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SMT and Test Equipment EU facility featured closed bid - private treaty sale

On behalf of our European Clients, we are pleased to offer the attached SMT and test Equipment. All Equipment is still installed and in excellent condition. Click on each table item for further details. Photographs and equipment specifications are available on request.


SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
11569 Applied Materials 0290-09018 Rev F Heat Exchanger FACILITIES 01.04.1996 1 inquire immediately
87484 BAUSCH & LOMB StereoZoom 4 Microscope on Boom Stand, 0.7-3X with 10X W.F. Stereo Eyepieces 1 as is where is
87485 BAUSCH & LOMB StereoZoom 4 Microscope on Small Benchtop Stand, 0.7-3X with 15X W.F. Eyepieces 1 as is where is
87486 BAUSCH & LOMB StereoZoom 6 Plus Microscope, 0.67-4.0X with WF 10X/21 Eyepieces 1 as is where is
87487 BAUSCH & LOMB StereoZoom 7 Microscope on Boom Stand, 1-7X with 15X Eyepieces and 0.67X Adapter Lens 1 as is where is
67909 Cambridge S260 Scanning Electron Microscope SEM Laboratory Equipment 01.06.1991 1 as is where is immediately
79191 Camtek Condor 103PD Post saw 2D inspection 300 mm 01.06.2013 1 as is where is immediately
77131 Dage 4000 Bond Tester 01.05.2008 1 inquire immediately
86111 DAGE BT-2400 Bond Pull tester 200 mm 1 as is where is immediately
87488 DAGE BT23-PC Die Shear Tester with LC200 Die Shear Load Cell 1 as is where is
87489 DAGE PC-2400 Assembly Test Tool 1 as is where is
91826 DAGE BT22-PC Assembly Test Tool with 50gm Wire Pull Load and Rotating Hook ASSEMBLY 1 as is where is
91827 DAGE BT23 Die Shear Tester with LC200 Die Shear Load Cell, 2ea Available ASSEMBLY 1 as is where is
91828 DAGE BT24 Ball/Bump Shear Tester ASSEMBLY 1 as is where is
87490 DELTRONIC DH14-RR Profile Projector with 20X Objective Lens 1 as is where is
71907 Hamamatsu C7103 PC Controlled IC Back-side Lapping and Wafer Grinding System 200 mm and packages 01.10.2001 1 inquire immediately
78303 Hitachi Mi-scope CP11U Scanning Acoustic Tomograph Laboratory 01.06.2001 1 as is where is immediately
83585 Hitachi S5000H Field Emission SEM Laboratory 1 as is where is immediately
90690 ICOS CI-3050 Ball height Measurement ASSEMBLY 01.06.2006 1 as is where is immediately
79192 ISIS SemDex 301-34 Measurement of substrate layer thickness and total thickness variation 300 mm 01.06.2013 1 as is where is immediately
87627 JEOL JSM 6400 Scanning Electron Microscope 1 as is where is immediately
92312 KLA Tencor Surfscan SP2/XP Particle Measurement 01.06.2006 1 as is where is 6 months
15057 KLA-Tencor FT-750 Film Thickness Inspection System 1
87491 LEITZ 060.685.010 Toolmaker's Microscope with Tilting Head ,XYφ Stage, Transmitted Light Illumination 1 as is where is
60884 LG Semicon CLS-9002 3rd OPTICAL INSPECTION UNIT 1 as is where is
82163 Mirtec MV-3L inspection machine 01.06.2007 1 as is where is immediately
86466 Mitutoyo PJH3000 F profile projector assembly / SMT 01.06.2002 2 as is where is immediately
87492 OLYMPUS BH-BHM Wafer Inspection Microscope 1 as is where is
86340 PHOENIX NANOMEX 160 NF X-RAY INSPECTION SYSTEM assembly / SMT 01.06.2006 1 as is where is immediately
92003 Phoenix PCBA Inspector 100 X-Ray inspection machine for PCB assembly / SMT 01.10.2001 1 as is where is immediately
92075 Phoenix NanomeX 180 X-ray Inspection Assembly 01.06.2015 1 as is where is immediately
87493 ROYCE INSTRUMENTS System 550 100K Die Shear/Bond Pull Tester with RPTM 50g Wire Pull Load Cell, ASTM-200g, ASTM 2K, STM 20K & STM 100K Shear Test Load Cells, Collection of Workholders 1 as is where is
82167 Saki BF-Sirius inspection machine 01.06.2006 1 as is where is immediately
60881 SEC CL-3 3rd OPTICAL INSPECTION 1 as is where is
60882 SEC CL-3 3rd OPTICAL INSPECTION 1 as is where is
60883 SEC CL-3 3rd OPTICAL INSPECTION 1 as is where is
86475 Sonoscan D9000 Scanning Acoustic Microscope 1 as is where is immediately
83665 TSC Memsys TEI 5200 Visual Inspection for LED production LED 01.04.2011 1 as is where is immediately
56842 VEECO MS-35T Turbopumped Leak Detector 1 as is where is
79594 Vision Engineering Dynascope Inspection Microscope Assembly 01.06.1995 1 as is where is immediately
33628 WENTWORTH LABS HOP "Hands Off Probe" Micropositioner, 2ea Available 1 as is where is


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