On behalf of our European Clients, we are pleased to offer the attached SMT and test Equipment. All Equipment is still installed and in excellent condition. Click on each table item for further details. Photographs and equipment specifications are available on request.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 115496 | Akrometrix | AXP | Thermal Warpage & Strain | ASSEMBLY | 1 | as is where is | |||
| 108730 | BAUSCH & LOMB | StereoZoom 4 | Microscope on Boom Stand, 0.7-3X with 10X W.F. Stereo Eyepieces | 1 | as is where is | ||||
| 108731 | BAUSCH & LOMB | StereoZoom 4 | Microscope on Small Benchtop Stand, 0.7-3X with 15X W.F. Eyepieces | 1 | as is where is | ||||
| 108732 | BAUSCH & LOMB | StereoZoom 6 Plus | Microscope, 0.67-4.0X with WF 10X/21 Eyepieces | 1 | as is where is | ||||
| 108733 | BAUSCH & LOMB | StereoZoom 7 | Microscope on Boom Stand, 1-7X with 15X Eyepieces and 0.67X Adapter Lens | 1 | as is where is | ||||
| 112662 | Bausch and Lomb | MicroZoom | Microscope,Incident Light | 1 | as is where is | ||||
| 106447 | Dage | 4000 | DAGE 4000 SHEAR TESTER | 150 mm/200 mm | 01.06.2000 | 1 | as is where is | immediately | |
| 108743 | DAGE | BT23PC | Die Shear Tester with LC200 Die Shear Load Cell, 2ea Available | ASSEMBLY | 1 | as is where is | 2 weeks | ||
| 108744 | DAGE | BT24 | Ball/Bump Shear Tester | ASSEMBLY | 01.05.1994 | 1 | as is where is | immediately | |
| 108745 | DAGE | BT23-PC | Die Shear Tester with LC200 Die Shear Load Cell | Assembly | 01.05.1996 | 1 | as is where is | immediately | |
| 108746 | DAGE | 2400PC | Wire pull tester | Assembly | 1 | as is where is | immediately | ||
| 108806 | DAGE | Series 5000 | Assembly Test System, Incomplete - Call for Details | ASSEMBLY | 1 | inquire | |||
| 108747 | DELTRONIC | DH14-RR | Profile Projector with 20X Objective Lens | 1 | as is where is | ||||
| 113288 | FEI | Quanta 200 | Scanning Electron Microscope | Laboratory | 1 | inquire | immediately | ||
| 71907 | Hamamatsu | C7103 | PC Controlled IC Back-side Lapping and Wafer Grinding System | 200 mm and packages | 01.09.2001 | 1 | as is where is | immediately | |
| 109561 | Hitachi | S5500 | HIGH RESOLUTION INSPECTION SEM | Laboratory | 01.06.2014 | 1 | as is where is | immediately | |
| 114469 | KLA | ICOS T830 | COMPONENT INSPECTION SYSTEM | Assembly | 1 | as is where is | |||
| 114470 | KLA | CI-T53P | COMPONENT INSPECTION SYSTEM | Assembly | 1 | as is where is | |||
| 115842 | KLA | WI-2280 | Wafer Inspection Equipment | 150 mm | 1 | as is where is | |||
| 106678 | KLA TENCOR | CI T1X0 | package inspection system | 300 mm | 01.06.2006 | 1 | as is where is | immediately | |
| 113081 | KLA-TENCOR | CI T1X0 | PACKAGE INSPECTION SYSTEM | N/A | 1 | as is where is | immediately | ||
| 115909 | KR�SS | DSA100B | DROP SHAPE ANALYZER / ANGLE GonioMeter | 200 mm | 1 | as is where is | |||
| 114531 | KWONSYS | KWONSYS | VISION INSPECTION | Assembly | 1 | as is where is | |||
| 108185 | Micro Vu | Vertex 420 | Precision coordinate measurement system | assembly | 1 | as is where is | immediately | ||
| 115986 | Micro-Vu | VERTEX 420 | Confocal Vision System | ASSEMBLY | 1 | as is where is | |||
| 112853 | Mitutoyo | 176-901-1A | Microscope, Coaxial | 1 | as is where is | ||||
| 116443 | Nanofocus | AusPrint | 3 D Inspection system with handler | ASSEMBLY | 01.06.2014 | 1 | as is where is | ||
| 112868 | Nikon | MM-11 | Microscope, Bright & Dark Ref/Trans Light | 1 | as is where is | ||||
| 112869 | Nikon | MM-11B | Microscope, Ref/Trans Light | 1 | as is where is | ||||
| 112870 | Nikon | MM-11B | Microscope, Brightfield Ref/Trans Light | 1 | as is where is | ||||
| 112873 | Nikon | XD-20 | Microscope,BF/DF/DIC/POL,Ref/Trans Light | 1 | as is where is | ||||
| 113114 | NIKON | NEXIV VMZ-R3020 | MICROSCOPE AUTOMATED MEASURING SYSTEMS | 200 mm-300 mm | 1 | as is where is | immediately | ||
| 116014 | Nikon | V-12A | Optical comparator | ASSEMBLY | 1 | as is where is | |||
| 113976 | Nordson / Dage | XD7600NT | X-Ray Inspection System | 1 | inquire | ||||
| 111400 | Olympus | KLA 1500 LCD | Cold light source with ring light and Adapter ring for different microscope sizes | Assembly | 4 | as is where is | immediately | ||
| 111401 | Olympus | Highlight 2100 | Cold light source with ring light | Assembly | 1 | as is where is | immediately | ||
| 111402 | Olympus | Highlight 2001 | Cold light source with ring light | Assembly | 1 | as is where is | immediately | ||
| 114338 | Olympus | TH3 Microscope | Inspection Microscope | N/A | 1 | as is where is | |||
| 114339 | Olympus | OLS4000 | 3D Measurement Microscope | N/A | 01.06.2007 | 1 | as is where is | ||
| 114340 | Olympus | OLS5000 | 3D Measurement Microscope | N/A | 01.06.2007 | 1 | as is where is | ||
| 113293 | Panalytical | X-PERT PRO | XRD | Laboratory | 01.06.2008 | 1 | as is where is | immediately | |
| 116078 | Rame-Hart instrument co. | 400 | DROP SHAPE ANALYZER / ANGLE GonioMeter | 200 mm | 1 | as is where is | |||
| 108876 | SONIX | UHR-2000 | Scanning Acoustic Microscope | ASSEMBLY | 1 | inquire | |||
| 111384 | SONIX | HS-1000 | Scanning Acoustic Microscope | Laboratory | 01.06.2010 | 1 | as is where is | immediately | |
| 113987 | Sonix | SAM | Bond Inspection Tool | 1 | inquire | ||||
| 106551 | TT Vision | T-224X | TT Vision - Post Tape Inspection | 1 | as is where is | ||||
| 108781 | VEECO | MS-35T | Turbopumped Leak Detector | 1 | as is where is | ||||
| 108782 | WENTWORTH LABS | HOP "Hands Off Probe" | Micropositioner, 2ea Available | 1 | as is where is | ||||
| 110600 | ZEISS | Stemi 2000 | Stereozoom Microscope | Assembly | 1 | inquire | immediately | ||
| 113000 | ZEISS | ICM 405 | INVERTED MICROSCOPE, BRIGHTFIELD AND DIC | 1 | as is where is | ||||
| 113001 | Zeiss | AXIOMAT | Microscope,BF/DF/DIC,Ref/Trans Light | 1 | as is where is | ||||
| 113004 | Zeiss | UEM | Microscope,Brightfield,Reflected Light | 1 | as is where is | ||||
| 113005 | Zeiss | Universal | Microscope,Brightfield & DIC, Ref/Trans Light | 1 | as is where is |