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Pre-owned Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com

Please find below a list of Used Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com .Click on any listed item of Fab Metrology , Inspection and QC Equipment to see further data.


SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
91841 ADE Episcan 1000 FT-IR Spectromter for measurement of Epitaxial films 100-200 mm 1 inquire immediately
92686 ADE FIT3120 PARTICLE COUNTER 300 mm 1 as is where is
97846 ADE NANOMAPPER SQM 300 mm 01.06.2001 1 as is where is
96030 Agilent / Verigy HP4155A Semiconductor Parameter Analyzer 200 mm 1 inquire
99083 Agilent / Verigy 4284A LCR & Resistance Meter 1 as is where is
84360 Alcatel 925-40 Leak Detector 1 as is where is immediately
71960 Applied Materials SEMVISION CX INSPECTION SEM 200 mm 01.06.2000 1 as is where is immediately
83514 Applied Materials Opal 7830i Enhanced CD-SEM 200 mm 01.06.1997 1 as is where is immediately
85943 Applied Materials VeritySEM 3 Critical Dimension Measurement SEM 300 mm 01.06.2007 1 as is where is immediately
86422 Applied Materials Orbot WF720 Wafer inspection system 125 mm 1 as is where is
90567 Applied Materials VeritySEM 3 SEM - Critical Dimension (CD) Measurement 300 mm 01.06.2005 1 as is where is immediately
90568 Applied Materials VeritySEM 3 SEM - Critical Dimension (CD) Measurement 300 mm 01.06.2005 1 as is where is immediately
90947 Applied Materials UVision 4 Bright field inspection 300 mm 01.06.2009 1 as is where is
92045 Applied Materials UV 5 Wafer Inspection System 300 mm 01.06.2012 1 as is where is immediately
92800 Applied Materials Orbot WF720 Metrology (Metrology) 125 mm 1 as is where is
93395 Applied Materials UVision 3 Wafer Inspection System 200 mm 1 inquire immediately
93658 Applied Materials Excite High Speed Particle Detection System for Bare Wafer or Patterned Wafer Inspection 200 MM 1 as is where is
95612 Applied Materials SEMVision G3 Defect Review SEM 200 mm / 300 mm 1 inquire immediately
95756 Applied Materials Uvision 200 Brightfield Inspection 300 mm 01.06.2007 1 as is where is
96831 Applied Materials Uvision 200 Brightfield Inspection 300 mm 01.06.2007 1 as is where is
96832 Applied Materials Uvision 4 Brightfield Inspection 300 mm 01.10.2013 1 as is where is
96833 Applied Materials Uvision 4 Brightfield Inspection 300 mm 01.06.2011 1 as is where is
97213 Applied Materials COMPLUS 4T Darkfield Inspection System 300 mm 01.07.2010 1 as is where is
97214 Applied Materials COMPLUS 4T Darkfield Inspection System 300 mm 01.04.2010 1 as is where is
97226 Applied Materials SEMVISION G3 Defect Review SEM 300 mm 01.03.2011 1 as is where is
97575 Applied Materials Uvision 3 Brightfield Inspection 300 mm 1 as is where is
97576 Applied Materials VeritySEM 2 SEM - Critical Dimension (CD) Measurement 300 mm 1 as is where is
98054 Applied Materials SEMVISION CX Defect Review SEM 300 mm 1 as is where is
98084 Applied Materials UVision 5 Brightfield UV Wafer Inspection System 300 mm 01.06.2011 1 as is where is
98085 Applied Materials UVision 5 Brightfield UV Wafer Inspection System 300 mm 01.06.2012 1 as is where is
98329 Applied Materials PRODUCER GT (Chamber) UV CURE CHAMBER 300 mm 1 inquire
98796 Applied Materials COMPLUS4T Darkfield Inspection System 300 mm 01.04.2010 1 as is where is
99000 Applied Materials UVISION7 Brightfield Inspection 300 mm 01.09.2011 1 as is where is
97046 ASML Yeldstar S-100 Advanced Process Control / Yield Opimization System 300 mm 1 as is where is immediately
98559 ASML Yieldstar S1250D Overlay Measurement 300 mm 1 as is where is
91387 AUGUST CV-9812 Wafer Carrier inspection tool 1 as is where is
98447 August 3DI-8000 wafer inspection 300mm 1 as is where is
98448 August NSX-95 2D Auto inspection system 200mm 1 as is where is
93660 August Technology NSX-85 Automated Defect Inspection System 1 as is where is
98378 Bio Rad QS-408-M FTIR 150 mm 2 as is where is
95016 Bio-Rad Q8 Overlay Metrology 1 as is all rebuilt 1 month
99405 Bio-Rad Q5 (Upgrade to a Q6) Overlay Registration Tool up to 200 mm 2 as is where is immediately
99406 Bio-Rad Q7/Q8 Overlay metrology Tool 150 mm-200 mm 01.06.1997 1 as is where is immediately
99407 Bio-Rad QS-1200 FT-IR Spectrometer 100-200 mm 01.06.2004 1 as is where is immediately
99408 Bio-Rad QS-300 FT-IR Spectrometer for measurement of EPI films up to 200 mm 01.06.1995 1 as is where is immediately
99409 Bio-Rad QS-408M Manual FT-IR Spectrometer 100-200 mm 1 as is where is immediately
33671 BIORAD Q5 Overlay Metrology Tool 200 mm 2 as is where is immediately
91845 BIORAD QS-300 FT-IR Spectrometer for up to 200mm Wafers 200 mm 01.06.1995 1 inquire immediately
91847 BIORAD QS-408M Manual FT-IR Spectrometer for Epi, SiN, BPSG Measurement & More, up to 200mm Wafers, 2ea Available 1 inquire immediately
97461 Biorad Q200 Overlay Measurement System 200 mm 1 as is where is
97995 Biorad Q5 Overlay measurement system 150mm 1 as is where is
97850 Bruker DEKTAK-8ADP Scan Profiler 1 as is where is
98851 Bruker D8 Fabline X-ray Diffractometer 150 mm / 200 mm 01.05.2011 1 as is where is immediately
84534 Cameca IMS 6F / 7F (Spares) Eucentric Rotating sample stage spares 1 immediately
95610 Cameca TXRF 8300 Automated TXRF with Specimen Chamber and Wafer Handling 300 mm 01.06.2007 1 as is where is immediately
74929 CDE Resmap 463 OC Four-point prober Resistivity Measurement up to 300 mm 1 as is where is immediately
87833 Disco DAD6450 Dicing and handler 200mm 1 as is where is immediately
89978 Edwards IPX-500 Dry Pump 1 as is where is
96569 Ellipso technology Elli-SE-aM6 Ellipsometer UP TO 6 INCH 01.05.2011 1 as is where is immediately
92213 ESCO EMD-WA1000S Temperature Desorption Analyzer 200mm 01.06.2000 1 as is where is
14505 FEI XL835 Dual beam FIB workstation 01.06.1998 1 inquire 2 weeks
79226 FEI DB 235 Dual Beam FIB SEM 01.06.2000 1 inquire
86036 FEI 1265 DUAL BEAM FIB 300 mm 1 as is where is
86037 FEI EXPIDA 1255S MANUAL LOAD, NO STEM, NGSEM COL 300 mm 1 as is where is
86292 FEI F30 Technai FIB SEM 1
86294 FEI DB 835 FIB SEM 1
86295 FEI Quanta 400 FIB SEM 1 inquire immediately
86300 FEI Nova nano 230 FIB SEM 1 inquire immediately
89021 FEI Vectra + FIB Sem Laboratory 01.10.1998 1 as is where is immediately
91392 FEI FEM2010F Dual Beam FIB-SEM N/A 1 as is where is
92040 FEI TF30 Super twin 01.10.2007 1 as is all rebuilt immediately
93961 FEI Altura Dual beam FIB 01.01.2004 1 as is where is immediately
96041 FEI Helios Nanolab 400 FIB SEM 100 mm 01.06.2008 1 inquire
97011 FEI EXPIDA 1255 Dual Beam FIB SEM 300 mm 01.06.2006 1 as is where is immediately
97047 FEI EXPIDA DB 1255 Dual Beam FIB SEM 300 mm 01.06.2006 1 as is where is immediately
97614 FEI Strata 400S Dual Beam FIB SEM Laboratory 01.06.2007 1 as is where is immediately
98055 FEI TECNAIG2 STWIN Transmission Electron Microscope 300 mm 1 as is where is
98114 FEI ExSolve 2 WTP EFEM High Accuracy FIB 300 mm 01.06.2017 1 as is where is
98115 FEI TEM Tecnai G2 F20 Transmission electron microscope 01.03.2012 1 as is where is immediately
98205 FEI Strata 400S FA SEMs/TEMs/Dual Beams 100 mm 01.06.2005 1 inquire
98605 FEI Tecnai G2 F20 TEM LABORATORY 1 as is where is
99400 FEI Quanta Inspect fp Tungsten filament SEM 200 mm 1 as is where is immediately
99853 FEI XL40 Cross Section SEM 1 inquire
86235 FEI Company 820 Dual Bem Fib SEM 200 mm 1 as is where is immediately
97925 Filmetrics F50 UV Mapping Reflectometer 200 mm 1 as is where is immediately
88252 First Ten Angstroms FTA3000 Life Sciences, Particle Analysis 300mm 01.01.2010 1 as is where is
55974 FRONTIER FSM900TC-VAC FILM STRESS AND WAFER BOW MEASUREMENT 200 mm 01.05.2000 1 as is where is immediately
88253 FSE FSE-CS-300 Evaporator Deposition Equipment 200mm 1 as is where is
90155 FSM FSM 500TC THIN FILM STRESS MEASUREMENT 01.02.2007 1 as is where is
90156 FSM 500TC THIN FILM STRESS MEASUREMENT 01.06.2004 1 as is where is
93084 FSM SYMPHONYMC Life Time 300 MM 1 as is where is
96543 Gaertner L115C-8 Ellipsometer, cassette to cassette 100-200 mm 01.03.1995 1 as is where is immediately
99414 GCA/Tropel 9000 Wafer Flatness Analyzer 1 as is where is
95807 GeMeTec WSPS Metrology and QC 300 mm 1 as is where is
71907 Hamamatsu C7103 PC Controlled IC Back-side Lapping and Wafer Grinding System 200 mm and packages 01.10.2001 1 inquire immediately
97928 HANRA HRI-580L INSPECTION SYSTEM ASSEMBLY 2 inquire
95808 Hermes eScan-315xp E-beam Inspection 300 mm 1 as is where is
97859 HERMES NMI-100 DEFECT INSPECTION 1 as is where is
94211 Hermes Microvision eP3 XP E-beam Inspection 300 mm 01.06.2014 1 as is where is
95283 Hermes Microvision eScan-315xp E-beam Inspection 300mm 01.01.2011 1 as is where is
97616 Hermes Microvision eScan 315xp E-beam Inspection 300 mm 01.09.2008 1 as is where is
97617 Hermes Microvision eScan 315xp E-beam Inspection 300 mm 1 as is where is
98118 Hermes Microvision eScan320 ebeam Inspection 300 mm 1 as is where is
96863 Hermes Microvision (HMI) eP3 XP E-beam Inspection 300 mm 01.06.2014 1 as is where is
36259 HITACHI S-9300 SEM - CD (CRITICAL DIMENSION) 300 mm 01.06.2005 1 as is all rebuilt 2 months
52166 Hitachi 545-5515 DC power supply module for CD SEM spares 1 as is where is immediately
52167 Hitachi 6280H Power Supply Module 4channels spares 1 as is where is immediately
52168 Hitachi 545-5540 Power Supply unit for CD SEM Spares 1 as is where is immediately
52312 Hitachi 545-5522 VG board for CD SEM spares 01.06.1994 1 as is where is immediately
52339 Hitachi 545-5521 EVAC PCB FOR HITACHI CD-SEM spares 01.06.1994 1 as is where is immediately
52340 Hitachi 545-5537 IP-PC2 for cd-sem spares 01.06.1994 1 as is where is immediately
52343 Hitachi 377-7592 Power Supply Module for CD SEM spares 01.06.1994 1 as is where is immediately
53054 HITACHI 6280H (SPARES) SORD Computer for cd sem system spares 1 as is where is immediately
56838 Hitachi S-4500 FE Inspection SEM Type 1 chamber 1 as is all rebuilt immediately
60939 HITACHI S4160 01.06.1996 1 as is where is
60964 HITACHI S7800HSA 1 as is where is
65359 HITACHI S-9220 SIP baord for CD-SEM S9220,P/N 568-5591 1 as is where is immediately
74794 Hitachi S5200 FE SEM with EDX Inspection 01.06.2005 1 as is where is immediately
78108 Hitachi S4700 Type 2 FE-SEM Up to 6 inch 01.06.2006 1 as is all rebuilt immediately
78685 HITACHI DES-9300 METRO 300 MM 01.04.2001 1 as is where is
78690 HITACHI S-9300 CD-SEM 300 MM 01.06.2001 1 as is where is immediately
78693 HITACHI S9360 CD-SEM 300 MM 01.01.2003 1 as is where is
82687 HITACHI S9380Ⅱ CD SEM 300 mm 01.06.2006 1 as is where is
82688 HITACHI S9380Ⅱ CD SEM 300 mm 01.06.2006 1 as is where is
83585 Hitachi S5000H Field Emission SEM Laboratory 1 as is where is immediately
84345 Hitachi EA8000 X-ray Particle Contaminant Analyzer 1 as is where is immediately
84839 Hitachi S2700 Scanning Electron Microscope Laboratory 1 as is where is immediately
86169 HITACHI FB-2000A FIB Sem 200 mm 01.06.2001 1 as is where is
86171 HITACHI S-4700 (w/EDAX) FE SEM with EDX 01.06.1998 1 as is where is
86172 HITACHI S-5000 FE SEM 200 mm 01.06.1994 1 as is where is
86173 HITACHI S-5000 FE SEM 200 mm 01.06.1996 1 as is where is
86174 HITACHI S-5000 FE SEM 200 mm 01.06.1999 1 as is where is
86175 HITACHI S-5000 FE SEM 200 mm 01.06.2000 1 as is where is
86275 Hitachi RS4000 In-line Defect Review SEM 200 mm / 300 mm 01.01.2007 1 as is where is immediately
86296 Hitachi 3600N SEM 1 inquire immediately
86297 Hitachi S5200 FE-SEM 1 inquire immediately
86298 Hitachi S4800 FE-SEM 1 inquire immediately
86299 Hitachi s3000H SEM 1 inquire immediately
88591 Hitachi RS3000T Review SEM 300 MM 01.06.2007 1 as is where is
88592 Hitachi RS4000 Review SEM 300 MM 01.06.2006 1 as is where is
88948 Hitachi S9380 CD SEM metrology ( Working ) Spares 1 inquire immediately
88949 Hitachi S9380 II CD SEM metrology (As-Is) Spares 1 as is where is immediately
90949 Hitachi RS5000 DR SEM 300 mm 01.06.2007 1 as is where is
91005 Hitachi RS 5500 Defect Review SEM 300 MM 01.06.2009 1 as is where is immediately
91006 Hitachi RS 5500 Defect Review SEM 300 MM 01.06.2009 1 as is where is immediately
91085 HITACHI IS-2700 Wafer Inspection Station 300 mm 1 as is where is
91086 HITACHI S-4160 FE SEM Laboratory 01.06.1996 1 as is where is
91087 HITACHI S-4160 FE SEM Laboratory 01.06.1996 1 as is where is
91088 HITACHI S-4800 FE SEM Laboratory 01.06.2005 1 as is where is
91089 HITACHI S-5500 FE SEM Laboratory 01.06.2006 1 as is where is
91090 HITACHI S-5500 FE SEM Laboratory 01.06.2012 1 as is where is
91091 HITACHI S-5500 FE SEM Laboratory 01.06.2010 1 as is where is
91092 HITACHI S-9380 II CD SEM 300 mm 01.06.2006 1 as is where is
91093 HITACHI S-9380 II CD SEM 300 mm 01.06.2006 1 as is where is
91094 HITACHI S-9380 II CD SEM 300 mm 01.06.2007 1 as is where is
91095 HITACHI S-9380 II CD SEM 300 mm 01.06.2007 1 as is where is
91096 HITACHI S-9380 II CD SEM 300 mm 01.06.2005 1 as is where is
91097 HITACHI S-9380 II CD SEM 300 mm 01.06.2007 1 as is where is
91100 HITACHI S-9380 II CD SEM 300 mm 01.06.2007 1 inquire immediately
91102 HITACHI S-9380 II CD SEM 300 mm 01.06.2003 1 as is where is
91103 HITACHI WA-1300 ATOMIC FORCE MICROSCOPE 300 mm 1 as is where is
91104 HITACHI WA3300 atomic force microscope - 1 as is where is
91395 HITACHI I-6300 CD SEM 1 as is where is
91396 HITACHI IS2700SE Dark Field inspection 300 mm 01.06.2006 1 as is where is
91397 HITACHI IS2700SE Dark Field inspection 1 as is where is
91398 HITACHI IS3000E High Speed Dark Field inspection 300 mm 01.06.2007 1 as is where is
91399 HITACHI IS3000E High Speed Dark Field inspection 300 mm 01.06.2007 1 as is where is
91400 HITACHI IS3000E High Speed Dark Field inspection 300 mm 01.06.2007 1 as is where is
91401 HITACHI IS3000E High Speed Dark Field inspection 300 mm 01.06.2007 1 as is where is
91402 HITACHI IS3000E High Speed Dark Field inspection 300 mm 01.06.2007 1 as is where is
91403 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91404 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91405 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91407 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91408 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91411 HITACHI S9260A CD SEM 200 mm 01.05.2003 1 as is where is immediately
91416 HITACHI LS-6800 wafer surface inspection 200 mm /300 mm 1 as is where is
91417 HITACHI LS-6800 wafer surface inspection 300 mm 01.09.2007 1 as is where is immediately
91418 HITACHI UA-7200 Stripper/Asher 01.06.2001 1 as is where is
91821 HITACHI S9380Ⅱ CD SEM 01.06.2007 1 as is where is
91848 HITACHI S7000 CD SEM 150 mm 01.06.1989 1 as is where is immediately
92027 HITACHI S9300 CD SEM 200-300 mm 01.06.2001 3 as is where is immediately
92806 Hitachi RS4000 Defect Review SEM 300 mm 1 as is where is
93085 HITACHI S9380 II CD SEM 300 mm 01.06.2004 1 as is where is immediately
93374 Hitachi S4700 FIELD EMISSION SEM Laboratory 01.06.2004 1 as is where is immediately
93394 Hitachi S9380 ii CD SEM 300 mm 01.08.2007 1 inquire immediately
93903 HITACHI S9220 CD SEM 300 mm 01.06.2000 1 as is where is
93904 HITACHI S9380_2 CD SEM 300 mm 01.06.2005 1 as is where is
93905 HITACHI S9380 ii CD SEM 300 mm 01.06.2005 1 as is where is immediately
93906 HITACHI S9380_2 CD SEM 300 mm 01.06.2006 1 as is where is
93907 HITACHI S9380_2 CD SEM 300 mm 01.06.2004 1 as is where is
94216 Hitachi RS-6000 SEM - Defect Review (DR) 300 mm 01.07.2014 1 as is where is
94459 HITACHI S-7800 CD SEM 150 mm,200 mm 01.06.1996 1 as is where is
94460 HITACHI S-7800HSA CD SEM 150 mm,200 mm 01.06.1997 1 as is where is
95070 Hitachi S5000 SEM Scanning Electron Microscope Hitachi S5000 with Noran 445A-3SES detector Laboratory 1 as is where is immediately
95095 HITACHI S-9380 II Metrology 12" 01.06.2003 1 as is where is
95361 Hitachi IS3000 DARK FIELD INSPECTION 300 mm 01.06.2007 1 as is where is
95729 Hitachi WA 3300 Atomic Force Microscope 300 mm 01.06.2007 1 as is where is immediately
95934 Hitachi HD-2300 Scanning Transmission Electron Microscope 300 mm 1 as is where is
95998 HITACHI EDAX 136-5 Energy Dispersive X-ray Spectrometer Laboratory and Scientific 1 as is where is
96042 Hitachi CG-4000 CD Sem 300 mm 1 inquire
96044 Hitachi S-4800-II FE SEM 200 mm 01.06.2004 1 inquire
96045 Hitachi S-4800-II FE SEM 200 mm 01.06.2007 1 inquire
96046 Hitachi S-5200 FE SEM Laboratory and Scientific 1 inquire
96047 Hitachi SU-70 High Resolution Field Emission SEM Laboratory and Scientific 01.06.2008 1 inquire
96377 Hitachi S9380 II CD SEM 300 mm 01.06.2006 1 as is where is immediately
96550 Hitachi S9200 CD SEM 200 mm 01.03.1999 1 as is where is immediately
96576 Hitachi S-3400N-Type Ⅱ Scanning Electron Microscope Up to 8 inch 01.05.2011 1 as is where is immediately
97014 Hitachi S-4700 SEM 200 mm 01.06.2000 1 as is where is
97016 Hitachi S-5000 FE-SEM 01.06.1996 1 as is where is
97043 Hitachi SU 8010 Ultra High Resolution Field Emission Scanning Electron Microscope 100 mm 01.06.2014 1 as is where is immediately
97098 Hitachi S5500 FE SEM 01.06.1998 1 inquire
98119 Hitachi S-4800 FE SEM 300 mm 01.06.2004 1 as is where is
98120 Hitachi S-4800 FE SEM 300 mm 01.06.2005 1 as is where is
98121 Hitachi S-9380II CD SEM 300 mm 01.06.2005 1 as is where is
98122 Hitachi S-9380II CD SEM 300 mm 01.06.2006 1 as is where is
98206 Hitachi S-5000 FA SEMs/TEMs/Dual Beams 1 inquire
98207 Hitachi S-7800 Metrology and Inspection 200 mm 01.08.1997 1 inquire
98208 Hitachi S-9380-II Metrology and Inspection 300 mm 1 inquire
98269 HITACHI RS 4000 Defect Review SEM 300 mm 01.06.2003 1 as is where is
98270 HITACHI RS 4000 Defect Review SEM 300 mm 01.06.2003 1 as is where is
98271 HITACHI S4700-II Scanning Electron Microscope 300 mm 01.06.2001 1 as is where is
98272 HITACHI S4700-II Scanning Electron Microscope 300 mm 01.06.2001 1 as is where is
98273 HITACHI S4700 FE SEM 1 as is where is
98274 HITACHI S9220 CD SEM 200 mm 01.06.2000 1 as is where is
98275 HITACHI S9380 II CD SEM 300 mm 01.06.2013 1 as is where is
98311 Hitachi S5500 FE SEM 200 mm 01.06.1998 1 inquire
98312 Hitachi S6280 In Line SEM (for spares use) 200 mm 01.06.1992 3 as is where is
98313 Hitachi S9380 CD SEM 200 mm 01.06.2003 1 inquire
98506 Hitachi WA200 SEM 200 mm 1 as is where is
98813 HITACHI S9380-2 CD SEM 300 mm 01.02.2007 1 as is where is
98884 HITACHI S9380 CD SEM 300mm 01.06.2006 1 as is where is
98885 HITACHI S9380 CD SEM 300mm 01.06.2007 1 as is where is
98886 HITACHI S9380 CD SEM 300mm 01.06.2007 1 as is where is
99005 HITACHI S-5500 Ultra-high Resolution SEM 200/300 mm 01.06.2005 1 as is where is
99157 Hitachi CG4000 SEM 300mm 01.05.2007 1 as is where is
99158 Hitachi CG-4100 SEM - Critical Dimension (CD) Measurement 300mm 1 as is where is
99159 Hitachi CG-4100 SEM - Critical Dimension (CD) Measurement 300mm 1 as is where is
99160 Hitachi RS-4000 SEM - Defect Review (DR) 300mm 1 as is where is
99161 Hitachi S-4800 FE SEM 300mm 1 as is where is
99162 Hitachi S-8840 SEM - Critical Dimension (CD) Measurement 100mm 1 as is where is
99163 Hitachi S-8840 SEM - Critical Dimension (CD) Measurement 150mm 1 as is where is
99164 Hitachi S-8840 SEM - Critical Dimension (CD) Measurement 100mm 1 as is where is
99855 Hitachi S-8820 CD SEM 01.02.1996 1 inquire
99856 Hitachi S4500 Field Emission SEM 01.06.1993 1 inquire
87825 Horiba PD3000 Reticle inspection system 200 MM 01.06.1995 1 as is where is immediately
88596 Horiba PR-PD2 Reticle/Mask Particle Detection System 150 MM 01.04.2006 1 as is where is immediately
98392 Horiba PD2000 (PARTS) Reticle Inspection System (User Interface) 150 mm 1 as is where is immediately
90670 Horiba Jobin Evon PZ2000 Ellipsometer 200 mm 01.06.2000 1 as is where is immediately
97863 HP 16500C Logic Analyser 1 as is where is
86681 Hypervision PTF1 IR Emission Microscope 01.06.2000 1 as is where is immediately
96717 ICOS CI-T130 Lead Scan Assembly 01.06.2008 1 inquire
91419 J.A Woollam VUV-VASE (Gen II) Ellipsometer 300 mm 1 as is where is
91420 J.A Woollam VUV-VASE VU302 (Gen I) Ellipsometer 200 mm 01.06.2001 1 as is where is
93087 J.A Woollam VUV-VASE (Gen II) Ellipsometer 300 MM 1 as is where is
91421 J.A.WOOLAM M-2000X spectroscopic ellipsometers 1 as is where is
93088 J.A.WOOLAM VUV-VASE VU302 (Gen I) Ellipsometer 200 mm 01.06.2001 1 as is where is
84540 JEOL 2100F TEM 200 mm 01.01.2004 1 as is where is immediately
87098 JEOL JWS-7505 Defect review SEM w/ EDX, untested 200 mm 01.01.2001 1 as is where is
87627 JEOL JSM 6400 Scanning Electron Microscope 1 as is where is immediately
87828 Jeol JWS7555 Scanning Electron Microscopes 200 mm 01.01.2000 1 as is where is immediately
91422 JEOL JSM-5600 FE SEM 01.06.1999 1 as is where is
91423 JEOL JSM-6340F FE SEM 1 as is where is
91424 JEOL JSM-6700F FE SEM 1 as is where is
91425 JEOL JWS-7515 WAFER INSPECTION 1 as is where is
91426 JEOL JWS-7515 WAFER INSPECTION 1 as is where is
91899 Jeol jSM 6330F FIELD EMISSION SEM 1 as is where is immediately
92068 JEOL JSM 6400F Scanning Electron Microscope 1 as is where is immediately
92220 JEOL JWS-7555 SEM - Defect Review (DR) 200mm 1 as is where is
93311 JEOL JSM-6320 Field Emission SEM Laboratory 1 as is where is immediately
93663 Jeol JWS-7515 In-Line Wafer Inspection Electron Microscope. 1 as is where is
93664 Jeol JWS-7515 In-Line Wafer Inspection Electron Microscope 1 as is where is
93665 Jeol JWS-7555 Wafer Inspection SEM 1 as is where is
97999 JEOL JWS 7700 DR SEM 200 mm 01.06.1996 1 as is where is
98123 JEOL ARM200CF Super X PFA 01.06.2014 1 as is where is
98393 Jeol 6340F FE SEM 150 mm 1 as is where is
98394 Jeol 6600F FE SEM 150 mm 1 as is where is
98395 Jeol JWS-7555S Wafer Inspection System 150 mm 1 as is where is
98611 JEOL JEM-3000F Ultra High pressure Electron Microscope LABORATORY 1 as is where is
91427 Jordan Valley JVX 6200 X-ray metrology (X-Ray Reflectivity) 300 mm 1 as is where is
95012 Jordan Valley JVX 5200T X-Ray Reflectometer 200 MM / 300 MM 01.06.2006 1 as is where is
98000 Jordan Valley VVX 5200T METROLOGY 300 mm 01.06.2006 1 as is where is
99001 Jordan Valley JVX6200 X-Ray Reflectometer 01.11.2010 1 as is where is
99830 JORDAN VALLEY JVX6200I X-ray Metrology System 300 mm 01.03.2011 1 as is where is immediately
91429 KEITHLEY KEITHLEY 236 SOURCE MEASURE UNIT 1 as is where is
91430 KEITHLEY KEITHLEY 236 SOURCE MEASURE UNIT 1 as is where is
82672 KLA 2132 bright-field WAFER INSPECTION 200mm 1 as is where is immediately
87630 KLA - Tencor Alphastep IQ Surface measurement 4 inch 1 as is where is immediately
95510 KLA - Tencor Spectra F5X Surface Characterization 01.07.2002 0 as is where is immediately
91992 KLA -TENCOR 8100 Critical Dimension Measurement CD-SEM (FOR SPARES USE) 200 mm 01.06.1999 2 as is where is immediately
32230 KLA TENCOR SFS6400 MECHANICAL CALIBRATION Document Number 238 WAFERSURFACE ANALYSIS SYSTEM CUSTOMER MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
32231 KLA TENCOR Surfscan 64X0 Calibration Procedure Surfscan 64X0 Calibration Procedure MANUAL 1 as is where is immediately
32232 KLA TENCOR surfscan 64XX optical alignments Document Number 236 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
32233 KLA TENCOR SFS6x00 MECHANICAL CALIBRATION Document number 200 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
60953 KLA Tencor 2135 brightfield wafer defect inspection 200 mm 01.06.1996 1 as is where is immediately
95098 KLA TENCOR 2139 Metrology 8" 01.06.2000 1 as is where is
99837 KLA- TENCOR P-22H Metrology Tool 200 mm 1 as is all rebuilt immediately
90662 KLA-TENCOR 2132 Wafer Inspection - 200mm silicon 200 mm 01.04.1996 1 as is where is immediately
91991 KLA-TENCOR 8100 XP Critical Dimension Measurement CD-SEM 200 mm 01.06.2000 2 as is where is immediately
98061 KLA-TENCOR AIT 1 Dark field, particle inspection 150 mm / 200 mm 1 inquire immediately
96997 KLA-Tencor Surfscan AIT 8020 Particle Review 200 mm 01.06.1997 1 as is where is immediately
99831 Kla-Tencor Candela CS20V Optical Surface Analyzer 01.06.2017 3 as is where is immediately
99845 KLA-Tencor 2351 Bright-Field Wafer Inspection System 200 mm 1 as is where is immediately
1680 KLA-TENCOR 2132 bright-field WAFER INSPECTION 200 mm 01.08.1995 1 as is where is immediately
1691 KLA-TENCOR 259 (spare parts) Reticle Inspection - SPARE PARTS up to 7 inch 01.12.1991 1 inquire immediately
52151 KLA-Tencor Hamamatsu R1924A Photomultiplier spares 01.04.2007 1 inquire immediately
53035 KLA-Tencor 2132 Wafer chuck, 8" spares 1 as is where is immediately
53036 KLA-Tencor Compumotor M575L11 Stepping motor drive spares 1 as is where is immediately
70127 KLA-Tencor AIT UV PATTERNED WAFER INSPECTION 200 mm 01.08.2003 1 as is where is immediately
71632 KLA-TENCOR 2122 WAFER DEFECT INSPECTION 200 mm 1 as is where is immediately
74643 KLA-Tencor 710-013838-00 Rev 1 PCB Universal Video Mux spares 01.06.1993 1 as is where is
76676 KLA-TENCOR AIT XP FUSION Dark Field WAFER PARTICLE DETECTION 200 mm 01.10.2002 1 as is where is immediately
76677 KLA-TENCOR AIT FUSION Dark Field WAFER PARTICLE DETECTION 200 mm 01.06.2002 1 as is where is immediately
76681 KLA-TENCOR AIT UV Dark Field WAFER PARTICLE DETECTION 200 mm 01.01.2003 1 as is where is immediately
76682 KLA-TENCOR AIT UV Dark field wafer particle inspection system 200 mm 01.10.2003 1 as is where is immediately
76684 KLA-TENCOR P20H PROFILOMETER 200 mm 01.04.1996 1 as is where is immediately
78697 KLA-Tencor INS3300 MICROSCOPE INSPECTION STATION 300 MM 01.06.2006 1 as is where is
79847 KLA-Tencor 2915 inspection and metrology 300 mm 01.06.2012 1 inquire immediately
83702 KLA-Tencor AMRAY 4200 Review SEM 8" 01.03.1999 1 as is where is immediately
84034 KLA-Tencor SP2 wafer surface inspection system 300 mm 01.02.2006 1 inquire immediately
84299 KLA-Tencor SP2 XP Wafer surface particle detection 300 mm 01.02.2014 1 as is where is immediately
84523 KLA-Tencor RS 55 (TC) Resisitivity Measurement 150 MM AND 200 MM 01.06.1997 1 as is where is immediately
85953 KLA-Tencor AIT XP Parts/Options 200 mm 1 as is where is
85954 KLA-Tencor AIT XP Parts/Options 200 mm 1 as is where is
86038 KLA-Tencor AIT UV++ DARKFIELD PATTERN INSPECTION 300 mm 1 as is where is
86040 KLA-Tencor SCD-XT SCATTEROMETRY METROLOGY TOOL, NC 300 mm 1 as is where is
86180 KLA-TENCOR AIT-UV WAFER PARTICLE INSPECTION 200 mm 01.06.2002 1 as is where is
86419 KLA-Tencor AIT 1 wafer particle detection 150 mm 1 as is where is
86424 KLA-Tencor 7700 Surfscan 125 mm 01.02.1996 1 as is where is
87421 KLA-Tencor Puma 9550 WAFER INSPECTION 300 mm 01.11.2011 1 as is where is
87790 KLA-Tencor FLX 2908 Thin Film Measurement System 200 mm 01.04.1996 1 as is where is immediately
88266 KLA-Tencor eS20XP E-beam Inspection 200mm 01.01.2001 1 as is where is
88364 Kla-Tencor 2135 Birghtfield wafer defect inspection 150 mm or 200 mm 01.06.1995 1 inquire immediately
88365 Kla-Tencor 2135 XP Brightfield wafer defect inspection 150 mm or 200 mm 01.06.1997 1 inquire immediately
88366 Kla-Tencor 2139 Birghtfield wafer defect inspection 150 mm or 200 mm 01.06.2000 1 as is where is immediately
88368 Kla-Tencor P15 WAFER SURFACE PROFILOMETER 200 mm OR SMALLER 01.06.2007 1 inquire immediately
88369 Kla-Tencor 5200 Overlay measurement (For spares use) 200 mm 01.06.1997 1 inquire immediately
88370 Kla-Tencor FLX 2908 Wafer Stress Measurement 1 inquire
88378 Kla-Tencor Alpha Step IQ Profileometer Manual 1 inquire immediately
88379 Kla-Tencor AIT 2 Surfscan wafer particle detection system 200 mm 01.06.1998 1 inquire
88600 KLA-Tencor Aleris HX8500 Thickness Measurement 300 MM 01.06.2008 1 as is where is
88605 KLA-Tencor EDR5210 Defect Review SEM 300 MM 01.06.2010 1 as is where is
88607 KLA-Tencor INM100+INS10 Metrology 150 MM 1 as is where is
88610 KLA-Tencor KLA2800 Bright Field Inspection 300 MM 01.06.2007 1 as is where is
89977 KLA-Tencor Surfscan 4000 Wafer surface particle inspection 150mm 1 as is where is immediately
90324 KLA-Tencor KLA5200XP Overlay Measurement 200mm 1 as is where is immediately
90957 KLA-Tencor EDR5210 DR SEM 300 mm 1 as is where is
90960 KLA-Tencor NANOMAPPER Nanotopography 300 mm 01.06.2006 1 as is where is
90961 KLA-Tencor Puma 9000 Dark field defect Inspection 300 mm 01.06.2005 1 as is where is
91007 KLA-Tencor Aset F5x Thin Film measurement 300 MM 01.11.2003 1 as is where is immediately
91106 KLA-Tencor ARCHER 100AIM Overlay Measurement 300 mm 1 as is where is
91107 KLA-Tencor ARCHER 100AIM Overlay Measurement 300 mm 01.06.2007 1 as is where is immediately
91110 KLA-Tencor PUMA 9000D Wafer Inspection System 200 mm 1 as is where is
91111 KLA-Tencor PUMA 9000D Wafer Inspection System 300 mm 01.06.2006 1 as is where is
91112 KLA-Tencor PUMA 9000D Wafer Inspection System 300 mm 01.06.2005 1 as is where is
91431 KLA-Tencor 2350 Brightfield Wafer Defect Inspection 200 mm 01.06.2001 1 as is where is
91432 KLA-Tencor 2350 Brightfield Wafer Defect Inspection 200 mm 01.06.2001 1 as is where is
91433 KLA-Tencor 2350 Brightfield Wafer Defect Inspection 300 mm 1 as is where is
91435 KLA-Tencor AIT Particle Review 200 mm 01.06.1997 1 as is where is
91436 KLA-Tencor AIT I Patterned Wafer Inspection 150 mm,200 mm 01.06.1997 1 as is where is
91440 KLA-Tencor ARCHER 10 XT Overlay measurement system 300 mm 01.06.2008 1 as is where is immediately
91441 KLA-Tencor ARCHER AIM Overlay measurement system 300 mm 1 as is where is
91442 KLA-Tencor ARCHER XT+ Overlay measurement system 300 mm 01.06.2007 1 as is where is immediately
91443 KLA-Tencor ARCHER XT+ Overlay measurement system 300 mm 01.06.2003 1 as is where is
91444 KLA-Tencor ARCHER XT+ Overlay measurement system 300 mm 1 as is where is
91445 KLA-Tencor ARCHERXT+ Overlay measurement system 300 mm 01.06.2006 1 as is where is
91446 KLA-Tencor ARCHERXT+ Overlay measurement system 300 mm 01.06.2007 1 as is where is
91447 KLA-Tencor ARCHERXT+ Overlay measurement system 300 mm 01.06.2007 1 as is where is
91449 KLA-Tencor FLX-2320 Film stress measurement 150 mm,200 mm 01.01.1994 1 as is where is
91450 KLA-Tencor FLX-2320 Film stress measurement 150 mm,200 mm 01.06.1994 1 as is where is
91451 KLA-Tencor HRP_340 Surface Profiler 300 mm 01.06.2005 1 as is where is
91452 KLA-Tencor HRP_340 Surface Profiler 300 mm 01.06.2007 1 as is where is
91453 KLA-Tencor KLA 5100XP OVERLAY REGISTRATION 150 mm,200 mm 1 as is where is
91454 KLA-Tencor KLA 5200 OVERLAY REGISTRATION 150 mm,200 mm 1 as is where is
91457 KLA-Tencor M-GAUGE 200 Thickness measurement 4", 150 mm 1 as is where is
91464 KLA-Tencor PROMETRIX FT750 Film Thickness Measurement 1 as is where is
91466 KLA-Tencor PROMETRIX FT750 Film Thickness Measurement 1 as is where is
91467 KLA-Tencor PROMETRIX RS35 Auto Type Resistivity 150 mm,200 mm 1 as is where is
91468 KLA-Tencor PROMETRIX RS55 Auto Type Resistivity 150 mm,200 mm 1 as is where is
91469 KLA-Tencor PROMETRIX RS55 Manual Type Resistivity 200 mm 1 as is where is
91470 KLA-Tencor PROMETRIX UV-1050 THIN FILM MEASUREMENT 1 as is where is
91474 KLA-Tencor THERMA-WAVE OP 2600 OPTI-PROBE 200 mm 1 as is where is
91475 KLA-Tencor THERMA-WAVE OP 2600 OPTI-PROBE 200 mm 1 as is where is immediately
91476 KLA-Tencor THERMA-WAVE OP 2600 OPTI-PROBE 200 mm 01.06.1995 1 as is where is immediately
91477 KLA-Tencor THERMA-WAVE OP 2600 OPTI-PROBE 200 mm 1 as is where is immediately
91478 KLA-Tencor THERMA-WAVE OP 2600 DUV OPTI-PROBE 200 mm 01.08.1997 1 as is where is immediately
91479 KLA-Tencor THERMA-WAVE OP 2600B OPTI-PROBE 200 mm 01.06.1997 1 as is where is immediately
91480 KLA-Tencor THERMA-WAVE OP 2600B OPTI-PROBE 200 mm 1 as is where is immediately
91481 KLA-Tencor THERMA-WAVE OP 2600B OPTI-PROBE 200 mm 01.06.1997 1 as is where is immediately
91482 KLA-Tencor THERMA-WAVE OP 2600B OPTI-PROBE 200 mm 01.06.1997 1 as is where is immediately
91483 KLA-Tencor THERMA-WAVE OP 2600B OPTI-PROBE 200 mm 01.06.1999 1 as is where is immediately
91484 KLA-Tencor THERMA-WAVE OP 2600B OPTI-PROBE 200 mm 01.06.1997 1 as is where is immediately
91824 KLA-TENCOR UV-1050 FILM MEASUREMENT 01.06.1997 1 as is where is
91990 KLA-TENCOR AIT I Surfscan wafer particle detection system 200 mm 01.06.1998 2 as is where is immediately
92061 KLA-Tencor Candela 6120 Disk Inspection 200 mm 1 as is where is immediately
92222 KLA-Tencor Archer 300 Overlay Measurement System 300 mm 01.06.2012 1 as is where is
92670 KLA-Tencor 2815 PATTERNED WAFER INSPECTION SYSTEM 300 mm 01.08.2008 1 as is where is immediately
92705 KLA-Tencor ES35D E-BEAM INSPECTION 300 MM 01.06.2006 1 as is where is
92813 KLA-Tencor MPV CD2 AMC Optical Wafer Metrology 125 mm 1 as is where is
92814 KLA-Tencor MPV CD2 AMC Optical Wafer Metrology 125 mm 1 as is where is
92815 KLA-Tencor MPV-CD Optical Wafer Metrology 125 mm 1 as is where is
92817 KLA-Tencor Surfscan 7700 Particle Counter (Metrology) 125 mm 1 as is where is
93090 KLA-Tencor ARCHER 100AIM Overlay 300 mm 1 as is where is
93091 KLA-Tencor ARCHER 300 PLUS Overlay 300 mm 01.11.2011 1 as is where is immediately
93092 KLA-Tencor ARCHER 300LCM Overlay 300 mm 01.07.2010 1 as is where is
93093 KLA-Tencor SP3 wafer inspection 300 mm 1 as is where is immediately
93094 KLA-Tencor AIT UV DARKFIELD DEFECT INSPECTION 200 mm 1 as is where is
93095 KLA-Tencor AIT XP+ DARKFIELD DEFECT INSPECTION 200 mm 01.06.1998 1 as is where is
93096 KLA-Tencor ARCHER AIM� Overlay 300 MM 01.06.2003 1 as is where is
93097 KLA-Tencor P-10 DISK PROFILER 150 mm,200 mm 1 as is where is
93098 KLA-Tencor P-12 DISK PROFILER 150 mm/200 mm 1 as is where is immediately
93099 KLA-Tencor P-2 DISK PROFILER 150 mm,200 mm 1 as is where is
93100 KLA-Tencor P-2 DISK PROFILER 150 mm,200 mm 01.06.1996 1 as is where is
93101 KLA-Tencor P-20H DISK PROFILER 150 mm,200 mm 1 as is where is
93102 KLA-Tencor P-2H DISK PROFILER 150 mm,200 mm 01.06.1996 1 as is where is
93908 KLA-Tencor AIT-XP WAFER PARTICLE MEASUREMENT 300 mm 1 as is where is
93910 KLA-Tencor SP3 DARKFIELD WAFER INSPECTION SYSTEM 300 mm 01.06.2011 1 as is where is immediately
93911 KLA-Tencor UV1080 THIN FILM MEASUREMENT 200 mm 01.06.1999 1 as is where is
94219 KLA-Tencor Surfscan SP2 Darkfield Wafer Particle Detection System 300 mm 01.06.2007 1 as is where is
94461 KLA-Tencor 2132 (mainbody only) INSPECTION UNIT 150 mm,200 mm 01.06.1995 1 as is where is
94462 KLA-Tencor AIT Particle Review 200 mm 01.06.1997 1 as is where is
94463 KLA-Tencor Alpha Step 500 Profilometer 150 mm,200 mm 1 as is where is
94464 KLA-Tencor Archer AIM Overlay 200 mm 01.10.2004 1 as is where is immediately
94465 KLA-Tencor ARCHER XT+ Overlay 300 mm 01.06.2007 1 as is where is
94466 KLA-Tencor ARCHER XT+ Overlay 300 mm 01.06.2007 1 as is where is
94467 KLA-Tencor FLX-2320 Film stress measurement 150 mm,200 mm 01.06.1991 1 as is where is
94469 KLA-Tencor KLA 5100 OVERLAY REGISTRATION 150 mm,200 mm 1 as is where is
94470 KLA-Tencor KLA- Aleris CX FilmThickness Mesuarement 300 mm 01.06.2007 1 as is where is
94471 KLA-Tencor KLA- Aleris HT FilmThickness Mesuarement 300 mm 01.06.2005 1 as is where is
94472 KLA-Tencor PUMA 9130 Darkfield Wafer inspection system 300 mm 01.06.2006 1 as is where is immediately
94473 KLA-Tencor SP1 Tbi Unpatterned wafer inspection System 200 mm 01.02.2007 1 as is where is immediately
94571 KLA-Tencor AIT UV+ DARKFIELD PATTERN INSPECTION 300 mm 1 as is where is
94577 KLA-Tencor AIT-UV Dark Field Inspection 200 mm 01.01.2003 1 as is where is immediately
95290 KLA-Tencor Puma 9130 Darkfield Inspection 300mm 01.06.2007 1 as is where is
95291 KLA-Tencor Puma 9130 Darkfield Inspection 300mm 01.06.2007 1 as is where is
95819 KLA-Tencor SpectraShape 8660 Optical Review System 300 mm 01.10.2013 1 as is where is
95820 KLA-Tencor SpectraShape 8660 Optical Review System 300 mm 01.09.2013 1 as is where is
96049 KLA-Tencor 2365 Bright Field Inspection 300 mm or 200 mm 01.06.2006 1 inquire
96052 KLA-Tencor ASET F5 Film Thickness Measurement System 200 mm 1 inquire
96053 KLA-Tencor Spectra CD F5X w/CD Surface Characterization 200 mm 01.06.2002 1 inquire
96586 KLA-Tencor P6 Alpha Step Profileometer Up to 6 inch 01.05.2011 1 as is where is immediately
96998 KLA-Tencor Surfscan AIT 8010 Patterned Wafer Inspection 200 mm 01.06.1997 1 as is where is immediately
97018 KLA-Tencor OP2600 Thick Film Measurement 200 mm 01.06.1995 1 as is where is
97019 KLA-Tencor AIT 8010 Defect Inspection System 200 mm 01.06.1997 1 as is where is immediately
97020 KLA-Tencor VISEDGE_CV300 Etch Inspection 300 mm 01.06.2007 1 as is where is
97096 KLA-Tencor AIT XP+ Defect Inspection 01.06.1999 1 inquire
97097 KLA-Tencor Archer 10XT Overlay Measurement 01.06.2002 1 inquire
97450 KLA-Tencor SP1-TBI Wafer Particle Inspection System 300 mm 01.09.2004 1 as is where is immediately
97453 KLA-Tencor Archer 200 AIM Overlay Measurement System 300 mm 01.05.2010 1 as is where is immediately
97628 KLA-Tencor Archer 100 Overlay Measurement System 300 mm 1 as is where is
97629 KLA-Tencor Archer 100 Overlay Measurement System 300 mm 1 as is where is
97630 KLA-Tencor Archer 100 Overlay Measurement System 300 mm 1 as is where is
97631 KLA-Tencor Archer 100 Overlay Measurement System 300 mm 1 as is where is
97632 KLA-Tencor Archer 300 Overlay Measurement System 300 mm 1 as is where is
97633 KLA-Tencor Archer 300 Overlay Measurement System 300 mm 1 as is where is
97636 KLA-Tencor Archer 300+ AIM Overlay Measurement System 300 mm 01.11.2012 1 as is where is immediately
97638 KLA-Tencor Archer XT+ Overlay Measurement System 300 mm 1 as is where is
97641 KLA-Tencor eS32 E-beam Inspection 300 mm 1 as is where is
97642 KLA-Tencor Puma 9120 Darkfield Inspection 300 mm 1 as is where is
97643 KLA-Tencor Puma 9120 Darkfield Inspection 300 mm 1 as is where is
97644 KLA-Tencor SpectraCD 100 Film Thickness Measurement System 300 mm 1 as is where is
97645 KLA-Tencor SpectraShape 8660 Optical Review System 300 mm 1 as is where is
97646 KLA-Tencor SpectraShape 8660 Optical Review System 300 mm 1 as is where is
97647 KLA-Tencor SpectraShape 8660 Optical Review System 300 mm 1 as is where is
97648 KLA-Tencor SpectraShape 8660 Optical Review System 300 mm 1 as is where is
98002 KLA-Tencor ES31 ebeam inspection 300 mm 01.06.2011 1 as is where is
98003 KLA-Tencor ES32 ebeam inspection 300 mm 01.06.2005 1 as is where is
98031 KLA-Tencor FX-200 (Initialized) Thin Film Measurement 300 mm 1 as is where is
98032 KLA-Tencor SFX100 Thickness Measurement System 300 mm 01.06.2004 1 as is where is
98033 KLA-Tencor SP1 TBI Unpatterned wafer inspection System 200 mm 01.06.2000 1 as is where is
98034 KLA-Tencor SP2 (Parts Missing) Darkfield Wafer Particle Detection System 300 mm 01.06.2005 1 as is where is
98056 KLA-Tencor QUANTOX 64100 Wafer electrical measurement 300 mm 1 as is where is
98125 KLA-Tencor 3905 Broadband Plasma Patterned Wafer Inspection 300 mm 01.06.2016 1 as is where is
98126 KLA-Tencor 3905 Broadband Plasma Patterned Wafer Inspection 300 mm 01.06.2017 1 as is where is
98127 KLA-Tencor Aleris CX Film thickness measurements 300 mm 01.06.2007 1 as is where is
98128 KLA-Tencor Archer 300 AIM Overlay 300 mm 01.06.2012 1 as is where is
98129 KLA-Tencor ASET-F5x Thickness measurement 300 mm 01.06.2003 1 as is where is
98130 KLA-Tencor HRP-340 Profileometer 300 mm 01.06.2004 1 as is where is
98131 KLA-Tencor 5100 Overlay Measurement 200 mm 01.06.1995 1 as is where is
98132 KLA-Tencor Puma 9100 Dark Field Inspection 300 mm 01.06.2007 1 as is where is
98133 KLA-Tencor SP1 DLS Particle counter 200 mm, 300 mm 01.12.2004 1 as is where is
98134 KLA-Tencor Viper Macro Defect Detection System 300 mm 01.06.2010 1 as is where is
98209 KLA-Tencor 2365 Metrology and Inspection 200 mm 01.06.2006 1 inquire
98314 KLA-Tencor 6220 Surfscan darkfield inspection 200 mm 01.06.1995 1 inquire immediately
98344 KLA-Tencor 2810 METRO 300 mm 01.06.2008 1 inquire
98399 KLA-Tencor 2132 Inspection System 150 mm 1 as is where is
98400 KLA-Tencor AIT I Surfscan Patterned Wafer Surface Inspection 200 mm 2 as is where is
98401 KLA-Tencor P-2 Profiler 150 mm 1 as is where is
98402 KLA-Tencor P20H handler profiler 1 as is where is
98403 KLA-Tencor SFS-7600 Patterned Wafer Surface Inspection 150 mm 1 as is where is
98404 KLA-Tencor UV-1050 Thin Film Measurement System 150 mm 1 as is where is
98548 KLA-Tencor AIT XP Fusion Darkfield Pattern Inspection 200 mm 3 inquire
98549 KLA-Tencor AIT XP Darkfield Pattern Inspection 200 mm 1 inquire immediately
98550 KLA-Tencor SP1-DLS Darkfield Non-Pattern Inspection 300 mm 1 inquire
98551 KLA-Tencor ES31 SEM Defect Inspection 200 mm 1 as is where is immediately
98552 KLA-Tencor UV1050 Film Thickness Measurement 150 mm-200 mm 1 inquire
98553 KLA-Tencor UV1080 Film Thickness Measurement 150 mm-200 mm 1 inquire
98816 KLA-Tencor ARCHER10XT Overlay Measurement 300 mm 01.02.2005 1 as is where is
98817 KLA-Tencor ARCHERXT-PLUS Overlay Measurement 300 mm 01.06.2006 1 as is where is
98818 KLA-Tencor F5X Film Thickness Measurement System 300 mm 01.09.2001 1 as is where is immediately
98819 KLA-Tencor PUMA 2 Darkfield Inspection System 300 mm 01.02.2007 1 as is where is
98850 KLA-Tencor 6420 Surfscan wafer inspection system (Refurbished) 150 mm / 200 mm 01.08.1999 1 inquire immediately
98858 KLA-Tencor Surfscan 4500 Unpatterned Wafer Surface Inspection 1 inquire
98887 KLA-Tencor AWUS3110 METROLOGY 200mm 01.06.2001 1 as is where is
98910 KLA-Tencor 2135 Brightfield wafer defect inspection 1 as is where is
98911 KLA-Tencor 2915 Inspection System 1 as is where is
98912 KLA-Tencor AIT XP Defect Inspection 1 as is where is
98913 KLA-Tencor AIT XUV Darkfield Wafer Inspection 1 as is where is
98914 KLA-Tencor Spectra FX-1000 HT Thin film measurement system 1 as is where is
98915 KLA-Tencor Puma 9550i Wafer Inspection 1 as is where is
98916 KLA-Tencor Stealth 2350 Defect Inspection 1 as is where is
98917 KLA-Tencor TP 420XP Post Implant measurement 1 as is where is
98918 KLA-Tencor Viper 2401 After Develop Inspection Tool 1 as is where is
98969 KLA-Tencor 8100XP CD SEM 01.06.1998 1 as is where is immediately
99010 KLA-Tencor F5X Surface Characterization 300 mm 01.05.2003 1 as is where is
99011 KLA-Tencor PUMA2 Darkfield Inspection 01.06.2005 1 as is where is
99055 KLA-Tencor Candela CS20R Optical Surface Analyzer 01.04.2012 1 as is where is immediately
99174 KLA-Tencor Archer 100 Overlay Measurement System 1 as is where is
99175 KLA-Tencor Archer XT+ Overlay Measurement System 300mm 1 as is where is
99176 KLA-Tencor Archer XT+ Overlay Measurement System 300mm 1 as is where is
99177 KLA-Tencor P-170 Profilometer 1 as is where is
99178 KLA-Tencor Puma 9650 Darkfield Inspection 300mm 01.03.2014 1 as is where is
99417 KLA-Tencor AIT 1 Patterned Wafer Defect Inspection Tool 150 mm-200 mm 01.12.1996 1 as is where is immediately
99418 KLA-Tencor RS-55TCA Resisitivity Measurement 75mm - 200 mm 01.06.1996 1 inquire immediately
99439 KLA-Tencor 5200XP Overlay Measurement System 200 mm 1 as is where is immediately
99440 KLA-Tencor 5200XP Overlay Measurement System 200 mm 2 inquire immediately
99441 KLA-Tencor 5200 Overlay Measurement System 200 mm 2 inquire immediately
99808 KLA-Tencor CS20V Optical Surface Analyzer 01.08.2017 1 inquire immediately
99859 KLA-Tencor 5011 Overlay precision measurement system 1 inquire
99860 KLA-Tencor P10 Surface Profiler 150/200 mm 01.01.2000 1 inquire
99861 KLA-Tencor SFS-7600 Surfscan Patterned Wafer Inspection System 150/200 mm 01.01.1994 2 inquire
78700 KOKUSAI VR120S METRO 300 MM 01.06.2006 1 as is where is
97865 KRUSS KRUSSDSA100 CONTECT ANGLE MEASUREMENT 1 as is where is
94475 LASERTEC BGM300 Wafer Surface Analyzing and VIsualization System 200 mm 01.06.2008 1 as is where is
98057 Lasertech M8351 RESIST PATTERNED AND BLANK INSPECTION 1 as is where is
64259 Leica INS 3300 Microscope inspection station 200 mm 1 as is where is immediately
82685 LEICA UV Optic Scope QE 300 mm 01.06.2006 1 as is where is
86186 LEICA INS3300 Wafer Inspection Microscope 200 mm/300 mm 01.06.2003 1 as is where is
88268 Leica INM20 Microscope 200mm 1 as is where is
88269 Leica INS10 Microscope 200mm 1 as is where is
91486 LEICA INS 2000 REVIEW STATION 1 as is where is
91488 LEICA INS-3000 Wafer Defect Inspection ( UV / NT OS) 200 mm 01.06.2000 1 as is where is
91489 LEICA INS-3000 DUV Wafer Defect Inspection ( NT OS) 200 mm 01.06.2003 1 as is where is
91490 LEICA INS-3000 DUV Wafer Defect Inspection ( NT OS) 200 mm 01.06.2003 1 as is where is
91492 LEICA Leica INM100 Operation Manual Optical Microscope 1 as is where is
91493 LEICA Leica INM100 Operation Manual Optical Microscope 1 as is where is
91494 LEICA Leica INM100 Operation Manual Optical Microscope 1 as is where is
97106 Leica MZ 12.5 Stereomicroscope 1 as is where is
98920 Leica INM 300 Microscope 1 as is where is
99199 Leica Polylite SC Microscope 1 as is where is
86193 LEITZ MPV-SP Wafer Inspection Microscope 200 mm 1 as is where is
86420 Leitz MPV CD2 AMC Wafer inspection microscope 125 mm 1 as is where is
86421 Leitz MPV CD2 AMC Wafer inspection microscope 125 mm 1 as is where is
86423 Leitz MPV-CD Wafer inspection microscope 125 mm 1 as is where is
86426 Leitz INM100+INS10 Wafer inspection microscope 150 mm 1 as is where is
81917 MDC 986G Automatic CV Plotter 200 MM 01.06.2002 1 as is where is immediately
98020 MDC CMT-SR2000N Resistivity Measurement System 1 as is where is
99419 MDC CSM Automatic CV Plotter with RM-1600 Computer 1 as is where is immediately
99420 MDC CSM/16 Automatic CV Plotter with RM-1600 Computer 125 MM 1 as is where is immediately
98407 MDS CV92A Mapper 150 mm 1 as is where is
97701 Metryx Mentor OC23 Mass Measurement 1 as is where is
97702 Metryx Mentor OC23 Mass Measurement 1 as is where is
98005 MicoMetrics Precis Overlay measurement system 200 mm 01.06.2010 1 as is where is
99422 Minato MM-6600 Wafer Mobility Tester 2 as is where is
91113 MITUTOYO MP2000 METRO 200 mm 1 as is where is
97095 N&K 3000 Film Thickness Measurement 01.06.2003 1 inquire
71741 Nanofab Nano150 Ion Beam Lithography / Implanter System 150 mm 1 inquire immediately
82690 NANOMETRICS ORION METROLOGY 300 mm 01.06.2006 1 as is where is immediately
84832 NANOMETRICS NanoSpec 9000 Metrology Equipment, Wafer Inspection Equipment 200mm 1 as is where is immediately
86425 Nanometrics Nanospec AFT 210 surface inspection 125 mm 1 as is where is
88616 Nanometrics Caliper Mosaic Overlay Measurement System 300 MM 01.06.2005 1 as is where is immediately
88617 Nanometrics Caliper Mosaic Overlay 300 MM 01.06.2002 1 as is where is immediately
88618 Nanometrics Caliper Mosaic Overlay 300 MM 01.06.2009 1 as is where is immediately
90584 Nanometrics Trajectory T3 Film Thickness Measurement System 1 as is where is
90884 Nanometrics Tevet Trajectory T3 Film Thickness Measurement System 1 as is where is
91526 NANOMETRICS Caliper Mosaic Overlay 300 mm 01.06.2003 1 as is where is immediately
91527 NANOMETRICS Caliper Mosaic Overlay 300 mm 01.06.2010 1 as is where is immediately
91528 NANOMETRICS Caliper Mosaic Overlay 300 mm 01.09.2009 1 as is where is immediately
91529 NANOMETRICS Caliper Mosaic Overlay 300 mm 01.03.2010 1 as is where is immediately
91530 NANOMETRICS NANOMETRICS 9-7200-0195E Mask & Wafer Inspection 200 mm 1 as is where is
91531 NANOMETRICS NANOSPEC ATF210 Film Thickness Measurement 1 as is where is
91532 Nanometrics Q230 Wafer Inspection System 1 as is where is immediately
92041 Nanometrics 9010B Metrology 1 as is where is immediately
92818 Nanometrics NanoSpec 210 Metrology (Metrology) 125 mm 1 as is where is
93667 Nanometrics 8300X Thin Film Metrology Tool. 1 as is where is
95833 Nanometrics Atlas II+ Critical Dimension (CD) Measurement 300 mm 01.02.2015 1 as is where is
95834 Nanometrics Atlas II+ Critical Dimension (CD) Measurement 01.12.2014 1 as is where is
97024 Nanometrics CALIPER_MOSAIC Overlay Inspection 300 mm 01.07.2010 1 as is where is immediately
98153 Nanometrics Caliper Mosaic Overlay Measurement 300 mm 01.06.2011 1 as is where is
98154 Nanometrics Caliper Mosaic Overlay Measurement 300 mm 01.06.2009 1 as is where is
98155 Nanometrics Caliper Mosaic Overlay Measurement 300 mm 01.06.2009 1 as is where is
98289 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 01.06.2005 1 as is where is
98290 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 01.06.2005 1 as is where is
98291 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 01.06.2006 1 as is where is
98315 Nanometrics Nanospec 4150 Film Thickness Measurement 200 mm 01.06.1992 1 inquire immediately
98479 Nanometrics 9100 film thickness measurement 200mm 1 as is where is
98480 Nanometrics 8000X film thickness measurement 150mm 1 as is where is
98481 Nanometrics 8000Xse film thickness measurement 200mm 2 as is where is
98508 Nanometrics M6100 Film Thickness Measurement 200 mm 1 as is where is
98831 NANOMETRICS ATLAS Critical Dimension (CD) Measurement 300 mm 01.03.2005 1 as is where is
98832 NANOMETRICS ATLAS Critical Dimension (CD) Measurement 300 mm 01.11.2009 1 as is where is
99027 NANOMETRICS ATLAS Critical Dimension (CD) Measurement 01.06.2007 1 as is where is
99028 NANOMETRICS ATLAS Critical Dimension (CD) Measurement 300 mm 01.10.2006 1 as is where is
99029 NANOMETRICS ATLAS Critical Dimension (CD) Measurement 01.10.2006 1 as is where is
99030 NANOMETRICS ATLAS Critical Dimension (CD) Measurement 300 mm 01.02.2008 1 as is where is
99210 Nanometrics NanoSpec II Film Thickness Measurement System 1 as is where is
99211 Nanometrics NanoSpec/AFT 210 Film Thickness Measurement System 100mm 1 as is where is
99212 Napson NC-10 Resistivity Measurement 1 as is where is
99213 Napson NC-10 Resistivity Measurement 1 as is where is
99214 Napson NC-10 Resistivity Measurement 1 as is where is
99215 Napson NC-10 Resistivity Measurement 1 as is where is
99216 Napson NC-10 Resistivity Measurement 1 as is where is
99217 Napson NC-10 Resistivity Measurement 1 as is where is
97868 Newport 1830-C Optical Power Meter 1 as is where is
93103 NGR NGR2150 E-beam wafer inspection 300 MM 1 as is where is
91534 NICOLET Magna 410 ft-ir Spectrometer 01.06.1996 1 as is where is
91535 NICOLET Magna 560 ft-ir Spectrometer 01.06.1998 1 as is where is
98922 Nicolet ECO 3000 FTIR 1 as is where is
91536 Nidec im15 Wafer inspection 1 as is where is
82904 Nikcon AMI-2000 Surface Analyzer 01.06.2003 1 as is where is immediately
33708 NIKON Optiphot 88 Wafer Inspection Microscope 200 mm 1 as is where is immediately
64341 Nikon VMR 3020 Video Measuring System 01.01.2001 1 as is where is immediately
74827 Nikon MM40 MEASURING MICROSCOPE 200 mm 1 as is where is
76705 Nikon Opiphot Inspection Microscope with autoloader 200 mm 01.04.1992 1 as is where is immediately
88273 Nikon OPTIPHOT 200 Microscope 200mm 1 as is where is
91863 NIKON Optiphot 150 Wafer Inspection Microscope, 10X, 20X, 50X & 150X Objs., 150mm XY Stage 150 mm 1 as is where is immediately
91864 NIKON Optiphot 200 (For spares use) Wafer Inspection Microscope (Parts Tool Only) 200 mm 1 as is where is immediately
92616 Nikon OPTISTATION V Optical Review System 200mm 1 as is where is
92617 Nikon OPTISTATION V Optical Review System 200mm 1 as is where is
92707 NIKON VMR-C4540 FOUP INSPECTION 300 MM 01.06.2001 1 as is where is
92825 Nikon OPTIPHOT 66 Microscope (Metrology) 150 mm 1 as is where is
96395 Nikon Lasermark Overlap Inspection System Inspection System 200 - 300 mm 01.06.2013 1 as is where is immediately
96719 Nikon Optistation-3100 Wafer inspection microscope 1 inquire
96890 Nikon AMI-3000 Macro-Defect 300 mm 01.01.2006 1 as is where is
97708 Nikon AMI-3000 Macro-Defect 300 mm 1 as is where is
97712 Nikon OPTISTATION 3100 Microscope inspection station 300 mm 1 as is where is
97713 Nikon OPTISTATION 3100 Microscope inspection station 300 mm 1 as is where is
98923 Nikon Optiphot 200 Inspection Microscope 1 as is where is
99396 Nikon EpiPhot 200 Inspection Microscope 200 mm 1 as is where is immediately
99424 Nikon Optiphot 150 Wafer Inspection Microscope 150 mm 1 as is where is immediately
99425 Nikon Optistation 3 Microscope Wafer Inspection Satation with cassette to cassette handling 150 mm 1 as is where is immediately
99426 Nikon Optistation 3 Microscope Wafer Inspection Station with cassette to cassette handling 150 mm 1 as is where is immediately
99427 Nikon Optistation 3 Wafer Inspection System 150 mm 01.06.1994 1 as is where is immediately
99428 Nikon Optistation 3A Automatic Wafer Inspection Station 200 mm 01.06.1997 1 as is where is immediately
86646 Nitto HR8500 taper 1 as is where is
53146 NOVA 210 CMP ENDPOINT MEASUREMENT SYSTEMS 200 mm 5 as is where is immediately
69809 Olympus MX-50 Microscopes 3
86194 Olympus AL-2000 Wafer Inspection Microscope 200 mm 1 as is where is immediately
87492 OLYMPUS BH-BHM Wafer Inspection Microscope 150 mm 1 as is where is immediately
91538 OLYMPUS BH3-MJLA4-383D HIGH POWER SCOPE N/a 01.06.1995 1 as is where is
91539 OLYMPUS MX80 AF-F Microscope inspection station 150 / 200 mm 1 as is where is immediately
91540 Olympus Olympus AL3120F MICROSCOPE (ASYST300FL - 2L/P) 300 mm 1 as is where is
91541 Olympus Olympus AL3120F MICROSCOPE (TAS300(E3)- 2L/P) 300 mm 1 as is where is
91542 Olympus Olympus AL3120F MICROSCOPE (TAS300(E3)- 2L/P) 300 mm 01.06.2003 1 as is where is
91543 Olympus Olympus AL3120F MICROSCOPE (TAS300(E3) - 3L/P) 300 mm 01.06.2004 1 as is where is
91544 Olympus Olympus AL3120F-DUV MICROSCOPE (TAS300 - 2L/P) 300 mm 01.06.2003 1 as is where is
91545 Olympus Olympus AL3120F-DUV-EL MICROSCOPE (ASYST300FL - 2L/P) 300 mm 01.06.2002 1 as is where is
91546 Olympus Olympus AL3130F MICROSCOPE (KWF12 - 3L/P) 300 mm 01.06.2005 1 as is where is
91547 Olympus Olympus AL3130F MICROSCOPE (KWF12 - 3L/P) 300 mm 01.06.2005 1 as is where is
91548 Olympus Olympus AL3130F MICROSCOPE (KWF12 - 3L/P) 300 mm 01.06.2005 1 as is where is
91549 Olympus Olympus AL3130F MICROSCOPE (KWF12 - 3L/P) 300 mm 01.06.2006 1 as is where is
91550 Olympus Olympus AL3130F MICROSCOPE (TAS300(E4) - 3L/P) 300 mm 01.06.2007 1 as is where is
91551 Olympus Olympus AL3130F MICROSCOPE (TAS300(E4) - 3L/P) 300 mm 01.06.2007 1 as is where is
92820 Olympus BHMJL Microscope (Metrology) 150 mm 1 as is where is
92821 Olympus BHMJL Microscope (Metrology) 150 mm 1 as is where is
95118 OLYMPUS MX-610 Microscope 200mm - 300mm 1 3 months
96371 Olympus MX61L Wafer Inspection Microscope 300 mm 01.01.2013 1 as is where is immediately
96372 Olympus MX51 Wafer Inspection Microscope 150 mm 1 as is where is immediately
96604 OLYMPUS BX51M Optical Microscope Up to 6 inch 01.12.2010 3 as is where is
96605 OLYMPUS BX60M Low Magnification Optical Microscope (400x350) Assembly 01.02.2011 1 as is where is
96606 OLYMPUS MX51F High Magnification Optical Microscope Up to 6 inch 01.01.2011 4 as is where is
98970 Olympus Olympus AL3120F-DUV MICROSCOPE (TAS300 - 2L/P) 300 mm 01.06.2003 1 as is where is
99227 Olympus AL3110F Macro-Defect 300mm 1 as is where is
76711 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76712 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76713 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76714 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76715 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76716 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76717 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76718 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION 200 mm 01.12.1996 1 as is where is immediately
76719 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION WITH AUTOLOADER 200 mm 01.12.1996 1 as is where is immediately
76720 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION WITH AUTOLOADER 200 mm 01.12.1996 1 as is where is immediately
76721 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION WITH AUTOLOADER 200 mm 01.12.1996 1 as is where is immediately
76722 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION WITH AUTOLOADER 200 mm 01.12.1996 1 as is where is immediately
76723 OLYMPUS / ZEISS AL100 / AXIOTRON MICROSCOPE INSPECTION STATION WITH AUTOLOADER 200 mm 01.12.1996 1 as is where is immediately
83940 Philips CM30 Scanning Transmission Electron Microscope (TEM) Laboratory 01.06.1992 1 as is where is immediately
97003 Philips PHI 680 Auger Nanoprobe Laboratory 01.06.1998 1 as is where is immediately
95011 PHILLIPS IMPULSE 300B Thin-film measurement 200 MM / 300 MM 01.06.2004 1 as is where is
98929 Phillips TreX 610 X-ray Fluorescence Spectrometer 1 as is where is
91869 PLASMOS SD2000 Automatic Ellipsometer 200 mm 1 inquire immediately
99429 Plasmos SD 2004 Multi-Wavelength Ellipsometer 200 mm 1 as is where is immediately
78159 Plasmos / Yvon Jobin /Philips Analytical SD2000 Laser Ellipsometer 200 mm 01.08.2000 1 as is where is immediately
31246 PMS Liquitrack 776200 Non volatile residual Monitor facilities 01.11.1999 1 as is where is immediately
98424 Quantronix DRS 820 Inspection System 150 mm 3 as is where is
87792 QVI 600XP Process Control & Measurement 1 as is where is
91552 RAYTEX RXW-800 EDGE SCAN 200 mm 01.06.2008 1 as is where is
98489 Raytex RXW-0826SFIX-SMIF edge scanner 200mm 1 as is where is
79216 ReVera VeraFlex X-Ray Photoelectron Spectroscopy 300 mm 01.06.2008 1 inquire
97732 ReVera RVX1000 Film Thickness Measurement System 300 mm 01.11.2013 1 as is where is
97733 ReVera RVX1000 Film Thickness Measurement System 300 mm 1 as is where is
97734 ReVera RVX1000 Film Thickness Measurement System 300 mm 1 as is where is
11072 RIGAKU 3700H TXRF Wafer Analyzer 150-200 MM 01.04.1994 1 as is where is immediately
34320 Rigaku 3640 X-Ray Wafer Analyzer 200mm 1 as is where is immediately
35595 RIGAKU 3630 (For spares use) Xray Fluorescence Wafer/Disk Analyzer, Missing Xray Tube 01.06.1997 1 as is where is immediately
71780 Rigaku TXRF 300S X-Ray Diffractometer 150mm to 300 mm 01.01.2001 1 as is where is immediately
78701 RIGAKU XRF3630 TRF 200 mm 01.06.1995 1 as is where is
79217 Rigaku MFM65 XRR/XRF 300 mm 01.06.2009 1 inquire
80193 RIGAKU V300 TXRF inspection system 200 mm or 300 mm 01.12.2008 1 as is where is immediately
82910 RIGAKU 3630 Wafer Inspection Equipment 200 01.06.1996 1 as is where is immediately
83519 Rigaku 3640 X-ray fluoresence wafer / disk analyzer 200 mm 01.06.2000 1 as is all rebuilt immediately
87823 Rigaku MFM65 X-ray inspection (For Cu and Au quantification) 300 MM / 200 mm 01.10.2007 1 as is where is immediately
91554 RIGAKU XRF3630 Wafer/ Disk Analyzer 1 as is where is
91555 RIGAKU XRF3630 Wafer/ Disk Analyzer 1 as is where is
91556 RIGAKU XRF3630 Wafer/ Disk Analyzer 1 as is where is
91557 RIGAKU XRF3640 (Handle include) Wafer/ Disk Analyzer 200 mm 01.06.1995 1 as is where is
91558 RIGAKU XRF3640 (Handle not include) Wafer / Disk Analyzer / XRF 200 mm 01.06.1998 1 as is where is immediately
92691 Rigaku MFM65 In-Line Energy Dispersive X-Ray Fluoresence Wafer Inspection System 300 mm 01.06.2008 1 as is where is immediately
93104 RIGAKU 3640 X-Ray fluorescence wafer / Disk analyzer (AL,Fe,Ni,Si,Pt,Cr ) 125 mm 01.06.1999 1 as is where is
93912 RIGAKU XRF3640 X-ray fluoresence wafer / disk analyzer 200 mm 01.06.2000 1 as is where is immediately
96900 Rigaku MFM310 X-ray Reflectivity (XRR) 300 mm 1 as is where is
99243 Rigaku 3640 X-ray Fluorescence Spectrometer 1 as is where is
99430 Rigaku 3640 X-Ray Fluorescence Wafer/Disk Analyzer 200 mm 1 as is where is
72034 RUDOLPH MP200 METROLOGY 200 mm 01.06.2000 1 as is where is immediately
78702 RUDOLPH MP300 METRO 300 MM 01.06.2007 1 as is where is
78703 RUDOLPH MP300 METRO 300 MM 01.06.2009 1 as is where is
91116 RUDOLPH MP200 XCu Thin Film Measurement 200 mm 01.06.2001 1 as is where is
91559 RUDOLPH AXL_S Macro Inspection System 300 mm 01.06.2005 1 as is where is
91560 RUDOLPH AXL_S Macro Inspection System 300 mm 01.06.2005 1 as is where is
91561 RUDOLPH AXL_S Macro Inspection System 300 mm 01.06.2006 1 as is where is
91562 RUDOLPH MP1 300 Film thickness measurement 300 mm 01.06.2013 1 as is where is
91563 RUDOLPH Meta Pulse Film Metrology 200 mm 01.06.2005 1 as is where is
91564 RUDOLPH Meta Pulse 200 Film Metrology 200 mm 1 as is where is
91565 RUDOLPH MP1 300 Film Metrology 300 mm 1 as is where is
91566 Rudolph WS3840 3D Bump Metrology 300 mm 01.06.2010 1 as is where is
91567 RUDOLPH META PULSE 200 Surface Film Metrology 200 mm 01.06.2002 1 as is where is immediately
91822 RUDOLPH FE-7 ELLIPSOMETER 01.06.1997 1 as is where is
91915 Rudolph FE4 Ellipsometer 200 MM 01.06.1995 1 as is where is immediately
92709 Rudolph WV320 MACRO INSPECTION 300 MM 01.06.2006 1 as is where is immediately
92710 Rudolph WV320 MACRO INSPECTION 300 MM 01.06.2006 1 as is where is
94478 RUDOLPH FE-3 Focus Ellipsometer 200 mm 1 as is where is
94479 RUDOLPH FE-4D Focus Ellipsometer 200 mm 1 as is where is
95619 Rudolph WV320 MACRO INSPECTION 300 MM 01.06.2006 1 as is where is immediately
95621 RUDOLPH WV320 Metrology 300mm 1 as is where is immediately
96720 Rudolph NSX-105 macro defect inspection 1 inquire
97030 RUDOLPH METAPULSE-200 Thick Film Measurement 200 mm 01.06.2000 1 as is where is
97031 RUDOLPH METAPULSE-III 300XCU Thick Film Measurement 300 mm 01.06.2011 1 as is where is
97032 RUDOLPH RUDOLPH/FE-7 Ellipsometer 200 mm 01.06.1996 1 as is where is
97965 RUDOLPH NSX320 MACRO DEFECT INSPECTOR 300 MM 1 inquire
97966 RUDOLPH WHS MACRO DEFECT INSPECTOR 300 MM 1 inquire
98171 Rudolph NSX105C Macro Inspection 200 mm 01.06.2007 1 as is where is
98296 RUDOLPH Meta Pulse 300 Film thickness measurement 300 mm 1 as is where is
98297 RUDOLPH Meta Pulse 300 Film thickness measurement 300 mm 1 as is where is
98298 RUDOLPH MP1-300 Film thickness measurement 300 mm 01.06.2007 1 as is where is
98493 Rudolph MP200 Cu Film thickness measurement 200mm 4 as is where is
98494 Rudolph MP300 Cu Film thickness measurement 300mm 1 as is where is
98835 RUDOLPH AXI-S Macro Wafer Inspection 300 mm 01.07.2004 1 as is where is immediately
98836 RUDOLPH AXI-S930B Macro Defect Inspection System 300 mm 01.02.2007 1 as is where is
98837 RUDOLPH MP1-300XCU Film Thickness Measurement System 300 mm 01.05.2008 1 as is where is immediately
98838 RUDOLPH S3000A focused beam ellipsometry 300 mm 01.06.2012 1 as is where is
98902 RUDOLPH AXI-S Wafer Inspection 300 mm 01.06.2005 1 as is where is
99035 RUDOLPH AXI-S Macro Wafer Inspection 01.03.2004 1 as is where is
99036 RUDOLPH AXI-S Macro Defect Inspection System 01.05.2003 1 as is where is
99037 RUDOLPH S3000A focused beam ellipsometry 01.05.2012 1 as is where is
99244 Rudolph NSX 105D Macro-Defect 150mm 1 as is where is
99245 Rudolph NSX 105D Macro-Defect 1 as is where is
70089 Rudolph Technologies FE-VII Ellipsometer 200 mm 01.06.1996 1 as is where is immediately
98009 Rudolph Technologies AUGUST CV-9800 Carrier cassette msmt 01.06.2011 1 as is where is
88629 Rudolph/August NSX105 Macro Inspection 200 MM 01.06.2004 1 as is where is
88630 Rudolph/August NSX105 Macro Inspection 200 MM 01.06.2003 1 as is where is
91875 SDI SPV-300 Surface Photo Voltage Tester for up to 300mm Wafers up to 300 mm 01.06.1997 1 as is where is immediately
91873 SDI / Semilab FAaST-330 Dielectric Characterization Tool with COCOS & Epi-t for up to 300mm Wafers up to 300 mm 01.06.1999 1 as is where is immediately
91117 SEIKO CHIPS-200 metrology system 200 mm 1 as is where is
86199 SEIKO SEIKI SMI2200 SEM 200 mm 1 as is where is
91118 SELA MC100 metrology system 200 mm 1 as is where is
91119 SELA MC500 metrology system 200 mm 1 as is where is
82911 Semiconductor Diagnostics 3030 Surface Profiler 200 01.06.2012 1 as is where is immediately
93670 Semilab WT-2000PVN Multifunction Wafer Mapping Tool 1 as is where is
89974 Semix Tazmo SOG TR817UD-TM 150mm SOG 150mm 1 as is where is
95377 Sheffield Endeavor Coordinate Measurement Machine 9.12.7 1 as is where is immediately
82686 Shinsung Eng SGL-30 QE 300 mm 01.06.2011 1 as is where is
97877 Siemens 3 DIMESION MEA FAB-METROLOGY 01.06.2006 1 as is where is
74946 Sonoscan D6000 C-Sam 01.05.1996 1 as is where is immediately
83703 SOPRA SE 200 Ellipsometer 200 mm 1 as is where is
91877 SSM 470i CV Plotter 1 inquire
98012 SSM SSM 6100 CV IMPLANT-CV CURVES 300 mm 01.06.2000 1 as is where is
89975 TecHarmonic EHTVS Water Scrubber 1 as is where is
77049 Tecnai TF20 TEM Refurbished 01.06.2001 1 as is where is immediately
33722 TENCOR AlphaStep 300 Profilometer 1 inquire
93671 Tencor AS 500 Profilometer 1 as is where is
90594 Tescan FERA3 XMH FE SEM 01.06.2014 1 as is where is
61012 THERMA-WAVE OP 2600B OPTI-PROBE 200mm 01.01.1997 1 as is where is immediately
91825 THERMAWAVE OP-2600 METROLOGY 01.06.2002 1 as is where is
98437 Thermawave OP 2600B Inspection System 150/200 mm 2 as is where is
98438 Thermawave OP 5340 Inspection System 150/200/300 mm 1 as is where is
98439 Thermawave TP 630 Inspection System 150/200/300 mm 1 as is where is
98935 Thermawave TP 630 Ion Implant Measurement System 1 as is where is
99874 Thermawave OP2600 Film Thickness 150 mm 01.05.1995 1 inquire
91569 Thermo Fisher ECO 1000 FTIR System 200 mm 01.06.2000 1 as is where is immediately
98905 THERMO-FISHER ECO3000 Spectrometer FT-IR 300 mm 01.06.2005 1 as is where is
91570 Toray SP-500w Bump Height Measurement 300 mm 01.06.2010 1 as is where is
97887 TOYO SE-4000 Roughness Measurement 01.06.2008 1 as is where is
78309 Veeco VX310 Atomic Force Microscope 200 mm / 300 mm 01.06.2004 1 as is where is immediately
83586 Veeco Dimension X3D Model 340 Atomic Force Microscope 300 mm 01.11.2006 1 as is where is immediately
88284 Veeco Dimension 7000 Atomic Force Microscope (AFM) 200mm 1 as is where is
88375 Veeco D9000 Atomic Force Microscope 200 mm 01.06.1997 1 as is where is immediately
88631 Veeco Dimension X3D Atomic Force Microscope 300 MM 01.06.2006 1 as is where is
91823 VEECO X-200 PROFILOMETER 01.06.2006 1 as is where is
93672 Veeco Autoprobe Di CP-II Atomic Force Microscope.�Scanning probe microscope 1 as is where is
93674 Veeco Dimension X3D-DS Three Dimensional AFM Atomic Force Microscope Metrology System 1 as is where is
96382 Veeco D9000 Atomic Force Microscope 200 mm 01.06.2001 1 as is where is immediately
96383 Veeco D9000 Atomic Force Microscope 200 mm 01.06.2001 1 as is where is immediately
96404 Veeco NT3300 Non Contact Profilometer 6 or 8 inch 01.01.2004 1 as is all rebuilt immediately
97839 Veeco Dimension X1D Atomic Force Microscope (AFM) 300 mm 1 as is where is
97840 Veeco Dimension X1D Atomic Force Microscope (AFM) 300 mm 1 as is where is
98373 VEECO V220SI METRO 200 mm 01.06.2002 1 inquire
93675 Veeco Bruker Wyko SP9900 Large Format Optical Surface Profile 1 as is where is
93676 Veeco Digital Instruments Dimension 3100 Atomic Force Microscope 1 as is where is
36870 Veeco Wyko NT 3300 Profiler System 1
95009 WOOLAM HS-190 Scanning Monochromator 200 MM 1 as is where is
95010 WOOLAM M-2000 Spectroscopic Ellipsometer 200 MM 1 as is where is immediately
34091 Wyko NT 2000 Optical Profiling system 200 MM 1 inquire immediately
38870 Wyko NT1100 Optical Profiling system 1
66762 WYKO HD 2000 DPC Video Scope 1
71792 WYKO NT3300 Optical 3D profiling system 1
93677 Wyko BP2000W Bump Measurement Profiling System 1 as is where is
96646 WYKO NT3300 Profilometer 200mm 1 as is all rebuilt immediately
96964 XEI Scientific Evactron 10 Specimen Preparation Laboratory 1 as is where is
96965 XEI Scientific Evactron 10 Specimen Preparation Laboratory 1 as is where is
98217 YesTech YTV-B3 AOI Automated Optical Inspection System 01.06.2008 1 as is where is immediately
86716 ZEISS Axiotron Wafer inspection microscope 1 as is where is immediately
90595 Zeiss CDC32 Reticle Inspection 6 inch 01.06.2010 1 as is where is immediately
91388 Zeiss AXIOTRON INSPECTION MICROSCOPE 1 as is where is
91389 Zeiss AXIOTRON INSPECTION MICROSCOPE 1 as is where is
91390 Zeiss AXIOTON High Perpomance MICRO SCOPE N/a 01.06.2008 1 as is where is
97108 Zeiss Axiotech 100 HD Inspection Microscope 1 as is where is
97610 Zeiss Axiotron 300 Microscope 300 mm 1 as is where is
98211 Zeiss Ultra 55 FA SEMs/TEMs/Dual Beams 1 inquire
93679 Zygo SXM300 Multimode Scanning Probe Microscope 1 as is where is


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