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List of Nanometrics equipment available for sale at fabsurplus.com

The following are the items available for sale related to Nanometrics at SDI fabsurplus.com. To inquire about the Nanometrics equipment item you need, click on the relevant link below to get more details, and inquiry if interested. If no result is shown, please try to search for another item or inquiry us about your request of Nanometrics items.


SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
82690 NANOMETRICS ORION METROLOGY 300 mm 01.06.2006 1 as is where is immediately
90884 Nanometrics Tevet Trajectory T3 Film Thickness Measurement System 1 as is where is
86044 NANOMETRICS NANOSPEC 8300X THIN FILMS MEASURING SYSTEM 300 mm 1 as is where is
88616 Nanometrics Caliper Mosaic Overlay 300 MM 01.06.2005 1 as is where is
88617 Nanometrics Caliper Mosaic Overlay 300 MM 01.06.2002 1 as is where is
88618 Nanometrics Caliper Mosaic Overlay 300 MM 01.06.2009 1 as is where is
88620 Nanometrics METRA 2200M Overlay 200 MM 01.06.1996 1 as is where is
88621 Nanometrics METRA-7200 Overlay 200 MM 1 as is where is
86580 Nanometrics Q22I Metrology 200mm 1 as is where is
84277 Nanometrics 9000 Nanospec 9000 Metrology thickness tool 1 as is all rebuilt immediately
91964 NANOMETRICS CALIPER MOSAIC WAFER INSPECTION 300 mm 01.05.2003 1 as is where is
91721 Nanometrics Lynx with OCD Metrology 300mm 1 as is where is
84832 NANOMETRICS NanoSpec 9000 Metrology Equipment, Wafer Inspection Equipment 200mm 1 as is where is immediately
55401 NANOMETRICS NanoSpec M-210AFT Metrology Equipment, Thin Film Measurement System 200mm 1 as is where is
55402 NANOMETRICS NanoSpec M-210AFT Metrology Equipment, Thin Film Measurement System 200mm 01.01.1993 1 as is where is
55403 NANOMETRICS NanoSpec M-5100 Metrology Equipment, Wafer Inspection Equipment 200mm 1 as is where is
55404 NANOMETRICS NanoSpec M-5100 Metrology Equipment, Wafer Inspection Equipment 200mm 1 as is where is
91524 NANOMETRICS ATLAS Advanced OCD metrology system 200 mm /300 mm 01.06.2005 1 as is where is
91525 NANOMETRICS ATLAS-XP Advanced OCD metrology system 200 mm 01.06.2011 1 as is where is
91526 NANOMETRICS CALIPER_MOSAIC Overlay 300 mm 01.06.2003 1 as is where is
91527 NANOMETRICS CALIPER_MOSAIC Overlay 300 mm 01.06.2010 1 as is where is
91528 NANOMETRICS CALIPER_MOSAIC Overlay 300 mm 01.06.2001 1 as is where is
91529 NANOMETRICS CALIPER_MOSAIC Overlay 1 as is where is
92041 Nanometrics 9010B Metrology 1 as is where is immediately
91530 NANOMETRICS NANOMETRICS 9-7200-0195E Mask & Wafer Inspection 200 mm 1 as is where is
91531 NANOMETRICS NANOSPEC ATF210 Film Thickness Measurement 1 as is where is
91532 NANOMETRICS Q230 Wafer Inspection System 1 as is where is
90255 Nanometrics M5100 or M5100UV ? Thickness measurement 150 mm 02.09.1995 1 as is where is
86425 Nanometrics Nanospec AFT 210 surface inspection 125 mm 1 as is where is
88271 Nanometrics LYNX Critical Dimension (CD) Measurement (non SEM) 300mm 01.06.2013 1 as is where is
88272 Nanometrics LYNX Critical Dimension (CD) Measurement (non SEM) 300mm 01.06.2010 1 as is where is
90583 Nanometrics LYNX Critical Dimension (CD) Measurement (non SEM) 300 mm 01.09.2011 1 as is where is
90584 Nanometrics Trajectory T3 Film Thickness Measurement System 1 as is where is
36593 NANOMETRICS 7200 OVERLAY MEASUREMENT SYSTEM 200mm 01.08.2000 1 as is where is immediately
36594 NANOMETRICS NANOSPEC ATF , MARK-NANOMETRICS 1 inquire
36595 NANOMETRICS NANOSPEC ATF210 , MARK-NANOMETRICS 1 inquire


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