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List of Nanometrics equipment available for sale at fabsurplus.com

The following are the items available for sale related to Nanometrics at SDI fabsurplus.com. To inquire about the Nanometrics equipment item you need, click on the relevant link below to get more details, and inquiry if interested. If no result is shown, please try to search for another item or inquiry us about your request of Nanometrics items.


SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
98831 NANOMETRICS ATLAS Critical Dimension (CD) Measurement 300 mm 01.03.2005 1 as is where is
98832 NANOMETRICS ATLAS Critical Dimension (CD) Measurement 300 mm 01.11.2009 1 as is where is
88616 Nanometrics Caliper Mosaic Overlay Measurement System 300 MM 01.06.2005 1 as is where is immediately
88617 Nanometrics Caliper Mosaic Overlay 300 MM 01.06.2002 1 as is where is immediately
88618 Nanometrics Caliper Mosaic Overlay 300 MM 01.06.2009 1 as is where is immediately
84277 Nanometrics 9000 Nanospec 9000 Metrology thickness tool 1 as is all rebuilt immediately
100923 NANOMETRICS ATLAS Critical Dimension (CD) Measurement 300 mm 01.06.2006 1 as is where is
84832 NANOMETRICS NanoSpec 9000 Metrology Equipment, Wafer Inspection Equipment 200mm 1 as is where is immediately
98153 Nanometrics Caliper Mosaic Overlay Measurement 300 mm 01.06.2011 1 as is where is
98154 Nanometrics Caliper Mosaic Overlay Measurement 300 mm 01.06.2009 1 as is where is
98155 Nanometrics Caliper Mosaic Overlay Measurement 300 mm 01.06.2009 1 as is where is
101487 Nanometrics Tevet Trajectory T3 Film Thickness Measurement System 300mm 1 as is where is
101488 Nanometrics Tevet Trajectory T3 Film Thickness Measurement System 300mm 1 as is where is
100221 Nanometrics Atlas II+ Critical Dimension (CD) Measurement 300mm 01.06.2014 1 as is where is immediately
100222 Nanometrics LYNX Critical Dimension (CD) Measurement (non SEM) 300mm 01.06.2018 1 as is where is
91526 NANOMETRICS Caliper Mosaic Overlay 300 mm 01.06.2003 1 as is where is immediately
91527 NANOMETRICS Caliper Mosaic Overlay 300 mm 01.06.2010 1 as is where is immediately
91528 NANOMETRICS Caliper Mosaic Overlay 300 mm 01.09.2009 1 as is where is immediately
91529 NANOMETRICS Caliper Mosaic Overlay 300 mm 01.03.2010 1 as is where is immediately
92041 Nanometrics 9010B Metrology 1 as is where is immediately
91530 NANOMETRICS NANOMETRICS 9-7200-0195E Mask & Wafer Inspection 200 mm 1 as is where is
91531 NANOMETRICS NANOSPEC ATF210 Film Thickness Measurement 1 as is where is
91532 Nanometrics Q230 Wafer Inspection System 1 as is where is immediately
92818 Nanometrics NanoSpec 210 Metrology (Metrology) 125 mm 1 as is where is
86425 Nanometrics Nanospec AFT 210 surface inspection 125 mm 1 as is where is
98479 Nanometrics 9100 film thickness measurement 200mm 1 as is where is
98480 Nanometrics 8000X film thickness measurement 150mm 1 as is where is
98481 Nanometrics 8000Xse film thickness measurement 200mm 2 as is where is
98482 Nanometrics Caliper Mosaic EFEM module Brooks Razor robot with Brooks load port 300mm 1 as is where is
98483 Nanometrics Lynx EFEM Kawasaki robot with TDK load port 300 mm 1 as is where is immediately
98508 Nanometrics M6100 Film Thickness Measurement 200 mm 1 as is where is
101583 NANOMETRICS ATLAS CD Measurement 300 mm 01.03.2007 1 as is where is
101584 NANOMETRICS ATLAS CD Measurement 300 mm 01.08.2006 1 as is where is
101585 NANOMETRICS CALIPER-ULTRA Overlay Measurement 300 mm 01.08.2006 1 as is where is
99027 NANOMETRICS ATLAS Critical Dimension (CD) Measurement 01.06.2007 1 as is where is
99028 NANOMETRICS ATLAS Critical Dimension (CD) Measurement 300 mm 01.10.2006 1 as is where is
99029 NANOMETRICS ATLAS Critical Dimension (CD) Measurement 01.10.2006 1 as is where is
99030 NANOMETRICS ATLAS Critical Dimension (CD) Measurement 300 mm 01.02.2008 1 as is where is
98289 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 01.06.2005 1 as is where is
98290 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 01.06.2005 1 as is where is
98291 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 01.06.2006 1 as is where is


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