The following are the items available for sale related to Nanometrics at SDI fabsurplus.com. To inquire about the Nanometrics equipment item you need, click on the relevant link below to get more details, and inquiry if interested. If no result is shown, please try to search for another item or inquiry us about your request of Nanometrics items.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 82690 | NANOMETRICS | ORION | METROLOGY | 300 mm | 01.06.2006 | 1 | as is where is | immediately |
| 90884 | Nanometrics | Tevet Trajectory T3 | Film Thickness Measurement System | 1 | as is where is | |||
| 88616 | Nanometrics | Caliper Mosaic | Overlay Measurement System | 300 MM | 01.06.2005 | 1 | as is where is | immediately |
| 88617 | Nanometrics | Caliper Mosaic | Overlay | 300 MM | 01.06.2002 | 1 | as is where is | |
| 88618 | Nanometrics | Caliper Mosaic | Overlay | 300 MM | 01.06.2009 | 1 | as is where is | |
| 88620 | Nanometrics | METRA 2200M | Overlay | 200 MM | 01.06.1996 | 1 | as is where is | |
| 88621 | Nanometrics | METRA-7200 | Overlay | 200 MM | 1 | as is where is | ||
| 95537 | NANOMETRICS | ATLAS | Thin Film Measurement | 300 mm | 01.06.2006 | 1 | as is where is | |
| 84277 | Nanometrics | 9000 | Nanospec 9000 Metrology thickness tool | 1 | as is all rebuilt | immediately | ||
| 91721 | Nanometrics | Lynx with OCD | Metrology | 300mm | 1 | as is where is | ||
| 84832 | NANOMETRICS | NanoSpec 9000 | Metrology Equipment, Wafer Inspection Equipment | 200mm | 1 | as is where is | immediately | |
| 94564 | NANOMETRICS | ATLAS XP | CD AND FILM THICKNESS MEASUREMENT (Photomask) | RETICLE | 1 | as is where is | ||
| 91526 | NANOMETRICS | CALIPER_MOSAIC | Overlay | 300 mm | 01.06.2003 | 1 | as is where is | |
| 91527 | NANOMETRICS | CALIPER_MOSAIC | Overlay | 300 mm | 01.06.2010 | 1 | as is where is | |
| 91528 | NANOMETRICS | CALIPER_MOSAIC | Overlay | 300 mm | 01.06.2001 | 1 | as is where is | |
| 91529 | NANOMETRICS | CALIPER_MOSAIC | Overlay | 1 | as is where is | |||
| 92041 | Nanometrics | 9010B | Metrology | 1 | as is where is | immediately | ||
| 91530 | NANOMETRICS | NANOMETRICS 9-7200-0195E | Mask & Wafer Inspection | 200 mm | 1 | as is where is | ||
| 91531 | NANOMETRICS | NANOSPEC ATF210 | Film Thickness Measurement | 1 | as is where is | |||
| 91532 | Nanometrics | Q230 | Wafer Inspection System | 1 | as is where is | immediately | ||
| 90255 | Nanometrics | M5100 or M5100UV ? | Thickness measurement | 150 mm | 02.09.1995 | 1 | as is where is | |
| 92818 | Nanometrics | NanoSpec 210 | Metrology (Metrology) | 125 mm | 1 | as is where is | ||
| 86425 | Nanometrics | Nanospec AFT 210 | surface inspection | 125 mm | 1 | as is where is | ||
| 94875 | Nanometrics | Q200i | Overlay Measurement | 200 mm | 1 | as is where is | ||
| 88271 | Nanometrics | LYNX | Critical Dimension (CD) Measurement (non SEM) | 300mm | 01.06.2013 | 1 | as is where is | |
| 88272 | Nanometrics | LYNX | Critical Dimension (CD) Measurement (non SEM) | 300mm | 01.06.2010 | 1 | as is where is | |
| 90583 | Nanometrics | LYNX | Critical Dimension (CD) Measurement (non SEM) | 300 mm | 01.09.2011 | 1 | as is where is | |
| 90584 | Nanometrics | Trajectory T3 | Film Thickness Measurement System | 1 | as is where is | |||
| 95196 | NANOMETRICS | CALIPER ELAN | Overlay Metrology | 300 mm | 01.07.2005 | 1 | as is where is | |
| 95197 | NANOMETRICS | ATLAS | Thin Film Measurement | 300 mm | 01.10.2006 | 1 | as is where is | |
| 93666 | Nanometrics | 3000 | Tabletop Thin Film Analysis System | 1 | as is where is | |||
| 93667 | Nanometrics | 8300X | Thin Film Metrology Tool. | 1 | as is where is | |||
| 93668 | Nanometrics | Nanospec 6100 | Automated Film Thickness Measurement System | 1 | as is where is | |||
| 93669 | Nanometrics | Nanospec 6100 | Automated Film Thickness Measurement System | 1 | as is where is |