On behalf of our European Clients, we are pleased to offer the attached SMT and test Equipment. All Equipment is still installed and in excellent condition. Click on each table item for further details. Photographs and equipment specifications are available on request.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 9878 | ALESSI | REL 4500 | Manual Wafer Prober | 150 mm | 1 | inquire | immediately | |
| 11569 | Applied Materials | 0290-09018 Rev F | Heat Exchanger | FACILITIES | 01.04.1996 | 1 | inquire | immediately |
| 87484 | BAUSCH & LOMB | StereoZoom 4 | Microscope on Boom Stand, 0.7-3X with 10X W.F. Stereo Eyepieces | 1 | as is where is | |||
| 87485 | BAUSCH & LOMB | StereoZoom 4 | Microscope on Small Benchtop Stand, 0.7-3X with 15X W.F. Eyepieces | 1 | as is where is | |||
| 87486 | BAUSCH & LOMB | StereoZoom 6 Plus | Microscope, 0.67-4.0X with WF 10X/21 Eyepieces | 1 | as is where is | |||
| 87487 | BAUSCH & LOMB | StereoZoom 7 | Microscope on Boom Stand, 1-7X with 15X Eyepieces and 0.67X Adapter Lens | 1 | as is where is | |||
| 67909 | Cambridge | S260 | Scanning Electron Microscope SEM | Laboratory Equipment | 01.06.1991 | 1 | as is where is | immediately |
| 79191 | Camtek | Condor 103PD | Post saw 2D inspection | 300 mm | 01.06.2013 | 1 | as is where is | immediately |
| 9916 | DAGE | BT 24 | Ball/Die Shear Tester | ASSEMBLY | 01.06.1994 | 1 | inquire | immediately |
| 33624 | DAGE | BT-23 | Microtester with LC200 Die Shear Load Cell | 1 | as is where is | |||
| 77131 | Dage | 4000 | Bond Tester | 01.05.2008 | 1 | inquire | immediately | |
| 86111 | DAGE | BT-2400 | Bond Pull tester | 200 mm | 1 | as is where is | immediately | |
| 87488 | DAGE | BT23-PC | Die Shear Tester with LC200 Die Shear Load Cell | 1 | as is where is | |||
| 87489 | DAGE | PC-2400 | Assembly Test Tool | 1 | as is where is | |||
| 88348 | Dage | 4000 Series | Bond Pull Tester | 300mm | 01.06.2007 | 1 | as is where is | immediately |
| 89970 | DAGE | 2400TX/PC | Wire Pull/Ball Shear/Die Shear Tester | Assembly | 1 | as is where is | 1 month | |
| 87490 | DELTRONIC | DH14-RR | Profile Projector with 20X Objective Lens | 1 | as is where is | |||
| 79182 | EO Tech | CSM 3000 | Wafer laser mark machine | 300 mm | 01.06.2013 | 1 | as is where is | immediately |
| 71907 | Hamamatsu | C7103 | PC Controlled IC Back-side Lapping and Wafer Grinding System | 200 mm and packages | 01.10.2001 | 1 | inquire | immediately |
| 78111 | HITACHI | FB2000A | FIB SEM | Laboratory | 01.06.2001 | 1 | as is where is | immediately |
| 78303 | Hitachi | Mi-scope CP11U | Scanning Acoustic Tomograph | Laboratory | 01.06.2001 | 1 | as is where is | immediately |
| 83585 | Hitachi | S5000H | Field Emission SEM | Laboratory | 1 | as is where is | immediately | |
| 56841 | IRVINE OPTICAL | Ultrastation 3 | Macro Inspection Station | 1 | as is where is | |||
| 79192 | ISIS | SemDex 301-34 | Measurement of substrate layer thickness and total thickness variation | 300 mm | 01.06.2013 | 1 | as is where is | immediately |
| 83590 | JEOL | JSM 7401F | High Resolution FE SEM | 200 mm | 01.06.2006 | 1 | as is where is | immediately |
| 87627 | JEOL | JSM 6400 | Scanning Electron Microscope | 1 | as is where is | immediately | ||
| 15057 | KLA-Tencor | FT-750 | Film Thickness Inspection System | 1 | ||||
| 87491 | LEITZ | 060.685.010 | Toolmaker's Microscope with Tilting Head ,XYφ Stage, Transmitted Light Illumination | 1 | as is where is | |||
| 60884 | LG Semicon | CLS-9002 | 3rd OPTICAL INSPECTION UNIT | 1 | as is where is | |||
| 82163 | Mirtec | MV-3L | inspection machine | 01.06.2007 | 1 | as is where is | immediately | |
| 86466 | Mitutoyo | PJH3000 F | profile projector | assembly / SMT | 01.06.2002 | 2 | as is where is | immediately |
| 61170 | NIKON | Optistation 3 | Automatic Wafer Inspection Systems for 150mm Wafers | 150 mm | 3 | as is where is | ||
| 86730 | Nikon | V12 | Profile Projector | assembly / SMT | 1 | as is where is | ||
| 15207 | Olympus | AL100-B8 | Programmable Wafer Loader | 200 mm | 9 | as is where is | immediately | |
| 87492 | OLYMPUS | BH-BHM | Wafer Inspection Microscope | 1 | as is where is | |||
| 87100 | Oxford Instruments | X-Strata 980 | XRF machine for coating thickness and material composition analysis | Assembly | 01.06.2013 | 1 | as is where is | immediately |
| 15061 | Philips | SPW-2800 | Xray Inspection System | 150 mm and 200 mm | 01.06.2000 | 1 | inquire | immediately |
| 86340 | PHOENIX | NANOMEX 160 NF | X-RAY INSPECTION SYSTEM | assembly / SMT | 01.06.2006 | 1 | as is where is | immediately |
| 87493 | ROYCE INSTRUMENTS | System 550 100K | Die Shear/Bond Pull Tester with RPTM 50g Wire Pull Load Cell, ASTM-200g, ASTM 2K, STM 20K & STM 100K Shear Test Load Cells, Collection of Workholders | 1 | as is where is | |||
| 82167 | Saki | BF-Sirius | inspection machine | 01.06.2006 | 1 | as is where is | immediately | |
| 60881 | SEC | CL-3 | 3rd OPTICAL INSPECTION | 1 | as is where is | |||
| 60882 | SEC | CL-3 | 3rd OPTICAL INSPECTION | 1 | as is where is | |||
| 60883 | SEC | CL-3 | 3rd OPTICAL INSPECTION | 1 | as is where is | |||
| 86475 | Sonoscan | D9000 | Scanning Acoustic Microscope | 1 | as is where is | immediately | ||
| 89985 | SONOSCAN | D9000 | Scanning Acoustic Microscope | 300 MM | 01.08.2004 | 1 | as is where is | immediately |
| 83665 | TSC Memsys | TEI 5200 | Visual Inspection for LED production | LED | 01.04.2011 | 1 | as is where is | immediately |
| 87494 | UNITEK MIYACHI | Micropull IV | Bond Pull Tester, with B&L StereoZoom 4 Microscope | 1 | as is where is | |||
| 56842 | VEECO | MS-35T | Turbopumped Leak Detector | 1 | as is where is | |||
| 79594 | Vision Engineering | Dynascope | Inspection Microscope | Assembly | 01.06.1995 | 1 | as is where is | immediately |
| 33628 | WENTWORTH LABS | HOP "Hands Off Probe" | Micropositioner, 2ea Available | 1 | as is where is |