Please find below a list of Used Test (ATE) Automatic Test Equipment for sale by fabsurplus.com .Click on any listed item of Test (ATE) Automatic Test Equipment to see further data.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 54226 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 7 | as is where is | immediately | |
| 95398 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
| 95399 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
| 95400 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
| 95401 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
| 95402 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
| 95403 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
| 78639 | Advantest | T5335P (Spares) | Spare Boards from test system (See attached list for details) | TEST | 01.11.1997 | 1 | as is where is | immediately | |
| 87652 | Advantest | T5371 | Test system (With a single test head ) | Test | 1 | as is where is | immediately | ||
| 89909 | Advantest | Hifix for PQFP80 (14 x 20) | Hi-fix for Advantest T5371 package type PQFP80 (14 x 20) | Spares | 01.05.2005 | 1 | as is where is | immediately | |
| 94490 | Advantest | T5375 | Automated Test Equipment | TEST | 2 | as is where is | immediately | ||
| 99379 | ADVANTEST | T5375 | High-Speed Flash Memory tester | TEST | 01.11.2003 | 1 | as is where is | immediately | |
| 99380 | ADVANTEST | T5771ES | Automated Test Equipment for laboratory or office use | TEST | 1 | as is where is | immediately | ||
| 99388 | Advantest | Versatest V4000 | Automated Test Equipment for laboratory or office use | TEST | 01.06.2006 | 1 | as is where is | immediately | |
| 99389 | Advantest | Versatest V4000 | Automated Test Equipment | TEST | 01.06.2006 | 1 | as is where is | immediately | |
| 99390 | Advantest | Versatest V4000 | Automated Test Equipment | TEST | 01.06.2006 | 1 | as is where is | immediately | |
| 100668 | Advantest | V3300 | Memory Tester | TEST | 1 | as is where is | |||
| 103812 | Advantest | T5335P | Automated Test System | test | 1 | as is where is | immediately | ||
| 108048 | Advantest | T5371 | Automated test equipment | TEST | 5 | as is where is | |||
| 108050 | Advantest | T5585 | Automated test equipment | TEST | 1 | as is where is | |||
| 108057 | Advantest | T5381ES | ATE Tester | TEST | 3 | as is where is | |||
| 108058 | Advantest | T5585 | ATE Tester | TEST | 1 | as is where is | |||
| 108549 | ADVANTEST | T5382A1 | Test System | TEST | 1 | as is where is | immediately | ||
| 108550 | ADVANTEST | T5585 | Test System | 200 mm | 1 | as is where is | immediately | ||
| 109120 | Advantest | V5000 | Automated Test equipment | TEST | 01.06.2010 | 11 | as is where is | immediately | |
| 109575 | ADVANTEST | T5377 | Automated test Equipment | Test | 01.06.2010 | 6 | as is where is | immediately | |
| 109576 | ADVANTEST | T5593 | Automated test Equipment | Test | 01.01.2005 | 1 | as is where is | immediately | |
| 109577 | ADVANTEST | T5585 | Automated test Equipment | Test | 01.06.2001 | 1 | as is where is | immediately | |
| 111455 | ADVANTEST | T5593 | AUTOMATED TEST EQUIPMENT | TEST | 01.09.2004 | 1 | as is where is | immediately | |
| 111520 | ADVANTEST | T5585 | Automated test equipment | TEST | 01.06.2004 | 1 | as is where is | ||
| 113343 | Advantest | PS1600CTH | Automated TEST Equipment | TEST | 2 | inquire | |||
| 114222 | Advantest | V6000 FT | Memory Tester | 300 mm | 1 | as is where is | |||
| 114223 | Advantest | V6000 FT | Memory Tester | 300 mm | 1 | as is where is | |||
| 114224 | Advantest | V6000 FT | Memory Tester | 300 mm | 1 | as is where is | |||
| 114423 | ADVANTEST | T5593 | Automated test Equipment | Test | 01.01.2005 | 1 | as is where is | immediately | |
| 114475 | ADVANTEST | T6372 | TEST SYSTEM | TEST | 3 | as is where is | immediately | ||
| 114476 | ADVANTEST | T6373 | TEST SYSTEM | TEST | 2 | as is where is | immediately | ||
| 115486 | Advantest | MPT3000HVM Gen 3 | SSD Test System | TEST | 1 | as is where is | |||
| 116398 | Advantest | V4400 | Memory Tester | TEST | 1 | as is where is | |||
| 116399 | Advantest | V4400 | Memory Tester | TEST | 1 | as is where is | |||
| 116400 | Advantest | V4400 | Memory Tester | TEST | 1 | as is where is | |||
| 116401 | Advantest | V4400 | Memory Tester | TEST | 1 | as is where is | |||
| 108555 | Agilent | 16702A | LOGIC ANALISYS SYSYEM | TEST | 1 | as is where is | immediately | ||
| 115676 | Chroma | M25 uEL Tester | LED Tester | 200 mm | 1 | as is where is | |||
| 115677 | Chroma | M25 uEL Tester | LED Tester | 200 mm | 1 | as is where is | |||
| 115678 | Chroma | M25 uEL Tester | LED Tester | 200 mm | 1 | as is where is | |||
| 115679 | Chroma | M25 uEL Tester | LED Tester | 200 mm | 1 | as is where is | |||
| 115680 | Chroma | M25 uEL Tester | LED Tester | 200 mm | 1 | as is where is | |||
| 87089 | Credence | Personal Kalos I | Test system | TEST | 01.10.2002 | 1 | as is where is | immediately | |
| 113340 | Credence | Kalos Hex | Automated TEST Equipment | TEST | 1 | inquire | |||
| 113341 | Credence | Kalos XW | Automated TEST Equipment | TEST | 4 | inquire | |||
| 114305 | FTS | FTI-1000 with P8XL Prober | Parametric test System with Prober | 200 mm | 01.08.1999 | 1 | as is where is | ||
| 110616 | HP / Agilent | 4062 | Automated Test equipment | TEST | 1 | as is where is | immediately | ||
| 86677 | InTest | Test Head | CPIT TEP8 / STFLASH EPROM / 1792 Test Head | Spares | 31.05.2007 | 1 | as is where is | immediately | |
| 108970 | IsMeca | NX16 | TEST SYSTEM | TEST | 01.06.2011 | 1 | as is where is | immediately | |
| 113783 | KEYSIGHT | HP4062U | Parametric Test System | 150 mm | 1 | as is where is | |||
| 113784 | KEYSIGHT | HP4062U | Parametric Test System | 150 mm | 1 | as is where is | |||
| 113785 | KEYSIGHT | HP4062U | Parametric Test System | 150 mm | 1 | as is where is | |||
| 113786 | KEYSIGHT | HP4062U | Parametric Test System | 150 mm | 1 | as is where is | |||
| 115789 | Keysight / Agilent / Hewlett-Packard (HP) | 4062 UX | Parametric Tester | TEST | 1 | as is where is | |||
| 115790 | Keysight / Agilent / Hewlett-Packard (HP) | 4062 UX | Parametric Tester | TEST | 1 | as is where is | |||
| 115791 | Keysight / Agilent / Hewlett-Packard (HP) | 4062 UX | Parametric Tester | TEST | 1 | as is where is | |||
| 115792 | Keysight / Agilent / Hewlett-Packard (HP) | 4062 UX | Parametric Tester | TEST | 1 | as is where is | |||
| 115793 | Keysight / Agilent / Hewlett-Packard (HP) | 4062 UX | Parametric Tester | TEST | 1 | as is where is | |||
| 115794 | Keysight / Agilent / Hewlett-Packard (HP) | 4062 UX | Parametric Tester | TEST | 1 | as is where is | |||
| 115795 | Keysight / Agilent / Hewlett-Packard (HP) | 4062 UX | Parametric Tester | TEST | 1 | as is where is | |||
| 115796 | Keysight / Agilent / Hewlett-Packard (HP) | 4062 UX | Parametric Tester | TEST | 1 | as is where is | |||
| 115797 | Keysight / Agilent / Hewlett-Packard (HP) | 4062 UX | Parametric Tester | TEST | 1 | as is where is | |||
| 115798 | Keysight / Agilent / Hewlett-Packard (HP) | 4062 UX | Parametric Tester | TEST | 1 | as is where is | |||
| 115799 | Keysight / Agilent / Hewlett-Packard (HP) | 4062 UX | Parametric Tester | TEST | 1 | as is where is | |||
| 115800 | Keysight / Agilent / Hewlett-Packard (HP) | 4062 UX | Parametric Tester | TEST | 1 | as is where is | |||
| 115801 | Keysight / Agilent / Hewlett-Packard (HP) | 4062 UX | Parametric Tester | TEST | 1 | as is where is | |||
| 115802 | Keysight / Agilent / Hewlett-Packard (HP) | 4072A | Parametric Tester | TEST | 1 | as is where is | |||
| 115803 | Keysight / Agilent / Hewlett-Packard (HP) | 4072B | Parametric Tester | TEST | 1 | as is where is | |||
| 115804 | Keysight / Agilent / Hewlett-Packard (HP) | 4073A | Parametric Tester | TEST | 1 | as is where is | |||
| 115972 | LTX Credence | Fusion CX | Mixed Signal Tester | TEST | 1 | as is where is | |||
| 115973 | LTX Credence | Fusion CX | Mixed Signal Tester | TEST | 1 | as is where is | |||
| 115974 | LTX Credence | Fusion CX | Mixed Signal Tester | TEST | 1 | as is where is | |||
| 108028 | MOSAID | M4205 | Memory Tester | TEST | 1 | as is where is | immediately | ||
| 108767 | MOSAID | MS4155 | Memory Test System | TEST | 1 | as is where is | immediately | ||
| 108031 | NEXTEST | MAGNUM II EV ICP | Memory Tester | TEST | 01.11.2011 | 1 | as is where is | ||
| 99382 | NexTest / Teradyne | MAVERICK PT II | Automated Test Equipment | TEST | 1 | as is where is | immediately | ||
| 99383 | NexTest / Teradyne | MAVERICK PT II | Automated Test Equipment | TEST | 1 | as is where is | immediately | ||
| 109045 | NexTest / Teradyne | Maverick-II PT | Bitmap Tester | TEST | 01.05.2003 | 1 | as is where is | immediately | |
| 109046 | NexTest / Teradyne | Maverick-II PT | Bitmap Tester | TEST | 01.05.2004 | 1 | as is where is | immediately | |
| 108030 | Nextest Systems Corporation | MAGNUM ICP 1280 | Memory Tester | TEST | 01.05.2010 | 1 | as is where is | immediately | |
| 108032 | Nextest Systems Corporation | MAGNUM II ICP 1280 | Memory Tester | TEST | 01.04.2010 | 1 | as is where is | immediately | |
| 108054 | Shibasoku | S230 | Automated test equipment | TEST | 1 | as is where is | |||
| 71904 | ST Automation | test head | test head for Eprom U 1835 | 1 | as is where is | ||||
| 71908 | ST Automation | PTM1 | Flash Memory Tester | Test | 3 | as is where is | immediately | ||
| 71910 | ST Automation | MT32SX | Flash Memory Test System for 256 MB memory testing | TEST | 01.05.2008 | 1 | as is where is | immediately | |
| 78133 | ST Automation | QT200 | Test System | test | 31.05.2007 | 1 | as is where is | immediately | |
| 78137 | ST Automation | QT200 | Tester System with monitor | test | 1 | as is where is | immediately | ||
| 78138 | ST Automation | R.S.V. | ST Memory Test System Electronic Automation | test | 31.03.2007 | 1 | as is where is | immediately | |
| 80177 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately | |
| 80178 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately | |
| 80179 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately | |
| 80180 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately | |
| 80181 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately | |
| 80182 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately | |
| 80183 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately | |
| 80184 | ST Automation | QT EPR16 DD | Automated Flash Memory Tester System with monitor | TEST | 30.09.2007 | 1 | as is where is | immediately | |
| 86279 | ST Automation | MT32SX | Flash Memory testing System | TEST | 30.06.2005 | 1 | as is where is | immediately | |
| 86280 | ST Automation | PT-M1 | Automated Test System | Test | 1 | as is where is | immediately | ||
| 86670 | ST Automation | QT200 | Automated Test System | TEST | 31.05.2005 | 1 | as is where is | immediately | |
| 93822 | ST Automation | EPR88 | Automated Test System | TEST | 31.05.2005 | 1 | as is where is | immediately | |
| 93865 | ST Automation | QT 200 epr 88 | Flash Memory Testing System | Test | 31.05.2005 | 1 | as is where is | immediately | |
| 95233 | ST Automation | MT 32 SX | Fully Automated Memory Test System for BIST and NAND Memories | TEST | 30.11.2005 | 1 | inquire | immediately | |
| 99969 | ST Automation | QT200 | Automated Tester System with monitor | test | 31.05.2005 | 1 | as is where is | immediately | |
| 101848 | ST Automation | MT32SX | Automated Flash Memory Testing System | test | 31.05.2007 | 1 | as is where is | immediately | |
| 102494 | ST Automation | MT32SX | Automated Flash Memory Testing System FOR TESTING 256 MB MEMORY | TEST | 30.09.2007 | 1 | as is where is | immediately | |
| 84022 | Sun | Ultrasparc 60 | Unix computer from Teradyne J994 | Test | 31.12.1996 | 1 | as is where is | immediately | |
| 84023 | Sun | Ultrasparc 60 (Hard Disk Drive) | Hard Disk from Unix computer from Teradyne J994 | Test | 01.01.1997 | 1 | as is where is | immediately | |
| 33413 | SYNAX | SX3100 | Fully Automated test Handler, ambient and hot configured. | TEST | 01.05.2006 | 1 | as is all rebuilt | immediately | |
| 33414 | SYNAX | SX3100 | Fully Automated test Handler, ambient and hot configured. | test | 01.05.2006 | 1 | as is all rebuilt | immediately | |
| 78136 | Sytrama | MTM 32 V01 | ST Test Head Manipulator QT 124 | 30.11.2005 | 1 | as is where is | immediately | ||
| 80089 | Sytrama | MTM 32 V01 | ST Test Head Manipulator QT 124 | 30.11.2005 | 1 | as is where is | immediately | ||
| 54232 | Teradyne | J994 | Memory Tester | test | 01.05.2000 | 1 | as is where is | immediately | |
| 82231 | Teradyne | 961-061-00 | Teradyne J971 Power Supply | 01.07.1997 | 1 | as is where is | immediately | ||
| 82232 | Teradyne | 961-128-00 | Teradyne J971 Power Supply | 01.07.1997 | 1 | as is where is | immediately | ||
| 108213 | TERADYNE | CATALYST | EDS/ TEST | test | 1 | as is where is | |||
| 108607 | TERADYNE | IP750EX | AUTOMATED TEST EQUIPMENT For CMOS Image Sensor testing | TEST | 01.06.2012 | 1 | as is where is | immediately | |
| 111537 | TERADYNE | MAGNUM 2X GVLC | Automated test equipment | TEST | 01.06.2010 | 2 | as is where is | immediately | |
| 111538 | TERADYNE | MAGNUM 2X GVLC | Automated test equipment | TEST | 01.06.2010 | 1 | as is where is | ||
| 113177 | TERADYNE | CATALYST | Automated Test Equipment | 200 mm,300 mm | 01.06.1998 | 1 | as is where is | immediately | |
| 113178 | TERADYNE | CATALYST | Automated Test Equipment | 200 mm,300 mm | 01.06.2000 | 1 | as is where is | immediately | |
| 113179 | TERADYNE | CATALYST | Automated Test Equipment | 200 mm,300 mm | 1 | as is where is | |||
| 113186 | Teradyne | TSLH 124 | In-circuit Test System | TEST | 2 | inquire | immediately | ||
| 113335 | Teradyne | J750Ex | Automated test Systems with (512/1024 pins, 8 x HSD200 & 2 DPS) | Test | 01.06.2014 | 7 | as is where is | immediately | |
| 113346 | Teradyne | UFlex SC/HD | Automated TEST Equipment | TEST | 2 | inquire | |||
| 116453 | Teradyne | Catalyst Mixed Signal | Automated test equipment | TEST | 01.06.2000 | 1 | as is where is | ||
| 116454 | Teradyne | J750 | Automated test equipment | TEST | 01.06.2013 | 1 | as is where is | ||
| 116455 | Teradyne | J750 | Automated test equipment | TEST | 01.06.2006 | 1 | as is where is | ||
| 116456 | Teradyne | J750 | Automated test equipment | TEST | 01.06.2013 | 1 | as is where is | ||
| 114383 | Verigy | 4071A with P8XL Prober | Parametric test System with Prober | 200 mm | 01.06.1999 | 1 | as is where is | ||
| 114384 | Verigy | 4072A with P8XL Prober | Parametric test System with Prober | 200 mm | 01.06.2006 | 1 | as is where is | ||
| 114385 | Verigy | 4073A with P8XL Prober | Parametric test System with Prober | 200 mm | 01.06.2003 | 1 | as is where is | ||
| 100692 | Yokogawa | ST6730A | Logic Tester | TEST | 2 | as is where is | |||
| 102577 | Yokogawa | TS670 | Tester | TEST | 3 | inquire | immediately | ||
| 106757 | YOKOGAWA | TS6700 | LCD DRIVER TESTER | TEST | 01.06.2003 | 1 | as is where is | ||
| 108056 | Yokogawa | AL6095 | Automated test equipment | TEST | 1 | as is where is | |||
| 113342 | Yokogawa | TS670 | Automated TEST Equipment | TEST | 3 | inquire | |||
| 114471 | YOKOGAWA | ST6730A | TEST SYSTEM | TEST | 2 | as is where is | |||
| 114472 | YOKOGAWA | TS 6700 | TEST SYSTEM | TEST | 3 | as is where is | immediately | ||
| 114473 | YOKOGAWA | ST6730 | TEST SYSTEM | TEST | 5 | as is where is | immediately | ||
| 114474 | YOKOGAWA | TS 670 | TEST SYSTEM | TEST | 1 | as is where is | immediately |