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SMT and Test Equipment EU facility featured closed bid - private treaty sale

On behalf of our European Clients, we are pleased to offer the attached SMT and test Equipment. All Equipment is still installed and in excellent condition. Click on each table item for further details. Photographs and equipment specifications are available on request.


SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
9878 ALESSI REL 4500 Manual Wafer Prober 150 mm 1 inquire immediately
11569 Applied Materials 0290-09018 Rev F Heat Exchanger FACILITIES 01.04.1996 1 inquire immediately
87484 BAUSCH & LOMB StereoZoom 4 Microscope on Boom Stand, 0.7-3X with 10X W.F. Stereo Eyepieces 1 as is where is
87485 BAUSCH & LOMB StereoZoom 4 Microscope on Small Benchtop Stand, 0.7-3X with 15X W.F. Eyepieces 1 as is where is
87486 BAUSCH & LOMB StereoZoom 6 Plus Microscope, 0.67-4.0X with WF 10X/21 Eyepieces 1 as is where is
87487 BAUSCH & LOMB StereoZoom 7 Microscope on Boom Stand, 1-7X with 15X Eyepieces and 0.67X Adapter Lens 1 as is where is
67909 Cambridge S260 Scanning Electron Microscope SEM Laboratory Equipment 01.06.1991 1 as is where is immediately
79191 Camtek Condor 103PD Post saw 2D inspection 300 mm 01.06.2013 1 as is where is immediately
82161 Cyberoptics QX500 inline AOI inspection machine 01.06.2012 1 as is where is immediately
9916 DAGE BT 24 Ball/Die Shear Tester ASSEMBLY 01.06.1994 1 inquire immediately
33624 DAGE BT-23 Microtester with LC200 Die Shear Load Cell 1 as is where is
77131 Dage 4000 Bond Tester 01.05.2008 1 inquire immediately
86111 DAGE BT-2400 Bond Pull tester 200 mm 1 as is where is immediately
87488 DAGE BT23-PC Die Shear Tester with LC200 Die Shear Load Cell 1 as is where is
87489 DAGE PC-2400 Assembly Test Tool 1 as is where is
88348 Dage 4000 Series Bond Pull Tester 300mm 01.06.2007 1 as is where is
84442 DAGE PRECISION TOOL 4000HS METROLOGY 200 1 as is where is
87490 DELTRONIC DH14-RR Profile Projector with 20X Objective Lens 1 as is where is
79182 EO Tech CSM 3000 Wafer laser mark machine 300 mm 01.06.2013 1 as is where is immediately
71907 Hamamatsu C7103 PC Controlled IC Back-side Lapping and Wafer Grinding System 200 mm and packages 01.10.2001 1 inquire immediately
78111 HITACHI FB2000A FIB SEM Laboratory 01.06.2001 1 as is where is immediately
78303 Hitachi Mi-scope CP11U Scanning Acoustic Tomograph Laboratory 01.06.2001 1 as is where is immediately
83585 Hitachi S5000H Field Emission SEM Laboratory 1 as is where is immediately
56841 IRVINE OPTICAL Ultrastation 3 Macro Inspection Station 1 as is where is
79192 ISIS SemDex 301-34 Measurement of substrate layer thickness and total thickness variation 300 mm 01.06.2013 1 as is where is immediately
83590 JEOL JSM 7401F High Resolution FE SEM 200 mm 01.06.2006 1 as is where is immediately
87627 JEOL JSM 6400 Scanning Electron Microscope 1 as is where is immediately
15057 KLA-Tencor FT-750 Film Thickness Inspection System 1
86700 Leica / Vistec INM 200 Wafer Inspection Microscopes 200 mm 01.01.2002 1 as is where is immediately
86717 Leica / Vistec INM 200 Wafer Inspection Microscopes 200 mm 01.01.2002 1 as is where is immediately
87491 LEITZ 060.685.010 Toolmaker's Microscope with Tilting Head ,XYφ Stage, Transmitted Light Illumination 1 as is where is
60884 LG Semicon CLS-9002 3rd OPTICAL INSPECTION UNIT 1 as is where is
82163 Mirtec MV-3L inspection machine 01.06.2007 1 as is where is immediately
86466 Mitutoyo PJH3000 F profile projector assembly / SMT 01.06.2002 2 as is where is immediately
61170 NIKON Optistation 3 Automatic Wafer Inspection Systems for 150mm Wafers 150 mm 3 as is where is
86730 Nikon V12 Profile Projector assembly / SMT 1 as is where is
15207 Olympus AL100-B8 Programmable Wafer Loader 200 mm 9 as is where is immediately
87492 OLYMPUS BH-BHM Wafer Inspection Microscope 1 as is where is
87100 Oxford Instruments X-Strata 980 XRF machine for coating thickness and material composition analysis Assembly 01.06.2013 1 as is where is immediately
15061 Philips SPW-2800 Xray Inspection System 150 mm and 200 mm 01.06.2000 1 inquire immediately
86340 PHOENIX NANOMEX 160 NF X-RAY INSPECTION SYSTEM assembly / SMT 01.06.2006 1 as is where is immediately
87493 ROYCE INSTRUMENTS System 550 100K Die Shear/Bond Pull Tester with RPTM 50g Wire Pull Load Cell, ASTM-200g, ASTM 2K, STM 20K & STM 100K Shear Test Load Cells, Collection of Workholders 1 as is where is
82167 Saki BF-Sirius inspection machine 01.06.2006 1 as is where is immediately
60881 SEC CL-3 3rd OPTICAL INSPECTION 1 as is where is
60882 SEC CL-3 3rd OPTICAL INSPECTION 1 as is where is
60883 SEC CL-3 3rd OPTICAL INSPECTION 1 as is where is
86475 Sonoscan D9000 Scanning Acoustic Microscope 1 as is where is immediately
83665 TSC Memsys TEI 5200 Visual Inspection for LED production LED 01.04.2011 1 as is where is immediately
87494 UNITEK MIYACHI Micropull IV Bond Pull Tester, with B&L StereoZoom 4 Microscope 1 as is where is
56842 VEECO MS-35T Turbopumped Leak Detector 1 as is where is
79594 Vision Engineering Dynascope Inspection Microscope Assembly 01.06.1995 1 as is where is immediately
33628 WENTWORTH LABS HOP "Hands Off Probe" Micropositioner, 2ea Available 1 as is where is


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