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List of Nanometrics equipment available for sale at fabsurplus.com

The following are the items available for sale related to Nanometrics at SDI fabsurplus.com. To inquire about the Nanometrics equipment item you need, click on the relevant link below to get more details, and inquiry if interested. If no result is shown, please try to search for another item or inquiry us about your request of Nanometrics items.


SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
82690 NANOMETRICS ORION METROLOGY 300 mm 01.06.2006 1 as is where is immediately
85010 Nanometrics Q240AT Overlay Measurement 200 mm 01.12.2000 1 as is where is
86044 NANOMETRICS NANOSPEC 8300X THIN FILMS MEASURING SYSTEM 300 mm 1 as is where is
86580 Nanometrics Q22I Metrology 200mm 1 as is where is
84277 Nanometrics 9000 Nanospec 9000 Metrology thickness tool 1 as is all rebuilt immediately
84832 NANOMETRICS NanoSpec 9000 Metrology Equipment, Wafer Inspection Equipment 200mm 1 as is where is immediately
38501 Nanometrics Nanoline Nanoline CRD-III with Olympus Microscope 1 inquire immediately
55401 NANOMETRICS NanoSpec M-210AFT Metrology Equipment, Thin Film Measurement System 200mm 1 as is where is
55402 NANOMETRICS NanoSpec M-210AFT Metrology Equipment, Thin Film Measurement System 200mm 01.01.1993 1 as is where is
55403 NANOMETRICS NanoSpec M-5100 Metrology Equipment, Wafer Inspection Equipment 200mm 1 as is where is
55404 NANOMETRICS NanoSpec M-5100 Metrology Equipment, Wafer Inspection Equipment 200mm 1 as is where is
82823 Nanometrics M-215 Thickness 6 01.06.1989 1 as is where is
82824 Nanometrics M-215 Thickness 6 01.06.1989 1 as is where is
85397 Nanometrics CALIPER_MOSAIC Overlay Measurement 300 mm 01.06.2009 1 as is where is
85398 Nanometrics CALIPER_MOSAIC Overlay Measurement 300 mm 01.06.2002 1 as is where is
85399 Nanometrics CDS200 Overlay Measurement 200 mm 01.06.2003 1 as is where is
85400 Nanometrics METRA7200 Overlay Measurement 200 mm 1 as is where is
85401 Nanometrics METRA7200 Overlay Measurement 200 mm 1 as is where is
86425 Nanometrics Nanospec AFT 210 surface inspection 125 mm 1 as is where is
85402 Nanometrics Nanospec AFT400 Film Thickness Measurement 200 mm 01.06.1997 1 as is where is
85403 Nanometrics SIPHER EPI SLIP AND DEFECT 200 mm 01.06.2002 1 as is where is immediately
33700 NANOMETRICS Nanoline CD-50 CD Measurement Tool 1 inquire
33701 NANOMETRICS Nanospec 181 Film Thickness Measurement System 1 inquire
33703 NANOMETRICS Nanospec 2100 Film Thickness Measurement System with Irvine Optical Optistation 200 Automatic Wafer Loader 1 inquire
79528 Nanometrics Nanoline CRD-III CD Measurement Tool 1 as is where is immediately
33704 NANOMETRICS Nanospec 212 Film Thickness Measurement System with 125mm/150mm Dual Wafer Sliding Stage 1 inquire
84695 Nanometrics Q200I Overlay 1 as is where is
86513 NANOMETRICS CALIPER MOSAIC Wafer Overlay Measurement 300 mm 01.03.2011 1 as is where is immediately
36593 NANOMETRICS 7200 OVERLAY MEASUREMENT SYSTEM 200mm 01.08.2000 1 as is where is immediately
86514 NANOMETRICS CALIPER_MOSAIC Wafer Overlay Measurement 300 mm 01.05.2005 1 as is where is immediately
36594 NANOMETRICS NANOSPEC ATF , MARK-NANOMETRICS 1 inquire
36595 NANOMETRICS NANOSPEC ATF210 , MARK-NANOMETRICS 1 inquire


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