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SMT and Test Equipment EU facility featured closed bid - private treaty sale

On behalf of our European Clients, we are pleased to offer the attached SMT and test Equipment. All Equipment is still installed and in excellent condition. Click on each table item for further details. Photographs and equipment specifications are available on request.


SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
9878 ALESSI REL 4500 Manual Wafer Prober 150 mm 1 inquire immediately
11569 Applied Materials 0290-09018 Rev F Heat Exchanger FACILITIES 01.04.1996 1 inquire immediately
82861 Applied Materials ComPlus - 2T Wafer Inspection Equipment 200 2 as is where is immediately
67909 Cambridge S260 Scanning Electron Microscope SEM Laboratory Equipment 01.06.1991 1 as is where is immediately
79191 Camtek Condor 103PD Post saw 2D inspection 300 mm 01.06.2013 1 as is where is immediately
77289 Creden ISP 3000 Wafer Inspection Equipment N/A 1 as is where is
77290 Creden ISP 3000 Wafer Inspection Equipment N/A 1 as is where is
82161 Cyberoptics QX500 inline AOI inspection machine 01.06.2012 1 as is where is immediately
9916 DAGE BT 24 Ball/Die Shear Tester ASSEMBLY 01.06.1994 1 inquire immediately
32134 Dage 2400-TX Wire Pull Ball Shear Tester 1 as is where is immediately
33623 DAGE BT-22PC Microtester with 50gm or 200gm wire pull load cells 1 as is all rebuilt 2 weeks
33624 DAGE BT-23 Microtester with LC200 Die Shear Load Cell 1 as is where is
33626 DAGE 2400PC Wire Bond pull Tester 1 as is where is immediately
73209 Dage 2400 PC Bond Pull Tester ASSEMBLY 01.06.1997 1 as is where is immediately
73210 Dage BT-100 Material Tester 0 as is where is
77131 Dage 4000 Bond Tester 01.05.2008 1 inquire immediately
86111 DAGE BT-2400 Bond Pull tester 200 mm 1 as is where is immediately
79182 EO Tech CSM 3000 Wafer laser mark machine 300 mm 01.06.2013 1 as is where is immediately
71907 Hamamatsu C7103 IC Back-side Lapping System 200 mm 1 as is where is immediately
70030 Hitachi Mi-Scope 10 Scanning Acoustic Microscope (SAM) ASSEMBLY 01.06.1992 1 as is where is immediately
78111 HITACHI FB2000A FIB SEM Laboratory 01.06.2001 1 as is where is immediately
78303 Hitachi Mi-scope CP11U Scanning Acoustic Tomograph Laboratory 01.06.2001 1 as is where is immediately
83585 Hitachi S5000H Field Emission SEM Laboratory 1 as is where is immediately
77055 ICOS CI-9450 Lead inspection Tray to Reel 01.05.2004 1
56884 Insidix TDM Topographic deformation measurement of JEDEC packages assembly 01.10.2008 1 as is where is immediately
56841 IRVINE OPTICAL Ultrastation 3 Macro Inspection Station 1 as is where is
79192 ISIS SemDex 301-34 Measurement of substrate layer thickness and total thickness variation 300 mm 01.06.2013 1 as is where is immediately
83590 JEOL JSM 7401F High Resolution FE SEM 200 mm 01.06.2006 1 as is where is immediately
55327 KLA TENCOR 2135 Metrology Equipment, Wafer Inspection Equipment 200mm 01.08.1997 1 as is where is
15057 KLA-Tencor FT-750 Film Thickness Inspection System 1
58866 KLA-Tencor Ultrapointe CRS-1010 Mask Inspection System 200 mm 1 as is where is
84625 L3 PX107 X-RAY Machine N/A 1 as is where is
77277 Leica / Vistec LDS 3300M Wafer Inspection Equipment 300 1 as is where is
77278 Leica / Vistec LDS 3300M Wafer Inspection Equipment 300 1 as is where is
60884 LG Semicon CLS-9002 3rd OPTICAL INSPECTION UNIT 1 as is where is
67911 Micro Instrument PE9000A Electromigration Oven 01.06.2000 1 as is where is immediately
67912 Micro Instrument PE9000A Electromigration Oven 01.06.2000 1 as is where is immediately
81914 Micromass 386 Mass Spectrometer Laboratory 1 as is where is immediately
82163 Mirtec MV-3L inspection machine 01.06.2007 1 as is where is immediately
82164 Mirtec MV-7Xi inline AOI inspection machine 01.06.2012 1 as is where is immediately
10038 NIKON Metaphot Binocular Microscope with 5X, 20X, 40X & 100X BF/DF Obj. Lenses, Polaroid Camera 125 mm 1 as is where is immediately
61170 NIKON Optistation 3 Automatic Wafer Inspection Systems for 150mm Wafers 150 mm 3 as is where is
70002 Nikon MX-50 Microscope 1
79103 Nikon NEXIV VMR 3020 Video Measuring Microscope Assembly 01.02.2011 1 inquire immediately
15207 Olympus AL100-B8 Programmable Wafer Loader 200 mm 9 as is where is immediately
70007 Olympus SZ30 Stereo Microscope 1 as is where is immediately
82162 Omron VT-WIN II_L type inspection machine 01.06.2006 1 as is where is immediately
80292 Oxford Instruments X-Strata 980 XRF machine for coating thickness and material composition analysis Assembly 1 as is where is immediately
84626 PERKIN ELMER X Ray N/A 1 as is where is
15061 Philips SPW-2800 Xray Inspection System 150 mm and 200 mm 01.06.2000 1 inquire immediately
73225 Phoenix PCBE Inspector X-Ray inspection assembly / SMT 1 as is where is immediately
54532 POTOP PM530A Mettalurgical Microscope 1
82167 Saki BF-Sirius inspection machine 01.06.2006 1 as is where is immediately
60881 SEC CL-3 3rd OPTICAL INSPECTION 1 as is where is
60882 SEC CL-3 3rd OPTICAL INSPECTION 1 as is where is
60883 SEC CL-3 3rd OPTICAL INSPECTION 1 as is where is
78258 Sonoscan D6000 C-SAM System 01.05.2003 1 as is where is immediately
84627 STI AT8000 Lead Inspect N/A 1 as is where is
82166 TRI TR7500DTL Desktop AOI 01.06.2007 1 as is where is immediately
83665 TSC Memsys TEI 5200 Visual Inspection for LED production LED 01.04.2011 1 as is where is immediately
56842 VEECO MS-35T Turbopumped Leak Detector 1 as is where is
79594 Vision Engineering Dynascope Inspection Microscope Assembly 01.06.1995 1 as is where is immediately
33628 WENTWORTH LABS HOP "Hands Off Probe" Micropositioner, 2ea Available 1 as is where is
79307 Werth Record 600-2 Profile projector assembly 01.06.1981 1 as is where is immediately
10139 WILD M420 Makrozoom Microscope 1 as is where is immediately
73229 Wyko NT100 Optical Profiling system 1 as is where is
66702 Zygo NV 7200 Microscope Assembly 1 as is where is immediately


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