On behalf of our European Clients, we are pleased to offer the attached SMT and test Equipment. All Equipment is still installed and in excellent condition. Click on each table item for further details. Photographs and equipment specifications are available on request.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 9878 | ALESSI | REL 4500 | Manual Wafer Prober | 150 mm | 1 | inquire | immediately | |
| 11569 | Applied Materials | 0290-09018 Rev F | Heat Exchanger | FACILITIES | 01.04.1996 | 1 | inquire | immediately |
| 82861 | Applied Materials | ComPlus - 2T | Wafer Inspection Equipment | 200 | 2 | as is where is | immediately | |
| 67909 | Cambridge | S260 | Scanning Electron Microscope SEM | Laboratory Equipment | 01.06.1991 | 1 | as is where is | immediately |
| 79191 | Camtek | Condor 103PD | Post saw 2D inspection | 300 mm | 01.06.2013 | 1 | as is where is | immediately |
| 77289 | Creden | ISP 3000 | Wafer Inspection Equipment | N/A | 1 | as is where is | ||
| 77290 | Creden | ISP 3000 | Wafer Inspection Equipment | N/A | 1 | as is where is | ||
| 82161 | Cyberoptics | QX500 inline AOI | inspection machine | 01.06.2012 | 1 | as is where is | immediately | |
| 9916 | DAGE | BT 24 | Ball/Die Shear Tester | ASSEMBLY | 01.06.1994 | 1 | inquire | immediately |
| 32134 | Dage | 2400-TX | Wire Pull Ball Shear Tester | 1 | as is where is | immediately | ||
| 33623 | DAGE | BT-22PC | Microtester with 50gm or 200gm wire pull load cells | 1 | as is all rebuilt | 2 weeks | ||
| 33624 | DAGE | BT-23 | Microtester with LC200 Die Shear Load Cell | 1 | as is where is | |||
| 33626 | DAGE | 2400PC | Wire Bond pull Tester | 1 | as is where is | immediately | ||
| 73210 | Dage | BT-100 | Material Tester | 0 | as is where is | |||
| 77131 | Dage | 4000 | Bond Tester | 01.05.2008 | 1 | inquire | immediately | |
| 86111 | DAGE | BT-2400 | Bond Pull tester | 200 mm | 1 | as is where is | immediately | |
| 84442 | DAGE PRECISION TOOL | 4000HS | METROLOGY | 200 | 1 | as is where is | ||
| 79182 | EO Tech | CSM 3000 | Wafer laser mark machine | 300 mm | 01.06.2013 | 1 | as is where is | immediately |
| 71907 | Hamamatsu | C7103 | IC Back-side Lapping System | 200 mm | 1 | as is where is | immediately | |
| 70030 | Hitachi | Mi-Scope 10 | Scanning Acoustic Microscope (SAM) | ASSEMBLY | 01.06.1992 | 1 | as is where is | immediately |
| 78111 | HITACHI | FB2000A | FIB SEM | Laboratory | 01.06.2001 | 1 | as is where is | immediately |
| 78303 | Hitachi | Mi-scope CP11U | Scanning Acoustic Tomograph | Laboratory | 01.06.2001 | 1 | as is where is | immediately |
| 83585 | Hitachi | S5000H | Field Emission SEM | Laboratory | 1 | as is where is | immediately | |
| 77055 | ICOS | CI-9450 | Lead inspection Tray to Reel | 01.05.2004 | 1 | |||
| 56884 | Insidix | TDM | Topographic deformation measurement of JEDEC packages | assembly | 01.10.2008 | 1 | as is where is | immediately |
| 56841 | IRVINE OPTICAL | Ultrastation 3 | Macro Inspection Station | 1 | as is where is | |||
| 79192 | ISIS | SemDex 301-34 | Measurement of substrate layer thickness and total thickness variation | 300 mm | 01.06.2013 | 1 | as is where is | immediately |
| 83590 | JEOL | JSM 7401F | High Resolution FE SEM | 200 mm | 01.06.2006 | 1 | as is where is | immediately |
| 55327 | KLA TENCOR | 2135 | Metrology Equipment, Wafer Inspection Equipment | 200mm | 01.08.1997 | 1 | as is where is | |
| 15057 | KLA-Tencor | FT-750 | Film Thickness Inspection System | 1 | ||||
| 58866 | KLA-Tencor | Ultrapointe CRS-1010 | Mask Inspection System | 200 mm | 1 | as is where is | ||
| 84625 | L3 | PX107 | X-RAY Machine | N/A | 1 | as is where is | ||
| 77277 | Leica / Vistec | LDS 3300M | Wafer Inspection Equipment | 300 | 1 | as is where is | ||
| 77278 | Leica / Vistec | LDS 3300M | Wafer Inspection Equipment | 300 | 1 | as is where is | ||
| 86700 | Leica / Vistec | INM 200 | Wafer Inspection Microscopes | 200 mm | 01.01.2002 | 1 | as is where is | immediately |
| 86717 | Leica / Vistec | INM 200 | Wafer Inspection Microscopes | 200 mm | 01.01.2002 | 1 | as is where is | immediately |
| 60884 | LG Semicon | CLS-9002 | 3rd OPTICAL INSPECTION UNIT | 1 | as is where is | |||
| 67911 | Micro Instrument | PE9000A | Electromigration Oven | 01.06.2000 | 1 | as is where is | immediately | |
| 67912 | Micro Instrument | PE9000A | Electromigration Oven | 01.06.2000 | 1 | as is where is | immediately | |
| 81914 | Micromass | 386 | Mass Spectrometer | Laboratory | 1 | as is where is | immediately | |
| 82163 | Mirtec | MV-3L | inspection machine | 01.06.2007 | 1 | as is where is | immediately | |
| 82164 | Mirtec | MV-7Xi inline AOI | inspection machine | 01.06.2012 | 1 | as is where is | immediately | |
| 86466 | Mitutoyo | PJH3000 F | profile projector | assembly / SMT | 2 | as is where is | immediately | |
| 10038 | NIKON | Metaphot | Binocular Microscope with 5X, 20X, 40X & 100X BF/DF Obj. Lenses, Polaroid Camera | 125 mm | 1 | as is where is | immediately | |
| 61170 | NIKON | Optistation 3 | Automatic Wafer Inspection Systems for 150mm Wafers | 150 mm | 3 | as is where is | ||
| 70002 | Nikon | MX-50 | Microscope | 1 | ||||
| 79103 | Nikon | NEXIV VMR 3020 | Video Measuring Microscope | Assembly | 01.02.2011 | 1 | inquire | immediately |
| 15207 | Olympus | AL100-B8 | Programmable Wafer Loader | 200 mm | 9 | as is where is | immediately | |
| 70007 | Olympus | SZ30 | Stereo Microscope | 1 | as is where is | immediately | ||
| 82162 | Omron | VT-WIN II_L type | inspection machine | 01.06.2006 | 1 | as is where is | immediately | |
| 80292 | Oxford Instruments | X-Strata 980 | XRF machine for coating thickness and material composition analysis | Assembly | 1 | as is where is | immediately | |
| 84626 | PERKIN ELMER | X Ray | N/A | 1 | as is where is | |||
| 15061 | Philips | SPW-2800 | Xray Inspection System | 150 mm and 200 mm | 01.06.2000 | 1 | inquire | immediately |
| 73225 | Phoenix | PCBE Inspector | X-Ray inspection | assembly / SMT | 1 | as is where is | immediately | |
| 86340 | PHOENIX | NANOMEX 160 NF | X-RAY INSPECTION SYSTEM | assembly / SMT | 01.06.2006 | 1 | as is where is | immediately |
| 54532 | POTOP | PM530A | Mettalurgical Microscope | 1 | ||||
| 82167 | Saki | BF-Sirius | inspection machine | 01.06.2006 | 1 | as is where is | immediately | |
| 60881 | SEC | CL-3 | 3rd OPTICAL INSPECTION | 1 | as is where is | |||
| 60882 | SEC | CL-3 | 3rd OPTICAL INSPECTION | 1 | as is where is | |||
| 60883 | SEC | CL-3 | 3rd OPTICAL INSPECTION | 1 | as is where is | |||
| 78258 | Sonoscan | D6000 | C-SAM System | 01.05.2003 | 1 | as is where is | immediately | |
| 86475 | Sonoscan | D9000 | Scanning Acoustic Microscope | 1 | as is where is | immediately | ||
| 84627 | STI | AT8000 | Lead Inspect | N/A | 1 | as is where is | ||
| 82166 | TRI | TR7500DTL | Desktop AOI | 01.06.2007 | 1 | as is where is | immediately | |
| 83665 | TSC Memsys | TEI 5200 | Visual Inspection for LED production | LED | 01.04.2011 | 1 | as is where is | immediately |
| 56842 | VEECO | MS-35T | Turbopumped Leak Detector | 1 | as is where is | |||
| 79594 | Vision Engineering | Dynascope | Inspection Microscope | Assembly | 01.06.1995 | 1 | as is where is | immediately |
| 33628 | WENTWORTH LABS | HOP "Hands Off Probe" | Micropositioner, 2ea Available | 1 | as is where is | |||
| 79307 | Werth | Record 600-2 | Profile projector | assembly | 01.06.1981 | 1 | as is where is | immediately |
| 10139 | WILD | M420 | Makrozoom Microscope | 1 | as is where is | immediately | ||
| 73229 | Wyko | NT100 | Optical Profiling system | 1 | as is where is | |||
| 66702 | Zygo | NV 7200 | Microscope | Assembly | 1 | as is where is | immediately |