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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 107011 | Veeco | Dektak 200 Si | Contact Profilometer - for spares use (Not operational condition) | 150 mm | 01.06.2000 | 1 | as is where is | immediately | |
| 106007 | VEECO | E475 Turbodisc | MOCVD System configured for AsP use | 100 mm | 01.09.2010 | 1 | as is where is | immediately | |
| 108331 | Veeco | Dimension 7000 | Atomic Force Microscope (AFM) | 200mm | 1 | as is where is | immediately | ||
| 109116 | Veeco | Vx340 Dimension | Atomic Force Proflier | 300 mm | 01.06.2010 | 1 | as is where is | immediately | |
| 114000 | Veeco | LANCER | Ion Beam Etch System (IBE) | 150/200 mm | 1 | inquire | |||
| 112980 | Veeco | Dektak 3030 | Profileometer | 1 | as is where is | ||||
| 112981 | Veeco | Dektak 3030 Auto II | Profileometer | 1 | as is where is | ||||
| 108893 | VEECO | AP-150 | Automtic Four Point Probe, for up to 6" Wafers | 150 MM | 1 | as is where is | 2 weeks | ||
| 108894 | VEECO | Dektak 3030ST | Profilometer | 1 | inquire | ||||
| 108916 | Veeco | Dimension X3D | Model 340 Atomic Force Microscope | 300 MM | 01.05.2006 | 1 | as is where is | immediately | |
| 113284 | Veeco | K465i | GaN MOCVD | 1 | as is where is | immediately | |||
| 112570 | Veeco | Dimension X3D-340 | Metrology AFM | 300 mm | 01.06.2004 | 1 | as is where is | ||
| 112571 | Veeco | K465 | GaN MOCVD | 1 | as is where is | ||||
| 112572 | Veeco | K465 | GaN MOCVD | 1 | as is where is | ||||
| 112573 | Veeco | K465 | GaN MOCVD | 1 | as is where is | ||||
| 108781 | VEECO | MS-35T | Turbopumped Leak Detector | 1 | as is where is | ||||
| 112010 | Veeco / Solid State Equipment Corporation (SSEC) | Waferstorm 3300 / M3303 / M3304 (SSEC 3303/4) | Single Wafer Processing | N/A | 1 | as is where is | |||
| 106563 | Veeco Wyko | NT3300 | 3D Bump Height (Veeco) | 150 mm/200 mm | 1 | as is where is | immediately |