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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 98831 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 300 mm | 01.03.2005 | 1 | as is where is | |
| 98832 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 300 mm | 01.11.2009 | 1 | as is where is | |
| 84277 | Nanometrics | 9000 | Nanospec 9000 Metrology thickness tool | 1 | as is all rebuilt | immediately | ||
| 100923 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 300 mm | 01.06.2006 | 1 | as is where is | |
| 101962 | Nanometrics | Atlas II+ | Critical Dimension (CD) Measurement (non SEM) | 300mm | 01.06.2014 | 1 | as is where is | |
| 84832 | NANOMETRICS | NanoSpec 9000 | Metrology Equipment, Wafer Inspection Equipment | 200mm | 1 | as is where is | immediately | |
| 98153 | Nanometrics | Caliper Mosaic | Overlay Measurement | 300 mm | 01.06.2011 | 1 | as is where is | |
| 98154 | Nanometrics | Caliper Mosaic | Overlay Measurement | 300 mm | 01.06.2009 | 1 | as is where is | |
| 98155 | Nanometrics | Caliper Mosaic | Overlay Measurement | 300 mm | 01.06.2009 | 1 | as is where is | |
| 101487 | Nanometrics | Tevet Trajectory T3 | Film Thickness Measurement System | 300mm | 1 | as is where is | ||
| 101488 | Nanometrics | Tevet Trajectory T3 | Film Thickness Measurement System | 300mm | 1 | as is where is | ||
| 100221 | Nanometrics | Atlas II+ | Critical Dimension (CD) Measurement | 300mm | 01.06.2015 | 1 | as is where is | immediately |
| 100222 | Nanometrics | LYNX | Critical Dimension (CD) Measurement (non SEM) | 300mm | 01.06.2018 | 1 | as is where is | |
| 91526 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 01.06.2003 | 1 | as is where is | immediately |
| 91527 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 01.06.2010 | 1 | as is where is | immediately |
| 91528 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 01.09.2009 | 1 | as is where is | immediately |
| 91529 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 01.03.2010 | 1 | as is where is | immediately |
| 92041 | Nanometrics | 9010B | Metrology | 1 | as is where is | immediately | ||
| 91530 | NANOMETRICS | NANOMETRICS 9-7200-0195E | Mask & Wafer Inspection | 200 mm | 1 | as is where is | ||
| 91531 | NANOMETRICS | NANOSPEC ATF210 | Film Thickness Measurement | 1 | as is where is | |||
| 91532 | Nanometrics | Q230 | OVERLAY MEASUREMENT | 200 mm | 1 | as is where is | immediately | |
| 92818 | Nanometrics | NanoSpec 210 | Metrology (Metrology) | 125 mm | 1 | as is where is | ||
| 86425 | Nanometrics | Nanospec AFT 210 | surface inspection | 125 mm | 1 | as is where is | ||
| 102302 | Nanometrics | Atlas | Film Thickness measurement | 200 mm | 01.06.2007 | 1 | as is where is | |
| 102303 | Nanometrics | Caliper Elan | Overlay Measurement System | 300 mm | 1 | as is where is | ||
| 102304 | Nanometrics | Caliper Elan | Overlay Measurement | 300 mm | 01.06.2004 | 1 | as is where is | |
| 102305 | Nanometrics | Caliper Elan | Overlay Measurement | 300 mm | 01.06.2006 | 1 | as is where is | |
| 102306 | Nanometrics | Caliper Elan | Overlay Measurement | 300 mm | 01.06.2006 | 1 | as is where is | |
| 102307 | Nanometrics | Caliper Elan | Overlay Measurement | 300 mm | 01.06.2006 | 1 | as is where is | |
| 102308 | Nanometrics | Caliper Elan | Overlay Measurement | 300 mm | 01.06.2006 | 1 | as is where is | |
| 102309 | Nanometrics | Caliper Q300 | Overlay Measurement System | 300 mm | 01.06.2003 | 1 | as is where is | |
| 102310 | Nanometrics | Caliper Q300 | Overlay Measurement | 300 mm | 01.06.2003 | 1 | as is where is | |
| 102311 | Nanometrics | Caliper Q300 | Overlay Inspection | 300 mm | 01.06.2002 | 1 | as is where is | |
| 102312 | Nanometrics | Caliper Q300 | Overlay Measurement | 300 mm | 01.06.2002 | 1 | as is where is | |
| 102313 | Nanometrics | Caliper Q300 | Overlay Measurement | 300 mm | 1 | as is where is | ||
| 102314 | Nanometrics | Q200I | Overlay Measurement System | 200 mm | 01.06.2000 | 1 | as is where is | |
| 102315 | Nanometrics | Q200I | Overlay Measurement | 200 mm | 01.06.2002 | 1 | as is where is | |
| 98479 | Nanometrics | 9100 | film thickness measurement | 200mm | 1 | as is where is | ||
| 98480 | Nanometrics | 8000X | film thickness measurement | 150mm | 1 | as is where is | ||
| 98481 | Nanometrics | 8000Xse | film thickness measurement | 200mm | 2 | as is where is | ||
| 98482 | Nanometrics | Caliper Mosaic EFEM module | Brooks Razor robot with Brooks load port | 300mm | 1 | as is where is | ||
| 98483 | Nanometrics | Lynx EFEM | Kawasaki robot with TDK load port | 300 mm | 1 | as is where is | immediately | |
| 98508 | Nanometrics | M6100 | Film Thickness Measurement | 200 mm | 1 | as is where is | ||
| 101583 | NANOMETRICS | ATLAS | CD Measurement | 300 mm | 01.03.2007 | 1 | as is where is | |
| 101584 | NANOMETRICS | ATLAS | CD Measurement | 300 mm | 01.08.2006 | 1 | as is where is | |
| 101585 | NANOMETRICS | CALIPER-ULTRA | Overlay Measurement | 300 mm | 01.07.2006 | 1 | as is where is | |
| 99027 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 01.06.2007 | 1 | as is where is | ||
| 99028 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 300 mm | 01.10.2006 | 1 | as is where is | |
| 99029 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 01.10.2006 | 1 | as is where is | ||
| 99030 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 300 mm | 01.02.2008 | 1 | as is where is | |
| 98289 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 01.06.2005 | 1 | as is where is | |
| 98290 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 01.06.2005 | 1 | as is where is | |
| 98291 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 01.06.2006 | 1 | as is where is |