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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 116628 | Camtek | Condor 302M | Wafer inspection system for surface defects, 2D bump metrology, and 3D measurement | 150 mm and 200 mm | 01.06.2011 | 1 | as is where is | immediately |