The following are the items available for sale related to Nanometrics at SDI fabsurplus.com. To inquire about the Nanometrics equipment item you need, click on the relevant link below to get more details, and inquiry if interested. If no result is shown, please try to search for another item or inquiry us about your request of Nanometrics items.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 98831 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 300 mm | 01.03.2005 | 1 | as is where is | |
| 98832 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 300 mm | 01.11.2009 | 1 | as is where is | |
| 88616 | Nanometrics | Caliper Mosaic | Overlay Measurement System | 300 MM | 01.06.2005 | 1 | as is where is | immediately |
| 88617 | Nanometrics | Caliper Mosaic | Overlay | 300 MM | 01.06.2002 | 1 | as is where is | immediately |
| 88618 | Nanometrics | Caliper Mosaic | Overlay | 300 MM | 01.06.2009 | 1 | as is where is | immediately |
| 84277 | Nanometrics | 9000 | Nanospec 9000 Metrology thickness tool | 1 | as is all rebuilt | immediately | ||
| 100923 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 300 mm | 01.06.2006 | 1 | as is where is | |
| 84832 | NANOMETRICS | NanoSpec 9000 | Metrology Equipment, Wafer Inspection Equipment | 200mm | 1 | as is where is | immediately | |
| 98153 | Nanometrics | Caliper Mosaic | Overlay Measurement | 300 mm | 01.06.2011 | 1 | as is where is | |
| 98154 | Nanometrics | Caliper Mosaic | Overlay Measurement | 300 mm | 01.06.2009 | 1 | as is where is | |
| 98155 | Nanometrics | Caliper Mosaic | Overlay Measurement | 300 mm | 01.06.2009 | 1 | as is where is | |
| 101487 | Nanometrics | Tevet Trajectory T3 | Film Thickness Measurement System | 300mm | 1 | as is where is | ||
| 101488 | Nanometrics | Tevet Trajectory T3 | Film Thickness Measurement System | 300mm | 1 | as is where is | ||
| 100221 | Nanometrics | Atlas II+ | Critical Dimension (CD) Measurement | 300mm | 01.06.2014 | 1 | as is where is | immediately |
| 100222 | Nanometrics | LYNX | Critical Dimension (CD) Measurement (non SEM) | 300mm | 01.06.2018 | 1 | as is where is | |
| 91526 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 01.06.2003 | 1 | as is where is | immediately |
| 91527 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 01.06.2010 | 1 | as is where is | immediately |
| 91528 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 01.09.2009 | 1 | as is where is | immediately |
| 91529 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 01.03.2010 | 1 | as is where is | immediately |
| 92041 | Nanometrics | 9010B | Metrology | 1 | as is where is | immediately | ||
| 91530 | NANOMETRICS | NANOMETRICS 9-7200-0195E | Mask & Wafer Inspection | 200 mm | 1 | as is where is | ||
| 91531 | NANOMETRICS | NANOSPEC ATF210 | Film Thickness Measurement | 1 | as is where is | |||
| 91532 | Nanometrics | Q230 | Wafer Inspection System | 1 | as is where is | immediately | ||
| 92818 | Nanometrics | NanoSpec 210 | Metrology (Metrology) | 125 mm | 1 | as is where is | ||
| 86425 | Nanometrics | Nanospec AFT 210 | surface inspection | 125 mm | 1 | as is where is | ||
| 98479 | Nanometrics | 9100 | film thickness measurement | 200mm | 1 | as is where is | ||
| 98480 | Nanometrics | 8000X | film thickness measurement | 150mm | 1 | as is where is | ||
| 98481 | Nanometrics | 8000Xse | film thickness measurement | 200mm | 2 | as is where is | ||
| 98482 | Nanometrics | Caliper Mosaic EFEM module | Brooks Razor robot with Brooks load port | 300mm | 1 | as is where is | ||
| 98483 | Nanometrics | Lynx EFEM | Kawasaki robot with TDK load port | 300 mm | 1 | as is where is | immediately | |
| 98508 | Nanometrics | M6100 | Film Thickness Measurement | 200 mm | 1 | as is where is | ||
| 101583 | NANOMETRICS | ATLAS | CD Measurement | 300 mm | 01.03.2007 | 1 | as is where is | |
| 101584 | NANOMETRICS | ATLAS | CD Measurement | 300 mm | 01.08.2006 | 1 | as is where is | |
| 101585 | NANOMETRICS | CALIPER-ULTRA | Overlay Measurement | 300 mm | 01.08.2006 | 1 | as is where is | |
| 99027 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 01.06.2007 | 1 | as is where is | ||
| 99028 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 300 mm | 01.10.2006 | 1 | as is where is | |
| 99029 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 01.10.2006 | 1 | as is where is | ||
| 99030 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 300 mm | 01.02.2008 | 1 | as is where is | |
| 98289 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 01.06.2005 | 1 | as is where is | |
| 98290 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 01.06.2005 | 1 | as is where is | |
| 98291 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 01.06.2006 | 1 | as is where is |