SDI fabsurplus.com is pleased to announce the availability of the following listed used Seiko SFT-3200 Coating thickness Gauge Refurbished.
Please click on the "Get Quote" button at the end of the SFT-3200 description, if you'd like to get a quotation, photos and specifications of this Coating thickness Gauge Refurbished, and your request for this equipment will be forwarded to our SDI sales representatives automatically.
This Seiko SFT-3200 Coating thickness Gauge Refurbished is available for immediate sale.
Crating, refurbishment and delivery for this equipment can be quoted on request.
SDI ID: | 72930 |
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Manufacturer: | Seiko |
Model: | SFT-3200 |
Description: | Coating thickness Gauge Refurbished |
Version: | Assembly |
Vintage: | Inquire |
Quantity: | 1 |
Sales Condition: | inquire |
Lead Time: | immediately |
Sales Price: | Inquire |
Comments: | Measuring chamber: Sample chamber with 9”x 6.5” top plate for easy access and support Micro-focus, Be-window X-ray tube with 4000ml oil reservoir Proprietary, SS, brazed window proportional counter (for greater accuracy/repeatability and longevity) Automatic, motorized collimator 6sizes: Rnd – Shaped: 4, 8, 12, 20 mil Sq – Shaped: 1x16, 2x16 mil (X x Y) Precision, High-speed, X-Y-Z stage w/ 9.5 x 6 x 6” movement SFT System Analyzer: IBM Compatible system, Windows XP O/S, 17” monitor Microsoft Office software including Microsoft Excel & Microsoft Word Seiko X-Ray Station - 32 bit software for multi-tasking Software features: Advanced statistical processing functions automatically link to Microsoft Excel for seamless reporting in popular spreadsheet format Full color, 2D / 3D Surface profiles Advanced, spectrum analysis functions enables operator to “fine-tune” calibration to quickly maximize performance for a specific thickness range or alloy composition Calibration modes: Single layer, FP Thin film, Dual layer, tri-layer, Solution analysis, Simultaneous alloy thickness and composition Bulk Analysis: Fundamental Parameter &Calibration modes Automatic Adjust: Has a built in reference standard that automatically adjust the XRF, this feature virtually eliminates the need to recalibrate the instrument and can be manually set to your desired time schedule.
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Get Quote |
The data provided herein is not an offer capable of acceptance.
The information contained on this page is, to our knowledge and information, accurate, but it may contain errors and therefore we do not warrant the completeness or accuracy of the information contained on this page.
Any offer by you to purchase the equipment described on this page shall be subject to our standard terms and conditions of sale.
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