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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 82690 | NANOMETRICS | ORION | METROLOGY | 300 mm | 01.06.2006 | 1 | as is where is | immediately |
| 85010 | Nanometrics | Q240AT | Overlay Measurement | 200 mm | 01.12.2000 | 1 | as is where is | |
| 86044 | NANOMETRICS | NANOSPEC 8300X | THIN FILMS MEASURING SYSTEM | 300 mm | 1 | as is where is | ||
| 84277 | Nanometrics | 9000 | Nanospec 9000 Metrology thickness tool | 1 | as is all rebuilt | immediately | ||
| 84832 | NANOMETRICS | NanoSpec 9000 | Metrology Equipment, Wafer Inspection Equipment | 200mm | 1 | as is where is | immediately | |
| 38501 | Nanometrics | Nanoline | Nanoline CRD-III with Olympus Microscope | 1 | inquire | immediately | ||
| 55401 | NANOMETRICS | NanoSpec M-210AFT | Metrology Equipment, Thin Film Measurement System | 200mm | 1 | as is where is | ||
| 55402 | NANOMETRICS | NanoSpec M-210AFT | Metrology Equipment, Thin Film Measurement System | 200mm | 01.01.1993 | 1 | as is where is | |
| 55403 | NANOMETRICS | NanoSpec M-5100 | Metrology Equipment, Wafer Inspection Equipment | 200mm | 1 | as is where is | ||
| 55404 | NANOMETRICS | NanoSpec M-5100 | Metrology Equipment, Wafer Inspection Equipment | 200mm | 1 | as is where is | ||
| 82823 | Nanometrics | M-215 | Thickness | 6 | 01.06.1989 | 1 | as is where is | |
| 82824 | Nanometrics | M-215 | Thickness | 6 | 01.06.1989 | 1 | as is where is | |
| 85397 | Nanometrics | CALIPER_MOSAIC | Overlay Measurement | 300 mm | 01.06.2009 | 1 | as is where is | |
| 85398 | Nanometrics | CALIPER_MOSAIC | Overlay Measurement | 300 mm | 01.06.2002 | 1 | as is where is | |
| 85399 | Nanometrics | CDS200 | Overlay Measurement | 200 mm | 01.06.2003 | 1 | as is where is | |
| 85400 | Nanometrics | METRA7200 | Overlay Measurement | 200 mm | 1 | as is where is | ||
| 85401 | Nanometrics | METRA7200 | Overlay Measurement | 200 mm | 1 | as is where is | ||
| 85402 | Nanometrics | Nanospec AFT400 | Film Thickness Measurement | 200 mm | 01.06.1997 | 1 | as is where is | |
| 85403 | Nanometrics | SIPHER | EPI SLIP AND DEFECT | 200 mm | 01.06.2002 | 1 | as is where is | |
| 33700 | NANOMETRICS | Nanoline CD-50 | CD Measurement Tool | 1 | inquire | |||
| 33701 | NANOMETRICS | Nanospec 181 | Film Thickness Measurement System | 1 | inquire | |||
| 33703 | NANOMETRICS | Nanospec 2100 | Film Thickness Measurement System with Irvine Optical Optistation 200 Automatic Wafer Loader | 1 | inquire | |||
| 79528 | Nanometrics | Nanoline CRD-III | CD Measurement Tool | 1 | as is where is | immediately | ||
| 33704 | NANOMETRICS | Nanospec 212 | Film Thickness Measurement System with 125mm/150mm Dual Wafer Sliding Stage | 1 | inquire | |||
| 84695 | Nanometrics | Q200I | Overlay | 1 | as is where is | |||
| 36593 | NANOMETRICS | 7200 | OVERLAY MEASUREMENT SYSTEM | 200mm | 01.08.2000 | 1 | inquire | |
| 36594 | NANOMETRICS | NANOSPEC ATF , MARK-NANOMETRICS | 1 | inquire | ||||
| 36595 | NANOMETRICS | NANOSPEC ATF210 , MARK-NANOMETRICS | 1 | inquire |