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List of Nanometrics equipment available for sale at fabsurplus.com

The following are the items available for sale related to Nanometrics at SDI fabsurplus.com. To inquire about the Nanometrics equipment item you need, click on the relevant link below to get more details, and inquiry if interested. If no result is shown, please try to search for another item or inquiry us about your request of Nanometrics items.


SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
82690 NANOMETRICS ORION METROLOGY 300 mm 01.06.2006 1 as is where is immediately
90884 Nanometrics Tevet Trajectory T3 Film Thickness Measurement System 1 as is where is
88616 Nanometrics Caliper Mosaic Overlay Measurement System 300 MM 01.06.2005 1 as is where is immediately
88617 Nanometrics Caliper Mosaic Overlay 300 MM 01.06.2002 1 as is where is immediately
88618 Nanometrics Caliper Mosaic Overlay 300 MM 01.06.2009 1 as is where is immediately
88620 Nanometrics METRA 2200M Overlay 200 MM 01.06.1996 1 as is where is
88621 Nanometrics METRA-7200 Overlay 200 MM 1 as is where is
84277 Nanometrics 9000 Nanospec 9000 Metrology thickness tool 1 as is all rebuilt immediately
91721 Nanometrics Lynx with OCD Metrology 300mm 01.10.2008 1 as is where is
95833 Nanometrics Atlas II+ Critical Dimension (CD) Measurement 300 mm 01.02.2015 1 as is where is
95834 Nanometrics Atlas II+ Critical Dimension (CD) Measurement 01.12.2014 1 as is where is
84832 NANOMETRICS NanoSpec 9000 Metrology Equipment, Wafer Inspection Equipment 200mm 1 as is where is immediately
91526 NANOMETRICS Caliper Mosaic Overlay 300 mm 01.06.2003 1 as is where is immediately
91527 NANOMETRICS Caliper Mosaic Overlay 300 mm 01.06.2010 1 as is where is immediately
91528 NANOMETRICS Caliper Mosaic Overlay 300 mm 01.09.2009 1 as is where is immediately
91529 NANOMETRICS Caliper Mosaic Overlay 300 mm 01.03.2010 1 as is where is immediately
92041 Nanometrics 9010B Metrology 1 as is where is immediately
91530 NANOMETRICS NANOMETRICS 9-7200-0195E Mask & Wafer Inspection 200 mm 1 as is where is
91531 NANOMETRICS NANOSPEC ATF210 Film Thickness Measurement 1 as is where is
91532 Nanometrics Q230 Wafer Inspection System 1 as is where is immediately
90255 Nanometrics M5100 or M5100UV ? Thickness measurement 150 mm 02.09.1995 1 as is where is
92818 Nanometrics NanoSpec 210 Metrology (Metrology) 125 mm 1 as is where is
86425 Nanometrics Nanospec AFT 210 surface inspection 125 mm 1 as is where is
94875 Nanometrics Q200i Overlay Measurement 200 mm 1 as is where is
88271 Nanometrics LYNX Critical Dimension (CD) Measurement (non SEM) 300mm 01.06.2013 1 as is where is
96982 Nanometrics Nanospec 9200 Wafer Inspection 200 mm 01.06.2001 1 inquire
96983 Nanometrics Nanospec 9310 Wafer Inspection 200 mm 01.06.2008 1 inquire
90584 Nanometrics Trajectory T3 Film Thickness Measurement System 1 as is where is
93667 Nanometrics 8300X Thin Film Metrology Tool. 1 as is where is
96489 NANOMETRICS ATLAS Overlay Measurement 200mm 01.03.2005 1 as is where is
96490 NANOMETRICS ATLAS Overlay Measurement 300mm 01.10.2004 1 as is where is
96491 NANOMETRICS CALIPER-ELAN ULTRA Overlay Measurement 300mm 01.08.2006 1 as is where is
96492 NANOMETRICS CALIPER-ELAN Overlay Measurement 300mm 01.06.2005 1 as is where is
96493 NANOMETRICS CALIPER-ELAN Overlay Measurement 300mm 01.06.2005 1 as is where is


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