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List of Nanometrics equipment available for sale

The following are the items available for sale related to Nanometrics. To inquire about the Nanometrics equipment item you need, click on the relevant link below to get more details, and inquiry if interested. If no result is shown, please try to search for another item or inquiry us about your request of Nanometrics items.


SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
55401 NANOMETRICS NanoSpec M-210AFT Metrology Equipment, Thin Film Measurement System 200mm 1 as is where is
55402 NANOMETRICS NanoSpec M-210AFT Metrology Equipment, Thin Film Measurement System 200mm 01.01.1993 1 as is where is
55403 NANOMETRICS NanoSpec M-5100 Metrology Equipment, Wafer Inspection Equipment 200mm 1 as is where is
55404 NANOMETRICS NanoSpec M-5100 Metrology Equipment, Wafer Inspection Equipment 200mm 1 as is where is
33700 NANOMETRICS Nanoline CD-50 CD Measurement Tool 1 inquire
33701 NANOMETRICS Nanospec 181 Film Thickness Measurement System 1 inquire
33703 NANOMETRICS Nanospec 2100 Film Thickness Measurement System with Irvine Optical Optistation 200 Automatic Wafer Loader 1 inquire
33704 NANOMETRICS Nanospec 212 Film Thickness Measurement System with 125mm/150mm Dual Wafer Sliding Stage 1 inquire
34711 Nanometrics METRA 7200 2 SMIF indexers 01.03.2001 1 immediately
34712 Nanometrics METRA 7200 2 SMIF indexers 01.12.2002 1 immediately
36593 NANOMETRICS 7200 OVERLAY MEASUREMENT SYSTEM 200mm 01.08.2000 1 inquire
36594 NANOMETRICS NANOSPEC ATF , MARK-NANOMETRICS 1 inquire
36595 NANOMETRICS NANOSPEC ATF210 , MARK-NANOMETRICS 1 inquire
38501 Nanometrics Nanoline Nanoline CRD-III with Olympus Microscope 1 inquire immediately
61447 NANOMETRICS NANO9300 THICKNESS MEASUREMENT 1 as is where is
62690 Nanometrics Nanoline 1 as is where is
69286 Nanometrics AFT 200 NanoSpec 1 as is where is
69679 Nanometrics 9010 Integrated Metrology System 1 as is where is immediately
74818 Nanometrics 4000 Wafer inspection 200 MM 1 as is where is
74820 Nanometrics Nanospec 210 Film Thickness measurement 150 mm and 125 mm 1 as is where is
74821 Nanometrics Nanospec AFT400 Film Thickness Measurement 8 1 as is where is
79528 Nanometrics Nanoline CRD-III CD Measurement Tool 1 as is where is immediately
82516 Nanometrics LYNX Critical Dimension (CD) Measurement (non SEM) 300mm 1 as is where is
82690 NANOMETRICS ORION METROLOGY 300 mm 01.06.2006 1 as is where is immediately
82823 Nanometrics M-215 Thickness 6 01.06.1989 1 as is where is
82824 Nanometrics M-215 Thickness 6 01.06.1989 1 as is where is
83354 Nanometrics SIPHER EPI SLIP AND DEFECT 200 mm 01.06.2002 1 as is where is
83791 NANOMETRICS ATLAS Thin Film Processing 300 mm 01.07.2004 1 as is where is immediately
84277 Nanometrics 9000 Nanospec 9000 Metrology thickness tool 1 as is all rebuilt immediately
51042 Nanometrics (Olympus) 209157 Microscope 1 as is where is
58839 Nanometrics Inc. 7000-0321 Nano CD-50 01.05.1998 0 as is where is


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