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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 97024 | Nanometrics | CALIPER_MOSAIC | Overlay Inspection | 300 mm | 01.07.2010 | 1 | as is where is | immediately |
| 98315 | Nanometrics | Nanospec 4150 | Film Thickness Measurement | 200 mm | 01.06.1992 | 1 | inquire | immediately |
| 98831 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 300 mm | 01.03.2005 | 1 | as is where is | |
| 98832 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 300 mm | 01.11.2009 | 1 | as is where is | |
| 88616 | Nanometrics | Caliper Mosaic | Overlay Measurement System | 300 MM | 01.06.2005 | 1 | as is where is | immediately |
| 88617 | Nanometrics | Caliper Mosaic | Overlay | 300 MM | 01.06.2002 | 1 | as is where is | immediately |
| 88618 | Nanometrics | Caliper Mosaic | Overlay | 300 MM | 01.06.2009 | 1 | as is where is | immediately |
| 84277 | Nanometrics | 9000 | Nanospec 9000 Metrology thickness tool | 1 | as is all rebuilt | immediately | ||
| 100923 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 300 mm | 01.06.2006 | 1 | as is where is | |
| 95833 | Nanometrics | Atlas II+ | Critical Dimension (CD) Measurement | 300 mm | 01.02.2015 | 1 | as is where is | immediately |
| 95834 | Nanometrics | Atlas II+ | Critical Dimension (CD) Measurement | 300 mm | 01.12.2014 | 1 | as is where is | immediately |
| 84832 | NANOMETRICS | NanoSpec 9000 | Metrology Equipment, Wafer Inspection Equipment | 200mm | 1 | as is where is | immediately | |
| 98153 | Nanometrics | Caliper Mosaic | Overlay Measurement | 300 mm | 01.06.2011 | 1 | as is where is | |
| 98154 | Nanometrics | Caliper Mosaic | Overlay Measurement | 300 mm | 01.06.2009 | 1 | as is where is | |
| 98155 | Nanometrics | Caliper Mosaic | Overlay Measurement | 300 mm | 01.06.2009 | 1 | as is where is | |
| 100220 | Nanometrics | Atlas | Film Thickness Measurement System | 300mm | 1 | as is where is | ||
| 100221 | Nanometrics | Atlas II+ | Critical Dimension (CD) Measurement | 300mm | 01.06.2014 | 1 | as is where is | immediately |
| 100222 | Nanometrics | LYNX | Critical Dimension (CD) Measurement (non SEM) | 300mm | 01.06.2018 | 1 | as is where is | |
| 91526 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 01.06.2003 | 1 | as is where is | immediately |
| 91527 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 01.06.2010 | 1 | as is where is | immediately |
| 91528 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 01.09.2009 | 1 | as is where is | immediately |
| 91529 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 01.03.2010 | 1 | as is where is | immediately |
| 92041 | Nanometrics | 9010B | Metrology | 1 | as is where is | immediately | ||
| 91530 | NANOMETRICS | NANOMETRICS 9-7200-0195E | Mask & Wafer Inspection | 200 mm | 1 | as is where is | ||
| 91531 | NANOMETRICS | NANOSPEC ATF210 | Film Thickness Measurement | 1 | as is where is | |||
| 91532 | Nanometrics | Q230 | Wafer Inspection System | 1 | as is where is | immediately | ||
| 92818 | Nanometrics | NanoSpec 210 | Metrology (Metrology) | 125 mm | 1 | as is where is | ||
| 86425 | Nanometrics | Nanospec AFT 210 | surface inspection | 125 mm | 1 | as is where is | ||
| 98479 | Nanometrics | 9100 | film thickness measurement | 200mm | 1 | as is where is | ||
| 98480 | Nanometrics | 8000X | film thickness measurement | 150mm | 1 | as is where is | ||
| 98481 | Nanometrics | 8000Xse | film thickness measurement | 200mm | 2 | as is where is | ||
| 98482 | Nanometrics | Caliper Mosaic EFEM module | Brooks Razor robot with Brooks load port | 300mm | 1 | as is where is | ||
| 98483 | Nanometrics | Lynx EFEM | Kawasaki robot with TDK load port | 300 mm | 1 | as is where is | immediately | |
| 98508 | Nanometrics | M6100 | Film Thickness Measurement | 200 mm | 1 | as is where is | ||
| 99027 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 01.06.2007 | 1 | as is where is | ||
| 99028 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 300 mm | 01.10.2006 | 1 | as is where is | |
| 99029 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 01.10.2006 | 1 | as is where is | ||
| 99030 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 300 mm | 01.02.2008 | 1 | as is where is | |
| 93667 | Nanometrics | 8300X | Thin Film Metrology Tool. | 1 | as is where is | |||
| 98289 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 01.06.2005 | 1 | as is where is | |
| 98290 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 01.06.2005 | 1 | as is where is | |
| 98291 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 01.06.2006 | 1 | as is where is |