On behalf of our European Clients, we are pleased to offer the attached SMT and test Equipment. All Equipment is still installed and in excellent condition. Click on each table item for further details. Photographs and equipment specifications are available on request.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 101860 | Advanced Technology Inc. | Cypress GEN2 | Lead Inspection Equipment | Assembly | 01.06.2016 | 1 | as is where is | |
| 92699 | AKROMETRIX | PS400 | Package warpage Measurement | ASSEMBLY | 01.06.2006 | 1 | as is where is | immediately |
| 87484 | BAUSCH & LOMB | StereoZoom 4 | Microscope on Boom Stand, 0.7-3X with 10X W.F. Stereo Eyepieces | 1 | as is where is | |||
| 87485 | BAUSCH & LOMB | StereoZoom 4 | Microscope on Small Benchtop Stand, 0.7-3X with 15X W.F. Eyepieces | 1 | as is where is | |||
| 87486 | BAUSCH & LOMB | StereoZoom 6 Plus | Microscope, 0.67-4.0X with WF 10X/21 Eyepieces | 1 | as is where is | |||
| 87487 | BAUSCH & LOMB | StereoZoom 7 | Microscope on Boom Stand, 1-7X with 15X Eyepieces and 0.67X Adapter Lens | 1 | as is where is | |||
| 98855 | Bruker | D8 Advance | X-ray Diffraction System | Laboratory | 1 | inquire | ||
| 95922 | Chatillon | TCD Series TCD 1234 | Force Tester | assembly / SMT | 1 | as is where is | immediately | |
| 93986 | Comet | FOX 225.25 | PCB X-Ray inspection system | assembly / SMT | 01.03.2006 | 1 | inquire | immediately |
| 94370 | Cyberscan | CT350T | Dual non-contact double-sided optical profilometer | 200-300 MM | 01.06.2015 | 1 | as is where is | immediately |
| 77131 | Dage | 4000 | Bond Tester | 01.05.2008 | 1 | inquire | immediately | |
| 87488 | DAGE | BT23-PC | Die Shear Tester with LC200 Die Shear Load Cell | Assembly | 01.06.1996 | 1 | as is where is | immediately |
| 87489 | DAGE | 2400PC | Wire pull tester | Assembly | 1 | as is where is | immediately | |
| 91827 | DAGE | BT23PC | Die Shear Tester with LC200 Die Shear Load Cell, 2ea Available | ASSEMBLY | 1 | as is where is | 2 weeks | |
| 91828 | DAGE | BT24 | Ball/Bump Shear Tester | ASSEMBLY | 01.06.1994 | 1 | as is where is | immediately |
| 99410 | Dage | 2400PC | Wire Pull Tester with die shear load cell | Assembly | 01.06.1995 | 1 | as is where is | immediately |
| 99411 | Dage | BT23 | Die Shear Tester | Assembly | 01.06.1990 | 1 | as is where is | immediately |
| 99412 | Dage | MCT 22 | Wire Bond Pull Tester | Assembly | 01.06.1995 | 1 | as is where is | immediately |
| 102487 | DAGE | 4000 Plus | Multifunction Bondtester | 1 | as is where is | immediately | ||
| 87490 | DELTRONIC | DH14-RR | Profile Projector with 20X Objective Lens | 1 | as is where is | |||
| 102953 | DISCO | EAD6750+ SEMHAWK HANDLER | Package Saw | ASSEMBLY | 01.06.2013 | 1 | as is where is | |
| 102957 | FSM | AQUAFLEX | 4-POINT BENDING | ASSEMBLY | 01.06.2007 | 1 | as is where is | |
| 71907 | Hamamatsu | C7103 | PC Controlled IC Back-side Lapping and Wafer Grinding System | 200 mm and packages | 01.10.2001 | 1 | as is where is | immediately |
| 78303 | Hitachi | Mi-scope CP11U | Scanning Acoustic Tomograph | Laboratory | 01.06.2001 | 1 | as is where is | immediately |
| 83585 | Hitachi | S5000H | Field Emission SEM | Laboratory | 1 | as is where is | immediately | |
| 95722 | HITACHI | S9300 | SEM - CD (CRITICAL DIMENSION) | 300 mm | 01.06.2005 | 1 | as is all rebuilt | immediately |
| 102241 | ICOS | CI-5150 | Inspection System | 1 | as is where is | |||
| 101859 | INVALID[Advanced Technology Inc.] | Cypress | Lead Inspection Equipment | Assembly | 01.06.2016 | 1 | as is where is | |
| 87627 | JEOL | JSM 6400 | Scanning Electron Microscope | 1 | as is where is | immediately | ||
| 97935 | KLA-Tencor | CI-T53P | COMPONENT INSPECTOR | ASSEMBLY | 1 | inquire | ||
| 102497 | KLA-Tencor | T830 | Inspection System | 01.08.2015 | 1 | as is where is | ||
| 82163 | Mirtec | MV-3L | inspection machine | 01.06.2007 | 1 | as is where is | immediately | |
| 86466 | Mitutoyo | PJH3000 F | profile projector | assembly / SMT | 01.06.2002 | 2 | as is where is | immediately |
| 96009 | MITUTOYO | PJH30005FT2100 | PROFILE PROJECTOR | ASSEMBLY | 01.06.1998 | 1 | as is where is | |
| 97945 | MITUTOYO | QS250Z1J | 3D MEASURING MACHINE | ASSEMBLY | 1 | inquire | ||
| 102973 | MITUTOYO | PJ-H30005F | PROFILE PROJECTOR | ASSEMBLY | 01.06.2002 | 1 | as is where is | |
| 99330 | Nanofocus | Micro-sprint | 3d inspection system with handler | Assembly | 01.06.2014 | 1 | as is where is | immediately |
| 98007 | Nikon | VMR-C4540 | Microscope | 1 | as is where is | |||
| 94401 | Oxford | CMI 950 | Xray fluorescence spectrometer | 01.06.2000 | 1 | as is where is | ||
| 100044 | Panalytical | X-PERT | X-RAY DIFFRACTOMETER | 1 | as is where is | immediately | ||
| 86340 | PHOENIX | NANOMEX 160 NF | X-RAY INSPECTION SYSTEM | assembly / SMT | 01.06.2006 | 1 | as is where is | immediately |
| 100648 | Phoenix | X-Ray | Inspection System | Assembly | 1 | as is where is | ||
| 100649 | Phoenix | X-Ray PBGA | Inspection System for PCBs | Assembly | 1 | inquire | immediately | |
| 102338 | Phoenix | micromex 160 | X-Ray inspection system | - | 01.06.2007 | 1 | as is where is | |
| 102339 | Phoenix | Micromex SE 160T | X-Ray inspection system | 300 mm | 01.06.2009 | 1 | as is where is | |
| 100717 | Shimadzu | SMX-160CT-SV3S | X-Ray Analysis System | Assembly | 1 | as is where is | immediately | |
| 102981 | SONIX | QUANTUM-350 | Scanning Acoustic Microscope | ASSEMBLY | 01.06.2005 | 1 | as is where is | |
| 86475 | Sonoscan | D9000 | Scanning Acoustic Microscope | 1 | as is where is | immediately | ||
| 100650 | Sonoscan | C-SAM D6000 | Acoustic Microscope | Assembly | 1 | as is where is | ||
| 100686 | UNI-HITE | XVA160 | X-ray 3D-CT System | ASSEMBLY | 1 | as is where is | ||
| 56842 | VEECO | MS-35T | Turbopumped Leak Detector | 1 | as is where is | |||
| 79594 | Vision Engineering | Dynascope | Inspection Microscope | Assembly | 01.06.1995 | 1 | as is where is | immediately |
| 33628 | WENTWORTH LABS | HOP "Hands Off Probe" | Micropositioner, 2ea Available | 1 | as is where is |