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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 82690 | NANOMETRICS | ORION | METROLOGY | 300 mm | 01.06.2006 | 1 | as is where is | immediately |
| 90884 | Nanometrics | Tevet Trajectory T3 | Film Thickness Measurement System | 1 | as is where is | |||
| 88616 | Nanometrics | Caliper Mosaic | Overlay Measurement System | 300 MM | 01.06.2005 | 1 | as is where is | immediately |
| 88617 | Nanometrics | Caliper Mosaic | Overlay | 300 MM | 01.06.2002 | 1 | as is where is | immediately |
| 88618 | Nanometrics | Caliper Mosaic | Overlay | 300 MM | 01.06.2009 | 1 | as is where is | immediately |
| 88620 | Nanometrics | METRA 2200M | Overlay | 200 MM | 01.06.1996 | 1 | as is where is | |
| 88621 | Nanometrics | METRA-7200 | Overlay | 200 MM | 1 | as is where is | ||
| 84277 | Nanometrics | 9000 | Nanospec 9000 Metrology thickness tool | 1 | as is all rebuilt | immediately | ||
| 91721 | Nanometrics | Lynx with OCD | Metrology | 300mm | 01.10.2008 | 1 | as is where is | |
| 95833 | Nanometrics | Atlas II+ | Critical Dimension (CD) Measurement | 300 mm | 01.02.2015 | 1 | as is where is | |
| 95834 | Nanometrics | Atlas II+ | Critical Dimension (CD) Measurement | 01.12.2014 | 1 | as is where is | ||
| 84832 | NANOMETRICS | NanoSpec 9000 | Metrology Equipment, Wafer Inspection Equipment | 200mm | 1 | as is where is | immediately | |
| 91526 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 01.06.2003 | 1 | as is where is | immediately |
| 91527 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 01.06.2010 | 1 | as is where is | immediately |
| 91528 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 01.09.2009 | 1 | as is where is | immediately |
| 91529 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 01.03.2010 | 1 | as is where is | immediately |
| 92041 | Nanometrics | 9010B | Metrology | 1 | as is where is | immediately | ||
| 91530 | NANOMETRICS | NANOMETRICS 9-7200-0195E | Mask & Wafer Inspection | 200 mm | 1 | as is where is | ||
| 91531 | NANOMETRICS | NANOSPEC ATF210 | Film Thickness Measurement | 1 | as is where is | |||
| 91532 | Nanometrics | Q230 | Wafer Inspection System | 1 | as is where is | immediately | ||
| 90255 | Nanometrics | M5100 or M5100UV ? | Thickness measurement | 150 mm | 02.09.1995 | 1 | as is where is | |
| 92818 | Nanometrics | NanoSpec 210 | Metrology (Metrology) | 125 mm | 1 | as is where is | ||
| 86425 | Nanometrics | Nanospec AFT 210 | surface inspection | 125 mm | 1 | as is where is | ||
| 94875 | Nanometrics | Q200i | Overlay Measurement | 200 mm | 1 | as is where is | ||
| 88271 | Nanometrics | LYNX | Critical Dimension (CD) Measurement (non SEM) | 300mm | 01.06.2013 | 1 | as is where is | |
| 96982 | Nanometrics | Nanospec 9200 | Wafer Inspection | 200 mm | 01.06.2001 | 1 | inquire | |
| 96983 | Nanometrics | Nanospec 9310 | Wafer Inspection | 200 mm | 01.06.2008 | 1 | inquire | |
| 90584 | Nanometrics | Trajectory T3 | Film Thickness Measurement System | 1 | as is where is | |||
| 93667 | Nanometrics | 8300X | Thin Film Metrology Tool. | 1 | as is where is | |||
| 96489 | NANOMETRICS | ATLAS | Overlay Measurement | 200mm | 01.03.2005 | 1 | as is where is | |
| 96490 | NANOMETRICS | ATLAS | Overlay Measurement | 300mm | 01.10.2004 | 1 | as is where is | |
| 96491 | NANOMETRICS | CALIPER-ELAN ULTRA | Overlay Measurement | 300mm | 01.08.2006 | 1 | as is where is | |
| 96492 | NANOMETRICS | CALIPER-ELAN | Overlay Measurement | 300mm | 01.06.2005 | 1 | as is where is | |
| 96493 | NANOMETRICS | CALIPER-ELAN | Overlay Measurement | 300mm | 01.06.2005 | 1 | as is where is |