FEI Quanta 200 3D Dual-Beam FIB SEM with Omniprobe, LMIS, BSD for Sale

The FEI Quanta 3D 200i is a combination of two systems:
1.A Scanning Electron Microscope (SEM) produces enlarged images of a variety of specimens achieving magnification over 100 000x providing high resolution imaging in a digital format.
2.A Focused Ion Beam (FIB) system is capable of fast and precise milling of the specimen material, revealing the structure under the surface layer, making cross sections, deposition layers, etc. The ion system produces high resolution images as well.
The integration of both systems yields a powerful analytical tool for obtaining any data from any sample in three dimensions. Users can switch between the two beams for quick and accurate navigation and milling. Convergence of the SEM and FIB at a short working distance allows precision “slice-and-view” cross-sectioning and analysis at high resolution. The instrument provides optimum throughput, resolution and automation. FIB/SEM instrument provides an expanded range of capabilities not possible with separate FIB or SEM tools:
1. High-resolution electron beam images of FIB cross sections without eroding the feature of interest.
2. Real-time cross-section images and videos with the electron beam during FIB milling.
3. Electron beam Drift Suppresion during FIB milling or imaging.
4. High resolution elemental microanalysis of defect cross sections.
5. Imaging of sample surfaces with the electron beam during navigation without erosion or implantation of FIB source ions.
6. Transmission Electron Microscopy (TEM) sample preparation with in situ conductive coating.

Includes: Omniprobe Model 100.7 In-situ Nanomanipulator
Platinum 20089-K Gas Injection System

FEI Gallium 1500LMIS Liquid Metal Ion Source Feb 2016 vintage
Back-Scatter Detector FEI p/n 4022.262.47862