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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 93704 | Veeco | Deposition System | Ion Beam Etching and Deposition�Parts System. | 1 | as is where is | |||
| 56842 | VEECO | MS-35T | Turbopumped Leak Detector | 1 | as is where is | |||
| 97839 | Veeco | Dimension X1D | Atomic Force Microscope (AFM) | 300 mm | 1 | as is where is | ||
| 97840 | Veeco | Dimension X1D | Atomic Force Microscope (AFM) | 300 mm | 1 | as is where is | ||
| 88375 | Veeco | D9000 | Atomic Force Microscope | 200 mm | 01.06.1997 | 1 | as is where is | immediately |
| 88631 | Veeco | Dimension X3D | Atomic Force Microscope | 300 MM | 01.06.2006 | 1 | as is where is | |
| 55914 | VEECO | Dektak | Profilometer, Parts Tool Only | 1 | as is where is | |||
| 96382 | Veeco | D9000 | Atomic Force Microscope | 200 mm | 01.06.2001 | 1 | as is where is | immediately |
| 96383 | Veeco | D9000 | Atomic Force Microscope | 200 mm | 01.06.2001 | 1 | as is where is | immediately |
| 83586 | Veeco | Dimension X3D Model 340 | Atomic Force Microscope | 300 mm | 01.11.2006 | 1 | as is where is | immediately |
| 96404 | Veeco | NT3300 | Non Contact Profilometer | 6 or 8 inch | 01.01.2004 | 1 | as is all rebuilt | immediately |
| 91823 | VEECO | X-200 | PROFILOMETER | 01.06.2006 | 1 | as is where is | ||
| 86200 | VEECO | V220SI | Atomic Force Microscope | 200 mm | 01.06.2002 | 1 | as is where is | |
| 93400 | Veeco | IBD 210 | Sputter / PVD system | 01.01.1998 | 2 | as is where is | immediately | |
| 93401 | Veeco | IBD 210 | Sputter / PVD system | 01.01.1998 | 1 | as is where is | immediately | |
| 93402 | Veeco | K465i Turbodisc | GaN MOCVD reactor | 2 inch to 6 inch | 01.06.2010 | 2 | as is where is | immediately |
| 88284 | Veeco | Dimension 7000 | Atomic Force Microscope (AFM) | 200mm | 1 | as is where is | ||
| 78309 | Veeco | VX310 | Atomic Force Microscope | 200 mm / 300 mm | 01.06.2004 | 1 | as is where is | immediately |
| 91878 | VEECO | AP-150 | Automtic Four Point Probe, for up to 6" Wafers | 1 | inquire | |||
| 93672 | Veeco | Autoprobe Di CP-II | Atomic Force Microscope.�Scanning probe microscope | 1 | as is where is | |||
| 93674 | Veeco | Dimension X3D-DS | Three Dimensional AFM Atomic Force Microscope Metrology System | 1 | as is where is | |||
| 93675 | Veeco Bruker | Wyko SP9900 | Large Format Optical Surface Profile | 1 | as is where is | |||
| 93676 | Veeco Digital Instruments | Dimension 3100 | Atomic Force Microscope | 1 | as is where is | |||
| 36870 | Veeco Wyko | NT 3300 | Profiler System | 1 |