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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 106663 | HITACHI | IS3000SE | E-beam wafer inspection | 300 mm | 01.06.2006 | 1 | as is where is | immediately | |
| 109555 | Hitachi | IS3000 | DARK FIELD INSPECTION | 300 mm | 01.05.2007 | 1 | as is where is | ||
| 113090 | LAM | TORUS300K | DRY Bevel Etcher | 300 mm | 01.06.2006 | 1 | as is where is | ||
| 106701 | LAM | TORUS300K | DRY Bevel Etcher | 300 mm | 01.06.2006 | 1 | as is where is | ||
| 115968 | Leica | INS3000 | Wafer Inspection Microscope | 200 mm | 1 | as is where is | |||
| 115969 | Leica | INS3000 DUV | Wafer Inspection Microscope | 200 mm | 1 | as is where is | |||
| 115961 | Leica | INS3000 | Wafer Inspection Microscope | 200 mm | 1 | as is where is | |||
| 115962 | Leica | INS3000 | Wafer Inspection Microscope | 200 mm | 1 | as is where is | |||
| 115963 | Leica | INS3000 | Wafer Inspection Microscope | 200 mm | 1 | as is where is | |||
| 115964 | Leica | INS3000 | Wafer Inspection Microscope | 200 mm | 1 | as is where is | |||
| 115965 | Leica | INS3000 | Wafer Inspection Microscope | 200 mm | 1 | as is where is | |||
| 115966 | Leica | INS3000 | Wafer Inspection Microscope | 200 mm | 1 | as is where is | |||
| 115967 | Leica | INS3000 | Wafer Inspection Microscope | 200 mm | 1 | as is where is | |||
| 114538 | Olympus | OLS3000 | Microscope | Assembly | 1 | as is where is | |||
| 116082 | RECIF | SIS300 | Wafer Sorter | 300 mm | 1 | as is where is | |||
| 103552 | RORZE | RASS300F | Wafer Sorter / 4Foup type | 300 mm | 31.05.2006 | 1 | as is where is | ||
| 113152 | RUDOLPH | S3000S | FBE(focused beam laser ellipsometry) | 300 mm | 1 | as is where is | immediately | ||
| 100932 | RUDOLPH | S3000A | Focused Beam Ellipsometer | 200 mm | 31.05.2012 | 1 | as is where is | ||
| 110795 | Rudolph | S300D Ultra II | Thin Film Measurement Tool / Ellipsometer | 300 mm | 01.05.2005 | 1 | as is where is | immediately | |
| 106721 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2010 | 1 | as is where is | immediately | |
| 106723 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 1 | as is where is | |||
| 106725 | RUDOLPH | S3000S | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2010 | 1 | as is where is | ||
| 113149 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2011 | 1 | as is where is | immediately | |
| 113150 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 1 | as is where is | |||
| 113151 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2011 | 1 | as is where is | immediately | |
| 114247 | SUSS | ACS300 PLUS | Photoresist developer | 200 mm | 1 | as is where is | immediately |