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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 82690 | NANOMETRICS | ORION | METROLOGY | 300 mm | 01.06.2006 | 1 | as is where is | immediately |
| 90884 | Nanometrics | Tevet Trajectory T3 | Film Thickness Measurement System | 1 | as is where is | |||
| 86044 | NANOMETRICS | NANOSPEC 8300X | THIN FILMS MEASURING SYSTEM | 300 mm | 1 | as is where is | ||
| 88616 | Nanometrics | Caliper Mosaic | Overlay | 300 MM | 01.06.2005 | 1 | as is where is | |
| 88617 | Nanometrics | Caliper Mosaic | Overlay | 300 MM | 01.06.2002 | 1 | as is where is | |
| 88618 | Nanometrics | Caliper Mosaic | Overlay | 300 MM | 01.06.2009 | 1 | as is where is | |
| 88620 | Nanometrics | METRA 2200M | Overlay | 200 MM | 01.06.1996 | 1 | as is where is | |
| 88621 | Nanometrics | METRA-7200 | Overlay | 200 MM | 1 | as is where is | ||
| 86580 | Nanometrics | Q22I | Metrology | 200mm | 1 | as is where is | ||
| 84277 | Nanometrics | 9000 | Nanospec 9000 Metrology thickness tool | 1 | as is all rebuilt | immediately | ||
| 91964 | NANOMETRICS | CALIPER MOSAIC | WAFER INSPECTION | 300 mm | 01.05.2003 | 1 | as is where is | |
| 91721 | Nanometrics | Lynx with OCD | Metrology | 300mm | 1 | as is where is | ||
| 84832 | NANOMETRICS | NanoSpec 9000 | Metrology Equipment, Wafer Inspection Equipment | 200mm | 1 | as is where is | immediately | |
| 55401 | NANOMETRICS | NanoSpec M-210AFT | Metrology Equipment, Thin Film Measurement System | 200mm | 1 | as is where is | ||
| 55402 | NANOMETRICS | NanoSpec M-210AFT | Metrology Equipment, Thin Film Measurement System | 200mm | 01.01.1993 | 1 | as is where is | |
| 55403 | NANOMETRICS | NanoSpec M-5100 | Metrology Equipment, Wafer Inspection Equipment | 200mm | 1 | as is where is | ||
| 55404 | NANOMETRICS | NanoSpec M-5100 | Metrology Equipment, Wafer Inspection Equipment | 200mm | 1 | as is where is | ||
| 91524 | NANOMETRICS | ATLAS | Advanced OCD metrology system | 200 mm /300 mm | 01.06.2005 | 1 | as is where is | |
| 91525 | NANOMETRICS | ATLAS-XP | Advanced OCD metrology system | 200 mm | 01.06.2011 | 1 | as is where is | |
| 91526 | NANOMETRICS | CALIPER_MOSAIC | Overlay | 300 mm | 01.06.2003 | 1 | as is where is | |
| 91527 | NANOMETRICS | CALIPER_MOSAIC | Overlay | 300 mm | 01.06.2010 | 1 | as is where is | |
| 91528 | NANOMETRICS | CALIPER_MOSAIC | Overlay | 300 mm | 01.06.2001 | 1 | as is where is | |
| 91529 | NANOMETRICS | CALIPER_MOSAIC | Overlay | 1 | as is where is | |||
| 92041 | Nanometrics | 9010B | Metrology | 1 | as is where is | immediately | ||
| 91530 | NANOMETRICS | NANOMETRICS 9-7200-0195E | Mask & Wafer Inspection | 200 mm | 1 | as is where is | ||
| 91531 | NANOMETRICS | NANOSPEC ATF210 | Film Thickness Measurement | 1 | as is where is | |||
| 91532 | NANOMETRICS | Q230 | Wafer Inspection System | 1 | as is where is | |||
| 90255 | Nanometrics | M5100 or M5100UV ? | Thickness measurement | 150 mm | 02.09.1995 | 1 | as is where is | |
| 86425 | Nanometrics | Nanospec AFT 210 | surface inspection | 125 mm | 1 | as is where is | ||
| 88271 | Nanometrics | LYNX | Critical Dimension (CD) Measurement (non SEM) | 300mm | 01.06.2013 | 1 | as is where is | |
| 88272 | Nanometrics | LYNX | Critical Dimension (CD) Measurement (non SEM) | 300mm | 01.06.2010 | 1 | as is where is | |
| 90583 | Nanometrics | LYNX | Critical Dimension (CD) Measurement (non SEM) | 300 mm | 01.09.2011 | 1 | as is where is | |
| 90584 | Nanometrics | Trajectory T3 | Film Thickness Measurement System | 1 | as is where is | |||
| 36593 | NANOMETRICS | 7200 | OVERLAY MEASUREMENT SYSTEM | 200mm | 01.08.2000 | 1 | as is where is | immediately |
| 36594 | NANOMETRICS | NANOSPEC ATF , MARK-NANOMETRICS | 1 | inquire | ||||
| 36595 | NANOMETRICS | NANOSPEC ATF210 , MARK-NANOMETRICS | 1 | inquire |