tencor 2139 Birghtfield wafer defect inspection 150 mm or 200 mm 01.06.2000 1 as is where is immediately
88368 Kla-Tencor P15 WAFER SURFACE PROFILOMETER 200 mm OR SMALLER 01.06.2007 1 inquire immediately
88369 KLA-Tencor 5200 Overlay measurement (For spares use) 200 mm 01.06.1997 1 inquire immediately
88370 Kla-Tencor FLX 2908 Wafer Stress Measurement 1 inquire
88378 Kla-Tencor Alpha Step IQ Profileometer Manual 1 inquire immediately
88379 Kla-Tencor AIT 2 Surfscan wafer particle detection system 200 mm 01.06.1998 1 inquire
88605 KLA-Tencor EDR5210 Defect Review SEM 300 MM 01.06.2010 1 as is where is
88607 KLA-Tencor INM100+INS10 Metrology 150 MM 1 as is where is
89977 KLA-Tencor Surfscan 4000 Wafer surface particle inspection 150mm 1 as is where is immediately
90957 KLA-Tencor EDR5210 DR SEM 300 mm 1 as is where is
90960 KLA-Tencor NANOMAPPER Nanotopography 300 mm 01.06.2006 1 as is where is
90961 KLA-Tencor Puma 9000 Dark field defect Inspection 300 mm 01.06.2005 1 as is where is
91007 KLA-Tencor Aset F5x Thin Film measurement 300 MM 01.11.2003 1 as is where is immediately
91106 KLA-Tencor ARCHER 100AIM Overlay Measurement 300 mm 1 as is where is
91107 KLA-Tencor ARCHER 100AIM Overlay Measurement 300 mm 01.06.2007 1 as is where is immediately
91110 KLA-Tencor PUMA 9000D Wafer Inspection System 200 mm 1 as is where is
91111 KLA-Tencor PUMA 9000D Wafer Inspection System 300 mm 01.06.2006 1 as is where is
91112 KLA-Tencor PUMA 9000D Wafer Inspection System 300 mm 01.06.2005 1 as is where is
91431 KLA-Tencor 2350 Brightfield Wafer Defect Inspection 200 mm 01.06.2001 1 as is where is
91432 KLA-Tencor 2350 Brightfield Wafer Defect Inspection 200 mm 01.06.2001 1 as is where is
91433 KLA-Tencor 2350 Brightfield Wafer Defect Inspection 300 mm 1 as is where is
91435 KLA-Tencor AIT Particle Review 200 mm 01.06.1997 1 as is where is
91436 KLA-Tencor AIT I Patterned Wafer Inspection 150 mm,200 mm 01.06.1997 1 as is where is
91441 KLA-Tencor ARCHER AIM Overlay measurement system 300 mm 1 as is where is
91442 KLA-Tencor ARCHER XT+ Overlay measurement system 300 mm 01.06.2007 1 as is where is immediately
91443 KLA-Tencor ARCHER XT+ Overlay measurement system 300 mm 01.06.2003 1 as is where is
91444 KLA-Tencor ARCHER XT+ Overlay measurement system 300 mm 1 as is where is
91445 KLA-Tencor ARCHERXT+ Overlay measurement system 300 mm 01.06.2006 1 as is where is
91446 KLA-Tencor ARCHERXT+ Overlay measurement system 300 mm 01.06.2007 1 as is where is
91447 KLA-Tencor ARCHERXT+ Overlay measurement system 300 mm 01.06.2007 1 as is where is
91452 KLA-Tencor HRP340 Surface Profilometer 300 mm 01.06.2007 1 as is where is immediately
91453 KLA-Tencor KLA 5100XP OVERLAY REGISTRATION 150 mm,200 mm 1 as is where is
91457 KLA-Tencor M-GAUGE 200 Thickness measurement 4", 150 mm 1 as is where is
91464 KLA-Tencor PROMETRIX FT750 Film Thickness Measurement 1 as is where is
91466 KLA-Tencor PROMETRIX FT750 Film Thickness Measurement 1 as is where is
91469 KLA-Tencor PROMETRIX RS55 Manual Type Resistivity 200 mm 1 as is where is
91474 KLA-Tencor THERMA-WAVE OP 2600 OPTI-PROBE 200 mm 1 as is where is
91475 KLA-Tencor THERMA-WAVE OP 2600 OPTI-PROBE 200 mm 1 as is where is immediately
91476 KLA-Tencor THERMA-WAVE OP 2600 OPTI-PROBE 200 mm 01.06.1995 1 as is where is immediately
91477 KLA-Tencor THERMA-WAVE OP 2600 OPTI-PROBE 200 mm 1 as is where is immediately
91478 KLA-Tencor THERMA-WAVE OP 2600 DUV OPTI-PROBE 200 mm 01.08.1997 1 as is where is immediately
91479 KLA-Tencor THERMA-WAVE OP 2600B OPTI-PROBE 200 mm 01.06.1997 1 as is where is immediately
91480 KLA-Tencor THERMA-WAVE OP 2600B OPTI-PROBE 200 mm 1 as is where is immediately
91481 KLA-Tencor THERMA-WAVE OP 2600B OPTI-PROBE 200 mm 01.06.1997 1 as is where is immediately
91482 KLA-Tencor THERMA-WAVE OP 2600B OPTI-PROBE 200 mm 01.06.1997 1 as is where is immediately
91483 KLA-Tencor THERMA-WAVE OP 2600B OPTI-PROBE 200 mm 01.06.1999 1 as is where is immediately
91484 KLA-Tencor THERMA-WAVE OP 2600B OPTI-PROBE 200 mm 01.06.1997 1 as is where is immediately
91990 KLA-TENCOR AIT I Surfscan wafer particle detection system 200 mm 01.06.1998 2 as is where is immediately
92705 KLA-Tencor ES35D E-BEAM INSPECTION 300 MM 01.06.2006 1 as is where is
92813 KLA-Tencor MPV CD2 AMC Optical Wafer Metrology 125 mm 1 as is where is
92814 KLA-Tencor MPV CD2 AMC Optical Wafer Metrology 125 mm 1 as is where is
92815 KLA-Tencor MPV-CD Optical Wafer Metrology 125 mm 1 as is where is
92817 KLA-Tencor Surfscan 7700 Particle Counter (Metrology) 125 mm 1 as is where is
93090 KLA-Tencor ARCHER 100AIM Overlay 300 mm 1 as is where is
93091 KLA-Tencor ARCHER 300 PLUS Overlay 300 mm 01.11.2011 1 as is where is immediately
93092 KLA-Tencor ARCHER 300LCM Overlay 300 mm 01.07.2010 1 as is where is
93094 KLA-Tencor AIT UV DARKFIELD DEFECT INSPECTION 200 mm 1 as is where is
93096 KLA-Tencor ARCHER AIM Overlay 300 MM 01.06.2003 1 as is where is
93097 KLA-Tencor P-10 DISK PROFILER 150 mm,200 mm 1 as is where is
93098 KLA-Tencor P-12 DISK PROFILER 150 mm/200 mm 1 as is where is immediately
93099 KLA-Tencor P-2 DISK PROFILER 150 mm,200 mm 1 as is where is
93100 KLA-Tencor P-2 DISK PROFILER 150 mm,200 mm 01.06.1996 1 as is where is
93101 KLA-Tencor P-20H DISK PROFILER 150 mm,200 mm 1 as is where is
93102 KLA-Tencor P-2H DISK PROFILER 150 mm,200 mm 01.06.1996 1 as is where is
93910 KLA-Tencor SP3 DARKFIELD WAFER INSPECTION SYSTEM 300 mm 01.06.2011 1 as is where is immediately
93911 KLA-Tencor UV1080 THIN FILM MEASUREMENT 200 mm 01.06.1999 1 as is where is
94461 KLA-Tencor 2132 (mainbody only) INSPECTION UNIT 150 mm,200 mm 01.06.1995 1 as is where is
94462 KLA-Tencor AIT Particle Review 200 mm 01.06.1997 1 as is where is
94464 KLA-Tencor Archer AIM Overlay 200 mm 01.10.2004 1 as is where is immediately
94465 KLA-Tencor ARCHER XT+ Overlay 300 mm 01.06.2007 1 as is where is
94466 KLA-Tencor ARCHER XT+ Overlay 300 mm 01.06.2007 1 as is where is
94469 KLA-Tencor KLA 5100 OVERLAY REGISTRATION 150 mm,200 mm 1 as is where is
94470 KLA-Tencor KLA- Aleris CX FilmThickness Mesuarement 300 mm 01.06.2007 1 as is where is
94471 KLA-Tencor KLA- Aleris HT FilmThickness Mesuarement 300 mm 01.06.2005 1 as is where is
94472 KLA-Tencor PUMA 9130 Darkfield Wafer inspection system 300 mm 01.06.2006 1 as is where is immediately
94473 KLA-Tencor SP1 Tbi Unpatterned wafer inspection System 200 mm 01.02.2007 1 as is where is immediately
96052 KLA-Tencor ASET F5 Film Thickness Measurement System 200 mm 1 inquire
96053 KLA-Tencor Spectra CD F5X w/CD Surface Characterization 200 mm 01.06.2002 1 inquire
96998 KLA-Tencor Surfscan AIT 8010 Patterned Wafer Inspection 200 mm 01.06.1997 1 as is where is immediately
97020 KLA-Tencor VISEDGE_CV300 Etch Inspection 300 mm 01.06.2007 1 as is where is
97450 KLA-Tencor SP1-TBI Wafer Particle Inspection System 300 mm 01.09.2004 1 as is where is immediately
97453 KLA-Tencor Archer 200 AIM Overlay Measurement System 300 mm 01.05.2010 1 as is where is immediately
98002 KLA-Tencor ES31 ebeam inspection 300 mm 01.06.2011 1 as is where is
98003 KLA-Tencor ES32 ebeam inspection 300 mm 01.06.2005 1 as is where is
98032 KLA-Tencor SFX100 Thickness Measurement System 300 mm 01.06.2004 1 as is where is
98033 KLA-Tencor SP1 TBI Unpatterned wafer inspection System 200 mm 01.06.2000 1 as is where is immediately
98034 KLA-Tencor SP2 (Parts Missing) Darkfield Wafer Particle Detection System 300 mm 01.06.2005 1 as is where is
98126 KLA-Tencor 3905 Broadband Plasma Patterned Wafer Inspection 300 mm 01.06.2017 1 as is where is
98127 KLA-Tencor Aleris CX Film thickness measurements 300 mm 01.06.2007 1 as is where is
98128 KLA-Tencor Archer 300 AIM Overlay 300 mm 01.06.2012 1 as is where is
98131 KLA-Tencor 5100 Overlay Measurement 200 mm 01.06.1995 1 as is where is
98132 KLA-Tencor Puma 9100 Dark Field Inspection 300 mm 01.06.2007 1 as is where is
98134 KLA-Tencor Viper Macro Defect Detection System 300 mm 01.06.2010 1 as is where is
98399 KLA-Tencor 2132 Brightfield Wafer Defect Inspection System 200 mm 01.08.1997 1 as is where is immediately
98400 KLA-Tencor AIT I Surfscan Patterned Wafer Surface Inspection 200 mm 1 as is where is immediately
98403 KLA-Tencor SFS-7600 Patterned Wafer Surface Inspection 150 mm 1 as is where is
98404 KLA-Tencor UV-1050 Thin Film Measurement System 150 mm 1 as is where is
98548 KLA-Tencor AIT XP Fusion Darkfield Pattern Inspection 200 mm 3 inquire
98549 KLA-Tencor AIT XP Darkfield Pattern Inspection 200 mm 1 inquire immediately
98550 KLA-Tencor SP1-DLS Darkfield Non-Patterned Wafer Inspection 300 mm 1 inquire 3 months
98551 KLA-Tencor ES31 SEM Defect Inspection 200 mm 1 as is where is immediately
98552 KLA-Tencor UV1050 Film Thickness Measurement 150 mm-200 mm 1 inquire
98553 KLA-Tencor UV1080 Film Thickness Measurement 150 mm-200 mm 1 inquire
98818 KLA-Tencor F5X Film Thickness Measurement System 300 mm 01.09.2001 1 as is where is immediately
98858 KLA-Tencor Surfscan 4500 Unpatterned Wafer Surface Inspection 2 inch to 6 inch 01.12.1989 1 as is where is immediately
98912 KLA-Tencor AIT XP Defect Inspection 1 as is where is
98914 KLA-Tencor Spectra FX-1000 HT Thin film measurement system 1 as is where is
98915 KLA-Tencor Puma 9550i Wafer Inspection 1 as is where is
98916 KLA-Tencor Stealth 2350 Defect Inspection 1 as is where is
98917 KLA-Tencor TP 420XP Post Implant measurement 1 as is where is
98918 KLA-Tencor Viper 2401 After Develop Inspection Tool 1 as is where is
98969 KLA-Tencor 8100XP CD SEM 01.06.1998 1 as is where is immediately
99055 KLA-Tencor Candela CS20R Optical Surface Analyzer 01.04.2012 1 as is where is immediately
99441 KLA-Tencor 5200 Overlay Measurement System 200 mm 2 inquire immediately
99859 KLA-Tencor 5011 Overlay precision measurement system 1 inquire
99860 KLA-Tencor P10 Surface Profiler 150/200 mm 01.01.2000 1 inquire
99861 KLA-Tencor SFS-7600 Surfscan Patterned Wafer Inspection System 150/200 mm 01.01.1994 2 inquire
99912 KLA-Tencor KLA2131 Inspection System 200 mm 01.06.1995 1 as is where is
100186 KLA-Tencor eS32 E-beam Inspection 300mm 01.06.2007 1 as is where is
100187 KLA-Tencor eS37 E-beam Inspection 300mm 01.06.2009 1 as is where is
100730 KLA-Tencor Alpha Step IQ Surface Profiler 01.06.2010 1 as is where is
100731 KLA-Tencor Candela CS20V Wafer Inspection 1 as is where is
100907 KLA-Tencor SFX100 Thickness Measurement System 300 mm 01.06.2004 1
100918 KLA-Tencor PUMA 9000 Defect Inspection 300 mm 01.06.2008 1 as is where is
101342 KLA-Tencor AIT I Patterned Surface Defect Inspection System 200 mm 01.02.1998 1 as is where is immediately
101452 KLA-Tencor WaferSight Wafer Characterization 300 mm 01.11.2005 1 as is where is immediately
101614 KLA-Tencor SFX200 Thickness Measurement System 200 - 300 mm 01.11.2005 1 inquire immediately
101625 KLA-Tencor CI-T130 INSPECTION W/RB PYRAMID & MVS7 (GEN 2) Assembly 1 as is where is
101626 KLA-Tencor CI-T130 INSPECTION W/RBP, 70X70, MVS7K (GEN 2) Assembly 1 as is where is
101627 KLA-Tencor AIM+ OVERLAY REGISTRATION TOOL, Copper Tool 300 mm 1 as is where is
101801 KLA-Tencor M-gage300 Al Thickness measurement 200 mm 01.06.2001 1 inquire
102258 KLA-Tencor AIT Fusion Dark Field inspection 200 mm 01.06.2003 1 as is where is
102259 KLA-Tencor Archer AIM+ Overlay measurement 300 mm 01.06.2008 1 as is where is
102260 KLA-Tencor ASET-F5x Thickness measurement 200 mm, 300 mm 01.06.2001 1 as is where is
102261 KLA-Tencor CRS1010 Review Station 200 mm 01.06.1998 1 as is where is
102262 KLA-Tencor DP2 Data Prep Station 01.06.2012 1 as is where is
102263 KLA-Tencor eS31 E-beam Inspection 300 mm 01.06.2004 1 as is where is
102264 KLA-Tencor eS32 Electron-Beam Inspection 300 mm 01.06.2007 1 as is where is
102265 KLA-Tencor eS32 Electron-Beam Inspection 300 mm 01.06.2007 1 as is where is
102266 KLA-Tencor eS32 E-beam Inspection 300 mm 01.06.2007 1 as is where is
102267 KLA-Tencor FX200 Thickness measurement 300 mm 01.06.2006 1 as is where is
102268 KLA-Tencor 2371 Bright Defect inspection 200 mm 01.06.2006 1 as is where is
102270 KLA-Tencor Puma 9000 Dark Field Inspection 300 mm 01.06.2005 1 as is where is
102272 KLA-Tencor SLF576 Reticle inspection system 01.06.2003 1 as is where is
102273 KLA-Tencor Surfscan 2.1 Particle Counter 125 mm 1 as is where is
102274 KLA-Tencor Viper 2435 MACRO INSPECTION 300 mm 1 as is where is
102472 KLA-Tencor 6220 Bare Wafer Particle Detection System 150 mm / 200 mm 1 inquire immediately
102477 KLA-Tencor P-10 Manual Wafer Load Disk Profilometer 200 mm 1
102634 KLA-Tencor 6400 Patterned Wafer Particle Inspection System 150 mm / 200 mm 1 inquire 1 month
102709 KLA-Tencor eS32 E-beam Inspection 300 mm 1 as is where is
102710 KLA-Tencor eS32 E-beam Inspection 300 mm 1 as is where is
102711 KLA-Tencor Surfscan SP2 Wafer Particle Measurement System 300 mm 1 as is where is
102712 KLA-Tencor Surfscan SP2 Wafer Particle Measurement System 300 mm 1 as is where is
102714 KLA-Tencor Surfscan SP2 Wafer Particle Measurement System 300 mm 1 as is where is
102715 KLA-Tencor Surfscan SP2 Wafer Particle Measurement System 300 mm 1 as is where is
102716 KLA-Tencor Surfscan SP2 Wafer Particle Measurement System 300 mm 01.06.2007 1 as is where is
102969 KLA-Tencor FIT3120 PARTICLE COUNTER 300 mm 01.06.2005 1 as is where is
102987 KLA-Tencor SP3 Wafer Surface Inspection System 300 mm 01.06.2011 1 as is where is
102988 KLA-Tencor UV1080 Thin Film Measurement System 200 mm 01.06.1999 1 as is where is
103095 KLA-Tencor 2800 Brightfield Inspection 300mm 01.06.2006 1 as is where is
103096 KLA-Tencor AIT UV Darkfield Inspection 300mm 01.06.2004 1 as is where is
103099 KLA-Tencor Surfscan SP3 Particle Measurement 300mm 01.06.2014 1 as is where is
103141 KLA-Tencor FX-200 (Initialized) Thin Film Measurement 300 mm 1 as is where is
103162 KLA-Tencor P-15 Profiler 200 mm 1 inquire
103163 KLA-Tencor P-11 Profiler 1 inquire
103164 KLA-Tencor Surfscan 4000 Unpatterned Wafer Surface Inspection Tool 150 mm 01.06.1986 1 inquire
103165 KLA-Tencor Surfscan 4500 Unpatterned Wafer Surface Inspection Tool 150 mm 1 inquire
103166 KLA-Tencor Surfscan 5000 Unpatterned Wafer Surface Inspection Tool 200 mm 01.06.1988 1 inquire
103228 KLA-Tencor CANDELA CS20 Metrology 150 mm 01.06.2010 1 as is where is immediately
103268 KLA-Tencor SP1-DLS Darkfield Non-Patterned Wafer Inspection 300 mm 01.03.2005 1 as is all rebuilt 3 months
103452 KLA-Tencor Visedge CV300 Wafer-Edge Inspection 300 mm 01.06.2007 1 as is where is
103529 KLA-Tencor ALERIS HT FilmThickness Mesuarement 300 mm 01.06.2003 1 as is where is
103530 KLA-Tencor ARCHER 10 AIM Overlay 300 mm 01.06.2005 1 as is where is
103531 KLA-Tencor ES35 E BEAM INSPECTING 300 mm 01.06.2009 1 as is where is
103532 KLA-Tencor SP3 Unpatterned Wafer Inspection 300 mm 01.06.2011 1 as is where is
103533 KLA-Tencor SPECTRACD-XT Scatterometry 300 mm 01.06.2005 1 as is where is
103729 KLA-Tencor Candela CS 920 Defect Inspection for SIC and standard wafers 6 and 8 inch 01.06.2015 1 as is where is immediately
103732 KLA-Tencor P11 Long Scan Stylus Surface Profiler 200 MM 01.06.1995 1 as is where is immediately
103733 KLA-Tencor Surfscan 4500 Wafer Particle Inspection System 2 to 6 inch 01.06.1986 1 as is where is immediately
103734 KLA-Tencor Teron 610 Reticle Inspection System Reticle 01.01.2012 1 as is where is immediately
102284 Kokusai VR-120SD Resistivity Measurement 300 mm 1 as is where is
97865 KRUSS KRUSSDSA100 CONTECT ANGLE MEASUREMENT 1 as is where is
94475 LASERTEC BGM300 Wafer Surface Analyzing and VIsualization System 200 mm 01.06.2008 1 as is where is
88268 Leica INM20 Microscope 200mm 1 as is where is immediately
88269 Leica INS10 Microscope 200mm 1 as is where is
91492 LEICA Leica INM100 Operation Manual Optical Microscope 1 as is where is
91493 LEICA Leica INM100 Operation Manual Optical Microscope 1 as is where is
91494 LEICA Leica INM100 Operation Manual Optical Microscope 1 as is where is
97106 Leica MZ 12.5 Stereomicroscope 1 as is where is
98920 Leica INM 300 Microscope 1 as is where is
103110 Leica LDS3300C Macro-Defect 300mm 1 as is where is
86193 LEITZ MPV-SP Wafer Inspection Microscope 200 mm 1 as is where is
86420 Leitz MPV CD2 AMC Wafer inspection microscope 125 mm 1 as is where is
86421 Leitz MPV CD2 AMC Wafer inspection microscope 125 mm 1 as is where is
86423 Leitz MPV-CD Wafer inspection microscope 125 mm 1 as is where is
86426 Leitz INM100+INS10 Wafer inspection microscope 150 mm 1 as is where is
102168 Leo 1530 FE-SEM up to 8 inch 01.06.2002 1 as is where is
99419 MDC CSM Automatic CV Plotter with RM-1600 Computer 1 as is where is immediately
99420 MDC CSM/16 Automatic CV Plotter with RM-1600 Computer 125 MM 1 as is where is immediately
98005 MicoMetrics Precis Overlay measurement system 200 mm 01.06.2010 1 as is where is
99422 Minato MM-6600 Wafer Mobility Tester 2 as is where is
91113 MITUTOYO MP2000 METRO 200 mm 1 as is where is
100734 Mitutoyo SJ-401 Surface Roughness Tester 1 as is where is
100735 Mitutoyo SJ-411 Surface Roughness Tester 1 as is where is
100736 Mitutoyo YC-H250 Measurement Machine 01.06.2011 1 as is where is
100737 Mitutoyo YC-H260 Measurement Machine 1 as is where is
101628 N&K GEMINI SCATTEROMETER/REFLECTANCE-TRANSMISSION 300 mm 1 as is where is
71741 Nanofab Nano150 Ion Beam Lithography / Implanter System 150 mm 1 inquire immediately
84832 NANOMETRICS NanoSpec 9000 Metrology Equipment, Wafer Inspection Equipment 200mm 1 as is where is immediately
86425 Nanometrics Nanospec AFT 210 surface inspection 125 mm 1 as is where is
91526 NANOMETRICS Caliper Mosaic Overlay 300 mm 01.06.2003 1 as is where is immediately
91527 NANOMETRICS Caliper Mosaic Overlay 300 mm 01.06.2010 1 as is where is immediately
91528 NANOMETRICS Caliper Mosaic Overlay 300 mm 01.09.2009 1 as is where is immediately
91529 NANOMETRICS Caliper Mosaic Overlay 300 mm 01.03.2010 1 as is where is immediately
91530 NANOMETRICS NANOMETRICS 9-7200-0195E Mask & Wafer Inspection 200 mm 1 as is where is
91531 NANOMETRICS NANOSPEC ATF210 Film Thickness Measurement 1 as is where is
91532 Nanometrics Q230 OVERLAY MEASUREMENT 200 mm 1 as is where is immediately
92041 Nanometrics 9010B Metrology 1 as is where is immediately
92818 Nanometrics NanoSpec 210 Metrology (Metrology) 125 mm 1 as is where is
98153 Nanometrics Caliper Mosaic Overlay Measurement 300 mm 01.06.2011 1 as is where is
98154 Nanometrics Caliper Mosaic Overlay Measurement 300 mm 01.06.2009 1 as is where is
98155 Nanometrics Caliper Mosaic Overlay Measurement 300 mm 01.06.2009 1 as is where is
98289 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 01.06.2005 1 as is where is
98290 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 01.06.2005 1 as is where is
98291 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 01.07.2006 1 as is where is immediately
98480 Nanometrics 8000X film thickness measurement 150mm 2 as is where is immediately
98481 Nanometrics 8000Xse film thickness measurement 200mm 2 as is where is
98508 Nanometrics M6100 Film Thickness Measurement 200 mm 1 as is where is
100923 NANOMETRICS ATLAS Critical Dimension (CD) Measurement 300 mm 01.06.2006 1 as is where is
101585 NANOMETRICS CALIPER-ULTRA Overlay Measurement 300 mm 01.07.2006 1 as is where is
102302 Nanometrics Atlas Film Thickness measurement 200 mm 01.06.2007 1 as is where is
102303 Nanometrics Caliper Elan Overlay Measurement System 300 mm 1 as is where is
102304 Nanometrics Caliper Elan Overlay Measurement 300 mm 01.06.2004 1 as is where is
102305 Nanometrics Caliper Elan Overlay Measurement 300 mm 01.06.2006 1 as is where is
102306 Nanometrics Caliper Elan Overlay Measurement 300 mm 01.06.2006 1 as is where is
102307 Nanometrics Caliper Elan Overlay Measurement 300 mm 01.06.2006 1 as is where is
102308 Nanometrics Caliper Elan Overlay Measurement 300 mm 01.06.2006 1 as is where is
102309 Nanometrics Caliper Q300 Overlay Measurement System 300 mm 01.06.2003 1 as is where is
102310 Nanometrics Caliper Q300 Overlay Measurement 300 mm 01.06.2003 1 as is where is
102311 Nanometrics Caliper Q300 Overlay Inspection 300 mm 01.06.2002 1 as is where is
102312 Nanometrics Caliper Q300 Overlay Measurement 300 mm 01.06.2002 1 as is where is
102313 Nanometrics Caliper Q300 Overlay Measurement 300 mm 1 as is where is
102314 Nanometrics Q200I Overlay Measurement System 200 mm 01.06.2000 1 as is where is
102315 Nanometrics Q200I Overlay Measurement 200 mm 01.06.2002 1 as is where is
102840 NANOMETRICS 9010 Integrated Metrology System 01.01.2008 5 as is where is immediately
103544 NANOMETRICS CALIPER ELAN Overlay 300 mm 01.06.2004 1 as is where is
97868 Newport 1830-C Optical Power Meter 1 as is where is
93103 NGR NGR2150 E-beam wafer inspection 300 MM 1 as is where is
91534 NICOLET Magna 410 ft-ir Spectrometer 01.06.1996 1 as is where is
91535 NICOLET Magna 560 ft-ir Spectrometer 01.06.1998 1 as is where is
98922 Nicolet ECO 3000 FTIR 1 as is where is
102316 Nicolet ECO1000 Film Thickness Gauge 200 mm 1 as is where is
102888 Nicolet ECO-1000S FT-IR 200 mm 01.06.1996 1 as is where is
91536 Nidec im15 Wafer inspection 1 as is where is
82904 Nikcon AMI-2000 Surface Analyzer 01.06.2003 1 as is where is immediately
33708 NIKON Optiphot 88 Wafer Inspection Microscope 200 mm 1 as is where is immediately
64341 Nikon VMR 3020 Video Measuring System 01.01.2001 1 as is where is immediately
76705 Nikon Opiphot Inspection Microscope with autoloader 200 mm 01.04.1992 1 as is where is immediately
88273 Nikon OPTIPHOT 200 Microscope 200mm 1 as is where is
91863 NIKON Optiphot 150 Wafer Inspection Microscope, 10X, 20X, 50X & 150X Objs., 150mm XY Stage 150 mm 1 as is all rebuilt immediately
91864 NIKON Optiphot 200 (For spares use) Wafer Inspection Microscope (Parts Tool Only) 200 mm 1 as is where is immediately
92616 Nikon OPTISTATION V Optical Review System 200mm 1 as is where is
92617 Nikon OPTISTATION V Optical Review System 200mm 1 as is where is
92707 NIKON VMR-C4540 FOUP INSPECTION 300 MM 01.06.2001 1 as is where is
92825 Nikon OPTIPHOT 66 Microscope (Metrology) 150 mm 1 as is where is
96395 Nikon Lasermark Overlap Inspection System Inspection System 200 - 300 mm 01.06.2013 1 as is where is immediately
97712 Nikon OPTISTATION 3100 Microscope inspection station 300 mm 1 as is where is
97713 Nikon OPTISTATION 3100 Microscope inspection station 300 mm 1 as is where is
98923 Nikon Optiphot 200 Inspection Microscope 1 as is where is
99396 Nikon EpiPhot 200 Inspection Microscope 200 mm 1 as is where is immediately
99424 Nikon Optiphot 150 Wafer Inspection Microscope 150 mm 1 as is where is immediately
99425 Nikon Optistation 3 Microscope Wafer Inspection Satation with cassette to cassette handling 150 mm 1 as is where is immediately
99426 Nikon Optistation 3 Microscope Wafer Inspection Station with cassette to cassette handling 150 mm 1 as is where is immediately
99427 Nikon Optistation 3 Wafer Inspection System 150 mm 01.06.1994 1 as is where is immediately
99428 Nikon Optistation 3A Automatic Wafer Inspection Station 200 mm 01.06.1997 1 as is where is immediately
100223 Nikon AMI-3300 Macro-Defect 300mm 1 as is where is
100224 Nikon AMI-3300 Macro-Defect 300mm 1 as is where is
100226 Nikon AMI-3500 Macro-Defect 300mm 1 as is where is
102323 Nikon Optistation 3000 Microscope inspection station 01.06.2011 1 as is where is
103038 Nikon Optiphot Inspection Microscope w/ Nomarski Optics 1 as is where is
103039 Nikon Optiphot 88 200mm Inspection Microscope w/ Nomarski Optics 200 mm 1 as is where is
103213 Nikon Optiphot-88-AC IN Inspection Microscope 200 mm 1 as is where is
103214 Nikon Optiphot 300 Inspection Microscope 150 mm 1 as is where is
103215 Nikon Optiphot 300 Inspection Microscope 300 mm 1 as is where is
103216 Nikon Optiphot 200 Inspection Microscope 200 mm 1 as is where is
103458 Nikon Optiphot 150 Wafer Inspection Microscope 150 mm 1 as is where is immediately
103698 Nikon L200 Wafer Inspection Microscope 200 mm 01.06.2016 1 as is where is
53146 NOVA 210 CMP ENDPOINT MEASUREMENT SYSTEMS 200 mm 5 as is where is immediately
69809 Olympus MX-50 Microscopes 3
86194 Olympus AL-2000 Wafer Inspection Microscope 200 mm 1 as is where is immediately
87492 OLYMPUS BH-BHM Wafer Inspection Microscope 150 mm 1 as is where is immediately
91538 OLYMPUS BH3-MJLA4-383D HIGH POWER SCOPE N/a 01.06.1995 1 as is where is
91539 OLYMPUS MX80 AF-F Microscope inspection station 150 / 200 mm 1 as is where is immediately
91540 Olympus Olympus AL3120F MICROSCOPE (ASYST300FL - 2L/P) 300 mm 1 as is where is
91541 Olympus Olympus AL3120F MICROSCOPE (TAS300(E3)- 2L/P) 300 mm 1 as is where is
91542 Olympus Olympus AL3120F MICROSCOPE (TAS300(E3)- 2L/P) 300 mm 01.06.2003 1 as is where is
91543 Olympus Olympus AL3120F MICROSCOPE (TAS300(E3) - 3L/P) 300 mm 01.06.2004 1 as is where is
91544 Olympus Olympus AL3120F-DUV MICROSCOPE (TAS300 - 2L/P) 300 mm 01.06.2003 1 as is where is
91545 Olympus Olympus AL3120F-DUV-EL MICROSCOPE (ASYST300FL - 2L/P) 300 mm 01.06.2002 1 as is where is
91546 Olympus Olympus AL3130F MICROSCOPE (KWF12 - 3L/P) 300 mm 01.06.2005 1 as is where is
91547 Olympus Olympus AL3130F MICROSCOPE (KWF12 - 3L/P) 300 mm 01.06.2005 1 as is where is
91548 Olympus Olympus AL3130F MICROSCOPE (KWF12 - 3L/P) 300 mm 01.06.2005 1 as is where is
91549 Olympus Olympus AL3130F MICROSCOPE (KWF12 - 3L/P) 300 mm 01.06.2006 1 as is where is
91550 Olympus Olympus AL3130F MICROSCOPE (TAS300(E4) - 3L/P) 300 mm 01.06.2007 1 as is where is
91551 Olympus Olympus AL3130F MICROSCOPE (TAS300(E4) - 3L/P) 300 mm 01.06.2007 1 as is where is
92820 Olympus BHMJL Microscope (Metrology) 150 mm 1 as is where is
92821 Olympus BHMJL Microscope (Metrology) 150 mm 1 as is where is
95118 OLYMPUS MX-610 Microscope 200mm - 300mm 1 3 months
96371 Olympus MX61L Wafer Inspection Microscope 300 mm 01.01.2013 1 as is where is immediately
96372 Olympus MX51 Wafer Inspection Microscope 150 mm 1 as is where is immediately
98970 Olympus Olympus AL3120F-DUV MICROSCOPE (TAS300 - 2L/P) 300 mm 01.06.2003 1 as is where is
101975 Olympus AL3100 Microscope Inspection Station 300mm 1 as is where is
102839 Olympus MX61-L Inspection Microscope 300 mm 1 as is where is immediately
103229 Olympus BX50 Olympus BX51RF Microscope 150 mm 1 as is where is immediately
76711 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76712 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76713 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76714 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
103547 ONTO WV320 MACRO INSPECTING 300 mm 01.06.2004 1 as is where is
100233 Oxford X-Strata980 X-ray Fluorescence Spectrometer 01.06.2010 1 as is where is
83940 Philips CM30 Scanning Transmission Electron Microscope (TEM) Laboratory 01.06.1992 1 as is where is immediately
97003 Philips PHI 680 Auger Nanoprobe Laboratory 01.06.1998 1 as is where is immediately
103115 Philips PW2830 X-ray Fluorescence Spectrometer 300mm 01.06.2004 1 as is where is
103116 Philips PW2830 X-ray Fluorescence Spectrometer 300mm 01.06.2003 1 as is where is
95011 PHILLIPS IMPULSE 300B Thin-film measurement 200 MM / 300 MM 01.06.2004 1 as is where is
98929 Phillips TreX 610 X-ray Fluorescence Spectrometer 1 as is where is
91869 PLASMOS SD2000 Automatic Ellipsometer 200 mm 1 inquire immediately
99429 Plasmos SD 2004 Multi-Wavelength Ellipsometer 200 mm 1 as is where is immediately
78159 Plasmos / Yvon Jobin /Philips Analytical SD2000 Laser Ellipsometer 200 mm 01.08.2000 1 as is where is immediately
31246 PMS Liquitrack 776200 Non volatile residual Monitor facilities 01.11.1999 1 as is where is immediately
98424 Quantronix DRS 820 Inspection System 150 mm 3 as is where is
87792 QVI 600XP Process Control & Measurement 1 as is where is
91552 RAYTEX RXW-800 EDGE SCAN 200 mm 01.06.2008 1 as is where is
98489 Raytex RXW-0826SFIX-SMIF edge scanner 200mm 1 as is where is
79216 ReVera VeraFlex X-Ray Photoelectron Spectroscopy 300 mm 01.06.2008 1 as is where is immediately
97733 ReVera RVX1000 Film Thickness Measurement System 300 mm 1 as is where is
97734 ReVera RVX1000 Film Thickness Measurement System 300 mm 1 as is where is
102378 Revera RVX5000 X-Ray Photo-electron Spectroscopy (XPS) 300 mm 01.06.2006 1 as is where is
34320 Rigaku 3640 X-Ray Wafer Analyzer 200mm 1 as is where is immediately
35595 RIGAKU 3630 (For spares use) Xray Fluorescence Wafer/Disk Analyzer, Missing Xray Tube 01.06.1997 1 as is where is immediately
71780 Rigaku TXRF 300S X-Ray Diffractometer 150mm to 300 mm 01.01.2001 1 as is where is immediately
79217 Rigaku MFM65 XRR/XRF 300 mm 01.06.2009 1 inquire
82910 RIGAKU 3630 Wafer Inspection Equipment 200 01.06.1996 1 as is where is immediately
83519 Rigaku 3640 X-ray fluoresence wafer / disk analyzer 200 mm 01.06.2000 1 as is all rebuilt immediately
87823 Rigaku MFM65 X-ray inspection (For Cu and Au quantification) 300 MM / 200 mm 01.10.2007 1 as is where is immediately
91554 RIGAKU XRF3630 Wafer/ Disk Analyzer 1 as is where is
91555 RIGAKU XRF3630 Wafer/ Disk Analyzer 1 as is where is
91556 RIGAKU XRF3630 Wafer/ Disk Analyzer 1 as is where is
91557 RIGAKU XRF3640 (Handle include) Wafer/ Disk Analyzer 200 mm 01.06.1995 1 as is where is
91558 RIGAKU XRF3640 (Handle not include) Wafer / Disk Analyzer / XRF 200 mm 01.06.1998 1 as is where is immediately
92691 Rigaku MFM65 In-Line Energy Dispersive X-Ray Fluoresence Wafer Inspection System 300 mm 01.06.2008 1 as is where is immediately
93104 RIGAKU 3640 X-Ray fluorescence wafer / Disk analyzer (AL,Fe,Ni,Si,Pt,Cr ) 125 mm 01.06.1999 1 as is where is
96900 Rigaku MFM310 X-ray Reflectivity (XRR) 300 mm 1 as is where is
99430 Rigaku 3640 X-Ray Fluorescence Wafer/Disk Analyzer 200 mm 1 as is where is immediately
101802 Rigaku XRF3640 Metal thickness measurement 200 mm 1 inquire
102347 Rigaku 3272 TXRF (X-Ray Fluorescence) 300 mm 01.06.2005 1 as is where is
102348 Rigaku SYS3630 XRF (X-Ray Fluorescence) 200 mm 01.06.1996 1 as is where is
102350 Rigaku TXRF3750 TXRF (X-Ray Fluorescence) 200 mm 01.06.1999 1 as is where is
102351 RION KS-40AF Particle Measurement 300 mm 01.06.2007 1 as is where is
72034 RUDOLPH MP200 METROLOGY 200 mm 01.06.2000 1 as is where is immediately
91116 RUDOLPH MP200 XCu Thin Film Measurement 200 mm 01.06.2001 1 as is where is
91559 RUDOLPH AXI_S Macro Inspection System 300 mm 01.06.2005 1 as is where is
91560 RUDOLPH AXI_S Macro Inspection System 300 mm 01.06.2005 1 as is where is
91561 RUDOLPH AXI_S Macro Inspection System 300 mm 01.06.2006 1 as is where is
91562 RUDOLPH MP1 300 Film thickness measurement 300 mm 01.06.2013 1 as is where is
91563 RUDOLPH Meta Pulse Film Metrology 200 mm 01.06.2005 1 as is where is
91564 RUDOLPH Meta Pulse 200 Film Metrology 200 mm 1 as is where is
91565 RUDOLPH MP1 300 Film Metrology 300 mm 1 as is where is
91566 Rudolph WS3840 3D Bump Metrology 300 mm 01.06.2010 1 as is where is immediately
91567 RUDOLPH META PULSE 200 Surface Film Metrology 200 mm 01.06.2002 1 as is where is immediately
92709 Rudolph WV320 MACRO INSPECTION 300 MM 01.06.2006 1 as is where is immediately
92710 Rudolph WV320 MACRO INSPECTION 300 MM 01.06.2006 1 as is where is
94478 RUDOLPH FE-3 Focus Ellipsometer 200 mm 1 as is where is
94479 RUDOLPH FE-4D Focus Ellipsometer 200 mm 1 as is where is
95619 Rudolph WV320 MACRO INSPECTION 300 MM 01.06.2006 1 as is where is immediately
95621 RUDOLPH WV320 Metrology 300mm 1 as is where is immediately
97965 RUDOLPH NSX320 MACRO DEFECT INSPECTOR 300 MM 1 inquire
97966 RUDOLPH WHS MACRO DEFECT INSPECTOR 300 MM 1 inquire
98171 Rudolph NSX105C Macro Inspection 200 mm 01.06.2007 1 as is where is
98296 RUDOLPH Meta Pulse 300 Film thickness measurement 300 mm 1 as is where is
98297 RUDOLPH Meta Pulse 300 Film thickness measurement 300 mm 1 as is where is
98298 RUDOLPH MP1-300 Film thickness measurement 300 mm 01.06.2007 1 as is where is
98493 Rudolph MP200 Cu Film thickness measurement 200mm 1 as is where is immediately
98494 Rudolph MP300 Cu Film thickness measurement 300mm 2 as is where is immediately
98835 RUDOLPH AXI-S Macro Wafer Inspection 300 mm 01.07.2004 1 as is where is immediately
98837 RUDOLPH MP1-300XCU Film Thickness Measurement System 300 mm 01.05.2008 1 as is where is immediately
100928 RUDOLPH AXI-S Macro Inspection System 300 mm 01.06.2003 1 as is where is
100929 RUDOLPH FE-7 Ellipsometer 200 mm 01.06.1996 1 as is where is
100930 RUDOLPH MP300 Film thickness measurement 200 mm 01.06.2007 1 as is where is
100931 RUDOLPH MP300 Film thickness measurement 200 mm 01.06.2009 1 as is where is
100932 RUDOLPH S3000A Focused Beam Ellipsometer 200 mm 01.06.2012 1 as is where is
101348 Rudolph Auto EL Elipsometer 150mm 1 as is where is
101349 Rudolph FE III Ellipsometer 1 as is where is
101491 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
101492 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
101493 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
101494 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
101495 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
101496 Rudolph NSX 105 Macro-Defect Inspection System 200mm 1 as is where is
101803 Rudolph AXI-935 Macro Defect Inspection System 300 mm 01.06.2007 1 inquire
101804 Rudolph FE-Ⅳ Thickness Measurement 200 mm 01.04.1995 1 inquire
101805 Rudolph FE-Ⅶ Thickness Measurement 200 mm 01.04.2002 1 inquire
101806 Rudolph NSX-105 Macro Defect Inspection System 200 mm 01.06.2008 2 inquire
102355 Rudolph 3Di8500 Wafer Inspection 300 mm 01.06.2008 1 as is where is
102356 Rudolph Axi-S Macro inspection 300 mm 01.06.2005 1 as is where is
102357 Rudolph NSX105 Macro Defect Inspection System 01.06.2008 1 as is where is
102358 Rudolph NSX115 Macro Defect Inspection System 300 mm 01.06.2009 1 as is where is
102359 Rudolph NSX115 Macro Defect Inspection System 300 mm 01.06.2009 1 as is where is
102360 Rudolph NSX115 Macro Defect Inspection System 300 mm 01.06.2010 1 as is where is
102361 Rudolph S300 Spectroscopic Reflectometer 300 mm 1 as is where is
102363 Rudolph S3000S Focused Beam Ellipsometer 300 mm 01.06.2011 1 as is where is
102364 Rudolph S3000SX Focused Beam Ellipsometer 300 mm 01.06.2011 1 as is where is
102365 Rudolph WV320 Macro inspection 300 mm 01.06.2005 1 as is where is
102366 Rudolph WV320 Macro inspection 300 mm 01.06.2005 1 as is where is
102367 Rudolph WV320 Macro Defect inspection 300 mm 01.06.2005 1 as is where is
102368 Rudolph WV320 Macro inspection 300 mm 1 as is where is
102369 Rudolph WV320 Macro Defect inspection 300 mm 01.06.2005 1 as is where is
102370 Rudolph WV320 Macro inspection 300 mm 1 as is where is
102371 Rudolph WV320 Macro inspection 300 mm 1 as is where is
102372 Rudolph WV320 Macro Defect inspection 300 mm 01.06.2007 1 as is where is
102373 Rudolph WV320 Macro Defect inspection 300 mm 01.06.2007 1 as is where is
102374 Rudolph WV320 Macro Defect inspection 300 mm 1 as is where is
102375 Rudolph WV320 Macro inspection 300 mm 01.06.2005 1 as is where is
102376 Rudolph WV320 Macro Defect inspection 300 mm 1 as is where is
102377 Rudolph WV320 Macro inspection 300 mm 1 as is where is
103553 RUDOLPH AXI-S Macro Inspection 300 mm 01.06.2004 1 as is where is
103554 RUDOLPH AXI935D AVI 300 mm 1 as is where is
103555 RUDOLPH MP3 300XCU FLIM THICKNESS MEASUREMENT SYSTEM 300 mm 1 as is where is
103707 Rudolph AXI-S Macro Inspection System 300 mm 01.06.2003 1 as is where is
103708 Rudolph AXI-935D Macro Inspection System 300 mm 1 as is where is
103709 Rudolph AXI-935D Macro Inspection System 300 mm 01.06.2011 1 as is where is
70089 Rudolph Technologies FE-VII Ellipsometer 200 mm 01.06.1996 1 as is where is immediately
88629 Rudolph/August NSX105 Macro Inspection 200 MM 01.06.2004 1 as is where is
88630 Rudolph/August NSX105 Macro Inspection 200 MM 01.06.2003 1 as is where is
101673 RVSI WS-3800 2D/3D Automated Optical Inspection System 200 mm 1 as is where is
91875 SDI SPV-300 Surface Photo Voltage Tester for up to 300mm Wafers up to 300 mm 01.06.1997 1 as is where is immediately
102894 SDI SPV-1050 Contamination Monitoring System 200 mm 01.06.1996 1 as is where is immediately
91873 SDI / Semilab FAaST-330 Dielectric Characterization Tool with COCOS & Epi-t for up to 300mm Wafers up to 300 mm 01.06.1999 1 as is where is immediately
91117 SEIKO CHIPS-200 metrology system 200 mm 1 as is where is
102379 Seiko Instruments Xvision 300DB Fib-SEM 300 mm 1 as is where is immediately
86199 SEIKO SEIKI SMI2200 SEM 200 mm 1 as is where is
91118 SELA MC100 metrology system 200 mm 1 as is where is
91119 SELA MC500 metrology system 200 mm 1 as is where is
102951 SELA EM3i Saw for TEM sample preparation ASSEMBLY 01.06.2011 1 as is where is
82911 Semiconductor Diagnostics 3030 Surface Profiler 200 01.06.2012 1 as is where is immediately
100747 Semilab WT-2000PVN Carrier Lifetime Measurement System 1 as is where is immediately
102381 Semilab PS-2000 Ellipsometric Porosimeter 01.06.2015 1 as is where is
102382 Semilab SPVCMS4000 Surface Charge Measurement 200 mm 01.06.1995 1 as is where is
89974 Semix Tazmo SOG TR817UD-TM 150mm SOG 150mm 1 as is where is
95377 Sheffield Endeavor Coordinate Measurement Machine 9.12.7 1 as is where is immediately
97877 Siemens 3 DIMESION MEA FAB-METROLOGY 01.06.2006 1 as is where is
74946 Sonoscan D6000 C-Sam 01.05.1996 1 as is where is immediately
83703 SOPRA SE 200 Ellipsometer 200 mm 1 as is where is
102394 SOPRA EP12 Optical Dielectric Porosity Measurement System (300mm) 300 mm 1 as is where is
91877 SSM 470i CV Plotter 1 inquire
98012 SSM SSM 6100 CV IMPLANT-CV CURVES 300 mm 01.06.2000 1 as is where is
89975 TecHarmonic EHTVS Water Scrubber 1 as is where is
101356 Technos TREX610T Total Reflection X-Ray Flourescence Spectrometer 150mm 1 as is where is
101503 Technos TVD-900 ICP-MS Spectrometer 1 as is where is
77049 Tecnai TF20 TEM Refurbished 01.06.2001 1 as is where is immediately
33722 TENCOR AlphaStep 300 Profilometer 1 inquire
61012 THERMA-WAVE OP 2600B OPTI-PROBE 200mm 01.01.1997 1 as is where is immediately
98438 Thermawave OP 5340 Inspection System 150/200/300 mm 1 as is where is
98935 Thermawave TP 630 Ion Implant Measurement System 1 as is where is
99874 Thermawave OP2600 Film Thickness 150 mm 01.05.1995 1 inquire
101809 Thermawave OP-2600 thickness measurement System 200 mm 1 inquire
101810 Thermawave ThrmaProbe-420 Lattice Defects measurement 200 mm 01.06.1999 1 inquire
91569 Thermo Fisher ECO 1000 FTIR System 200 mm 01.06.2000 1 as is where is immediately
91570 Toray SP-500w Bump Height Measurement 300 mm 01.06.2010 1 as is where is
97887 TOYO SE-4000 Roughness Measurement 01.06.2008 1 as is where is
102456 TSK / Accretech Win-Win 50 1600 Bright Field Inspection 300 mm 1 as is where is
102457 TSK / Accretech Win-Win 50 1600 Bright-Field Inspection 300 mm 01.06.2005 1 as is where is
102458 TSK / Accretech Win-Win 50 1600 Bright Field Inspection 300 mm 01.06.2005 1 as is where is
102459 TSK / Accretech Win-Win 50 1600 Bright Field Inspection 300 mm 1 as is where is
88284 Veeco Dimension 7000 Atomic Force Microscope (AFM) 200mm 1 as is where is
88375 Veeco D9000 Atomic Force Microscope 200 mm 01.06.1997 1 as is where is immediately
88631 Veeco Dimension X3D Model 340 Atomic Force Microscope 300 MM 01.06.2006 1 as is where is immediately
96382 Veeco D9000 Atomic Force Microscope 200 mm 01.06.2001 1 as is where is immediately
96383 Veeco D9000 Atomic Force Microscope 200 mm 01.06.2001 1 as is where is immediately
96404 Veeco NT3300 Non Contact Profilometer 6 or 8 inch 01.01.2004 1 as is all rebuilt immediately
97839 Veeco Dimension X1D Atomic Force Microscope (AFM) 300 mm 1 as is where is
97840 Veeco Dimension X1D Atomic Force Microscope (AFM) 300 mm 1 as is where is
98373 VEECO V220SI METRO 200 mm 01.06.2002 1 inquire
102461 Veeco Dimension X1D ATOMIC FORCE MICROSCOPE (AFM) 300 mm 01.06.2004 1 as is where is
102462 Veeco Dimension X3D Atomic Force Microscope (AFM) 300 mm 01.06.2004 1 as is where is
102463 Veeco Dimension X3D ATOMIC FORCE MICROSCOPE (AFM) 300 mm 01.06.2006 1 as is where is
102464 Veeco NT9800 Optical Profiling System 01.06.2010 1 as is where is
102465 Veeco V220SI Surface Profile Measurement 1 as is where is
103136 Veeco Dimension Vx340 Atomic Force Profiler (AFP) 300mm 01.06.2003 1 as is where is
103182 Veeco Dimension 3100 Atomic Force Microscope 150 mm 01.06.2017 1 as is all rebuilt immediately
103373 VEECO Dektak 8 Programmable Surface Profiler Measuring System 200 mm 01.05.2006 1 as is where is immediately
103665 Veeco Dektak 3030 ST Surface Texture Analysis System 1 as is where is
103669 Veeco 9000M Atomic Force Microscope 1 as is where is
103670 Veeco Dektak SXM Atomic Force Microscope 200 mm 1 as is where is
95009 WOOLAM HS-190 Scanning Monochromator 200 MM 1 as is where is
93087 Woollam VUV-VASE (Gen II) Ellipsometer 300 MM 1 as is where is immediately
34091 Wyko NT 2000 Optical Profiling system 200 MM 1 inquire immediately
38870 Wyko NT1100 Optical Profiling system 1 as is where is 2 weeks
66762 WYKO HD 2000 DPC Video Scope 1 as is where is immediately
71792 WYKO NT3300 Optical 3D profiling system 1
96646 WYKO NT3300 Profilometer 200mm 1 as is all rebuilt immediately
98217 YesTech YTV-B3 AOI Automated Optical Inspection System 01.06.2008 1 as is where is immediately
86716 ZEISS Axiotron Wafer inspection microscope 1 as is where is immediately
91388 Zeiss AXIOTRON INSPECTION MICROSCOPE 1 as is where is
91389 Zeiss AXIOTRON INSPECTION MICROSCOPE 1 as is where is
91390 Zeiss AXIOTON High Perpomance MICRO SCOPE N/a 01.06.2008 1 as is where is
97108 Zeiss Axiotech 100 HD Inspection Microscope Assembly 1 as is where is immediately
97610 Zeiss Axiotron 300 Microscope 300 mm 1 as is where is
98211 Zeiss Ultra 55 FA SEMs/TEMs/Dual Beams 1 inquire


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