BRUKER D8 Fabline X-Ray Diffraction wafer measurement for Sale

-A complete, automated solution for wafer measurement by X-ray Diffraction.

General System description
The Bruker AXS D8 Fabline provides Non-destructive, non-contact X-ray metrology for thin film thickness, composition and crystallization phase.
-Can load Wafers from 2" up to 300 mm
-Horizontal sample mount
-Measurement spots down to 100 μm
-Radiation-safe stainless-steel enclosure
-Class 2 cleanroom compatible
-Pattern recognition from #1 software company Cognex.

-Equipment was professionally deinstalled from operational condition in the fab.
-Please refer to the attached photos showing the equipment prior to de-installation in the fab, and also packed up at the warehouse.
-Equipment Packing list is as follows:-

Crate Number    DESCRIPTION                Qty    Crate No.    Length(cm)xWidth(cm)Height(cm)Weight(kg)
1                Mainbody                1    1            230X174X240    1182
2                Transfer Unit, Filters    1    2            244X167X239    724
3                Air Conditioner-1/2        1    3            129X108X99    206
4                Assy Box-1/2/3/4/5        1    4            152X81X89    175

-The equipment is fitted with 2 x 300 mm FOUP load ports
-Has CE Safety Certification
-Voltage setup: 230V / 400V , 3 phase, 50 Hz, 6 kVA