On behalf of our European Clients, we are pleased to offer the attached SMT and test Equipment. All Equipment is still installed and in excellent condition. Click on each table item for further details. Photographs and equipment specifications are available on request.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 92699 | AKROMETRIX | PS400 | Package warpage Measurement | ASSEMBLY | 01.06.2006 | 1 | as is where is | immediately |
| 87484 | BAUSCH & LOMB | StereoZoom 4 | Microscope on Boom Stand, 0.7-3X with 10X W.F. Stereo Eyepieces | 1 | as is where is | |||
| 87485 | BAUSCH & LOMB | StereoZoom 4 | Microscope on Small Benchtop Stand, 0.7-3X with 15X W.F. Eyepieces | 1 | as is where is | |||
| 87486 | BAUSCH & LOMB | StereoZoom 6 Plus | Microscope, 0.67-4.0X with WF 10X/21 Eyepieces | 1 | as is where is | |||
| 87487 | BAUSCH & LOMB | StereoZoom 7 | Microscope on Boom Stand, 1-7X with 15X Eyepieces and 0.67X Adapter Lens | 1 | as is where is | |||
| 98855 | Bruker | D8 Advance | X-ray Diffraction System | Laboratory | 1 | inquire | ||
| 95922 | Chatillon | TCD Series TCD 1234 | Force Tester | assembly / SMT | 1 | as is where is | immediately | |
| 93986 | Comet | FOX 225.25 | PCB X-Ray inspection system | assembly / SMT | 01.03.2006 | 1 | inquire | immediately |
| 77131 | Dage | 4000 | Bond Tester | 01.05.2008 | 1 | inquire | immediately | |
| 87488 | DAGE | BT23-PC | Die Shear Tester with LC200 Die Shear Load Cell | 1 | as is where is | |||
| 87489 | DAGE | PC-2400 | Assembly Test Tool | 1 | as is where is | |||
| 91827 | DAGE | BT23 | Die Shear Tester with LC200 Die Shear Load Cell, 2ea Available | ASSEMBLY | 1 | as is where is | ||
| 91828 | DAGE | BT24 | Ball/Bump Shear Tester | ASSEMBLY | 1 | as is where is | ||
| 93616 | Dage | 4000BS5KG | Dage 4000 Ball Shear Load Cell. 5kg capacity. | ASSEMBLY | 1 | as is where is | ||
| 93617 | Dage | 4000HS | High Speed Bond Tester | ASSEMBLY | 1 | as is where is | ||
| 93618 | Dage | DS50KG-CAL-A | Load Cell Calibration Weight. | ASSEMBLY | 1 | as is where is | ||
| 98381 | Dage | 4000 | Bond Tester | 1 | as is where is | |||
| 87490 | DELTRONIC | DH14-RR | Profile Projector with 20X Objective Lens | 1 | as is where is | |||
| 96568 | ECOPIA | HMS-5000 | Hall effect measurement system | Packaging | 01.05.2011 | 1 | as is where is | |
| 93626 | Finnigan Mat | GCQ | Ion Trap Mass Spectrometer Coupled to a Gas Chromatograph. | LABORATORY AND SCIENTIFIC | 1 | as is where is | ||
| 71907 | Hamamatsu | C7103 | PC Controlled IC Back-side Lapping and Wafer Grinding System | 200 mm and packages | 01.10.2001 | 1 | inquire | immediately |
| 78303 | Hitachi | Mi-scope CP11U | Scanning Acoustic Tomograph | Laboratory | 01.06.2001 | 1 | as is where is | immediately |
| 83585 | Hitachi | S5000H | Field Emission SEM | Laboratory | 1 | as is where is | immediately | |
| 95722 | HITACHI | S9300 | SEM - CD (CRITICAL DIMENSION) | 300 mm | 01.06.2005 | 1 | as is all rebuilt | immediately |
| 93619 | Hypervision | Chip Unzip | Backside Preparation System. | ASSEMBLY | 1 | as is where is | ||
| 96577 | IMS Nanotech | LVIS-3 + | LED Visual Inspection | LED | 01.06.2012 | 1 | as is where is | immediately |
| 96578 | IMS NANOTECH | LVIS-V | LED Visual Inspection Equipment | LED | 01.06.2012 | 1 | as is where is | immediately |
| 87627 | JEOL | JSM 6400 | Scanning Electron Microscope | 1 | as is where is | immediately | ||
| 97935 | KLA-Tencor | CI-T53P | COMPONENT INSPECTOR | ASSEMBLY | 1 | inquire | ||
| 82163 | Mirtec | MV-3L | inspection machine | 01.06.2007 | 1 | as is where is | immediately | |
| 86466 | Mitutoyo | PJH3000 F | profile projector | assembly / SMT | 01.06.2002 | 2 | as is where is | immediately |
| 93620 | Mitutoyo | PH-3500 | Profile Projector. | ASSEMBLY | 1 | as is where is | ||
| 96009 | MITUTOYO | PJH30005FT2100 | PROFILE PROJECTOR | ASSEMBLY | 01.06.1998 | 1 | as is where is | |
| 97945 | MITUTOYO | QS250Z1J | 3D MEASURING MACHINE | ASSEMBLY | 1 | inquire | ||
| 96597 | NIKON | SZM-645 | Microscope | assembly | 01.06.2011 | 1 | as is where is | |
| 98007 | Nikon | VMR-C4540 | Microscope | 1 | as is where is | |||
| 87492 | OLYMPUS | BH-BHM | Wafer Inspection Microscope | 1 | as is where is | |||
| 96607 | OLYMPUS | SZ61TR | Low Magnification Microscope | Reliability/Test | 01.12.2010 | 8 | as is where is | |
| 96608 | Optoelectronic Precision Co., Ltd. | LEOS-OPI-110 | Characteristic Measuring Equipment / Multi-channel | LED | 01.12.2011 | 1 | as is where is | |
| 94401 | Oxford | CMI 950 | Xray fluorescence spectrometer | 01.06.2000 | 1 | as is where is | ||
| 96609 | Panalytical | X-PERT PRO MRD | XRD | Loader 1: 2-4 Inch, Loader 2: 4-12 Inch | 01.05.2011 | 1 | as is where is | immediately |
| 86340 | PHOENIX | NANOMEX 160 NF | X-RAY INSPECTION SYSTEM | assembly / SMT | 01.06.2006 | 1 | as is where is | immediately |
| 92003 | Phoenix | PCBA Inspector 100 | X-Ray inspection machine for PCB | assembly / SMT | 01.10.2001 | 1 | as is where is | immediately |
| 99156 | Phoenix | 160T | X-ray Inspection | 1 | as is where is | |||
| 96610 | Photondays | LED Accelerated Aging System | LED Aging & Tester | Reliability/Test | 01.06.2011 | 1 | as is where is | |
| 86475 | Sonoscan | D9000 | Scanning Acoustic Microscope | 1 | as is where is | immediately | ||
| 93622 | TA Instruments | Q1000 | DSC Q1000 Differential Scannning Calorimeter. | ASSEMBLY | 1 | as is where is | ||
| 93624 | Temptronic | TPO4100A-1 | Thermal Inducing System.�Temp. Range: -20 to 225 deg C. | FACILITIES | 1 | as is where is | ||
| 93625 | Temptronic | TPO4100A-2 | Tabletop Thermal Forcing System.� | FACILITIES | 1 | as is where is | ||
| 56842 | VEECO | MS-35T | Turbopumped Leak Detector | 1 | as is where is | |||
| 79594 | Vision Engineering | Dynascope | Inspection Microscope | Assembly | 01.06.1995 | 1 | as is where is | immediately |
| 33628 | WENTWORTH LABS | HOP "Hands Off Probe" | Micropositioner, 2ea Available | 1 | as is where is |